USD447967S1 - Measuring apparatus for measuring a particle size distribution - Google Patents

Measuring apparatus for measuring a particle size distribution Download PDF

Info

Publication number
USD447967S1
USD447967S1 US29/132,403 US13240300F USD447967S US D447967 S1 USD447967 S1 US D447967S1 US 13240300 F US13240300 F US 13240300F US D447967 S USD447967 S US D447967S
Authority
US
United States
Prior art keywords
measuring
particle size
size distribution
measuring apparatus
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/132,403
Inventor
Koji Terada
Kaoru Takarada
Kenichi Inami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to US29/132,403 priority Critical patent/USD447967S1/en
Assigned to SYSMEX CORPORATION reassignment SYSMEX CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: INAMI, KENICHI, TAKARADA, KAORU, TERADA, KOJI
Application granted granted Critical
Publication of USD447967S1 publication Critical patent/USD447967S1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Description

FIG. 1 is a front view of a measuring apparatus for measuring a particle size distribution showing our new design;
FIG. 2 is a rear view thereof;
FIG. 3 is a left side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 is a bottom plan view thereof.

Claims (1)

  1. The ornamental design for a measuring apparatus for measuring a particle size distribution, as shown and described.
US29/132,403 2000-11-08 2000-11-08 Measuring apparatus for measuring a particle size distribution Expired - Lifetime USD447967S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/132,403 USD447967S1 (en) 2000-11-08 2000-11-08 Measuring apparatus for measuring a particle size distribution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/132,403 USD447967S1 (en) 2000-11-08 2000-11-08 Measuring apparatus for measuring a particle size distribution

Publications (1)

Publication Number Publication Date
USD447967S1 true USD447967S1 (en) 2001-09-18

Family

ID=22453890

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/132,403 Expired - Lifetime USD447967S1 (en) 2000-11-08 2000-11-08 Measuring apparatus for measuring a particle size distribution

Country Status (1)

Country Link
US (1) USD447967S1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate

Similar Documents

Publication Publication Date Title
USD432930S (en) Distance measuring device
USD420987S (en) Handheld computer
USD444296S1 (en) Carrying case
USD404713S (en) Adapter
USD438478S1 (en) Measuring tape
USD408363S (en) Adapter
USD408364S (en) Adapter
USD439253S1 (en) Ergonomic mouse
USD436286S1 (en) Egg-cooker
USD447967S1 (en) Measuring apparatus for measuring a particle size distribution
USD420870S (en) Measuring funnel
USD447070S1 (en) Multi-meter
USD405889S (en) Pill crusher apparatus
USD436629S1 (en) Display
USD404979S (en) Bottle-attaching funnel
USD424206S (en) Exfoliation apparatus
USD444167S1 (en) Multi-pick apparatus
USD447155S1 (en) Grinder
USD453550S1 (en) Shower apparatus
USD452842S1 (en) Adapter
USD443093S1 (en) Adjustable tracklight
USD449608S1 (en) Computer switching apparatus
USD442583S1 (en) Handheld computer
USD429287S (en) Handheld computer
USD442777S1 (en) Carrying case