WO2008126603A1 - ドライバ回路および半導体試験装置 - Google Patents
ドライバ回路および半導体試験装置 Download PDFInfo
- Publication number
- WO2008126603A1 WO2008126603A1 PCT/JP2008/054505 JP2008054505W WO2008126603A1 WO 2008126603 A1 WO2008126603 A1 WO 2008126603A1 JP 2008054505 W JP2008054505 W JP 2008054505W WO 2008126603 A1 WO2008126603 A1 WO 2008126603A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- driver circuit
- capacitive load
- impedance
- testing apparatus
- semiconductor testing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/56—Modifications of input or output impedances, not otherwise provided for
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/60—Amplifiers in which coupling networks have distributed constants, e.g. with waveguide resonators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0005—Modifications of input or output impedance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/297—Indexing scheme relating to amplifiers the loading circuit of an amplifying stage comprising a capacitor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/387—A circuit being added at the output of an amplifier to adapt the output impedance of the amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/421—Multiple switches coupled in the output circuit of an amplifier are controlled by a circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/423—Amplifier output adaptation especially for transmission line coupling purposes, e.g. impedance adaptation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
本発明は、容量性負荷4に伝送線路3を介して所定の電圧を供給するドライバ回路である。ドライバ1と伝送線路3との間に配置され、インピーダンスが可変できるインピーダンス回路6を備えている。インピーダンス回路6は、容量性負荷4の容量値の大きさに応じて、インピーダンスを任意の値に設定自在になっている。これにより、本発明は、容量性負荷の容量値の大小にかかわらず、その容量性負荷の両端電圧の立ち上がり時間、およびその立ち上がり波形を所定範囲に収められる。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-063553 | 2007-03-13 | ||
JP2007063553 | 2007-03-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008126603A1 true WO2008126603A1 (ja) | 2008-10-23 |
Family
ID=39863735
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/054505 WO2008126603A1 (ja) | 2007-03-13 | 2008-03-12 | ドライバ回路および半導体試験装置 |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2008126603A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013130427A (ja) * | 2011-12-20 | 2013-07-04 | Tokyo Electron Ltd | 半導体デバイスの検査装置 |
TWI671987B (zh) * | 2018-09-10 | 2019-09-11 | 捷佳科技股份有限公司 | 無線電力傳輸單元 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62238477A (ja) * | 1986-04-10 | 1987-10-19 | Hitachi Electronics Eng Co Ltd | Ic検査装置 |
JPS6331311A (ja) * | 1986-07-22 | 1988-02-10 | クリデンス システムズ コーポレイション | 可変インピ−ダンス駆動回路 |
JPH0458170A (ja) * | 1990-06-26 | 1992-02-25 | Mitsubishi Electric Corp | 半導体試験装置 |
-
2008
- 2008-03-12 WO PCT/JP2008/054505 patent/WO2008126603A1/ja active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62238477A (ja) * | 1986-04-10 | 1987-10-19 | Hitachi Electronics Eng Co Ltd | Ic検査装置 |
JPS6331311A (ja) * | 1986-07-22 | 1988-02-10 | クリデンス システムズ コーポレイション | 可変インピ−ダンス駆動回路 |
JPH0458170A (ja) * | 1990-06-26 | 1992-02-25 | Mitsubishi Electric Corp | 半導体試験装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013130427A (ja) * | 2011-12-20 | 2013-07-04 | Tokyo Electron Ltd | 半導体デバイスの検査装置 |
TWI671987B (zh) * | 2018-09-10 | 2019-09-11 | 捷佳科技股份有限公司 | 無線電力傳輸單元 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1909384A3 (en) | Rectifier circuit with variable capacitor, semiconductor device using the circuit, and driving method therefor | |
WO2008033674A3 (en) | High voltage latching and dc restoration isolation and level shifting method and apparatus | |
WO2008081741A1 (ja) | 抵抗変化型素子および抵抗変化型記憶装置 | |
WO2007124050A3 (en) | Probe structures with electronic components | |
EP4235446A3 (en) | Integrated circuit with graduated on-die termination | |
AU319720S (en) | Electronic device | |
WO2008086030A3 (en) | Methods and systems for interfacing an electric stringed musical instrument to an electronic device | |
MY157390A (en) | Switching circuit and semiconductor module | |
WO2007100997A3 (en) | Supply circuit for implantable medical devices | |
WO2011110255A3 (de) | Messspitze mit integriertem messwandler | |
WO2014090551A3 (de) | Vorladeschaltung zum laden eines zwischenkreiskondensators | |
WO2007081360A3 (en) | Electronic disabling device having adjustable output pulse power | |
WO2010049308A3 (en) | A power supply that operates efficiently at high and low line input | |
WO2009001170A3 (en) | Filter having impedance matching circuits | |
WO2015129908A3 (en) | Element for generating or detecting electromagnetic waves which includes a resonance unit and a differential negative resistance | |
WO2013001000A3 (en) | An electrosurgical instrument | |
AU319729S (en) | Electronic device | |
WO2008126603A1 (ja) | ドライバ回路および半導体試験装置 | |
WO2008005112A3 (en) | Configurable voltage regulator | |
WO2010022700A3 (de) | Anordnung zur messung wenigstens eines wertes einer an einer elektronischen komponente anliegenden spannung | |
EP3461007A3 (en) | Techniques for reducing uneven aging in integrated circuits | |
WO2010046758A3 (en) | Apparatus and method for active voltage compensation | |
EP2418772A8 (en) | Variable impedance matching circuit | |
EP2383860A3 (en) | Rapid charging apparatus | |
TW200723200A (en) | Startup circuit and backlight control circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 08721921 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 08721921 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: JP |