US6476716B1 - Temperature-controlled variable resistor - Google Patents
Temperature-controlled variable resistor Download PDFInfo
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- US6476716B1 US6476716B1 US09/713,502 US71350200A US6476716B1 US 6476716 B1 US6476716 B1 US 6476716B1 US 71350200 A US71350200 A US 71350200A US 6476716 B1 US6476716 B1 US 6476716B1
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- temperature
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B15/00—Systems controlled by a computer
- G05B15/02—Systems controlled by a computer electric
Definitions
- the present invention relates to temperature-responsive electronic devices and methods of operation. More particularly, but not by way of limitation, the present invention relates to temperature-controlled variable resistors, temperature-controlled variable current sources and temperature-controlled variable voltage sources.
- a laser diode driver One electronic device that requires a current source that varies with changes in temperature is a laser diode driver.
- Laser diodes are notoriously fickle and require a very precise operating current that will generally vary with temperature. For example, the efficiency and optical power of a laser diode above threshold increase with decreasing temperatures. This means that a laser diode that has its operating current configured at room temperature will have reduced output once it warms up past room temperature. Conversely, if the operating current is set up after the laser diode has warmed up, the laser diode may overdrive when it is operated at room temperature.
- a laser diode driver would be enhanced by a temperature-controlled regulation device that can adjust current or at least aid in adjusting current. Such a device would allow a laser diode to operate efficiently over a wide range of temperatures to maintain a constant output power.
- laser diode drivers are not the only electronic devices that require temperature-controlled current/voltage sources.
- transceivers may require a temperature-controlled current source, and those of skill in the art can readily identify numerous other devices that require temperature-controlled current/voltage sources.
- a device and method are needed to adjust or aid in adjusting current/voltage sources in response to changes in temperature.
- the present invention provides, among other things, a method and apparatus to regulate an electronic device in response to temperature changes.
- one method of the present invention can control a device operable in different operational modes.
- This method can include the steps of sensing a temperature; accessing a table using the sensed temperature; reading an operational mode indicator from the table, wherein the operational mode indicator can, for example, correspond to the sensed temperature; and operating the device in a proper one of the operational modes, which corresponds to the operational mode indicator.
- FIG. 1A is a block diagram of a temperature-controlled variable resistor
- FIG. 1B is a more detailed block diagram of the temperature-controlled variable resistor of FIG. 1A;
- FIG. 1C is a circuit diagram of the variable resistor component shown in FIG. 1A;
- FIG. 2A is a block diagram of a temperature-controlled variable voltage source
- FIG. 2B is a circuit diagram of the variable voltage source shown in FIG. 2A;
- FIG. 3A is a block diagram of a temperature-controlled variable current source
- FIG. 3B is a circuit diagram of the variable current source shown in FIG. 3A;
- FIG. 4A is an illustration of an electronic device with an integrated temperature-controlled regulation device.
- FIG. 4B is a block diagram of a temperature controlled regulation device as shown in FIG. 4 A.
- FIG. 1A it is a block diagram of a temperature-controlled variable resistor 100 that can be used for, among other things, adjusting current/voltage sources in response to changes in temperature.
- This embodiment includes a variable resistor 102 with a high-end resistor terminal 104 and a low-end resistor terminal 106 .
- the variable resistor 102 is responsive to inputs from a control logic 108 that can communicate with the variable resistor 102 in a serial and/or a parallel fashion.
- control logic 108 is connected to an I/O interface 110 , a lookup table 112 , a memory device 114 and a temperature sensor 116 .
- control logic 108 reads a temperature from the temperature sensor 116 and accesses the lookup table 112 to determine a resistance value that corresponds to the temperature read from the temperature sensor 116 . This resistance value is then communicated to the variable resistor 102 so that the resistance between the high-end terminal 104 and the low-end terminal 106 can be changed accordingly.
- FIG. 1 B a preferred embodiment is illustrated in FIG. 1 B.
