US20150027532A1 - Solar cell, solar cell module and method of manufacturing solar cell - Google Patents
Solar cell, solar cell module and method of manufacturing solar cell Download PDFInfo
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- US20150027532A1 US20150027532A1 US14/453,769 US201414453769A US2015027532A1 US 20150027532 A1 US20150027532 A1 US 20150027532A1 US 201414453769 A US201414453769 A US 201414453769A US 2015027532 A1 US2015027532 A1 US 2015027532A1
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- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 238000006243 chemical reaction Methods 0.000 claims abstract description 26
- 239000004065 semiconductor Substances 0.000 claims description 85
- 229920005989 resin Polymers 0.000 claims description 22
- 239000011347 resin Substances 0.000 claims description 22
- 239000000758 substrate Substances 0.000 claims description 17
- 238000007747 plating Methods 0.000 claims description 15
- 239000008393 encapsulating agent Substances 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 10
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 7
- 239000003822 epoxy resin Substances 0.000 claims description 3
- 229920000647 polyepoxide Polymers 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 7
- 230000003667 anti-reflective effect Effects 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- 238000010248 power generation Methods 0.000 description 5
- 239000005038 ethylene vinyl acetate Substances 0.000 description 4
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 4
- 238000005215 recombination Methods 0.000 description 4
- 230000006798 recombination Effects 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 2
- -1 polyethylene Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02366—Special surface textures of the substrate or of a layer on the substrate, e.g. textured ITO/glass substrate or superstrate, textured polymer layer on glass substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/022441—Electrode arrangements specially adapted for back-contact solar cells
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
- H01L31/03529—Shape of the potential jump barrier or surface barrier
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0376—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including amorphous semiconductors
- H01L31/03762—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including amorphous semiconductors including only elements of Group IV of the Periodic System
-
- H—ELECTRICITY
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/068—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
-
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- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/068—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
- H01L31/0682—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells back-junction, i.e. rearside emitter, solar cells, e.g. interdigitated base-emitter regions back-junction cells
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- H—ELECTRICITY
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/072—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type
- H01L31/0745—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type comprising a AIVBIV heterojunction, e.g. Si/Ge, SiGe/Si or Si/SiC solar cells
- H01L31/0747—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type comprising a AIVBIV heterojunction, e.g. Si/Ge, SiGe/Si or Si/SiC solar cells comprising a heterojunction of crystalline and amorphous materials, e.g. heterojunction with intrinsic thin layer or HIT® solar cells; solar cells
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic System
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- This disclosure relates to a solar cell, a solar cell module and a method of manufacturing a solar cell.
- a back contact solar cell has been known as a solar cell achieving improved photoelectric conversion efficiency (for example, see Patent Document 1).
- Patent Document 1 Japanese Patent Application Publication No. 2005-101151
- An embodiment of the invention has an objective to provide a solar cell with improved photoelectric conversion efficiency.
- a first aspect of the invention is a solar cell including a photoelectric conversion body, a p-side electrode, an n-side electrode, and an insulating layer.
- the photoelectric conversion body includes a p-type surface and an n-type surface in one principal surface.
- the p-side electrode is disposed on the p-type surface.
- the n-side electrode is disposed on the n-type surface.
- the insulating layer is disposed between the p-side electrode and the n-side electrode. A surface of the insulating layer has a convex shape.
- a second aspect of the invention is a solar cell module.
- the solar cell module includes the solar cell of the first aspect and a resin encapsulant.
- the resin encapsulant seals the solar cell.
- the insulating layer contains a resin.
- a third aspect of the invention is a method of manufacturing a solar cell.
- the method of manufacturing a solar cell includes: preparing a photoelectric conversion body including one principal surface provided with a p-type surface and an n-type surface; forming an insulating layer on a border portion between the p-type surface and the n-type surface in the one principal surface of the photoelectric conversion body in such a way that an exposed portion of the p-type surface and an exposed portion of the n-type surface are defined by the insulating layer; and after forming the insulating layer, forming a p-side electrode on the p-type surface and an n-side electrode on the n-type surface concurrently by plating.
- a solar cell with improved photoelectric conversion efficiency can be provided.
- FIG. 1 is a schematic cross sectional diagram of a solar cell according to a first embodiment.
- FIG. 2 is a schematic cross sectional diagram of a solar cell module according to the first embodiment.
- FIG. 3 is a schematic cross sectional diagram of a solar cell according to a second embodiment.
- FIG. 4 is a schematic cross sectional diagram of a solar cell according to a third embodiment.
- FIG. 5 is an exemplary cross sectional diagram of multiple solar cells stacked in the third embodiment.
- FIG. 6 is a schematic cross sectional diagram of a solar cell according to a fourth embodiment.
- solar cell 1 a includes photoelectric conversion body 10 having light-receiving surface 10 a and back surface 10 b.
- Photoelectric conversion body 10 includes substrate 11 .
- Substrate 11 is made of a semiconductor material.
- Substrate 11 may be made of a crystalline semiconductor such as crystalline silicon, for example, or the like.
- Substrate 11 has one conductivity type. Specifically, in the present embodiment, description is provided for an example where the conductivity type of substrate 11 is n-type.
- Semiconductor layer 12 n made of an n-type semiconductor which is of the same conductivity type as substrate 11 is disposed on first principal surface 11 a located on a light-receiving surface 10 a side of substrate 11 .
- First principal surface 11 a is substantially entirely covered with semiconductor layer 12 n.
- Semiconductor layer 12 n may be made of n-type amorphous silicon or the like.
- the thickness of semiconductor layer 12 n may be about 1 nm to 10 nm, for example.
- a semiconductor layer made of a substantially-intrinsic i-type semiconductor may be provided between semiconductor layer 12 n and first principal surface 11 a.
- the semiconductor layer has a thickness of about several ⁇ to 250 ⁇ , for example, with which the semiconductor layer cannot substantially contribute to power generation.
- Anti-reflective layer 13 is disposed on a surface of semiconductor layer 12 n on the opposite side from substrate 11 .
- Anti-reflective layer 13 has both a function to inhibit reflection and a function as a protective film.
- Anti-reflective layer 13 constitutes light-receiving surface 10 a of photoelectric conversion body 10 .
- Anti-reflective layer 13 may be made of, for example, silicon nitride or the like.
- the thickness of anti-reflective layer 13 can be set as needed depending on a factor such as the wavelength of light whose reflection is to be inhibited.
- the thickness of anti-reflective layer 13 may be, for example, about 50 nm to 200 nm.
- Semiconductor layer 14 p made of a p-type semiconductor which is of a conductivity type different from substrate 11 is disposed on a portion of second principal surface 11 b of substrate 11 .
- Semiconductor layer 15 n made of an n-type semiconductor which is of the same conductivity type as substrate 11 is disposed on at least part of the other portion of second principal surface 11 b of substrate 11 where no semiconductor layer 14 p is disposed.
- second principal surface 11 b is substantially entirely covered with semiconductor layer 14 p and semiconductor layer 15 n.
- Semiconductor layer 14 p and semiconductor layer 15 n maybe made of materials such as p-type amorphous silicon and n-type amorphous silicon, respectively.
- Semiconductor layer 14 p and semiconductor layer 15 n constitute back surface 10 b of photoelectric conversion body 10 .
- Semiconductor layer 14 p constitutes p-type surface 10 bp
- semiconductor layer 15 n constitutes n-type surface 10 bn.
- the thickness of semiconductor layer 14 p may be about 2 nm to 20 nm, for example.
- the thickness of semiconductor layer 15 n may be about 5 nm to 50 nm, for example.
- a semiconductor layer made of a substantially-intrinsic i-type semiconductor may be provided between semiconductor layer 14 p and second principal surface 11 b. This semiconductor layer has a thickness of about several ⁇ to 250 ⁇ , for example, with which the semiconductor layer cannot substantially contribute to power generation.
- a semiconductor layer made of a substantially-intrinsic i-type semiconductor may be provided between semiconductor layer 15 n and second principal surface 11 b. This semiconductor layer has a thickness of about several ⁇ to 250 ⁇ , for example, with which the semiconductor layer cannot substantially contribute to power generation.
- Such semiconductor layers made of substantially-intrinsic i-type semiconductors may be made of amorphous silicon or the like.
- Insulating layer 16 is disposed between the end portions of semiconductor layer 14 p and semiconductor layer 15 n.
- Insulating layer 16 maybe made of, for example, silicon nitride, silicon oxide or the like.
- First seed layer 17 is disposed on semiconductor layer 14 p.
- First seed layer 17 is a layer having a function as a seed to form p-side electrode 21 p by plating as described later.
- second seed layer 18 is disposed on semiconductor layer 15 n.
- Second seed layer 18 is a layer having a function as a seed to form n-side electrode 22 n by plating as described later.
- First and second seed layers 17 , 18 may be each made of transparent conductive oxide such as indium tin oxide (ITO) or at least one kind of metal such as Cu or Ag.
- Each of first and second seed layers 17 , 18 may be formed of a multilayer including a transparent conductive oxide layer and a metal layer disposed on the transparent conductive oxide layer, for example.
- the thickness of each of first and second seed layers 17 , 18 may be about 0.1 ⁇ m to 1.0 ⁇ m.
- P-side electrode 21 p to collect positive holes is disposed on first seed layer 17 disposed on p-type surface 10 bp.
- P-side electrode 21 p is electrically connected to p-type surface 10 bp via first seed layer 17 .
- n-side electrode 22 n to collect electrons is disposed on second seed layer 18 disposed on n-type surface 10 bn.
- N-side electrode 22 n is electrically connected to n-type surface 10 bn via second seed layer 18 .
- p-side electrode 21 p may be disposed directly on p-type surface 10 bp
- n-side electrode 22 n may be disposed directly on n-type surface 10 bn.
- Each of p-side electrode 21 p and n-side electrode 22 n may preferably include a plating film, or may be more preferably formed of a plating film.
- each of p-side electrode 21 p and n-side electrode 22 n may be formed of a laminate of two or more plating films.
- each of p-side electrode 21 p and n-side electrode 22 n may be formed of a multilayer of a first plating film made of Cu and a second plating film made of Sn, for example.
- each of p-side electrode 21 p and n-side electrode 22 n may be about 20 ⁇ m to 30 ⁇ m.
- Insulating layer 23 is disposed between p-side electrode 21 p and n-side electrode 22 n in a planar direction of back surface 10 b of photoelectric conversion body 10 .
- Surface 23 a of insulating layer 23 has a convex shape. In other words, the cross-sectional shape of insulating layer 23 is a dome shape.
- Insulating layer 23 is provided between and on top of end portions of first seed layer 17 and second seed layer 18 which are neighboring in the x-axis direction. Insulating layer 23 is embedded between first seed layer 17 and p-side electrode 21 p and between second seed layer 18 and n-side electrode 22 n.
- Insulating layer 23 may be made of an inorganic insulating material such as silicon oxide or silicon nitride, for example, but maybe preferably made of an organic insulating material such as an epoxy resin, an acrylic resin or a urethane resin, for example, and more preferably made of a plating resist made of a resist material containing an epoxy resin.
- an inorganic insulating material such as silicon oxide or silicon nitride
- an organic insulating material such as an epoxy resin, an acrylic resin or a urethane resin, for example, and more preferably made of a plating resist made of a resist material containing an epoxy resin.
- first seed layer 17 is formed on p-type surface 10 bp and second seed layer 18 is formed on n-type surface 10 bn.
- First and second seed layers 17 , 18 may be formed by, for example, sputtering, a CVD (Chemical Vapor Deposition) technique, or the like.
- insulating layer 23 is formed. Specifically, insulating layer 23 having convex-shaped surface 23 a is formed on each boundary portion between p-type surface 10 bp and n-type surface 10 bn of back surface 10 b of photoelectric conversion body 10 in such a manner that an exposed portion of p-type surface 10 bp and an exposed portion of n-type surface 10 bn are defined by insulating layer 23 .
- a method of forming insulating layer 23 is not particularly limited. For example, in the case where insulating layer 23 is made of an organic insulating material, insulating layer 23 may be formed by, for example, a screen printing method, an inkjet method, a photolithography method, or the like.
- p-side electrode 21 p is formed on p-type surface 10 bp and n-side electrode 22 n is formed on n-type surface 10 bn, concurrently.
- insulating layer 23 it is preferable to form insulating layer 23 by using a plating resist.
- insulating layer 23 disposed between p-side electrode 21 p and n-side electrode 22 n has convex-shaped surface 23 a. This makes it possible to secure a long distance on back surface 10 b between p-side electrode 21 p and n-side electrode 22 n. Thus, even if the distance in the x-axis direction between p-side electrode 21 p and n-side electrode 22 n is set short, high insulating resistance between p-side electrode 21 p and n-side electrode 22 n can be achieved. This enables achievement of improved photoelectric conversion efficiency.
- the electrodes is formed over an area wider than the seed layers, and the p-side and n-side electrodes may come into contact with each other in some cases. To prevent contact between the p-side electrode and the n-side electrode, a large distance needs to be secured between the first seed layer and the second seed layer.
- the present embodiment since the present embodiment has insulating layer 23 provided, the distance between first seed layer 17 and second seed layer 18 can be made short because p-side electrode 21 p and n-side electrode 22 n are kept from contacting each other.
- the convex shape of surface 23 a of insulating layer 23 more effectively keeps p-side electrode 21 p and n-side electrode 22 n from contacting each other, and enables a much shorter distance between first seed layer 17 and second seed layer 18 . Accordingly, more improved photoelectric conversion efficiency can be achieved.
- insulating layer 23 by using a plating resist more effectively keeps p-side electrode 21 p and n-side electrode 22 n from contacting each other, and enables a much shorter distance between first seed layer 17 and second seed layer 18 . Accordingly, more improved photoelectric conversion efficiency can be achieved.
- Insulating layer 23 is provided between and on first seed layer 17 and second seed layer 18 .
- a width of insulating layer 23 on the surface plane of first seed layer 17 and second seed layer 18 is longer than a width insulating layer 23 on the surface plane of semiconductor layer 14 p and semiconductor layer 15 n. For this reason, insulating layer 23 can inhibit first and second seed layers 17 , 18 from peeling off from photoelectric conversion body 10 .
- FIG. 2 is a schematic cross-sectional diagram of a solar cell module in the first embodiment.
- solar cell module 2 includes solar cell 1 a.
- Solar cell la is sealed by resin encapsulant 30 .
- Light-receiving surface member 31 is provided on a light-receiving surface 10 a side of resin encapsulant 30 .
- back surface member 32 is provided on a back surface 10 b side of resin encapsulant 30 .
- resin encapsulant 30 can more suitably seal solar cell 1 a, and can inhibit moisture or the like from reaching solar cell 1 a.
- the adhesive strength between insulating layer 23 and resin encapsulant 30 is 75 N, and the adhesive strength between semiconductor layer 14 p and insulating layer 23 is 75 N or higher.
- solar cell module 2 is configured such that semiconductor layer 14 p and resin encapsulant 30 adhere to each other. In this case, the adhesive strength between semiconductor layer 14 p and resin encapsulant 30 is 42 N.
- insulating layer 23 leads to an increase in the adhesive strength between semiconductor layer 14 p and resin encapsulant 30 , and therefore makes it possible to inhibit entry of moisture or the like.
- the adhesive strengths presented above were each measured by a test of tensile strength between the two kinds of layers.
- resin encapsulant 30 may be made of a resin such for example as ethylene-vinyl acetate copolymer (EVA), polyvinyl butyral (PVB), polyethylene (PE), or polyurethane (PU).
- EVA ethylene-vinyl acetate copolymer
- PVB polyvinyl butyral
- PE polyethylene
- PU polyurethane
- Light-receiving surface member 31 may be formed of, for example, a translucent or transparent glass plate, plastic plate or the like.
- Back surface member 32 may be formed of, for example, a resin film such as a polyethylene terephthalate (PET) film, a multilayer film in which a metal foil such as an Al foil is inserted between stacked resin films, a steel sheet, or the like.
- PET polyethylene terephthalate
- FIG. 3 is a schematic cross sectional diagram of solar cell 1 b in a second embodiment. As illustrated in FIG. 3 , solar cell 1 b in the second embodiment is different from solar cell 1 a in the first embodiment in term of the configuration of photoelectric conversion body 10 . The configuration of photoelectric conversion body 10 in the present embodiment is described below.
- Semiconductor layer 14 i made of a substantially-intrinsic i-type semiconductor is provided between substrate 11 and semiconductor layer 14 p.
- Semiconductor layer 14 i has a thickness of about several ⁇ to 250 ⁇ , for example, with which semiconductor layer 14 i cannot substantially contribute to power generation.
- Semiconductor layer 15 i made of a substantially-intrinsic i-type semiconductor is provided between substrate 11 and semiconductor layer 15 n.
- Semiconductor layer 15 i has a thickness of about several ⁇ to 250 ⁇ , for example, with which semiconductor layer 15 i cannot substantially contribute to power generation.
- Semiconductor layer 14 i and semiconductor layer 14 p are provided so as to substantially entirely cover second principal surface 11 b including a portion above semiconductor layer 15 n. Thus, Semiconductor layer 14 i and semiconductor layer 14 p are also provided above semiconductor layer 15 n. Recombination layer 19 is provided between semiconductor layer 15 n and semiconductor layer 14 p. In this way, another semiconductor layer maybe further provided on n-type surface 10 bn constituted by semiconductor layer 15 n.
- Electric charges collected on p-type surface 10 bp are extracted from p-side electrode 21 p in direct contact with semiconductor layer 14 p as in the case of the first embodiment.
- electrons collected on n-type surface 10 bn are extracted from n-side electrode 22 n via recombination layer 19 , semiconductor layer 14 i, and semiconductor layer 14 p
- Recombination layer 19 may be made of a material such as a semiconductor material in which many midgap levels exist in energy bands, or a metallic material capable of coming in ohmic contact with a p-type semiconductor layer. The selection of such a material makes it possible to reduce a loss of electrons extracted from n-side electrode 22 n. More specifically, recombination layer 19 may be made of, for example, p-type or n-type amorphous silicon, p-type or n-type microcrystalline silicon, or the like.
- P-type surface 10 bp and n-type surface 10 bn are connected with semiconductor layer 14 i and semiconductor layer 14 p interposed in between.
- semiconductor layer 14 i and semiconductor layer 14 p have such small film thicknesses as to have high resistance that allows only a small current to flow.
- This configuration enables generated electric current to be efficiently extracted from p-side electrode 21 p and n-side electrode 22 n without needing the processes of forming semiconductor layer 14 i and semiconductor layer 14 p.
- solar cell 1 b can produce the same effects as solar cell 1 a.
- solar cell 1 b does not need a patterning process of semiconductor layer 14 p and the like. Accordingly, the manufacturing cost can be reduced.
- FIG. 4 is a schematic cross sectional diagram of solar cell 1 c according to a third embodiment.
- solar cell 1 c includes insulating layer 23 protruding from p-side electrode 21 p and n-side electrode 22 n.
- Insulating layer 23 is made of an elastic body such as a resin. For this reason, if multiple solar cells 1 c are stacked as illustrated in FIG. 5 , only insulating layers 23 made of the elastic bodies contact neighboring solar cells 1 c. The parts of solar cells 1 c other than insulating layers 23 are kept from contacting neighboring solar cells 1 c. This inhibits solar cells 1 c from being damaged even if solar cells 1 c are stacked without resin sheets or the like inserted therebetween. As a result, solar cells 1 c are easy to store, which enables reduction in the manufacturing costs for solar cell module 2 as well.
- all insulating layers 23 do not necessarily have to protrude from p-side electrode 21 p and n-side electrode 22 n, but only some of insulating layers 23 may protrude from p-side electrode 21 p and n-side electrode 22 n.
- FIG. 6 is a schematic cross sectional diagram of solar cell 1 d according to a fourth embodiment.
- insulating layer 23 is formed before the formation of p-side electrode 21 p and n-side electrode 22 n.
- insulating layer 23 is formed after the formation of p-side electrode 21 p and n-side electrode 22 n. Even in this case, the same effects as those described in the third embodiment can be obtained.
Abstract
Description
- This application is a continuation application of International Application No. PCT/JP2012/081086, filed on Nov. 30, 2012, entitled “SOLAR CELL, SOLAR CELL MODULE AND METHOD OF MANUFACTURING SOLAR CELL”, which claims priority from prior Japanese Patent Applications No. 2011-0264659 filed on Dec. 02, 2011 and No. 2012-031464 filed on Feb. 16, 2012, the entire contents of which are incorporated herein by reference.
- 1. Field of the Invention
- This disclosure relates to a solar cell, a solar cell module and a method of manufacturing a solar cell.
- 2. Description of Related Art
- Heretofore, a back contact solar cell has been known as a solar cell achieving improved photoelectric conversion efficiency (for example, see Patent Document 1).
- Patent Document 1: Japanese Patent Application Publication No. 2005-101151
- In recent years, there has been a demand for further improvement in photoelectric conversion efficiency of back contact solar cells.
- An embodiment of the invention has an objective to provide a solar cell with improved photoelectric conversion efficiency.
- A first aspect of the invention is a solar cell including a photoelectric conversion body, a p-side electrode, an n-side electrode, and an insulating layer. The photoelectric conversion body includes a p-type surface and an n-type surface in one principal surface. The p-side electrode is disposed on the p-type surface. The n-side electrode is disposed on the n-type surface. The insulating layer is disposed between the p-side electrode and the n-side electrode. A surface of the insulating layer has a convex shape.
- A second aspect of the invention is a solar cell module. The solar cell module includes the solar cell of the first aspect and a resin encapsulant. The resin encapsulant seals the solar cell. The insulating layer contains a resin.
- A third aspect of the invention is a method of manufacturing a solar cell. The method of manufacturing a solar cell includes: preparing a photoelectric conversion body including one principal surface provided with a p-type surface and an n-type surface; forming an insulating layer on a border portion between the p-type surface and the n-type surface in the one principal surface of the photoelectric conversion body in such a way that an exposed portion of the p-type surface and an exposed portion of the n-type surface are defined by the insulating layer; and after forming the insulating layer, forming a p-side electrode on the p-type surface and an n-side electrode on the n-type surface concurrently by plating.
- According to the first aspect of the invention, a solar cell with improved photoelectric conversion efficiency can be provided.
-
FIG. 1 is a schematic cross sectional diagram of a solar cell according to a first embodiment. -
FIG. 2 is a schematic cross sectional diagram of a solar cell module according to the first embodiment. -
FIG. 3 is a schematic cross sectional diagram of a solar cell according to a second embodiment. -
FIG. 4 is a schematic cross sectional diagram of a solar cell according to a third embodiment. -
FIG. 5 is an exemplary cross sectional diagram of multiple solar cells stacked in the third embodiment. -
FIG. 6 is a schematic cross sectional diagram of a solar cell according to a fourth embodiment. - Hereinafter, examples of preferred embodiments carrying out the invention are described. It should be noted that the following embodiments are provided just for illustrative purposes. The invention should not be limited at all to the following embodiments.
- In the drawings referred to in the embodiments and other parts, components having substantially the same function are referred to with the same reference numeral. In addition, the drawings referred to in the embodiments and other parts are illustrated just schematically, and the dimensional ratio and the like of objects depicted in the drawings are different from those of the actual ones in some cases. The dimensional ratio and the like of objects are also different among the drawings in some cases. The specific dimensional ratio and the like of objects should be determined with the following description taken into consideration.
- (Configuration of Solar Cell 1 a)
- As illustrated in
FIG. 1 , solar cell 1 a includesphotoelectric conversion body 10 having light-receivingsurface 10 a andback surface 10 b.Photoelectric conversion body 10 includessubstrate 11.Substrate 11 is made of a semiconductor material.Substrate 11 may be made of a crystalline semiconductor such as crystalline silicon, for example, or the like.Substrate 11 has one conductivity type. Specifically, in the present embodiment, description is provided for an example where the conductivity type ofsubstrate 11 is n-type. -
Semiconductor layer 12 n made of an n-type semiconductor which is of the same conductivity type assubstrate 11 is disposed on firstprincipal surface 11 a located on a light-receivingsurface 10 a side ofsubstrate 11. Firstprincipal surface 11 a is substantially entirely covered withsemiconductor layer 12 n.Semiconductor layer 12 n may be made of n-type amorphous silicon or the like. The thickness ofsemiconductor layer 12 n may be about 1 nm to 10 nm, for example. - Here, a semiconductor layer made of a substantially-intrinsic i-type semiconductor may be provided between
semiconductor layer 12 n and firstprincipal surface 11 a. The semiconductor layer has a thickness of about several Å to 250 Å, for example, with which the semiconductor layer cannot substantially contribute to power generation. -
Anti-reflective layer 13 is disposed on a surface ofsemiconductor layer 12 n on the opposite side fromsubstrate 11.Anti-reflective layer 13 has both a function to inhibit reflection and a function as a protective film.Anti-reflective layer 13 constitutes light-receivingsurface 10 a ofphotoelectric conversion body 10.Anti-reflective layer 13 may be made of, for example, silicon nitride or the like. Here, the thickness ofanti-reflective layer 13 can be set as needed depending on a factor such as the wavelength of light whose reflection is to be inhibited. The thickness ofanti-reflective layer 13 may be, for example, about 50 nm to 200 nm. -
Semiconductor layer 14 p made of a p-type semiconductor which is of a conductivity type different fromsubstrate 11 is disposed on a portion of secondprincipal surface 11 b ofsubstrate 11. Semiconductor layer 15 n made of an n-type semiconductor which is of the same conductivity type assubstrate 11 is disposed on at least part of the other portion of secondprincipal surface 11 b ofsubstrate 11 where nosemiconductor layer 14 p is disposed. In this embodiment, secondprincipal surface 11 b is substantially entirely covered withsemiconductor layer 14 p and semiconductor layer 15 n.Semiconductor layer 14 p and semiconductor layer 15 n maybe made of materials such as p-type amorphous silicon and n-type amorphous silicon, respectively. -
Semiconductor layer 14 p and semiconductor layer 15 n constitute backsurface 10 b ofphotoelectric conversion body 10.Semiconductor layer 14 p constitutes p-type surface 10 bp, whereas semiconductor layer 15 n constitutes n-type surface 10 bn. - The thickness of
semiconductor layer 14 p may be about 2 nm to 20 nm, for example. The thickness of semiconductor layer 15 n may be about 5 nm to 50 nm, for example. Here, a semiconductor layer made of a substantially-intrinsic i-type semiconductor may be provided betweensemiconductor layer 14 p and secondprincipal surface 11 b. This semiconductor layer has a thickness of about several Å to 250 Å, for example, with which the semiconductor layer cannot substantially contribute to power generation. Similarly, a semiconductor layer made of a substantially-intrinsic i-type semiconductor may be provided between semiconductor layer 15 n and secondprincipal surface 11 b. This semiconductor layer has a thickness of about several Å to 250 Å, for example, with which the semiconductor layer cannot substantially contribute to power generation. Such semiconductor layers made of substantially-intrinsic i-type semiconductors may be made of amorphous silicon or the like. - End portions of
semiconductor layer 14 p in an x axial direction overlap semiconductor layer 15 n in a thickness direction z. Insulatinglayer 16 is disposed between the end portions ofsemiconductor layer 14 p and semiconductor layer 15 n. Insulatinglayer 16 maybe made of, for example, silicon nitride, silicon oxide or the like. -
First seed layer 17 is disposed onsemiconductor layer 14 p.First seed layer 17 is a layer having a function as a seed to form p-side electrode 21 p by plating as described later. On the other hand,second seed layer 18 is disposed on semiconductor layer 15 n.Second seed layer 18 is a layer having a function as a seed to form n-side electrode 22 n by plating as described later. First and second seed layers 17, 18 may be each made of transparent conductive oxide such as indium tin oxide (ITO) or at least one kind of metal such as Cu or Ag. Each of first and second seed layers 17, 18 may be formed of a multilayer including a transparent conductive oxide layer and a metal layer disposed on the transparent conductive oxide layer, for example. The thickness of each of first and second seed layers 17, 18 may be about 0.1 μm to 1.0 μm. - P-
side electrode 21 p to collect positive holes is disposed onfirst seed layer 17 disposed on p-type surface 10 bp. P-side electrode 21 p is electrically connected to p-type surface 10 bp viafirst seed layer 17. On the other hand, n-side electrode 22 n to collect electrons is disposed onsecond seed layer 18 disposed on n-type surface 10 bn. N-side electrode 22 n is electrically connected to n-type surface 10 bn viasecond seed layer 18. Here, p-side electrode 21 p may be disposed directly on p-type surface 10 bp, while n-side electrode 22 n may be disposed directly on n-type surface 10 bn. - Each of p-
side electrode 21 p and n-side electrode 22 n may preferably include a plating film, or may be more preferably formed of a plating film. For example, each of p-side electrode 21 p and n-side electrode 22 n may be formed of a laminate of two or more plating films. Specifically, each of p-side electrode 21 p and n-side electrode 22 n may be formed of a multilayer of a first plating film made of Cu and a second plating film made of Sn, for example. - The thickness of each of p-
side electrode 21 p and n-side electrode 22 n may be about 20 μm to 30 μm. - Insulating
layer 23 is disposed between p-side electrode 21 p and n-side electrode 22 n in a planar direction ofback surface 10 b ofphotoelectric conversion body 10.Surface 23 a of insulatinglayer 23 has a convex shape. In other words, the cross-sectional shape of insulatinglayer 23 is a dome shape. Insulatinglayer 23 is provided between and on top of end portions offirst seed layer 17 andsecond seed layer 18 which are neighboring in the x-axis direction. Insulatinglayer 23 is embedded betweenfirst seed layer 17 and p-side electrode 21 p and betweensecond seed layer 18 and n-side electrode 22 n. - Insulating
layer 23 may be made of an inorganic insulating material such as silicon oxide or silicon nitride, for example, but maybe preferably made of an organic insulating material such as an epoxy resin, an acrylic resin or a urethane resin, for example, and more preferably made of a plating resist made of a resist material containing an epoxy resin. - (Method of Manufacturing Solar Cell 1 a)
- Next, an example of a method of manufacturing a solar cell 1 a is described.
- Firstly,
photoelectric conversion body 10 is prepared. Then,first seed layer 17 is formed on p-type surface 10 bp andsecond seed layer 18 is formed on n-type surface 10 bn. First and second seed layers 17, 18 may be formed by, for example, sputtering, a CVD (Chemical Vapor Deposition) technique, or the like. - Next, insulating
layer 23 is formed. Specifically, insulatinglayer 23 having convex-shapedsurface 23 a is formed on each boundary portion between p-type surface 10 bp and n-type surface 10 bn ofback surface 10 b ofphotoelectric conversion body 10 in such a manner that an exposed portion of p-type surface 10 bp and an exposed portion of n-type surface 10 bn are defined by insulatinglayer 23. A method of forming insulatinglayer 23 is not particularly limited. For example, in the case where insulatinglayer 23 is made of an organic insulating material, insulatinglayer 23 may be formed by, for example, a screen printing method, an inkjet method, a photolithography method, or the like. - Subsequently, by plating such as electroplating, p-
side electrode 21 p is formed on p-type surface 10 bp and n-side electrode 22 n is formed on n-type surface 10 bn, concurrently. Here, in order to keep p-side electrode 21 p and n-side electrode 22 n from being in contact with each other on insulatinglayer 23, it is preferable to form insulatinglayer 23 by using a plating resist. - As has been described above, in solar cell 1 a, insulating
layer 23 disposed between p-side electrode 21 p and n-side electrode 22 n has convex-shapedsurface 23 a. This makes it possible to secure a long distance onback surface 10 b between p-side electrode 21 p and n-side electrode 22 n. Thus, even if the distance in the x-axis direction between p-side electrode 21 p and n-side electrode 22 n is set short, high insulating resistance between p-side electrode 21 p and n-side electrode 22 n can be achieved. This enables achievement of improved photoelectric conversion efficiency. - In addition, if no insulating
layer 23 is provided and then a p-side electrode and an n-side electrode are formed by plating, the electrodes is formed over an area wider than the seed layers, and the p-side and n-side electrodes may come into contact with each other in some cases. To prevent contact between the p-side electrode and the n-side electrode, a large distance needs to be secured between the first seed layer and the second seed layer. - In contrast, since the present embodiment has insulating
layer 23 provided, the distance betweenfirst seed layer 17 andsecond seed layer 18 can be made short because p-side electrode 21 p and n-side electrode 22 n are kept from contacting each other. The convex shape ofsurface 23 a of insulatinglayer 23 more effectively keeps p-side electrode 21 p and n-side electrode 22 n from contacting each other, and enables a much shorter distance betweenfirst seed layer 17 andsecond seed layer 18. Accordingly, more improved photoelectric conversion efficiency can be achieved. - Moreover, the formation of insulating
layer 23 by using a plating resist more effectively keeps p-side electrode 21 p and n-side electrode 22 n from contacting each other, and enables a much shorter distance betweenfirst seed layer 17 andsecond seed layer 18. Accordingly, more improved photoelectric conversion efficiency can be achieved. - Insulating
layer 23 is provided between and onfirst seed layer 17 andsecond seed layer 18. Here, a width of insulatinglayer 23 on the surface plane offirst seed layer 17 andsecond seed layer 18 is longer than awidth insulating layer 23 on the surface plane ofsemiconductor layer 14 p and semiconductor layer 15 n. For this reason, insulatinglayer 23 can inhibit first and second seed layers 17, 18 from peeling off fromphotoelectric conversion body 10. -
FIG. 2 is a schematic cross-sectional diagram of a solar cell module in the first embodiment. As illustrated inFIG. 2 , solar cell module 2 includes solar cell 1 a. Solar cell la is sealed byresin encapsulant 30. Light-receivingsurface member 31 is provided on a light-receivingsurface 10 a side ofresin encapsulant 30. On the other hand, backsurface member 32 is provided on aback surface 10 b side ofresin encapsulant 30. - When insulating
layer 23 contains a resin, the adherence between insulatinglayer 23 andresin encapsulant 30 is high. For this reason,resin encapsulant 30 can more suitably seal solar cell 1 a, and can inhibit moisture or the like from reaching solar cell 1 a. - To be more specific, in the case where a resist material containing an epoxy material in an amount of 30% is used for insulating
layer 23 and an ethylene-vinyl acetate copolymer (EVA) is used forresin encapsulant 30, the adhesive strength between insulatinglayer 23 andresin encapsulant 30 is 75 N, and the adhesive strength betweensemiconductor layer 14 p and insulatinglayer 23 is 75 N or higher. On the other hand, if a solar cell has no insulatinglayer 23, solar cell module 2 is configured such thatsemiconductor layer 14 p andresin encapsulant 30 adhere to each other. In this case, the adhesive strength betweensemiconductor layer 14 p andresin encapsulant 30 is 42 N. Based on the above results, it is found that the provision of insulatinglayer 23 leads to an increase in the adhesive strength betweensemiconductor layer 14 p andresin encapsulant 30, and therefore makes it possible to inhibit entry of moisture or the like. Incidentally, the adhesive strengths presented above were each measured by a test of tensile strength between the two kinds of layers. - Note that
resin encapsulant 30 may be made of a resin such for example as ethylene-vinyl acetate copolymer (EVA), polyvinyl butyral (PVB), polyethylene (PE), or polyurethane (PU). Light-receivingsurface member 31 may be formed of, for example, a translucent or transparent glass plate, plastic plate or the like. Backsurface member 32 may be formed of, for example, a resin film such as a polyethylene terephthalate (PET) film, a multilayer film in which a metal foil such as an Al foil is inserted between stacked resin films, a steel sheet, or the like. - Hereinafter, other preferable embodiments of the invention are described. In the following description, components having substantially the same functions as those in the foregoing first embodiment are referred to with the same reference numerals, and the explanation thereof is omitted.
-
FIG. 3 is a schematic cross sectional diagram ofsolar cell 1 b in a second embodiment. As illustrated inFIG. 3 ,solar cell 1 b in the second embodiment is different from solar cell 1 a in the first embodiment in term of the configuration ofphotoelectric conversion body 10. The configuration ofphotoelectric conversion body 10 in the present embodiment is described below. - Semiconductor layer 14 i made of a substantially-intrinsic i-type semiconductor is provided between
substrate 11 andsemiconductor layer 14 p. Semiconductor layer 14 i has a thickness of about several Å to 250 Å, for example, with which semiconductor layer 14 i cannot substantially contribute to power generation. Semiconductor layer 15 i made of a substantially-intrinsic i-type semiconductor is provided betweensubstrate 11 and semiconductor layer 15 n. Semiconductor layer 15 i has a thickness of about several Å to 250 Å, for example, with which semiconductor layer 15 i cannot substantially contribute to power generation. - Semiconductor layer 14 i and
semiconductor layer 14 p are provided so as to substantially entirely cover secondprincipal surface 11 b including a portion above semiconductor layer 15 n. Thus, Semiconductor layer 14 i andsemiconductor layer 14 p are also provided above semiconductor layer 15 n.Recombination layer 19 is provided between semiconductor layer 15 n andsemiconductor layer 14 p. In this way, another semiconductor layer maybe further provided on n-type surface 10 bn constituted by semiconductor layer 15 n. - Electric charges collected on p-
type surface 10 bp are extracted from p-side electrode 21 p in direct contact withsemiconductor layer 14 p as in the case of the first embodiment. On the other hand, electrons collected on n-type surface 10 bn are extracted from n-side electrode 22 n viarecombination layer 19, semiconductor layer 14 i, andsemiconductor layer 14 p -
Recombination layer 19 may be made of a material such as a semiconductor material in which many midgap levels exist in energy bands, or a metallic material capable of coming in ohmic contact with a p-type semiconductor layer. The selection of such a material makes it possible to reduce a loss of electrons extracted from n-side electrode 22 n. More specifically,recombination layer 19 may be made of, for example, p-type or n-type amorphous silicon, p-type or n-type microcrystalline silicon, or the like. - P-
type surface 10 bp and n-type surface 10 bn are connected with semiconductor layer 14 i andsemiconductor layer 14 p interposed in between. However, semiconductor layer 14 i andsemiconductor layer 14 p have such small film thicknesses as to have high resistance that allows only a small current to flow. This configuration enables generated electric current to be efficiently extracted from p-side electrode 21 p and n-side electrode 22 n without needing the processes of forming semiconductor layer 14 i andsemiconductor layer 14 p. Also,solar cell 1 b can produce the same effects as solar cell 1 a. Moreover,solar cell 1 b does not need a patterning process ofsemiconductor layer 14 p and the like. Accordingly, the manufacturing cost can be reduced. -
FIG. 4 is a schematic cross sectional diagram of solar cell 1 c according to a third embodiment. As illustrated inFIG. 4 , solar cell 1 c includes insulatinglayer 23 protruding from p-side electrode 21 p and n-side electrode 22 n. Insulatinglayer 23 is made of an elastic body such as a resin. For this reason, if multiple solar cells 1 c are stacked as illustrated inFIG. 5 , only insulatinglayers 23 made of the elastic bodies contact neighboring solar cells 1 c. The parts of solar cells 1 c other than insulatinglayers 23 are kept from contacting neighboring solar cells 1 c. This inhibits solar cells 1 c from being damaged even if solar cells 1 c are stacked without resin sheets or the like inserted therebetween. As a result, solar cells 1 c are easy to store, which enables reduction in the manufacturing costs for solar cell module 2 as well. - Incidentally, all insulating
layers 23 do not necessarily have to protrude from p-side electrode 21 p and n-side electrode 22 n, but only some of insulatinglayers 23 may protrude from p-side electrode 21 p and n-side electrode 22 n. -
FIG. 6 is a schematic cross sectional diagram of solar cell 1 d according to a fourth embodiment. In solar cell 1 c, insulatinglayer 23 is formed before the formation of p-side electrode 21 p and n-side electrode 22 n. In contrast, in solar cell 1 d, insulatinglayer 23 is formed after the formation of p-side electrode 21 p and n-side electrode 22 n. Even in this case, the same effects as those described in the third embodiment can be obtained.
Claims (10)
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KR20110071375A (en) * | 2009-12-21 | 2011-06-29 | 현대중공업 주식회사 | Back contact type hetero-junction solar cell and method of fabricating the same |
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2012
- 2012-11-30 JP JP2013547234A patent/JP6029023B2/en not_active Expired - Fee Related
- 2012-11-30 WO PCT/JP2012/081086 patent/WO2013081104A1/en active Application Filing
-
2014
- 2014-08-07 US US14/453,769 patent/US20150027532A1/en not_active Abandoned
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US4543441A (en) * | 1983-02-14 | 1985-09-24 | Hitachi, Ltd. | Solar battery using amorphous silicon |
US20040200520A1 (en) * | 2003-04-10 | 2004-10-14 | Sunpower Corporation | Metal contact structure for solar cell and method of manufacture |
US20090223562A1 (en) * | 2006-10-27 | 2009-09-10 | Kyocera Corporation | Solar Cell Element Manufacturing Method and Solar Cell Element |
US20080173347A1 (en) * | 2007-01-23 | 2008-07-24 | General Electric Company | Method And Apparatus For A Semiconductor Structure |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10475946B2 (en) * | 2015-09-30 | 2019-11-12 | Panasonic Intellectual Property Management Co., Ltd. | Method of manufacturing back surface junction type solar cell |
US20180347410A1 (en) * | 2015-11-03 | 2018-12-06 | Carlos Alberto Hernandez Abarca | System for recovering thermal energy produced in pyrometallurgical process plants or similar, to convert same into, or generate, electrical energy |
Also Published As
Publication number | Publication date |
---|---|
JP6029023B2 (en) | 2016-11-24 |
WO2013081104A1 (en) | 2013-06-06 |
JPWO2013081104A1 (en) | 2015-04-27 |
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