WO2005090913A1 - Dual axis vibratory rate gyroscope - Google Patents
Dual axis vibratory rate gyroscope Download PDFInfo
- Publication number
- WO2005090913A1 WO2005090913A1 PCT/US2005/008081 US2005008081W WO2005090913A1 WO 2005090913 A1 WO2005090913 A1 WO 2005090913A1 US 2005008081 W US2005008081 W US 2005008081W WO 2005090913 A1 WO2005090913 A1 WO 2005090913A1
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- WO
- WIPO (PCT)
- Prior art keywords
- vibratory
- motion
- masses
- rate sensor
- rotational rate
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5705—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using masses driven in reciprocating rotary motion about an axis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5719—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
Definitions
- the present invention relates to the field of rotational rate sensors that include vibrating resonators.
- Rotational rate sensors with vibrating resonators also referred to as “vibratory- rate gyroscopes,” measure rotational rates directly by sensing forces generated by the vibrating elements in response to rotation of the sensor.
- vibratory- rate gyroscopes Various configurations of vibratory elements have been developed for use in vibratory- rate gyroscopes, including suspended tuning-fork structures, vibrating beams and vibrating rings. These elements are driven on resonance and the motion of the elements in response to rotation is measured to determine the forces on the elements and the rotation of the sensor.
- rotational rate sensor that is small, inexpensive to produce, is adaptable to a wide range of applications, and is easily integrated with miocroelectronics. Such adaptability would preferably include the ability to adjust the bandwidth of the sensor and to provide for uniform output from a number of sensors.
- the present invention is directed to providing these advantages.
- the preferred embodiment of the present invention comprises a dual-axis rotational-rate sensor having two vibratory masses disposed symmetrically about a restoring element and driven in a resonant counter-phase motion, wherein the two masses vibrate with equal but opposite amplitudes along a single axis.
- the vibratory structure accommodates motion of the masses in a plane orthogonal to the vibratory axis and measures motion of the masses along two axes in this orthogonal plane to provide signals directly responsive to rotation of the sensor about two axes.
- Figure 1 an exploded view of vibratory assembly 1 00;
- Figure 2 is an illustration of a top view of beam element 1 50;
- Figure 3 illustrates an assembled vibratory assembly;
- Figure 4 is a side view of vibratory assembly 1 00 illustrating counter- phase motion;
- Figure 5 is a perspective drawings illustrating the motion of vibratory assembly 1 00 in response to rotation about the x and/or y axes.
- FIG. 1 is a side view illustrating the motion of vibratory assembly 1 00 in the "in-phase” mode
- Figure 7 is a perspective drawing of the vibratory assembly 1 00 mounted on mount plate 700
- Figure 8 is a perspective drawing of drive side assembly 800 in an exploded view
- Figure 9 is a perspective drawing of sense side assembly 900 in exploded view
- Figure 1 0 is an exploded view of signal PCB 1 01 0
- Figure 1 1 is an exploded view of the suspended assembly 1 1 1 0
- Figure 1 2 is an exploded view of final assembly 1 200
- Figure 1 3 is a logical schematic diagram of ASIC 1 030
- Figure 1 4 is a detailed schematic of combining and scaling DACs 1 340 and adjoining circuitry.
- Figure 1 is an exploded view of vibratory assembly 1 00, which includes cylindrical permanent magnets 1 1 0 and 1 20, magnet holders 1 30 and 1 40, and a planar beam structure 1 50. Magnets 1 1 0 and 1 20 are preferably aligned as illustrated, with poles oriented in a common direction, so that their magnet fields reinforce each other.
- Beam structure 1 50 has an axially symmetric hexagon shape and is composed of several winding serpentine beams symmetrically folded about the z-axis. Beams 210-265 operate as spring arms to provide restoring forces in vibratory assembly 1 00. Contacts 21 0c-235c on the ends of the beams provide mounting locations the two magnet holders 1 30 and 1 40. Mounting points 240m-265m provide locations for fixing to an external assembly.
- magnet holder 1 30 is connected in a similar fashion to three interleaved beam ends 225c, 230c and 235c on the opposite side of beam structure 1 50.
- This mounting, and the relief in magnet holders 1 30 and 1 40 allows magnet holders 1 30 and 1 40 to move freely with respect to each other both in and out of the plane of beam structure 1 50. Specifically, magnet holders 1 30 and 1 40 can move towards each other along the z-axis without interference for a distance sufficient for the operation of vibratory assembly 1 00.
- Magnet holders 1 30 and 140 are formed from a non-magnetic material, such as certain stainless steels, and are attached to beam structure 1 50. Magnets 1 10 and 1 20 are fixed inside magnet holders 1 30 and 1 40. The remaining 6 serpentine beams are mounted to an external assembly at mounting points 240m, 245m, 250m, 255m, 260m and 265m.
- magnets 1 1 0 and 120 are driven into a counter-phase motion along the z-axis as illustrated in Figure 4.
- Counter-phase motion is a forced-resonant sinusoidal motion along the z-axis wherein magnets 1 1 0 and 1 20 sequentially move apart, then together, along the z-axis.
- vibratory rotational-rate sensors measure the rate of rotation of the sensor by sensing the force exerted on a mass moving in a linear direction within the rotating frame-of-reference of the sensor.
- This force is commonly referred to as the "Coriolis force,” and is described by the equation:
- m is the mass of the moving object
- v is the velocity vector of the moving object
- ⁇ is the angular rate of rotation of the system.
- a force is exerted on magnets 1 10 and 1 20 in a direction orthogonal to both the axis of rotation and the axis of vibration, as given in Equation 1 .
- This force is proportional to angular rate of rotation ⁇ and results in movement of magnets 1 10 and 1 20 in the x-y plane.
- This motion is detected to resolve the rotational rates about the x and y-axes. More specifically, referring to the coordinate system in Figure 4, the axis of forced counter-phase vibration is the z-axis.
- magnet 1 1 0 is driven along the z-axis at the resonant frequency of the counter-phase mode of 1 800 Hz.
- the amplitude of this motion is about 50 microns peak-to-peak and the resonance is characterized by a quality factor "Q" of about 2000.
- Q quality factor
- Magnet 1 20 acquires a symmetrical sympathetic motion in response to the motion of magnet 1 1 0.
- the motion of the non-driven magnet 1 20 in the x-y plane is sensed to detect the rotation of vibratory assembly 1 00 about the x and y-axes.
- the same magnet or mass could both driven and sensed by using appropriate time sequencing.
- the preferred embodiment allows for more design in the placement of the drive and sense functions.
- beam structure 1 50 provides the restoring forces required to establish the desired resonant frequencies of vibratory structure 1 00. It also is designed to provide for radial symmetry in the x-y plane, such that magnets 1 1 0 and 1 20 move symmetrically in the x-y plane in response to rotation. Specially, beam structure 1 50 is 6-fold axially symmetric. That is, if beam structure 1 50 is divided into 6-sixty degree segments, the segments are identical, and they remain identical with rotation. This symmetrical design minimizes drive trajectory misalignment errors, cross-axis errors, and facilitates equal movement of the magnets in any direction in the x-y plane.
- serpentine beams 21 0, 21 5, 220, 225, 230 and 235 couple to the magnet/magnet holder pairs at contacts 21 0c, 21 5c, 220c, 225c, 230c and 260c. These beams provide a restoring force that establishes a counter-mode resonance of about 1 800 Hz.
- the serpentine shapes of the beams allow for the longer beam lengths required to lower the resonant frequency to the desired
- Beam structure 1 50 also includes design features that reduce undesirable modes of oscillation. More specifically, the design minimizes the "in-phase" mode of vibration illustrated in Figure 6. In the in-phase mode, magnets 1 1 0 and 1 20 both move in the + z direction, then both move in the -z direction. This mode of operation is undesirable because it couples unbalanced forces in and out of vibratory assembly 1 00 at mounting points 240m-265m.
- the in-phase mode is minimized by designing beam structure 1 50 such that the resonant frequency of the in-phase mode is well separated from the counter-phase resonance. This is accomplished by the proper choice of beam lengths for the six beams 240-265 which couple beam structure 1 50 to an external assembly at mounting points 240m-265m.
- beams are minimally involved in the counter-phase mode but are involved in the in-phase mode, in a manner analogous to the involvement of the handle on a tuning fork when the arms of the tuning fork move in phase. Lengthening these 6 beams lowers the resonant frequency of the in-phase mode, which reduces the energy coupled between the in-phase mode and the driving frequency, which is picked to coincide with the desired counter-phase mode.
- the lengths of beams 240-265 have been chosen to result in an in-phase resonant frequency of 1 400 Hz, well below the drive frequency. This separation of greater than 20% is more than sufficient to allow filters to eliminate in-phase frequencies.
- Beam structure 1 50 has a planar, single-element design that lends itself to easy manufacturing and has a number of preferable mechanical characteristics.
- the planar beam-spring configuration can be easily manufactured by chemical etching, or by various semiconductor or micro-machine manufacturing techniques, or by etching, fine blanking, stamping or electro-discharge machining. Physical vapor deposition processes, such as sputtering, may also be used to produce the desired beam shapes. It is desirable that the material beam structure 1 50 maintain a constant modulus of elasticity over temperature so that the vibration frequency remains suitably constant over the operating temperature of the sensor.
- the material is preferably homogenous and suitable materials for beam element 1 50 include metals such as elinvar, stainless steel, beryllium copper, spring steel or other suitable alloys.
- quartz or silicon may be used and shaped through conventional photolithographic etching processes.
- Other mechanisms could be developed to provide the restoring forces for certain embodiments of the present invention, however, the planar beam structure, and more particularly the serpentine beam structure with beam-springs of varying lengths, provides unique advantages to the preferred embodiment of the present invention, such as the extremely high-Q which is a result of the low-loss homogeneous design of beam structure 1 50.
- the sense motion is responsive to the torques caused by rotation of vibratory assembly 1 00.
- the sense motion is a sinusoidal motion that is driven at the frequency of the counter-phase motion and has an amplitude proportional to both the rotational rate and the amplitude of the counter-phase motion.
- the natural resonant frequency of the sense motion referred to as the "sense mode” is chosen close to the drive frequency of the counter-phase mode.
- the natural resonant frequency of the sense mode is preferably close to the drive frequency of the counter-phase mode, about 1 700 Hz in the preferred embodiment. Picking the sense mode resonance to be close to the frequency of the driven counter-phase motion magnifies the amount of sense motion, which is desired because of the very small magnitude of the motion to be sensed.
- This frequency is close enough to the drive frequency of the counter-phase motion to achieve a significant physical resonance magnification multiple of approximately 1 0.
- a higher magnification and sensitivity is possible if the sense mode resonance is chosen to be closer to or coincident with the frequency of the driven counter-phase motion.
- Beam structure 1 50 thus provides a restoring force for the desired counter-phase mode and permits vibrations in the plane orthogonal to the vibratory axis
- beam structure 1 50 establishes a high-Q resonance (Q is about 2000) for the counter-phase mode, and establishes the resonance of the sense mode close to the driven frequency of the counter-phase mode.
- Figure 7 illustrates the beam element mounted to an external metallic mount plate 700.
- Beam structure 1 50 is attached to mount plate 700 by fastening mounting points 240m-265m (See Figure 2) of the 6 serpentine beams 240-265 to raised protrusions on mount plate 700. These protrusions (not shown) are formed as semi-piercings in mount plate 700 and hold beam structure 1 50 approximately 0.23 mm from mount plate 700 so that all beams of beam structure 1 50 can vibrate freely.
- Figure 8 illustrates drive side assembly 800 in an exploded view.
- Drive side assembly 800 locates drive coil 81 0 proximate to magnet 1 1 0 and magnet holder 1 30 (illustrated in previous Figures 1 , 3-7) and includes a plastic drive mold 820, which incorporates a location feature for drive coil 81 0.
- a magnetically permeable iron plate 830 is attached to the rear of drive mold 820 to help channel the magnetic flux lines generated by magnet 1 1 0 and to improve the coupling between drive coil 81 0 and magnet 1 10. Plate 830 also provides additional inertia to the system to reduce unwanted motion.
- Pins 840 are attached to drive mold 820 and carry electrical signals to and from drive side assembly 800
- Figure 9 illustrates a sense side assembly 900 in an exploded view.
- Sense side assembly 900 is mounted proximate to magnet 1 20 on the side of beam structure 1 50 opposite drive assembly 800.
- Two pairs of sense coils 91 0 and 91 5 are attached to sense mold 920.
- the two pairs of flat, oval, sense coils are oriented 90 degrees apart and, when completely assembled, are located in close proximity to magnet 1 30.
- Coils 910 and 91 5 coils are each mounted in the x-y plane and are used to detect motion of magnet 1 20 in the x-y plane, one pair sensing motion along the x-axis, the other pair sensing motion along the y-axis.
- sense coils 91 0 are oriented such that motion magnet 1 20 along the x-axis will generally increase the flux in one coil, and decrease the flux in the other, signal corresponding to the x position of magnet 1 20.
- the oval shape of the coils makes them more sensitive to motion in the x-direction.
- Each coil pair is connected with opposite polarity (wound in opposite directions) so that flux changes resulting from the driven z-axis motion of magnet 1 20 generally cancel out, but motions along the x-axis will be additive.
- Figure 1 0 is an exploded view of signal printed circuit board (PCB) 1 010. Attached to signal PCB 101 0 are Electronically Erasable Programmable Read Only Memory (EEPROM) 1 020 and Application Specific Integrated Circuit (ASIC) 1 030.
- a capacitive shield plate 1040 is attached to signal PCB 101 0 and prevents capacitive coupling between sense coils 91 0 and 91 5 and the various traces and pins on signal PCB 1 010.
- Capacitive shield plate 1040 is a made from an electrically conducting and non-magnetic material, such as phosphor bronze.
- AGC coil 1 050 is attached to the back side of signal PCB 1 01 0.
- AGC coil 1 050 senses the amplitude and precise phase of the driven counter-phase motion along the z-axis and provides feedback for the drive, error correction and signal demodulation circuitry.
- Coils 81 0, 91 0, 91 5 and 1 050 are manufactured by winding insulated electrically conductive wire, such as copper, around a spindle which is later removed.
- the coils can also be formed by spiraling traces on several PCB layers to generate a coil structure or by depositing metal films onto a substrate and then etching coil turns with photolithographic methods.
- One advantage of the present design is that it is amenable to the use of flat coils, which are inexpensive and easily manufactured. Alternatively, other types of transducers could be used for driving and sensing the vibratory motion.
- Figure 1 1 is an exploded view of suspended assembly 1 1 1 0.
- Drive side assembly 800 is attached to mount plate 700 via tangs 71 0.
- Mount plate 700 is further attached to sense side assembly 900 via tangs 720.
- the resulting compact integrated assembly positions drive coil 81 0 in close proximity to magnet 1 1 0; and AGC coil 1050 and sense coils 91 0 and 91 5 are positioned in close proximity to magnet 1 20.
- the various cross connecting pins are connected (soldered) into signal PCB 1 01 0 to establish electrical routes through suspended assembly 1 1 10.
- FIG. 1 2 is an exploded view of final assembly 1 200.
- Base assembly 1 21 0 consists of a plastic injection molded part, base mold 1 220, which has 4 pins 1 225 attached to it.
- Conducting metallic belly plate 1 230 is attached to base mold 1 220.
- Gasket 1 240 molded out of silicon rubber, is inserted between base mold 1 220 and belly plate 1230 as shown.
- Four helical springs 1 250 are connected to pins 1 225.
- Helical springs 1 250 are made from electrically conducting material that is wound into a helical spiral shape.
- Suspended assembly 1 1 1 0 is positioned onto 4 helical springs 1 250, and attached by soldered, welding, brazing or mechanical fastening.
- Helical springs 1 250 perform two functions. First, the four conductive springs are used to pass electrical signals between signal PCB 1 01 0 and base mold 1 220. Further, springs 1 250 provide vibratory isolation between suspended assembly 1 1 10 and base mold 1 220. This isolation prevents unwanted vibrations (linear acceleration, mass mismatch effects) from being coupled to vibratory assembly 100. Lastly, can 1 260 is then attached to belly plate 1 230 to form a closed container to shield the sensor from undesired interference sources. Gasket 1 240 forms a seal against the can so as to prevent moisture from entering the assembly.
- ASIC 1 030 performs signal processing for the rotational rate sensor.
- EEPROM 1 020 stores various calibration factors and other data used by ASIC 1 030.
- Figure 1 3 is a logical schematic of the system electronics of ASIC 1 030.
- Coils 81 0, 91 0, 91 5 and 1 050 in final assembly 1 200 are illustrated in transducer section 1 305.
- Vibratory assembly 1 00 is driven at its natural resonant frequency by applying an alternating drive current (DP-DM) to drive coil 81 0.
- DP-DM alternating drive current
- AGC coil 1 050 produces a sinusoidal AGC signal (AGP-AGM) having an amplitude scaled to provide the desired physical amplitude of vibration of vibratory assembly 1 00 along the z-axis.
- the frequency and phase of the drive current is adjusted to coincide with the frequency of vibratory assembly 1 00 in the counter-phase mode so as to maximize the driven motion.
- Yaw motion (about the x-axis) is detected by sense coils 91 0, which produces yaw signal.
- YWP-YWM yaw signal
- pitch motion (about the y-axis) is detected by sense coils 91 5, which produces pitch signal (PWP-PWM) .
- Yaw and Pitch preamps 1 320 and 1 330 and the AGC preamp portion of AGC preamp and vibration oscillator 1 31 0 convert the low-level voltage signals from coils 91 0, 91 5 and 1050 to differential currents utilizing on-chip conversion resistors.
- These preamps have minimal phase-delay characteristics, which preserves the precise phase relationships between yaw, pitch and AGC signals used by ASIC 1030. Alternatively, the phase characteristics could be matched. In either case, the phase relationships between the signals are precisely preserved.
- AGP-AGM Differential analog AGC signal
- AGP-AGM is coupled to AGC preamp and vibration oscillator 1 310.
- a vibration oscillator portion of AGC preamp and vibration oscillator 1 310 drives vibratory assembly 1 00 at its resonant frequency by applying drive current (DP-DM) to drive coil 81 0 using phase and amplitude feedback from AGC signal (AGP-AGM) from AGC coil 1 030.
- AGC signal (AGP- AGM) is integrated over each half-cycle and the result is compared with a voltage reference derived from temperature-compensated band gap reference (BG) and the difference is used to create the appropriate magnitude slew-limited drive signal at the DP and DM outputs.
- BG temperature-compensated band gap reference
- DP-DM has a generally square- wave like waveform and is nominally in-phase with the AGC signal.
- the analog differential AGC signal (AGP-AGM) is amplified and output to combining and scaling DACs 1 340 as signals (AG1 P-AG1 M).
- a phase, reference signal ADPCOMP is also provided to ADC Clock Synthesizer and Counter 1 325 in response to zero crossings of the AGC signal.
- Scaling and combining DACs 1 340 condition analog yaw (YWP-YWM) and pitch (PWP-PYM) sense signals to provide for dc offset removal from the preamplifiers, to remove parasitic quadrature error signals, and to remove cross-axis errors to compensate for unit-to-unit variations so that the signals presented to the ADC blocks will be normalized with respect to unit-to-unit variations.
- DC offset and parasitic quadrature error signals are removed by analog addition of equal and opposite analog signals which are synthesized by programmable digital-to-analog converters (DACs) using calibration values stored in digital registers in serial interface and RAM 1 355. Cross-axis errors are compensated for in a similar fashion but use the sense channel signals directly as a reference.
- the COMCAL bus line interconnecting scaling DACs 1 340 and serial interface and RAM 1 355 provides scaling DACs 1 340 access to the PINPH, POFST, PCAX, PSF, YINPH, YOFST, YCAX and YSF registers of serial interface and RAM 1 355. The use of these registers is discussed in further detail below.
- Figure 1 4 is a detailed schematic of combining and scaling DACs 1 340 and adjoining circuitry.
- the yaw input signal is the differential voltage across the yaw input pins YWP and YWM.
- VyawNOM InphYaw* SIN(2 ⁇ * Fvib * t) - CrossYaw * RatePitch * COS(2 ⁇ r * Fvib * t) (Equation 3) - (RateYaw + MROyaw) * YSF * COS(2;r * Fvib * t)
- the SIN term of this equation is an in-phase signal (relative to the AGC signal) which is an undesired error component resulting from transducer misalignment of the driven vibratory motion.
- InphYaw is defined as the amplitude of this in- phase yaw signal.
- This error is eliminated by adding an equal and opposite signal provided by YINPH DAC 1 41 0 to the sensed yaw signal (YWP-YWM) at adder 1 41 1 0.
- YINPH DAC 141 0 scales its output with AGC signal (AGP-AGM), which is multiplied by the YINPH calibration parameter.
- the first COS term is an undesired error signal which comes from coupling between the yaw and pitch axes.
- CrossYaw is defined as the amplitude of this cross-axis (pitch) error signal.
- This cross-axis error is compensated for by adding an equal and opposite signal to the sensed yaw signal (YWP-YWM) at adder 1 41 1 0.
- the correction signal is provided by YCAX DAC 1 430, which scales its output with pitch signal (PWP-PYM), and is multiplied by the YCAX calibration parameter.
- the second COS term contains the desired signal, which is modulated by yaw angular rate. This signal indicates the desired angular yaw rate motion of vibratory assembly 100. However, this term also includes an undesired mechanical rate offset (MROyaw) arising from alignment errors.
- MROyaw mechanical rate offset
- desired yaw sense signal is demodulated at mixer 14140 with a cosine signal (in quadrature with the AGC signal) to demodulate the desired yaw signal and to further remove remaining undesired sine components.
- Mixer 1 41 40 can further selectively demodulate the yaw sense signal with either a sine signal or a dc signal. These modes are used to determine calibration values, as described below.
- Yaw analog-to-digital converter (ADC) 1 350 and pitch ADC 1 360 perform simultaneous analog-to-digital conversions which are synchronized relative to the AGC signal.
- Pitch ADC 1 360 operates in a manner consistent with that of yaw ADC 1 350, which we now describe.
- the corrected yaw signal is applied to mixer 1 41 40, where it is demodulated by mixing with a cosine signal (in quadrature with the AGC signal) .
- the demodulated signal is then rectified and converted to digital levels by yaw ADC 1 350.
- yaw ADC 1 350 utilizes a Sigma Delta Converter 1 41 50 that samples the demodulated yaw signal at a high rate in response to HSCLK signal from ADC clock synthesizer and counter 1 325 many times each cycle. Twice each 1 .8 kHz cycle the rectified samples are integrated by integrator 1 41 60 in synchronization with the CLK signal from ADC clock synthesizer and counter 1 325.
- the CLK signal is derived directly from the AGC signal to retain precise phase relationship with the physical oscillator. This synchronized demodulation and conversion further improves signal-to-noise of the sense signals by further removing certain error signals.
- the digital values applied to YINPH DAC 1 41 0 and PINPH DAC 1460 are derived by auto-correction loops that perform sine demodulation of the sense channels and adjust the scaling YINPH DAC 1410 and PINPH DAC 1460 to minimize the amount of in-phase signal on each of the two sense channels.
- a selectable in-phase trim mode selects the sine input to mixer 141 04 and to demodulate the corrected yaw signal with a sine wave.
- the resulting sine- demodulated digital signal from yaw ADC 1350 establishes the value of the YINPH parameter, which is loaded into YINPH register 1 420 and used to scale the YINPH DAC 1 410 to remove sine error signals during normal operation.
- the PINPH auto-correction loop operates in a similar manner.
- the digital values for YCAX DAC 1430 and PCAX DAC 1480 are derived from factory calibration procedures wherein the completed assembly is rotated and the amount of cross axis on the relative channels is measured. These digital values are then loaded into EEPROM 1 020 and digital registers on ASIC 1 030.
- YOFST and POFST are correction signals for DC offset errors.
- the digital values for YOFST and POFST are also determined by auto-correction loops.
- the output from adder 1 41 1 0 is applied to integrator 1 41 90, which is synchronized to the CLK signal from ADC clock synthesizer and counter 1 320 to integrate the output from adder 1 41 1 0 over a set number of cycles of the AGC signal.
- the integrated value is compared to a reference value (nominally zero) in comparator 1 4200.
- the result is applied to counter 1 450.
- This count adjusts the YOFST value stored in YOFST DAC 1440, which scales a DC signal applied to adder 141 1 0 to provide DC error correction.
- the POFST loop operates in an identical manner. In operation, these loops will adjust the scaling of a YOFST and POFST to minimize the amount of DC signal on the sense channels.
- ADC clock synthesizer and counter 1 320 receives the analog AGCCOMP signal from AGC preamp and vibration oscillator 1 31 0, and provides the digital clock signals CLK and COUNT used to precisely synchronize the digital circuitry and sampling with the oscillations of the vibratory assembly. This is accomplished by using a high frequency oscillator which is divided down to a frequency matching the natural vibration frequency of vibratory assembly 1 00 and locked to a phase reference (such as the zero crossing point) of AGC signal AGPCOMP.
- the CLK/COUNT signal is shifted 90 degrees in-phase from the AGCCOMP signal to facilitate extraction of the sense signal angular rate information. Thus, it is precisely synchronized with the physical vibration of vibration assembly 1 00.
- a high speed HSCLK signal is also provided, which is synchronized with the CLK signal and has a higher frequency. During calibration, the 90 degree phase shift is selectively deactivated in order to determine YINPH and PINPH calibration values.
- ASIC 1 030 and EEPROM 1 020 communicate with an external microprocessor using a serial 2 wire interface, such as Philips' I2C interface, contained in serial interface and RAM block 1 355.
- the 2 wire interface conserves the number of connections required between the external package and the suspended assembly. In fact, there are only four electrical connections to the suspended assembly. This enables the external microprocessor to read digital values from result registers and to write calibration values and status values into input registers.
- EEPROM 1 020 During factory calibration, error signals are measured and the appropriate scaling factors stored in EEPROM 1 020. During initialization of normal operation, an external microprocessor reads the stored calibration values from EEPROM 1 020 and writes them to registers on ASIC 1 030. ASIC 1 030 uses these stored values to set the appropriate DAC levels used for performing the error corrections discussed above.
- Values YINPH, PINPH, YOFST, POFST, YCAX, PCAX, YSF, PSSF, RCC, CN and AGS are stored in the ⁇ PINPH > , and ⁇ YINPH > , ⁇ POFST > , ⁇ YOFST > , ⁇ YCAX > , ⁇ PCAX > , ⁇ YSF > , ⁇ PSSF > , ⁇ RCC > , ⁇ CN > , ⁇ AGS > registers respectively. During factory calibration these register values are written by an external processor to EEPROM 1020 for permanent storage.
- RCC is the time constant calibration used to adjust the oscillator center frequency to compensate for ASIC process variations.
- AGS is the amplitude calibration value which scales the AGC signal prior to amplitude detection. Thus, altering the value of AGS changes the physical amplitude of the driven counter-phase motion. Seeding (preloading) these values in the active registers in ASIC 1 030, which is on-board suspended assembly 1 1 1 0, allows each sensor to be electronically calibrated and improves start-up time.
- Digital and analog filtering is further performed throughout the circuitry in a conventional manner in order to remove the unwanted low and high-frequency components present on the signals. This circuitry is not illustrated.
- ASIC 1030 further includes temperature sensor 1 380 and voltage level detector 1 390 which are fed through voltage/temperature ADC 1 370 so that the temperature of the sensor, as well as the supply voltage can be reported. These values are made available to allow subsequent higher order error correction for temperature and voltage dependant phenomena.
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Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007503038A JP5160218B2 (en) | 2004-03-12 | 2005-03-11 | Vibration rotation rate sensor and operation method thereof |
EP05729161.9A EP1723390B1 (en) | 2004-03-12 | 2005-03-11 | Dual axis vibratory rate gyroscope |
CN2005800153504A CN1954190B (en) | 2004-03-12 | 2005-03-11 | Dual axis vibratory rate gyroscope |
KR1020067018592A KR101308550B1 (en) | 2004-03-12 | 2005-03-11 | Dual axis vibratory rate gyroscope |
US10/591,333 US7673510B2 (en) | 2004-03-12 | 2005-03-11 | Dual axis vibration rate gyroscope |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US55265204P | 2004-03-12 | 2004-03-12 | |
US60/552,652 | 2004-03-12 |
Publications (1)
Publication Number | Publication Date |
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WO2005090913A1 true WO2005090913A1 (en) | 2005-09-29 |
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PCT/US2005/008372 WO2005090915A1 (en) | 2004-03-12 | 2005-03-11 | Error correction for vibratory rate gyroscope |
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