TWM586455U - Auxiliary sucking device of electronic elements - Google Patents
Auxiliary sucking device of electronic elements Download PDFInfo
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- TWM586455U TWM586455U TW108205001U TW108205001U TWM586455U TW M586455 U TWM586455 U TW M586455U TW 108205001 U TW108205001 U TW 108205001U TW 108205001 U TW108205001 U TW 108205001U TW M586455 U TWM586455 U TW M586455U
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Abstract
一種電子元件的輔助吸引裝置，包含一中心蓋單元、一上蓋單元，及一下蓋單元。該中心蓋單元包括一板體、一開口，及一位於該開口周緣之第一真空溝，該上蓋單元包括一上蓋體、一與該第一真空溝連接之第二真空溝，及一與該第二真空溝連接之上通氣口，該第一、二真空溝與該上通氣口圍繞界定出一第一真空通道，該下蓋單元包括一下蓋體、一與該第一真空溝連接之第三真空溝，及一與該第三真空溝連接之下通氣口，該第一、三真空溝與該下通氣口圍繞界定出一第二真空通道，該第一、二真空通道會吸附周圍之電子元件，使其停止作動。 An auxiliary suction device for electronic components includes a central cover unit, an upper cover unit, and a lower cover unit. The center cover unit includes a plate body, an opening, and a first vacuum groove located on a periphery of the opening. The upper cover unit includes an upper cover body, a second vacuum groove connected to the first vacuum groove, and a first vacuum groove connected to the first vacuum groove. A second vacuum groove is connected to the upper vent, the first and second vacuum grooves and the upper vent define a first vacuum channel, and the lower cover unit includes a lower cover and a first vacuum groove connected to the first vacuum groove. Three vacuum grooves and a lower vent connected to the third vacuum groove. The first and third vacuum grooves and the lower vent define a second vacuum channel around the first and second vacuum channels. Electronic components stop it.
Description
本新型是有關一種輔助裝置，特別是指一種電子元件的輔助吸引裝置。 The present invention relates to an auxiliary device, in particular to an auxiliary suction device for electronic components.
在半導體製程中，往往會因為一些無法避免的原因而生成細小的微粒或缺陷。隨著半導體製程中元件尺寸不斷縮小且電路密極度的不斷提高，這些極微小之缺陷或微粒對積體電路品質的影響也日趨嚴重，因此，為了維持產品品質的穩定，需針對所生產之電子工件進行缺陷檢測，並根據檢測之結果分析造成缺陷的原因，之後才能進一步掌握以避免或減少缺陷的產生，以達到提升電子工件製程良率與可靠度之目的。 In the semiconductor process, fine particles or defects are often generated due to some unavoidable reasons. With the shrinking of the component size and the increasing of the circuit density in the semiconductor manufacturing process, the impact of these tiny defects or particles on the quality of integrated circuits is becoming increasingly serious. Therefore, in order to maintain the stability of product quality, it is necessary to target the produced electronics. The workpiece is inspected for defects, and the cause of the defect is analyzed according to the inspection results. After that, it can be further mastered to avoid or reduce the occurrence of defects to achieve the purpose of improving the yield and reliability of the electronic workpiece process.
以往作為電子工件之外觀檢查裝置，會藉由轉盤帶動該電子工件轉動，利用攝影機之攝影手段攝影該電子工件之各面向的外觀檢查，惟，在實際使用上卻存在有以下的問題：當該轉盤在移載該電子工件時，該電子工件在搬運台上的跳躍移動會使得工件的姿勢產生變化，而有無法藉由攝影手段偵測工件之缺陷，而無法確實提高偵測精度，因此，如何保持移載中之工件的穩固定位狀態，為各方所面臨與重視之課題。 In the past, as an appearance inspection device for electronic workpieces, the electronic workpiece was driven to rotate by a turntable, and the appearance inspection of all aspects of the electronic workpiece was photographed by means of a camera. However, in actual use, there were the following problems: When the turntable transfers the electronic workpiece, the jumping movement of the electronic workpiece on the conveying table will cause the posture of the workpiece to change, and it is impossible to detect the defect of the workpiece by photography, and it is impossible to improve the detection accuracy. Therefore, How to maintain the steady position of the workpiece during the transfer is an issue facing and valued by all parties.
有鑑於此，本新型之目的，是提供一種電子元件的輔助吸引裝置，包含一中心蓋單元、一上蓋單元，及一下蓋單元。 In view of this, an object of the present invention is to provide an auxiliary suction device for electronic components, which includes a central cover unit, an upper cover unit, and a lower cover unit.
