WO2000042397A1 - Source lumineuse et analyseur - Google Patents
Source lumineuse et analyseur Download PDFInfo
- Publication number
- WO2000042397A1 WO2000042397A1 PCT/JP2000/000136 JP0000136W WO0042397A1 WO 2000042397 A1 WO2000042397 A1 WO 2000042397A1 JP 0000136 W JP0000136 W JP 0000136W WO 0042397 A1 WO0042397 A1 WO 0042397A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- lamp
- light source
- source device
- deuterium lamp
- light
- Prior art date
Links
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 claims abstract description 66
- 229910052805 deuterium Inorganic materials 0.000 claims abstract description 66
- 235000012745 brilliant blue FCF Nutrition 0.000 claims 1
- 238000001816 cooling Methods 0.000 description 21
- 238000005286 illumination Methods 0.000 description 16
- 238000012986 modification Methods 0.000 description 8
- 230000004048 modification Effects 0.000 description 8
- 238000010891 electric arc Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 125000006850 spacer group Chemical group 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 241001621399 Lampris Species 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000010425 asbestos Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000003578 releasing effect Effects 0.000 description 1
- 229910052895 riebeckite Inorganic materials 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/68—Lamps in which the main discharge is between parts of a current-carrying guide, e.g. halo lamp
Definitions
- the present invention relates to a light source device provided with a deuterium lamp and an analyzer using the same.
- the temperature of the deuterium lamp rises due to the discharge that occurs between the anode and the cathode, but if the temperature rises too high, the lamp's original characteristics cannot be obtained, or the lamp cannot be used. The life of the camera will be shortened. Also, in a spectrometer incorporating a deuterium lamp or a spectroscope, if the temperature of the deuterium lamp becomes too high, the optical system is adversely affected. Therefore, in order to cool the deuterium lamp, a method of forcibly cooling with a cooling fan was devised. However, when this cooling fan was used, there was a problem that the light fluctuated due to the vibrations of the motor and the ambient temperature of the optical system and the detection unit changed due to the wind from the fan.
- a method of cooling a light source using a heat pipe has been adopted instead of a cooling method using a cooling fan.
- Techniques for cooling a light source using this heat pipe include, for example, a light source cooling device disclosed in Japanese Patent Application Laid-Open No. 63-229225, and Japanese Patent Application Laid-Open No. Hei 8-230359.
- a spectrophotometer published in. The technology described in each of these publications is to attach a heat pipe to a container for storing a light source, thereby preventing an excessive rise in temperature of the light source. Then, according to the cooling method using the heat pipe, the problem in the case of using the cooling fan described above can be solved.
- the present invention has been made in view of such circumstances, and has as its object to provide a light source device having high cooling efficiency and an analyzer using the same.
- a light source device includes a deuterium lamp that emits predetermined light by causing a discharge between an anode and a cathode, and a lamp housing that houses the deuterium lamp. And a heat pipe provided in the pipe fixing portion, wherein the deuterium lamp and the lamp storing container each have positioning means, and each of the deuterium lamps and the lamp storing vessel has a positioning means.
- the cathode of the deuterium lamp is positioned so as to be close to the pipe fixing part.
- the deuterium lamp is housed in the lamp housing part of the lamp housing when the light is emitted.
- the lamp container is provided with a pipe fixing portion provided with a heat pipe. Further, the deuterium lamp and the lamp container are positioned and fixed by the positioning means of each of them so that the cathode side of the deuterium lamp is close to the pipe fixing part. As a result, the hottest cathode portion of the deuterium lamp during light emission is effectively cooled by the heat pipe. Further, in the light source device according to the present invention, it is desirable that the light source device further includes a heat insulating member that covers the lamp storage container.
- An analyzer includes: a light source device as described above; a sample cell having a housing portion capable of housing a sample to be measured and allowing light emitted from the light source device to pass therethrough; A spectroscope for splitting light.
- the analyzer since the light source device having high cooling efficiency is used as described above, the light passing through the sample cell for storing the sample to be measured and the sample to be measured in the storage unit is separated. The temperature rise with the spectroscope can be prevented.
- FIG. 1 is an exploded perspective view of a light source device according to the present invention.
- FIG. 2 is a cross-sectional view in the II-II direction in a state where the light source device shown in FIG. 1 is assembled.
