USD1003181S1 - Test and measurement instrument and accessories - Google Patents
Test and measurement instrument and accessories Download PDFInfo
- Publication number
- USD1003181S1 USD1003181S1 US29/809,745 US202129809745F USD1003181S US D1003181 S1 USD1003181 S1 US D1003181S1 US 202129809745 F US202129809745 F US 202129809745F US D1003181 S USD1003181 S US D1003181S
- Authority
- US
- United States
- Prior art keywords
- test
- accessories
- measurement instrument
- view
- elevational view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005259 measurement Methods 0.000 title claims description 5
- 230000007613 environmental effect Effects 0.000 description 1
Images
Description
The broken lines in the drawings depict environmental structure as well as unclaimed portions of the test and measurement instrument and accessories, neither of which form any part of the claimed design.
Claims (1)
- The ornamental design for a test and measurement instrument and accessories, as shown and described.
Priority Applications (13)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/809,745 USD1003181S1 (en) | 2021-09-29 | 2021-09-29 | Test and measurement instrument and accessories |
TW111305708F TWD225702S (en) | 2021-09-29 | 2022-03-29 | Stand accessory for test and measurement instrument |
JP2022006486F JP1743919S (en) | 2021-09-29 | 2022-03-29 | electrical measuring instrument |
JP2022006490F JP1731016S (en) | 2021-09-29 | 2022-03-29 | electrical measuring instrument |
JP2022006488F JP1731014S (en) | 2021-09-29 | 2022-03-29 | electrical measuring instrument |
JP2022006487F JP1743857S (en) | 2021-09-29 | 2022-03-29 | electrical measuring instrument |
TW111305709F TWD225703S (en) | 2021-09-29 | 2022-03-29 | Battery accessory for test and measurement instrument |
TW111301482F TWD224179S (en) | 2021-09-29 | 2022-03-29 | Test and measurement instrument |
TW111305710F TWD225704S (en) | 2021-09-29 | 2022-03-29 | Test and measurement instrument |
JP2022006489F JP1731015S (en) | 2021-09-29 | 2022-03-29 | electrical measuring instrument |
TW111305707F TWD225701S (en) | 2021-09-29 | 2022-03-29 | Test and measurement instrument with stand and battery |
US17/953,234 US20230016996A1 (en) | 2019-09-17 | 2022-09-26 | Stand for a test and measurement instrument |
CN202211201397.1A CN115875544A (en) | 2021-09-29 | 2022-09-29 | Support for a test and measurement instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/809,745 USD1003181S1 (en) | 2021-09-29 | 2021-09-29 | Test and measurement instrument and accessories |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29706063 Continuation-In-Part | 2019-09-17 | 2019-09-17 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US17/953,234 Continuation-In-Part US20230016996A1 (en) | 2019-09-17 | 2022-09-26 | Stand for a test and measurement instrument |
Publications (1)
Publication Number | Publication Date |
---|---|
USD1003181S1 true USD1003181S1 (en) | 2023-10-31 |
Family
ID=84227967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/809,745 Active USD1003181S1 (en) | 2019-09-17 | 2021-09-29 | Test and measurement instrument and accessories |
Country Status (3)
Country | Link |
---|---|
US (1) | USD1003181S1 (en) |
JP (5) | JP1731015S (en) |
TW (5) | TWD225702S (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD1029665S1 (en) * | 2021-03-04 | 2024-06-04 | Fluke Corporation | Power quality analyzer |
USD1034257S1 (en) * | 2023-10-30 | 2024-07-09 | RF Explorer Technologies SL | Radiofrequency spectrum analyzer |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109514396A (en) * | 2019-01-17 | 2019-03-26 | 滦南县丰田五金农具制造有限公司 | A kind of quincunx drum curved surface polishing machine and its polishing method |
Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD340701S (en) * | 1991-07-05 | 1993-10-26 | Canon Kabushiki Kaisha | Input and output terminal for electronic computers |
USD345346S (en) * | 1991-10-18 | 1994-03-22 | International Business Machines Corp. | Pen-based computer |
USD354743S (en) * | 1993-04-02 | 1995-01-24 | Vieira Osvaldo B | Microprocessor controlled road map |
USD355170S (en) * | 1993-06-24 | 1995-02-07 | Sharp Kabushiki Kaisha | Computer |