該中心蓋單元包括一板體、一開設於該板 體表面之開口，及一開設於該板體上且位於該開口周緣之第一真空溝，該上蓋單元包括一上蓋體、一與該第一真空溝連接之第二真空溝，及一位於該上蓋體並與該第二真空溝連接之上通氣口，該第一、二真空溝與該上通氣口圍繞界定出一第一真空通道，該下蓋單元包括一下蓋體、一與該第一真空溝連接之第三真空溝，及一位於該下蓋體上並與該第三真空溝連接之下通氣口，該第一、三真空溝與該下通氣口圍繞界定出一第二真空通道，該第一、二真空通道會吸附周圍之電子元件，使其停止作動。 The center cover unit includes a plate body, and a plate opened on the plate. An opening on the surface of the body, and a first vacuum groove opened on the board and located on the periphery of the opening, the upper cover unit includes an upper cover body, a second vacuum groove connected to the first vacuum groove, and a second vacuum groove The upper cover is connected with the second vent groove and the upper vent, the first and second vacuum grooves and the upper vent define a first vacuum channel. The lower cover unit includes a lower cover, a first cover and a first cover. A third vacuum groove connected to the vacuum groove, and a vent hole located on the lower cover and connected to the third vacuum groove, and the first and third vacuum grooves and the lower air hole define a second vacuum channel around The first and second vacuum channels will attract the surrounding electronic components and stop them.
本新型的另一技術手段，是在於上述更包含一與該上、下通氣口連接之空氣源，當該空氣源作動會吸附靠近該第一、二真空通道周圍的電子元件。 Another technical means of the present invention is that the above-mentioned method further includes an air source connected to the upper and lower vents, and when the air source is actuated, the electronic components near the first and second vacuum channels are adsorbed.
本新型的又一技術手段，是在於上述之板體具有一與該上、下蓋單元連接之上表面，及一相反之下表面，該第一真空溝位於該上表面，該上蓋體具有一與該上表面連接之第一上板面，及一相反之第二上板面，該第二真空溝位於該第一上板面上，該下蓋體具有一與該上表面連接之第一下板面，及一相反之第二下板面，該第三真空溝位於該第一下板面上。 Another technical means of the present invention is that the above board has an upper surface connected to the upper and lower cover units, and an opposite lower surface, the first vacuum groove is located on the upper surface, and the upper cover has a A first upper plate surface connected to the upper surface and an opposite second upper plate surface, the second vacuum groove is located on the first upper plate surface, and the lower cover has a first upper plate connected to the upper surface The lower plate surface and an opposite second lower plate surface, the third vacuum groove is located on the first lower plate surface.
本新型的再一技術手段，是在於上述之中心蓋單元更包括一開設於該上表面且位於該開口周緣之植入真空溝，而該下蓋單元更包括一位於該第一下板面並與該植入真空溝連接之第四真空溝，及一位於該下蓋體並與該第四真空溝連接之植入通氣口，該植入真空溝、該第四真空溝與該植入通氣口圍繞界定出一第三真空通道。 Another technical means of the present invention is that the above-mentioned central cover unit further includes an implanted vacuum groove opened on the upper surface and located on the periphery of the opening, and the lower cover unit further includes a first vacuum plate located on the first lower plate surface and A fourth vacuum groove connected to the implanted vacuum groove, and an implanted vent located in the lower cover and connected to the fourth vacuum groove, the implanted vacuum groove, the fourth vacuum groove and the implanted ventilation A third vacuum channel is defined around the mouth.
本新型的另一技術手段，是在於上述之空氣源與該植入通氣口連接，該第三真空通道會吸附周圍之電子元件，使其停止作動。 Another technical means of the present invention is that the above-mentioned air source is connected with the implantation vent, and the third vacuum channel will attract the surrounding electronic components to stop the operation.
本新型的又一技術手段，是在於上述之上、下蓋單元更包括一分別位於該上、下蓋體且對應該第 一真空溝之一端設置的檢測窗口。 Another technical means of the present invention is that the above-mentioned upper and lower cover units further include a respective upper and lower cover body respectively corresponding to the first and lower cover bodies. A detection window is provided at one end of a vacuum groove.
本新型的再一技術手段，是在於上述之檢測窗口對應設置於該中心蓋單元之開口的上方周緣處。 According to still another technical means of the present invention, the above-mentioned detection window is correspondingly provided at an upper peripheral edge of the opening of the center cover unit.
本新型的另一技術手段，是在於上述之第一真空溝是傾斜一角度地設置於該開口周緣，而該第二、三真空溝則配合該第一真空溝之傾斜角度設置。 Another technical means of the present invention is that the above-mentioned first vacuum groove is disposed at an angle of the opening at an oblique angle, and the second and third vacuum grooves are arranged in accordance with the inclination angle of the first vacuum groove.
