WO2009033426A1 - Dispositif de test de câble à multiples sous-unités - Google Patents

Dispositif de test de câble à multiples sous-unités Download PDF

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Publication number
WO2009033426A1
WO2009033426A1 PCT/CN2008/072328 CN2008072328W WO2009033426A1 WO 2009033426 A1 WO2009033426 A1 WO 2009033426A1 CN 2008072328 W CN2008072328 W CN 2008072328W WO 2009033426 A1 WO2009033426 A1 WO 2009033426A1
Authority
WO
WIPO (PCT)
Prior art keywords
test
cable
subunit
testing
subunit cable
Prior art date
Application number
PCT/CN2008/072328
Other languages
English (en)
Chinese (zh)
Inventor
Nailian Shen
Xiaochun Yi
Bin Jiang
Original Assignee
Shanghai Electric Cable Research Institute
Shanghai Secri Opt-Electrical Calbes Co. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Electric Cable Research Institute, Shanghai Secri Opt-Electrical Calbes Co. Ltd. filed Critical Shanghai Electric Cable Research Institute
Priority to CH00325/10A priority Critical patent/CH699898B1/de
Publication of WO2009033426A1 publication Critical patent/WO2009033426A1/fr

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58Testing of lines, cables or conductors

Definitions

  • the present invention relates to a test apparatus for a large logarithmic cable. Background technique
  • a single cable contains more and more pairs of wires.
  • the specified logarithm is used as a unit (subunit).
  • a cable can contain multiple subunits.
  • test equipment for large logarithmic cables must also adapt to their requirements.
  • One end of the test cable is connected to the test disc on the near end and the other end is connected to the test disc on the far end.
  • the test discs Due to the large number of line tests, the test discs are required to have a larger disc diameter. This not only causes inconvenience to the test, but also has a large influence on the impedance test due to too much peeling off the sheath or the distance between the pairs of the subunits. Summary of the invention
  • the present invention adopts the following technical solutions:
  • a multi-subunit cable testing device includes a workbench and a test disc disposed on the workbench, wherein: the number of the test discs is plural.
  • each of the test disks includes 10 to 30 test channels.
  • the number of the test disks is two.
  • each of the test disks includes 25 test channels.
  • Figure 1 is a conventional subunit test device; 2 is a cable test device for multiple subunits of the present invention.
  • a multi-subunit cable test apparatus includes a workbench 10 and two test discs 20 disposed on the workbench 10.
  • test disk diameter is small, effectively solving the problem of occupying a large space. Since the dispersion length of the cable subunit is reduced, the influence on the impedance during cable testing is well solved.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

L'invention porte sur un dispositif de test de câble à multiples sous-unités. Le dispositif comporte une table d'actionnement (10) et des panneaux de test (20) disposés sur la table d'actionnement (10). Le nombre des panneaux de test (20) est supérieur à un. Chaque panneau de test comprend de 10 à 30 canaux de test.
PCT/CN2008/072328 2007-09-11 2008-09-11 Dispositif de test de câble à multiples sous-unités WO2009033426A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CH00325/10A CH699898B1 (de) 2007-09-11 2008-09-11 Prüfvorrichtung für Kabel mit mehreren Untereinheiten.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CNU2007200745537U CN201149608Y (zh) 2007-09-11 2007-09-11 多子单位的电缆测试装置
CN200720074553.7 2007-09-11

Publications (1)

Publication Number Publication Date
WO2009033426A1 true WO2009033426A1 (fr) 2009-03-19

Family

ID=40117379

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2008/072328 WO2009033426A1 (fr) 2007-09-11 2008-09-11 Dispositif de test de câble à multiples sous-unités

Country Status (3)

Country Link
CN (1) CN201149608Y (fr)
CH (1) CH699898B1 (fr)
WO (1) WO2009033426A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101387673B (zh) * 2007-09-11 2012-05-09 上海电缆研究所 电缆测试装置
CN102368088B (zh) * 2011-10-21 2013-03-13 中国北方车辆研究所 被测设备及电流卡钳布置装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3784910A (en) * 1972-07-13 1974-01-08 Teradyne Inc Sequential addressing network testing system
CN2388607Y (zh) * 1999-04-21 2000-07-19 深圳市中兴通讯股份有限公司 电缆测试仪
CN1595186A (zh) * 2004-07-02 2005-03-16 哈尔滨工业大学 一种多芯电缆自动测试方法和装置
CN2709982Y (zh) * 2004-07-14 2005-07-13 上海电缆研究所 分立通道电缆测试平台
CN2709992Y (zh) * 2004-07-14 2005-07-13 上海电缆研究所 电缆测试平台
JP2006084249A (ja) * 2004-09-15 2006-03-30 Hioki Ee Corp 絶縁検査方法および絶縁検査装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3784910A (en) * 1972-07-13 1974-01-08 Teradyne Inc Sequential addressing network testing system
CN2388607Y (zh) * 1999-04-21 2000-07-19 深圳市中兴通讯股份有限公司 电缆测试仪
CN1595186A (zh) * 2004-07-02 2005-03-16 哈尔滨工业大学 一种多芯电缆自动测试方法和装置
CN2709982Y (zh) * 2004-07-14 2005-07-13 上海电缆研究所 分立通道电缆测试平台
CN2709992Y (zh) * 2004-07-14 2005-07-13 上海电缆研究所 电缆测试平台
JP2006084249A (ja) * 2004-09-15 2006-03-30 Hioki Ee Corp 絶縁検査方法および絶縁検査装置

Also Published As

Publication number Publication date
CH699898B1 (de) 2010-10-29
CN201149608Y (zh) 2008-11-12

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