US20010005393A1 - Device for temperature measurement - Google Patents
Device for temperature measurement Download PDFInfo
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- US20010005393A1 US20010005393A1 US09/766,449 US76644901A US2001005393A1 US 20010005393 A1 US20010005393 A1 US 20010005393A1 US 76644901 A US76644901 A US 76644901A US 2001005393 A1 US2001005393 A1 US 2001005393A1
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- 238000009529 body temperature measurement Methods 0.000 title claims abstract description 13
- 238000005259 measurement Methods 0.000 claims abstract description 80
- 230000003287 optical effect Effects 0.000 claims abstract description 37
- 230000005855 radiation Effects 0.000 claims abstract description 15
- 238000009826 distribution Methods 0.000 claims abstract description 14
- 238000003384 imaging method Methods 0.000 claims description 3
- 238000013461 design Methods 0.000 description 3
- 230000004075 alteration Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000004049 embossing Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/07—Arrangements for adjusting the solid angle of collected radiation, e.g. adjusting or orienting field of view, tracking position or encoding angular position
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0803—Arrangements for time-dependent attenuation of radiation signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0808—Convex mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0814—Particular reflectors, e.g. faceted or dichroic mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0879—Optical elements not provided otherwise, e.g. optical manifolds, holograms, cubic beamsplitters, non-dispersive prisms or particular coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S33/00—Geometrical instruments
- Y10S33/21—Geometrical instruments with laser
Definitions
- the invention relates to a device for temperature measurement.
- Such devices which are known in the art for contactless temperature measurement comprise a detector for receiving heat radiation emanating from a measurement spot on an object of measurement, an optical system for imaging the heat radiation emanating from the measurement spot onto the detector and a sighting arrangement for identifying the position and size of the measurement spot on the object of measurement by means of visible light.
- a further processing arrangement which converts the detector signal into a temperature indication is also connected to the detector.
- the optical system is so designed that at a certain measurement distance for the most part only heat radiation from a certain area of the object of measurement, namely the so-called measurement spot, is focussed onto the detector.
- the size of the measurement spot is defined by the area from which 90% of the heat rays focussed onto the detector strike.
- applications are also known in which there are reference to values between 50% and 100%.
- the pattern of the dependence of the size of the measurement spot upon the measurement distance depends upon the design of the optical system.
- a fundamental distinction is made between distant focussing and close focussing.
- distant focussing the optical system images the detector into infinity and in close focussing it images it onto the focus plane.
- close focussing it is necessary to deal with a measurement spot which grows linearly with the measurement distance, whereas in close focussing the measurement spot will first of all become smaller with the measurement distance and after the focus plane will enlarge again if the free aperture of the optical system is greater than the measurement spot in the focus plane. If the measurement spot in the focus plane is greater than the free aperture of the optical system, then the measurement spot is also enlarged with the measurement distance even before the focus plane. Only the increase in the size of the measurement spot is smaller before the focus plane than after it.
- a sighting system is also known in the art which uses two laser beams to describe the size of the measurement spot.
- This system uses two divergent beams emanating from the edge of the optical system to characterise a close-focussed system and two laser beams which intersect in the focus point to characterise a close-focussed optical system.
- the object of the invention is to make further developments to the device for temperature measurement in such a way as to facilitate simple identification of the position and size of the measurement spot independently of the distance.
- the sighting arrangement has a diffractive optical system for producing a light intensity distribution with which the position and size of the measurement spot on the object of measurement can be rendered visible.
- a diffractive optical system is an optical element, the function of which is based principally upon the diffraction or light waves.
- transverse microstructures which can consist, for example, of a surface profile or a refractive index profile are provided in the optical element.
- Diffractive optical elements with a surface profile are also known as so-called holographic elements.
- the surface patterns are produced for example by exposure of photoresist layers to light and subsequent etching.
- Such a surface profile can also be converted by electroplating into an embossing printing block with which the hologram profile can be transferred into heated plastic films and reproduced.
- many holographic elements can be produced economically from one hologram printing block.
- the pattern of the diffractive optical system is produced by interference of an object wave with a reference wave. If for example a spherical wave is used as the object wave and a plane wave as the reference wave then an intensity distribution is produced in the image plane which is composed of a point in the centre (0 th order), a first intensive circle (first order) and further less intensive circle of greater diameter (higher orders). By screening out of the 0 th and the higher orders an individual circle can be filtered out.
- a plurality of other intensity distributions which are explained in greater detail below with reference to several embodiments can be produced by other object waves.
- the light intensity distribution which is produced can be formed, for example, by a circular marking surrounding the measurement spot or a cross-shaped marking.
- Such a device can also be produced economically and only requires a little adjustment work.
- FIG. 1 shows a schematic representation of a device according to the invention for temperature measurement according to a first embodiment
- FIGS. 2 a to 2 g show schematic representations of various light intensity distributions for identifying the position and size of the measurement spot
- FIG. 3 shows a schematic representation or a device according to the invention for temperature measurement according to a second embodiment
- FIG. 4 shows a schematic representation of a device according to the invention for temperature measurement according to a third embodiment
- FIG. 5 shows a schematic representation of a device according to the invention for temperature measurement according to a fourth embodiment.
- FIG. 1 shows a first embodiment of a device according to the invention for temperature measurement, comprising
- the sighting arrangement 5 consists essentially of a light source 5 a , a diffractive optical system formed for example by a holographic element 5 b and an additional refracting and/or reflecting optical element 5 c .
- the light source 5 a sends a reference wave 6 a onto the holographic element 5 b , resulting in a conically opening hologram 6 b which is transformed by the optical element 5 c so that it forms an intensity distribution 6 c which describes the position and size of the measurement spot 2 a over all measurement distances.
- a laser is advantageously used as the light source 5 a for generating the reference wave.
- a semiconductor light-emitting diode or a thermal light source it is also possible to use a semiconductor light-emitting diode or a thermal light source.
- a filter is advantageously provided in order to reduce the chromatic aberrations.
- the optical system 4 is formed by a dichroic beam divider 4 a and an infrared lens 4 b .
- the heat radiation 3 emanating from the measurement spot 2 a first of all reaches the beam divider 4 a which deflects the heat radiation, i.e., the infrared radiation, by 90° and delivers it to the infrared lens 4 b .
- the beam divider 4 a Since the beam divider 4 a must of necessity lie in the beam path of the sighting arrangement 5 it is constructed as a dichromatic beam divider which is reflective for the heat radiation emanating from the measurement spot 2 a and transparent for the visible light of the sighting arrangement 5 .
- the size of the marking to be produced depends essentially upon two parameters, namely the measurement distance and the desired accuracy of measurement.
- the accuracy of measurement results from the percentage of the rays emanating from the measurement spot and focussed onto the detector.
- the area of the measurement spot can for example be defined by the fact that 90% of the emanating radiation reaches the detector. However, depending upon the application this percentage can also be changed.
- the optical element 5 c which is adapted to the optical system 4 is provided in order to ensure that in each measurement distance the marking produced for identifying the measurement spot has the correct size for the desired accuracy or measurement.
- FIGS. 2 a to 2 g show light intensity distributions such as might be produced on the object of measurement 2 for identifying the measurement spot 2 a .
- FIGS. 2 a to 2 d show annular markings which substantially outline the measurement spot 2 a .
- the markings can be configured as in FIGS. 2 a and 2 c as a closed circle 3 a of in FIGS. 2 b and 2 d as a broken circle 3 b . It may also be advantageous to represent the centre of the measurement spot by a further marking 3 c , for example in the form of a dot.
- FIGS. 2 e and 2 f the light intensity distributions are represented as cross-shaped markings 3 d and 3 e respectively.
- the point of intersection represents the centre of the measurement spot 2 a and the four corner points represent the outer limits thereof.
- FIG. 2 g A very advantageous light intensity distribution is represented in FIG. 2 g in the form of a plurality of concentric circles 3 f , 3 g , 3 h .
- each circle represents a region of the measurement spot 2 a from which a certain percentage of the energy of the received heat radiation originates.
- the inner circle 3 f could represent the region of the measurement spot from which 90% of the energy striking the detector originates.
- the second ring 3 g represents an energy value of 95% and the third ring 3 h would correspond to an energy value of 99%.
- FIG. 3 A further device according to the invention for temperature measurement is represented in FIG. 3.
- the same reference numerals are used in this case for the same components.
- This second embodiment differs from the first one essentially in the design of the optical system 4 and the optical element 5 ′ c of the sighting arrangement 5 .
- the optical element 5 ′ c is constructed as an annular lens and accordingly is designed to produce a light intensity distribution according to FIGS. 2 a to 2 d .
- the infrared lens 4 ′ b is arranged so that it is surrounded by the annular lens 5 ′ c .
- the detector 1 is then provided between the holographic element 5 b and the infrared lens 4 ′ b.
- Such an arrangement has the advantage that a beam divider can be omitted.
- a somewhat more complicated fixing of the detector must be accepted, since the conically opening hologram 6 b must not be restricted thereby.
- the problem of mounting the detector I is circumvented by providing the beam divider 4 ′ a between the holographic element 5 b and the arrangement consisting of the annular lens 5 c and the infrared lens 4 ′ b .
- the heat radiation emanating from the measurement spot 2 a is focussed first of all by the infrared lens 4 ′ b onto the beam divider 4 ′ a and is there deflected by 90° onto the detector 1 .
- FIG. 5 an embodiment is shown in which the shape of the measurement spot of a close-focussed system can be rendered visible with the aid of a diffractive optical system.
- the measurement plane i.e., the object of measurement 2
- two rays 3 i , 3 k delimiting the infrared beam are shown in the drawing.
- the ray 3 i extends from the upper edge of the infrared lens 4 ′ b to the upper edge of the measurement spot 2 a or from the lower edge of the infrared lens 4 ′ b to the lower edge of the measurement spot.
- the ray 3 k extends from the lower edge of the infrared lens 4 ′ b to the upper edge of the measurement spot 2 a or from the upper edge of the infrared lens 4 ′ b to the lower edge of the measurement spot.
- the optical element 5 ′ c of the sighting arrangement 5 is designed so as to produce two intensity cones 6 d and 6 e which substantially follow the course of the marginal rays 3 k and 3 i .
- the intensity cone 6 e describes the size of the measurement spot as far as the focus plane and the intensity cone 6 d describes the divergent measurement spot after the focus plane.
- a disadvantage of this embodiment is that the intensity cone 6 d extends inside the marginal ray 3 k , whilst the intensity cone 6 e extends outside the marginal ray 3 i .
- this disadvantage can be overcome by another design of the refracting and/or reflecting optical element 5 ′ c.
- the light intensity distribution could advantageously be formed by two circular concentric markings, wherein one circular marking identifies the measurement spot lying between the optical element 5 ′ c and the focus plane and the other marking identifies the measurement spot lying behind the focus plane—when viewed from the optical element.
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Abstract
A device for temperature measurement uses an optical system to image the heat radiation emanating from a measurement spot on an object of measurement onto a detector. A sighting arrangement is also provided which has a diffractive optical system by which a light intensity distribution is produced which corresponds to the position and size of the measurement spot on the object of measurement.
Description
- Device for temperature measurement
- The invention relates to a device for temperature measurement.
- Such devices which are known in the art for contactless temperature measurement comprise a detector for receiving heat radiation emanating from a measurement spot on an object of measurement, an optical system for imaging the heat radiation emanating from the measurement spot onto the detector and a sighting arrangement for identifying the position and size of the measurement spot on the object of measurement by means of visible light. A further processing arrangement which converts the detector signal into a temperature indication is also connected to the detector.
- In this case the optical system is so designed that at a certain measurement distance for the most part only heat radiation from a certain area of the object of measurement, namely the so-called measurement spot, is focussed onto the detector. In most cases the size of the measurement spot is defined by the area from which 90% of the heat rays focussed onto the detector strike. However, applications are also known in which there are reference to values between 50% and 100%.
- The pattern of the dependence of the size of the measurement spot upon the measurement distance depends upon the design of the optical system. A fundamental distinction is made between distant focussing and close focussing. In distant focussing the optical system images the detector into infinity and in close focussing it images it onto the focus plane. In the case of distant focussing it is necessary to deal with a measurement spot which grows linearly with the measurement distance, whereas in close focussing the measurement spot will first of all become smaller with the measurement distance and after the focus plane will enlarge again if the free aperture of the optical system is greater than the measurement spot in the focus plane. If the measurement spot in the focus plane is greater than the free aperture of the optical system, then the measurement spot is also enlarged with the measurement distance even before the focus plane. Only the increase in the size of the measurement spot is smaller before the focus plane than after it.
- In the past various attempts were made to render the position and size of the measurement spot, which is invisible per se, visible by illumination. According to JP-A-47-22521 a plurality of rays which originate from several light sources or are obtained by reflection from a light source are directed along the marginal rays of a close-focussed optical system onto the object of measurement. In this way the size and position of the measurement spot for a close-focussed system can be rendered visible by an annular arrangement of illuminated points around the measurement spot. U.S. Pat. No. 5,368,392 describes various methods of outlining measurement spots by laser beams. These include the mechanical deflection of one or several laser beams as well as the splitting of a laser beam by a beam divider or a fiber optic system into several single beams which surround the measurement spot.
- A sighting system is also known in the art which uses two laser beams to describe the size of the measurement spot. This system uses two divergent beams emanating from the edge of the optical system to characterise a close-focussed system and two laser beams which intersect in the focus point to characterise a close-focussed optical system.
- All known sighting arrangements are either only useful for a certain measurement distance or require relatively complex adjustment and are often quite expensive.
- The object of the invention, therefore, is to make further developments to the device for temperature measurement in such a way as to facilitate simple identification of the position and size of the measurement spot independently of the distance.
- This object is achieved according to one aspect of the invention, in that the sighting arrangement has a diffractive optical system for producing a light intensity distribution with which the position and size of the measurement spot on the object of measurement can be rendered visible.
- According to another aspect of the invention, a diffractive optical system is an optical element, the function of which is based principally upon the diffraction or light waves. In order to produce the diffraction, transverse microstructures which can consist, for example, of a surface profile or a refractive index profile are provided in the optical element. Diffractive optical elements with a surface profile are also known as so-called holographic elements. The surface patterns are produced for example by exposure of photoresist layers to light and subsequent etching. Such a surface profile can also be converted by electroplating into an embossing printing block with which the hologram profile can be transferred into heated plastic films and reproduced. Thus many holographic elements can be produced economically from one hologram printing block.
- The pattern of the diffractive optical system is produced by interference of an object wave with a reference wave. If for example a spherical wave is used as the object wave and a plane wave as the reference wave then an intensity distribution is produced in the image plane which is composed of a point in the centre (0th order), a first intensive circle (first order) and further less intensive circle of greater diameter (higher orders). By screening out of the 0th and the higher orders an individual circle can be filtered out. A plurality of other intensity distributions which are explained in greater detail below with reference to several embodiments can be produced by other object waves.
- According to another aspect of the invention, usually approximately 80% of the energy emanating from the light source lies in the patterns produced by the diffractive optical system. The remaining energy is distributed inside and outside the measurement spot.
- According to a further aspect of the invention, the light intensity distribution which is produced can be formed, for example, by a circular marking surrounding the measurement spot or a cross-shaped marking.
- Such a device can also be produced economically and only requires a little adjustment work.
- Further constructions of the invention are the subject of the subordinate claims and are explained in greater detail below with reference to the description of several embodiments and to the drawings.
- FIG. 1 shows a schematic representation of a device according to the invention for temperature measurement according to a first embodiment;
- FIGS. 2a to 2 g show schematic representations of various light intensity distributions for identifying the position and size of the measurement spot;
- FIG. 3 shows a schematic representation or a device according to the invention for temperature measurement according to a second embodiment;
- FIG. 4 shows a schematic representation of a device according to the invention for temperature measurement according to a third embodiment;
- FIG. 5 shows a schematic representation of a device according to the invention for temperature measurement according to a fourth embodiment.
- FIG. 1 shows a first embodiment of a device according to the invention for temperature measurement, comprising
- (a) a
detector 1 for receivingheat radiation 3 emanating from ameasurement spot 2 a of an object ofmeasurement 2, - (b) an
optical system 4 for imaging the heat radiation emanating from themeasurement spot 2 a onto thedetector 1, - c) and a
sighting arrangement 5 for identifying the position and size of themeasurement spot 2 a on the object ofmeasurement 2 by means ofvisible light 6. - The
sighting arrangement 5 consists essentially of alight source 5 a, a diffractive optical system formed for example by aholographic element 5 b and an additional refracting and/or reflecting optical element 5 c. Thelight source 5 a sends areference wave 6 a onto theholographic element 5 b, resulting in a conicallyopening hologram 6 b which is transformed by the optical element 5 c so that it forms anintensity distribution 6 c which describes the position and size of themeasurement spot 2 a over all measurement distances. - A laser is advantageously used as the
light source 5 a for generating the reference wave. However, it is also possible to use a semiconductor light-emitting diode or a thermal light source. When a thermal light source is used a filter is advantageously provided in order to reduce the chromatic aberrations. - The
optical system 4 is formed by adichroic beam divider 4 a and an infrared lens 4 b. Theheat radiation 3 emanating from themeasurement spot 2 a first of all reaches thebeam divider 4 a which deflects the heat radiation, i.e., the infrared radiation, by 90° and delivers it to the infrared lens 4 b . - Since the beam divider4 a must of necessity lie in the beam path of the
sighting arrangement 5 it is constructed as a dichromatic beam divider which is reflective for the heat radiation emanating from themeasurement spot 2 a and transparent for the visible light of thesighting arrangement 5. - The size of the marking to be produced depends essentially upon two parameters, namely the measurement distance and the desired accuracy of measurement. The accuracy of measurement results from the percentage of the rays emanating from the measurement spot and focussed onto the detector. The area of the measurement spot can for example be defined by the fact that 90% of the emanating radiation reaches the detector. However, depending upon the application this percentage can also be changed.
- The optical element5 c which is adapted to the
optical system 4 is provided in order to ensure that in each measurement distance the marking produced for identifying the measurement spot has the correct size for the desired accuracy or measurement. - FIGS. 2a to 2 g show light intensity distributions such as might be produced on the object of
measurement 2 for identifying themeasurement spot 2 a. FIGS. 2a to 2 d show annular markings which substantially outline themeasurement spot 2 a. In this case the markings can be configured as in FIGS. 2a and 2 c as aclosed circle 3 a of in FIGS. 2b and 2 d as abroken circle 3 b. It may also be advantageous to represent the centre of the measurement spot by afurther marking 3 c, for example in the form of a dot. - In FIGS. 2e and 2 f the light intensity distributions are represented as
cross-shaped markings measurement spot 2 a and the four corner points represent the outer limits thereof. - A very advantageous light intensity distribution is represented in FIG. 2g in the form of a plurality of
concentric circles measurement spot 2 a from which a certain percentage of the energy of the received heat radiation originates. Thus for example theinner circle 3 f could represent the region of the measurement spot from which 90% of the energy striking the detector originates. Thesecond ring 3 g represents an energy value of 95% and thethird ring 3 h would correspond to an energy value of 99%. With the aid of such a light intensity distribution the user can recognise the level of accuracy with which he can measure objects of a certain size. - A further device according to the invention for temperature measurement is represented in FIG. 3. The same reference numerals are used in this case for the same components. This second embodiment differs from the first one essentially in the design of the
optical system 4 and theoptical element 5′c of thesighting arrangement 5. In FIG. 3 theoptical element 5′c is constructed as an annular lens and accordingly is designed to produce a light intensity distribution according to FIGS. 2a to 2 d. Theinfrared lens 4′b is arranged so that it is surrounded by theannular lens 5′c. Thedetector 1 is then provided between theholographic element 5 b and theinfrared lens 4′b. - Such an arrangement has the advantage that a beam divider can be omitted. However, a somewhat more complicated fixing of the detector must be accepted, since the
conically opening hologram 6 b must not be restricted thereby. - In the third embodiment illustrated in FIG. 4 the problem of mounting the detector I is circumvented by providing the
beam divider 4′a between theholographic element 5 b and the arrangement consisting of the annular lens 5 c and theinfrared lens 4′b. Thus the heat radiation emanating from themeasurement spot 2 a is focussed first of all by theinfrared lens 4′b onto thebeam divider 4′a and is there deflected by 90° onto thedetector 1. - Whereas all the previously described embodiments related to distant-focussed systems, an embodiment is shown in FIG. 5 in which the shape of the measurement spot of a close-focussed system can be rendered visible with the aid of a diffractive optical system. In this case the measurement plane, i.e., the object of
measurement 2, lies directly in the focus plane of theoptical system 4. In each case tworays 3 i, 3 k delimiting the infrared beam are shown in the drawing. The ray 3 i extends from the upper edge of theinfrared lens 4′b to the upper edge of themeasurement spot 2 a or from the lower edge of theinfrared lens 4′b to the lower edge of the measurement spot. By contrast, theray 3 k extends from the lower edge of theinfrared lens 4′b to the upper edge of themeasurement spot 2 a or from the upper edge of theinfrared lens 4′b to the lower edge of the measurement spot. - The
optical element 5′c of thesighting arrangement 5 is designed so as to produce twointensity cones marginal rays 3 k and 3 i. In this case theintensity cone 6 e describes the size of the measurement spot as far as the focus plane and theintensity cone 6 d describes the divergent measurement spot after the focus plane. - A disadvantage of this embodiment is that the
intensity cone 6 d extends inside themarginal ray 3 k, whilst theintensity cone 6 e extends outside the marginal ray 3 i. However, this disadvantage can be overcome by another design of the refracting and/or reflectingoptical element 5′c. - In the embodiment according to FIG. 5 the light intensity distribution could advantageously be formed by two circular concentric markings, wherein one circular marking identifies the measurement spot lying between the
optical element 5′c and the focus plane and the other marking identifies the measurement spot lying behind the focus plane—when viewed from the optical element.
Claims (1)
1. Device for temperature measurement comprising:
a) a detector for receiving heat radiation (3) emanating from a measurement spot on an object of measurement;
b) an optical system for imaging the heat radiation emanating from the measurement spot onto the detector;
c) and a sighting arrangement comprising:
a laser:
a diffractive optical system, aligned to be illuminated by said laser, to produce a diffraction pattern in the form of light intensity distribution which includes a 0th order point in the center and at least one intensive circle displaced from the center; and
an optical element, aligned to be illuminated by said intensive circle to position said intensive circle for identifying and outlining the position and size of the measurement spot on the object of measurement by means of visible light and for positioning the 0th order pattern near the center of the measurement spot to facilitate sighting.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/766,449 US6290389B2 (en) | 1995-08-03 | 2001-01-19 | Device for temperature measurement |
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19528590.5 | 1995-08-03 | ||
DE19528590A DE19528590C3 (en) | 1995-08-03 | 1995-08-03 | Temperature measuring device |
DE19528590 | 1995-08-03 | ||
US83636997A | 1997-10-20 | 1997-10-20 | |
US09/766,449 US6290389B2 (en) | 1995-08-03 | 2001-01-19 | Device for temperature measurement |
Related Parent Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP1996/003330 Continuation WO1997006419A1 (en) | 1995-08-03 | 1996-07-29 | Temperature-measurement instrument with diffractive optics |
US08836369 Continuation | 1997-10-20 | ||
US83636997A Continuation | 1995-08-03 | 1997-10-20 |
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US20010005393A1 true US20010005393A1 (en) | 2001-06-28 |
US6290389B2 US6290389B2 (en) | 2001-09-18 |
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US09/766,449 Expired - Fee Related US6290389B2 (en) | 1995-08-03 | 2001-01-19 | Device for temperature measurement |
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US20060034345A1 (en) * | 2004-08-13 | 2006-02-16 | Rolls-Royce Plc. | Temperature measuring system |
EP1642084A1 (en) * | 2003-07-03 | 2006-04-05 | Optris GmbH | Visiereinrichtung und vorrichtung mit einer kontaktlos oder kontaktbehaftet einsetzbaren mess-, arbeits- und/oder wirkeinrichtung |
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US20030065377A1 (en) * | 2001-09-28 | 2003-04-03 | Davila Luis A. | Coated medical devices |
US20040196888A1 (en) * | 2002-10-31 | 2004-10-07 | Fluke Corporation | IR thermometer for automotive applications |
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EP2213994A1 (en) * | 2003-06-16 | 2010-08-04 | White Box Inc. | Laser system |
EP2251659A1 (en) * | 2003-06-16 | 2010-11-17 | White Box Inc. | Laser system |
EP1642084A1 (en) * | 2003-07-03 | 2006-04-05 | Optris GmbH | Visiereinrichtung und vorrichtung mit einer kontaktlos oder kontaktbehaftet einsetzbaren mess-, arbeits- und/oder wirkeinrichtung |
US20060034345A1 (en) * | 2004-08-13 | 2006-02-16 | Rolls-Royce Plc. | Temperature measuring system |
US7303331B2 (en) * | 2004-08-13 | 2007-12-04 | Rolls-Royce Plc | Temperature measuring system |
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US20140250757A1 (en) * | 2013-03-08 | 2014-09-11 | Blaze Optics LLC | Sighting apparatus for use with a firearm that discharges ammunition having multiple projectiles |
US9335119B2 (en) * | 2013-03-08 | 2016-05-10 | Blaze Optics LLC | Sighting apparatus for use with a firearm that discharges ammunition having multiple projectiles |
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