Classifications

• • A—HUMAN NECESSITIES
  • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
  • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
  • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
  • A61B6/48—Diagnostic techniques
  • A61B6/482—Diagnostic techniques involving multiple energy imaging
• • A—HUMAN NECESSITIES
  • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
  • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
  • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
  • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
  • A61B6/03—Computed tomography [CT]
  • A61B6/032—Transmission computed tomography [CT]
• • A—HUMAN NECESSITIES
  • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
  • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
  • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
  • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
  • A61B6/4021—Arrangements for generating radiation specially adapted for radiation diagnosis involving movement of the focal spot
  • A61B6/4028—Arrangements for generating radiation specially adapted for radiation diagnosis involving movement of the focal spot resulting in acquisition of views from substantially different positions, e.g. EBCT
• • A—HUMAN NECESSITIES
  • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
  • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
  • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
  • A61B6/46—Arrangements for interfacing with the operator or the patient
  • A61B6/461—Displaying means of special interest
  • A61B6/466—Displaying means of special interest adapted to display 3D data
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
  • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
  • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
  • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
• • A—HUMAN NECESSITIES
  • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
  • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
  • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
  • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
  • A61B6/025—Tomosynthesis
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N2223/00—Investigating materials by wave or particle radiation
  • G01N2223/40—Imaging
  • G01N2223/419—Imaging computed tomograph
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N2223/00—Investigating materials by wave or particle radiation
  • G01N2223/60—Specific applications or type of materials
  • G01N2223/612—Specific applications or type of materials biological material

Definitions

• NCI National Institute of Cancer
• the subject matter described herein relates to x-ray imaging. More specifically, the subject matter describes methods, systems and computer program products for multiplexing computed tomography.
• X-ray radiation is widely used to probe the internal structure of materials in applications such as medical diagnosis, security screening, and industrial inspection.
• simple imaging methods x-ray photons are transmitted through an object.
• the transmitted x-ray photons collected by a recording device over a period of time to form a static projection image with overlapping structural features.
• More advanced imaging methods such as computed tomography (CT), use multiple projection images from different viewing angles for image reconstruction or multiple frame images for contrast enhancement purposes.
• CT computed tomography
• Typical CT scanners achieve multiple viewing angles by high-speed rotation of an x-ray tube around an object. This requires a large and complicated gantry, which limits current medical CT scanners to about one second per scan. This sequential recording of x-ray images is inefficient when a large number of images of the same object are required. For example, CT scanners with a single-pixel x-ray tube take about 0.5 seconds for the x-ray tube to make one 360 degree rotation. In the process of this one rotation, about 1 ,000-2,000 projection images are taken. Each exposure is roughly 250-500 ⁇ s. For applications such as medical imaging, the long exposure times of current CT systems make them undesirable or ineffective.
• Techniques for increasing data collection speed for single-pixel x-ray tube systems include increasing the rotation speed of the x-ray tube or increasing the x-ray flux. However, these techniques are limited by physical constraints regarding the maximal rotation speed of the x-ray tube and overheating of the anode surface.
• One aspect can include an x-ray generating device configured to simultaneously generate a plurality of x-ray beams having distinct waveforms and configured to transmit the x-ray beams toward an object from a plurality of different viewing angles.
• An x-ray detector can be provided operable to detect x-ray intensities of the plurality of x-ray beams as a function of time and an image processing module operable to extract individual projection image data from the detected x-ray intensities based on the distinct waveforms of the x-ray beams for combining the projection image data to generate three-dimensional tomographic image data of the object according to an aspect of the subject matter described herein.
• the subject matter described herein can be implemented using a computer program product comprising computer executable instructions embodied in a computer readable medium.
• Exemplary computer readable media suitable for implementing the subject matter described herein can include chip memory devices, disc memory devices, application specific integrated circuits, programmable logic devices, and downloadable electrical signals.
• a computer program product that implements a subject matter described herein can reside on a single device or computing platform or can be distributed across multiple devices or computing platforms.
