WO2006108334A1 - Procede et appareil de detection d'une source de rayonnement electromagnetique dans un dispositif electrique - Google Patents

Procede et appareil de detection d'une source de rayonnement electromagnetique dans un dispositif electrique Download PDF

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Publication number
WO2006108334A1
WO2006108334A1 PCT/CN2005/002436 CN2005002436W WO2006108334A1 WO 2006108334 A1 WO2006108334 A1 WO 2006108334A1 CN 2005002436 W CN2005002436 W CN 2005002436W WO 2006108334 A1 WO2006108334 A1 WO 2006108334A1
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WIPO (PCT)
Prior art keywords
control unit
unit
electronic device
radiation source
emc
Prior art date
Application number
PCT/CN2005/002436
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English (en)
Chinese (zh)
Inventor
Keyong Yu
Guangming Ma
Rongliang Hu
Guo Shao
Rong Liu
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Zte Corporation
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Publication date
Application filed by Zte Corporation filed Critical Zte Corporation
Publication of WO2006108334A1 publication Critical patent/WO2006108334A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit

Definitions

  • the present invention relates to the measurement of electromagnetic radiation sources within an electronic device, and more particularly to the measurement of a primary electromagnetic radiation source by a plurality of functional units in a large communication device in the field of communication while operating simultaneously. Background technique
  • EMC is an abbreviation for Electro-Magnetic Compatibility.
  • Electromagnetic compatibility refers to the ability of electronic devices and systems to work in a coordinated and efficient manner in a variety of electromagnetic environments.
  • Electromagnetic Compatibility The purpose of the design is to enable electronic equipment to suppress a variety of external disturbances, to operate properly in a specific electromagnetic environment, while reducing its own electromagnetic interference to other electronic equipment.
  • Electromagnetic compatibility (EMC) tests can be grouped into four categories based on different standards: conducted emission measurements, radiated emissions measurements, conducted sensitivity (immunity) measurements, and radiation sensitivity (immunity) measurements.
  • the first two refer to the Electromagnetic Interference (EMI) part, and the latter two refer to the Electromagnetic Sensitivity (EMS) part.
  • EMI Electromagnetic Interference
  • EMS Electromagnetic Sensitivity
  • CCC is the English abbreviation of China Compulsory Certification. Only products with 3C certification can enter the domestic market. 3C certification provides detailed regulations on the safety performance and EMC of electromechanical and electrical products. From May 1st, 2003, the 19 categories and 132 products listed in the first batch of 3C certification catalogues cannot be sold, imported or exported and used in business activities without the 3C logo.
  • EMC electromagnetic compatibility
  • the usual solution is to add shielding measures to the frame in terms of process structure, such as adopting a series of means such as a conductor strip, a mesh shielding tape, an EMI gasket, and a conductive coating.
  • process structure such as adopting a series of means such as a conductor strip, a mesh shielding tape, an EMI gasket, and a conductive coating.
  • electronic equipment can pass the radiation emission test, but this is only a "blocking" approach. It does not fundamentally identify the electromagnetic radiation source and reduce the existing radiation emission indicators in the electronic equipment. .
  • the source that produces the radiation emission is customarily referred to as the source of electromagnetic radiation. If the electromagnetic radiation source can be found, the design is improved inside the electronic equipment, and a series of measures to reduce the electromagnetic radiation can be adopted, the shielding structure requirements of the process structure can be greatly reduced.
  • the EMC radiation emission test of the product is carried out after placing the rack into the EMC darkroom. After the test, a "radiation electromagnetic field strength-frequency" curve is obtained. From the curve obtained, if the frequency point exceeds the allowable range of the EMC standard, the radiation emission test of the product fails, and if all of them are within the limits allowed by the EMC standard, the radiation emission test of the product passes smoothly.
  • the product is often composed of more than one functional unit.
  • the functional unit and the functional unit are often connected by a backplane or a direct cable, and then Enclosed by a cabinet or rack, fixed, and finally connected to upstream or downstream equipment through a communication cable.
  • Electromagnetic radiation is generally generated by active components on functional units and diffuses around by passive components or interconnects. There are two ways of diffusion: wired and wireless, the former is called conducted emission, and the latter is radiated. emission.
  • the most important issue in solving the radiation emission problem is to find the source of electromagnetic radiation. Only accurate After the electromagnetic radiation source is positioned, the measures for solving the radiation emission can be effectively proposed. Determining the source of electromagnetic radiation based on the frequency of the signal is the easiest method because the frequency characteristics are most stable among all the characteristics of the signal, and the designer often has a clear signal frequency for each part of the circuit. Therefore, as long as the frequency of the radiation emission exceeding the punctuation point is known, it can be analyzed and inferred which part of the functional unit in the electronic device emits the radiation exceeding the standard, and then the functional unit whose speculative radiation emission exceeds the standard is removed from the rack, and the function unit is replaced. On the false panel, the radiation emission test is performed again.
  • the electromagnetic radiation source is usually a crystal oscillator, a clock driver, a phase-locked loop, a switching power supply, etc. from a printed circuit board (PCB), and the clock circuit is usually the most important source of electromagnetic radiation, especially It is the odd-order harmonic of the high-speed clock signal (like 3, 5, 7, and 9 times) as the main part. Therefore, in practical applications, in order to simplify the complexity of the test, it is not necessary to measure the radiation electromagnetic field strength curve of all devices in the functional unit, and only need to obtain radiation of some key components (such as crystal oscillator, clock driver, etc.) in the functional unit. The electromagnetic field strength curve is sufficient. Summary of the invention
