WO2008105322A1 - 光リフレクトメトリ測定方法および装置 - Google Patents

光リフレクトメトリ測定方法および装置 Download PDF

Info

Publication number
WO2008105322A1
WO2008105322A1 PCT/JP2008/052991 JP2008052991W WO2008105322A1 WO 2008105322 A1 WO2008105322 A1 WO 2008105322A1 JP 2008052991 W JP2008052991 W JP 2008052991W WO 2008105322 A1 WO2008105322 A1 WO 2008105322A1
Authority
WO
WIPO (PCT)
Prior art keywords
optical
measuring
refractometry
measuring method
optical refractometry
Prior art date
Application number
PCT/JP2008/052991
Other languages
English (en)
French (fr)
Inventor
Xinyu Fan
Fumihiko Ito
Yusuke Koshikiya
Original Assignee
Nippon Telegraph And Telephone Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph And Telephone Corporation filed Critical Nippon Telegraph And Telephone Corporation
Priority to JP2009501211A priority Critical patent/JP4917640B2/ja
Priority to CN2008800048107A priority patent/CN101611301B/zh
Priority to US12/525,287 priority patent/US8149419B2/en
Priority to EP08711774.3A priority patent/EP2128588B1/en
Publication of WO2008105322A1 publication Critical patent/WO2008105322A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

　本発明は、測定距離によらず高い精度を得ることの可能な光リフレクトメトリ測定方法および光リフレクトメトリ測定装置を提供することを目的とする。 　本発明は、光周波数領域リフレクトメトリ測定方法（ＯＦＤＲ）を用いて測定対象における後方散乱光強度の光伝搬方向に対する分布を測定する光リフレクトメトリ測定方法および光リフレクトメトリ測定装置において、周波数掃引光源１のコヒーレンス特性をモニタするコヒーレンスモニタ部１２を設け、そのモニタの結果に基づいて測定部１１における測定結果を補正することを特徴とする。
PCT/JP2008/052991 2007-02-28 2008-02-21 光リフレクトメトリ測定方法および装置 WO2008105322A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2009501211A JP4917640B2 (ja) 2007-02-28 2008-02-21 光リフレクトメトリ測定方法および装置
CN2008800048107A CN101611301B (zh) 2007-02-28 2008-02-21 光反射测定方法以及装置
US12/525,287 US8149419B2 (en) 2007-02-28 2008-02-21 Optical reflectometry and optical reflectometer
EP08711774.3A EP2128588B1 (en) 2007-02-28 2008-02-21 Optical refractometry measuring method and device

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007-050769 2007-02-28
JP2007050769 2007-02-28
JP2007-282319 2007-10-30
JP2007282319 2007-10-30

Publications (1)

Publication Number Publication Date
WO2008105322A1 true WO2008105322A1 (ja) 2008-09-04

Family

ID=39721157

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/052991 WO2008105322A1 (ja) 2007-02-28 2008-02-21 光リフレクトメトリ測定方法および装置

Country Status (5)

Country Link
US (1) US8149419B2 (ja)
EP (2) EP2339316B1 (ja)
JP (1) JP4917640B2 (ja)
CN (1) CN101611301B (ja)
WO (1) WO2008105322A1 (ja)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010185842A (ja) * 2009-02-13 2010-08-26 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び装置
JP2010271137A (ja) * 2009-05-20 2010-12-02 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び光周波数領域反射測定装置
WO2011039116A1 (de) * 2009-09-30 2011-04-07 Lios Technology Gmbh Optisches verfahren und vorrichtung zur ortsaufgelösten messung mechanischer grössen, insbesondere mechanischer schwingungen mittels glasfasern
CN104038281A (zh) * 2014-06-20 2014-09-10 天津大学 非线性相位估计的长距离高分辨率光频域反射解调方法
JP2016161512A (ja) * 2015-03-04 2016-09-05 日本電信電話株式会社 光ファイバ振動測定方法及びシステム
JP2019020276A (ja) * 2017-07-18 2019-02-07 日本電信電話株式会社 空間多重光伝送路評価装置及び方法
JP2019020143A (ja) * 2017-07-11 2019-02-07 日本電信電話株式会社 光ファイバ振動検知センサおよびその方法
JP2019052938A (ja) * 2017-09-14 2019-04-04 日本電信電話株式会社 光反射測定装置及びその方法
WO2021131315A1 (ja) 2019-12-25 2021-07-01 国立研究開発法人産業技術総合研究所 光学的測定装置及び測定方法
US11309404B2 (en) * 2018-07-05 2022-04-19 Applied Materials, Inc. Integrated CMOS source drain formation with advanced control
WO2023170821A1 (ja) * 2022-03-09 2023-09-14 日本電信電話株式会社 複数の光ファイバの損失を一括で測定する装置及び方法
TWI821319B (zh) * 2018-07-05 2023-11-11 美商應用材料股份有限公司 利用先進控制方式的整合cmos源極汲極形成