- This embodiment includes an I/O interface 110 , a combined memory block 118 (which can include the lookup table 112 and memory device 114 of FIG. 1 A), two variable resistors 102 a and 102 b , a temperature sensor 116 and a control logic 108 .
- the I/O interface 110 is a two wire interface with eight communication pins. These pins include:
- V cc Power Supply Terminal.
- GND Ground Terminal
- serial data pin is for serial data transfer.
- the pin is open drain and may be wire-ORed with other open drain or open collector interfaces.
- serial clock input is used to clock data in on rising edges and clock data out on falling edges.
- H a , H b High-end terminals (e.g., high-end terminal 104 ) of the variable resistors 102 a , 102 b , respectively.
- H a , H b High-end terminals (e.g., high-end terminal 104 ) of the variable resistors 102 a , 102 b , respectively.
- H a and 102 b it is not required that these high-end terminals be connected to a potential greater than the low-end terminal of the corresponding variable resistor.
- L a , L b Low-end terminals (e.g., low-end terminal 106 ) of the variable resistors 102 a , 102 b .
- low-end terminal 106 Low-end terminal 106
- WP Write Protect.
- Write Protect should be connected to GND before either the data in memory or resistance level may be changed.
- Write Protect is pulled high internally and must be either left open or connected to V cc if write protection is desired.
- a 0 , A 1 , A 2 Address Inputs. These input pins specify the address of the device when used in a multi-dropped configuration.
- the memory can be divided as follows:
- Memory Name of Location Location Function of Location User Defined Lookup 00h to 47h This block contains the Tables 120 user defined temperature settings of the variable resistors 102a and 102b. Values between 00h and FFF can be written to either table to set the 256 different resistance levels.
- the first address location, 00h is used to set the resistance level for ⁇ 40° C. Each successive memory location will contain the resistance level for the previous temperature plus 2° C.
- memory address 01h is the address that stores the resistor setting for a ⁇ 38° C. environment.
- Table Select Byte E0h Writing to this byte 122 determines which of the two user defined lookup tables 120 is selected for reading or writing.
- the configuration Byte 124 124 contains three data items: TAU - Temperature/Address Update; TEN - Temperature Update Enable; and AEN - Address Update Enable.
- the user sets the resistance level for the variable resistor 102 in “manual mode” by writing to addresses F0h and F1h (Resistor A setting and Resistor B setting 140) to control variable resistors A, 102a and B, 102b, respectively.
- AEN 0 the user can operate in a test mode. Address updates made from the temperature sensor will cease.
- the user can load a memory location into E4h and verify that the values in locations F1h and F2h are the expected user defined values.
- Temperature MSB 126 E2h This byte contains the MSB of the 13-bit 2's complement temperature output from the temperature sensor 116.
- Temperature LSB 128 E3h This byte contains the LSB of the 13-bit 2's complement temperature output from the temperature sensor 116.
- Address Pointer 130 E4h This pointer is the calculated, present resistance level address (0h - 47h).
- the user- defined resistor setting at this address in the respective look-up table 120 will be loaded into F1h and F2h (Resistor A setting, Resistor B setting) to set the resistance two level resistors 102a, 102b.
- User Memory 132 E5h to E6h This block is general purpose user memory.
- Internal Address E7h This byte allows the user Select 134 to use the external address pins (A 0 A 1 A 2 ) or an internal register location to determine the address of the temperature-controlled variable resistor 100.
- User Memory 134 E8h to Efh This block is general purpose user memory.
- the temperature sensor is a direct-to-digital temperature sensor that measures temperature through the use of an on-chip temperature measurement technique. Temperature measurements are initiated upon power-up, and the most recent result is stored in address locations E 2 h and E 3 h (that is, temperature MSB 126 and temperature LSB 128 ) of the combined memory block 118 . New measurements are taken every 10 milliseconds except during reads or writes to memory.
- the I/O interface 110 could be a one-wire interface, a two-wire interface, a parallel communication interface, etc.
- the combined memory block 118 could be arranged in virtually any fashion—with additional data items being included or some of the listed items being omitted.
- the combined memory block 118 could be configured to include any number of lookup tables for driving any number of variable resistors.
