US5969399A - High gain current mode photo-sensor - Google Patents

High gain current mode photo-sensor Download PDF

Info

Publication number
US5969399A
US5969399A US09/080,996 US8099698A US5969399A US 5969399 A US5969399 A US 5969399A US 8099698 A US8099698 A US 8099698A US 5969399 A US5969399 A US 5969399A
Authority
US
United States
Prior art keywords
type
well
doping
vertical transistor
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
US09/080,996
Inventor
Frederick A. Perner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Avago Technologies International Sales Pte Ltd
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Priority to US09/080,996 priority Critical patent/US5969399A/en
Assigned to HEWLETT-PACKARD COMPANY reassignment HEWLETT-PACKARD COMPANY ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: PERNER, FREDERICK A.
Priority to EP99303245A priority patent/EP0959502B1/en
Priority to DE69937588T priority patent/DE69937588T2/en
Priority to JP11132736A priority patent/JPH11345995A/en
Application granted granted Critical
Publication of US5969399A publication Critical patent/US5969399A/en
Assigned to HEWLETT-PACKARD COMPANY, A DELAWARE CORPORATION reassignment HEWLETT-PACKARD COMPANY, A DELAWARE CORPORATION MERGER (SEE DOCUMENT FOR DETAILS). Assignors: HEWLETT-PACKARD COMPANY, A CALIFORNIA CORPORATION
Assigned to AGILENT TECHNOLOGIES INC reassignment AGILENT TECHNOLOGIES INC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HEWLETT-PACKARD COMPANY
Assigned to AVAGO TECHNOLOGIES GENERAL IP PTE. LTD. reassignment AVAGO TECHNOLOGIES GENERAL IP PTE. LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AGILENT TECHNOLOGIES, INC.
Assigned to AVAGO TECHNOLOGIES SENSOR IP PTE. LTD. reassignment AVAGO TECHNOLOGIES SENSOR IP PTE. LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AVAGO TECHNOLOGIES IMAGING IP (SINGAPORE) PTE. LTD.
Assigned to AVAGO TECHNOLOGIES IMAGING IP (SINGAPORE) PTE. LTD. reassignment AVAGO TECHNOLOGIES IMAGING IP (SINGAPORE) PTE. LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Assigned to AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. reassignment AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AVAGO TECHNOLOGIES SENSOR IP PTE. LTD.
Assigned to AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. reassignment AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF THE ASSIGNEE PREVIOUSLY RECORDED ON REEL 017207 FRAME 0020. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Assignors: AGILENT TECHNOLOGIES, INC.
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/1443Devices controlled by radiation with at least one potential jump or surface barrier

Definitions

  • the above-described embodiment of the present invention utilizes two vertical PNP transistors to provide a large gain in a small amount of silicon space. It will be obvious to those skilled in the art from the preceding discussion that additional vertical transistors could be similarly connected to provide additional gain if needed. Similarly, if the light signal is sufficiently intense, a single vertical PNP transistor could be utilized.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

A high gain photodetector requiring a substantially silicon area than prior art photodetectors having the same gain. The photodetector includes a light converter for converting a light signal to a current; and a first vertical transistor. The first vertical transistor includes a first well in a semiconductor substrate, the first well including a diffusion region, the semiconductor substrate and the diffusion having a first type of doping and the first well having a second type of doping. The first type of doping is either P-type or N-type, and the second type of doping is the other of the P-type or N-type doping. The light converter is connected to the first well so as to forward bias the vertical transistor thereby causing a current to flow between the diffusion region in the first well and the substrate. Additional amplification of the photocurrent from the light converter can be provided by including a second vertical transistor. The second vertical transistor includes a second well in the semiconductor substrate, the second well including a second diffusion region. The semiconductor substrate and the second diffusion having the first type of doping and the second well having the second type of doping. The first vertical transistor and the second vertical transistor are connected as a Darlington pair. The amplified current from the vertical transistor(s) is converted to a voltage by a current to voltage converter.

