US6751079B2 - Circuit for the detection of short voltage glitches in a supply voltage - Google Patents
Circuit for the detection of short voltage glitches in a supply voltage Download PDFInfo
- Publication number
- US6751079B2 US6751079B2 US10/128,816 US12881602A US6751079B2 US 6751079 B2 US6751079 B2 US 6751079B2 US 12881602 A US12881602 A US 12881602A US 6751079 B2 US6751079 B2 US 6751079B2
- Authority
- US
- United States
- Prior art keywords
- voltage
- input
- comparator
- circuit
- glitch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime, expires
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
Definitions
- the invention relates to a circuit for the detection of short voltage glitches in a supply voltage, comprising a comparator with a first input and a second input and an output for indicating a detected voltage glitch.
- a circuit arrangement of the type defined in the opening paragraph is known from WO 98/50859.
- Said circuit is an integrated part of a so-termed power-on reset circuit which is used for bringing the elements of an associated integrated microelectronic circuit to a defined output state after a supply voltage has been switched on.
- the conventional power-on reset circuit generally works as an integrated circuit and therefore always needs to have an adequate time space for registration of a fluctuation of the supply voltage. Therefore, very short (typically shorter than 1 ⁇ s) and deep power supply glitches which are referred to as so-termed glitch pulses pass unnoticed by unbuffered operating circuits. These glitch pulses are very hard to detect, but may disturb the behavior of the circuit and may even cause malfunctioning.
- a known power-on reset circuit is extended by a glitch detector which is particularly tuned to detecting short voltage glitches so that, subsequently, the circuit can be reset reliably.
- the basic principle used in said glitch detector comprises the calculated discharge of a capacitor in case of a voltage glitch in the supply voltage and the evaluation of the subsequent charging curve of the capacitor by means a comparator.
- the glitch detector then needs to have a reference voltage for the negative comparator input and an additional reference voltage for the gate of a transistor.
- Such reference voltages are not available at any rate when the supply voltage is turned on, which restricts the use of the circuit.
- the known circuit of the glitch detector strongly depends on the threshold voltages of the transistors used.
- a comparator having a first input and a second input as well as an output for indicating a detected voltage glitch
- the other input of the comparator is unchanged connected to the voltage divider, so that it proportionally follows the voltage glitch. If the voltage glitch is deep enough then, there is a state of the variable potential at the second input of the comparator beyond the voltage of the invariable first input coming closer to the ground potential. Therefore, there is a reversal of polarities at the inputs of the comparator, after which a corresponding signal is generated at the comparator output. This signal then indicates the detection of a voltage glitch.
- the circuit according to the invention makes it possible by varying the taps from the voltage divider to change the level of the voltage glitch to be detected and thus flexibly adjust the circuit to the respective needs.
- no reference voltages are needed at the comparator inputs.
- the interrupter circuit comprises a first transistor whose source-drain path is situated in the connection line between the first input of the comparator and the voltage divider, and whose gate is controlled by a voltage which, proportionally to the voltage glitch, comes closer to the ground potential if there is a voltage glitch.
- the transistor which is connected in forward direction if the supply voltage is undisturbed is then cut-off and separates the first comparator input from the voltage divider, so that the input is uncoupled from the voltage glitch.
- the interrupter circuit additionally comprises the following elements:
- the supply voltage Vsup originates from a circuit block not of further interest here in which the parasitic elements of the circuit are combined by a resistor R 0 and a capacitor C 0 .
- the lalter components deform voltage glitches that are clearly shorter than 50 ns, usually so that their glitch length is clearly reduced and they thus remain unharmful for the circuit.
- the gate of the first transistor N 1 in the line between the input VN of the comparator C and the voltage divider is supplied with the potential Vsw which is present in the line between the third capacitor C 3 and the source of the second transistor P 1 .
- the output signal of the comparator C can thus be used for generating a digital error message.
- two voltage points in the linear gain range of the operational amplifier C may be chosen whose difference Vmes ⁇ Vref 1 is proportional to the maximum permitted voltage glitch in the supply voltage. With the circuit shown the voltage glitches can thus be detected in the range from below the noise level of the supplier to the ground potential level.
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measurement Of Current Or Voltage (AREA)
- Manipulation Of Pulses (AREA)
Abstract
Description
LIST OF REFERENCE CHARACTERS |
Vsup | supply voltage | ||
R0, R1, R2, R3 | resistors | ||
C0, C1, C2, C3 | capacitors | ||
N1, P1 | transistors | ||
VP | positive input | ||
VN | negative input | ||
C | comparator | ||
OUT | output | ||
Vmes, Vsw, Vref1 | voltages | ||
Vref2, Vdd_fail | |||
Claims (3)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10120147 | 2001-04-25 | ||
DE10120147.8 | 2001-04-25 | ||
DE10120147A DE10120147B4 (en) | 2001-04-25 | 2001-04-25 | Circuit for detecting short voltage dips in a supply voltage |
Publications (2)
Publication Number | Publication Date |
---|---|
US20020186038A1 US20020186038A1 (en) | 2002-12-12 |
US6751079B2 true US6751079B2 (en) | 2004-06-15 |
Family
ID=7682599
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/128,816 Expired - Lifetime US6751079B2 (en) | 2001-04-25 | 2002-04-24 | Circuit for the detection of short voltage glitches in a supply voltage |
Country Status (2)
Country | Link |
---|---|
US (1) | US6751079B2 (en) |
DE (1) | DE10120147B4 (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030226082A1 (en) * | 2002-05-31 | 2003-12-04 | Samsung Electronics Co., Ltd. | Voltage-glitch detection device and method for securing integrated circuit device from voltage glitch attack |
US20050024063A1 (en) * | 2003-07-31 | 2005-02-03 | Lsi Logic Corporation | Method and apparatus for measuring high speed glitch energy in an integrated circuit |
US20070127177A1 (en) * | 2005-12-02 | 2007-06-07 | Andrew Benton | System and method for conditioning a power supply transmission for supply to a load circuit |
EP1804199A1 (en) | 2005-12-20 | 2007-07-04 | St Microelectronics S.A. | Detector of disturbance peaks in the power supply of an integrated circuit |
US20080309378A1 (en) * | 2007-03-07 | 2008-12-18 | Matsushita Electric Industrial Co. Ltd. | Semiconductor device |
CN1976231B (en) * | 2005-11-30 | 2010-07-21 | 国际商业机器公司 | Circuit, IC chip and method of detecting edge triggering false impulse in noise signal |
US9437237B1 (en) | 2015-02-20 | 2016-09-06 | Western Digital Technologies, Inc. | Method to detect power loss through data storage device spindle speed |
US20170213518A1 (en) * | 2016-01-27 | 2017-07-27 | Mitsubishi Electric Corporation | Drive device and liquid crystal display apparatus |
US10156595B2 (en) | 2016-12-09 | 2018-12-18 | Microsemi Soc Corp. | Power supply glitch detector |
US10466275B1 (en) * | 2018-06-28 | 2019-11-05 | Xilinx, Inc. | Glitch detector and test glitch generator |
US11187731B2 (en) | 2019-08-15 | 2021-11-30 | Shenzhen GOODIX Technology Co., Ltd. | Power glitch signal detection circuit, security chip and electronic apparatus |
US11609277B2 (en) | 2019-06-24 | 2023-03-21 | Shenzhen GOODIX Technology Co., Ltd. | Power glitch signal detection circuit and security chip |
US11763037B2 (en) | 2019-06-24 | 2023-09-19 | Shenzhen GOODIX Technology Co., Ltd. | Power glitch signal detection circuit, security chip and electronic apparatus |
US11934566B2 (en) | 2020-03-09 | 2024-03-19 | Shenzhen GOODIX Technology Co., Ltd. | Voltage attack detection circuit and chip |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1873537B1 (en) * | 2006-06-29 | 2011-02-16 | St Microelectronics S.A. | Detection of type of detector of disturbance peaks in the power supply of an integrated circuit |
CN103675421A (en) * | 2013-05-31 | 2014-03-26 | 国家电网公司 | Power burr signal detection circuit and detection method thereof |
US9523722B2 (en) | 2014-06-02 | 2016-12-20 | Winbond Electronics Corporation | Method and apparatus for supply voltage glitch detection in a monolithic integrated circuit device |
EP2982997B1 (en) * | 2014-08-04 | 2024-05-08 | Winbond Electronics Corp. | Method and apparatus for supply voltage glitch detection in a monolithic integrated circuit device |
US11411509B2 (en) * | 2020-10-16 | 2022-08-09 | Dell Products L.P. | System and method for detecting the presence of input power of different types |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6085342A (en) * | 1997-05-06 | 2000-07-04 | Telefonaktiebolaget L M Ericsson (Publ) | Electronic system having a chip integrated power-on reset circuit with glitch sensor |
US6265921B1 (en) * | 1998-09-11 | 2001-07-24 | Stmicroelectronics Gmbh | Circuit configuration for shaping slew rate |
US6362632B1 (en) * | 2000-05-24 | 2002-03-26 | Becs Technology, Inc. | Balanced charge pump capacitive material sensor |
US6410998B1 (en) * | 1999-04-23 | 2002-06-25 | Daimlerchrysler Ag | Circuit arrangement with a reduction circuit for reducing interfering longitudinal voltages on a two-wire line |
US6411482B1 (en) * | 2000-02-15 | 2002-06-25 | Eaton Corporation | Surge protector comprising means for detecting and permanently recording an overvoltage event and panelboard employing the same |
US6424513B1 (en) * | 2000-05-23 | 2002-07-23 | Compaq Computer Corporation | Short circuit protection module |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4260907A (en) * | 1979-06-12 | 1981-04-07 | Telex Computer Products, Inc. | Power-on-reset circuit with power fail detection |
-
2001
- 2001-04-25 DE DE10120147A patent/DE10120147B4/en not_active Expired - Lifetime
-
2002
- 2002-04-24 US US10/128,816 patent/US6751079B2/en not_active Expired - Lifetime
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6085342A (en) * | 1997-05-06 | 2000-07-04 | Telefonaktiebolaget L M Ericsson (Publ) | Electronic system having a chip integrated power-on reset circuit with glitch sensor |
US6265921B1 (en) * | 1998-09-11 | 2001-07-24 | Stmicroelectronics Gmbh | Circuit configuration for shaping slew rate |
US6410998B1 (en) * | 1999-04-23 | 2002-06-25 | Daimlerchrysler Ag | Circuit arrangement with a reduction circuit for reducing interfering longitudinal voltages on a two-wire line |
US6411482B1 (en) * | 2000-02-15 | 2002-06-25 | Eaton Corporation | Surge protector comprising means for detecting and permanently recording an overvoltage event and panelboard employing the same |
US6424513B1 (en) * | 2000-05-23 | 2002-07-23 | Compaq Computer Corporation | Short circuit protection module |
US6362632B1 (en) * | 2000-05-24 | 2002-03-26 | Becs Technology, Inc. | Balanced charge pump capacitive material sensor |
Cited By (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030226082A1 (en) * | 2002-05-31 | 2003-12-04 | Samsung Electronics Co., Ltd. | Voltage-glitch detection device and method for securing integrated circuit device from voltage glitch attack |
US7085979B2 (en) * | 2002-05-31 | 2006-08-01 | Samsung Electronics Co., Ltd. | Voltage-glitch detection device and method for securing integrated circuit device from voltage glitch attack |
US20050024063A1 (en) * | 2003-07-31 | 2005-02-03 | Lsi Logic Corporation | Method and apparatus for measuring high speed glitch energy in an integrated circuit |
US7081762B2 (en) * | 2003-07-31 | 2006-07-25 | Lsi Logic Corporation | Method and apparatus for measuring high speed glitch energy in an integrated circuit |
CN1976231B (en) * | 2005-11-30 | 2010-07-21 | 国际商业机器公司 | Circuit, IC chip and method of detecting edge triggering false impulse in noise signal |