- the temperature sensor 116 is not necessarily limited to a direct-to-digital temperature sensor. Any type of temperature sensor can be used.
- variable resistor 102 includes a MSB (most significant bit) decoder 144 and a LSB (least significant bit) decoder 146 .
- Each of these decoders operates a set of associated switches (which can include parallel CMOS devices, FETs, BJTs, etc.) responsive to signals received from the control logic 108 .
- the most significant bits of the signal from the control logic 108 are received at the MSB decoder 144 on lines 150 and 152 , and the least significant bits of the signal are received at the LSB decoder 146 on lines 154 and 156 .
- the MSB decoder 144 is configured to operate switches 158 , 160 , 162 , and 164
- the LSB decoder 146 is configured to operate switches 166 , 168 , 170 , and 172 .
- sixteen different resistance levels can be achieved.
- the maximum resistance of 15X is obtained because the resistance value of individual resistors 174 , 176 , and 178 is four times the value of individual resistors 180 , 182 , and 184 .
- the resistance of 15X is obtained by connecting all of the resistors between terminal 104 and terminal 106 .
- the relationship between the resistors is best described in that the value of the individual resistors 174 , 176 , and 178 should be 2 N times the value of the individual resistors 180 , 182 and 184 , where N equals 1 ⁇ 2 the number of input bits.
- variable resistor 102 the operation of the variable resistor 102 can be illustrated by an example. Assume that a signal of binary “1101” is received from the control logic 108 with the left most bit being the most significant bit. The MSB decoder should receive binary “11” and the LSB decoder 106 should receive binary “01”. Next, the MSB decoder 144 should turn switch 164 on and switches 158 , 160 , and 162 off. Similarly, the LSB decoder 146 should turn switch 170 on and switch 166 , 168 , and 172 off. This configuration of switches causes resistors 174 , 176 , 178 , and 184 to be connected between terminal 104 and terminal 106 and gives a total resistance of 13X.
- variable resistor 102 also includes resistors 186 , 188 , and 190 as well as a capacitor 192 . These components are designed to minimize switching noise within the variable resistor 102 .
- the present invention can also be configured with the switches on the inside of the resistors 174 , 176 , 178 , 180 , 182 , and 184 relative to terminals 104 and 106 . That is, resistors 174 , 176 , and 178 are located between terminal 104 and the switches 158 , 160 , 162 , and 164 and resistors 180 , 182 , and 184 are located between terminal 106 and switches 166 , 168 , 170 , and 172 .
- variable resistor 102 could be designed with any number of decoders and banks of resistors.
- a variable resistor with 16 different resistance levels could be designed with a single, four-input/16 output decoder.
- Such a variable resistor could include 16 switches and 15 resistors arranged in a single bank.
- the variable resistor could include 3 decoders—each with three inputs. This embodiment of the variable resistor would include three banks of eight switches and would provide 512 different resistance levels.
- FIG. 2A it is a block diagram of a temperature-controlled variable voltage source 200 .
- This embodiment of the present invention is similar to the temperature-controlled variable resistor 100 shown in FIG. 1 A.
- the temperature-controlled variable voltage source includes an I/O interface 200 , a lookup table 202 , a memory 204 , a control logic 206 and a temperature sensor 208 .
- the temperature-controlled variable voltage source 200 includes a variable voltage source 210 rather than the variable resistor 102 (shown in FIG. 1 A).
- the temperature sensor 208 senses a temperature and provides that information to the control logic 206 , which accesses the lookup table 202 to determine a proper setting for the variable voltage source 210 . This setting is then communicated to the variable voltage source 210 so that the output voltage at V out can be adjusted.
- the voltage output from the variable voltage source 210 is varied by varying an internal resistance.
- the variable voltage source 210 includes a variable resistor such as the variable resistor 100 shown in FIG. 1 A. As the resistance value is changed, the voltage drop is changed and the value of V out is changed.
- FIG. 2 B Another embodiment of the variable voltage source 210 is illustrated in FIG. 2 B.