本新型的又一技術手段，是在於上述更包含一轉動單元，其包括一設置於該中心蓋單元之開口的轉盤，及複數設置於該轉盤周緣之承載槽，該電子元件受該轉盤帶動而移動其中，該承載槽定義有一自該轉盤中心向該承載槽垂直延伸的中心軸線，當該電子元件位於該承載槽中時，會受該空氣源吸附而抵靠於該中心軸線的左側。 Another technical means of the present invention is that the above-mentioned device further includes a rotating unit, which includes a turntable provided at the opening of the center cover unit, and a plurality of bearing slots provided at the periphery of the turntable. The electronic components are driven by the turntable. Moving therein, the bearing slot defines a central axis extending vertically from the center of the turntable to the bearing slot. When the electronic component is located in the bearing slot, it will be absorbed by the air source and abut against the left side of the center axis.
本新型的再一技術手段，是在於上述之下蓋體位於該上蓋體之一側，該第一真空溝的數量為3個，該植入真空溝的數量為1個，而該第二真空溝的數量為2個，該第三、四真空溝的數量分別為1個。 Another technical means of the present invention is that the lower cover is located on one side of the upper cover, the number of the first vacuum grooves is three, the number of the implanted vacuum grooves is one, and the second vacuum is The number of grooves is two, and the number of the third and fourth vacuum grooves is one each.
本新型之有益功效在於，藉由該第一、二、三真空通道將該空氣源之真空導引至該承載槽旁，使該電子元件平穩地位於該承載槽的左側，便於該電子元件在同一位置且靜止狀態下穩地進行檢測或入料位置，以提升缺陷檢測之準確性。 The beneficial effect of the present invention is that the vacuum of the air source is guided by the first, second, and third vacuum passages to the side of the carrying slot, so that the electronic component is located on the left side of the carrying slot smoothly, so that the electronic component can In the same position and steady state, the inspection or feeding position is performed steadily to improve the accuracy of defect detection.
1‧‧‧入料單元 1‧‧‧feeding unit
10‧‧‧傳輸通道 10‧‧‧ transmission channel
11‧‧‧基座 11‧‧‧ base
12‧‧‧第一氣流溝 12‧‧‧first air groove
13‧‧‧連接口 13‧‧‧Connector
14‧‧‧阻擋件 14‧‧‧ barrier
15‧‧‧動力源 15‧‧‧ Power source
16‧‧‧傳送軌道 16‧‧‧ Teleport
161‧‧‧第一端 161‧‧‧ the first end
162‧‧‧第二端 162‧‧‧second end
2‧‧‧導引單元 2‧‧‧Guide unit
20‧‧‧氣流通道 20‧‧‧Airflow channel
21‧‧‧第一側導件 21‧‧‧First side guide
211‧‧‧第一面 211‧‧‧ the first side
212‧‧‧第二面 212‧‧‧Second Side
22‧‧‧第二氣流溝 22‧‧‧Second air channel
23‧‧‧第二側導件 23‧‧‧Second side guide
24‧‧‧側吸口 24‧‧‧Side suction
3‧‧‧吸附件 3‧‧‧Adsorption
4‧‧‧轉動單元 4‧‧‧Rotating unit
41‧‧‧轉盤 41‧‧‧Turntable
410‧‧‧分離界線 410‧‧‧ separation line
42‧‧‧承載槽 42‧‧‧bearing trough
420‧‧‧中心軸線 420‧‧‧center axis
5‧‧‧中心蓋單元 5‧‧‧ center cover unit
50‧‧‧第三真空通道 50‧‧‧Third vacuum channel
51‧‧‧板體 51‧‧‧Board
511‧‧‧上表面 511‧‧‧upper surface
512‧‧‧下表面 512‧‧‧ lower surface
52‧‧‧開口 52‧‧‧ opening
53‧‧‧第一真空溝 53‧‧‧The first vacuum trench
54‧‧‧植入真空溝 54‧‧‧Implanted into the vacuum trench
6‧‧‧上蓋單元 6‧‧‧ cover unit
60‧‧‧第一真空通道 60‧‧‧The first vacuum channel
61‧‧‧上蓋體 61‧‧‧ Upper cover
611‧‧‧第一上板面 611‧‧‧First upper surface
612‧‧‧第二上板面 612‧‧‧Second upper surface
62‧‧‧第二真空溝 62‧‧‧Second Vacuum Ditch
63‧‧‧上通氣口 63‧‧‧ Upper vent
64‧‧‧檢測窗口 64‧‧‧ Detection window
7‧‧‧下蓋單元 7‧‧‧ Lower cover unit
70‧‧‧第二真空通道 70‧‧‧Second vacuum channel
71‧‧‧下蓋體 71‧‧‧ lower cover
711‧‧‧第一下板面 711‧‧‧First lower surface
712‧‧‧第二下板面 712‧‧‧Second lower surface
72‧‧‧第三真空溝 72‧‧‧ Third Vacuum Ditch
73‧‧‧下通氣口 73‧‧‧lower vent
74‧‧‧第四真空溝 74‧‧‧ Fourth vacuum trench
75‧‧‧植入通氣口 75‧‧‧Implanted into the vent
8‧‧‧空氣源 8‧‧‧ air source
9‧‧‧電子元件 9‧‧‧Electronic components
圖1是一立體示意圖，說明本新型電子元件的輔助吸引裝置之較佳實施例；圖2是一立體示意圖，說明該較佳實施例中一入料單元與設置於其上之導引單元的態樣；圖3是一方塊示意圖，說明該較佳實施例中一動力源電連接一阻擋件之態樣；圖4是一上視示意圖，說明該較佳實施例之另一視角 態樣；圖5是一上視示意圖，說明該較佳實施例中一側吸口吸附兩電子元件之態樣；圖6是一立體示意圖，說明該較佳實施例中該側吸口之設置態樣；圖7是一上視示意圖，說明該較佳實施例中受吸附之電子元件抵靠於一承載槽左方的態樣；圖8是一立體示意圖，說明該較佳實施例中一中心蓋單元之態樣；圖9是一立體示意圖，說明該較佳實施例中一上蓋單元與一下蓋單元之態樣；及圖10是一方塊示意圖，說明該較佳實施例中一空氣源電連接一上通氣口、一下通氣口，及一植入通氣口之態樣。 FIG. 1 is a schematic perspective view illustrating a preferred embodiment of the auxiliary suction device of the novel electronic component; FIG. 2 is a schematic perspective view illustrating a feeding unit and a guide unit disposed thereon in the preferred embodiment. Fig. 3 is a schematic block diagram illustrating a state in which a power source is electrically connected to a blocking member in the preferred embodiment; Fig. 4 is a schematic top view illustrating another perspective of the preferred embodiment Fig. 5 is a schematic top view illustrating a state in which one side suction port adsorbs two electronic components in the preferred embodiment; Fig. 6 is a schematic three-dimensional view illustrating a state of setting the side suction port in the preferred embodiment ; FIG. 7 is a schematic top view illustrating a state in which the sucked electronic component abuts a left side of a bearing slot in the preferred embodiment; FIG. 8 is a schematic perspective view illustrating a center cover in the preferred embodiment Unit state; Figure 9 is a three-dimensional schematic diagram illustrating the state of an upper cover unit and a lower cap unit in the preferred embodiment; and Figure 10 is a block diagram illustrating an air source electrical connection in the preferred embodiment An upper vent, a lower vent, and an implanted vent.
有關本新型之相關申請專利特色與技術內容，在以下配合參考圖式之較佳實施例的詳細說明中，將可清楚的呈現。 The features and technical contents of the related patent application of the new model will be clearly presented in the following detailed description of the preferred embodiments with reference to the drawings.
參閱圖1、2，及3，為本新型電子元件的輔助吸引裝置之較佳實施例，適用於對一電子元件9進行測試、入料包裝，其包含一入料單元1、一導引單元2、一吸附件3、一轉動單元4、一中心蓋單元5、一上蓋單元6、一下蓋單元7，及一空氣源8。 Referring to Figures 1, 2, and 3, this is a preferred embodiment of an auxiliary suction device for a new type of electronic component, which is suitable for testing and feeding packaging of an electronic component 9, which includes a feeding unit 1 and a guiding unit. 2. An adsorption member 3, a rotating unit 4, a center cover unit 5, an upper cover unit 6, a lower cover unit 7, and an air source 8.
於此，該電子元件9會自該入料單元1進入該導引單元2，再由該轉動單元4帶動進行檢測及入料等作業。 Here, the electronic component 9 enters the guiding unit 2 from the feeding unit 1 and is driven by the rotating unit 4 to perform operations such as detection and feeding.
該入料單元1包括一基座11、一開設於該基座11表面之第一氣流溝12、一設置於該基座11上並與該第一氣流溝12連接之連接口13、一設置於該基座11中並可向上凸伸出該基座11表面之阻擋件14，及一用以驅 動該阻擋件14升降以分離相鄰兩電子元件9之動力源15。 The feeding unit 1 includes a base 11, a first airflow groove 12 opened on the surface of the base 11, a connection port 13 provided on the base 11 and connected to the first airflow groove 12, and a device. In the base 11, a blocking member 14 protruding upward from the surface of the base 11, and a blocking member 14 The blocking member 14 is moved up and down to separate the power sources 15 of two adjacent electronic components 9.
