TWM583048U - Lens quality detecting device and system thereof - Google Patents
Lens quality detecting device and system thereof Download PDFInfo
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- TWM583048U TWM583048U TW108202205U TW108202205U TWM583048U TW M583048 U TWM583048 U TW M583048U TW 108202205 U TW108202205 U TW 108202205U TW 108202205 U TW108202205 U TW 108202205U TW M583048 U TWM583048 U TW M583048U
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Abstract
一種鏡頭品質檢測裝置及其系統，係包括一載台及一鏡頭品質檢測裝置，該載台形成至少一貫孔，至少一待測鏡頭對應容設於該貫孔內，該鏡頭品質檢測裝置對應設置於所述載台一側，該鏡頭品質檢測裝置包括一架體及一圖樣產生裝置及一鏡頭模組，該圖樣產生裝置設置於該架體上並具有一基板及至少一發光單元，該發光單元對應設置於該基板上，該圖樣產生裝置係用以提供一圖樣光束，該鏡頭模組對應設置於該架體上並設於所述圖樣產生裝置上方，該鏡頭模組一端與所述發光單元相對應並接收所述圖樣光束再傳遞至該鏡頭模組另一端再傳遞至所述待測鏡頭。 A lens quality detecting device and a system thereof, comprising a loading platform and a lens quality detecting device, wherein the loading platform forms at least a consistent hole, and at least one lens to be tested is correspondingly disposed in the through hole, and the lens quality detecting device is correspondingly disposed. On the side of the stage, the lens quality detecting device includes a frame body, a pattern generating device and a lens module. The pattern generating device is disposed on the frame body and has a substrate and at least one light emitting unit. The unit is disposed on the substrate, and the pattern generating device is configured to provide a pattern light beam. The lens module is disposed on the frame body and disposed above the pattern generating device, and the lens module has one end and the light emitting unit. The unit corresponds to and receives the pattern beam and transmits it to the other end of the lens module and then to the lens to be tested.
Description
本創作是有關於一種鏡頭品質檢測裝置及其系統，尤指一種可大幅增加檢測便利性並避免圖樣產生裝置碰撞造成的損毀之鏡頭品質檢測裝置及其系統。 The present invention relates to a lens quality detecting device and a system thereof, and more particularly to a lens quality detecting device and a system thereof which can greatly increase the convenience of detection and avoid damage caused by collision of a pattern generating device.
隨著鏡頭模組之尺寸日益縮小，傳統的鏡頭測試機台在進行測試便會遇到檢測瓶頸。請參閱第1圖，係為傳統的鏡頭品質檢測系統1，晶圓級鏡頭模組10的背焦距相較於傳統的鏡頭模組短，且尺寸亦遠小於傳統的鏡頭模組，因此傳統的鏡頭測試機台11在對晶圓級鏡頭模組10進行光學測試時，圖樣產生裝置12的凸部120需進入貫孔13以進行圖樣光束14之投射，如此便容易發生圖樣產生裝置12去碰撞到鏡頭測試機台11的左右兩側，而導致圖樣產生裝置12的損毀。 As the size of the lens module is shrinking, the traditional lens test machine will encounter a detection bottleneck when testing. Referring to FIG. 1 , which is a conventional lens quality detecting system 1 , the back focus of the wafer level lens module 10 is shorter than that of the conventional lens module, and the size is much smaller than that of the conventional lens module, so the conventional When the lens test machine 11 optically tests the wafer level lens module 10, the convex portion 120 of the pattern generating device 12 needs to enter the through hole 13 to project the pattern light beam 14, so that the pattern generating device 12 is easily collided. The left and right sides of the lens test machine 11 are caused to cause damage to the pattern generating device 12.
此外，若必須檢測下一個待測鏡頭模組10時，需先將鏡頭測試機台11遠離圖樣產生裝置12後再水平移動該頭測試機台11以至下一個待測的鏡頭模組10進行檢測，因此，在檢測過程中會產生兩個動作，故所花費的檢測時間也相對較長並且檢測過程也非常不便利。 In addition, if it is necessary to detect the next lens module 10 to be tested, the lens testing machine 11 is first moved away from the pattern generating device 12, and then the head testing machine 11 is horizontally moved to the next lens module 10 to be tested. Therefore, two actions are generated during the detection process, so the detection time taken is relatively long and the detection process is also very inconvenient.
