US3525432A - Sorting system - Google Patents

Description

R. F. 'ZURCHER SORTING SYSTEM Aug. 25, 1970 7 Sheets-Sheet 1 Filed 001;. 21, 1968 AWIM/az @001; A zaea/zz,

Aug. 25, 1970 soR'TiNe SYSTEM Filed Oct. 21, 1968 V 7 Sheets-Sheet 2 SORTING SYSTEM '7 Shets-Sheet 15 Filed Oct. 21, 1968 dra Aug. 25, 1970' R. F; ZURCH-ER SORTING SYSTEM 7 Sheets-Sheet 4 Filed Oct. 21, 1968 R. F. ZURCHER SORTING SYSTEM Aug. 25, 1970 7 Sheets-Sheet 6 Filed Oct. 21, 1968 Aug. 25, 1970 SORTING SYSTEM Filed Oct. 21, 1968 R. F. 'ZURCHER 3,525,432.

7 Sheets-Sheet 7' United States Patent 3,525,432 SORTING SYSTEM Rudolf F. Zurcher, Los Angeles, Calif., assignor, by mesne assignments, to GTI Corporation, Meadville, Pa., a corporation of Rhode Island Filed Oct. 21, 1968, Ser. No. 769,233 Int. Cl. B07c /344 US. Cl. 209-73 19 Claims ABSTRACT OF THE DISCLOSURE This disclosure relates to a system capable of highspeed sorting of miniature parts (chips). A valve controlled vacuum transfer arm mechanically cycles between a vibratory feeder bowl and a contacting platform'to pick up a miniature part at the bowl feedout point, deliver the part to the contacting platform of a contacting mechanism, and then return to the bowl for another such'part. The delivered parts are mechanically contacted, tested, classified, and sorted into appropriate classification receptacles. A clutch is provided for automatically stopping the transfer arm at an intermediate position between the bowl and the contacting platform so that sorting of a previously delivered part may be effected before another part can be delivered. The clutch is controlled by a solenoid so that when an electrical signal, derived from the contacting operation, is received by the solenoid the transfer arm will be permitted to proceed from or through the intermediate position to the contacting platform.

This invention relates to a new and improved sorting system of the type capable of high speed sorting of miniature parts (chips) employing a clutch arrangement for effecting unique coaction of a transferring mechanism, a contacting mechanism, and other components of the system.

A previously developed electromechanical system for sorting miniature parts (miniature parts are herein generically defined as chips) included, inter alia, a chip transferring mechanism and a contacting mechanism. The transferring device had a transfer arm for transferring miniature parts or chips from a vibratory feeder bowl to a support surface, and the contacting mechanism had a contact arm for contacting a chip placed on the support surface. The contact arm was operably connected toelectronic equipment capable of testing and classifying chips. The contacting mechanism and the electronic equipment were associated with classification receptacles. Each classification receptacle was attached to a respective movable guide tube. The electronic equipment was operable to actuate a solenoid associated with a selected guide tube after the classification of a chip had been determined, and an ejector arm of the contacting mechanism was operable to push the classified chip into the actuated guide tube. In operation a chip was transported, contacted, tested, classified and sorted. A multiplicity of such chips were sorted by repeating this operation cycle. This prior system utilized a motor for operating both the transfer arm and the contact arm.

In a semiautomatic version of this system the electrical circuit for the motor was automatically deenergized after each complete revolution of the motor and at a time in the operation cycle when the vacuum nozzle of the transfer arm was proximate to the feed out point of the vibratory feeder bowl. The person operating the system, when desiring to effect another operation cycle, pushed a start button thereby causing mechanical contacting of a chip on the support surface, the start of testing and classifying of such chip, and the energization of the motor at the end of classifying. The motor shaft then 3,525,432 Patented Aug. 25, 1970 "ice rotated, thus causing the transfer arm to move so that another chip, obtained from the vibratory feeder bowl by the vacuum nozzle, was transported to the support surface. This latter chip was placed on the support surface when the motor shaft had completed about half of a revolution. The motor shaft continued rotating, thus effecting return of the transfer arm to its initial position wherein the vacuum nozzle was again proximate to the feedout point of the vibratory feeder bowl, until the motor was again stopped by automatic deenergization of the power circuit of the motor.

In an automatic version of this system the motor continued rotating indefinitely, without stopping, through a multiplicity of cycles. Thus the transfer arm did not dwell or rest with the vacuum nozzle proximate to the feedout point for an indefinite time interval as was the case in the semiautomatic version.

In both versions the requisite vacuum at the vacuum nozzle was produced by employing an airpot and check valve arrangement. The airpot consisted of a reciprocable piston mounted in an air cylinder. The piston was coupled to the motor so as to reciprocate back and forth during each revolution of the motor. The piston was arranged to move outwardly of the air cylinder during the chip delivery portion of the transfer arm cycle, thus drawing air into the vacuum nozzle so that a chip could be attracted to and held by the nozzle. During the return of the arm and thus the nozzle to the vibratory feeder bowl, the piston moved inwardly of the air cylinder, thus expelling air through the nozzle. The check valve assisted in regulating the flow of air to and from the nozzle, as was found desirable, when very minute, light weight chips were to be transported; this check valve could be deleted when relatively larger, heavier chips were to be transported.

