US3271285A - Method for sputtering niobium or tantalum thin films - Google Patents

Method for sputtering niobium or tantalum thin films Download PDF

Info

Publication number
US3271285A
US3271285A US316917A US31691763A US3271285A US 3271285 A US3271285 A US 3271285A US 316917 A US316917 A US 316917A US 31691763 A US31691763 A US 31691763A US 3271285 A US3271285 A US 3271285A
Authority
US
United States
Prior art keywords
cathode
niobium
sputtering
tantalum
thin films
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US316917A
Inventor
Raymond E Skoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Priority to US316917A priority Critical patent/US3271285A/en
Application granted granted Critical
Publication of US3271285A publication Critical patent/US3271285A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • C23C14/18Metallic material, boron or silicon on other inorganic substrates
    • C23C14/185Metallic material, boron or silicon on other inorganic substrates by cathodic sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00Superconductor technology: apparatus, material, process
    • Y10S505/80Material per se process of making same
    • Y10S505/815Process of making per se
    • Y10S505/816Sputtering, including coating, forming, or etching

Definitions

  • FIG. 1 is a side elevation of one type of apparatus which can be used to carry out the process of this invention.
  • FIG. 2 is a somewhat schematic illustration showing the type of cathode grid used to carry out the present process.
  • the process of this invention comprises locating a suitable substrate within an enclosure chamber which is connected to a source of argon. Also located within the enclosed chamber is a perforate or screen-like cathode which is positioned in operative relationship with respect to the film substrate.
  • argon atoms are ionized and directed against the surface of the cathode body.
  • some of the argon ions which miss the cathode hit the substrate and thus clean the substrate surface of impurities.
  • Metal ions are propelled from the cathode due to the ion bombardment and some strike the substrate so that a film of metal is gradually built up. It has been found that by following this process, superconductive films of the two metals mentioned can be formed.
  • the numeral indicates means defining an enclosed chamber 11.
  • the means 10 may constitute, as shown, a simple bell jar arrangement.
  • a cathode 12 which is constructed of either tantalum or niobium, a growth substrate such as quartz plate 13 and an anode 14 which is the ground return for cathode 12. It will be noted that the growth substrate 13 is located between the cathode and the anode so that ions which miss the cathode will flow toward anode 14 and strike the substrate 13.
  • FIG. 2 of the drawings illustrates one specific cathode construction which enables the present process to be carried out.
  • the cathode 12 is perforate so that it has a number of passages 15 through which argon ions may pass.
  • the cathode may take many configurations as long as openings exist through which the argon ions can pass without striking the cathode itself.
  • the cathode may be of a screen-like mesh configuration or may be a punched sheet.
  • the enclosed chamber 11 was supplied with an argon gas of 0.1 micron pressure which was continuously pumped through the chamber, the cathode was at a potential of 1000 volts to effect the sputtering operation which was effected for about 20 minutes.
  • the quartz substrate 13 had a body centered cubic niobium film 4000 A. thick which film had a critical current of 4 amps at 42 K. in no applied magnetic field.
  • the argon system was changed so that a fresh supply was not present during the entire sputtering operation, that is a stagnant argon atmosphere of 0.1 micron, the film had a face-centered cubic structure but was superconducting.
  • a mesh cathode was constructed and placed in an apparatus like that of FIG. 1.
  • Argon was pumped through the sputtering chamber at a pressure of 0.09 micron, the cathode current was 10 milliamperes and cathode voltage was 800-1000 volts.
  • Sputtering was effected for 60 minutes using a quartz substrate on which the tantalum film was deposited.
  • the resulting thin film was superconducting at 4.2 K. with a critical current of 3.4 milliamperes in zero applied magnetic field,
  • a method of sputtering superconductive films of niobium or tantalum on to a supporting substrate comprising, positioning a perforate cathode having at least one opening the axis of which is substantially perpendicular to the substrate and which is constructed of a metal selected from the group consisting of niobium and tantalum within an enclosed chamber, providing an anode operatively spaced from the cathode, locating a suitable substrate within the enclosed chamber between the cathode and the anode, introducing a supply of argon into the enclosed chamber, and energizing the perforate cathode with direct current whereby the substrate is hit simultaneously by ionized argon and cathode metal to form a superconductive film.

Description

p 6, 1966 R. E. SKODA 3,271,285
METHOD FOR SPUTTERING NIOBIUM OR TANTALUM THIN FILMS Filed Oct. 17 1963 70 Voltage Source Hi5 A ffomey.
United rates Patent 3,271,285 METHOD FOR SPUTTERIN G NIOBIUM OR TANTALUM THIN FILMS Raymond E. Skoda, Scotia, N.Y., assignor to General Electric Company, a corporation of New York Filed Oct. 17, 1963, Ser. No. 316,917 1 Claim. (Cl. 204-492) This invention relates to sputtered metal films and more particularly to an improved sputtering process for producing superconductive films of niobium or tantalum.
In recent years, intensive investigation has been undertaken in the area of superconductivity and especially in that concerning superconductive thin films. The metals tantalum and niobium have evoked considerable interest but, unfortunately, these metals are often difficult to obtain in thin films which retain the superconductive properties of the bulk material. Among the various methods attempted to produce thin superconductive films of tantalum or niobium is cathodic sputtering. However, the process must usually utilize an asymmetric alternating current so that what is termed back sputtering from the anode is accomplished, it being felt that this back sputtering eliminates impurities from the film as it is being formed that would otherwise preclude obtainment of superconductive properties.
It is a principal object of the invention to provide an improved process for sputtering superconductive films of niobium or tantalum onto a suitable substrate.
Other objects and advantages of this invention will be in part obvious and in part explained by reference to the accompanying specification and drawings.
In the drawings:
FIG. 1 is a side elevation of one type of apparatus which can be used to carry out the process of this invention, and
FIG. 2 is a somewhat schematic illustration showing the type of cathode grid used to carry out the present process.
Generally, the process of this invention comprises locating a suitable substrate within an enclosure chamber which is connected to a source of argon. Also located within the enclosed chamber is a perforate or screen-like cathode which is positioned in operative relationship with respect to the film substrate. By providing an argon atmosphere within the enclosed chamber and activating the cathode, the cathode being constructed of either tantalum or niobium, argon atoms are ionized and directed against the surface of the cathode body. Simultaneously, some of the argon ions which miss the cathode hit the substrate and thus clean the substrate surface of impurities. Metal ions are propelled from the cathode due to the ion bombardment and some strike the substrate so that a film of metal is gradually built up. It has been found that by following this process, superconductive films of the two metals mentioned can be formed.
Referring to the drawings, the numeral indicates means defining an enclosed chamber 11. The means 10 may constitute, as shown, a simple bell jar arrangement. Within chamber 11 is located a cathode 12 which is constructed of either tantalum or niobium, a growth substrate such as quartz plate 13 and an anode 14 which is the ground return for cathode 12. It will be noted that the growth substrate 13 is located between the cathode and the anode so that ions which miss the cathode will flow toward anode 14 and strike the substrate 13.
FIG. 2 of the drawings illustrates one specific cathode construction which enables the present process to be carried out. Specifically, the cathode 12 is perforate so that it has a number of passages 15 through which argon ions may pass. The cathode may take many configurations as long as openings exist through which the argon ions can pass without striking the cathode itself. For example, the cathode may be of a screen-like mesh configuration or may be a punched sheet.
Using an apparatus similar to that shown in FIG. 1, the enclosed chamber 11 was supplied with an argon gas of 0.1 micron pressure which was continuously pumped through the chamber, the cathode was at a potential of 1000 volts to effect the sputtering operation which was effected for about 20 minutes. At the end of this time, the quartz substrate 13 had a body centered cubic niobium film 4000 A. thick which film had a critical current of 4 amps at 42 K. in no applied magnetic field. When the argon system was changed so that a fresh supply was not present during the entire sputtering operation, that is a stagnant argon atmosphere of 0.1 micron, the film had a face-centered cubic structure but was superconducting.
To test the efficacy of the process with tantalum, a mesh cathode was constructed and placed in an apparatus like that of FIG. 1. Argon was pumped through the sputtering chamber at a pressure of 0.09 micron, the cathode current was 10 milliamperes and cathode voltage was 800-1000 volts. Sputtering was effected for 60 minutes using a quartz substrate on which the tantalum film was deposited. The resulting thin film was superconducting at 4.2 K. with a critical current of 3.4 milliamperes in zero applied magnetic field,
Although the present invention has been described in connection with preferred embodiments, it is to be understood that modifications and variations may be resorted to without departing from the spirit and scope of the invention, as those skilled in the art will readily understand. Such modifications and variations are considered to be within the purview and scope of the invention and the appended claim.
What I claim as new and desire to secure by Letters Patent of the United States is:
A method of sputtering superconductive films of niobium or tantalum on to a supporting substrate comprising, positioning a perforate cathode having at least one opening the axis of which is substantially perpendicular to the substrate and which is constructed of a metal selected from the group consisting of niobium and tantalum within an enclosed chamber, providing an anode operatively spaced from the cathode, locating a suitable substrate within the enclosed chamber between the cathode and the anode, introducing a supply of argon into the enclosed chamber, and energizing the perforate cathode with direct current whereby the substrate is hit simultaneously by ionized argon and cathode metal to form a superconductive film.
References Cited by the Applicant Superconductive Films Made by Protected Sputtering of Tantalum or Niobium, Rudolph Frericks, Journal of Applied Physics, 33, 5, 1898 (1962).
JOHN H. MACK, Primary Examiner.
R. K. MIHALEK, Assistant Examiner.
US316917A 1963-10-17 1963-10-17 Method for sputtering niobium or tantalum thin films Expired - Lifetime US3271285A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US316917A US3271285A (en) 1963-10-17 1963-10-17 Method for sputtering niobium or tantalum thin films

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US316917A US3271285A (en) 1963-10-17 1963-10-17 Method for sputtering niobium or tantalum thin films

Publications (1)

Publication Number Publication Date
US3271285A true US3271285A (en) 1966-09-06

Family

ID=23231272

Family Applications (1)

Application Number Title Priority Date Filing Date
US316917A Expired - Lifetime US3271285A (en) 1963-10-17 1963-10-17 Method for sputtering niobium or tantalum thin films

Country Status (1)

Country Link
US (1) US3271285A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3325393A (en) * 1964-05-28 1967-06-13 Gen Electric Electrical discharge cleaning and coating process
US3351543A (en) * 1964-05-28 1967-11-07 Gen Electric Process of coating diamond with an adherent metal coating using cathode sputtering
US3393446A (en) * 1966-05-23 1968-07-23 Philips Corp Method for joining aluminum to metals
US3432416A (en) * 1966-10-03 1969-03-11 Gen Electric High purity niobium films formed by glow discharge cathode sputtering
US3514392A (en) * 1968-03-18 1970-05-26 Automatic Fire Control Inc Ion plating anode source

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
None *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3325393A (en) * 1964-05-28 1967-06-13 Gen Electric Electrical discharge cleaning and coating process
US3351543A (en) * 1964-05-28 1967-11-07 Gen Electric Process of coating diamond with an adherent metal coating using cathode sputtering
US3393446A (en) * 1966-05-23 1968-07-23 Philips Corp Method for joining aluminum to metals
US3432416A (en) * 1966-10-03 1969-03-11 Gen Electric High purity niobium films formed by glow discharge cathode sputtering
US3514392A (en) * 1968-03-18 1970-05-26 Automatic Fire Control Inc Ion plating anode source

Similar Documents

Publication Publication Date Title
KR960002632B1 (en) The method and the equipment for plasma-energized magnetron sputtering vapor deposition
EP0489239B1 (en) Sputtering apparatus with magnetron cathodes for coating of substrates
EP0478909B1 (en) Process and apparatus for obtaining a diamondlayer
AU746645C (en) Method and apparatus for deposition of biaxially textured coatings
Anders et al. S-shaped magnetic macroparticle filter for cathodic arc deposition
WO2004031441A1 (en) Device for carrying out a plasma-assisted process
DE2823876A1 (en) PROCESS FOR EVAPORATING MATERIAL IN A VACUUM EVAPORATION SYSTEM
DE3912572A1 (en) SPRAYING DEVICE
DE3543316A1 (en) Process for the reactive vapour deposition of layers of oxides, nitrides, oxynitrides and carbides
US3616402A (en) Sputtering method and apparatus
US3330752A (en) Method and apparatus for cathode sputtering including suppressing temperature rise adjacent the anode using a localized magnetic field
US3271285A (en) Method for sputtering niobium or tantalum thin films
DE112009003766T5 (en) Sputtering device and sputtering method
DE10196150T5 (en) Magnetron sputtering
EP1485516B1 (en) Method for formation of titanium nitride films
KR0178555B1 (en) Magnetron sputter coating method and apparatus with rotating magnet cathode
DE112008004247T5 (en) Arc evaporator and method for operating the evaporator
EP0867036B1 (en) Method and device for pre-treatment of substrates
Karulkar et al. Fabrication of Nb‐NbO x‐Pb Josephson tunnel junctions using rf glow‐discharge oxidation
Dhariwal et al. In situ ion etching in a scanning electron microscope
JPS61183466A (en) Counter target type sputtering device
Mattox Design considerations for ion plating
GB2393321A (en) Plasma generation
JPS582589B2 (en) sputtering equipment
DE2608323A1 (en) High vacuum sputtering of dielectric material - bonded to its carrier by adhesive contg. metal powder to improve heat transfer