WO2004106853A1 - Anordnung und ein verfahren zur erkennung von schichten, die auf oberflächen von bauteilen angeordnet sind, und bestimmung deren eigenschaften - Google Patents
Anordnung und ein verfahren zur erkennung von schichten, die auf oberflächen von bauteilen angeordnet sind, und bestimmung deren eigenschaften Download PDFInfo
- Publication number
- WO2004106853A1 WO2004106853A1 PCT/EP2004/005446 EP2004005446W WO2004106853A1 WO 2004106853 A1 WO2004106853 A1 WO 2004106853A1 EP 2004005446 W EP2004005446 W EP 2004005446W WO 2004106853 A1 WO2004106853 A1 WO 2004106853A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- examined
- detector unit
- detector
- imaging
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000000576 coating method Methods 0.000 title abstract description 7
- 238000011156 evaluation Methods 0.000 claims abstract description 13
- 239000000126 substance Substances 0.000 claims abstract description 8
- 230000001419 dependent effect Effects 0.000 claims abstract description 4
- 238000003384 imaging method Methods 0.000 claims description 22
- 238000005286 illumination Methods 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 3
- 238000011835 investigation Methods 0.000 claims description 2
- 238000012545 processing Methods 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 abstract description 3
- 230000003287 optical effect Effects 0.000 description 7
- 239000006185 dispersion Substances 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000005855 radiation Effects 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 4
- 238000013507 mapping Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/024—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using means for illuminating a slit efficiently (e.g. entrance slit of a spectrometer or entrance face of fiber)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0262—Constructional arrangements for removing stray light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
- G01N2021/945—Liquid or solid deposits of macroscopic size on surfaces, e.g. drops, films, or clustered contaminants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9586—Windscreens
Definitions
- the invention relates to an arrangement and a method for recognizing layers which are arranged on surfaces of components, and determining their properties, in particular water, ice and dirt layers on surfaces, preferably in the case of components of vehicles. Above all, the chemical properties and the surface properties of the layers, in particular the roughness, are to be determined.
- these layers are usually irradiated or irradiated with optical radiation and the radiation reflected or transmitted by these layers is measured and evaluated in different spectral ranges. These measurements can then be used to infer the presence of layers and, if such layers are present, their properties, in particular also their chemical properties, can be determined.
- DE 199 27 015 A1 discloses a method and a device for determining the thickness and growth rate of an ice layer on components of aircraft, in which the layer on the component surface before falling radiation is broken down into wavelength ranges by a holographic grating connected to a photoelectric line receiver and the measured radiation is compared with the line receiver with a stored reflection curve of the component surface without coating.
- the growth rate of such a layer can also be determined in several temporally staggered measuring intervals.
- a disadvantage of this method is the fact that the mechanical appearance of these layers cannot be distinguished. Only total thickness or concentration are determined. In particular, layers of ice, snow or hoarfrost cannot be distinguished spectroscopically or only with great effort. The roughness of a layer cannot be determined in this way.
- a spectrometer with a two-dimensional detector is known from FR 2 810 732 AI.
- the signal of several, one of which is perpendicular to the dispersion direction of the spectrometer, is Chen wavelength associated detector elements added.
- the spectrum obtained is evaluated.
- CCD or CMOS elements are provided as detector elements.
- the object of the invention is to create an arrangement and a method for recognizing layers and determining their properties on components, with which, in addition to the thickness and the chemical composition, the surface shape of such layers with a little can also be achieved in a simple manner complex detector can be determined.
- the detector arrangement consists of detector elements arranged in a matrix. These can advantageously be CCD or CMOS elements.
- the particular feature of the arrangement according to the invention and of the method carried out with it in contrast to the state of the art, is that the entrance slit is not completely illuminated by the light scattered or reflected by the layer, in particular by its surface. Thus, if there is no layer or a layer with a smooth surface on the component in question, only a relatively small part of the entrance slit is illuminated.
- the mapping of the gap through the imaging grid onto the flat, two-dimensionally resolved Transmitting detector arrangement creates a spectrum in the form of a narrow strip.
- the light that is no longer reflected or scattered at it will illuminate a more or less large area of the entrance slit depending on the degree of roughness, which is imaged by the imaging grating on the two-dimensionally resolving detector arrangement.
- the spectrum is created there in the form of a broad strip. From the signals supplied by the areally arranged detector elements, u. a. the roughness of the examined layer can be determined.
- the wavelength-dependent imaging of the illuminated part of the entrance slit takes place, in particular, by means of an imaging hologitter on the detector elements of the detector unit such that, depending on the roughness of the surface to be examined, a more or less wide area of the detector unit is irradiated.
- the holographic grating also spectrally decomposes the light influenced by the layer.
- the evaluation of the signals of the exposed detector elements and the determination and output of measured values relating to the properties of the layer under investigation are carried out in an evaluation unit.
- measured values for the roughness of the layer surface are determined from the width of the exposed area of the detector unit. From the spectral distribution z. B. the chemical composition of the layer can be determined.
- the invention will be explained in more detail below using an exemplary embodiment. In the drawing show in
- Fig. 2 simplifies an arrangement according to the invention
- Incident light illumination of the layer and Fig. 3 an arrangement, which on a transparent
- Disc is arranged.
- the arrangement shown in FIG. 1 for the detection of layers and the determination of their properties on surfaces, in particular water, ice and dirt layers on objects and components of vehicles basically represents a spectrometer.
- This arrangement comprises a housing 1, in which to illuminate an object or object 2, for example on a transparent or non-transparent object.
- the light source 4 is collimated with the optical element 5 ', that is, imaged to infinity.
- the other optical link 5 "then focuses the beam path onto the entrance slit 7. Both lenses and mirrors can be provided as optical links 5 'and 5".
- a flat detector unit 8 which is composed of matrix-like detector elements 9, for example CCD or CMOS elements, an imaging grating 10, e.g. B. a holographic grid, also arranged in the housing 1.
- the detector unit 8 is connected to an evaluation unit 11 such that the signals of each individual detector element 9 can be processed in this unit 11.
- the layer 3 to be examined is illuminated through the object 2 carrying it.
- 1 shielding elements 13 are arranged within the housing.
- the arrangement shown in simplified form in FIG. 2 has the same components and assemblies as the arrangement according to FIG. 1. The same reference numerals are also used for elements with the same function.
- a layer 14 located on the object 2 is illuminated in incident light. The light reflected from the surface 14 'is directed to the entrance slit 7 as in the arrangement according to FIG. 1 and is imaged onto the detector unit 8 by a holographic grating (not shown in FIG. 2 for the sake of simplicity).
- the signals of the detector elements (pixels) 9 belonging to a wavelength ⁇ are added as usual.
- the width and position of the spectra strips on the detector unit 8 are additionally calculated, e.g. B. by adding the signal values of all detector elements 9 in the dispersion direction. Then the width and position (position) of the center of gravity are calculated transversely to Dispersion direction and thus the determination of values for the roughness of the surface 3 'or 14' of the layer 3 or 14 to be examined.
- the output signals of each individual detector element 9 are fed to the evaluation unit 11, and by adding the signal values belonging to a wavelength ⁇ in the direction of dispersion, the chemical composition and the thickness of the layer 3 'or 14' are obtained according to known methods.
- a narrow distribution of this sum is a characteristic of a smooth layer surface and a broad distribution of the sum characterizes the measure for a rough surface.
- the position of the layer 3 to be examined ie the actual measurement object, can also be determined from the position and position of the strip imaged on the detector unit 8.
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Mathematical Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04734224A EP1629254A1 (de) | 2003-06-03 | 2004-05-21 | Anordnung und ein verfahren zur erkennung von schichten, die auf oberfl chen von bauteilen angeordnet sind, und bestimmung de ren eigenschaften |
US10/559,175 US7502108B2 (en) | 2003-06-03 | 2004-05-21 | Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics |
JP2006508185A JP2006526769A (ja) | 2003-06-03 | 2004-05-21 | 構成部材の表面に形成された成層の同定およびその特性の測定のための装置および方法。 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10324934.6 | 2003-06-03 | ||
DE10324934A DE10324934A1 (de) | 2003-06-03 | 2003-06-03 | Anordnung und ein Verfahren zur Erkennung von Schichten, die auf Oberflächen von Bauteilen angeordnet sind, und Bestimmung deren Eigenschaften |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004106853A1 true WO2004106853A1 (de) | 2004-12-09 |
Family
ID=33482387
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2004/005446 WO2004106853A1 (de) | 2003-06-03 | 2004-05-21 | Anordnung und ein verfahren zur erkennung von schichten, die auf oberflächen von bauteilen angeordnet sind, und bestimmung deren eigenschaften |
Country Status (5)
Country | Link |
---|---|
US (1) | US7502108B2 (de) |
EP (1) | EP1629254A1 (de) |
JP (1) | JP2006526769A (de) |
DE (1) | DE10324934A1 (de) |
WO (1) | WO2004106853A1 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2882590B1 (fr) * | 2005-02-28 | 2007-05-11 | Airbus France Sas | Sonde pour la mesure de l'epaisseur d'une accretien de givre sur une surface |
DE102005050432A1 (de) * | 2005-10-21 | 2007-05-03 | Rap.Id Particle Systems Gmbh | Vorrichtung und Verfahren zur Charakterisierung von Gleitmittel und Hydrophobierungsfilmen in pharmazeutischen Behältnissen bezüglich Dicke und Homogenität |
DE102005050795A1 (de) * | 2005-10-24 | 2007-04-26 | Leopold Kostal Gmbh & Co. Kg | Meßvorrichtung zur Bestimmung der Dicke und/oder der optischen Transmissionseigenschaften einer Scheibe, vorzugsweise einer Fahrzeugscheibe |
DE102010041748A1 (de) | 2010-09-30 | 2012-04-05 | Carl Zeiss Microimaging Gmbh | Vorrichtungen und Verfahren zur spektroskopischen Untersuchung von Proben |
DE102010041749A1 (de) | 2010-09-30 | 2012-04-05 | Carl Zeiss Microlmaging Gmbh | Messeinrichtungen und Vorrichtungen zur spektroskopischen Untersuchung von Proben |
JP5838466B2 (ja) * | 2011-03-11 | 2016-01-06 | ナノフォトン株式会社 | 光学顕微鏡、及び分光測定方法 |
US10126560B2 (en) * | 2016-02-18 | 2018-11-13 | National Engineering Research Center for Optical Instrumentation | Spectrum-generation system based on multiple-diffraction optical phasometry |
DE102019100615A1 (de) * | 2019-01-11 | 2020-07-16 | NoKra Optische Prüftechnik und Automation GmbH | Verfahren und Vorrichtung zur Erfassung einer Beschichtung auf einer Oberfläche |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4544271A (en) * | 1981-11-28 | 1985-10-01 | Shimadzu Corporation | Densitometer |
DE4413758A1 (de) * | 1993-04-21 | 1994-12-08 | Fraunhofer Ges Forschung | Verfahren und Vorrichtung für die Topographieprüfung von Oberflächen |
WO1999024786A1 (en) * | 1997-11-06 | 1999-05-20 | Stil S.A. | Optoelectronic system using spatiochromatic triangulation |
US6052188A (en) * | 1998-07-08 | 2000-04-18 | Verity Instruments, Inc. | Spectroscopic ellipsometer |
DE19927015A1 (de) * | 1999-06-07 | 2000-12-14 | Zeiss Carl Jena Gmbh | Verfahren und Vorrichtung zur Bestimmung der Dicke und Wachstumsgeschwindigkeit einer Eisschicht |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5166752A (en) * | 1990-01-11 | 1992-11-24 | Rudolph Research Corporation | Simultaneous multiple angle/multiple wavelength ellipsometer and method |
US5424827A (en) * | 1993-04-30 | 1995-06-13 | Litton Systems, Inc. | Optical system and method for eliminating overlap of diffraction spectra |
US5412473A (en) * | 1993-07-16 | 1995-05-02 | Therma-Wave, Inc. | Multiple angle spectroscopic analyzer utilizing interferometric and ellipsometric devices |
US5517032A (en) * | 1994-07-01 | 1996-05-14 | Transoptics, Inc. | Thin film thickness measuring system |
DE19506550A1 (de) * | 1995-02-24 | 1996-08-29 | Inst Chemo Biosensorik | Verfahren zur verzugsfreien Feststellung von und zur Warnung vor durch Glättebildung bedingte Gefahren und Vorrichtung zur Durchführung des Verfahrens |
DE19615366B4 (de) * | 1996-04-19 | 2006-02-09 | Carl Zeiss Jena Gmbh | Verfahren und Einrichtung zum Nachweis physikalischer, chemischer, biologischer oder biochemischer Reaktionen und Wechselwirkungen |
FR2810732B1 (fr) * | 2000-06-27 | 2003-04-18 | Jobin Yvon S A | Procede de mesure spectroscopique a definition spectrale amelioree |
US6952260B2 (en) * | 2001-09-07 | 2005-10-04 | Jian Ming Xiao | Double grating three dimensional spectrograph |
DE10205142B4 (de) * | 2002-02-07 | 2004-01-15 | Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V. | Anordnung und Verfahren zur Wellenlängenkalibration bei einem Echelle-Spektrometer |
JP4416522B2 (ja) * | 2004-01-26 | 2010-02-17 | キヤノン株式会社 | 分光器 |
-
2003
- 2003-06-03 DE DE10324934A patent/DE10324934A1/de not_active Withdrawn
-
2004
- 2004-05-21 EP EP04734224A patent/EP1629254A1/de not_active Withdrawn
- 2004-05-21 WO PCT/EP2004/005446 patent/WO2004106853A1/de not_active Application Discontinuation
- 2004-05-21 JP JP2006508185A patent/JP2006526769A/ja active Pending
- 2004-05-21 US US10/559,175 patent/US7502108B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4544271A (en) * | 1981-11-28 | 1985-10-01 | Shimadzu Corporation | Densitometer |
DE4413758A1 (de) * | 1993-04-21 | 1994-12-08 | Fraunhofer Ges Forschung | Verfahren und Vorrichtung für die Topographieprüfung von Oberflächen |
WO1999024786A1 (en) * | 1997-11-06 | 1999-05-20 | Stil S.A. | Optoelectronic system using spatiochromatic triangulation |
US6052188A (en) * | 1998-07-08 | 2000-04-18 | Verity Instruments, Inc. | Spectroscopic ellipsometer |
DE19927015A1 (de) * | 1999-06-07 | 2000-12-14 | Zeiss Carl Jena Gmbh | Verfahren und Vorrichtung zur Bestimmung der Dicke und Wachstumsgeschwindigkeit einer Eisschicht |
Also Published As
Publication number | Publication date |
---|---|
DE10324934A1 (de) | 2004-12-23 |
US20070195323A1 (en) | 2007-08-23 |
US7502108B2 (en) | 2009-03-10 |
EP1629254A1 (de) | 2006-03-01 |
JP2006526769A (ja) | 2006-11-24 |
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