WO2008089371A3 - Automated noise measurement system - Google Patents

Automated noise measurement system Download PDF

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Publication number
WO2008089371A3
WO2008089371A3 PCT/US2008/051374 US2008051374W WO2008089371A3 WO 2008089371 A3 WO2008089371 A3 WO 2008089371A3 US 2008051374 W US2008051374 W US 2008051374W WO 2008089371 A3 WO2008089371 A3 WO 2008089371A3
Authority
WO
WIPO (PCT)
Prior art keywords
measurement system
noise measurement
noise
automated noise
automated
Prior art date
Application number
PCT/US2008/051374
Other languages
French (fr)
Other versions
WO2008089371A2 (en
Inventor
Todd Wangsness
Eugene Rzyski
Original Assignee
Omniphase Res Lab Inc
Todd Wangsness
Eugene Rzyski
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omniphase Res Lab Inc, Todd Wangsness, Eugene Rzyski filed Critical Omniphase Res Lab Inc
Priority to JP2009546522A priority Critical patent/JP2010517016A/en
Priority to EP08713815A priority patent/EP2109775A2/en
Priority to CA002673529A priority patent/CA2673529A1/en
Priority to AU2008206142A priority patent/AU2008206142A1/en
Priority to MX2009007650A priority patent/MX2009007650A/en
Publication of WO2008089371A2 publication Critical patent/WO2008089371A2/en
Publication of WO2008089371A3 publication Critical patent/WO2008089371A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Amplifiers (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

A noise test measurement system configured to measure a noise component of a transmitted RF signal is described. The noise test measurement system may include an antenna, a low-noise amplifier, a local oscillator, a first coupler, a first variable phase- shifter, a first mixer, and a processor.
PCT/US2008/051374 2007-01-17 2008-01-17 Automated noise measurement system WO2008089371A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2009546522A JP2010517016A (en) 2007-01-17 2008-01-17 Automatic noise measurement system
EP08713815A EP2109775A2 (en) 2007-01-17 2008-01-17 Automated noise measurement system
CA002673529A CA2673529A1 (en) 2007-01-17 2008-01-17 Automated noise measurement system
AU2008206142A AU2008206142A1 (en) 2007-01-17 2008-01-17 Automated noise measurement system
MX2009007650A MX2009007650A (en) 2007-01-17 2008-01-17 Automated noise measurement system.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US88521807P 2007-01-17 2007-01-17
US60/885,218 2007-01-17

Publications (2)

Publication Number Publication Date
WO2008089371A2 WO2008089371A2 (en) 2008-07-24
WO2008089371A3 true WO2008089371A3 (en) 2008-09-04

Family

ID=39523359

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2008/051374 WO2008089371A2 (en) 2007-01-17 2008-01-17 Automated noise measurement system

Country Status (7)

Country Link
EP (1) EP2109775A2 (en)
JP (1) JP2010517016A (en)
KR (1) KR20090115729A (en)
AU (1) AU2008206142A1 (en)
CA (1) CA2673529A1 (en)
MX (1) MX2009007650A (en)
WO (1) WO2008089371A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2480902B1 (en) * 2009-09-23 2020-03-25 Oewaves, Inc. Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay
WO2011047699A1 (en) * 2009-10-21 2011-04-28 Verigy (Singapore) Pte. Ltd. Test device and test method for measuring a phase noise of a test signal
US20160245913A1 (en) * 2015-02-19 2016-08-25 Korea Advanced Institute Of Science And Technology Apparatus and method for measuring precipitation in the atmosphere using k-band frequency-modulated continuous wave (fmcw) weather radar system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998004054A1 (en) * 1996-07-18 1998-01-29 Ericsson Inc. System and method for reducing cumulative noise in a distributed antenna network
US20020070803A1 (en) * 2000-08-15 2002-06-13 Eugene Rzyski Intermodulation product cancellation circuit
EP1689093A2 (en) * 2005-02-04 2006-08-09 Fujitsu Limited Signal transmission system and signal transmission method with power control

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5608331A (en) * 1995-06-06 1997-03-04 Hughes Electronics Noise measurement test system
US6745020B2 (en) * 2002-08-29 2004-06-01 Eugene Rzyski Direct downconversion receiver

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998004054A1 (en) * 1996-07-18 1998-01-29 Ericsson Inc. System and method for reducing cumulative noise in a distributed antenna network
US20020070803A1 (en) * 2000-08-15 2002-06-13 Eugene Rzyski Intermodulation product cancellation circuit
EP1689093A2 (en) * 2005-02-04 2006-08-09 Fujitsu Limited Signal transmission system and signal transmission method with power control

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
GIORDANO ET AL: "The <maths><tex>$\pm$</tex></maths> 45[deg.] Correlation Interferometer as a Means to Measure Phase Noise of Parametric Origin", TRUMENTATION AND MEASUREMENT, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, vol. 52, no. 1, 1 February 2003 (2003-02-01), XP011074091, ISSN: 0018-9456 *

Also Published As

Publication number Publication date
EP2109775A2 (en) 2009-10-21
WO2008089371A2 (en) 2008-07-24
JP2010517016A (en) 2010-05-20
KR20090115729A (en) 2009-11-05
CA2673529A1 (en) 2008-07-24
MX2009007650A (en) 2009-10-12
AU2008206142A1 (en) 2008-07-24

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