Description

FIELD OF THE INVENTION
The present invention relates to photodetectors, and more particularly, to a high gain photodetector for generating a binary value based on light intensity.
BACKGROUND OF THE INVENTION
There are a number of situations in which a moveable carriage must be aligned over a stationary object by detecting a fiducial mark on the stationary object. One method for detecting the fiducial mark "on the fly" is to incorporate an array of photodetectors on the moveable carriage. If the array is sufficiently large, the fiducial mark will alter the light at one or more of the detectors. By determining the identity of the photodetectors that "fired", the location and size of the fiducial mark can be deduced.
If the light signal is weak, a high gain photodetector must be utilized. Such a detector requires a two stage operational amplifier followed by a current to voltage translator. The area on the chip required for the operational amplifiers limits the density of photodetectors in the array. Hence, it would be advantageous to provide a high gain photodetector that requires less area to construct.
Broadly, it is the object of the present invention to provide an improved photodetector.
It is a further object of the present invention to provide a photodetector that requires less area than prior art photodetectors having the same gain.
These and other objects of the present invention will become apparent to those skilled in the art from the following detailed description of the invention and the accompanying drawings.
SUMMARY OF THE INVENTION
The present invention is a high gain photodetector that can be constructed in a substantially smaller space than prior art photodetectors having the same gain. The photodetector includes a light converter for converting a light signal to a current; and a first vertical transistor. The first vertical transistor includes a first well in a semiconductor substrate, the first well including a diffusion region, the semiconductor substrate and the diffusion having a first type of doping and the first well having a second type of doping. The first type of doping is either P-type or N-type, and the second type of doping is the other of the P-type or N-type doping. The light converter is connected to the first well so as to forward bias the vertical transistor thereby causing a current to flow between the diffusion region in the first well and the substrate. In the preferred embodiment of the present invention, the light converter is a photodiode constructed from a diffusion region of the second type doping in the semiconductor substrate. Additional amplification of the photocurrent from the light converter can be provided by including a second vertical transistor. The second vertical transistor includes a second well in the semiconductor substrate, the second well including a second diffusion region. The semiconductor substrate and the second diffusion having the first type of doping and the second well having the second type of doping. The first vertical transistor and the second vertical transistor are connected as a Darlington pair. The amplified current from the vertical transistor(s) is converted to a voltage by a current to voltage converter connected to the first diffusion region for converting current flowing through the diffusion region into a voltage.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic drawing of a photodetector according to the present invention.
FIG. 2 is a cross-sectional view of a portion of an integrated circuit chip having a photodetector according to the present invention constructed thereon.
DETAILED DESCRIPTION OF THE INVENTION
The manner in which the present invention achieves its advantages may be more easily understood with reference to FIGS. 1 and 2. FIG. 1 is a schematic drawing of a photodetector according to the present invention, and FIG. 2 is a cross-sectional view through a portion of an integrated circuit chip illustrating the construction of the PNP transistors utilized in the present invention. Referring to FIG. 1, photosensor 10 is constructed from a conventional photo-diode 31 and two vertical PNP bipolar transistors shown at 32 and 33. A current mode detector 30 supplies a current in response to a light signal to the photo-diode 31.
Current amplification is provided by the two vertical PNP transistors 32, 33 which require significantly less silicon area than operational amplifiers used to provide the equivalent function in a conventional photodetector. The PNP vertical bipolar transistors 32, 33 are made from layers available in a conventional N-well/CMOS process with the emitter formed with the P+S/D diffusion layer shown at 53 and 63 in FIG. 2. The bases of the transistors 32, 33 are formed by the N-Well layer shown at 51 and 61 with a N+Well contact shown at 52 and 62. A common collector is formed by the P+/P- Substrate 41. A combined current gain of over 1000 is expected from the two transistors 32, 33 which are connected in a Darlington configuration as shown in FIG. 1. The two transistors 32, 33 in the current mode detector 30 amplify the photo-current generated in photo-diode 31 to a level at which the current can be sensed directly by the current to voltage translator and buffer amplifier circuit shown at 20. This current mode detector 30 responds quickly to the transition between light and dark without requiring a significant integration time as is the case with conventional voltage mode photo sensors.
The current to voltage translator 20 is constructed from a small current sensor transistor 21 and a large current mirror transistor 22. By adjusting the ratio of the sizes of transistors 21 and 22 additional current gain (˜10X) can be obtained. Transistors 23 and 24 form another current mirror to buffer the large swing digital output driver 25 from the sensor current mirror.
The above-described embodiment of the present invention utilizes two vertical PNP transistors to provide a large gain in a small amount of silicon space. It will be obvious to those skilled in the art from the preceding discussion that additional vertical transistors could be similarly connected to provide additional gain if needed. Similarly, if the light signal is sufficiently intense, a single vertical PNP transistor could be utilized.
The above-described embodiments of the present invention have utilized PNP transistors constructed on a P-type substrate. It will be obvious to those skilled in the art from the preceding discussion that the present invention can also be implemented with vertical NPN transistors constructed on an N-type substrate.
Various modifications to the present invention will become apparent to those skilled in the art from the foregoing description and accompanying drawings. Accordingly, the present invention is to be limited solely by the scope of the following claims.