  • the technical problem to be solved by the present invention is: A method for measuring electromagnetic radiation sources in an electronic device is proposed, which makes it easier to find and locate the main radiation source; and a device for implementing the method is also provided.
  • the measuring method of the electromagnetic radiation source in the electronic device of the present invention comprises the following steps - the first step, performing an EMC radiation emission test in the case where all the devices in the electronic device are working normally;
  • the third step by controlling only one of the functional units described in the second step to perform the EMC radiation emission test, respectively, the radiation electromagnetic field intensity curves of the different devices in the functional unit are obtained;
  • the fourth step the second and third steps are used to test each functional unit and each functional unit until all functional units are tested;
  • the fifth step is to analyze the data.
  • an EMC radiation emission test is performed in the case where all devices in the electronic device are operating normally
  • the functional units in the electronic device are divided into several groups, and only one of the groups is allowed to work by the control, and an EMC radiation emission test is performed. If the main radiation source to be found is in the group, the third step is performed. Otherwise, continue testing other groups until you find the group with the primary source of radiation;
  • the functional unit range containing the main radiation source is gradually reduced according to the similar method in the second step until the functional unit containing the main radiation source is found;
  • the devices in the main radiating element found in the third step are divided into several groups, and the range of the device containing the main radiation source is gradually reduced in a similar manner to the second step and the third step until the device which is the main radiation source is found.
  • the device for measuring electromagnetic radiation source in an electronic device of the present invention comprises a control interface unit, a communication interface unit, a core control unit, a power supply control unit, and a device control unit;
  • the control interface unit is configured for the user to send an instruction to the core control unit and receive the information sent by the core control unit and display the information to the user; and may be an application running on a computer platform or an operation panel designed for EMC testing.
  • the communication interface unit is a connection portion between the control interface unit and the core control unit;
  • the core control unit receives the instruction from the control interface, and after the analysis and processing, respectively issues instructions to the power supply control unit and the device control unit; simultaneously monitors the status in the current electronic device, and sends the status information to the control interface unit through the communication interface; Can be realized with 8031 series MCU.
  • the power supply control unit realizes power supply control of each functional unit in the electronic device
  • the device control unit controls the working state of the device.
  • the invention can not only obtain the radiation electromagnetic field intensity curve of the entire electronic device, but also measure each functional module in the electronic device and each potential electromagnetic radiation source.
  • the purpose of quickly positioning the electromagnetic radiation source can be achieved, the time and cost of the EMC test can be saved, and the development speed and quality of the product can be improved.
  • Figure 1 is a block diagram of an electromagnetic radiation source measuring device of the present invention
  • Figure 2 is a flow chart showing the operation of the core control unit in the apparatus of the present invention.
  • 3 is a flow chart of one of the radiation emission test schemes for electronic devices in the present invention. detailed description
  • the main idea of the electromagnetic radiation source measuring device of the present invention is to add a small part of the circuit in the electronic device, and under the instruction of the user, realize the control of the work of each functional module in the electronic device, for each functional module
  • Each potential source of electromagnetic radiation within the measurement is measured. Control of the operation of the functional modules is achieved by powering the functional units. Control of each potential source of electromagnetic radiation is achieved through the control pins of the device.
  • the electromagnetic radiation source measuring device comprises the following modules: a control interface unit, a communication interface unit, a core control unit, a power supply control unit, and a device control unit.
  • a control interface unit When in use, the user uses the control interface to issue commands to the core control unit through the communication interface to realize power supply control and device control.
  • the control interface unit 101 is an interface portion between the user and the electromagnetic radiation source measuring device.
  • the control interface unit may be an application running on a computer platform or an operation panel designed for EMC testing. Considering the popularity of computers, it is best to use computers as a means of control.
  • the control interface unit provides a control means for the user to realize that the user sends an instruction to the electromagnetic radiation source measuring device through the control interface, and after receiving the command, the core control unit sets the power supply control unit and the device control unit. At the same time, the control interface receives the information sent by the core control unit and displays it to the user.
  • the communication interface unit 102 is a connection portion between the control interface unit and the core control unit in the electromagnetic radiation source measuring device, and is responsible for transmitting commands and information between the control interface unit and the core control unit.
  • the communication protocol between the control interface and the core control unit should also be considered.
  • the complexity of the interface unit should be relatively low, the cost should be relatively cheap, and because the distance between the device under test and the console in the EMC darkroom is generally less than 15m, it is best to use serial communication.
  • the serial communication port adopts the standard RS232 or RS485 mode.
  • the information transmission mode can be selected as asynchronous serial interface mode, starting bit 1 bit, data bit 8 bit, stop bit 1 bit, with or without parity bit.
  • the data transmission rate is selected among 1200, 2400, 4800, and 9600 bps according to requirements.
  • the basic format of the protocol adopted is defined as -
  • SOI ADDRESS COMMAND DATA CHKSUM EOI SOI is the Start Of Information, which marks the beginning of the message body.
  • ADDRESS is the address of the operation object. If two core control units are designed in the same electronic device, it can be distinguished by address.
  • COMMAND is an instruction type, which is generally divided into a power supply control instruction, a device control instruction, and a current status instruction.
  • DATA is the content of the command body.
  • CHKSUM is a checksum and is used for error control during information transmission.
  • EOI is the End Of Information, which marks the end of the message body.
  • the core control unit 103 is a main component of the electromagnetic radiation source measuring device and is a control center of the electromagnetic radiation source measuring device. After receiving the instruction from the control interface, it is parsed. If it is the power supply control and the device control command, the information is transmitted to the power supply control unit and the device control unit. If the current status command is obtained, the core control unit will send the current status to the control interface unit. Since this part needs to complete functions such as calculation, analysis, and control, it is recommended to use the currently widely used 8031 series MCU. The application running on the 8031 is written according to the proposed communication protocol.
  • the control interface communicates with the core control unit as the master-slave mode.
  • the control interface calls the core control unit and sends instructions. After receiving the command, the core control unit completes the corresponding settings and returns information. If the control interface does not receive the response information of the core control unit within a certain period of time, it should be considered that the communication process failed.
  • the power supply control unit 104 is used to control the power supply of each functional unit in the electronic device.
  • Large communication devices are typically -48V distributed power systems, and each functional unit is powered separately by the backplane.
  • An electronic switch consisting of a dedicated IC circuit and a power MOS transistor is designed on the power interface of each functional unit. These switches can flexibly control the power supply of each functional unit. You can choose to allow only one functional unit or some of the functional units to work with a certain functional unit or some functional units.
  • the device control unit 105 can control the operating state of the device.
  • the device For electromagnetic radiation sources on the functional unit that may generate emissions, such as crystals, clock drivers, etc., the device itself typically has an enable. During the test, it is completely possible to control the enable terminals of these devices through the device control unit, and only allow a certain part of the device on the functional unit to work, measure the EMC curve under the current working state, and after analysis, the radiation of the device can be obtained. Launch indicator.
  • the workflow of the core control unit is as follows - after the electronic device is powered on, the core control unit first completes the initialization of the electromagnetic radiation source measuring device, so that the device In the non-EMC test state, the core control unit is working in the waiting state, the power supply control unit supplies power to the functional unit normally, and the device control unit does not perform any control on the device, and the entire electronic device is in a normal working mode.
  • the power supply control unit supplies power to the functional unit normally
  • the device control unit does not perform any control on the device
  • the entire electronic device is in a normal working mode.
  • all the units will work in the "sleep mode", at this time only part of the circuit of the core control unit works, which can reduce power consumption and reduce the device. Its own impact on electronic devices.
  • the core control unit After the core control unit receives the instruction from the control interface, the core control unit first analyzes the format of the instruction. If it is an invalid instruction or an erroneous instruction, the core control unit will discard the received instruction and return to the waiting state; If it is an EMC test command, after the core control unit distinguishes the power supply control command or the device control command, the power supply control unit and the device control unit are respectively set to complete the user's setting of the EMC test state. After the setting is completed, the core control unit will send the current control status to the control interface again for the user to know the completion status after issuing the command and the test status information inside the electronic device. After the transmission is completed, the core control unit is working again in the waiting state.
  • FIG. 3 shows the flow of one of the radiation emission measurement methods of the electronic device in the present invention:
  • each functional unit in the electronic device is defined as Fl, F2, ..., Fn, and each functional unit has DK D2, ..., Dm controllable devices.
  • the electromagnetic radiation source measuring device is installed without any setting, and the EMC radiation emission test of the entire electronic device is completed;
  • the fifth step the test is completed, and the data is analyzed.
  • the obtained radiation electromagnetic field intensity curve can obtain the influence of each electromagnetic radiation source in the electronic device on the electronic device. If you need a radiation electromagnetic field strength curve when several functional units are working at the same time, you can also obtain it by setting.
  • test method can be:
  • the electromagnetic radiation source measurement device is installed without any setting, and the EMC radiation emission test of the entire electronic device is completed;
  • the devices in the functional unit are divided into several groups, such as two groups, and the second step is used to gradually narrow down the test range, and finally the main radiation source can be found.
  • the above electromagnetic radiation source measuring device plays an auxiliary role in the product prototype development stage. Once the electronic device is designed and shaped, the device can be completely removed from the electronic device, further reducing the cost of the product, but the design should consider the corresponding Removable and compatible design.

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

L'invention concerne un procédé et un appareil de détection d'une source de rayonnement électromagnétique dans un dispositif électrique. Le procédé comprend les étapes suivantes: essai de rayonnement EMC lors du fonctionnement de tous les composants; fonctionnement d'un seul module fonctionnel, essai d'un rayonnement EMC, obtention du rayonnement généré par le module fonctionnel; fonctionnement d'un des composants, essai du rayonnement EMC, obtention des courbes d'intensité électromagnétique de différents composants respectivement; obtention, au moyen des étapes précitées, de courbes d'intensité et de champ électromagnétique de chaque module fonctionnel et composants de chaque module fonctionnel; finalement analyse des données. L'appareil comprend un module d'interface de contrôle, un module d'interface de communication, un module de contrôle central, un module de contrôle d'alimentation et un module de contrôle de composants. Ainsi, on obtient, d'une part, des courbes d'intensité de champ électromagnétique de tout le dispositif électrique et, d'autre part, on localise rapidement la source de rayonnement électromagnétique.
PCT/CN2005/002436 2005-04-15 2005-12-31 Procede et appareil de detection d'une source de rayonnement electromagnetique dans un dispositif electrique WO2006108334A1 (fr)

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CNB2005100341810A CN100392414C (zh) 2005-04-15 2005-04-15 一种电子设备内电磁辐射源的测量方法和装置
CN200510034181.0 2005-04-15

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CN109061343A (zh) * 2018-07-13 2018-12-21 成都四威功率电子科技有限公司 一种辐射敏感度测试方法
CN109061344A (zh) * 2018-07-13 2018-12-21 成都四威功率电子科技有限公司 一种辐射敏感度试验中辐射位置的自动调整方法
CN112288315A (zh) * 2020-11-13 2021-01-29 深圳市车可讯科技有限公司 一种车载电子的emc设计方法
CN114034949A (zh) * 2021-10-26 2022-02-11 一汽解放汽车有限公司 电路***的电磁兼容测试方法、装置、计算机设备
CN114545120A (zh) * 2022-01-29 2022-05-27 苏州浪潮智能科技有限公司 一种服务器辐射抗干扰度测试方法、装置、设备及介质
CN117330850A (zh) * 2023-12-01 2024-01-02 上海优立检测技术股份有限公司 用于智能移动终端的辐射检测方法、***、设备及介质

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CN103675476A (zh) * 2012-09-17 2014-03-26 联想(北京)有限公司 信息处理方法及电子设备
CN109061343A (zh) * 2018-07-13 2018-12-21 成都四威功率电子科技有限公司 一种辐射敏感度测试方法
CN109061344A (zh) * 2018-07-13 2018-12-21 成都四威功率电子科技有限公司 一种辐射敏感度试验中辐射位置的自动调整方法
CN112288315A (zh) * 2020-11-13 2021-01-29 深圳市车可讯科技有限公司 一种车载电子的emc设计方法
CN114034949A (zh) * 2021-10-26 2022-02-11 一汽解放汽车有限公司 电路***的电磁兼容测试方法、装置、计算机设备
CN114545120A (zh) * 2022-01-29 2022-05-27 苏州浪潮智能科技有限公司 一种服务器辐射抗干扰度测试方法、装置、设备及介质
CN114545120B (zh) * 2022-01-29 2024-01-16 苏州浪潮智能科技有限公司 一种服务器辐射抗干扰度测试方法、装置、设备及介质
CN117330850A (zh) * 2023-12-01 2024-01-02 上海优立检测技术股份有限公司 用于智能移动终端的辐射检测方法、***、设备及介质
CN117330850B (zh) * 2023-12-01 2024-03-15 上海优立检测技术股份有限公司 用于智能移动终端的辐射检测方法、***、设备及介质

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