• Figure 1 is a block diagram of one example of a multiplexing computed tomography system according to the subject matter described herein;
• Figure 2 illustrates a perspective side view of a multiplexing CT system according to the subject matter described herein;
• Figure 3 illustrates a front view of a stationary, planar multiplexing CT system according to the subject matter described herein;
• Figure 4 is a flow chart of a process for performing multiplexing computed tomography according to the subject matter described herein;
• Figures 5A-5F are graphs of simulation results of a two-beam multiplexing CT system according to the subject matter described herein;
• Figures 6A-6F are graphs of simulation results of an eight-beam multiplexing CT system according to the subject matter described herein;
• Figure 7 is a schematic, cross-sectional side view of a multi-pixel, field emission x-ray source according to the subject matter described herein;
• Figure 8 is a schematic, cross-sectional side view of an x-ray unit of the x-ray source shown in Figure 8 for generating a single, pulsed x-ray beam according to the subject matter described herein;
• Figures 9A-9C are graphs illustrating the sum of two x-ray waveforms experimentally measured by an x-ray intensity detector
• Figure 10 is a graph of two x-ray beams with square waveforms after a Fourier transform has been performed on the data.
• Figure 11 illustrates a perspective side view of a multiplexing CT system with a rotating gantry and movable object stage according to the subject matter described herein.
• a multiplexing CT system can include an x-ray generating device configured to simultaneously generate a plurality of x-ray beams having distinct waveforms and configured to transmit the x-ray beams toward an object from a plurality of different viewing angles.
• a multiplexing computed tomography system can include an x-ray detector to detect x-ray intensities of the plurality of x-ray beams as a function of time.
• a multiplexing CT system can include an image processing module to extract individual projection image data from the detected x-ray intensities based on the distinct waveforms of the x-ray beams for combining the projection image data to generate three- dimensional tomographic image data of the object.
• a multiplexing computed tomography system can simultaneously generate pixellated x-ray beams with programmable waveforms and direct the x-ray beams to an object to be imaged.
• the x-ray beams can be generated by a multi-beam field emission x-ray (MBFEX) source.
• the x-ray beams can be detected by a digital x-ray detector.
• An image processing module can be operable to extract individual projection data from the detected x-rays based on the waveforms of the x-rays for combining the projection image data to generate three-dimensional tomographic image data of the object.
• the parallel imaging process may be advantageous, for example, because it can reduce the total data collection time for CT imaging and the x-ray intensity required from the x-ray source.
• the x-ray beams can each be generated by single-pixel x-ray sources using carbon nanotube (CNT) based field emission cathodes, which have the capability for generating x- rays with programmable waveforms where the intensity, pulse width and repetition rate can be readily varied.
• CNT carbon nanotube
• FIG. 1 is a block diagram of an exemplary multiplexing computed tomography system generally designated 100 according to one aspect of the subject matter described herein.
• System 100 can collect three-dimensional tomographic image data ID of an object O.
• a multiplexing function MPF
• MPF multiplexing function
• MBFEX multi-beam field emission x-ray
• the MPF controls the XGD to generate beams XB1, XB2, and XBk at a distinct temporal frequency ⁇ by pixels (x, y) of x-ray generator XGD.
• all x-ray beams XB1 , XB2, and XBk can be detected by a high frame rate x-ray detector XD which outputs temporal data l(x, y, t) for every pixel.
• X-ray beams XB1 , XB2, and XBk can have distinct waveforms. As described below, the distinct waveforms allow downstream processing components to distinguish the data obtained from the different projection angles.
• the temporal data set can be processed by a demultiplexing function
• the DMPF can include a temporal Fourier transform function (TFT) operable to obtain frequency domain spectrum l(x, y, ⁇ ) based on the temporal data.
• TFT temporal Fourier transform function
• Noise in the temporal data may be filtered by a numerical n-band filter for obtaining n distinct principle components d(x, y, ⁇ k).
• An exemplary noise filter is described in U.S. Patent Application No.
• the principle components generated by function TFT can correspond to a particular x-ray beam generated by x-ray generator device XGD.
• the principle components can correspond to x-ray beams XB1 , XB2, and XBk.
• the kth principle component generated by function TFT corresponds to x-ray beam XBk generated from x-ray generator device XGD operating at ⁇ frequency.
• the principle components can be used to form projection image data PM , PI2, and PIk from x-ray beams XB1 , XB2, and XBk.