- a 2-input decoder 212 is connected to four switches 214 , 216 , 218 , and 220 .
- switches 214 , 216 , 218 , and 220 Depending upon the value of the input at lines 222 and 224 , at least one of the four switches will be turned on, thereby setting the resistance value between V in and V out .
- the input into the decoder is binary “ 10 ”
- switch 218 will be turned on (and switches 214 , 216 , and 220 will be turned off), and the resistance between V in and V out will be the value of resistor 226 plus the value of resistor 228 .
- Resistor 230 will not impact the total resistance. Accordingly, V in will be dropped according to resistors 226 and 228 .
- FIG. 3A it is a block diagram of a temperature-controlled variable current source 300 .
- the temperature-controlled variable current source 300 includes an I/O interface 302 , a lookup table 304 , a memory 306 , a control logic 308 , a variable current source 312 and a temperature sensor 310 .
- the temperature sensor 310 senses a temperature and provides that information to the control logic 308 , which accesses the lookup table 304 to determine a proper setting for the variable current source 312 . This setting is then communicated to the variable current source 112 where the output current is adjusted accordingly.
- variable current source 312 can be designed in a variety of ways, good results have been achieved with the circuit shown in FIG. 3 B.
- the variable current source 312 includes a two-input decoder 314 with one output 316 left unconnected and three outputs connected to switches 318 , 320 , and 322 .
- Each switch is associated with one of current sources 324 , 326 , and 328 .
- the associated current source can contribute to the current at I out
- switch when a switch is off, the associated current source cannot contribute to the current at I out .
- any combination of switches 324 , 326 , and 328 can be on. For example, if a current of 13 ⁇ 4 X is desired at I out , switches 324 , 326 , and 328 should be on simultaneously.
- FIG. 4A it is an illustration of an electronic device with an integrated temperature-controlled regulation device 402 such as the temperature controlled resistor 102 , the temperature controlled voltage source 210 and/or the temperature controlled current source 312 .
- the electronic device 400 can be any type of electronic device that requires temperature based regulation, including laser diode drivers, wireless devices, power sources, etc.
- the temperature-controlled regulation device 402 is shown in greater detail in FIG. 4 B. This embodiment reflects a generic version of the devices shown in FIGS. 1A, 2 A, and 3 A.
- the temperature-controlled regulation device 402 includes an I/O interface 404 , a lookup table 406 , a memory 408 , a control logic 410 , and a temperature sensor 412 .
- the temperature-controlled regulation device 402 includes a regulator 414 that could be a variable resistor, a variable current source, a variable voltage source, or any other type of regulator.
- the overall device does not necessarily need to be associated with temperature-controlled voltage/current source.
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Abstract
Description
Memory | ||
Name of Location | Location | Function of Location |
User Defined Lookup | 00h to 47h | This block contains the |
Tables 120 | user defined temperature | |
settings of the | ||
resistors | ||
102a and 102b. | ||
Values between 00h and FFF | ||
can be written to either | ||
table to set the 256 | ||
different resistance | ||
levels. The first address | ||
location, 00h, is used to | ||
set the resistance level | ||
for −40° C. Each successive | ||
memory location will | ||
contain the resistance | ||
level for the previous | ||
temperature plus 2° C. For | ||
example, memory address 01h | ||
is the address that stores | ||
the resistor setting for a | ||
−38° C. environment. | ||
Table Select Byte | E0h | Writing to this |
122 | determines which of the two | |
user defined lookup tables | ||
120 is selected for reading | ||
or writing. | ||
00h (Table A selected) | ||
01h (Table B selected) | ||
Configuration Byte | E1h | The |
124 | contains three data items: | |