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5325848B2 (ja) * 2010-08-13 2013-10-23 アンリツ株式会社 光パルス試験装置および光伝送路試験方法
US9178611B2 (en) * 2011-06-28 2015-11-03 Intuitive Surgical Operations, Inc. Fiber optic network interrogation tool for combined swept-heterodyne optical spectrum analysis and optical frequency-domain reflectometry
CN102322880B (zh) * 2011-08-18 2013-06-05 天津大学 偏振敏感的分布式光频域反射扰动传感装置和解调方法
TW201315170A (zh) * 2011-09-27 2013-04-01 Chunghwa Telecom Co Ltd 光頻域反射式光纖網路測試方法
US9222850B2 (en) 2013-03-14 2015-12-29 Axonoptics, Llc Integrated optics reflectometer
EP2826112A4 (en) * 2012-03-14 2016-04-20 Axonoptics Llc INTEGRATED OPTICAL REFLECTOMETER
US9557243B2 (en) 2012-03-14 2017-01-31 Axonoptics Llc Integrated optics reflectometer
CN102636196B (zh) * 2012-04-09 2014-09-17 天津大学 一种基于瑞利散射光谱相关系数的分布式扰动传感装置的解调方法
EP2720388A1 (en) * 2012-10-15 2014-04-16 Koninklijke Philips N.V. An optical frequency domain reflectometry (OFDR) system
EP2730947A1 (de) * 2012-11-12 2014-05-14 Technische Universität Hamburg-Harburg Lidar-Messsystem und Lidar-Messverfahren
CN102997937B (zh) * 2012-12-12 2014-07-30 天津大学 一种可抑制光源相位噪声的光频域反射装置和解调方法
US9632006B2 (en) 2013-06-10 2017-04-25 General Photonics Corporation Distributed fiber bend and stress measurement for determining optical fiber reliability by multi-wavelength optical reflectometry
WO2014201057A2 (en) * 2013-06-10 2014-12-18 General Photonics Corporation Devices and methods for characterization of distributed fiber bend and stress
CN103763022B (zh) * 2013-12-06 2017-01-04 南京硅源光电技术有限公司 一种基于高阶边带扫频调制的高空间分辨率光频域反射计***
CN103776474A (zh) * 2014-01-10 2014-05-07 江苏昂德光电科技有限公司 一种3d矩阵式多通道光纤传感解调***
JP6236369B2 (ja) * 2014-09-03 2017-11-22 日本電信電話株式会社 光ファイバの温度・歪み分布測定方法および装置
CN104296965A (zh) * 2014-09-20 2015-01-21 江苏骏龙电力科技股份有限公司 一种ofdr实验***
US10250323B2 (en) * 2015-05-28 2019-04-02 Telefonaktiebolaget L M Ericsson (Publ) Device and method for monitoring optical fibre link
CN106556415A (zh) * 2015-09-28 2017-04-05 中兴通讯股份有限公司 激光器相位噪声消除装置、***及方法
CN106705863B (zh) * 2017-01-16 2019-03-22 南京大学 一种提高光频域反射仪的最大测试距离的方法
JP6828227B2 (ja) * 2017-04-27 2021-02-10 アンリツ株式会社 光周波数領域反射測定装置及び光周波数領域反射測定方法
CN111164406B (zh) * 2017-10-05 2022-04-15 柯尼卡美能达株式会社 二维闪烁测定装置及二维闪烁测定方法
US11026575B2 (en) 2018-01-23 2021-06-08 Amo Development, Llc Methods and systems of optical coherence tomography with fiducial signal for correcting scanning laser nonlinearity
JP7069993B2 (ja) * 2018-04-09 2022-05-18 日本電信電話株式会社 光スペクトル線幅演算方法、装置およびプログラム
KR102196035B1 (ko) * 2018-12-26 2020-12-29 (주)미래컴퍼니 펄스 위상 이동을 이용한 3차원 거리측정 카메라의 비선형 거리 오차 보정 방법
JP7331373B2 (ja) * 2019-02-12 2023-08-23 日本電信電話株式会社 光周波数反射計測装置およびその計測方法
CN110579177B (zh) * 2019-07-30 2021-04-27 天津大学 基于相对相位变化的光频域反射分布式传感解调方法
CN110749419B (zh) * 2019-09-12 2021-04-13 芯华创(武汉)光电科技有限公司 一种ofdr检测方法
US11942986B2 (en) * 2021-09-24 2024-03-26 Viavi Solutions Inc. Optical time-domain reflectometer (OTDR) including channel checker
CN116659394B (zh) * 2023-06-07 2024-03-01 哈尔滨工业大学 一种基于延时重采样的扫频干涉测量非线性同步误差校正方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61260131A (ja) * 1985-05-15 1986-11-18 Kokusai Denshin Denwa Co Ltd <Kdd> 光スペクトル測定装置
US5511086A (en) 1995-03-22 1996-04-23 The Texas A&M University System Low noise and narrow linewidth external cavity semiconductor laser for coherent frequency and time domain reflectometry
EP0754939A1 (en) 1995-02-02 1997-01-22 Yokogawa Electric Corporation Optical fibre detecting device
JPH09218130A (ja) * 1996-02-09 1997-08-19 Nippon Telegr & Teleph Corp <Ntt> 周波数掃引誤差検出方法および回路、光周波数掃引光源、ならびに光周波数領域反射測定回路
EP1045237A2 (en) 1999-04-14 2000-10-18 Ando Electric Co., Ltd. Optical fiber characteristics measuring apparatus
JP2001352121A (ja) * 2000-06-09 2001-12-21 Canon Inc リングレーザーのスペクトル線幅の測定方法
EP1289150A1 (en) 2001-08-24 2003-03-05 STMicroelectronics S.r.l. A process for generating a variable frequency signal, for instance for spreading the spectrum of a clock signal, and device therefor
JP2003106944A (ja) * 2001-08-22 2003-04-09 Agilent Technol Inc 干渉計を用いた光学部品の特性測定システム及びその測定方法
WO2006068875A2 (en) 2004-12-14 2006-06-29 Luna Innovations Inc. Compensating for time varying phase changes in interferometric measurements

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2783323B1 (fr) * 1998-09-10 2000-10-13 Suisse Electronique Microtech Dispositif interferometrique pour relever les caracteristiques de reflexion et/ou de transmission optiques en profondeur d'un objet
US20030072051A1 (en) * 2000-10-16 2003-04-17 Myers Michael H. Orthogonal-code, photonic multiplexing
WO2004008092A1 (de) * 2002-07-15 2004-01-22 Campus Technologies Ag Vorrichtung und verfahren zur optischen spektroskopie und optischen sensorik sowie verwendung der vorrichtung
US7440087B2 (en) * 2004-02-24 2008-10-21 Luna Innovations Incorporated Identifying optical fiber segments and determining characteristics of an optical device under test based on fiber segment scatter pattern data
JP4409331B2 (ja) * 2004-03-30 2010-02-03 株式会社トプコン 光画像計測装置
US7365859B2 (en) * 2004-09-10 2008-04-29 The General Hospital Corporation System and method for optical coherence imaging
US8315282B2 (en) * 2005-01-20 2012-11-20 Massachusetts Institute Of Technology Fourier domain mode locking: method and apparatus for control and improved performance
US7589843B2 (en) * 2005-09-27 2009-09-15 Verity Instruments, Inc. Self referencing heterodyne reflectometer and method for implementing
WO2008013705A2 (en) * 2006-07-26 2008-01-31 Luna Innovations Incorporated High resolution interferometric optical frequency domain reflectometry ( ofdr) beyond the laser coherence length

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61260131A (ja) * 1985-05-15 1986-11-18 Kokusai Denshin Denwa Co Ltd <Kdd> 光スペクトル測定装置
EP0754939A1 (en) 1995-02-02 1997-01-22 Yokogawa Electric Corporation Optical fibre detecting device
US5511086A (en) 1995-03-22 1996-04-23 The Texas A&M University System Low noise and narrow linewidth external cavity semiconductor laser for coherent frequency and time domain reflectometry
JPH09218130A (ja) * 1996-02-09 1997-08-19 Nippon Telegr & Teleph Corp <Ntt> 周波数掃引誤差検出方法および回路、光周波数掃引光源、ならびに光周波数領域反射測定回路
EP1045237A2 (en) 1999-04-14 2000-10-18 Ando Electric Co., Ltd. Optical fiber characteristics measuring apparatus
JP2001352121A (ja) * 2000-06-09 2001-12-21 Canon Inc リングレーザーのスペクトル線幅の測定方法
JP2003106944A (ja) * 2001-08-22 2003-04-09 Agilent Technol Inc 干渉計を用いた光学部品の特性測定システム及びその測定方法
EP1289150A1 (en) 2001-08-24 2003-03-05 STMicroelectronics S.r.l. A process for generating a variable frequency signal, for instance for spreading the spectrum of a clock signal, and device therefor
WO2006068875A2 (en) 2004-12-14 2006-06-29 Luna Innovations Inc. Compensating for time varying phase changes in interferometric measurements

Non-Patent Citations (8)

* Cited by examiner, † Cited by third party
Title
FAN XINYU AND ITO F.: "Renketsu Sanshoho o Mochiita Kogen Coherence-cho o Koeru Sokutei Kyori o Motsu Shingata OFDR", PROCEEDINGS OF THE IEICE CONFERENCE, 2007 COMMUNICATIONS 2, 7 March 2007 (2007-03-07), pages 517, XP008112842 *
FAN XINYU, KOSHIKIYA Y., ITO F.: "Renketsu Sanshoho o Mochiita Laser Coherence-cho o Koeru Sokutei Kyori o Motsu Shingata OFDR", IEICE TECHNICAL REPORT, vol. 107, no. 52, 17 May 2007 (2007-05-17), pages 61 - 66, XP008112842 *
GLOMBITZA U ET AL.: "COHERENT FREQUENCY-DOMAIN REFLECTOMETRY FOR CHARACTERIZATION OF SINGLE-MODE INTEGRATED-OPTICAL WAVEGUIDES", JOURNAL OF LIGHTWAVE TECHNOLOGY, vol. II, no. 8, pages 1377 - 1384, XP000415389, DOI: doi:10.1109/50.254098
HOTATE K ET AL.: "Synthesis of optical-coherence function and its applications in distributed and multiplexed optical. sensing", JOURNAL OF LIGHTWAVE TECHNOLOGY IEEE USA, vol. 24, no. 7, July 2006 (2006-07-01), pages 2541 - 2557, XP002594242, DOI: doi:10.1109/JLT.2006.874645
KOSHIKIYA Y., FAN XINYU, ITO F.: "SSB Henchoki o Mochiita Shuhasu Ryoiki Hansha Sokuteiho ni Okeru Rayleigh Koho Sanranko no Chokyori Range. Kokyori Bunkaino Sokutei", PROCEEDINGS OF THE IEICE CONFERENCE, 2007 COMMUNICATIONS 2, 7 March 2007 (2007-03-07), pages 516, XP008137985 *
PASSY R ET AL.: "Experimental and theoretical investigations of coherent OFDR with semiconductor laser sources", JOURNAL OF LIGHTWAVE TECHNOLOGY USA, vol. 12, no. 9, September 1994 (1994-09-01), pages 1622 - 1630, XP000484341, DOI: doi:10.1109/50.320946
See also references of EP2128588A4
W. EICKHOFF; R. ULRICH: "Applied Physics Letters", OPTICAL FREQUENCY DOMAIN REFLECTOMETRY IN SINGLE-MODE FIBER, vol. 39, no. 9, pages 693 - 695

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010185842A (ja) * 2009-02-13 2010-08-26 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び装置
JP2010271137A (ja) * 2009-05-20 2010-12-02 Nippon Telegr & Teleph Corp <Ntt> 光周波数領域反射測定方法及び光周波数領域反射測定装置
WO2011039116A1 (de) * 2009-09-30 2011-04-07 Lios Technology Gmbh Optisches verfahren und vorrichtung zur ortsaufgelösten messung mechanischer grössen, insbesondere mechanischer schwingungen mittels glasfasern
CN104038281A (zh) * 2014-06-20 2014-09-10 天津大学 非线性相位估计的长距离高分辨率光频域反射解调方法
CN104038281B (zh) * 2014-06-20 2017-07-11 天津大学 非线性相位估计的长距离高分辨率光频域反射解调方法
JP2016161512A (ja) * 2015-03-04 2016-09-05 日本電信電話株式会社 光ファイバ振動測定方法及びシステム
JP2019020143A (ja) * 2017-07-11 2019-02-07 日本電信電話株式会社 光ファイバ振動検知センサおよびその方法
JP2019020276A (ja) * 2017-07-18 2019-02-07 日本電信電話株式会社 空間多重光伝送路評価装置及び方法
JP2019052938A (ja) * 2017-09-14 2019-04-04 日本電信電話株式会社 光反射測定装置及びその方法
US11309404B2 (en) * 2018-07-05 2022-04-19 Applied Materials, Inc. Integrated CMOS source drain formation with advanced control
TWI821319B (zh) * 2018-07-05 2023-11-11 美商應用材料股份有限公司 利用先進控制方式的整合cmos源極汲極形成
WO2021131315A1 (ja) 2019-12-25 2021-07-01 国立研究開発法人産業技術総合研究所 光学的測定装置及び測定方法
WO2023170821A1 (ja) * 2022-03-09 2023-09-14 日本電信電話株式会社 複数の光ファイバの損失を一括で測定する装置及び方法

Also Published As

Publication number Publication date
CN101611301B (zh) 2012-11-07
EP2128588B1 (en) 2013-04-10
EP2339316B1 (en) 2012-07-25
EP2128588A4 (en) 2010-09-15
JPWO2008105322A1 (ja) 2010-06-03
CN101611301A (zh) 2009-12-23
US8149419B2 (en) 2012-04-03
EP2128588A1 (en) 2009-12-02
US20100097615A1 (en) 2010-04-22
JP4917640B2 (ja) 2012-04-18
EP2339316A1 (en) 2011-06-29

Similar Documents

Publication Publication Date Title
WO2008105322A1 (ja) 光リフレクトメトリ測定方法および装置
WO2007090147A3 (en) Method and apparatus for measurement of optical properties in tissue
EP2772738A3 (en) Optical fiber temperature distribution measurement device and method of measuring optical fiber temperature distribution
EP1760424A4 (en) DISTRIBUTED OPTICAL FIBER SENSOR
GB201307338D0 (en) Methods related to instrument-independent measurements for quantitive analysis of fiber-optic Raman sepctroscopy
WO2014155400A8 (en) Apparatus for interrogating distributed stimulated brillouin scattering optical fibre sensors using a quickly tuneable brillouin ring laser
EP2400284A3 (en) Optical fiber temperature distribution measuring device
WO2012018214A3 (en) Optic fiber distributed temperature sensor system with self-correction function and temperature measuring method using thereof
WO2013090631A3 (en) Film thickness monitor
MX2011007835A (es) Sensor de fibra óptica de iluminación lateral, multi paramétrico y com múltiples puntos sensores.
WO2008100409A3 (en) Method and apparatus for determining reflectance data of a subject
EP2600114A3 (en) Multi-point measuring method of fbg sensor and multi-point measuring apparatus
TW200643472A (en) Apparatus and methods for scatterometry of optical devices
GB201022138D0 (en) Display device and means to measure and isolate the ambient light
WO2008040939A3 (en) Measuring brillouin backscatter from an optical fibre using a tracking signal
WO2009120643A3 (en) Dimensional probe and methods of use
GB201320077D0 (en) Laser tracker that combines two different wavelengths with a fiber-optic coupler
ATE460641T1 (de) Optisches bildmessgerät
WO2013012495A3 (en) System and method of distributed fiber optic sensing including integrated reference path
BRPI1005662A8 (pt) Dispositivo e método para detectar placas na cavidade bucal
WO2011091439A3 (en) Fiberoptic probe for measuring tissue oxygenation and method for using same
WO2008038182A3 (en) Ultrasonic determination of optical absorption coefficients
WO2009134310A3 (en) Apparatus for measurement of the axial length of an eye
EP2392900A3 (en) Interferometer
IN2014KN01266A (ja)

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200880004810.7

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08711774

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2009501211

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 12525287

Country of ref document: US

WWE Wipo information: entry into national phase

Ref document number: 2008711774

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: DE