• the distinct waveform frequencies allow function TFT to distinguish the data obtained from the different projection angles.
• a number n of projection images can simultaneously be obtained during an exposure time of a single projection image using only one detector.
• a system according to the subject matter described herein can advantageously increase projection image data acquisition speed by n- fold over conventional CT systems.
• Projection image data PH , PI2, and PIk can be communicated to a image processing module IPM operable to combine the projection image data into three-dimensional tomographic image data ID of object O.
• Image data ID can be communicated to a display D operable to display a three- dimensional image of object O based on image data ID.
• FIG. 2 illustrates a perspective view of an exemplary multiplexing CT system generally designated 200 according to an aspect of the subject matter described herein.
• multiplexing CT system 200 can comprise an x-ray generating device XGD comprising a multi-beam field emission x-ray source operable to generate a plurality of x-ray beams XB1 and XB2 from a plurality of focal spots on the x-ray anode surface.
• X-ray generating device XGD can have an anode shaped with a ring- shaped geometry with focal spots FS arranged for forming 360 degree viewing angles.
• the generated x-ray beams are directed towards a center of the ring-shape for targeting object O positioned on an object stage OS.
• An x-ray detector XD can be positioned for receiving x-ray beams that pass through or past object O.
• Each focal spot FS can be equal distance to object O.
• the number of focal spots required can be in the range of about 100 to about 3,000 and covering over about 180 degrees to about 360 degrees of viewing angles.
• the total number of projection images and the range of the viewing angles can be smaller.
• x-ray beams covering about 30-50 degrees viewing angles may be sufficient.
• Figure 3 illustrates a schematic diagram of a stationary, planar multiplexing CT system 300 according to an aspect of the subject matter described herein.
• x-ray generator device XGD includes a plurality of focal spots (1-N), such as focal spots FS, positioned on an anode surface.
• Focal spots FS can be configured to emit x-ray beams, generally designated XB, when bombarded by x-rays from an x-ray source.
• X-ray beams XB can each having distinct waveforms.
• X-ray beams XB can be directed toward object O from a plurality of different viewing angles.
• X-ray detector XD can be configured for detecting the x-ray beams passing through or past object O.
• x-ray detector XD can detect the x-ray intensities of the x-ray beams passing through or past object O as a function of time.
• An image processing module can extract individual projection image data from the detected x-ray intensities based on the distinct waveforms of the x-ray beams for combining the projection image data to generate three-dimensional tomographic image data of the object.
• the three-dimensional tomographic image data can be stored and/or used by a suitable display for displaying a three-dimensional image of object O.
• FIG. 4 is a flow chart of an exemplary process for performing multiplexing computed tomography according to an aspect of the subject matter described herein.
• an object is illuminated by a plurality of x-ray beams from a plurality of viewing angles.
• Each x-ray beam can have a distinct waveform, which is controlled by multiplexing function MPF.
• x-ray generator device XGD shown in Figure 1 can be controlled to generate x-ray beams XB1 , XB2, and XBk having distinct temporal waveforms and direct the x-ray beams toward object O.
• the x-ray intensities of the plurality of x-ray beams can be detected as a function of time.
• the x-ray beams illuminating object O can be detected by x-ray detector XD.
• the x-ray detector can be an array or an area digital x-ray detector wherein the frame rate of the detector is faster than pulse rates of the x-ray beams.
• individual projection image data can be extracted from the detected x-ray intensities by a demultiplexing function DMPF corresponding to the specific MPF.
• the extracted individual image data can be combined to generate three-dimensional tomographic image data of the object.
• a three-dimensional image of the object based on the generated three-dimensional image data of the object can be displayed.
• display D can display a three-dimensional image of object O based on the generated three- dimensional image data ID of object O.
• requirements for the x-ray intensity can be significantly reduced and image data collection times can be reduced or at least equal to the total image data collection time required of conventional serial CT scanner.
• image data collection times can be reduced or at least equal to the total image data collection time required of conventional serial CT scanner.
• the same example discussed above is used. Assuming 1000 projection images are required for reconstruction and each image requires 500 ⁇ s x 1 Ampere x-ray dose, conventional CT scanners with a serial approach can capture 1000 exposures sequentially, at 500 ⁇ s x 1 Ampere x-ray dose each. This process will require about 0.5 second.