配合參閱圖4、5，及6，該入料單元1更包括一與該基座11之一側連接的傳送軌道16，其中，該傳送軌道16具有一遠離該基座11之第一端161，以及一靠近該基座11之第二端162，該電子元件9會自該第一端161前進至該第二端162以進入該基座11。 With reference to FIGS. 4, 5, and 6, the feeding unit 1 further includes a conveying track 16 connected to one side of the base 11, wherein the conveying track 16 has a first end 161 far from the base 11. And a second end 162 near the base 11, the electronic component 9 will advance from the first end 161 to the second end 162 to enter the base 11.
該導引單元2包括一第一側導件21、一設置於該第一側導件21表面並與該第一氣流溝12對向連接之第二氣流溝22，及一與該第一側導件21對向且間隔設置於該基座11上之第二側導件23。 The guide unit 2 includes a first side guide 21, a second air groove 22 provided on a surface of the first side guide 21 and connected opposite to the first air groove 12, and a first side guide The guide members 21 are opposite to and spaced from the second side guide members 23 on the base 11.
其中，該第一側導件21具有一與該基座11連接之第一面211，及一相反之第二面212，於此，該第一側導件21之第一面211與該連接口13相互垂直。 Wherein, the first side guide 21 has a first surface 211 connected to the base 11 and an opposite second surface 212. Here, the first surface 211 of the first side guide 21 and the connection The interfaces 13 are perpendicular to each other.
此外，該基座11與該第一、二側導件21、23圍繞界定出一引導該電子元件9自該傳送軌道16的第二端162進入該轉動單元4的傳輸通道10，而該第一、二氣流溝12、22與該連接口13圍繞界定出一與外界連通之氣流通道20，於此該氣流通道20之用途為吸附欲進入該轉動單元4之電子元件9。透過該傳輸通道10限制該電子元件9於其中，避免該電子元件9左右擺動，以提升輸送之穩定性。 In addition, the base 11 and the first and second side guides 21 and 23 delimit a transmission channel 10 that guides the electronic component 9 from the second end 162 of the transfer track 16 into the rotating unit 4, and the first The first and second airflow grooves 12 and 22 and the connection port 13 define an airflow channel 20 that communicates with the outside. The purpose of the airflow channel 20 is to attract electronic components 9 that are to enter the rotating unit 4. The electronic component 9 is restricted through the transmission channel 10 to prevent the electronic component 9 from swinging left and right, so as to improve the stability of transportation.
進一步地，該第一側導件21與該基座11圍繞界定出一位於該第一側導件21之側壁上的側吸口24，且該側吸口24與該氣流通道20相連通。而該側吸口24比該阻擋件14靠近該傳送軌道16之第一端161設置。 Further, the first side guide 21 and the base 11 define a side suction port 24 located on a side wall of the first side guide 21, and the side suction port 24 is in communication with the airflow channel 20. The side suction opening 24 is disposed closer to the first end 161 of the conveying rail 16 than the blocking member 14.
該吸附件3與該連接口13之一端連接，且該吸附件3保持真空吸氣狀態，配合參閱圖7，當該吸附件3作動會將氣體輸送至該氣流通道20，使得與該氣流通道20相連通之側吸口24將兩個位於該傳輸通道10上的電子元件9朝圖5之箭頭方向吸附，以令如LED般具有多面 的電子元件9之其中一個面被該側吸口24所吸附，以達平整順暢之入料。 The adsorption member 3 is connected to one end of the connection port 13, and the adsorption member 3 maintains a vacuum suction state. With reference to FIG. 7, when the adsorption member 3 is activated, it will transport gas to the airflow channel 20 so as to be connected to the airflow channel. The 20 side suction port 24 attracts two electronic components 9 located on the transmission channel 10 in the direction of the arrow in FIG. 5 so as to have a multi-faceted surface like an LED. One side of the electronic component 9 is absorbed by the side suction port 24 to achieve smooth and smooth feeding.
該轉動單元4包括一設置於該基座11上並位於該第一、二側導件21、23旁之轉盤41，及複數設置於該轉盤41周緣之承載槽42，該電子元件9自該基座11進入該轉盤41之承載槽42，再由該轉盤41帶動(如圖4之箭頭的轉動方向)遠離該基座11。 The rotating unit 4 includes a turntable 41 disposed on the base 11 and beside the first and second side guides 21 and 23, and a plurality of bearing grooves 42 disposed on the periphery of the turntable 41. The base 11 enters the bearing groove 42 of the turntable 41, and is driven by the turntable 41 (as shown in the direction of the arrow of FIG. 4) away from the base 11.