是以，要如何解決上述習用之問題與缺失，即為本案之創作人與從事此行業之相關廠商所亟欲研究改善之方向所在者。 Therefore, how to solve the above problems and problems in the past, that is, the creators of the case and the relevant manufacturers engaged in this industry are eager to study the direction of improvement.
爰此，為有效解決上述之問題，本創作之主要目的在於提供一種可大幅增加檢測便利性之鏡頭品質檢測裝置。 Therefore, in order to effectively solve the above problems, the main purpose of the present invention is to provide a lens quality detecting device which can greatly increase the convenience of detection.
本創作之次要目的，在於提供一種可大幅縮短檢測時間之鏡頭品質檢測裝置。 The second objective of this creation is to provide a lens quality detecting device that can significantly shorten the detection time.
本創作之次要目的，在於提供一種避免圖樣產生裝置之碰撞所造成的損毀之鏡頭品質檢測裝置。 A secondary object of the present invention is to provide a lens quality detecting device that avoids damage caused by collision of a pattern generating device.
本創作之次要目的，在於提供一種可大幅增加檢測便利性之鏡頭品質檢測系統。 The second objective of this creation is to provide a lens quality detection system that can greatly increase the convenience of detection.
本創作之次要目的，在於提供一種可大幅縮短檢測時間之鏡頭品質檢測系統。 The second objective of this creation is to provide a lens quality detection system that can significantly reduce the detection time.
本創作之次要目的，在於提供一種避免圖樣產生裝置之碰撞所造成的損毀之鏡頭品質檢測系統。 The second objective of the present invention is to provide a lens quality detecting system that avoids damage caused by collision of the pattern generating device.
為達上述目的，本創作係提供一種鏡頭品質檢測裝置，係包括一架體及一圖樣產生裝置及一鏡頭模組，該圖樣產生裝置對應設置於該架體上，該圖樣產生裝置具有一基板及至少一發光單元，該發光單元對應設置於該基板上，該圖樣產生裝置係用以提供一圖樣光束，該鏡頭模組對應設置於該架體上並設於所述圖樣產生裝置上方，該鏡頭模組一端與所述發光單元相對應並接收所述圖樣光束再傳遞至該鏡頭模組另一端。 In order to achieve the above object, the present invention provides a lens quality detecting device, which comprises a frame body and a pattern generating device and a lens module. The pattern generating device is correspondingly disposed on the frame body, and the pattern generating device has a substrate. And the at least one illuminating unit is disposed on the substrate, the pattern generating device is configured to provide a pattern light beam, and the lens module is disposed on the frame body and disposed above the pattern generating device. One end of the lens module corresponds to the light emitting unit and receives the pattern light beam and transmits the light beam to the other end of the lens module.
為達上述目的，本創作係提供一種鏡頭品質檢測系統，係包括一載台及一鏡頭品質檢測裝置，該載台係形成至少一貫孔，至少一待測鏡頭對應容設於該貫孔內，該鏡頭品質檢測裝置對應設置於所述載台一 側，該鏡頭品質檢測裝置包括一架體及一圖樣產生裝置及一鏡頭模組，該圖樣產生裝置設置於該架體上並具有一基板及至少一發光單元，該發光單元對應設置於該基板上，該圖樣產生裝置係用以提供一圖樣光束，該鏡頭模組對應設置於該架體上並設於所述圖樣產生裝置上方，該鏡頭模組一端與所述發光單元相對應並接收所述圖樣光束再傳遞至該鏡頭模組另一端再傳遞至所述待測鏡頭。 In order to achieve the above object, the present invention provides a lens quality detecting system, which comprises a loading stage and a lens quality detecting device, wherein the loading platform forms at least a consistent hole, and at least one lens to be tested is correspondingly received in the through hole. The lens quality detecting device is correspondingly disposed on the stage The lens quality detecting device includes a frame body and a pattern generating device and a lens module. The pattern generating device is disposed on the frame body and has a substrate and at least one light emitting unit. The light emitting unit is correspondingly disposed on the substrate. The pattern generating device is configured to provide a pattern beam, and the lens module is disposed on the frame body and disposed above the pattern generating device, and the lens module corresponds to the light emitting unit at one end and receives the image. The pattern beam is transmitted to the other end of the lens module and then transmitted to the lens to be tested.
透過本創作此結構的設計，當待測鏡頭進行MTF(Modulation Transfer Function，調制轉換函數)測試時，藉由該鏡頭品質檢測裝置之鏡頭模組一端接收該圖樣產生裝置的圖樣光束後再傳遞至該鏡頭模組另一端後，再將該圖樣光束從遠端投射至所述待測鏡頭上後，再投射至一感光裝置上，進而完成鏡頭品質檢測作業，如此一來，透過該鏡頭模組的遠端投射方式，可避免習知圖樣產生裝置必須伸入所述貫孔進行圖樣光束投射時而造成該圖樣產生裝置容易碰撞到機台所產生的損毀問題，除此之外，於MTF測試過程中，也無須先將該載台遠離該圖樣產生裝置後再水平移動載台以至下一個待測鏡頭進行檢測(會產生兩個動作)而造成的時間花費問題，因此本創作可大幅縮減檢測時間並增加檢測便利性。 Through the design of the structure of the present invention, when the lens to be tested is subjected to the MTF (Modulation Transfer Function) test, the lens module of the lens quality detecting device receives the pattern beam of the pattern generating device and transmits it to the image beam. After the other end of the lens module, the pattern beam is projected from the far end to the lens to be tested, and then projected onto a photosensitive device to complete the lens quality detecting operation, so that the lens module is passed through the lens module. The far-end projection method can avoid the problem that the conventional pattern generating device must protrude into the through-hole to project the pattern beam, thereby causing the pattern generating device to easily collide with the machine, and in addition, in the MTF test process In this case, there is no need to first move the stage away from the pattern generating device and then move the stage horizontally to the next lens to be tested for detection (two actions will occur), so the creation time can greatly reduce the detection time. And increase the convenience of detection.
1‧‧‧鏡頭品質檢測系統 1‧‧‧Lens quality inspection system
10‧‧‧鏡頭模組 10‧‧‧Lens module
11‧‧‧機台 11‧‧‧ machine
12‧‧‧圖樣產生裝置 12‧‧‧ pattern generating device
13‧‧‧貫孔 13‧‧‧Tongkong
14‧‧‧圖樣光束 14‧‧‧ pattern beam
2‧‧‧鏡頭品質檢測裝置 2‧‧‧Lens quality inspection device
20‧‧‧架體 20‧‧‧ ‧ body
200‧‧‧底座 200‧‧‧Base
201‧‧‧背板 201‧‧‧ Backplane
202‧‧‧固定台 202‧‧‧ fixed table
203‧‧‧孔洞 203‧‧‧ hole
21‧‧‧支撐件 21‧‧‧Support
210‧‧‧容納部 210‧‧‧ Housing
22‧‧‧保護蓋 22‧‧‧ protective cover
220‧‧‧洞孔 220‧‧‧ hole
23‧‧‧承載板 23‧‧‧Loading board
24‧‧‧調節件 24‧‧‧Adjustment
3‧‧‧圖樣產生裝置 3‧‧‧ pattern generating device
30‧‧‧基板 30‧‧‧Substrate
31‧‧‧發光單元 31‧‧‧Lighting unit
32‧‧‧圖樣光束 32‧‧‧ pattern beam
4‧‧‧鏡頭模組 4‧‧‧Lens module
40‧‧‧第一端 40‧‧‧ first end
41‧‧‧第二端 41‧‧‧ second end
5‧‧‧鏡頭品質檢測系統 5‧‧‧Lens quality inspection system
50‧‧‧載台 50‧‧‧ stage
51‧‧‧貫孔 51‧‧‧through holes
6‧‧‧待測鏡頭 6‧‧‧Densor to be tested
7‧‧‧感光裝置 7‧‧‧Photosensitive device
第1圖係為習知鏡頭品質檢測裝置之局部剖視圖；第2圖係為本創作鏡頭品質檢測裝置之立體分解圖；第3圖係為本創作鏡頭品質檢測裝置之立體組合圖；第4圖係為本創作鏡頭品質檢測系統之俯視圖； 第5圖係為本創作鏡頭品質檢測系統之實施示意圖。 1 is a partial cross-sectional view of a conventional lens quality detecting device; FIG. 2 is an exploded perspective view of the creative lens quality detecting device; and FIG. 3 is a three-dimensional combined view of the creative lens quality detecting device; Is a top view of the creative lens quality inspection system; Figure 5 is a schematic diagram of the implementation of the creative lens quality detection system.