- FIG. 3 is a side view showing a modification of the light source device shown in FIG.
- FIG. 4 is a side view showing a second modification of the light source device shown in FIG.
- FIG. 5 is a diagram showing an analyzer according to the present invention.
- FIG. 6 is a cross-sectional view in the VI-VI direction of the light source device used in the analyzer shown in FIG.
- FIG. 7 is a diagram showing a modification of the analyzer shown in FIG. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1 is an exploded perspective view of the light source device 2 of the present embodiment
- FIG. 2 is a cross-sectional view in the II-II direction in a state where the light source device 2 shown in FIG. 1 is assembled.
- the light source device 2 includes a deuterium lamp 4 and a lamp container 6 that stores the deuterium lamp 4.
- the deuterium lamp 4 is a side-on type deuterium lamp.
- the deuterium lamp 4 has a glass bulb 8 in which deuterium gas is sealed. 10 are accommodated.
- the light emitting unit assembly 10 includes a ceramic spacer 12, a ceramic anode support plate 14, and a spacer 12.
- the anode plate 20 is located near the axis of the bulb 8
- the cathode part 22 is located at the outer edge in the bulb 8.
- an annular flange 24 is provided on the outer periphery of the lower portion of the bulb 8 of the deuterium lamp 4, and the flange 24 has two screw holes 26 and 27 formed therein. ing.
- the lamp storage container 6 includes a lamp storage section 28 having a storage space S for storing the deuterium lamp 4 therein, and a pipe fixing section 32 for fixing three heat pipes 30.
- a light exit window 34 is formed on the side surface of the lamp housing 28, and screw holes 36, 37 having the same diameter as the screw holes 26, 27 are formed at the bottom of the lamp housing 28.
- a flange portion 38 is formed. Further, the lamp housing part 28 and the pipe fixing part 32 are both made of aluminum and are integrally formed.
- the distance between the anode plate 20 and the pipe fixing portion 32 is The distance between the cathode part 22 and the pipe fixing part 32 is made smaller.
- the position of the cathode part 22 is not limited to the position shown in FIG. 2, and can be variously changed in the vicinity of the pipe fixing part 32.
- the positioning means does not necessarily have to be a screw hole as in the present embodiment.
- the screw holes 26 and 27 may be female screw portions.
- the heat pipe 30 has a heat absorbing part 30 a and a heat radiating part 30 b, and the heat absorbing part 30 a is inserted into a through hole 32 h formed in the pipe fixing part 32.
- the end of the heat pipe 30 on the side of the heat absorbing portion 30a protrudes from the through hole 32h.
- a power of about 10 W is supplied to the cathode section 22 from an external power supply (not shown) for about 20 seconds to preheat the cathode section 22.
- a DC open-circuit voltage of about 150 V is applied between the cathode section 22 and the anode plate 20 to prepare for arc discharge.
- a trigger current of about 350 to 500 V is applied between the cathode part 22 and the anode plate 20 in a state where the preparation for arc discharge is completed.
- the thermoelectrons emitted from the cathode part 22 converge at the converging aperture 16 a of the converging electrode plate 16 and reach the anode plate 20.
- an arc discharge is generated in front of the convergence opening 16a, and ultraviolet rays extracted from the arc ball by the arc discharge are emitted to the outside through the emission window 34.
- the temperature of the light source device 2 is highest at the cathode section 22.
- the deuterium lamp 4 and the lamp container 6 are positioned so that the cathode part 22 is close to the pipe fixing part 32. Therefore, the temperature rise of the deuterium lamp 2 can be effectively prevented. For this reason, the characteristics of the deuterium lamp 2 are further improved and the deuterium lamp 2 operates stably. Also, since the distance between the cathode part 22 and the pipe fixing part 32 is smaller than the distance between the anode plate 20 and the pipe fixing part 32, the temperature is lower than that of the anode plate 20 having a lower temperature. The cathode section 22 having a high temperature can be effectively cooled.
- the lamp storage section 28 and the pipe fixing section 32 are integrally formed, the heat of the lamp storage section 28 for storing the deuterium lamp 4 is easily transmitted to the pipe fixing section 32, and the heavy The cooling efficiency of the hydrogen lamp 4 can be further increased. It is of course important to cool the light source, but even if the temperature of the deuterium lamp 2 becomes too low due to excessive cooling, it is difficult to obtain the original characteristics of the deuterium lamp. Therefore, it is desirable to cool the light source to a predetermined temperature range (for example, 230 ° C to 280 ° C).
- the light source device 2 of the present embodiment can easily control the temperature of the deuterium lamp 2 by adjusting the position of the cathode part 22 or the like.
- FIG. 3 is a side view of the present modified example.
- This modification differs from the light source device shown in FIGS. 1 and 2 in that an annular small-diameter flange 44 is provided on the upper surface of an annular flange 24 attached to the lower periphery of the bulb 8. It is.
- the small flange 4 is dimensioned so that the outer periphery of the small flange 44 and the inner peripheral surface forming the storage space S of the lamp storage part 28 are fitted. Thereby, the positioning of the deuterium lamp 4 and the lamp container 6 can be performed more reliably.
- FIG. 4 is a side view of the present modified example.
- This modification differs from the light source device shown in FIGS. 1 and 2 in that the thickness of the flange portion 38 of the lamp housing 6 is increased, and a circular fitting space R is formed therein. Is a point.
- the flange portion 38 is dimensioned so that the inner peripheral surface forming the fitting space R is fitted to the outer peripheral surface of the flange 24 of the deuterium lamp 4.
- the deuterium lamp 4 and the lamp Positioning with the container 6 can be performed more reliably.
- FIG. 5 is a partial cross-sectional view showing the analyzer 50
- FIG. 6 is a cross-sectional view of the light source device shown in FIG.
- the analyzer 50 includes the light source device 2, a sample cell 52 for storing a sample to be measured, and a spectrometer 54.
- a heat insulating case 56 that covers the light source device 2 is provided on the outer periphery of the light source device 2.
- the heat insulating case 56 includes a stainless steel housing 56 a and an asbestos heat insulating member 56 b housed inside the housing 56 a.
- emission windows 58 and 60 for passing the output light from the deuterium lamp 4 are formed in the housing 56 a and the heat insulating member 56 b, respectively.
- a heat radiating fin 62 for enhancing a heat releasing effect is attached on the heat radiating portion 30 b side of the heat pipe 30 of the light source device 2.
- a power supply 57 for supplying power to the deuterium lamp is connected to the deuterium lamp 4.
- Light guides 62 for guiding the illumination light emitted from the deuterium lamp 4 to the incident surface of the sample cell 52 are arranged in the emission windows 58 and 60 of the heat insulating case 56.
- the light guide 62 is constituted by a quartz glass mouthpiece.
- the sample cell 52 has a housing 63 that can hold the sample to be measured and allows the illumination light from the deuterium lamp 4 to pass therethrough, an inlet 64 for allowing the sample to flow into the inside, and an internal And an outlet 66 for allowing the sample to be measured to flow out.
- the inlet 64 and the outlet 66 are connected to, for example, a transport pipe for transporting the sample to be measured. In this case, a part of the sample to be transported in the transport pipe is connected to the inlet 64 The sample then flows into the sample cell 52 and returns to the transport pipe from the outlet 66.
- a light guide 68 for guiding the illumination light emitted from the emission surface of the sample cell 52 to the spectrometer 54 is provided.
- the light guide 68 is constituted by an optical fiber.
- the spectroscope 54 inputs the illumination light emitted from the sample cell 52 via the light guide 68, and further splits the light.
- the spectroscope 54 includes a slit 70 having a rectangular opening, a reflecting mirror 72 that reflects illumination light passing through the slit 70, and an angle corresponding to the wavelength of the illumination light that has arrived from the reflecting mirror 72. It is provided with a grating 74 for diffracting and diffracting light at a wavelength, and a photodiode array 76 for detecting the separated illumination light.
- the sample to be measured flows into the storage portion 63 of the sample cell 52 from the inlet 64, and flows out from the outlet 66.
- the illuminating light emitted from the deuterium lamp 4 of the light source device 2 passes through the light guide 62 and enters the housing 63 of the sample cell 52.
- the illumination light that has entered the storage section 63 is absorbed by the sample to be measured in the storage section 63 according to the wavelength of the sample, and is emitted from the emission surface.
- the illumination light emitted from the sample cell 52 passes through the light guide 68 and enters the spectroscope 54 through the opening of the slit 70.
- the illumination light is reflected by the reflecting mirror 72, diffracted by the grating 74 at an angle corresponding to the wavelength, and the illumination light diffracted by the photodiode array 76 is detected.
- the spectrum of the illumination light can be obtained. Since the spectrum of the illumination light reflects the absorption according to the wavelength of the sample to be measured in the sample cell 52, the sample to be measured in the sample cell 52 is analyzed based on the spectrum of the illumination light. can do.
- the analyzer 50 of the present embodiment since the cooling efficiency of the deuterium lamp 4 is increased as described above, it is possible to prevent the temperature of the sample cell 52 and the spectrometer 54 from rising. And stable analysis can be performed. Further, since the light source device 2 is provided with the heat insulation case 56, heat conduction from the deuterium lamp 4 to the sample cell 52 and the spectrometer 54 can be further suppressed.
- the sample cell 80 differs from the analyzer 50 shown in FIG. 5 in the structure of the sample cell.
- This modification Unlike the sample cell 52, the sample cell 82 does not have an inflow portion and an outflow portion, and is a case (accommodating portion) for enclosing the sample to be measured.
- a lens 84 that collects illumination light from the deuterium lamp 4 is disposed between the light source device 2 and the sample cell 82, and the sample cell 82 and the slit 70 of the spectrometer 54 are disposed. Between them, a lens 86 for condensing the illumination light passing through the sample cell 82 is arranged.
- the cooling efficiency of the deuterium lamp 4 is increased, as in the analyzer 50 shown in FIG. 5, so that the temperature of the sample cell 52 and the spectrometer 54 is increased.
- the rise can be prevented, and stable analysis can be performed.
- the present invention is not limited to the above embodiment.
- the lamp storage section and the pipe fixing section do not necessarily have to be integrally formed, but may be connected separately.
- the number of screw holes constituting the positioning means is not limited to two, and the number thereof can be variously changed.
- the deuterium lamp and the lamp container are positioned so that the cathode side of the deuterium lamp is close to the pipe fixing portion by positioning means such as screws provided for each. Fixed. For this reason, the cathode portion, which has the highest temperature among the deuterium lamps at the time of light emission, is effectively cooled by the heat pipe, and the cooling efficiency of the deuterium lamp can be increased.
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Measuring Cells (AREA)
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU20039/00A AU2003900A (en) | 1999-01-13 | 2000-01-13 | Light source and analyzer |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11006769A JP2000205953A (ja) | 1999-01-13 | 1999-01-13 | 光源装置および分析装置 |
JP11/6769 | 1999-01-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2000042397A1 true WO2000042397A1 (fr) | 2000-07-20 |
Family
ID=11647396
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2000/000136 WO2000042397A1 (fr) | 1999-01-13 | 2000-01-13 | Source lumineuse et analyseur |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2000205953A (fr) |
AU (1) | AU2003900A (fr) |
WO (1) | WO2000042397A1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013145112A1 (fr) * | 2012-03-27 | 2013-10-03 | 株式会社島津製作所 | Dispositif de spéctrométrie |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5739322A (en) * | 1980-08-22 | 1982-03-04 | Hitachi Ltd | Photometer |
JPS63292025A (ja) * | 1987-05-26 | 1988-11-29 | Fuji Electric Co Ltd | 分光分析計の光源冷却装置 |
JPH08233659A (ja) * | 1995-02-28 | 1996-09-13 | Shimadzu Corp | 分光光度計 |
-
1999
- 1999-01-13 JP JP11006769A patent/JP2000205953A/ja active Pending
-
2000
- 2000-01-13 WO PCT/JP2000/000136 patent/WO2000042397A1/fr active Application Filing
- 2000-01-13 AU AU20039/00A patent/AU2003900A/en not_active Abandoned
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5739322A (en) * | 1980-08-22 | 1982-03-04 | Hitachi Ltd | Photometer |
JPS63292025A (ja) * | 1987-05-26 | 1988-11-29 | Fuji Electric Co Ltd | 分光分析計の光源冷却装置 |
JPH08233659A (ja) * | 1995-02-28 | 1996-09-13 | Shimadzu Corp | 分光光度計 |
Also Published As
Publication number | Publication date |
---|---|
AU2003900A (en) | 2000-08-01 |
JP2000205953A (ja) | 2000-07-28 |
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