Claims (4)

What is claimed is:
1. A photodetector comprising:
a light converter for converting a light signal to a current; and
a first vertical transistor, said first vertical transistor comprising a first well in a semiconductor substrate, said first well including a first diffusion region, said semiconductor substrate and said first diffusion region having a first type of doping and said first well having a second type of doping, wherein said first type of doping is either P-type or N-type and said second type of doping is the other of said P-type or N-type, said light converter being connected to said first well so as to forward bias said first vertical transistor.
2. The photodetector of claim 1 wherein said light converter comprises a photodiode comprising a diffusion region of said second type doping in said semiconductor substrate.
3. The photodetector of claim 1 further comprising a second vertical transistor, said second vertical transistor comprising a second well in said semiconductor substrate, said second well including a second diffusion region, said semiconductor substrate and said second diffusion having said first type of doping and said second well having said second type of doping, said first vertical transistor and said second vertical transistor are connected as a Darlington pair.
4. The photodetector of claim 3 further comprising a current to voltage converter connected to said second diffusion region for converting current flowing through said second diffusion region into a voltage.
US09/080,996 1998-05-19 1998-05-19 High gain current mode photo-sensor Expired - Fee Related US5969399A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US09/080,996 US5969399A (en) 1998-05-19 1998-05-19 High gain current mode photo-sensor
EP99303245A EP0959502B1 (en) 1998-05-19 1999-04-27 Photodetector
DE69937588T DE69937588T2 (en) 1998-05-19 1999-04-27 photodetector
JP11132736A JPH11345995A (en) 1998-05-19 1999-05-13 Photodetector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/080,996 US5969399A (en) 1998-05-19 1998-05-19 High gain current mode photo-sensor

Publications (1)

Publication Number Publication Date
US5969399A true US5969399A (en) 1999-10-19

Family

ID=22161002

Family Applications (1)

Application Number Title Priority Date Filing Date
US09/080,996 Expired - Fee Related US5969399A (en) 1998-05-19 1998-05-19 High gain current mode photo-sensor

Country Status (4)

Country Link
US (1) US5969399A (en)
EP (1) EP0959502B1 (en)
JP (1) JPH11345995A (en)
DE (1) DE69937588T2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8664580B2 (en) 2011-02-23 2014-03-04 Sharp Kabushiki Kaisha Optical sensor and electronic equipment

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2948815A (en) * 1955-02-18 1960-08-09 Philips Corp Circuit arrangement comprising a phototransistor
US3748546A (en) * 1969-05-12 1973-07-24 Signetics Corp Photosensitive device and array
US4107721A (en) * 1977-01-26 1978-08-15 Bell Telephone Laboratories, Incorporated Phototransistor
US5126814A (en) * 1986-12-09 1992-06-30 Tokyo, Japan Canon Kabushiki Kaisha Photoelectric converter with doped capacitor region
US5252851A (en) * 1991-01-30 1993-10-12 Sanyo Electric Co., Ltd. Semiconductor integrated circuit with photo diode
US5382824A (en) * 1992-07-16 1995-01-17 Landis & Gyr Business Support Ag Integrated circuit with an integrated color-selective photo diode and an amplifier following the photo-diode
US5767538A (en) * 1995-06-26 1998-06-16 Burr-Brown Corporation Integrated photodiode/transimpedance amplifier

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58159384A (en) * 1982-03-17 1983-09-21 Toshiba Corp Darlington photo-transistor
JPS60107858A (en) * 1983-11-17 1985-06-13 Toshiba Corp Darlington photo transistor
US4658282A (en) * 1984-06-28 1987-04-14 Honeywell Inc. Semiconductor apparatus
JPS63128666A (en) * 1986-11-19 1988-06-01 Canon Inc Photoelectric converter
JPH06260674A (en) * 1993-03-05 1994-09-16 Sharp Corp Phototransistor
JP3192366B2 (en) * 1996-01-31 2001-07-23 シャープ株式会社 Light receiving element and method of manufacturing the same

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2948815A (en) * 1955-02-18 1960-08-09 Philips Corp Circuit arrangement comprising a phototransistor
US3748546A (en) * 1969-05-12 1973-07-24 Signetics Corp Photosensitive device and array
US4107721A (en) * 1977-01-26 1978-08-15 Bell Telephone Laboratories, Incorporated Phototransistor
US5126814A (en) * 1986-12-09 1992-06-30 Tokyo, Japan Canon Kabushiki Kaisha Photoelectric converter with doped capacitor region
US5252851A (en) * 1991-01-30 1993-10-12 Sanyo Electric Co., Ltd. Semiconductor integrated circuit with photo diode
US5382824A (en) * 1992-07-16 1995-01-17 Landis & Gyr Business Support Ag Integrated circuit with an integrated color-selective photo diode and an amplifier following the photo-diode
US5767538A (en) * 1995-06-26 1998-06-16 Burr-Brown Corporation Integrated photodiode/transimpedance amplifier

