WO2004072624A1 - 蛍光相関分光解析装置 - Google Patents

蛍光相関分光解析装置 Download PDF

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Publication number
WO2004072624A1
WO2004072624A1 PCT/JP2004/001558 JP2004001558W WO2004072624A1 WO 2004072624 A1 WO2004072624 A1 WO 2004072624A1 JP 2004001558 W JP2004001558 W JP 2004001558W WO 2004072624 A1 WO2004072624 A1 WO 2004072624A1
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WO
WIPO (PCT)
Prior art keywords
fluorescent
analysis device
correlated
optical system
ccd camera
Prior art date
Application number
PCT/JP2004/001558
Other languages
English (en)
French (fr)
Inventor
Hirohiko Watanabe
Motoyuki Watanabe
Takayuki Inoue
Original Assignee
Hamamatsu Photonics K.K.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics K.K. filed Critical Hamamatsu Photonics K.K.
Priority to JP2005505002A priority Critical patent/JP4495083B2/ja
Priority to EP04710981A priority patent/EP1593957B1/en
Priority to DE602004018272T priority patent/DE602004018272D1/de
Priority to US10/545,393 priority patent/US7400396B2/en
Publication of WO2004072624A1 publication Critical patent/WO2004072624A1/ja
Priority to US12/000,732 priority patent/US7737389B2/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2823Imaging spectrometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2889Rapid scan spectrometers; Time resolved spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4406Fluorescence spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/443Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • G01J2003/28132D-array
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • G01J2003/282Modified CCD or like
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices
    • G01N2021/6423Spectral mapping, video display
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

蛍光相関分光解析装置1は、励起光照射光学系21、蛍光結像光学系22、CCDカメラ15、及びデータ解析装置16を備えている。励起光照射光学系21は、被測定試料Sの所定領域に励起光を照射する。蛍光結像光学系22は、被測定試料Sで発生した蛍光をCCDカメラ15の光検出面に結像する。CCDカメラ15は、光検出面に入射した蛍光を各画素毎に光電変換し、光電変換により発生した電荷を出力端から検出信号として出力する。データ解析装置16は、CCDカメラ15の画素のうち解析対象画素群に属する画素において発生した電荷による検出信号を入力し、入力した検出信号の自己相関関数を各画素毎に演算する。これにより、被測定試料の多点に対して同時且つ高速に蛍光相関分光解析を行うことが可能な蛍光相関分光解析装置が得られる。
PCT/JP2004/001558 2003-02-13 2004-02-13 蛍光相関分光解析装置 WO2004072624A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2005505002A JP4495083B2 (ja) 2003-02-13 2004-02-13 蛍光相関分光解析装置
EP04710981A EP1593957B1 (en) 2003-02-13 2004-02-13 Fluorescent correlated spectrometric analysis device
DE602004018272T DE602004018272D1 (de) 2003-02-13 2004-02-13 Fluoreszenzkorrelierte spektrometrische analyseeinrichtung
US10/545,393 US7400396B2 (en) 2003-02-13 2004-02-13 Fluorescent correalated spectrometric analysis device
US12/000,732 US7737389B2 (en) 2003-02-13 2007-12-17 Image pickup device including photodetection surface and transfer control arrangement

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2003035415 2003-02-13
JP2003-035415 2003-02-13
JP2003352638 2003-10-10
JP2003-352638 2003-10-10

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US10/545,393 A-371-Of-International US7400396B2 (en) 2003-02-13 2004-02-13 Fluorescent correalated spectrometric analysis device
US12/000,732 Continuation US7737389B2 (en) 2003-02-13 2007-12-17 Image pickup device including photodetection surface and transfer control arrangement

Publications (1)

Publication Number Publication Date
WO2004072624A1 true WO2004072624A1 (ja) 2004-08-26

Family

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PCT/JP2004/001558 WO2004072624A1 (ja) 2003-02-13 2004-02-13 蛍光相関分光解析装置

Country Status (5)

Country Link
US (2) US7400396B2 (ja)
EP (2) EP1593957B1 (ja)
JP (1) JP4495083B2 (ja)
DE (1) DE602004018272D1 (ja)
WO (1) WO2004072624A1 (ja)

Cited By (8)

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WO2008087869A1 (ja) * 2007-01-16 2008-07-24 Olympus Corporation 蛍光信号解析装置および蛍光信号解析方法
US20090290780A1 (en) * 2006-07-17 2009-11-26 Karsten Kottig Analysis method for chemical and/or biological samples
JP2010517056A (ja) * 2007-01-30 2010-05-20 ジーイー・ヘルスケア・バイオサイエンス・コーポレイション 時間分解蛍光イメージングシステム
JP2010197248A (ja) * 2009-02-25 2010-09-09 Furukawa Electric Co Ltd:The ラテラルフロー型蛍光イムノクロマト法用の標的物質を定量的に検出する装置
JP2010281735A (ja) * 2009-06-05 2010-12-16 Olympus Corp 画像解析方法および画像解析装置
JP2011085485A (ja) * 2009-10-15 2011-04-28 Olympus Corp 画像解析方法および画像解析装置
JP2012529119A (ja) * 2009-06-02 2012-11-15 ソーファスト ゲーエムベーハー 超解像光ゆらぎイメージング(sofi)
CN105794195A (zh) * 2014-10-27 2016-07-20 松下知识产权经营株式会社 图像形成***、图像形成方法、拍摄元件以及程序

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EP1593957B1 (en) 2003-02-13 2008-12-10 Hamamatsu Photonics K. K. Fluorescent correlated spectrometric analysis device
GB0414201D0 (en) 2004-06-24 2004-07-28 Fujifilm Electronic Imaging Method and apparatus for forming a multiple focus stack image
GB0503032D0 (en) 2005-02-14 2005-03-23 Fujifilm Electronic Imaging Blip focus
US7315372B1 (en) * 2005-09-29 2008-01-01 The United States Of America As Represented By The Secretary Of The Navy Instrument using near-field intensity correlation measurements for characterizing scattering of light by suspensions
US7706632B2 (en) 2008-01-17 2010-04-27 Ffei Limited Method and apparatus for forming a multiple focus stack image
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JP2010276380A (ja) * 2009-05-26 2010-12-09 Olympus Corp 蛍光相関分光分析装置及び方法並びにそのためのコンピュータプログラム
JP5337676B2 (ja) * 2009-06-25 2013-11-06 株式会社日立ハイテクノロジーズ 蛍光分析装置および蛍光検出装置
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DE102010016818A1 (de) * 2010-03-16 2011-09-22 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zur Durchführung von Multipoint-FCS
JP6298728B2 (ja) * 2014-06-26 2018-03-20 ルネサスエレクトロニクス株式会社 磁気計測装置
JP6583442B2 (ja) * 2016-02-19 2019-10-02 株式会社ニコン 試料作製方法および試料作製装置
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Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090290780A1 (en) * 2006-07-17 2009-11-26 Karsten Kottig Analysis method for chemical and/or biological samples
WO2008087869A1 (ja) * 2007-01-16 2008-07-24 Olympus Corporation 蛍光信号解析装置および蛍光信号解析方法
US8194981B2 (en) 2007-01-16 2012-06-05 Olympus Corporation Fluorescent signal analyzing apparatus and fluorescent signal analyzing method
JP5489469B2 (ja) * 2007-01-16 2014-05-14 オリンパス株式会社 蛍光信号解析装置および蛍光信号解析方法
JP2010517056A (ja) * 2007-01-30 2010-05-20 ジーイー・ヘルスケア・バイオサイエンス・コーポレイション 時間分解蛍光イメージングシステム
JP2010197248A (ja) * 2009-02-25 2010-09-09 Furukawa Electric Co Ltd:The ラテラルフロー型蛍光イムノクロマト法用の標的物質を定量的に検出する装置
JP4676539B2 (ja) * 2009-02-25 2011-04-27 古河電気工業株式会社 ラテラルフロー型蛍光イムノクロマト法用の標的物質を定量的に検出する装置及びその方法
JP2014207018A (ja) * 2009-06-02 2014-10-30 ソーファスト ゲーエムベーハー 超解像光ゆらぎイメージング(sofi)
JP2012529119A (ja) * 2009-06-02 2012-11-15 ソーファスト ゲーエムベーハー 超解像光ゆらぎイメージング(sofi)
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JP2010281735A (ja) * 2009-06-05 2010-12-16 Olympus Corp 画像解析方法および画像解析装置
JP2011085485A (ja) * 2009-10-15 2011-04-28 Olympus Corp 画像解析方法および画像解析装置
US8705865B2 (en) 2009-10-15 2014-04-22 Olympus Corporation Image analysis method and image analysis apparatus
CN105794195A (zh) * 2014-10-27 2016-07-20 松下知识产权经营株式会社 图像形成***、图像形成方法、拍摄元件以及程序
CN105794195B (zh) * 2014-10-27 2020-02-07 松下知识产权经营株式会社 图像形成***、图像形成方法以及拍摄元件

Also Published As

Publication number Publication date
US7400396B2 (en) 2008-07-15
JP4495083B2 (ja) 2010-06-30
DE602004018272D1 (de) 2009-01-22
EP1593957B1 (en) 2008-12-10
US20080174776A1 (en) 2008-07-24
EP1593957A1 (en) 2005-11-09
US7737389B2 (en) 2010-06-15
US20060262301A1 (en) 2006-11-23
EP1593957A4 (en) 2006-04-26
EP1925930A1 (en) 2008-05-28
JPWO2004072624A1 (ja) 2006-06-01

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