WO2009005144A1 - 汚れ検出装置および分析装置 - Google Patents

汚れ検出装置および分析装置 Download PDF

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Publication number
WO2009005144A1
WO2009005144A1 PCT/JP2008/062170 JP2008062170W WO2009005144A1 WO 2009005144 A1 WO2009005144 A1 WO 2009005144A1 JP 2008062170 W JP2008062170 W JP 2008062170W WO 2009005144 A1 WO2009005144 A1 WO 2009005144A1
Authority
WO
WIPO (PCT)
Prior art keywords
soil
detecting
reaction container
analyzing
soil detecting
Prior art date
Application number
PCT/JP2008/062170
Other languages
English (en)
French (fr)
Inventor
Motoaki Ozaki
Original Assignee
Olympus Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corporation filed Critical Olympus Corporation
Publication of WO2009005144A1 publication Critical patent/WO2009005144A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00277—Special precautions to avoid contamination (e.g. enclosures, glove- boxes, sealed sample carriers, disposal of contaminated material)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0401—Sample carriers, cuvettes or reaction vessels
    • G01N2035/0437—Cleaning cuvettes or reaction vessels

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Optical Measuring Cells (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)

Abstract

　分析処理に使用する容器に残存する汚れをさらに厳密に検出できる汚れ検出装置および分析装置を提供する。分析装置１は、液体検体中の成分と選択的に反応して光学的特性を変化させる汚れ検出用試薬を反応容器２１に投入して、反応容器２１に残存する汚れの光学的特性を十分に検出可能である程度まで引き上げてから、汚れ検出用測光部２０による反応容器２１における光学的特性を測定する汚れ検出用測定処理を行なう。そして、汚れ検出部３４は、この汚れ検出用測光部２０において測定された測定結果をもとに反応容器２１の汚れの程度を検出する。
PCT/JP2008/062170 2007-07-04 2008-07-04 汚れ検出装置および分析装置 WO2009005144A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007176530A JP2009014505A (ja) 2007-07-04 2007-07-04 汚れ検出装置および分析装置
JP2007-176530 2007-07-04

Publications (1)

Publication Number Publication Date
WO2009005144A1 true WO2009005144A1 (ja) 2009-01-08

Family

ID=40226182

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/062170 WO2009005144A1 (ja) 2007-07-04 2008-07-04 汚れ検出装置および分析装置

Country Status (2)

Country Link
JP (1) JP2009014505A (ja)
WO (1) WO2009005144A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013112098A1 (en) * 2012-01-27 2013-08-01 Spårab Produkter Ab Detection of contaminated areas

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6408354B2 (ja) * 2014-11-19 2018-10-17 東レエンジニアリング株式会社 検査装置及び生産管理方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6333662A (ja) * 1986-07-28 1988-02-13 Shimadzu Corp 自動分析装置
JPH1073601A (ja) * 1996-08-30 1998-03-17 Shimadzu Corp 自動分析装置
JP2007002090A (ja) * 2005-06-23 2007-01-11 Toshiba Corp 自動分析装置用アルカリ性洗剤、自動分析装置、および自動分析装置の洗浄方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6333662A (ja) * 1986-07-28 1988-02-13 Shimadzu Corp 自動分析装置
JPH1073601A (ja) * 1996-08-30 1998-03-17 Shimadzu Corp 自動分析装置
JP2007002090A (ja) * 2005-06-23 2007-01-11 Toshiba Corp 自動分析装置用アルカリ性洗剤、自動分析装置、および自動分析装置の洗浄方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013112098A1 (en) * 2012-01-27 2013-08-01 Spårab Produkter Ab Detection of contaminated areas
US9435748B2 (en) 2012-01-27 2016-09-06 Spårab Produkter Ab Detection of contaminated areas

Also Published As

Publication number Publication date
JP2009014505A (ja) 2009-01-22

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