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8664580B2 (en) 2011-02-23 2014-03-04 Sharp Kabushiki Kaisha Optical sensor and electronic equipment

Also Published As

Publication number Publication date
DE69937588T2 (en) 2008-10-23
EP0959502A2 (en) 1999-11-24
DE69937588D1 (en) 2008-01-03
JPH11345995A (en) 1999-12-14
EP0959502A3 (en) 2001-08-08
EP0959502B1 (en) 2007-11-21

Similar Documents

Publication Publication Date Title
US5276407A (en) Sense amplifier
US6300615B1 (en) Photoelectric conversion apparatus
JP2007067331A (en) Ultraviolet sensor
US4841138A (en) Photosensitive position sensor with logarithmic conversion
US6163024A (en) Photoelectric transducer
Ghazi et al. CMOS photodiode with enhanced responsivity for the UV/blue spectral range
US20080230817A1 (en) Semiconductor photodetector device
US6410901B1 (en) Image sensor having blooming effect preventing circuitry
US5013904A (en) Integrated photodetector with hysteresis
Biber et al. Avalanche photodiode image sensor in standard BiCMOS technology
JP3315651B2 (en) Optical sensor and solid-state imaging device
US5776795A (en) Method of making a contactless capacitor-coupled bipolar active pixel sensor with intergrated electronic shutter
US5969399A (en) High gain current mode photo-sensor
US4241358A (en) Radiation sensitive device with lateral current
GB2144265A (en) Solid-state image sensor
EP1662579A1 (en) Photodiode detector
US5721447A (en) Photodetector and a method for the fabrication thereof
JP3123708B2 (en) Optical receiving front-end amplifier
JP3142214B2 (en) Light receiving amplifier
US5942749A (en) Photodetector having means for processing optical input signals
JP2011082513A (en) Silicon photodetection module
KR100540554B1 (en) Photoreceiver photo electronic integrated circuit having heterojunction photo-transistor as detecting device
KR100456067B1 (en) Unit pixel of cmos image sensor
JPH08335712A (en) Photodetector and its manufacture
US10573775B1 (en) Bi CMOS pixel

Legal Events

Date Code Title Description
AS Assignment

Owner name: HEWLETT-PACKARD COMPANY, CALIFORNIA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:PERNER, FREDERICK A.;REEL/FRAME:009311/0550

Effective date: 19980514

AS Assignment

Owner name: HEWLETT-PACKARD COMPANY, A DELAWARE CORPORATION, C

Free format text: MERGER;ASSIGNOR:HEWLETT-PACKARD COMPANY, A CALIFORNIA CORPORATION;REEL/FRAME:010841/0649

Effective date: 19980520

AS Assignment

Owner name: AGILENT TECHNOLOGIES INC, CALIFORNIA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HEWLETT-PACKARD COMPANY;REEL/FRAME:010977/0540

Effective date: 19991101

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAY Fee payment

Year of fee payment: 4

AS Assignment

Owner name: AVAGO TECHNOLOGIES GENERAL IP PTE. LTD., SINGAPORE

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:AGILENT TECHNOLOGIES, INC.;REEL/FRAME:017207/0020

Effective date: 20051201

AS Assignment

Owner name: AVAGO TECHNOLOGIES SENSOR IP PTE. LTD.,SINGAPORE

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:AVAGO TECHNOLOGIES IMAGING IP (SINGAPORE) PTE. LTD.;REEL/FRAME:017675/0691

Effective date: 20060430

Owner name: AVAGO TECHNOLOGIES IMAGING IP (SINGAPORE) PTE. LTD

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.;REEL/FRAME:017675/0738

Effective date: 20060127

Owner name: AVAGO TECHNOLOGIES SENSOR IP PTE. LTD., SINGAPORE

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:AVAGO TECHNOLOGIES IMAGING IP (SINGAPORE) PTE. LTD.;REEL/FRAME:017675/0691

Effective date: 20060430

AS Assignment

Owner name: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:AVAGO TECHNOLOGIES SENSOR IP PTE. LTD.;REEL/FRAME:018545/0413

Effective date: 20061110

FPAY Fee payment

Year of fee payment: 8

REMI Maintenance fee reminder mailed
LAPS Lapse for failure to pay maintenance fees
STCH Information on status: patent discontinuation

Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

FP Lapsed due to failure to pay maintenance fee

Effective date: 20111019

AS Assignment

Owner name: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD

Free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF THE ASSIGNEE PREVIOUSLY RECORDED ON REEL 017207 FRAME 0020. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT;ASSIGNOR:AGILENT TECHNOLOGIES, INC.;REEL/FRAME:038633/0001

Effective date: 20051201