These versions of the prior system, while advantageous in many respects, were, in practice, found to be subject to certain limitations. Thus, for example, in the semiautomatic version the stopping and starting of the motor sometimes produced spurious electrical transients which interfered with the electrical testing and classifying of contacted chips and sometimes produced false signals to the solenoids utilized in conjunction with associated classification receptacles.

A limitation of the automatic version was the fixed time elapsing during each complete cycle of the transfer arm. Initial contacting, testing, and classifying of a chip occurred while the transfer arm was returning to the feedout point of the vibratory feeder bowl to pick up a new chip, but the sorting operation could not occur until sometime after the transfer arm began delivery of the new chip. The time required for initial contacting, testing, and classifying dictated the maximum speed at which the motor could cycle the transfer arm. Since the test time depended on the particular classification to be made, the minimum time interval for the transfer arm cycle was designed to accommodate the longest foreseeable testing time. Thus, in particular applications involving shorter test times, a portion of the transfer arm cycle time was wasted as far as the electronic classification equipment was concerned.

Another limitation, common to both the semiautomatic and automatic versions, arose from the fact that the associated testing and classifying equipment was capable of performing its operations in a very short time relative to the time required for the transfer arm to move the nozzle from the vibratory feeder bowl to the support surface. Thus, the associated equipment was ready to test and classify another chip long before the transfer arm could deliver another chip to the support surface. In the usual application it is desirable that a large number of chips be sorted in a given unit of time.

The present invention incorporates modifications of the previously developed system which substantially overcome the foregoing and other limitations. Accordingly, the present system avoids the problem of spurious electrical transients by utilizing a clutch in conjunction with a continuously running motor. The time elapsing between sorting of a classified chip and delivery of another chip to be classified is minimized by operating the clutch to operatively disconnect the transfer arm from the motor when the nozzle, with the chip to be classified, is at an intermediate position between the vibratory feeder bowl and the support surface.

The present invention advantageously is adapted for operation in either a semiautomatic or an automatic mode. Also, in both modes, time sequential and time concurrent operations occur between the mechanical cycle and the contacting cycle without interference, despite variable testing and classifying time and fixed mechanical cycle time,

rather than pseudo sequential operations in the semiautomatic mode or fully time concurrent operations in the automatic mode, thereby effectively reducing the total cycle time required for certain applications, regardless of the operating mode.

A further advantage of the system of the present invention, not obtainable in the previously developed system, is that, regardless of the operating mode, several units comprising a transferring apparatus and a contacting apparatus can be coupled to the test and classifying equipment via a multiplexer. The multiplexer allows time random testing of respective chips on respective support surfaces so that the high speed ability of the classifier equipment may be efiiciently utilized.

Accordingly, it is a primary object of the invention to provide an improved sorting system.

This and other objects are accomplished in accordance with the invention by the incorporation of a clutch arrangement relating the operation of a transferring mechanism, a contacting mechanism, and other system components in a unique fashion.

The above objects and features of the invention should become more apparent from the following description of the invention considered with the accompanying drawings.

Referring to the drawings:

FIG. 1 is a diagrammatic representation, in perspective, showing certain parts of a transferring mechanism utilized in a sorting system according to the present invention.

FIG. 2 is a plan view showing, in some detail, the arrangement of a contacting mechanism, means for receiving classified chips, and a transferring mechanism according to the present invention.

FIG. 3 is an elevational view taken along line 3-3 of FIG. 2 showing, inter alia, an arrangement whereby chips may be sorted into appropriate classification receptacles.

FIG. 4 is an elevational view taken along line 44 of FIG. 2, showing an arrangement including a weight arm for applying and removing contact pressure.

FIG. 5 is a perspective view of the latch structure embodied in the contacting mechanism shown in FIG. 2.

FIG. 6 is a detail drawing illustrating the operation of certain elements shown in FIG. 5.

FIGS. 7 and 8 are elevational views, taken along lines 7 and 8 respectively of FIG. 2, showing in some detail the structure of the contacting mechanism.

FIGS. 9-13 are schematic representations illustrating the operation of the contacting mechanism.

FIGS. 14 and 15 are respective side and front views showing certain details of a motor, clutch and associated parts comprising part of the combination shown in FIG. 1.

FIG. 16 illustrates the operation of the valving shown in FIG. 1.

FIG. 1 shows, in perspective, a generalized view of transferring mechanism wherein hollow transfer arm 12 is operated by motor 14, back and forth between the pickup point on vibratory feeder bowl 16 and platform 18 of a contacting station. Clutch 20, mounted on the motor shaft, supports rotary shutter plate 22.

Clutch 20 is comprised of three coaxial members 24-, 26, and 28. Member 26 has a ramp 30 defining a radial face which is engageable with a face or shoulder on spring biased lever 32. Solenoid 34 is energizable to pull lever 32 out of the way of the ramp face.

Vacuum pump 36, flapper valves 38 and 40, and trans fer arm 12 are interconnected by flexible tubing 42. Transfer arm 12 has a vacuum nozzle 44 for picking up chips. In FIG. 1, nozzle 44 is shown proximate to platform 18.

Ball bearing 46 is held in a socket on support 48 by means of spring biased rectangular frame 50 which has a detent inserted in a dimple of ball bearing 46. Bearing pin 52 extending through a guide slot in guide member 54 aids in the retaining of ball bearing 46 in the aforementioned socket.

Rod 56 interconnects rotatable clamp plate 58 and rotatable member 60. Large gear 62, which is coaxial with member 60, and driven thereby, meshes with small gear 64. Radial arm 66 connects transfer arm 12 to shaft 68. Piston rod 70 connects piston 72 within air cylinder 74 to small gear 64. Finally photocell 76 and radiant energy source 78 are disposed on opposite side of shutter plate 22.

The basic operation of the FIG. 1 structure is as follows: Solenoid 34 is energized, lever 32 disengages the radial face of ramp 30, clutch 20 couples, and clamp plate 58 rotates one complete revolution. Rotation of clamp plate 58 is converted into transfer arm motion via the intercoupling provided by rod 56, rotatable member 60, gears 62 and 64, and radial arm 66. Accordingly, transfer arm 12 pivots about bearing 46, and nozzle 44 travels in an arcuate path from an intermediate position, halfway between vibratory feeder bowl 16- and platform 18, to platform 18, returns to vibratory feeder bowl 16, then travels back to the intermediate position. The face on lever 32 again engages the radial face defined by ramp 30, clutch 20 decouples, and transfer arm 12 is held in the intermediate position.

FIG. 2 shows, inter alia, contacting mechanism 80, sorting apparatus 82, and alignment device 84. Contacting mechanism 80 comprises contact arms 86 attached to carriage 88, and weight arm 90. Platform 18 of alignment device 84 may be rotated or translated by twirling and pivoting control stick 92. Alignment device 84 is disclosed in application Ser. No. 733,347, filed May 31, 1968 by the same applicant, assigned to the same assignee and entitled Mechanical Alignment Device. Conical frame member 94 is disposed over solenoid controlled guide tubes 96. Each guide tube 96 is connected to a respective receptacle 98.

In FIG. 3 receptacle 98 and associated guide tube 96 are shown interconnected by member 100. Member 100 circumscribes the bottom portion of tube 96 and is pivoted on pin 102. Solenoid 104 is connected to member 100 so that when solenoid 104 is energized tube 96 moves to the dotted position shown so that it may receive a chip from chute 106 and direct it into receptacle 98. Collar 108 cusures accurate positioning of the mouth of guide tube 96 under chute 106. Spring 110 is connected between member 100 and flange 112 so that when solenoid 104 is not energized tube 96 is biased into engagement with resilient stop 114 which is attached to frame member 94.

FIG. 4 shows weight arm 90 pivoted on pin 116 and rocker element 118 pivoted on pin 120. Rocker portion 122 is engageable with a roller 124 (shown by dotted lines) which is secured to weight arm 90 by pin 126. Portion 122 normally rests on sleeve 128. When pin 130 engages rocker portion 132 and travels upward, rocker element 118 pivots about pin in the clockwise direction whereby weight arm 90 is caused to pivot clockwise about pin 116. Thus, portion 134 of weight arm 90, is lifted to relieve contact pressure from underlying contact arms 86 (shown in FIG. 2).

After rocker portion 132 has been thus lifted, subsequent downward travel of pin 130 allows rocker element 118 to pivot counterclockwise to return to the initial position shown wherein rocker portin 122 again rests on sleeve 128 so that weight arm 90 returns to its initial position wherein weight arm portion 134 again applies contact pressure to contact arm 86 (not shown).

FIG. shows, in perspective, an arrangement for latching contacting mechanism '80. Latch member 140 is pivot ed on pivot pin 142. Bracket 144, secured to member 140, has a rear portion 146 resting on surface 148. Triangular piece 150 is supported between bracket leg portions 152 by pin 154. Shaft 156 is connected to gear 62 (shown in FIG. 1). Plate 158 is clamped to shaft 156 by clamp screw 160. Leg portion 162 of plate 158 extends rearwardly so as to be engageable with the bottom surface of plate 164. Plate 164 is loosely mounted on shaft 156 whereby plate 164 and shaft 156 may move relative to each other. Plate 164 carries latch member 166 shown in locking engagement with notch 168 on latch member 140. Plate 164 also carries elongated pin 130 to which permanent magnet 170 is attached. Magnetic reed switch 172 is stationarily positioned so that when plate 164 is free to fall under gravity, magnet 170 will actuate switch 172. Switch 172 controls circuitry (not shown) which generates a control signal. Plunger 174, shown with its intermediate portion cut away, has a conical member 176 at one end and a push button 178 at its other end. Spring 180 normally biases plunger 174 so that conical member 176 is normally disengaged from triangular piece 150. Latch member 140 may be lifted and member 182 rotated thereunder to effectively prevent latching of members 140 and 166.

FIG. 6 shows plunger 174 with its conical member 176 in the normal position. When it is desired to disengage latch member 166 from notch 168, button 178 is pushed inward. Upon inward motion of plunger 174, conical member 176 first slidably engages triangular piece 150 thereby lifting the associated portion of latch member 140 and rotating latch member 140 clockwise about pivot pin 142 so that latch member 166 clears notch 168 and plate 164 is free to fall under gravity. Conical member 176 then passes underneath the uplifted triangular piece 150 to the fully actuated position (shown by the dotted lines) wherein conical member 176 clears or is disengeged from triangular piece 150. Upon deactuation or release of button 17 8 the plunger 174 returns to its normal position. During this return motion conical member 176 pushes triangular piece 150 ahead of it, thereby rotating triangular piece 150 counterclockwise (as indicated by the dotted lines) about pivot pin 154 without moving or lifting latch member 140. This feature insures proper operation of the latch arrangement.

In FIG. 7, weight arm 90 is shown pivoted on pin 116 which is supported by respective portions of frame member 190. Plunger 174, extending between button 178 and conical member 176, is biased to the left by spring 180 mounted in chamber 192 of member 194. Rocker element 118 is pivoted on pin 120.

FIG. 8 shows details of one embodiment of a contacting mechanism '80. In this embodiment test platform 18 is an elongated conductive metal plate having inclined surface portion 202 separated from main body 204 by insulating material 206. Chute 106, held in a vertical aperture in main body 204 by set screw 208, has a peripheral longitudinal slot facing test platform 18 so that chips can be directed from platform 18 into chute 106 when ejector arm 210 is extended to the left. The right end of ejector arm 210 is pivoted on a pin extending from lever 212.

Lever 212 in turn is pivoted on pin 214 extending from lever 216. Levers 216 and 218 are both pivoted on pin 120. Levers 212 and 218 are coupled together by pin 220 and slot 222 in lever 218.

Spring 226, connected between portion 228 of lever 218 and post 230 mounted in an aperture in frame member 190, biases lever 218 to the position shown. Two springs,

such as spring 234, extend between respective posts 236 on lever 216 and posts on frame member 190 similar to post 230.

Spring 238 is secured at one end to main body 204 by screw 240. The other end of spring 238 has a V-shaped portion normally resting on top of stop 242 which is integral with lever 216. Notch 244 on lever 212 can capture spring 238. One or more contact arms 86 are secured to contact carriage 88 by screws 246. Carriage 88 is an insulating body having apertures receiving contact terminals 248. Test and classifying equipment 250, which may comprise various automatic digital test equipment, is connected to terminals 248 so that when contact arms 86 contact engage a chip on platform 18 the chip may be electrically coupled thereto. A detailed description of equipment 250 is deemed unnecessary for proper understanding of the invention.

FIGS. 9-13 are diagrammatic representations illustrating the sequential operation of contacting mechanism shown in FIGS. 7 and 8. In FIG. 9 pin 130 has traveled in the clockwise direction from the dotted position to the shown position. Contact arm 86 is in contact engagement with a chip on platform 18. Pin 130 in the shown position engages rocker element 118 (shown in FIG 4). Continued clockwise travel of pin 130 first causes weight arm 90 (shown in FIG. 4) to lift, thus relieving contact pressure from contact arm 86. Pin then engages lever 218 causing ejector arm 210 to move to the left whereupon the left end of ejector arm "210 rides up the inclined surface 202 to lift contact arm 86 away from the chip. Subsequently ejector arm 210 sweeps the chip into chute 106 as shown in FIG. 10.

Pin 130 then continues its clockwise travel until lever 212 abuts stop 242. Lever 216 then is rotated clockwise to the position shown in FIG. 11 so that contact arm '86 and ejector arm 210 are both fully retracted to allow a chip to be placed on platform 18.

In the semiautomatic version, pin 130 is latched in its FIG. 11 position by the latching mechanism shown in FIG. 5 until plunger 174 is actuated whereupon pin 130 reverses its direction of movement and travels in the counterclockwise direction. In the automatic version, pin 130, upon reaching the FIG. 11 position, immediately reverses direction. In both instances counterclockwise travel of pin 130 allows lever 216 to move counterclockwise so that contact arm 86 moves to the left until its forward end overlies the newly deposited chip, at which time ejector arm 210 has advanced halfway to the left so that its left hand is resting at the top of the inclined surface 202 on platform 18. Spring 238 has entered slot 244 of lever 212, retaining ejector arm 210 in the halfway position so that contact arm 86 is held out of contact engagement with the newly deposited chip. FIG. 12 shows the position of various elements after these events have occurred.

Upon continued counterclockwise travel of pin 130, spring 238 snaps out of slot 244, and lever 212 rotates clockwise whereupon the left end of ejector arm 210 rides down the inclined surface of platform 18 thus allowmg contact arm 86 to contact the newly deposited chip. Shortly thereafter, pin 130 disengages rocker element 118 to permit weight arm 90 to apply contact pressure to contact arm 86.

FIG. 13 shows the position of the elements after these events have occurred.

Subsequent further counterclockwise travel of pin 130 brings it to the dotted position shown in FIG. 9 thus completing the operation cycle of the contacting mechanism.

In FIGS. 14 and 15 parts of the structure are shown cutaway or shown in cross section so that the details thereof may more readily be explained. Clutch 20, mounted on a shaft extending from motor 14, is situated within aperture 260 of vertical support 262. Photocell 76 is mounted in support 262 across from radiant energy source 78. Annular shutter plate 22 has an aperture 264 which can be rotated into position between photocell 76 and source 78. Shutter plate 22 is clamped between annular clamp plates 58 and 266 which are secured together by screws such as 268.

The assembled clamp and shutter plates are secured to mounting hub 28 of clutch 20 by one or more peripheral set screws such as 272. By loosening set screw 272, rotating the assembly relative to mounting hub 28, and retightening set screw 272 any desirable angular orientation of aperture 264 can be obtained. The end 274 of rod 56 is mounted on pin 276 extending from plate 58.