• a system in accordance with the subject matter described herein including 1000 x-ray emitting pixels covering more than 180 degree viewing angle range is used.
• each x-ray beam is pulsed at a different frequency.
• each x-ray beam has a square waveform and a 50% duty cycle.
• the frequency range of the 1000 x-ray beams is between f and 3f, where f is the lowest frequency of the group.
• 1 Ampere (A) tube current instead of using 1 Ampere (A) tube current as in conventional systems, the value is reduced to 0.1 A tube current for each pixel. To keep the same x-ray dose per exposure, the total exposure time of each beam is increased by a factor of 10.
• each x-ray beam is on for 10 milliseconds (500 ⁇ s x 10 /50%).
• the x-ray tube current of each pulse is 0.1 A. Since all of the beams are on at the same time, the total exposure time of the entire scan is 10 milliseconds, which is 50 times faster than in a conventional system using the serial method (0.5 second). Further, the x-ray tube current required is only 10% of that used for conventional CT scanners and without sacrificing imaging quality.
• the reduction in the x-ray tube current made possible by the subject matter described herein can be important, for example, because lower tube current results in lower costs, longer system lifetime, and smaller size as compared to conventional systems.
• the subject matter described herein can be used in accordance with energy subtraction imaging techniques.
• energy subtraction techniques two or more images of the same object can be taken using x-ray beams having different energy levels.
• the x-ray beams having different energy levels are applied sequentially to an object, wherein a first image of the object is captured using an x-ray beam having energy level E1 , and subsequently a second image of the object is captured using a second x-ray beam having energy level E2.
• an x- ray generator device can be controlled such that x-ray beams are generated with differing energy levels wherein energy level E1 is slightly above an absorption edge of the object and energy level E2 is slightly below the absorption edge of the object.
• the x-ray intensity of one image can be subtracted from the x-ray intensity of the second image to increase the contrast of the elements of interest.
• objects in motion can cause difficulty in registering the two images.
• two single-pixel x-ray sources and a digital x-ray detector can be used.
• Source 1 can be operated at an anode energy of E1
• source 2 can operated at an anode energy of E2.
• the two x-ray beams can be pulsed at frequencies of f1 and f2.
• the duty cycles of the two pulsed x-ray beams are higher than 50%.
• Figures 5A-5F and 6A-6F are graphs of simulation results of two- and eight-beam multiplexing CT systems, respectively, according to aspects of the subject matter described herein.
• the graphs of Figure 5A and 5B show x-ray intensity versus time data for first and second x-ray beams, respectively, generated by a system in accordance with the subject matter described herein.
• X-ray intensity is measured in photons received per second, also referred to as counts per second.
• Figure 5C shows the sum of the waveforms of the first and second x-ray beams.
• Figures 5D-5F show corresponding x-ray data in the frequency domain for each of the waveforms shown in Figures 5A-5C, respectively.
• the x-ray beams from the first and second x-ray beams are identifiable based on their frequencies in Figures 5D-5F.
• This data can be utilized by an image processing module for extracting individual projection image data from detected x-ray intensities based on the distinct waveforms of the x-ray beams for combining projection image data to generate three-dimensional tomographic image data of an object.
• graphs 6A-6C show the total x-ray intensity recorded at a pixel of the x-ray detector, measured in photons per second, versus data acquisition time, measured in second, in the time domain generated by a eight-beam system in accordance with the subject matter described here.
• Figures 6D-6F show corresponding x-ray data in the frequency domain.
• the x-ray beam waveform is not clearly identifiable in Figure 6D because the acquisition time is too small.
• the x-ray beams, as illustrated in Figures 6E-6F are clearly resolved in the frequency domain for acquisition times greater than 20 seconds. Therefore, projection image data for sufficiently high acquisition times can be utilized to generate three- dimensional tomographic image data of an object.
• an x-ray generating device can comprise a multi-pixel field emission x-ray source operable to simultaneously generate x-ray beams having distinct waveforms.
• the multi-pixel field emission x-ray source can direct the x-ray beams toward an object in accordance with the subject matter described herein.