US20070127177A1 (en) * | 2005-12-02 | 2007-06-07 | Andrew Benton | System and method for conditioning a power supply transmission for supply to a load circuit |
US8547672B2 (en) | 2005-12-02 | 2013-10-01 | Electronic Systems Protection, Inc. | System and method for conditioning a power supply transmission for supply to a load circuit |
US7511934B2 (en) | 2005-12-02 | 2009-03-31 | Electronic Systems Protection, Inc. | System and method for conditioning a power supply transmission for supply to a load circuit |
US20090303648A1 (en) * | 2005-12-02 | 2009-12-10 | Andrew Benton | System and method for conditioning a power supply transmission for supply to a load circuit |
EP1804199A1 (en) | 2005-12-20 | 2007-07-04 | St Microelectronics S.A. | Detector of disturbance peaks in the power supply of an integrated circuit |
US7777512B2 (en) | 2007-03-07 | 2010-08-17 | Panasonic Corporation | Semiconductor device |
US20080309378A1 (en) * | 2007-03-07 | 2008-12-18 | Matsushita Electric Industrial Co. Ltd. | Semiconductor device |
US9437237B1 (en) | 2015-02-20 | 2016-09-06 | Western Digital Technologies, Inc. | Method to detect power loss through data storage device spindle speed |
US20170213518A1 (en) * | 2016-01-27 | 2017-07-27 | Mitsubishi Electric Corporation | Drive device and liquid crystal display apparatus |
US10720119B2 (en) * | 2016-01-27 | 2020-07-21 | Mitsubishi Electric Corporation | Drive device and liquid crystal display apparatus |
US10156595B2 (en) | 2016-12-09 | 2018-12-18 | Microsemi Soc Corp. | Power supply glitch detector |
US10466275B1 (en) * | 2018-06-28 | 2019-11-05 | Xilinx, Inc. | Glitch detector and test glitch generator |
US11609277B2 (en) | 2019-06-24 | 2023-03-21 | Shenzhen GOODIX Technology Co., Ltd. | Power glitch signal detection circuit and security chip |
US11763037B2 (en) | 2019-06-24 | 2023-09-19 | Shenzhen GOODIX Technology Co., Ltd. | Power glitch signal detection circuit, security chip and electronic apparatus |
US11187731B2 (en) | 2019-08-15 | 2021-11-30 | Shenzhen GOODIX Technology Co., Ltd. | Power glitch signal detection circuit, security chip and electronic apparatus |
US11934566B2 (en) | 2020-03-09 | 2024-03-19 | Shenzhen GOODIX Technology Co., Ltd. | Voltage attack detection circuit and chip |
Also Published As
Publication number | Publication date |
---|---|
DE10120147B4 (en) | 2010-08-05 |
US20020186038A1 (en) | 2002-12-12 |
DE10120147A1 (en) | 2002-10-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., NETHERLANDS Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:BRETSCHNEIDER, ERNST;REEL/FRAME:013087/0507 Effective date: 20020515 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
AS | Assignment |
Owner name: NXP B.V., NETHERLANDS Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:KONINKLIJKE PHILIPS ELECTRONICS N.V.;REEL/FRAME:018635/0787 Effective date: 20061117 |
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FPAY | Fee payment |
Year of fee payment: 4 |
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FPAY | Fee payment |
Year of fee payment: 8 |
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FPAY | Fee payment |
Year of fee payment: 12 |
|
AS | Assignment |
Owner name: PHILIPS SEMICONDUCTORS INTERNATIONAL B.V., NETHERL Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:KONINKLIJKE PHILIPS ELECTRONICS N.V.;REEL/FRAME:043955/0001 Effective date: 20060928 Owner name: NXP B.V., NETHERLANDS Free format text: CHANGE OF NAME;ASSIGNOR:PHILIPS SEMICONDUCTORS INTERNATIONAL B.V.;REEL/FRAME:043951/0436 Effective date: 20060929 |