WO2008081742A1 - Resistance variable element, resistance variable storage device and resistance variable device - Google Patents

Resistance variable element, resistance variable storage device and resistance variable device Download PDF

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Publication number
WO2008081742A1
WO2008081742A1 PCT/JP2007/074559 JP2007074559W WO2008081742A1 WO 2008081742 A1 WO2008081742 A1 WO 2008081742A1 JP 2007074559 W JP2007074559 W JP 2007074559W WO 2008081742 A1 WO2008081742 A1 WO 2008081742A1
Authority
WO
WIPO (PCT)
Prior art keywords
resistance variable
electrode
storage device
resistance
voltage
Prior art date
Application number
PCT/JP2007/074559
Other languages
French (fr)
Japanese (ja)
Inventor
Shunsaku Muraoka
Koichi Osano
Satoru Fujii
Original Assignee
Panasonic Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corporation filed Critical Panasonic Corporation
Priority to JP2008552095A priority Critical patent/JPWO2008081742A1/en
Priority to US12/519,476 priority patent/US8018761B2/en
Publication of WO2008081742A1 publication Critical patent/WO2008081742A1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/30—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having three or more electrodes, e.g. transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/011—Manufacture or treatment of multistable switching devices
    • H10N70/021—Formation of switching materials, e.g. deposition of layers
    • H10N70/026—Formation of switching materials, e.g. deposition of layers by physical vapor deposition, e.g. sputtering
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20—Multistable switching devices, e.g. memristors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/821—Device geometry
    • H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/881—Switching materials
    • H10N70/883—Oxides or nitrides
    • H10N70/8836—Complex metal oxides, e.g. perovskites, spinels
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G11C2013/0073—Write using bi-directional cell biasing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G11C2013/0083—Write to perform initialising, forming process, electro forming or conditioning
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70—Resistive array aspects
    • G11C2213/79—Array wherein the access device being a transistor

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Networks Using Active Elements (AREA)

Abstract

A resistance variable element (10), a resistance variable storage device and a resistance variable device are provided with a first electrode(2); a second electrode (4); and a resistance variable layer (3), which is arranged between the first electrode (2) and the second electrode (4) and is electrically connected with the first electrode (2) and the second electrode (4). The resistance variable layer (3) includes a material, which is expressed by a chemical formula of (NiXFe1-X)Fe2O4, where X is 0.35 or more but not more than 0.9, and has a spinel structure. The resistance variable element, the resistance variable storage device and the resistance variable device have such characteristics that the electrical resistance between the first electrode (2) and the second electrode (4) lowers when a first voltage pulse having a first voltage is applied between the first electrode (2) and the second electrode (4) and that the electrical resistance between the first electrode (2) and the second electrode (4) increases when a second voltage pulse having a second voltage with a polarity different from that of the first voltage is applied between the first electrode (2) and the second electrode (4).
PCT/JP2007/074559 2006-12-28 2007-12-20 Resistance variable element, resistance variable storage device and resistance variable device WO2008081742A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008552095A JPWO2008081742A1 (en) 2006-12-28 2007-12-20 Resistance change element, resistance change memory device, and resistance change device
US12/519,476 US8018761B2 (en) 2006-12-28 2007-12-20 Resistance variable element, resistance variable memory apparatus, and resistance variable apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006-354208 2006-12-28
JP2006354208 2006-12-28

Publications (1)

Publication Number Publication Date
WO2008081742A1 true WO2008081742A1 (en) 2008-07-10

Family

ID=39588426

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/074559 WO2008081742A1 (en) 2006-12-28 2007-12-20 Resistance variable element, resistance variable storage device and resistance variable device

Country Status (4)

Country Link
US (1) US8018761B2 (en)
JP (1) JPWO2008081742A1 (en)
CN (1) CN101569011A (en)
WO (1) WO2008081742A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102306705A (en) * 2011-09-16 2012-01-04 北京大学 Multi-valued resistance random access memory with high capacity
US9006697B2 (en) 2012-03-23 2015-04-14 Kabushiki Kaisha Toshiba Resistance change element and nonvolatile memory device

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2614700C (en) 2005-07-14 2011-07-19 National Institute Of Pharmaceutical R&D Co., Ltd. Medicinal composition containing ginseng secondary glycosides, its preparation method and application
KR20090095313A (en) * 2008-03-05 2009-09-09 삼성전자주식회사 Programming Method of the Resistive memory device
JP5549105B2 (en) * 2009-04-15 2014-07-16 ソニー株式会社 Resistance change type memory device and operation method thereof
JP5295465B2 (en) * 2011-02-23 2013-09-18 パナソニック株式会社 Nonvolatile memory element and manufacturing method thereof
CN102185107B (en) * 2011-05-10 2013-07-31 中山大学 Resistance-type random storage component and preparation method thereof
US8982603B2 (en) * 2011-05-11 2015-03-17 Panasonic Intellectual Property Management Co., Ltd. Cross point variable resistance nonvolatile memory device and method of reading thereby
US9236102B2 (en) 2012-10-12 2016-01-12 Micron Technology, Inc. Apparatuses, circuits, and methods for biasing signal lines
US9042190B2 (en) 2013-02-25 2015-05-26 Micron Technology, Inc. Apparatuses, sense circuits, and methods for compensating for a wordline voltage increase
US9672875B2 (en) 2014-01-27 2017-06-06 Micron Technology, Inc. Methods and apparatuses for providing a program voltage responsive to a voltage determination
US9947400B2 (en) * 2016-04-22 2018-04-17 Nantero, Inc. Methods for enhanced state retention within a resistive change cell
US10446228B2 (en) 2017-12-23 2019-10-15 Nantero, Inc. Devices and methods for programming resistive change elements
US10483464B1 (en) * 2018-05-31 2019-11-19 Uchicago Argonne, Llc Resistive switching memory device
CN110675906B (en) * 2018-07-03 2021-10-08 华邦电子股份有限公司 Method for detecting resistance type random access memory unit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005101420A1 (en) * 2004-04-16 2005-10-27 Matsushita Electric Industrial Co. Ltd. Thin film memory device having a variable resistance
WO2006028117A1 (en) * 2004-09-09 2006-03-16 Matsushita Electric Industrial Co., Ltd. Resistance change element and manufacturing method thereof
JP2006080259A (en) * 2004-09-09 2006-03-23 Matsushita Electric Ind Co Ltd Resistance change element, nonvolatile memory using it, and manufacturing method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6204139B1 (en) * 1998-08-25 2001-03-20 University Of Houston Method for switching the properties of perovskite materials used in thin film resistors
JP4613478B2 (en) 2003-05-15 2011-01-19 ソニー株式会社 Semiconductor memory element and semiconductor memory device using the same
KR100773537B1 (en) 2003-06-03 2007-11-07 삼성전자주식회사 Nonvolatile memory device composing one switching device and one resistant material and method of manufacturing the same
JP4701427B2 (en) 2004-04-28 2011-06-15 パナソニック株式会社 Switching element and array type functional element using the same
JP2006319166A (en) 2005-05-13 2006-11-24 Matsushita Electric Ind Co Ltd Manufacturing method of storage cell

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005101420A1 (en) * 2004-04-16 2005-10-27 Matsushita Electric Industrial Co. Ltd. Thin film memory device having a variable resistance
WO2006028117A1 (en) * 2004-09-09 2006-03-16 Matsushita Electric Industrial Co., Ltd. Resistance change element and manufacturing method thereof
JP2006080259A (en) * 2004-09-09 2006-03-23 Matsushita Electric Ind Co Ltd Resistance change element, nonvolatile memory using it, and manufacturing method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102306705A (en) * 2011-09-16 2012-01-04 北京大学 Multi-valued resistance random access memory with high capacity
US8633465B2 (en) 2011-09-16 2014-01-21 Peking University Multilevel resistive memory having large storage capacity
US9006697B2 (en) 2012-03-23 2015-04-14 Kabushiki Kaisha Toshiba Resistance change element and nonvolatile memory device

Also Published As

Publication number Publication date
US8018761B2 (en) 2011-09-13
US20100027320A1 (en) 2010-02-04
CN101569011A (en) 2009-10-28
JPWO2008081742A1 (en) 2010-04-30

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