USD356548S (en) * | 1993-05-27 | 1995-03-21 | International Business Machines Corp. | Enclosure of a hand held computer |
USD386099S (en) * | 1996-06-24 | 1997-11-11 | Machinexpert, LLC | Portable machinery analyzer |
US6437552B1 (en) * | 2000-07-31 | 2002-08-20 | Lecroy Corporation | Automatic probe identification system |
US7463015B2 (en) * | 2006-12-29 | 2008-12-09 | Tektronix, Inc. | Time shifting signal acquisition probe system |
USD742371S1 (en) * | 2013-07-29 | 2015-11-03 | Raytheon Company | Mounted computer design |
USD797586S1 (en) * | 2015-05-26 | 2017-09-19 | Graphtec Corporation | Measurement data collector |
USD864952S1 (en) * | 2016-10-28 | 2019-10-29 | Mitsubishi Electric Corporation | Input device for industrial equipment |
TWD201506S (en) | 2018-05-15 | 2019-12-21 | 日商國際計測器股份有限公 | Testing instrument (steering testing system) |
JP1663342S (en) | 2019-06-12 | 2020-07-13 | ||
USD898735S1 (en) * | 2018-08-10 | 2020-10-13 | Shenzhen Ugee Technology Co., Ltd | Pen display |
USD909899S1 (en) | 2019-01-25 | 2021-02-09 | Tektronix, Inc. | Housing for a test and measurement instrument |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD865489S1 (en) | 2017-04-14 | 2019-11-05 | Fluke Electronics Corporation | Combined magnetic hanger and tilt stand for a portable test tool |
-
2021
- 2021-09-29 US US29/809,745 patent/USD1003181S1/en active Active
-
2022
- 2022-03-29 JP JP2022006489F patent/JP1731015S/en active Active
- 2022-03-29 TW TW111305708F patent/TWD225702S/en unknown
- 2022-03-29 TW TW111305707F patent/TWD225701S/en unknown
- 2022-03-29 TW TW111305709F patent/TWD225703S/en unknown
- 2022-03-29 JP JP2022006486F patent/JP1743919S/en active Active
- 2022-03-29 TW TW111305710F patent/TWD225704S/en unknown
- 2022-03-29 JP JP2022006490F patent/JP1731016S/en active Active
- 2022-03-29 JP JP2022006488F patent/JP1731014S/en active Active
- 2022-03-29 TW TW111301482F patent/TWD224179S/en unknown
- 2022-03-29 JP JP2022006487F patent/JP1743857S/en active Active
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD340701S (en) * | 1991-07-05 | 1993-10-26 | Canon Kabushiki Kaisha | Input and output terminal for electronic computers |
USD345346S (en) * | 1991-10-18 | 1994-03-22 | International Business Machines Corp. | Pen-based computer |
USD354743S (en) * | 1993-04-02 | 1995-01-24 | Vieira Osvaldo B | Microprocessor controlled road map |
USD356548S (en) * | 1993-05-27 | 1995-03-21 | International Business Machines Corp. | Enclosure of a hand held computer |
USD355170S (en) * | 1993-06-24 | 1995-02-07 | Sharp Kabushiki Kaisha | Computer |
USD386099S (en) * | 1996-06-24 | 1997-11-11 | Machinexpert, LLC | Portable machinery analyzer |
US6437552B1 (en) * | 2000-07-31 | 2002-08-20 | Lecroy Corporation | Automatic probe identification system |
US7463015B2 (en) * | 2006-12-29 | 2008-12-09 | Tektronix, Inc. | Time shifting signal acquisition probe system |
USD742371S1 (en) * | 2013-07-29 | 2015-11-03 | Raytheon Company | Mounted computer design |
USD797586S1 (en) * | 2015-05-26 | 2017-09-19 | Graphtec Corporation | Measurement data collector |
USD864952S1 (en) * | 2016-10-28 | 2019-10-29 | Mitsubishi Electric Corporation | Input device for industrial equipment |
TWD201506S (en) | 2018-05-15 | 2019-12-21 | 日商國際計測器股份有限公 | Testing instrument (steering testing system) |
USD898735S1 (en) * | 2018-08-10 | 2020-10-13 | Shenzhen Ugee Technology Co., Ltd | Pen display |
USD909899S1 (en) | 2019-01-25 | 2021-02-09 | Tektronix, Inc. | Housing for a test and measurement instrument |
JP1663342S (en) | 2019-06-12 | 2020-07-13 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD1029665S1 (en) * | 2021-03-04 | 2024-06-04 | Fluke Corporation | Power quality analyzer |
USD1034257S1 (en) * | 2023-10-30 | 2024-07-09 | RF Explorer Technologies SL | Radiofrequency spectrum analyzer |
Also Published As
Publication number | Publication date |
---|---|
JP1743857S (en) | 2023-05-11 |
TWD225702S (en) | 2023-06-01 |
TWD224179S (en) | 2023-03-11 |
JP1743919S (en) | 2023-05-11 |
TWD225704S (en) | 2023-06-01 |
TWD225701S (en) | 2023-06-01 |
JP1731015S (en) | 2022-11-30 |
JP1731014S (en) | 2022-11-30 |
TWD225703S (en) | 2023-06-01 |
JP1731016S (en) | 2022-11-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |