US20120061022A1 - Plasma texturing reaction apparatus - Google Patents

Plasma texturing reaction apparatus Download PDF

Info

Publication number
US20120061022A1
US20120061022A1 US12/938,733 US93873310A US2012061022A1 US 20120061022 A1 US20120061022 A1 US 20120061022A1 US 93873310 A US93873310 A US 93873310A US 2012061022 A1 US2012061022 A1 US 2012061022A1
Authority
US
United States
Prior art keywords
induction coil
high frequency
reaction apparatus
plasma
frequency power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US12/938,733
Inventor
Kun- Joo Park
Gi-hong Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SEMI-MATERIALS Co Ltd
Semi Materials Co Ltd
Original Assignee
Semi Materials Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semi Materials Co Ltd filed Critical Semi Materials Co Ltd
Assigned to SEMI-MATERIALS CO., LTD. reassignment SEMI-MATERIALS CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KIM, GI HONG, PARK, KUN JOO
Publication of US20120061022A1 publication Critical patent/US20120061022A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32137Radio frequency generated discharge controlling of the discharge by modulation of energy
    • H01J37/32155Frequency modulation
    • H01J37/32165Plural frequencies
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/3211Antennas, e.g. particular shapes of coils

Definitions

  • the present invention relates to a plasma texturing technology for a solar cell, and more particularly, to a plasma texturing reaction apparatus which can improve the manufacturing efficiency and quality of a solar cell by increasing the density and uniformity of plasma ions and appropriately controlling ion energy when conducting plasma texturing through dry etching on a solar cell wafer to increase a light absorption amount of available light to the inside of the solar cell by reducing a light reflection amount on the surface of the solar cell.
  • a solar cell is a photoelectric element which converts light energy into electrical energy.
  • the solar cell is considered as a clean energy source which can overcome problems such as environmental pollution, high fuel cost, etc. caused by the use of fossil fuel energy.
  • both surfaces of the solar cell wafer are etched.
  • the solar cell wafer have a thickness of no less than 200 ⁇ m
  • the surface texturing through wet chemical etching is conducted for an ultrathin wafer (a solar cell wafer with a thickness of no greater than 200 ⁇ m)
  • the breakage of the wafer may be caused as both surfaces of the wafer are etched. As a consequence, it is difficult to apply the surface texturing to an ultrathin wafer.
  • plasma is called a fourth material state and is a gas that has become partially ionized.
  • Such plasma has conductivity by particles which are electrically neutral but positively and negatively charged, and is sensitive to an electromagnetic field.
  • a technology of controlling an electromagnetic field applied to the plasma may be applied to a solar cell texturing process.
  • a plasma reaction apparatus may be classified into a solenoid type plasma reaction apparatus, a planar type plasma reaction apparatus and a dome type plasma reaction apparatus according to an antenna and a dielectric window.
  • the solenoid type plasma reaction apparatus since an inductance value is relatively high and a sputtering problem due to a high voltage occurs, efficiency may be reduced.
  • the planar type plasma reaction apparatus since the distance between a plasma source and a wafer is short, it may be difficult to independently adjust ion energy reaching the surface of the wafer.
  • the dome type plasma reaction apparatus since the area of a substrate is increased, it may be difficult to ensure a uniform etching rate.
  • a conventional planar inductively coupled plasma system includes a cylindrical induction coil in consideration that a semiconductor wafer has a circular shape.
  • a solar cell wafer has a rectangular or square shape, when using the conventional plasma reaction apparatus, it may be difficult to ensure a uniform etching rate across the wafer.
  • the present invention has been made in an effort to solve the problems occurring in the related art, and an object of the present invention is to increase the density and uniformity of plasma ions and appropriately control ion energy by using a square induction coil when conducting plasma texturing through dry etching on a solar cell wafer.
  • a plasma texturing reaction apparatus including: a chamber including a dielectric window and a chamber body and receiving a solar cell wafer to be textured; a polygonal induction coil provided at an outer upper portion of the dielectric window to generate a magnetic field for generating plasma; a high frequency low power supply unit that supplies a cathode of the chamber with high frequency power corresponding to process conditions; and a high frequency source power supply unit that supplies the polygonal induction coil with high frequency power.
  • FIG. 1 is a block diagram illustrating a plasma texturing reaction apparatus in accordance with an embodiment of the present invention
  • FIG. 2 is a schematic view illustrating an induction coil manufactured in a polygonal shape in accordance with an embodiment of the present invention
  • FIG. 3 is a plan view illustrating an induction coil in accordance with another embodiment of the present invention.
  • FIG. 4 is a schematic view illustrating an induction coil in accordance with another embodiment of the present invention.
  • FIG. 5 to FIGS. 7A to 7D are plan views illustrating an induction coil in accordance with another embodiment of the present invention.
  • FIG. 8 is a diagram illustrating a high frequency low power supply unit in accordance with another embodiment of the present invention.
  • FIG. 9 is a graph illustrating an experimental result for reflectivity of a solar cell wafer in the case of using a plasma texturing reaction apparatus in accordance with an embodiment of the present invention.
  • FIG. 10 is a graph illustrating an experimental result for uniformity of a solar cell wafer in the case of using a plasma texturing reaction apparatus in accordance with an embodiment of the present invention.
  • FIG. 1 is a block diagram illustrating a plasma texturing reaction apparatus in accordance with an embodiment of the present invention.
  • the plasma texturing reaction apparatus includes a chamber 103 , a polygonal induction coil 104 , a high frequency low power supply unit 108 , and a high frequency source power supply unit 111 .
  • the chamber 103 includes a dielectric window 103 A and a chamber body 103 B and receives a solar cell wafer 102 to be textured.
  • the polygonal induction coil 104 is provided at an outer upper portion of the dielectric window 103 A to generate a magnetic field for generating plasma.
  • the high frequency low power supply unit 108 supplies a cathode 101 of the chamber 103 with high frequency power corresponding to process conditions.
  • the high frequency source power supply unit 111 supplies the induction coil 104 with high frequency power.
  • Reference numeral 105 denotes a process model.
  • the high frequency power generated by a high frequency power generator 106 of the high frequency low power supply unit 108 is supplied to the cathode 101 , on which the solar cell wafer 102 to be textured is loaded, through a high frequency matching section 107 .
  • the cathode 101 is maintained in a negative potential state, and the intensity of ion energy and ion density are determined.
  • the high frequency power generated by a high frequency power generator 109 of the high frequency source power supply unit 111 is supplied to the induction coil 104 , which is installed above the solar cell wafer 102 , through a high frequency matching section 110 .
  • the induction coil 104 is not limited to a specific type induction coil.
  • the embodiment of the present invention employs an ICP (Inductively Coupled Plasma) induction coil.
  • a longitudinal magnetic field is formed around the induction coil 104 by a high frequency current supplied to the induction coil 104 .
  • a transverse electric field is formed in the plasma by the magnetic field, electrons are accelerated.
  • the accelerated electrons obtain energy from the electromagnetic field by passing through a skin depth, are introduced into the plasma, and collide with accelerated particles, so that gas introduced into the chamber 103 is ionized, resulting in the generation of high density plasma.
  • the induction coil 104 has a polygonal (e.g., a rectangular or a square) shape in order to ensure a uniform etching rate across the solar cell wafer 102 having a rectangular shape.
  • FIG. 2 is a schematic view illustrating the induction coil manufactured in the above shape in accordance with the embodiment of the present invention, which illustrates an example of a structure in which a coil is wound three times in a rectangular shape.
  • the induction coil 104 illustrated in FIG. 1 is a section taken along line A-A′ which is drawn in the induction coil 104 illustrated in FIG. 2 .
  • FIG. 3 is a plan view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a structure in which a coli is wound in a radial direction in order to increase uniformity.
  • FIG. 4 is a schematic view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a structure of a multiple induction coil in order to achieve the uniformity of ion energy and ion density.
  • the multiple induction coil has a structure in which induction coils 401 A and 401 B having the same shape (e.g., a rectangle) of two groups are connected in parallel to each other. The directions of currents flowing through the induction coils 401 A and 401 B of the two groups are the same.
  • the number of the groups is not limited to two. For example, the number of the groups may increase as is required.
  • the uniformity of an etching rate is the highest.
  • the distance and the interval in the induction coils 401 A and 401 B of the two groups may be the same or different from each other.
  • the solar cell wafer 102 is loaded on the cathode 101 in the chamber 103 and the multiple induction coil manufactured as illustrated in FIG. 4 is installed above the solar cell wafer 102 .
  • FIG. 5 is a plan view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a batch type structure designed such that a plurality of solar cell wafers can be textured at a time. Since a plurality of induction coils 501 arranged in a matrix format independently generate a magnetic field as described above with respect to the solar cell wafers 102 arranged on the cathode 101 , texturing can be simultaneously conducted.
  • FIG. 6 is a plan view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a batch type structure designed such that a plurality of solar cell wafers can be textured at a time.
  • the batch type induction coil includes a plurality of coils 601 arranged in the horizontal direction and a plurality of coils 602 arranged in the vertical direction below or above the coils 601 .
  • the interval ‘d’ between the right and left coils and the height ‘h’ (not shown) between the upper and lower coils are adjusted, so that ion density and ion energy of each wafer can be individually controlled and the plurality of solar cell wafers can be textured at a time.
  • FIGS. 7A to 7D are plan views illustrating the induction coil in accordance with another embodiment of the present invention, which illustrate a structure in which an induction coil is additionally provided in the induction coil in order to achieve uniformity of plasma ion density in consideration of the large diameter (e.g., 300 mm, 450 mm) of the solar cell wafer.
  • the large diameter e.g. 300 mm, 450 mm
  • FIG. 7A is an example in which a cylindrical induction coil 702 is additionally provided in a rectangular induction coil 701 .
  • FIG. 7B is an example in which a rectangular induction coil 704 is additionally provided in a rectangular induction coil 703 .
  • FIG. 7C is an example in which a rectangular induction coil 706 is additionally provided in a cylindrical induction coil 705 .
  • FIG. 7D is an example in which a rectangular induction coil 708 is additionally provided in a rectangular induction coil 707 and a rectangular induction coil 709 is additionally provided in the rectangular induction coil 708 .
  • high frequency power which is supplied from the high frequency source power supply unit 111 to the induction coil provided at an outside
  • high frequency power which is supplied from the high frequency source power supply unit 111 to the induction coil provided at an inside
  • the present invention is not limited the embodiments illustrated in FIGS. 7A to 7D .
  • FIG. 8 is a diagram illustrating the high frequency low power supply unit 108 illustrated in FIG. 1 in accordance with another embodiment of the present invention.
  • the high frequency low power supply unit 108 includes a plurality of high frequency power generators 106 A to 106 C and a plurality of high frequency matching sections 107 A to 107 C, so that the intensity and density of ion energy and radical concentration can be adjusted.
  • high frequency power supplied from the high frequency power generators 106 A to 106 C can be suitably supplied according to process conditions.
  • the high frequency power generator 106 A supplies power of a relatively low frequency (2 MHz)
  • the high frequency power generator 106 B supplies power of a relatively high frequency (12.56 MHz to 13.56 MHz)
  • the high frequency power generator 106 C supplies power of a higher frequency (27 MHz to 30 MHz or 60 MHz).
  • the high frequency power generators 106 A to 106 C supply power of a relatively low frequency in order to improve the intensity of ion energy, and power of a relatively high frequency in order to improve the density of the ion energy.
  • the high frequency power supplied from the high frequency power generators 106 A to 106 C, and the high frequency power supplied from the high frequency power generator 109 in a low dissociation region or a high dissociation region are adjusted, so that the intensity and density of ion energy and radical concentration are adjusted. Consequently, a high etching rate, wide uniformity and a process margin of the solar cell wafer 102 can be ensured.
  • desired high frequency power generators and high frequency matching sections can be selectively used according to process conditions.
  • FIG. 9 is a graph illustrating an experimental result for reflectivity of the solar cell wafer in the case of using the plasma texturing reaction apparatus in accordance with the embodiment of the present invention.
  • light reflectivity of the solar cell wafer in accordance with the embodiment of the present invention is reduced as the passage of texturing time and is smaller than 1% at maximum.
  • FIG. 10 is a graph illustrating an experimental result for uniformity of the solar cell wafer in the case of using the plasma texturing reaction apparatus in accordance with the embodiment of the present invention.
  • the difference of 1% or more occurs in uniformity of a center portion and an edge portion.
  • uniformity of a center portion and an edge portion is smaller than 0.03%.
  • a magnetic field is generated using a polygonal induction coil when conducting texturing on the surface of ultrathin wafer through dry etching in a process of manufacturing a solar cell, so that etching uniformity is improved from the center portion to an outer peripheral portion of the wafer, resulting in the reduction of reflectivity of the solar cell.
  • the photoelectric conversion efficiency of the solar cell is improved.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)

Abstract

A plasma texturing reaction apparatus includes a chamber including a dielectric window and a chamber body and receiving a solar cell wafer to be textured, and a polygonal induction coil provided at an outer upper portion of the dielectric window to generate a magnetic field for generating plasma, a high frequency low power supply unit that supplies a cathode of the chamber with high frequency power corresponding to process conditions, and a high frequency source power supply unit that supplies the polygonal induction coil with high frequency power.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention
  • The present invention relates to a plasma texturing technology for a solar cell, and more particularly, to a plasma texturing reaction apparatus which can improve the manufacturing efficiency and quality of a solar cell by increasing the density and uniformity of plasma ions and appropriately controlling ion energy when conducting plasma texturing through dry etching on a solar cell wafer to increase a light absorption amount of available light to the inside of the solar cell by reducing a light reflection amount on the surface of the solar cell.
  • 2. Description of the Related Art
  • A solar cell is a photoelectric element which converts light energy into electrical energy. The solar cell is considered as a clean energy source which can overcome problems such as environmental pollution, high fuel cost, etc. caused by the use of fossil fuel energy.
  • Recently, research has been actively conducted to improve the photoelectric conversion efficiency of a solar cell. As a way of improving the photoelectric conversion efficiency of a solar cell, wet chemical texturing is conducted on a solar cell wafer so as to decrease a light reflection amount on the surface of a solar cell and increase a light absorption amount of available light to the inside of the solar cell. By this fact, pyramid shapes with a size of 4˜10 μm are formed on the surface of the solar cell wafer.
  • In the case where surface texturing is conducted through wet chemical etching as described above, both surfaces of the solar cell wafer are etched. Generally, while it is required that the solar cell wafer have a thickness of no less than 200 μm, if the surface texturing through wet chemical etching is conducted for an ultrathin wafer (a solar cell wafer with a thickness of no greater than 200 μm), the breakage of the wafer may be caused as both surfaces of the wafer are etched. As a consequence, it is difficult to apply the surface texturing to an ultrathin wafer.
  • For this reason, plasma texturing has been spotlighted as an alternative of the wet chemical texturing.
  • As well known in the art, plasma is called a fourth material state and is a gas that has become partially ionized. Such plasma has conductivity by particles which are electrically neutral but positively and negatively charged, and is sensitive to an electromagnetic field. In this regard, a technology of controlling an electromagnetic field applied to the plasma may be applied to a solar cell texturing process.
  • A plasma reaction apparatus may be classified into a solenoid type plasma reaction apparatus, a planar type plasma reaction apparatus and a dome type plasma reaction apparatus according to an antenna and a dielectric window. According to the solenoid type plasma reaction apparatus, since an inductance value is relatively high and a sputtering problem due to a high voltage occurs, efficiency may be reduced. According to the planar type plasma reaction apparatus, since the distance between a plasma source and a wafer is short, it may be difficult to independently adjust ion energy reaching the surface of the wafer. According to the dome type plasma reaction apparatus, since the area of a substrate is increased, it may be difficult to ensure a uniform etching rate.
  • Furthermore, a conventional planar inductively coupled plasma system includes a cylindrical induction coil in consideration that a semiconductor wafer has a circular shape. However, since a solar cell wafer has a rectangular or square shape, when using the conventional plasma reaction apparatus, it may be difficult to ensure a uniform etching rate across the wafer.
  • SUMMARY OF THE INVENTION
  • Accordingly, the present invention has been made in an effort to solve the problems occurring in the related art, and an object of the present invention is to increase the density and uniformity of plasma ions and appropriately control ion energy by using a square induction coil when conducting plasma texturing through dry etching on a solar cell wafer.
  • In order to achieve the above object, according to one aspect of the present invention, there is provided a plasma texturing reaction apparatus including: a chamber including a dielectric window and a chamber body and receiving a solar cell wafer to be textured; a polygonal induction coil provided at an outer upper portion of the dielectric window to generate a magnetic field for generating plasma; a high frequency low power supply unit that supplies a cathode of the chamber with high frequency power corresponding to process conditions; and a high frequency source power supply unit that supplies the polygonal induction coil with high frequency power.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The above objects, and other features and advantages of the present invention will become more apparent after a reading of the following detailed description taken in conjunction with the drawings, in which:
  • FIG. 1 is a block diagram illustrating a plasma texturing reaction apparatus in accordance with an embodiment of the present invention;
  • FIG. 2 is a schematic view illustrating an induction coil manufactured in a polygonal shape in accordance with an embodiment of the present invention;
  • FIG. 3 is a plan view illustrating an induction coil in accordance with another embodiment of the present invention;
  • FIG. 4 is a schematic view illustrating an induction coil in accordance with another embodiment of the present invention;
  • FIG. 5 to FIGS. 7A to 7D are plan views illustrating an induction coil in accordance with another embodiment of the present invention;
  • FIG. 8 is a diagram illustrating a high frequency low power supply unit in accordance with another embodiment of the present invention;
  • FIG. 9 is a graph illustrating an experimental result for reflectivity of a solar cell wafer in the case of using a plasma texturing reaction apparatus in accordance with an embodiment of the present invention; and
  • FIG. 10 is a graph illustrating an experimental result for uniformity of a solar cell wafer in the case of using a plasma texturing reaction apparatus in accordance with an embodiment of the present invention.
  • DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
  • Reference will now be made in greater detail to a preferred embodiment of the present invention, an example of which is illustrated in the accompanying drawings.
  • FIG. 1 is a block diagram illustrating a plasma texturing reaction apparatus in accordance with an embodiment of the present invention. Referring to FIG. 1, the plasma texturing reaction apparatus includes a chamber 103, a polygonal induction coil 104, a high frequency low power supply unit 108, and a high frequency source power supply unit 111. The chamber 103 includes a dielectric window 103A and a chamber body 103B and receives a solar cell wafer 102 to be textured. The polygonal induction coil 104 is provided at an outer upper portion of the dielectric window 103A to generate a magnetic field for generating plasma. The high frequency low power supply unit 108 supplies a cathode 101 of the chamber 103 with high frequency power corresponding to process conditions. The high frequency source power supply unit 111 supplies the induction coil 104 with high frequency power. Reference numeral 105 denotes a process model.
  • The high frequency power generated by a high frequency power generator 106 of the high frequency low power supply unit 108 is supplied to the cathode 101, on which the solar cell wafer 102 to be textured is loaded, through a high frequency matching section 107. Thus, the cathode 101 is maintained in a negative potential state, and the intensity of ion energy and ion density are determined.
  • Simultaneously to this, the high frequency power generated by a high frequency power generator 109 of the high frequency source power supply unit 111 is supplied to the induction coil 104, which is installed above the solar cell wafer 102, through a high frequency matching section 110. The induction coil 104 is not limited to a specific type induction coil. The embodiment of the present invention employs an ICP (Inductively Coupled Plasma) induction coil.
  • Thus, a longitudinal magnetic field is formed around the induction coil 104 by a high frequency current supplied to the induction coil 104. As a transverse electric field is formed in the plasma by the magnetic field, electrons are accelerated. The accelerated electrons obtain energy from the electromagnetic field by passing through a skin depth, are introduced into the plasma, and collide with accelerated particles, so that gas introduced into the chamber 103 is ionized, resulting in the generation of high density plasma.
  • The induction coil 104 has a polygonal (e.g., a rectangular or a square) shape in order to ensure a uniform etching rate across the solar cell wafer 102 having a rectangular shape.
  • FIG. 2 is a schematic view illustrating the induction coil manufactured in the above shape in accordance with the embodiment of the present invention, which illustrates an example of a structure in which a coil is wound three times in a rectangular shape. The induction coil 104 illustrated in FIG. 1 is a section taken along line A-A′ which is drawn in the induction coil 104 illustrated in FIG. 2.
  • FIG. 3 is a plan view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a structure in which a coli is wound in a radial direction in order to increase uniformity.
  • FIG. 4 is a schematic view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a structure of a multiple induction coil in order to achieve the uniformity of ion energy and ion density. The multiple induction coil has a structure in which induction coils 401A and 401B having the same shape (e.g., a rectangle) of two groups are connected in parallel to each other. The directions of currents flowing through the induction coils 401A and 401B of the two groups are the same. The number of the groups is not limited to two. For example, the number of the groups may increase as is required.
  • According to an experimental result, for example, when the ratio of a distance ‘r’ between right and left windings in the induction coil 401A and an interval ‘d’ between the induction coils 401A and 401B of the two groups is 1, the uniformity of an etching rate is the highest. The distance and the interval in the induction coils 401A and 401B of the two groups may be the same or different from each other.
  • However, it is difficult to install the solar cell wafer 102 to be textured between the induction coils 401A and 401B of the two groups. In this regard, as illustrated in FIG. 1, the solar cell wafer 102 is loaded on the cathode 101 in the chamber 103 and the multiple induction coil manufactured as illustrated in FIG. 4 is installed above the solar cell wafer 102. Herein, it is preferred to achieve the uniformity of ion density and energy distribution by appropriately adjusting the interval ‘d’ between the induction coils 401A and 401B of the two groups.
  • FIG. 5 is a plan view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a batch type structure designed such that a plurality of solar cell wafers can be textured at a time. Since a plurality of induction coils 501 arranged in a matrix format independently generate a magnetic field as described above with respect to the solar cell wafers 102 arranged on the cathode 101, texturing can be simultaneously conducted.