TAU - Temperature/Address | ||
Update; | ||
TEN - Temperature Update | ||
Enable; and | ||
AEN - Address Update | ||
Enable. | ||
The DEFAULT setting is 03h, | ||
TAU = 1, TEN = 1 and AEN = | ||
1. | ||
TAU becomes a 1 after a | ||
temperature and address | ||
update has occurred as a | ||
result of a temperature | ||
conversion. The user can | ||
write this bit to 0 and | ||
check for a transition from | ||
0 to 1 in order to verify | ||
that a conversion has | ||
occurred. | ||
If TEN = 0, the temperature | ||
conversion feature is | ||
disabled. The user sets | ||
the resistance level for | ||
the |
||
in “manual mode” by writing | ||
to addresses F0h and F1h | ||
(Resistor A setting and | ||
Resistor B setting 140) to | ||
control variable resistors | ||
A, 102a and B, 102b, | ||
respectively. | ||
With AEN = 0 the user can | ||
operate in a test mode. | ||
Address updates made from | ||
the temperature sensor will | ||
cease. The user can load a | ||
memory location into E4h | ||
and verify that the values | ||
in locations F1h and F2h | ||
are the expected user | ||
defined values. | ||
|
E2h | This byte contains the MSB |
of the 13- |
||
complement temperature | ||
output from the | ||
sensor | ||
116. | ||
|
E3h | This byte contains the LSB |
of the 13- |
||
complement temperature | ||
output from the | ||
sensor | ||
116. | ||
|
E4h | This pointer is the |
calculated, present | ||
resistance level address | ||
(0h - 47h). The user- | ||
defined resistor setting at | ||
this address in the | ||
respective look-up table | ||
120 will be loaded into F1h | ||
and F2h (Resistor A | ||
setting, Resistor B | ||
setting) to set the | ||
resistance two | ||
resistors | ||
102a, 102b. | ||
|
E5h to E6h | This block is general |
purpose user memory. | ||
Internal Address | E7h | This byte allows the |
Select | ||
134 | to use the external address | |
pins (A0 A1 A2) or an | ||
internal register location | ||
to determine the address of | ||
the temperature-controlled | ||
|
||
byte is configured as | ||
follows: | ||
A2 A1 A0 ENB | ||
When ENB = 0 and external | ||
A2, A1, A0 are grounded, | ||
the temperature-controlled | ||
|
||
use internal address bits | ||
(A2, A1, A0) in this | ||
|
||
When ENB = 1, external A2, | ||
A1, A0 = any setting of the | ||
temperature-controlled | ||
|
||
use external address pins | ||
(A0 A1 A2). | ||
The DEFAULT setting is 01h. | ||
The temperature-controlled | ||
|
||
external pins (A0 A1 A2) to | ||
determine its address. | ||
|
E8h to Efh | This block is general |
purpose user memory. | ||
Resistor A Setting | F0h | In the user-controlled |
138 | setting mode, this block | |
contains the variable | ||
resistance level for | ||
|
||
Resistor B Setting | F1h | In the user-controlled |
140 | setting mode, this block | |
contains the resistance | ||
level for the | ||
resistor | ||
102b. | ||
|
F2h to FFh | General purpose user |
memory. | ||
Claims (26)
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US09/713,502 US6476716B1 (en) | 2000-11-15 | 2000-11-15 | Temperature-controlled variable resistor |
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US09/713,502 US6476716B1 (en) | 2000-11-15 | 2000-11-15 | Temperature-controlled variable resistor |
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US6476716B1 true US6476716B1 (en) | 2002-11-05 |
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US09/713,502 Expired - Lifetime US6476716B1 (en) | 2000-11-15 | 2000-11-15 | Temperature-controlled variable resistor |
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US20030102070A1 (en) * | 2001-11-30 | 2003-06-05 | The Boeing Company | System, method, and computer program product for providing control for high speed fiber placement |
US6608790B2 (en) * | 2001-12-03 | 2003-08-19 | Hewlett-Packard Development Company, L.P. | Write current compensation for temperature variations in memory arrays |
US20030173020A1 (en) * | 2002-02-22 | 2003-09-18 | Shibaura Mechatronics Corporation | Substrate laminating apparatus and method |
US20040042262A1 (en) * | 2002-09-03 | 2004-03-04 | Tran Lung T. | Memory device capable of calibration and calibration methods therefor |
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