WO2008105448A1 - 外観検査装置の確認画面表示方法 - Google Patents
外観検査装置の確認画面表示方法 Download PDFInfo
- Publication number
- WO2008105448A1 WO2008105448A1 PCT/JP2008/053381 JP2008053381W WO2008105448A1 WO 2008105448 A1 WO2008105448 A1 WO 2008105448A1 JP 2008053381 W JP2008053381 W JP 2008053381W WO 2008105448 A1 WO2008105448 A1 WO 2008105448A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- camera
- external appearance
- movement
- inspection device
- appearance inspection
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
Abstract
外観検査装置で不良と自動判定された不良箇所を目視検査する際に、作業者の負担の少ない、外観検査装置の確認画面表示方法を提供する。
移動ボタンを押すと、確認画面表示用カメラ6が検査対象物に移動すると共に、モニタに「移動中」の文字表示と検査対象物と同系色の画面表示、または移動前のキャプチャ画像を表示し、カメラの移動終了と共に、モニタ画面をカメラ6の映像に切替え、不良箇所を一時的に操作部1にキャプチャした画像をモニタに表示する。作業者は、全て静止画像により検査でき、移動中の画像を見ることなく検査でき、負担が軽減する。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-049438 | 2007-02-28 | ||
JP2007049438A JP2008215827A (ja) | 2007-02-28 | 2007-02-28 | 外観検査装置の確認画面表示方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008105448A1 true WO2008105448A1 (ja) | 2008-09-04 |
Family
ID=39721273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/053381 WO2008105448A1 (ja) | 2007-02-28 | 2008-02-27 | 外観検査装置の確認画面表示方法 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2008215827A (ja) |
WO (1) | WO2008105448A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110146519A (zh) * | 2018-02-12 | 2019-08-20 | 志圣工业股份有限公司 | 电路板检测方法及电路板曝光方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08210987A (ja) * | 1995-02-02 | 1996-08-20 | Olympus Optical Co Ltd | 欠陥検出用顕微鏡装置 |
JPH0915162A (ja) * | 1995-06-27 | 1997-01-17 | Matsushita Electric Works Ltd | 基板外観目視検査装置 |
JP2867704B2 (ja) * | 1993-04-21 | 1999-03-10 | オムロン株式会社 | 目視検査支援装置および基板検査装置ならびにこれらを用いたはんだ付け検査方法および修正方法 |
JP2004347569A (ja) * | 2003-05-26 | 2004-12-09 | Nikon Corp | 観察装置 |
JP2005351809A (ja) * | 2004-06-11 | 2005-12-22 | Nikon Corp | 観察装置 |
-
2007
- 2007-02-28 JP JP2007049438A patent/JP2008215827A/ja active Pending
-
2008
- 2008-02-27 WO PCT/JP2008/053381 patent/WO2008105448A1/ja active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2867704B2 (ja) * | 1993-04-21 | 1999-03-10 | オムロン株式会社 | 目視検査支援装置および基板検査装置ならびにこれらを用いたはんだ付け検査方法および修正方法 |
JPH08210987A (ja) * | 1995-02-02 | 1996-08-20 | Olympus Optical Co Ltd | 欠陥検出用顕微鏡装置 |
JPH0915162A (ja) * | 1995-06-27 | 1997-01-17 | Matsushita Electric Works Ltd | 基板外観目視検査装置 |
JP2004347569A (ja) * | 2003-05-26 | 2004-12-09 | Nikon Corp | 観察装置 |
JP2005351809A (ja) * | 2004-06-11 | 2005-12-22 | Nikon Corp | 観察装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110146519A (zh) * | 2018-02-12 | 2019-08-20 | 志圣工业股份有限公司 | 电路板检测方法及电路板曝光方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2008215827A (ja) | 2008-09-18 |
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