  • FIG. 6 is a plan view illustrating the induction coil in accordance with another embodiment of the present invention, which illustrates a batch type structure designed such that a plurality of solar cell wafers can be textured at a time. The batch type induction coil includes a plurality of coils 601 arranged in the horizontal direction and a plurality of coils 602 arranged in the vertical direction below or above the coils 601. The interval ‘d’ between the right and left coils and the height ‘h’ (not shown) between the upper and lower coils are adjusted, so that ion density and ion energy of each wafer can be individually controlled and the plurality of solar cell wafers can be textured at a time.
  • FIGS. 7A to 7D are plan views illustrating the induction coil in accordance with another embodiment of the present invention, which illustrate a structure in which an induction coil is additionally provided in the induction coil in order to achieve uniformity of plasma ion density in consideration of the large diameter (e.g., 300 mm, 450 mm) of the solar cell wafer.
  • FIG. 7A is an example in which a cylindrical induction coil 702 is additionally provided in a rectangular induction coil 701. FIG. 7B is an example in which a rectangular induction coil 704 is additionally provided in a rectangular induction coil 703. FIG. 7C is an example in which a rectangular induction coil 706 is additionally provided in a cylindrical induction coil 705. FIG. 7D is an example in which a rectangular induction coil 708 is additionally provided in a rectangular induction coil 707 and a rectangular induction coil 709 is additionally provided in the rectangular induction coil 708.
  • In the case of using the induction coil with such a structure, high frequency power, which is supplied from the high frequency source power supply unit 111 to the induction coil provided at an outside, and high frequency power, which is supplied from the high frequency source power supply unit 111 to the induction coil provided at an inside, are independently adjusted using a power distributor (not shown), so that ion density of a corresponding area can be determined at a desired degree.
  • The present invention is not limited the embodiments illustrated in FIGS. 7A to 7D. For example, it may be possible to employ various embodiments in which one or more induction coils having the same shape or different shapes are sequentially provided inside a single induction coil.
  • FIG. 8 is a diagram illustrating the high frequency low power supply unit 108 illustrated in FIG. 1 in accordance with another embodiment of the present invention. Referring to FIG. 8, the high frequency low power supply unit 108 includes a plurality of high frequency power generators 106A to 106C and a plurality of high frequency matching sections 107A to 107C, so that the intensity and density of ion energy and radical concentration can be adjusted.
  • In such a case, high frequency power supplied from the high frequency power generators 106A to 106C can be suitably supplied according to process conditions. For example, the high frequency power generator 106A supplies power of a relatively low frequency (2 MHz), the high frequency power generator 106B supplies power of a relatively high frequency (12.56 MHz to 13.56 MHz), and the high frequency power generator 106C supplies power of a higher frequency (27 MHz to 30 MHz or 60 MHz).
  • The high frequency power generators 106A to 106C supply power of a relatively low frequency in order to improve the intensity of ion energy, and power of a relatively high frequency in order to improve the density of the ion energy.
  • The high frequency power supplied from the high frequency power generators 106A to 106C, and the high frequency power supplied from the high frequency power generator 109 in a low dissociation region or a high dissociation region are adjusted, so that the intensity and density of ion energy and radical concentration are adjusted. Consequently, a high etching rate, wide uniformity and a process margin of the solar cell wafer 102 can be ensured.
  • Among the plurality of high frequency power generators 106A to 106C and the plurality of high frequency matching sections 107A to 107C, desired high frequency power generators and high frequency matching sections can be selectively used according to process conditions.
  • FIG. 9 is a graph illustrating an experimental result for reflectivity of the solar cell wafer in the case of using the plasma texturing reaction apparatus in accordance with the embodiment of the present invention. Referring to FIG. 9, as compared with the case where light reflectivity of a bare wafer is averagely 31.54% in a wavelength range of 300 nm to 800 nm, light reflectivity of the solar cell wafer in accordance with the embodiment of the present invention is reduced as the passage of texturing time and is smaller than 1% at maximum.
  • FIG. 10 is a graph illustrating an experimental result for uniformity of the solar cell wafer in the case of using the plasma texturing reaction apparatus in accordance with the embodiment of the present invention. Referring to FIG. 10, in the case of conducting texturing using a general induction coil, the difference of 1% or more occurs in uniformity of a center portion and an edge portion. However, in the case of conducting texturing using the induction coil in accordance with the embodiment of the present invention, uniformity of a center portion and an edge portion is smaller than 0.03%.
  • In accordance with the embodiments of the present invention, a magnetic field is generated using a polygonal induction coil when conducting texturing on the surface of ultrathin wafer through dry etching in a process of manufacturing a solar cell, so that etching uniformity is improved from the center portion to an outer peripheral portion of the wafer, resulting in the reduction of reflectivity of the solar cell. As a result, the photoelectric conversion efficiency of the solar cell is improved.
  • Although a preferred embodiment of the present invention has been described for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and the spirit of the invention as disclosed in the accompanying claims.

Claims (11)

1. A plasma texturing reaction apparatus comprising:
a chamber including a dielectric window and a chamber body and receiving a solar cell wafer to be textured;
a polygonal induction coil provided at an outer upper portion of the dielectric window to generate a magnetic field for generating plasma;
a high frequency low power supply unit that supplies a cathode of the chamber with high frequency power corresponding to process conditions; and
a high frequency source power supply unit that supplies the polygonal induction coil with high frequency power.
2. The plasma texturing reaction apparatus according to claim 1, wherein the polygon is at least a rectangle.
3. The plasma texturing reaction apparatus according to claim 1, wherein the induction coil includes an induction coil having a radial structure.
4. The plasma texturing reaction apparatus according to claim 1, wherein the induction coil includes an induction coil having a structure in which induction coils of a plurality of groups are connected in parallel to one another.
5. The plasma texturing reaction apparatus according to claim 1, wherein the induction coil includes an induction coil having a batch type structure in which a plurality of induction coils are arranged in a matrix format to generate a magnetic field with respect to corresponding solar cell wafers.
6. The plasma texturing reaction apparatus according to claim 1, wherein the induction coil includes an induction coil having a batch type structure in which a plurality of induction coils are arranged in a horizontal direction and a plurality of induction coils are arranged in a vertical direction below or above the plurality of induction coils arranged in the horizontal direction.
7. The plasma texturing reaction apparatus according to claim 1, wherein the induction coil includes an induction coil having a structure in which at least one induction coil having a same shape or different shapes is sequentially provided inside a single induction coil.
8. The plasma texturing reaction apparatus according to claim 7, wherein the single induction coil or the at least one induction coil provided inside the single induction coil includes a polygonal induction coil or a cylindrical induction coil.
9. The plasma texturing reaction apparatus according to claim 7 or 8, wherein the single induction coil or the at least one induction coil provided inside the single induction coil independently adjusts high frequency power radiated under a control of a high frequency power distributor to allow ion density of a corresponding area to be uniformly adjusted at a desired degree.
10. The plasma texturing reaction apparatus according to claim 1, wherein the high frequency low power supply unit includes a plurality of high frequency power generators and a plurality of high frequency matching sections to adjust intensity and density of ion energy and radical concentration.
11. The plasma texturing reaction apparatus according to claim 10, wherein the plurality of high frequency power generators generate high frequency power with a same frequency or different frequencies.
US12/938,733 2010-09-13 2010-11-03 Plasma texturing reaction apparatus Abandoned US20120061022A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2010-0089338 2010-09-13
KR1020100089338A KR101226266B1 (en) 2010-09-13 2010-09-13 Plasma Reactor FOR TEXTURING OF SOLAR CELL

Publications (1)

Publication Number Publication Date
US20120061022A1 true US20120061022A1 (en) 2012-03-15

Family

ID=44999640

Family Applications (1)

Application Number Title Priority Date Filing Date
US12/938,733 Abandoned US20120061022A1 (en) 2010-09-13 2010-11-03 Plasma texturing reaction apparatus

Country Status (4)

Country Link
US (1) US20120061022A1 (en)
EP (1) EP2428975A2 (en)
KR (1) KR101226266B1 (en)
CN (1) CN102403215A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120305191A1 (en) * 2011-05-31 2012-12-06 Semes Co., Ltd. Apparatus for treating substrate
US20150068681A1 (en) * 2013-09-06 2015-03-12 Hitachi High-Technologies Corporation Plasma processing apparatus
WO2021242506A1 (en) * 2020-05-27 2021-12-02 Lam Research Corporation Distributed plasma source array

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104988582B (en) * 2015-07-09 2017-08-11 重庆德尔森传感器技术有限公司 The sensor monocrystalline silicon etching device of equipment operating efficiency can be improved
KR101986834B1 (en) 2019-01-17 2019-06-07 와이아이테크(주) Dry Texturing Apparatus for Alkali SDR Surface of Crystalloid Solar Cell using Atmospheric Plasma
KR102298320B1 (en) 2019-01-17 2021-09-07 와이아이테크(주) Dry Texturing Apparatus for Alkali SDR Surface of Crystalloid Solar Cell using Atmospheric Plasma
CN111638569B (en) * 2020-07-17 2022-04-22 中国人民解放军空军工程大学 Radio frequency inductive coupling plasma superposition phase gradient super-surface wave-absorbing structure

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050162335A1 (en) * 2002-03-08 2005-07-28 Tokyo Electron Limited Plasma device
JP3854909B2 (en) * 2002-08-06 2006-12-06 株式会社日立製作所 Plasma processing equipment
JP5371238B2 (en) * 2007-12-20 2013-12-18 東京エレクトロン株式会社 Plasma processing apparatus and plasma processing method
KR101019493B1 (en) * 2008-10-22 2011-03-07 주식회사 케이씨텍 Chemical vapor deposition apparatus
KR20100048590A (en) * 2008-10-31 2010-05-11 주식회사 케이씨텍 Chemical vapor deposition apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120305191A1 (en) * 2011-05-31 2012-12-06 Semes Co., Ltd. Apparatus for treating substrate
US20150068681A1 (en) * 2013-09-06 2015-03-12 Hitachi High-Technologies Corporation Plasma processing apparatus
JP2015053172A (en) * 2013-09-06 2015-03-19 株式会社日立ハイテクノロジーズ Plasma processing apparatus
US10796884B2 (en) * 2013-09-06 2020-10-06 Hitachi High-Tech Corporation Plasma processing apparatus
WO2021242506A1 (en) * 2020-05-27 2021-12-02 Lam Research Corporation Distributed plasma source array

Also Published As

Publication number Publication date
KR20120027639A (en) 2012-03-22
EP2428975A2 (en) 2012-03-14
KR101226266B1 (en) 2013-01-25
CN102403215A (en) 2012-04-04

Similar Documents

Publication Publication Date Title
US20120061022A1 (en) Plasma texturing reaction apparatus
KR100774521B1 (en) Plasma reactor having multiple antenna structure
US20080156771A1 (en) Etching apparatus using neutral beam and method thereof
US20070068624A1 (en) Apparatus to treat a substrate and method thereof
TW201012310A (en) High density helicon plasma source for wide ribbon ion beam generation
US7088047B2 (en) Inductively coupled plasma generator having low aspect ratio
US20120037491A1 (en) Antenna for inductively coupled plasma generation, inductively coupled plasma generator, and method of driving the same
US20140035458A1 (en) Plasma reactor with electron beam plasma source having a uniform magnetic field
TW201508806A (en) Plasma processing device
US10796884B2 (en) Plasma processing apparatus
TWI521559B (en) Magnetic field distribution adjusting device for plasma processor and its adjusting method
KR20090037343A (en) Magnetized inductively coupled plasma processing apparatus and generating method
US10128083B2 (en) Ion sources and methods for generating ion beams with controllable ion current density distributions over large treatment areas
CN101998749B (en) Device for processing inductive coupling plasmas
KR20100048326A (en) Plasma processing apparatus including multi-stacked dielecric window for uniform plasma density
US7667208B2 (en) Technique for confining secondary electrons in plasma-based ion implantation
KR101112745B1 (en) Plasma reactor have a variable capacitively coupled plasma
KR20110006070U (en) Magnetized inductively coupled plasma processing apparatus
KR20050008065A (en) High density plasma source
KR20100048590A (en) Chemical vapor deposition apparatus
KR100501821B1 (en) Method of plasma generation and apparatus thereof
CN101292332A (en) Adaptively coupled plasma source having uniform magnetic field distribution and plasma chamber having the same
KR101104093B1 (en) Internal antenna and plasma generation apparatus
CN110415948B (en) Three-dimensional four-spiral inductance coupling coil
KR101013729B1 (en) Plasma reaction apparatus having corn type 3 dimensional helix inductive coil

Legal Events

Date Code Title Description
AS Assignment

Owner name: SEMI-MATERIALS CO., LTD., KOREA, REPUBLIC OF

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:PARK, KUN JOO;KIM, GI HONG;REEL/FRAME:025243/0445

Effective date: 20101021

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION