TWM644069U - Time Domain Interleaved Parameter Measurement System - Google Patents
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Abstract
本創作揭露一種時域交錯式參數量測系統，其包含至少一個參數量測裝置。參數量測裝置包含一第一訊號儀器、一路徑切換器、訊號收發處理裝置與一第二訊號儀器。路徑切換器耦接第一訊號儀器、第二訊號儀器、第一待測收發器與第二待測收發器，訊號收發處理裝置耦接第一待測收發器與第二待測收發器。第一訊號儀器於第一時段與第二時段中分別產生第一頻段訊號與第二頻段訊號。路徑切換器切換第一頻段訊號與第二頻段訊號之傳輸路徑，使訊號收發處理裝置與第二訊號儀器在不同時段中取得待測收發器之所有待測參數，同時降低訊號儀器之使用成本。The invention discloses a time-domain interleaved parameter measurement system, which includes at least one parameter measurement device. The parameter measurement device includes a first signal device, a path switcher, a signal receiving and processing device and a second signal device. The path switcher is coupled to the first signal instrument, the second signal instrument, the first transceiver under test and the second transceiver under test, and the signal receiving and processing device is coupled to the first transceiver under test and the second transceiver under test. The first signal device generates a first frequency band signal and a second frequency band signal in the first time period and the second time period respectively. The path switcher switches the transmission path of the first frequency band signal and the second frequency band signal, so that the signal transceiver processing device and the second signal instrument can obtain all the parameters to be measured of the transceiver under test at different time periods, and at the same time reduce the use cost of the signal instrument.
Description
本創作係有關於一種量測系統，尤指一種時域交錯式參數量測系統。This creation is about a measurement system, especially a time-domain interleaved parameter measurement system.
在信息化時代的今天，無線設備應用廣泛，無線設備的射頻性能直接關乎用戶的使用體驗，射頻性能直接影響了通訊質量，因此在生產和使用中需要對產品的射頻性能進行把控。在製造電子產品時，通常是由工廠大量製造後，再經由測試部門測試電子產品的各種功能，惟有通過所有測試項目的電子產品方可出廠送至客戶端，以確保所出廠的電子產品維持一定的水平。In today's information age, wireless devices are widely used. The radio frequency performance of wireless devices is directly related to the user experience, and the radio frequency performance directly affects the communication quality. Therefore, it is necessary to control the radio frequency performance of products during production and use. When manufacturing electronic products, they are usually produced in large quantities by the factory, and then the various functions of the electronic products are tested by the testing department. Only the electronic products that pass all the test items can be sent to the client before leaving the factory to ensure that the electronic products manufactured maintain a certain level of stability. s level.
一般對於射頻接收參數與射頻發射參數之架構如第1圖所示，第1圖為先前技術之射頻參數量測裝置之電路示意圖。請參閱第1圖，射頻參數量測裝置包含兩個向量訊號產生器10、12、兩個向量訊號分析器14、16與兩個電子集成卡(PE card)18、20。此射頻參數量測裝置用以量測兩個待測物22、24之射頻參數。在同一時段中，待測物22、24同時進行射頻發射模式，即電子集成卡18、20分別產生待測訊號，並將此傳送至待測物22、24進行調變，以產生射頻訊號給向量訊號分析器14、16，進而取得射頻參數。在另一時段中，待測物22、24同時進行射頻接收模式，即向量訊號產生器10、12分別產生射頻訊號，並將此傳送至待測物22、24進行解調，以產生待測訊號給電子集成卡18、20，進而取得射頻參數。由上述可知，量測兩個待測物22、24之射頻參數，需要兩個向量訊號產生器10、12與兩個向量訊號分析器14、16，使得測試成本較高。Generally, the structure of radio frequency receiving parameters and radio frequency transmitting parameters is shown in Fig. 1, and Fig. 1 is a schematic circuit diagram of a radio frequency parameter measuring device in the prior art. Please refer to FIG. 1 , the radio frequency parameter measurement device includes two vector signal generators 10 , 12 , two vector signal analyzers 14 , 16 and two electronic integration cards (PE cards) 18 , 20 . The radio frequency parameter measuring device is used for measuring radio frequency parameters of two objects under test 22 , 24 . During the same time period, the objects under test 22 and 24 are in radio frequency transmission mode at the same time, that is, the electronic integrated cards 18 and 20 respectively generate signals to be tested, and transmit this to the objects under test 22 and 24 for modulation to generate radio frequency signals to The vector signal analyzers 14 and 16 further obtain radio frequency parameters. In another period of time, the objects under test 22 and 24 are in the radio frequency receiving mode at the same time, that is, the vector signal generators 10 and 12 respectively generate radio frequency signals and transmit them to the objects under test 22 and 24 for demodulation to generate Signals are sent to the electronic integrated cards 18 and 20 to obtain radio frequency parameters. It can be known from the above that to measure the radio frequency parameters of the two DUTs 22, 24, two vector signal generators 10, 12 and two vector signal analyzers 14, 16 are required, which makes the test cost higher.
因此，本創作係在針對上述的困擾，提出一種時域交錯式參數量測系統，以解決習知所產生的問題。Therefore, this creation is aimed at the above problems, and proposes a time-domain interleaved parameter measurement system to solve the problems caused by the prior art.
本創作的主要目的，在於提供一種時域交錯式參數量測系統，其降低儀器之測試成本。The main purpose of this creation is to provide a time-domain interleaved parameter measurement system, which reduces the test cost of the instrument.
在本創作之一實施例中，一種時域交錯式參數量測系統包含至少一個參數量測裝置，參數量測裝置耦接至少一個第一待測收發器與至少一個第二待測收發器。參數量測裝置包含一第一訊號儀器、一路徑切換器、一訊號收發處理裝置與一第二訊號儀器。第一訊號儀器於第一時段與第二時段分別產生一第一頻段訊號與一第二頻段訊號。路徑切換器耦接第一訊號儀器、第一待測收發器與第二待測收發器。路徑切換器用以接收第一頻段訊號，並將此傳送至第一待測收發器進行解調，以產生第一待測訊號。路徑切換器用以接收第二頻段訊號，並將此傳送至第二待測收發器進行解調，以產生第二待測訊號。訊號收發處理裝置耦接第一待測收發器與第二待測收發器。訊號收發處理裝置用以接收第一待測訊號與第二待測訊號，並據此分別取得第一待測參數與第二待測參數。訊號收發處理裝置於第一時段產生第三待測訊號，並將此傳送至第二待測收發器進行調變，以產生一第三頻段訊號。訊號收發處理裝置於第二時段產生第四待測訊號，並將此傳送至第一待測收發器進行調變，以產生一第四頻段訊號。第二訊號儀器耦接路徑切換器。路徑切換器用以接收第三頻段訊號，並將此傳送至第二訊號儀器進行解調，以取得第三待測參數。路徑切換器用以接收第四頻段訊號，並將此傳送至第二訊號儀器進行解調，以取得第四待測參數。In an embodiment of the present invention, a time-domain interleaved parameter measurement system includes at least one parameter measurement device, and the parameter measurement device is coupled to at least one first transceiver under test and at least one second transceiver under test. The parameter measuring device includes a first signal device, a path switcher, a signal receiving and processing device and a second signal device. The first signal device generates a first frequency band signal and a second frequency band signal during the first time period and the second time period respectively. The path switcher is coupled to the first signal instrument, the first transceiver under test and the second transceiver under test. The path switcher is used to receive the first frequency band signal, and transmit it to the first transceiver under test for demodulation, so as to generate the first signal under test. The path switcher is used for receiving the second frequency band signal, and sending it to the second transceiver under test for demodulation, so as to generate the second signal under test. The signal receiving and processing device is coupled to the first transceiver under test and the second transceiver under test. The signal transceiving and processing device is used to receive the first signal to be tested and the second signal to be tested, and obtain the first parameter to be tested and the second parameter to be measured accordingly. The signal transceiving and processing device generates a third signal under test in the first period, and transmits it to the second transceiver under test for modulation to generate a signal of a third frequency band. The signal transceiving and processing device generates a fourth signal under test in the second period, and transmits it to the first transceiver under test for modulation to generate a signal of a fourth frequency band. The second signal device is coupled to the path switcher. The path switcher is used to receive the third frequency band signal, and transmit it to the second signal device for demodulation, so as to obtain the third parameter to be measured. The path switcher is used to receive the fourth frequency band signal, and transmit it to the second signal device for demodulation, so as to obtain the fourth parameter to be measured.
在本創作之一實施例中，訊號收發處理裝置包含一第一訊號收發處理器與一第二訊號收發處理器。第一訊號收發處理器耦接第一待測收發器。第一訊號收發處理器用以接收第一待測訊號，並據此取得第一待測參數。第一訊號收發處理器於第二時段產生第四待測訊號，並將此傳送至第一待測收發器進行調變，以產生第四頻段訊號。第二訊號收發處理器耦接第二待測收發器。第二訊號收發處理器用以接收第二待測訊號，並據此取得第二待測參數。第二訊號收發處理器於第一時段中產生第三待測訊號，並將此傳送至第二待測收發器進行調變，以產生第三頻段訊號。In an embodiment of the present invention, the signal transceiving and processing device includes a first signal transceiving processor and a second signal transceiving processor. The first signal transceiver processor is coupled to the first transceiver under test. The first signal transceiving processor is used for receiving the first signal to be tested and obtaining the first parameter to be tested accordingly. The first signal transceiver processor generates a fourth signal under test in the second period, and transmits the signal to the first transceiver under test for modulation to generate a fourth frequency band signal. The second signal transceiver processor is coupled to the second transceiver under test. The second signal transceiving processor is used for receiving the second signal to be measured and obtaining the second parameter to be measured accordingly. The second signal transceiver processor generates a third signal under test in the first period, and transmits it to the second transceiver under test for modulation to generate a signal of a third frequency band.
在本創作之一實施例中，第一訊號收發處理器與第二訊號收發處理器為電子集成卡(PE card)。In an embodiment of the present invention, the first signal transceiving processor and the second signal transceiving processor are electronic integrated cards (PE cards).
在本創作之一實施例中，時域交錯式參數量測系統更包含一控制主機，其耦接參數量測裝置之路徑切換器、第一訊號收發處理器與第二訊號收發處理器。控制主機用以控制路徑切換器於第一時段與第二時段傳送訊號。In an embodiment of the present invention, the time-domain interleaved parameter measurement system further includes a control host, which is coupled to the path switcher, the first signal transceiver processor, and the second signal transceiver processor of the parameter measurement device. The control host is used to control the path switcher to transmit signals during the first period and the second period.
在本創作之一實施例中，第一訊號儀器為向量訊號產生器時，第二訊號儀器為向量訊號分析器，第一訊號儀器為音頻訊號產生器時，第二訊號儀器為數位轉換器(digitizer)。In one embodiment of the present invention, when the first signal instrument is a vector signal generator, the second signal instrument is a vector signal analyzer, and when the first signal instrument is an audio signal generator, the second signal instrument is a digital converter ( digitizer).
在本創作之一實施例中，第一訊號儀器為向量訊號收發器時，第二訊號儀器為向量訊號收發器或向量網路分析儀。In one embodiment of the present invention, when the first signal instrument is a vector signal transceiver, the second signal instrument is a vector signal transceiver or a vector network analyzer.
在本創作之一實施例中，第一頻段訊號、第二頻段訊號、第三頻段訊號與第四頻段訊號為調變訊號。In an embodiment of the present invention, the first frequency band signal, the second frequency band signal, the third frequency band signal and the fourth frequency band signal are modulated signals.
在本創作之一實施例中，第一待測參數與第二待測參數為靈敏度、接收訊號強度指示(RSSI, Received Signal Strength Indication)或位元錯誤率(BER)。In an embodiment of the present invention, the first parameter to be measured and the second parameter to be measured are sensitivity, received signal strength indication (RSSI, Received Signal Strength Indication) or bit error rate (BER).
在本創作之一實施例中，第三待測參數與第四待測參數為位元錯誤率(BER)、傳輸功率(TX power)、頻譜遮罩(Spectrum Mask)、誤差向量幅度(EVM)或相鄰通道功率比(ACPR, Adjacent Channel Power Ratio)。In one embodiment of the present invention, the third parameter to be measured and the fourth parameter to be measured are bit error rate (BER), transmission power (TX power), spectrum mask (Spectrum Mask), error vector magnitude (EVM) Or Adjacent Channel Power Ratio (ACPR, Adjacent Channel Power Ratio).
在本創作之一實施例中，至少一個參數量測裝置包含多個參數量測裝置，至少一個第一待測收發器包含多個第一待測收發器，至少一個第二待測收發器包含多個第二待測收發器。所有參數量測裝置分別耦接所有第一待測收發器，並分別耦接所有第二待測收發器。In one embodiment of the present invention, at least one parameter measurement device includes a plurality of parameter measurement devices, at least one first transceiver to be tested includes a plurality of first transceivers to be tested, and at least one second transceiver to be tested includes A plurality of second transceivers under test. All the parameter measuring devices are respectively coupled to all the first transceivers under test, and are respectively coupled to all the second transceivers under test.
基於上述，時域交錯式參數量測系統以路徑切換器切換兩個訊號儀器所產生之訊號的傳輸路徑，在兩個不同時段取得兩個待測收發器在接收模式與發射模式中的待測參數，進而降低儀器之測試成本。Based on the above, the time-domain interleaved parameter measurement system uses a path switcher to switch the transmission paths of the signals generated by the two signal instruments, and obtains the measured values of the two transceivers under test in the receiving mode and transmitting mode at two different time periods. parameters, thereby reducing the test cost of the instrument.
茲為使 貴審查委員對本創作的結構特徵及所達成的功效更有進一步的瞭解與認識，謹佐以較佳的實施例圖及配合詳細的說明，說明如後：In order to enable your review committee to have a better understanding and understanding of the structural features and achieved effects of this creation, I would like to provide a better embodiment diagram and a detailed description, as follows:
本創作之實施例將藉由下文配合相關圖式進一步加以解說。盡可能的，於圖式與說明書中，相同標號係代表相同或相似構件。於圖式中，基於簡化與方便標示，形狀與厚度可能經過誇大表示。可以理解的是，未特別顯示於圖式中或描述於說明書中之元件，為所屬技術領域中具有通常技術者所知之形態。本領域之通常技術者可依據本創作之內容而進行多種之改變與修改。Embodiments of the invention will be further explained below with the help of related drawings. Wherever possible, the same reference numerals have been used throughout the drawings and description to refer to the same or similar components. In the drawings, the shape and thickness may be exaggerated for the sake of simplification and convenient labeling. It should be understood that elements not particularly shown in the drawings or described in the specification are forms known to those skilled in the art. Those skilled in the art can make various changes and modifications based on the content of this creation.
當一個元件被稱為『在…上』時，它可泛指該元件直接在其他元件上，也可以是有其他元件存在於兩者之中。相反地，當一個元件被稱為『直接在』另一元件，它是不能有其他元件存在於兩者之中間。如本文所用，詞彙『及/或』包含了列出的關聯項目中的一個或多個的任何組合。When an element is referred to as being "on", it can generally mean that the element is directly on other elements, or there may be other elements present in between. Conversely, when an element is referred to as being "directly on" another element, it cannot have the other element in between. As used herein, the word "and/or" includes any combination of one or more of the associated listed items.
於下文中關於“一個實施例”或“一實施例”之描述係指關於至少一實施例內所相關連之一特定元件、結構或特徵。因此，於下文中多處所出現之“一個實施例”或 “一實施例”之多個描述並非針對同一實施例。再者，於一或多個實施例中之特定構件、結構與特徵可依照一適當方式而結合。The following descriptions of "one embodiment" or "an embodiment" refer to at least one specific element, structure or feature associated with one embodiment. Therefore, multiple descriptions of "one embodiment" or "an embodiment" appearing in various places below do not refer to the same embodiment. Furthermore, specific components, structures and features in one or more embodiments may be combined in an appropriate manner.
揭露特別以下述例子加以描述，這些例子僅係用以舉例說明而已，因為對於熟習此技藝者而言，在不脫離本揭示內容之精神和範圍內，當可作各種之更動與潤飾，因此本揭示內容之保護範圍當視後附之申請專利範圍所界定者為準。在通篇說明書與申請專利範圍中，除非內容清楚指定，否則「一」以及「該」的意義包含這一類敘述包括「一或至少一」該元件或成分。此外，如本揭露所用，除非從特定上下文明顯可見將複數個排除在外，否則單數冠詞亦包括複數個元件或成分的敘述。而且，應用在此描述中與下述之全部申請專利範圍中時，除非內容清楚指定，否則「在其中」的意思可包含「在其中」與「在其上」。在通篇說明書與申請專利範圍所使用之用詞(terms)，除有特別註明，通常具有每個用詞使用在此領域中、在此揭露之內容中與特殊內容中的平常意義。某些用以描述本揭露之用詞將於下或在此說明書的別處討論，以提供從業人員(practitioner)在有關本揭露之描述上額外的引導。在通篇說明書之任何地方之例子，包含在此所討論之任何用詞之例子的使用，僅係用以舉例說明，當然不限制本揭露或任何例示用詞之範圍與意義。同樣地，本揭露並不限於此說明書中所提出之各種實施例。The disclosure is particularly described with the following examples, which are for illustration only, since various changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the disclosure, and therefore this The scope of protection of the disclosed content shall be subject to the definition of the appended patent application scope. Throughout the specification and claims, the meanings of "a" and "the" include that such description includes "one or at least one" of the element or component, unless the content clearly specifies otherwise. Furthermore, as used in the present disclosure, singular articles also include descriptions of plural elements or components, unless it is obvious from the specific context that the plural is excluded. Also, as applied in this description and all claims below, the meaning of "in" may include "in" and "on" unless the content clearly dictates otherwise. The terms (terms) used throughout the specification and patent claims generally have the ordinary meaning of each term used in this field, in the content of this disclosure and in the specific content, unless otherwise specified. Certain terms used to describe the disclosure are discussed below or elsewhere in this specification to provide practitioners with additional guidance in describing the disclosure. The use of examples anywhere throughout the specification, including examples of any terms discussed herein, is for illustration only and certainly does not limit the scope and meaning of the disclosure or any exemplified terms. Likewise, the present disclosure is not limited to the various embodiments presented in this specification.
可了解如在此所使用的用詞「包含(comprising)」、「包含(including)」、「具有(having)」、「含有(containing)」、「包含(involving)」等等，為開放性的(open-ended)，即意指包含但不限於。另外，本創作的任一實施例或申請專利範圍不須達成本創作所揭露之全部目的或優點或特點。此外，摘要部分和標題僅是用來輔助專利文件搜尋之用，並非用來限制創作作之申請專利範圍。It will be understood that the terms "comprising", "including", "having", "containing", "involving", etc. as used herein are open-ended The (open-ended) means including but not limited to. In addition, any embodiment or patent scope of this creation does not need to achieve all the purposes or advantages or characteristics disclosed in this creation. In addition, the abstract and title are only used to assist in the search of patent documents, and are not used to limit the scope of patent applications for creative works.
此外，若使用「電(性)耦接」或「電(性)連接」一詞在此係包含任何直接及間接的電氣連接手段。舉例而言，若文中描述一第一裝置電性耦接於一第二裝置，則代表該第一裝置可直接連接於該第二裝置，或透過其他裝置或連接手段間接地連接至該第二裝置。另外，若描述關於電訊號之傳輸、提供，熟習此技藝者應該可了解電訊號之傳遞過程中可能伴隨衰減或其他非理想性之變化，但電訊號傳輸或提供之來源與接收端若無特別敘明，實質上應視為同一訊號。舉例而言，若由電子電路之端點A傳輸(或提供)電訊號S給電子電路之端點B，其中可能經過一電晶體開關之源汲極兩端及/或可能之雜散電容而產生電壓降，但此設計之目的若非刻意使用傳輸(或提供)時產生之衰減或其他非理想性之變化而達到某些特定的技術效果，電訊號S在電子電路之端點A與端點B應可視為實質上為同一訊號。In addition, if the term "electrical (sexual) coupling" or "electrical (sexual) connection" is used herein, it includes any direct and indirect electrical connection means. For example, if it is described that a first device is electrically coupled to a second device, it means that the first device can be directly connected to the second device, or indirectly connected to the second device through other devices or connection means. device. In addition, if you describe the transmission and provision of electrical signals, those familiar with the art should be able to understand that the transmission of electrical signals may be accompanied by attenuation or other non-ideal changes, but if the source and receiver of electrical signal transmission or provision are not special In essence, it should be regarded as the same signal. For example, if an electrical signal S is transmitted (or provided) from terminal A of the electronic circuit to terminal B of the electronic circuit, it may pass through the source and drain terminals of a transistor switch and/or possible stray capacitance. A voltage drop is generated, but if the purpose of this design is not to deliberately use the attenuation or other non-ideal changes generated during transmission (or provision) to achieve certain specific technical effects, the electrical signal S is between the terminal A and the terminal of the electronic circuit. B should be considered as substantially the same signal.
除非特別說明，一些條件句或字詞，例如「可以(can)」、「可能(could)」、「也許(might)」，或「可(may)」，通常是試圖表達本案實施例具有，但是也可以解釋成可能不需要的特徵、元件，或步驟。在其他實施例中，這些特徵、元件，或步驟可能是不需要的。Unless otherwise specified, some conditional sentences or words, such as "can (can)", "maybe (could)", "maybe (might)", or "may" are usually intended to express that the embodiments of the present case have, However, it may also be construed as a feature, element, or step that may not be required. In other embodiments, these features, elements, or steps may not be required.
以下將提出一種本創作之時域交錯式參數量測系統，其以路徑切換器切換兩個訊號儀器所產生之訊號的傳輸路徑，在兩個不同時段取得兩個待測收發器在接收模式與發射模式中的待測參數，進而降低儀器之測試成本。The following will propose a time-domain interleaved parameter measurement system of this invention, which uses a path switcher to switch the transmission paths of the signals generated by the two signal instruments, and obtains the two transceivers under test in the receiving mode and at two different time periods. The parameters to be measured in the emission mode, thereby reducing the test cost of the instrument.
第2圖為本創作之第一實施例之時域交錯式參數量測系統之電路示意圖。請參閱第2圖， 時域交錯式參數量測系統3包含至少一個參數量測裝置30，參數量測裝置30耦接至少一個第一待測收發器40與至少一個第二待測收發器41。第一待測收發器40與第二待測收發器41耦接電源端VDD。在第一實施例中，參數量測裝置30、第一待測收發器40與第二待測收發器41之數量皆分別以一為例。參數量測裝置30包含一第一訊號儀器301、一第二訊號儀器302、一路徑切換器303與一訊號收發處理裝置304。路徑切換器303耦接第一訊號儀器301、第二訊號儀器302、第一待測收發器40與第二待測收發器41，訊號收發處理裝置304耦接第一待測收發器40與第二待測收發器41。舉例來說，當第一訊號儀器301為向量訊號產生器時，第二訊號儀器302為向量訊號分析器。當第一訊號儀器301為音頻訊號產生器時，第二訊號儀器302為數位轉換器(digitizer)。當第一訊號儀器301為向量訊號收發器時，第二訊號儀器302為向量訊號收發器或向量網路分析儀。Fig. 2 is a schematic circuit diagram of the time-domain interleaved parameter measurement system of the first embodiment of the invention. Please refer to FIG. 2, the time-domain interleaved parameter measurement system 3 includes at least one parameter measurement device 30, and the parameter measurement device 30 is coupled to at least one first transceiver under test 40 and at least one second transceiver under test 41 . The first transceiver under test 40 and the second transceiver under test 41 are coupled to the power terminal VDD. In the first embodiment, the numbers of the parameter measuring device 30 , the first transceiver under test 40 and the second transceiver under test 41 are each taken as one example. The parameter measurement device 30 includes a first signal device 301 , a second signal device 302 , a path switcher 303 and a signal transceiving and processing device 304 . The path switcher 303 is coupled to the first signal instrument 301, the second signal instrument 302, the first transceiver under test 40 and the second transceiver under test 41, and the signal transceiving processing device 304 is coupled to the first transceiver under test 40 and the second transceiver under test 40. Two transceivers 41 to be tested. For example, when the first signal instrument 301 is a vector signal generator, the second signal instrument 302 is a vector signal analyzer. When the first signal device 301 is an audio signal generator, the second signal device 302 is a digitizer. When the first signal instrument 301 is a vector signal transceiver, the second signal instrument 302 is a vector signal transceiver or a vector network analyzer.
假設第一訊號儀器301、第二訊號儀器302、路徑切換器303與訊號收發處理裝置304皆為全自動操作。第一訊號儀器301於第一時段與第二時段分別產生一第一頻段訊號F1與一第二頻段訊號F2，其中第一時段與第二時段為不同時段，第一頻段訊號F1與第二頻段訊號F2可為調變訊號，例如頻率鍵控(FSK)訊號、四階相移鍵控(QPSK)訊號或正交振幅調變(QAM)訊號。以下介紹第一待測收發器40之接收模式與第二待測收發器41之發射模式。路徑切換器303於第一時段接收第一頻段訊號F1，並將此傳送至第一待測收發器40，第一待測收發器40對第一頻段訊號F1進行解調，以產生第一待測訊號U1。訊號收發處理裝置304接收第一待測訊號U1，並據此取得第一待測參數。訊號收發處理裝置304於第一時段產生第三待測訊號U3，並將此傳送至第二待測收發器41，第二待測收發器41對第三待測訊號U3進行調變，以產生一第三頻段訊號F3。路徑切換器303接收第三頻段訊號F3，並將此傳送至第二訊號儀器302。第二訊號儀器302對第三頻段訊號F3進行解調，以取得第三待測參數。在第一時段中，第一訊號儀器301與第二訊號儀器302之運作時間可以相同也可以不同。若第一訊號儀器301與第二訊號儀器302之運作時間相同，表示第一訊號儀器301與第二訊號儀器302之運作時間等於第一時段。若第一訊號儀器301與第二訊號儀器302之運作時間不同，表示第一訊號儀器301與第二訊號儀器302之其中一個具有較長的運作時間，且此較長的運作時間等於第一時段。It is assumed that the first signal device 301 , the second signal device 302 , the path switcher 303 and the signal transceiving and processing device 304 are all fully automatic. The first signal device 301 generates a first frequency band signal F1 and a second frequency band signal F2 respectively in the first period and the second period, wherein the first period and the second period are different periods, the first frequency band signal F1 and the second frequency band The signal F2 can be a modulation signal, such as a frequency keying (FSK) signal, a quadrature phase shift keying (QPSK) signal or a quadrature amplitude modulation (QAM) signal. The receiving mode of the first transceiver under test 40 and the transmitting mode of the second transceiver 41 under test will be introduced below. The path switcher 303 receives the first frequency band signal F1 in the first time period, and transmits it to the first transceiver under test 40, and the first transceiver under test 40 demodulates the first frequency band signal F1 to generate the first frequency band signal F1 to be tested. Test signal U1. The signal transceiving and processing device 304 receives the first signal under test U1, and obtains the first parameter under test accordingly. The signal transceiving processing device 304 generates the third signal U3 under test in the first period, and transmits it to the second transceiver 41 under test, and the second transceiver 41 under test modulates the third signal U3 under test to generate A third frequency band signal F3. The path switcher 303 receives the third frequency band signal F3 and transmits it to the second signal device 302 . The second signal instrument 302 demodulates the third frequency band signal F3 to obtain a third parameter to be measured. In the first period, the operating time of the first signaling device 301 and the second signaling device 302 may be the same or different. If the operation time of the first signal device 301 and the second signal device 302 are the same, it means that the operation time of the first signal device 301 and the second signal device 302 is equal to the first period. If the operation time of the first signal device 301 and the second signal device 302 are different, it means that one of the first signal device 301 and the second signal device 302 has a longer operation time, and this longer operation time is equal to the first time period .
以下介紹第一待測收發器40之發射模式與第二待測收發器41之接收模式。路徑切換器303接收第二頻段訊號F2，並將此傳送至第二待測收發器41。第二待測收發器41對第二頻段訊號F2進行解調，以產生第二待測訊號U2。訊號收發處理裝置304接收第二待測訊號U2，並據此取得第二待測參數。訊號收發處理裝置304於第二時段產生第四待測訊號U4，並將此傳送第一待測收發器40。第一待測收發器40對第四待測訊號U4進行調變，以產生一第四頻段訊號F4。路徑切換器303接收第四頻段訊號F4，並將此傳送至第二訊號儀器302進行解調，以取得第四待測參數。在第二時段中，第一訊號儀器301與第二訊號儀器302之運作時間可以相同也可以不同。若第一訊號儀器301與第二訊號儀器302之運作時間相同，表示第一訊號儀器301與第二訊號儀器302之運作時間等於第二時段。若第一訊號儀器301與第二訊號儀器302之運作時間不同，表示第一訊號儀器301與第二訊號儀器302之其中一個具有較長的運作時間，且此較長的運作時間等於第二時段。以第1圖之架構進行量測的總測試時間為0.435秒，但以此時域交錯式參數量測系統3進行量測的總測試時間為0.457秒，雖然比現有技術使用更多的時間，但卻僅使用兩台訊號儀器量測出待測收發器在發射模式與接收模式的所有待測參數，以降低儀器之測試成本。The transmitting mode of the first transceiver under test 40 and the receiving mode of the second transceiver 41 under test will be introduced below. The path switcher 303 receives the second frequency band signal F2 and transmits it to the second transceiver under test 41 . The second transceiver under test 41 demodulates the second frequency band signal F2 to generate a second signal U2 under test. The signal transceiving and processing device 304 receives the second signal U2 to be measured, and obtains the second parameter to be measured accordingly. The signal transceiving and processing device 304 generates a fourth signal U4 under test during the second period, and sends it to the first transceiver 40 under test. The first transceiver under test 40 modulates the fourth signal under test U4 to generate a fourth frequency band signal F4. The path switcher 303 receives the fourth frequency band signal F4 and sends it to the second signal device 302 for demodulation to obtain the fourth parameter to be measured. In the second period, the operating time of the first signaling device 301 and the second signaling device 302 may be the same or different. If the operation time of the first signal device 301 and the second signal device 302 are the same, it means that the operation time of the first signal device 301 and the second signal device 302 is equal to the second period. If the operation time of the first signal device 301 and the second signal device 302 are different, it means that one of the first signal device 301 and the second signal device 302 has a longer operation time, and this longer operation time is equal to the second period . The total test time for measurement with the framework in Figure 1 is 0.435 seconds, but the total test time for measurement with the time-domain interleaved parameter measurement system 3 is 0.457 seconds, although it takes more time than the prior art, However, only two signal instruments are used to measure all the parameters of the transceiver under test in the transmitting mode and receiving mode, so as to reduce the test cost of the instrument.
在本創作之某些實施例中，第一待測參數與第二待測參數可為，但不限於靈敏度、接收訊號強度指示(RSSI, Received Signal Strength Indication)或位元錯誤率(BER)。第三待測參數與第四待測參數可為，但不限於位元錯誤率(BER)、傳輸功率(TX power)、頻譜遮罩(Spectrum Mask)、誤差向量幅度(EVM)或相鄰通道功率比(ACPR, Adjacent Channel Power Ratio)。舉例來說，在第一待測收發器40或第二待測收發器41之接收模式中，第一訊號儀器301產生作為頻段訊號之射頻訊號，第一待測收發器40或第二待測收發器41接收此射頻訊號，並對此進行解調，以產生對應靈敏度之數位碼型(digital pattern)。最後，訊號收發處理裝置304接收此數位碼型，以取得上述靈敏度，並比較數位碼型與一數位預設碼型，以判斷此靈敏度是否正確。在第一待測收發器40或第二待測收發器41之發射模式中，訊號收發處理裝置304產生一數位碼型，並將此傳送至第一待測收發器40或第二待測收發器41。第一待測收發器40或第二待測收發器41對此數位碼型進行調變，以產生一射頻訊號。第二訊號儀器302接收此射頻訊號，並對此射頻訊號進行解調，以取得原來之數位碼型。第二訊號儀器302比較此數位碼型與一數位預設碼型，以計算出位元錯誤率。In some embodiments of the present invention, the first parameter to be measured and the second parameter to be measured may be, but not limited to, sensitivity, Received Signal Strength Indication (RSSI, Received Signal Strength Indication) or bit error rate (BER). The third parameter to be measured and the fourth parameter to be measured can be, but not limited to, bit error rate (BER), transmission power (TX power), spectrum mask (Spectrum Mask), error vector magnitude (EVM) or adjacent channels Power ratio (ACPR, Adjacent Channel Power Ratio). For example, in the receiving mode of the first transceiver 40 under test or the second transceiver 41 under test, the first signal instrument 301 generates a radio frequency signal as a frequency band signal, and the first transceiver 40 under test or the second transceiver under test The transceiver 41 receives the RF signal and demodulates it to generate a digital pattern corresponding to the sensitivity. Finally, the signal transceiving and processing device 304 receives the digital pattern to obtain the above-mentioned sensitivity, and compares the digital pattern with a preset digital pattern to determine whether the sensitivity is correct. In the transmitting mode of the first transceiver 40 under test or the second transceiver 41 under test, the signal transceiving processing device 304 generates a digital pattern, and transmits this to the first transceiver 40 or the second transceiver under test Device 41. The first transceiver under test 40 or the second transceiver under test 41 modulates the digital pattern to generate a radio frequency signal. The second signal device 302 receives the radio frequency signal and demodulates the radio frequency signal to obtain the original digital pattern. The second signal instrument 302 compares the digital pattern with a preset digital pattern to calculate the bit error rate.
在本創作之某些實施例中，訊號收發處理裝置304可包含一第一訊號收發處理器3040與一第二訊號收發處理器3041。舉例來說，第一訊號收發處理器3040與第二訊號收發處理器3041可為，但不限於電子集成卡(PE card)。第一訊號收發處理器3040耦接第一待測收發器40，第二訊號收發處理器3041耦接第二待測收發器41。第一訊號收發處理器3040接收第一待測訊號U1，並據此取得第一待測參數。第一訊號收發處理器3040於第二時段產生第四待測訊號U4，並將此傳送至第一待測收發器40進行調變，以產生第四頻段訊號F4。第二訊號收發處理器3041接收第二待測訊號U2，並據此取得第二待測參數。第二訊號收發處理器3041於第一時段中產生第三待測訊號U3，並將此傳送至第二待測收發器41進行調變，以產生第三頻段訊號F3。In some embodiments of the present invention, the signal transceiving and processing device 304 may include a first signal transceiving processor 3040 and a second signal transceiving processor 3041 . For example, the first signal transceiving processor 3040 and the second signal transceiving processor 3041 can be, but not limited to, electronic integration cards (PE cards). The first signal transceiver processor 3040 is coupled to the first transceiver under test 40 , and the second signal transceiver processor 3041 is coupled to the second transceiver under test 41 . The first signal transceiver processor 3040 receives the first signal U1 to be tested, and obtains the first parameter to be tested accordingly. The first signal transceiver processor 3040 generates a fourth signal under test U4 in the second period, and transmits it to the first transceiver under test 40 for modulation to generate a fourth frequency band signal F4. The second signal transceiver processor 3041 receives the second signal U2 to be measured, and obtains the second parameter to be measured accordingly. The second signal transceiver processor 3041 generates a third signal under test U3 in the first period, and transmits it to the second transceiver 41 for modulation to generate a third frequency band signal F3.
當第一訊號儀器301、第二訊號儀器302、路徑切換器303與訊號收發處理裝置304皆為受控式操作時，時域交錯式參數量測系統3更可包含一控制主機31。控制主機31耦接參數量測裝置30之路徑切換器303、第一訊號收發處理器3040與第二訊號收發處理器3041。控制主機31控制第一訊號收發處理器3040與第二訊號收發處理器3041進行運作，並控制路徑切換器303於第一時段與第二時段傳送訊號。When the first signal device 301 , the second signal device 302 , the path switcher 303 and the signal transceiving and processing device 304 are all operated in a controlled manner, the time domain interleaved parameter measurement system 3 may further include a control host 31 . The control host 31 is coupled to the path switcher 303 , the first signal transceiver processor 3040 and the second signal transceiver processor 3041 of the parameter measuring device 30 . The control host 31 controls the operation of the first signal transceiver processor 3040 and the second signal transceiver processor 3041 , and controls the path switcher 303 to transmit signals during the first period and the second period.
第3圖為本創作之第二實施例之時域交錯式參數量測系統之電路示意圖。請參閱第3圖，第二實施例與第一實施例的差別在於參數量測裝置30、第一待測收發器40與第二待測收發器41之數量。在第二實施例中，所有參數量測裝置30分別耦接所有第一待測收發器40，並分別耦接所有第二待測收發器41。此外，所有參數量測裝置30可共同耦接控制主機31。第二實施例之運作方式與第一實施例相同，於此不再贅述。Fig. 3 is a schematic circuit diagram of the time-domain interleaved parameter measurement system of the second embodiment of the present invention. Please refer to FIG. 3 , the difference between the second embodiment and the first embodiment lies in the quantity of the parameter measuring device 30 , the first transceiver under test 40 and the second transceiver under test 41 . In the second embodiment, all the parameter measurement devices 30 are respectively coupled to all the first transceivers under test 40 , and are respectively coupled to all the second transceivers under test 41 . In addition, all the parameter measurement devices 30 can be commonly coupled to the control host 31 . The operation mode of the second embodiment is the same as that of the first embodiment, and will not be repeated here.
根據上述實施例，時域交錯式參數量測系統以路徑切換器切換兩個訊號儀器所產生之訊號的傳輸路徑，在兩個不同時段取得兩個待測收發器在接收模式與發射模式中的待測參數，進而降低儀器之測試成本。According to the above embodiment, the time-domain interleaved parameter measurement system uses a path switcher to switch the transmission paths of the signals generated by the two signal instruments, and obtains the values of the two transceivers under test in the receiving mode and the transmitting mode at two different time periods. The parameters to be measured can reduce the test cost of the instrument.
以上所述者，僅為本創作一較佳實施例而已，並非用來限定本創作實施之範圍，故舉凡依本創作申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾，均應包括於本創作之申請專利範圍內。The above is only a preferred embodiment of this creation, and it is not used to limit the scope of implementation of this creation. Therefore, all equal changes and modifications are made according to the shape, structure, characteristics and spirit described in the patent scope of this creation. , should be included in the scope of the patent application for this creation.
10:向量訊號產生器 12:向量訊號產生器 14:向量訊號分析器 16:向量訊號分析器 18:電子集成卡 20:電子集成卡 22:待測物 24:待測物 3:時域交錯式參數量測系統 30:參數量測裝置 31:控制主機 301:第一訊號儀器 302:第二訊號儀器 303:路徑切換器 304:訊號收發處理裝置 3040:第一訊號收發處理器 3041:第二訊號收發處理器 40:第一待測收發器 41:第二待測收發器 VDD:電源端 F1:第一頻段訊號 F2:第二頻段訊號 F3:第三頻段訊號 F4:第四頻段訊號 U1:第一待測訊號 U2:第二待測訊號 U3:第三待測訊號 U4:第四待測訊號10: Vector signal generator 12: Vector signal generator 14: Vector signal analyzer 16: Vector signal analyzer 18: Electronic integrated card 20: Electronic integrated card 22: The object to be tested 24: The object to be tested 3: Time domain interleaved parameter measurement system 30: Parameter measurement device 31: Control host 301: First Signal Instrument 302: Second signal instrument 303:Path Switcher 304: Signal receiving and processing device 3040: The first signal transceiver processor 3041: Second signal transceiver processor 40: The first transceiver to be tested 41: The second transceiver to be tested VDD: power terminal F1: The first frequency band signal F2: second frequency band signal F3: The third frequency band signal F4: The fourth frequency band signal U1: The first signal to be tested U2: The second signal to be tested U3: The third signal to be tested U4: The fourth signal to be tested
第1圖為先前技術之射頻參數量測裝置之電路示意圖。 第2圖為本創作之第一實施例之時域交錯式參數量測系統之電路示意圖。 第3圖為本創作之第二實施例之時域交錯式參數量測系統之電路示意圖。 Fig. 1 is a schematic circuit diagram of a radio frequency parameter measuring device in the prior art. Fig. 2 is a schematic circuit diagram of the time-domain interleaved parameter measurement system of the first embodiment of the invention. Fig. 3 is a schematic circuit diagram of the time-domain interleaved parameter measurement system of the second embodiment of the present invention.
3:時域交錯式參數量測系統 3: Time domain interleaved parameter measurement system
30:參數量測裝置 30: Parameter measurement device
31:控制主機 31: Control host
301:第一訊號儀器 301: First Signal Instrument
302:第二訊號儀器 302: Second signal instrument
303:路徑切換器 303:Path Switcher
304:訊號收發處理裝置 304: Signal receiving and processing device
3040:第一訊號收發處理器 3040: The first signal transceiver processor
3041:第二訊號收發處理器 3041: Second signal transceiver processor
40:第一待測收發器 40: The first transceiver to be tested
41:第二待測收發器 41: The second transceiver to be tested
VDD:電源端 VDD: power terminal
F1:第一頻段訊號 F1: The first frequency band signal
F2:第二頻段訊號 F2: second frequency band signal
F3:第三頻段訊號 F3: The third frequency band signal
F4:第四頻段訊號 F4: The fourth frequency band signal
U1:第一待測訊號 U1: The first signal to be tested
U2:第二待測訊號 U2: The second signal to be tested
U3:第三待測訊號 U3: The third signal to be tested
U4:第四待測訊號 U4: The fourth signal to be tested
Claims (10)
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| TW112201342U TWM644069U (en) | 2023-02-16 | 2023-02-16 | Time Domain Interleaved Parameter Measurement System |
| CN202321045695.6U CN219802340U (en) | 2023-02-16 | 2023-05-04 | Time domain staggered parameter measurement system |
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| TW112201342U TWM644069U (en) | 2023-02-16 | 2023-02-16 | Time Domain Interleaved Parameter Measurement System |
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| TWM644069U true TWM644069U (en) | 2023-07-21 |
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