Clutch 20 comprises, in addition to mounting hub 28, shaft adapter 24 and intermediate shell 26. A helical spring inside shell 26' wound counterclockwise, has one end portion captured in a slot in shell 26 adjacent shaft adapter 24 and the other end captured in a slot in mounting hub 28. Ramp 30 on shell 26 defines a radial face 278, the edge of which can be seen in FIG. 14. When motor 14 rotates clockwise the helical spring winds, thus coupling mounting hub 28 to shaft adapter 24, and hub 28 is driven clockwise. When shell 26 is restrained from rotating the helical spring unwinds, thus uncoupling hub 28 from shaft adapter 24. Clockwise rotation of motor 14 is inetfective to drive hub 28.

In order to restrain shell 26 from rotating, declutching lever 32 is provided. Lever 32 is pivoted on screw 280 attached to vertical support 262 and spring biased toward shell 26 by spring 288. Lever 32 is formed to define a shoulder surface 284, extending radially of shell 26, which when engaged with radial face 278 restrains shell 26 from any further clockwise rotation.

Lever 286 is pivoted on screw 280, biased toward shell 26 by spring 282, has a length less than the length of lever 32 from its pivoted end to surface 284; and functions as an antireverse lever. The top edge of lever 286 and the surface 284 of lever 32 define a pocket in which pin 292 extending from plate 266 may be captured. Pin 292 is disposed on plate 266 a few degrees counterclockwise relative to face 278 of shell 26. Lever 286 functions as an antireverse lever in that when face 278 rotates into engagement with face 284, inertia allows mounting hub 28 to continue rotating for a short time. During this time pin 292 falls into the pocket whereupon the top surface of lever 286 prevents mounting hub 28 from momentarily reversing direction as would otherwise occur. This feature is important when a very small, lightweight chip is being transported by transfer arm 12.

Solenoid 34 is held adjacent vertical support 262 by clamp 294. The solenoid plunger is connected to lever 32 'by linkage 296. When solenoid .34 is energized, lever 32 pivots counterclockwise and face 284 moves out of the path of face 278 of shell 26.

Lever 298- is pivoted on screw 300 extending from vertical support 262 and normally rests upon lever 32. When solenoid 34 is energized and lever 32 rotates counterclockwise, lever 298 pivots and drops onto shell 26 to prevent lever 32 from returning to its original position when solenoid 34 is deenergized. Lever 298 is thus in the path of travel of pin 292 so that pin 292 will subsequently lift lever 298 to its original position whereby spring 282 can return lever 32 to its original position.

FIG. 16 shows flapper valves 38 and 40' with respective spring biased flappers 310 and 312 arranged for actuation by pin 276 which is mounted on clockwise rotating shutter 22. Valves 38 and 40 are connected in .series between transfer arm 12 and vacuum pump 36. For proper timing of the valving operation relative to transfer arm movement, flappers 310 and 312 normally close respective valve bypass openings. As pin 276 passes through the position shown, transfer arm 12 is in the vicinity of test platform 18, and flapper 310 uncovers the respective val-ve bypass opening to relieve vacuum at nozzle 44. When pin 276 passes through the dotted 8 position, transfer arm 12 is in the vicinity of vibratory feeder bowl 16, and flapper .312 uncovers the respective valve bypass opening to relieve the vacuum at nozzle 44. Accordingly, operation of flapper valves 38 and 40 occurs at the proper time in the transfer arm cycle so that a chip may be picked up at the feedout point of vibratory feeder bowl 16 and transported to test platform 18 where the chip is released.

The operation of the sorting system in the automatic mode can be summarized as follows:

Assume that contact arms 86 are contacting a first chip on platform 18 and that testing and classifying of the first chip is in progress (FIG. 8). Further assume that nozzle 44 is stationary and holding a second chip at a position half way or intermediate between feeder bowl 16 and platform 18. At this time radial face 278 engages shoulder 284 of lever 32- so that clutch 20 is decoupled. At this time shutter plate aperture 264 is in the bottommost position shown in FIG. 14.

The FIG. 5 latching arrangement is rendered inoperative by resting latch member 140 on member 182 which has been pivoted underneath the adjacent portion of latch member 140.

Upon completion of testing and classifying, equipment 250 is operative to send, by appropriate means, an electrical signal to solenoid 34 whereby lever 32 is retracted and shoulder 284 and radial face 278 disengaged. Nozzle 44 now begins movement towards platform 18.

Equipment 250 concurrently actuates a selected solenoid 104 (FIG. 3), depending upon the classification assigned to the first chip by the equipment. As a result of the latter signal the mouth of the associated guide tube 96 moves into position underneath shoot 106 and, by suitable circuitry, is held in this new position until the solenoid 104 is deactuated in a manner which is to be described hereinafter.

As nozzle 44 approaches platform 18 with the second chip, pin 130 first engages rocker element 118 of FIG. 4 removing the contact pressure weight arm fro-m contact arms 86. Pin subsequently engages lever 218 so that ejector arm 210 pushes the first chip into shoot 106 which directs the chip into the selected guide tube 96. Ejector arm 210 and contact arms 86 then move away from the platform in time to allow nozzle 44 to deposit the second chip on platform 18. At this time pin 276 actuates flapper 310 of valve 38 (FIG. 16). Vacuum at nozzle 44 collapses for a short time and the second chip is deposited or dropped onto platform 18.

Transfer arm 12 now reverses direction and begins to return to bowl 16. Pin 130 also reverses direction so that shortly after the second chip has been deposited, contact arms 86 move over the second chip. Contact arms 86 then drop into contacting engagement with the second chip and contact pressure is applied by weight arm 90. Contact arms 86 bounce for a time due to their spring constant. The foregoing events occur before transfer arm has travelled half way back towards bowl 16.

By the time transfer arm 12 reaches a position half way back to bowl 16 the contact arms 86 have ceased to bounce. At this time, shutter aperture 264 passes between photocell 76 and light source 78. When this occurs, a signal is sent to equipment 250 indicating that testing of the second chip can commence. Additionally, a second signal is sent to deactuate the selected solenoid 104, by suitable means associated with the equipment 250, whereby the associated guide tube returns to its quiescent condition. The second chip is subsequently tested and classified. As nozzle 44 of transfer arm 12 arrives at bowl 16, pin 276 actuates flapper 312 of valve 40 (FIG. 16) and vacuum at nozzle 44 collapses, for a short time. When flapper 312 returns to its non-actuated position, vacuum at nozzle 44 resumes, causing transfer arm 12 to pick up a third chip from the feedout point of bowl 16.

Transfer arm 12 then moves toward platform 18. When it reaches the intermediate position halfway toward platform 18, radial face 278 of clutch shell 26 engages shoulder face 284 of lever 32 to decouple transfer arm 12 from motor 14 in the event that another signal has not been received by solenoid 34. Transfer arm 12 waits in this position until another signal is received by solenoid 34 whereupon the foregoing cycle of events is repeated. Of course, if solenoid 34 has received another signal prior to the time radial face 278 has reached the clutch decoupling position, then transfer arm 12 proceeds in an uninterrupted motion through the intermediate position to deliver the third part to platform 18 and thereby complete another operation cycle.

In the semiautomatic mode the operation cycle is similar to that of the automatic mode with only a few variations. In the semiautomatic mode, the latch arrangement shown in FIG. is utilized whereas in the automatic mode, it is not. In the automatic mode shutter plate aperture 264 serves the dual function of signalling to cause de-energization or resetting of the selected solenoid 104 and also indicating that testing and classifying can commence. The aperture 264 retains its function of allowing light from light source 78 to impinge upon photocell 76 for deactuation or resetting of the selected solenoid 104.

In operation, assume that the latching arrangement of FIG. 5 is latching contacting mechanism 80 in the position shown in FIG. 11, that a first chip is on platform 18, that nozzle 44 is stationary halfway between feeder bowl 16 and platform 18, and is carrying a second chip. When the operator presses button 178, conical member 176 (FIG. 5) causes latch members 166 and 140 to disengage whereupon plate 164 rotates counter-clockwise. As plate 164 rotates, contacting mechanism 80 operates to move contact arms 86 to the position shown in FIG. 13. Shortly thereafter, permanent magnet 170 (FIG. 5) arrives adjacent magnetic reed switch 172 producing a signal which is sent to equipment 250 to indicate that testing of the first chip can commence.

Testing and classifying of the first chip then occurs. After testing and classifying has been completed, equipment 250 sends a signal to a selected solenoid 104 (FIG. 3) and a signal to solenoid 34 (FIG. 1). Clutch 20 recouples and transfer arm 12 proceeds to deliver the second chip to platform 18.

The first chip is ejected, the second chip is placed on the platform 18, and nozzle 44 returns toward feeder bowl 16. When nozzle 44 is halfway back to feeder bowl 16, shutter plate aperture 264 passes between photocell 76 and light source 78 whereupon the selected solenoid 104 is deactuated and returned to its quiescent position.

Thus, it can be seen that in both the semiautomatic and automatic modes, an electrical signal is developed in an appropriate time in the mechanical cycle of transfer mechanism to allow testing and classifying of a chip to proceed. Furthermore, in each mode a signal is developed at the end of the testing and classifying cycle to induce or start another mechanical cycle. In both instances, this start signal is mechanically stored if the previous mechanical cycle has not yet been completed, thus allowing the transferring mechanism to continue without stopping through another subsequent mechanical cycle.

Operation of the system in the automatic mode is initiated by appropriately inducing an electrical signal to artificially indicate the completion of testing and classifying in order that a first chip may be deposited on platform 18. Thereafter the system operates in the automatic mode in the manner set forth above.

The above described system is quite versatile in that it may be utilized for sorting a wide variety of miniature parts (chips) having different size, weight, and geometric features. Accordingly, miniature metal pieces, film resistors, glass pill diodes, various types of semiconductor flip-chips, and other miniature parts may be sorted. Where semiconductor flip-chips are being handled, visual inspection for missing conductive bumps is possible. The semiautomatic mode makes possible the visual alignment of miniature parts prior to contacting. Various contact carriages may be provided with as many contact arms as desired. Thus, for example, the bumps of a semiconductor flip-chip can be aligned for contacting by a corresponding member of contact arms.

It should be appreciated that while the foregoing description has reference to particular structure, especially adapted for sorting chips, nevertheless, the inventive concepts embodied in the invention are reasonably adapted for incorporation in analogous situations where miniature items or chips are to be handled for a variety of purposes.

Accordingly, various changes and modifications, obvious to one skilled in the art, are deemed to be within the scope of the invention.

What is claimed is:

1. Chip sorting apparatus comprising:

a chip supply station and a chip classifier station;

means for transferring chips, in sequence, from said supply station to said classifier station;

means for routing chips from said classifier station in accordance with an assigned classification;

means for delaying transfer of a consecutive chip for a time directly related to the time required for classifying the immediately preceding chip when the required time exceeds a time predetermined by the synchronous operation of said transferring means and said classifier station.

2. In a chip routing apparatus, the combination of:

respective first and second synchronously operable mechanisms cooperating to respectively deliver consecutive chips to a classifier station and to route such chips therefrom;

said second mechanism being operable to route each chip in accordance with the classification assigned thereto at said classifier station; and

means for idling said first mechanism for a time dependent upon the classification time of the previous chip.

3. Apparatus for routing chips from a chip feed station to respective classifier receptacles comprising:

a chip classification station where chips are respectively assigned classifications in accordance with a parameter thereof;

a first mechanism for transferring a chip from said chip feed station to said chip classification station;

a second mechanism for routing such chip from said classification station in accordance with the assigned classification;

synchronizing means coupled to said mechanisms to correlate the operation cycles of said mechanisms;

said mechanisms being operable through repetitive cycles to thereby sort consecutive chips; and

means for lengthening the cycle time of said first mechanism in proportion to the time required to classify an immediately preceding delivered chip in excess of a predetermined portion of the cycle time of said first mechanism.

4. The apparatus of claim 3 wherein said second mechanism includes guide means for receiving a classified chip and directing such chip in accordance with the assigned classification into one of said classifier receptacles.

5. An electromechanical system for sorting a plurality of initially unclassified chips in accordance with an assigned classification comprising:

a first station for supplying unclassified chips to a chip carrier means;

a second station including a surface for receiving such chips from said chip carrier means;

a chip transfer mechanism including drive means coupled to said chip carrier means to repeatedly cycle and move said carrier means back and forth between 1 1 said stations to thereby successively deliver chips from said first station to said second station; said second station further comprising movable chip contacting means and movable chip removing means;

mechanical means for repeatedly cycling and moving said contacting means and said removing means to successively permit each unclassified Chip to be placed on said surface, subsequently contacted by contacting means, and thereafter ejected from said surface by said removing means;

test and classifying means coupled to said contacting means and to said chip transfer mechanism for testing and classifying each chip during contacting thereof and for controlling the operation of said chip transfer mechanism;

coupling means relating the mechanical cycles of said chip carrier means and said chip removing means to the time required for testing and classifying of each chip so that any chip on said surface will be removed therefrom prior to the placing of a successive chip thereon; and

said coupling means including clutch means capable of stopping said carrier means at an intermediate position to delay delivery of a successive chip for a time dependent upon the time required for testing and classifying and otherwise permitting uninterrupted operation of said transferring mechanism.

6. The system of claim 5 further including latchable means for preventing the aforementioned chip contacting by said contact means, and manual means to unlatch said latchable means to allow the aforementioned chip contacting to proceed.

7. The system of claim 5 wherein said mechanical means includes actuatable lever means for producing the aforementioned movement of said contacting means and said removing means.

8. In a chip-handling system for sequentially transporting, contacting, and sorting chips having chip supply and chip-contacting stations and a chip-transferring mechanism having chip-carrier means movable back and forth between said stations to alternately transport a chip from said chip-supply station to said chip-contacting station and to return to said chip-supply station to obtain another chip, a contacting mechanism operable in synchronous relation with said carrier means to contact each chip subsequent to placement thereof on said chip-contacting station, drive means for said carrier means and said contacting mechanism to produce the aforemention synchronous operation, and coupling means coupled between said drive means and said transferring mechanism, the improvements comprising:

said drive means being continuously operable during the aforementioned transporting, contacting and sortsaid contacting mechanism being adapted to permit testing and classifying of chips placed on said chip-contacting station and to accommodate derivation of a control signal in timed relationship with each testing and classifying operation,

clutch means incorporated within said coupling means and normally operable to decouple said carrier means from said drive means at a time in the operation cycle of said carrier means when said carrier means arrives at an intermediate position between said stations with a chip carried thereby; and

control means operable in response to the control signal to render said clutch means inoperative and to permit uninterrupted motion of said carrier means through said intermediate position to said chip-contacting station.

9. In a system for transporting, contacting, and sorting chips, the combination of:

a chip feed station and a chip test station, carrier means movable in a first direction to transport a chip from said chip feed station to said chip test station and movable in a second direction to return from said chip test station to said chip feed station;

contact means operative to permit testing and classifying of each chip at said chip test station;

clutch means coupled between a drive means for said carrier means and said carrier means, said drive means being continuously operable during the aforementioned transporting, contacting, and sorting of chips;

said clutch means including latch means, latchable at a predetermined time during the movement of said carrier means in the first direction, to stop said carrier means in an intermediate position and thereby delay the placement of a chip on said chip test station until such time as testing and classifying of a previously delivered chip at said chip test station has been completed; and

control means for moving one member of said latch means upon completion of the aforementioned testing and classifying so that said carrier means may proceed uninterrupted or after a time delay to said chip test station.

10. An electromechanical system for successive sorting of each of a plurality of chips into respective classification receptacles in accordance with an assigned classification comprising:

a first station for supplying chips and a second station for testing and classifying such chips;

said second station comprising a chip receiving surface disposed adjacent a plurality of chip classification receptacles;

a chip transfer mechanism having carrier means driven by a drive means to successively transport chips and to repeatedly deliver consecutive chips from said first station to said second station and return to said first station;

means for testing and classifying chips coupled to movable contact means;

said movable contact means together with a chip removal means comprising part of a contacting mechanism;

said movable contact means and said chip removal means each being movable relative to said chip receiving surface to permit placement of each successive chip on said chip receiving surface by said carrier means, contacting of each such chip by said contacting means, and removal of each such chip from said chip receiving surface subsequent to testing and classifying thereof;

synchronizing means relating the movements of said mechanisms to the time required for completion of testing and classifying of each previously delivered chip so that each such chip may be removed from said surface prior to the placement of a successive chip thereon;

said coupling means including means capable of stopping movement of said carrier means to delay delivery of a chip for a time dependent upon the time required to test and classify the previously delivered chip when the required time exceeds a predetermined time and for otherwise permitting uninterrupted delivery of the successive chip.

11. The system of claim 10 including means for delaying operation of the aforementioned testing and classifying means for a time after initial contacting of a chip by said contacting means.

12. An electromechanical system for sorting a plurality of chips comprising:

a first station for supplying unclassified chips to a chipcarrier means;

a second station including a surface to receive chips from said chip-carrier means;

a chip-transfer mechanism, including said chip-carrier means, and being operative in each cycle of operation to move said chip-carrier means back and forth between said stations;

said chip-carrier means being operative to successively deliver consecutive chips from said first station to said surface;

a chip-contacting mechanism, including said surface, having movable contacting means for contacting each consecutive chip, while on said surface, and chipremoval means for subsequently removing such chip during the cycle of operation of said chip-contacting mechanism; and

test and clasifier means coupled to said contacting means for testing and classifying each chip during contacting thereof, and means coupled to said test and classifier means for producing repetitive synchronous operation of said chip-transfer and chip-contacting mechanisms regardless of the time interval required for each testing and classifying operation.

13. An electromechanical system for performing successive sorting operations on each of a plurality of consecutive chips comprising:

a first station for supplying unclassified chips and a second station for testing and classifying such chips; transporting means for transporting chips from said first station to said second station;

said second station including a surface adapted to receive a chip transported to said second station by said transporting means;

contacting means operable at said second station and adapted to couple each received chip to test and classifying means;

removal means to remove each received chip after classifying thereof by said test and classifying means; and

means for idling said transporting means for a time proportionate to the time required to classify an immediately preceding delivered chip when the required time is in excess of a predetermined time.

.14. Apparatus for routing chips from a chip feed station to respective classifier receptacles comprising:

a first mechanism for delivering a chip to a classifier station where such chip is assigned a classification in accordance with a parameter thereof;

a second mechanism for routing such chip from said classifier station in accordance with the assigned classification;

synchronous means relating the operation cycles of said first and second mechanisms;

said mechanisms being operable through repetitive cycles to thereby sort consecutive chips; and

means for prolonging the chip delivery time of said first mechanism for a time corresponding to the time required to classify an immediately preceding delivered chip in excess of a predetermined time interval.

15. In a system for transporting, contacting, testing, classifying, and sorting chips including: chip feed and chip test stations, a chip transferring mechanism having a chip transfer arm for transporting chips from said chip feed to said chip test station, a contacting mechanism having contacting means for contacting chips at said chip test station to permit testing and classifying of such chips, and coupling means respectively connecting both mechanisms to a drive means so as to relate the operation cycles of such mechanisms, the improvements comprising:

said drive means being continuously operable during transporting, contacting, testing, classifying, and sorting of chips; said coupling means including electromechanical clutch means for mechanical decoupling said mechanisms from said continuously operable drive means during the chip-transporting portion of the operation cycle of said chip-transferring mechanism; and

said clutch means being arranged so that the aforementioned decoupling arrests transfer arm motion at an intermediate position between said stations whereby said transfer arm is stopped at the intermediate position.

16. The system of claim 15 wherein said electromechanical clutch means includes electromechanical means operable in response to an electrical signal to alternately permit the resumption of transfer arm motion from the intermediate position or to prevent the aforementioned decoupling to thereby permit said transfer arm to uninterruptedly pass through the intermediate position to complete the chip transporting portion of the transfer arm operation cycle, depending upon the time in the transfer arm cycle the electrical signal is received by said electromechanical means.

17. The system of claim 16 further including means for operating the system automatically or semiautomatically.

18. The system of claim 15 wherein said transfer arm has a vacuum nozzle for carrying chips, and further comprising means for inducing and relieving vacuum at said nozzle in timed relationship to the movement of said transfer arm.

19. The system of claim 15 including means for pivot ing said transfer arm about a first point and including a vacuum nozzle carried by said arm which is movable back and forth between said chip feed and chip test stations during the aforesaid pivoting.

References Cited UNITED STATES PATENTS 2,999,587 9/ 1961 Campbell 209-73 3,209,908 10/1965 Hopkins 209-81 3,252,571 5/1966 Hinkle et a1. 20981 3,282,420 11/1966 Frechette 209-81 X 3,363,179 1/1968 McCutcheon -20981 X 3,384,236 5/ 1968 Best et a1. 209-81 ALLEN N. KNOWLES, Primary Examiner US. Cl. X.R. 209-81

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