WO2008123146A1 - 顕微鏡 - Google Patents

顕微鏡 Download PDF

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Publication number
WO2008123146A1
WO2008123146A1 PCT/JP2008/055291 JP2008055291W WO2008123146A1 WO 2008123146 A1 WO2008123146 A1 WO 2008123146A1 JP 2008055291 W JP2008055291 W JP 2008055291W WO 2008123146 A1 WO2008123146 A1 WO 2008123146A1
Authority
WO
WIPO (PCT)
Prior art keywords
body section
sample
pattern body
microscope
pattern
Prior art date
Application number
PCT/JP2008/055291
Other languages
English (en)
French (fr)
Inventor
Mamoru Hirafuji
Ichiro Tominaga
Shigeto Eda
Original Assignee
Altair Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Altair Corporation filed Critical Altair Corporation
Priority to US12/448,861 priority Critical patent/US20100142040A1/en
Priority to EP08722643A priority patent/EP2128677A4/en
Publication of WO2008123146A1 publication Critical patent/WO2008123146A1/ja

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/086—Condensers for transillumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/12—Condensers affording bright-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G02B21/20—Binocular arrangements
    • G02B21/22—Stereoscopic arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

　透明あるいは半透明の試料を立体的に観察可能な顕微鏡を提供する。顕微鏡は、試料を設置する設置手段と、対物レンズを介して試料を視認可能な大きさに拡大する拡大手段と、模様が描かれた模様体部と、少なくとも模様体部に光を当てる投光手段とを備え、投光手段から投光された光を、模様体部を介し、設置手段により拡大手段の被写界深度内に配置された試料に当てることが可能な位置に、設置手段、模様体部、投光手段を設置したことを特徴とする。
PCT/JP2008/055291 2007-03-22 2008-03-21 顕微鏡 WO2008123146A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/448,861 US20100142040A1 (en) 2007-03-22 2008-03-21 Microscope
EP08722643A EP2128677A4 (en) 2007-03-22 2008-03-21 MICROSCOPE

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-075485 2007-03-22
JP2007075485 2007-03-22

Publications (1)

Publication Number Publication Date
WO2008123146A1 true WO2008123146A1 (ja) 2008-10-16

Family

ID=39830643

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/055291 WO2008123146A1 (ja) 2007-03-22 2008-03-21 顕微鏡

Country Status (4)

Country Link
US (1) US20100142040A1 (ja)
EP (1) EP2128677A4 (ja)
JP (1) JP4374392B2 (ja)
WO (1) WO2008123146A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011027906A (ja) * 2009-07-23 2011-02-10 Altair Giken Kk 顕微鏡
JP5421741B2 (ja) * 2009-11-20 2014-02-19 三鷹光器株式会社 手術顕微鏡

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003084206A (ja) * 2001-09-14 2003-03-19 Nikon Corp 格子照明顕微鏡
JP2006337896A (ja) * 2005-06-06 2006-12-14 Schott Ag 透過光明域照明装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5330350A (en) * 1976-09-01 1978-03-22 Olympus Optical Co Ltd Optical microscope
DE19644662C2 (de) * 1996-10-25 2000-04-13 Leica Microsystems Beleuchtungseinrichtung für ein Mikroskop
DE102004017694B3 (de) * 2004-04-10 2005-09-15 Schott Ag Durchlicht-Hellfeld-Beleuchtungseinrichtung
US7345815B2 (en) * 2004-04-28 2008-03-18 Olympus Corporation Illumination apparatus for microscope
DE102004053730B4 (de) * 2004-11-06 2014-04-03 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur Unterdrückung von Falschlicht
DE102005034829A1 (de) * 2005-07-26 2007-02-01 Leica Microsystems (Schweiz) Ag Mikroskop mit einer Operationsspaltlampe mit Laserlichtquelle

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003084206A (ja) * 2001-09-14 2003-03-19 Nikon Corp 格子照明顕微鏡
JP2006337896A (ja) * 2005-06-06 2006-12-14 Schott Ag 透過光明域照明装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2128677A4 *

Also Published As

Publication number Publication date
JP4374392B2 (ja) 2009-12-02
JP2008268928A (ja) 2008-11-06
EP2128677A1 (en) 2009-12-02
US20100142040A1 (en) 2010-06-10
EP2128677A4 (en) 2012-03-07

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