再者，該轉盤41之周緣與該基座11間定義有一分離界線410，而該承載槽42定義有一自該轉盤41中心向該承載槽42垂直延伸的中心軸線420。該阻擋件14位於該分離界線410上。 Furthermore, a separation boundary 410 is defined between the periphery of the turntable 41 and the base 11, and the bearing slot 42 defines a central axis 420 extending vertically from the center of the turntable 41 to the bearing slot 42. The blocking member 14 is located on the separation boundary 410.
透過該阻擋件14之設置，除了可分離位於第一順位的電子元件9後方之第二順位的電子元件9繼續前進外，更可阻擋位於第二順位的電子元件9後方之複數電子元件9前進，以避免一個以上之電子元件9進入該轉盤41之承載槽42中。於此，第一、二順位的電子元件9為進入該轉盤41之電子元件9的順序敘述。因此，在本較佳實施例中，該側吸口24會先吸附欲進入該承載槽42之第一、二順位的電子元件9，再由該阻擋件14將兩者分離，以達平整入料之目的。 Through the arrangement of the blocking member 14, in addition to separating the second-ranked electronic component 9 located behind the first-ranked electronic component 9 and continuing to advance, it can also block the plurality of electronic components 9 located behind the second-ranked electronic component 9 from proceeding In order to prevent more than one electronic component 9 from entering the bearing groove 42 of the turntable 41. Here, the first and second electronic components 9 are described in order of entering the electronic components 9 of the turntable 41. Therefore, in the preferred embodiment, the side suction opening 24 will first adsorb the first and second positions of the electronic components 9 that are to enter the loading slot 42, and then the two are separated by the blocking member 14 to achieve a flat feeding. Purpose.
此外，遠離該基座11之側吸口24，使該電子元件9於進入該承載槽42前先受該側吸口24吸附，調整該電子元件9之面向，可降低人工排除該電子元件9黏料、卡料，或鈎料等困擾，以確實提升作業效率。 In addition, the side suction opening 24 away from the base 11 allows the electronic component 9 to be adsorbed by the side suction opening 24 before entering the carrying slot 42 and adjusts the face of the electronic component 9 to reduce manual removal of the electronic component 9 sticky material. , Jamming, or hooking, etc., to really improve operating efficiency.
配合參閱圖8、9，及10，該中心蓋單元5包括一板體51、一開設於該板體51之開口52、一開設於該板體51上且位於該開口52周緣之第一真空溝53，及一位於該開口52周緣之植入真空溝54，該轉盤41是設置於該開口52上，該板體51概呈C型，該入料單元1設置於該板體51之C型缺口上。 With reference to FIGS. 8, 9, and 10, the center cover unit 5 includes a plate body 51, an opening 52 opened on the plate body 51, and a first vacuum opened on the plate body 51 and located on the periphery of the opening 52. The groove 53 and an implanted vacuum groove 54 located on the periphery of the opening 52. The turntable 41 is disposed on the opening 52. The plate 51 is generally C-shaped. The feeding unit 1 is provided on the C of the plate 51. Type notch.
其中，該板體51具有一與該上、下蓋單元6、7連接之上表面511，及一相反之下表面512，該第一真空溝53、及該植入真空溝54均位於該上表面511。而該第一真空溝53是傾斜一角度地設置於該開口52周緣。 The plate body 51 has an upper surface 511 connected to the upper and lower cover units 6, 7 and an opposite lower surface 512. The first vacuum groove 53 and the implanted vacuum groove 54 are located on the upper surface. Surface 511. The first vacuum groove 53 is disposed at an edge of the opening 52 at an angle.
該上蓋單元6包括一上蓋體61、一與該第一真空溝53對向連接之第二真空溝62，及一位於該上蓋體61並與該第二真空溝62連接之上通氣口63，該第一、二真空溝53、62與該上通氣口63圍繞界定出一第一真空通道60，其中，該上蓋體61具有一與該板體51連接之第一上板面611，及一相反之第二上板面612，該第二真空溝62位於該第一上板面611上。 The upper cover unit 6 includes an upper cover body 61, a second vacuum groove 62 oppositely connected to the first vacuum groove 53, and an upper vent 63 located on the upper cover body 61 and connected to the second vacuum groove 62. A first vacuum channel 60 is defined around the first and second vacuum grooves 53 and 62 and the upper air vent 63, wherein the upper cover body 61 has a first upper plate surface 611 connected to the plate body 51, and a In contrast to the second upper plate surface 612, the second vacuum groove 62 is located on the first upper plate surface 611.
該下蓋單元7包括一下蓋體71、一與該第一真空溝53對向連接之第三真空溝72，及一位於該下蓋體71上並與該第三真空溝72連接之下通氣口73，該第一、三真空溝53、72與該下通氣口73圍繞界定出一第二真空通道70，其中，該下蓋體71具有一與該板體51連接之第一下板面711，及一相反之第二下板面712，該第三真空溝72位於該第一下板面711上。其中，該下蓋體71位於該上蓋體61之一側。 The lower cover unit 7 includes a lower cover body 71, a third vacuum groove 72 connected to the first vacuum groove 53 opposite to the first vacuum groove 53, and a vent under the lower cover 71 and connected to the third vacuum groove 72. A second vacuum channel 70 is defined by the opening 73, the first and third vacuum grooves 53, 72, and the lower air vent 73. The lower cover 71 has a first lower plate surface connected to the plate 51. 711 and an opposite second lower plate surface 712. The third vacuum groove 72 is located on the first lower plate surface 711. The lower cover body 71 is located on one side of the upper cover body 61.
此外，該下蓋單元7更包括一位於該第一下板面711並與該植入真空溝54對向連接之第四真空溝74，及一位於該下蓋體71並與該第四真空溝74連接之植入通氣口75，該植入真空溝54、該第四真空溝74與該植入通氣口75圍繞界定出一第三真空通道50。 In addition, the lower cover unit 7 further includes a fourth vacuum groove 74 located on the first lower plate surface 711 and oppositely connected to the implanted vacuum groove 54, and a fourth vacuum groove 74 located on the lower cover 71 and connected to the fourth vacuum. The implantation vent 75 is connected to the trench 74. The implantation vacuum trench 54, the fourth vacuum trench 74 and the implantation vent 75 define a third vacuum channel 50.
該第一、二、三真空通道60、70、50會吸附周圍之電子元件9，使其停止作動。於此，該第一、二真空通道60、70之用途為吸附欲進行檢測之電子元件9，而該第三真空通道50則用以吸附欲承裝該電子元件9於一料帶(圖未繪出)中的入料包裝。當該上、下蓋單元6、7設置於該中心蓋單元5上時，該轉盤41會帶動該電子元件9 轉動至該第一真空溝53與該第四真空溝74的設置位置，以進行檢測及入料包裝。 The first, second and third vacuum channels 60, 70 and 50 will attract the surrounding electronic components 9 and stop them. Here, the purpose of the first and second vacuum channels 60 and 70 is to adsorb the electronic component 9 to be detected, and the third vacuum channel 50 is used to adsorb the electronic component 9 to be loaded on a tape (not shown in the figure). Draw) the incoming packaging. When the upper and lower cover units 6, 7 are disposed on the center cover unit 5, the turntable 41 will drive the electronic component 9 Rotate to the setting positions of the first vacuum groove 53 and the fourth vacuum groove 74 for testing and feeding and packing.
在本較佳實施例中，該第一真空溝53的數量為3個，與該第一真空溝53配合設置之第二、三真空溝62、72數量分別為2個與1個，而該植入真空溝54的數量為1個，與該植入真空溝54配合設置之第四真空溝74的數量為1個，實際實施時，可依需求設置不同數量，不應以此為限。 In the preferred embodiment, the number of the first vacuum grooves 53 is three, and the number of the second and third vacuum grooves 62 and 72 provided in cooperation with the first vacuum grooves 53 are two and one, respectively, and the The number of the implanted vacuum grooves 54 is one, and the number of the fourth vacuum grooves 74 provided in cooperation with the implanted vacuum grooves 54 is one. In actual implementation, different numbers can be set according to requirements, and this should not be limited.
由於該第一真空溝53是傾斜角度設置於該開口52周緣，而該第二、三真空溝62、72配合該第一真空溝53之傾斜角度設置，因此，該第一、二真空通道60、70亦為傾斜角度設置。 Since the first vacuum groove 53 is arranged at an inclined angle on the periphery of the opening 52, and the second and third vacuum grooves 62 and 72 are arranged in accordance with the inclination angle of the first vacuum groove 53, the first and second vacuum channels 60 , 70 is also set for the tilt angle.
此外，該上、下蓋單元6、7更包括一分別位於該上、下蓋體61、71且對應該第一真空溝53之一端設置的檢測窗口64。其中，該檢測窗口64對應設置於該中心蓋單元5之開口52的上方周緣處，以供該電子元件9之外觀檢查裝置或人眼視覺檢視之用。 In addition, the upper and lower cover units 6 and 7 further include a detection window 64 respectively located on the upper and lower cover bodies 61 and 71 and corresponding to one end of the first vacuum groove 53. The detection window 64 is correspondingly disposed at the upper peripheral edge of the opening 52 of the center cover unit 5 for the appearance inspection device of the electronic component 9 or the visual inspection of the human eye.
該空氣源8與該上、下通氣口63、73、及該植入通氣口75連接，當該空氣源8作動會吸附靠近該第一、二、三真空通道60、70、50周圍的電子元件9，使其停止作動。 The air source 8 is connected to the upper and lower vents 63 and 73, and the implanted vent 75. When the air source 8 is actuated, it will adsorb the electrons near the first, second, and third vacuum channels 60, 70, and 50. Element 9 to stop it.
由於該電子元件9的體積小於該承載槽42，當該電子元件9位於該承載槽42中時，會受該空氣源8吸附而抵靠於該中心軸線420的左側，也就是位於該承載槽42的左側(如圖7所示)，以便於該電子元件9在同一位置且靜止狀態下穩地進行檢測或入料，進而提升檢測之準確性。 Since the volume of the electronic component 9 is smaller than the loading slot 42, when the electronic component 9 is located in the loading slot 42, it will be adsorbed by the air source 8 and abut against the left side of the center axis 420, that is, it is located in the loading slot. The left side of 42 (as shown in FIG. 7) is convenient for the electronic component 9 to perform stable detection or feeding in the same position and in a static state, thereby improving the accuracy of detection.
透過該第一、二、三真空通道60、70、50將該空氣源8之真空導引至該承載槽42旁，其中，該第一真空通道60旁之電子元件9朝圖7中的實心單箭頭方向吸 附，該第二真空通道70旁之電子元件9朝圖7中的實心雙箭頭方向吸附，而該第三真空通道50旁之電子元件9則朝圖7中的空心單箭頭方向吸附，使該電子元件9平穩地抵靠於該承載槽42的左側，藉此固定該電子元件9的檢測或入料位置，以提升缺陷檢測之準確性。 Through the first, second, and third vacuum channels 60, 70, and 50, the vacuum of the air source 8 is guided to the side of the bearing groove 42, wherein the electronic component 9 next to the first vacuum channel 60 faces the solid in FIG. Single arrow direction suction In addition, the electronic component 9 next to the second vacuum channel 70 is attracted in the direction of the solid double arrow in FIG. 7, and the electronic component 9 next to the third vacuum channel 50 is attracted in the direction of the hollow single arrow in FIG. 7. The electronic component 9 steadily abuts against the left side of the bearing slot 42, thereby fixing the detection or feeding position of the electronic component 9 to improve the accuracy of defect detection.
綜上所述，本新型電子元件的輔助吸引裝置，藉以該入料單元1、該導引單元2、該吸附件3、該轉動單元4、該中心蓋單元5、該上蓋單元6、該下蓋單元7，及該空氣源8間相互設置，透過該氣流通道20將該吸附件3之真空導引至該側吸口24，再由該側吸口24先吸附欲進入該承載槽42之第一、二順位的電子元件9，之後由該阻擋件14將兩者分離，使該電子元件9得以平整地進入該承載槽42中，而該第一、二、三真空通道60、70、50將該空氣源8之真空導引至該承載槽42旁，使該電子元件9平穩地抵靠於該承載槽42的左側，藉此固定該電子元件9的檢測或入料位置，以提升缺陷檢測之準確性，故確實可以達成本新型之目的。 To sum up, the auxiliary suction device of the novel electronic component is based on the feeding unit 1, the guiding unit 2, the suction member 3, the rotating unit 4, the center cover unit 5, the upper cover unit 6, and the bottom The cover unit 7 and the air source 8 are arranged mutually, and the vacuum of the adsorption member 3 is guided to the side suction port 24 through the air flow channel 20, and then the side suction port 24 first adsorbs the first to be entered into the bearing groove 42 And two-rank electronic components 9, and then the two are separated by the blocking member 14, so that the electronic components 9 can enter the loading slot 42 smoothly, and the first, second, and third vacuum channels 60, 70, and 50 will The vacuum of the air source 8 is guided to the side of the carrying slot 42 so that the electronic component 9 can be smoothly abutted against the left side of the carrying slot 42, thereby fixing the detection or feeding position of the electronic component 9 to improve defect detection. Accuracy, it can indeed achieve the purpose of a new type of cost.
惟以上所述者，僅為本新型之較佳實施例而已，當不能以此限定本新型實施之範圍，即大凡依本新型申請專利範圍及新型說明內容所作之簡單的等效變化與修飾，皆仍屬本新型專利涵蓋之範圍內。 However, the above are only the preferred embodiments of the new model. When the scope of implementation of the new model cannot be limited in this way, that is, the simple equivalent changes and modifications made according to the scope of the patent application and the description of the new model, All are still covered by the new patent.
Claims (10)
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| Application Number | Priority Date | Filing Date | Title |
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| TW108205001U TWM586455U (en) | 2019-04-23 | 2019-04-23 | Auxiliary sucking device of electronic elements |
| CN201921015766.1U CN210150235U (en) | 2019-04-23 | 2019-07-02 | Auxiliary suction device of electronic assembly |
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