WO2004052059A3 - Methods for identification and verification using vacuum xrf system - Google Patents

Methods for identification and verification using vacuum xrf system Download PDF

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Publication number
WO2004052059A3
WO2004052059A3 PCT/US2003/038381 US0338381W WO2004052059A3 WO 2004052059 A3 WO2004052059 A3 WO 2004052059A3 US 0338381 W US0338381 W US 0338381W WO 2004052059 A3 WO2004052059 A3 WO 2004052059A3
Authority
WO
WIPO (PCT)
Prior art keywords
methods
verification
identification
vacuum
well
Prior art date
Application number
PCT/US2003/038381
Other languages
French (fr)
Other versions
WO2004052059A2 (en
Inventor
Harry Fred Schramm
Bruce J Kaiser
Original Assignee
Keymaster Technologies Inc
Nasa
Harry Fred Schramm
Bruce J Kaiser
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Keymaster Technologies Inc, Nasa, Harry Fred Schramm, Bruce J Kaiser filed Critical Keymaster Technologies Inc
Priority to AU2003302325A priority Critical patent/AU2003302325A1/en
Priority to EP03810881A priority patent/EP1570258A4/en
Publication of WO2004052059A2 publication Critical patent/WO2004052059A2/en
Publication of WO2004052059A3 publication Critical patent/WO2004052059A3/en

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Apparatus and methods in which one or more elemental taggants that are intrinsically located in an object are detected by x-ray fluorescence analysis under vacuum conditions to identify or verify the object’s elemental content for elements with lower atomic numbers. By using x-ray fluorescence analysis, the apparatus and methods of the invention are simple and easy to use, as well as provide detection by a non line of-sight method to establish the origin of objects, as well as their point of manufacture, authenticity, verification, security, and the presence of impurities. The invention is extremely advantageous because it provides the capability to measure lower atomic number elements in the field with a portable instrument.
PCT/US2003/038381 2002-11-29 2003-11-28 Methods for identification and verification using vacuum xrf system WO2004052059A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
AU2003302325A AU2003302325A1 (en) 2002-11-29 2003-11-28 Methods for identification and verification using vacuum xrf system
EP03810881A EP1570258A4 (en) 2002-11-29 2003-11-28 Methods for identification and verification using vacuum xrf system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/307,191 2002-11-29
US10/307,191 US6909770B2 (en) 2001-12-05 2002-11-29 Methods for identification and verification using vacuum XRF system

Publications (2)

Publication Number Publication Date
WO2004052059A2 WO2004052059A2 (en) 2004-06-17
WO2004052059A3 true WO2004052059A3 (en) 2004-09-10

Family

ID=32467787

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/038381 WO2004052059A2 (en) 2002-11-29 2003-11-28 Methods for identification and verification using vacuum xrf system

Country Status (4)

Country Link
US (1) US6909770B2 (en)
EP (1) EP1570258A4 (en)
AU (1) AU2003302325A1 (en)
WO (1) WO2004052059A2 (en)

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Also Published As

Publication number Publication date
US6909770B2 (en) 2005-06-21
US20030133537A1 (en) 2003-07-17
EP1570258A4 (en) 2007-11-21
WO2004052059A2 (en) 2004-06-17
AU2003302325A1 (en) 2004-06-23
AU2003302325A8 (en) 2004-06-23
EP1570258A2 (en) 2005-09-07

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