• Figure 7 is a schematic, cross-sectional side view of a multi-pixel field emission x-ray source generally designated 700, according to an aspect of the subject matter described herein.
• x-ray source 700 can include a plurality of electron field emitters FE for emitting electrons.
• Electron field emitters FE can comprise one or more carbon nanotubes and/or other suitable electron field emission materials. Further, electron field emitters FE can be attached to a surface of respective cathodes C, conductive or contact line, or other suitable conductive material. Electron field emitters can be carbon nanotubes.
• an x-ray generating device can comprise a multi-pixel field emission x-ray source configured to simultaneously generate a plurality of x-ray beams having distinct x-ray energy characteristics.
• the multi-energy x-ray beams can be used to obtain 3-D tomographic images with material properties or attributes in addition to the x-ray attenuation coefficient, otherwise known as the CT number, for medical imaging applications.
• These attributes can include, for example, the chemical composition, atomic number, or density of an object.
• Exemplary applications can also include detecting the chemical composition of an object, for bomb detection and homeland security purposes.
• cancer tissue may be distinguishable from normal tissue by its elastic properties, or may contain certain elements such as calcium, which may be determined using a multi-energy x-ray imaging system according to the subject matter described herein for use in medical applications.
• Electron field emitters FE can be controlled by a suitable controller, such as suitable general-purpose computer, to emit electrons for producing respective electron beams EB.
• a controller can control voltage sources VS1 to apply voltages between electron field emitters FE and gate electrodes GE to generate respective electric fields for extracting electrons from electron field emitters FE.
• the applied voltages can be pulsed at different frequencies for generating pulsed electron beams EB of different frequencies.
• the controller can individually operate a plurality of metal-oxide-semiconductor field-effect transistors (MOSFETs) T for individually controlling field emitters FE to emit electrons.
• MOSFETs metal-oxide-semiconductor field-effect transistors
• the controller can individually control the voltage applied to field emitters FE for individually turning transistors on and off.
• the drains of transistors T can be connected to a corresponding one of a plurality of cathodes C.
• Transistors T can be turned on and off by the individual application of a high signal (e.g., 5 V) and a low signal (e.g., 0 V), respectively, to the gates of transistors T.
• a high signal e.g., 5 V
• a low signal e.g., 0 V
• a high signal is applied to the gate of a transistor
• a drain-to-source channel of the transistor is turned on to apply a voltage difference between a respective cathode C and gate electrode GE.
• a voltage difference exceeding a threshold can generate an electric field between cathode C and gate electrode GE such that electrons are extracted from respective electron field emitters FE.
• x-ray source 700 can include an anode A having a plurality of focus spots bombarded by a corresponding electron beam.
• a voltage difference can be applied between anod ⁇ A and gate electrode GE such that respective fields are generated for accelerating electrons emitted by respective electron field emitters FE towards respective target structures TR.
• Target structures TR can, for example, be made of molybdenum.
• Target structures TR can produce x-ray beams having a desired pulse frequency upon bombardment by electron beams EB.
• X-ray source 800 can include a focusing electrode FEL for focusing electrons extracted from electron field emitters FE on target structure T and thus reduce the size of electron beam EB. Focusing electrode FEL can be controlled by application of voltage to focusing electrode FEL by voltage source VS2. The gate voltage can be varied depending on required flux.
• Electron field emitters FE and gate electrode GE can be contained within a vacuum chamber with a sealed interior.
• the interior of vacuum chamber can be evacuated to achieve a desired interior pressure.
• Electron beam EB can travel from the interior of vacuum chamber to its exterior through an electron permeable portion or window.
• the electron permeable portion or window can be 4" diameter beryllium (Be) x- ray window.
• X-ray beams of distinct waveforms can be generated by the electron bombardment of anode A by electron beams of distinct waveforms.
• anode A can be suitably shaped and/or angled such that the generated x-ray beams are transmitted toward an object from a plurality of different viewing angles.
• Figure 8 is a schematic, cross-sectional side view of an x-ray unit generally designated 800 of x-ray source 700 shown in Figure 7 for generating a single, pulsed x-ray beam XB according to an aspect of the subject matter described herein.
• X-ray unit 800 represents a single pixel of x-ray source 700.
• x-ray unit 800 can include an electron field emitter FE deposited on a cathode C.
• electron field emitter FE can be a 1.5 mm diameter carbon nanotube film.
• the carbon nanotube film can be deposited on a surface of a metal substrate. Further, the carbon nanotube film can be deposited on the surface by an electrophoretic process.
• X-ray unit 800 can include a gate electrode GE for extracting electrodes on application of voltage by voltage source VS1.
• gate electrode GE can be a tungsten grid.
• Gate electrode GE can be spaced from cathode C by a dielectric spacer DS.
• x-ray beam XB can be generated by applying a constant DC voltage to anode A and a variable DC voltage to gate electrode GE.
• An n-channel MOSFET T can be adapted for switching on and off the emission of electrons from electron field emitter FE.
• a pixel can be activated by applying a 5V signal to open the channel of MOSFET T such that electron field emitter FE forms a complete electrical circuit with gate electrode GE.
• Electron field emitter FE can be electrically coupled to a drain of MOSFET T.
• the source of MOSFET T can be grounded.
• the gate of MOSFET T can be connected to the output of a digital I/O board adapted to provided a 5 V DC voltage signal.
• Electrons can be emitted from field emitter FE when the voltage applied by voltage source VS1 is greater than the critical field for emission.
• the emitted electrons can be accelerated by application of a voltage across anode A and gate electrode GE by voltage source VS2.
• the electrons form an electron beam EB that bombard an area of anode A to generate x-ray beam XB.
• a voltage can be applied to a focusing electrode FEL for focusing electron beam EB onto a target focal spot of anode A.
• a scanning x-ray beam from different origins on a target of anode A can be produced by sweeping a pulsed controlling signal having a predetermined pulse width across each MOSFET in x-ray source 700. At each MOSFET that the signal is swept, a channel of the MOSFET can be opened for producing an x-ray beam from the corresponding focal point on the anode target.
• a subset of the pixels can be activated such that the subset of pixels emits electrons with the same pulsing frequencies which generate x-ray beams from different focal points with the same frequencies.
• a pixel subset can be activated such that the subset of pixels emits electrons with different pulsing frequencies which generate x-ray beams from different focal points with different frequencies.
• a subset of pixels can be activated by using separate gate electrons for the subset of pixels.
• Extraction voltages can be applied to the corresponding pixels with predetermined pulsing frequencies to generate field emitted electrons with the desired pulsing frequencies and amplitudes.
• a subset of pixels can be activated by using a common gate for all of the electron emitting pixels.
• the electron beam can be pulsed by pulsing the activation voltage applied to the MOSFET circuit.
• a pulsed voltage with the predetermined frequency can be applied to open the corresponding MOSFET.
• Figures 9A-9C are graphs of the sum of experimental results of a two- beam multiplexing CT system according to an aspect of the subject matter described herein.
• Figures 9A and 9B show exemplary waveforms displayed as a function of voltage versus the number of frames.
• Figure 9C shows the experimentally measured x-ray intensity, measured in photons per second resulting from sum of these two waveforms.
• This data may be utilized by an image processing module for extracting individual projection image data from detected x-ray intensities based on the distinct waveforms of the x-ray beams for combining projection image data to generate three-dimensional tomographic image data of an object.
• Figure 10 shows two x-ray beams with square waveforms after a temporal Fourier transform has been performed on the data, which can be a component of image processing module IPM.
• Figure 11 shows an x-ray source and x-ray detector which can rotate around an object to be imaged using a gantry. Moreover, the object stage can be configured to rotate, so that images can be acquired from multiple angles.
• This application discloses an exemplary micro-computed tomography scanner comprising a micro-focus field emission x-ray source, an x-ray detector, an object stage placed between the x-ray source and the detector, an electronic control system and a computer that controls the x-ray radiation and detector data collection, and computer software that reconstructs the three dimensional image of the object using a series of projection images collected from different projection angles.
• the x-ray beams being pulsed in a relationship with the motion of the object to be imaged.
• the x-ray sources and x-ray detecting units disclosed in this patent application are examples of x-ray generating devices and x-ray detectors for use in accordance with the subject matter described herein.

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