本創作之上述目的及其結構與功能上的特性，將依據所附圖式之較佳實施例予以說明。 The above object of the present invention, as well as its structural and functional features, will be described in accordance with the preferred embodiments of the drawings.
請參閱第2、3圖，係為本創作鏡頭品質檢測裝置之立體分解圖及立體組合圖，如圖所示，一種鏡頭品質檢測裝置2，係包括一架體20及一圖樣產生裝置3及一鏡頭模組4，該架體20具有一底座200及一背板201及一固定台202，該背板201的一端對應設置於該底座200上，該背板201的另一端設置所述固定台202，於該固定台202中央處形成有一孔洞203，該孔洞203用以設置該鏡頭模組4。 Please refer to the second and third figures, which are an exploded perspective view and a three-dimensional combination diagram of the creative lens quality detecting device. As shown in the figure, a lens quality detecting device 2 includes a frame body 20 and a pattern generating device 3 and A lens module 4, the frame body 20 has a base 200 and a back plate 201 and a fixed base 202. One end of the back plate 201 is correspondingly disposed on the base 200, and the other end of the back plate 201 is fixed. The stage 202 has a hole 203 formed in the center of the fixing base 202 for arranging the lens module 4.
於該底座200上再設置有一支撐件21，支撐件21頂部對應設有一容納部210，所述圖樣產生裝置3對應設於該容納部210處，該保護蓋22設於該背板201上並對應蓋設該支撐件21之頂部，該圖樣產生裝置3具有一基板30及至少一發光單元31，該發光單元31對應設置於該基板30上，該圖樣產生裝置3係用以提供一圖樣光束32(請參閱第5圖)，所述鏡頭模組4裝設於該孔洞203後而被固定在固定台202上，並且與該圖樣產生裝置3相對應設置，於本實施例中，該保護蓋22還開設有一洞孔220(如第3圖所示)，而得以令所述圖樣產生裝置3的圖樣光束32係穿過該洞孔220傳送至該鏡頭模組4的一端再傳遞至該鏡頭模組4的另一端。 A support member 21 is further disposed on the base 200. The top of the support member 21 is correspondingly disposed with a receiving portion 210. The pattern generating device 3 is disposed at the receiving portion 210. The protective cover 22 is disposed on the back plate 201. Correspondingly, the pattern generating device 3 has a substrate 30 and at least one light emitting unit 31. The light emitting unit 31 is correspondingly disposed on the substrate 30. The pattern generating device 3 is configured to provide a pattern beam. 32 (refer to FIG. 5), the lens module 4 is mounted on the fixing base 202 after being installed in the hole 203, and is disposed corresponding to the pattern generating device 3. In the embodiment, the protection is provided. The cover 22 also defines a hole 220 (as shown in FIG. 3), so that the pattern beam 32 of the pattern generating device 3 is transmitted through the hole 220 to one end of the lens module 4 and then transmitted to the cover. The other end of the lens module 4.
進一步說明，該鏡頭模組4具有一第一端40及一第二端41，該圖樣產生裝置3的圖樣光束32係穿過該保護蓋22的洞孔220後經由該第一端40進入並傳遞至該第二端41位置處，於本創作中，須說明的是，所述鏡 頭模組4可以是由兩個接物鏡頭相互對接所構成，亦或可以是由一個中繼鏡頭所構成，更詳細地說明，不論是兩接物鏡頭或一中繼鏡頭，所述鏡頭模組4內的鏡頭所投射出的光線皆為平行光設計，因此，任何能使該鏡頭模組4內投射出平行光皆包含於本創作之範圍內，合先敘明；另外，該架體20還具有至少一承載板23及至少一調節件24，所述支撐件21對應設置於該承載板23上，該調節件24係用以調節該承載板23進而可帶動並調整該支撐件21上的圖樣產生裝置3相對該鏡頭模組4的垂直距離。 Further, the lens module 4 has a first end 40 and a second end 41. The pattern beam 32 of the pattern generating device 3 passes through the hole 220 of the protective cover 22 and enters through the first end 40. Passed to the position of the second end 41. In the present creation, it should be noted that the mirror The head module 4 may be formed by two docking lenses facing each other, or may be composed of a relay lens. More specifically, whether it is a two-piece lens or a relay lens, the lens module The light projected by the lens in group 4 is designed as parallel light. Therefore, any parallel light projected in the lens module 4 can be included in the scope of the creation, and the frame is first described; The support member 21 is further disposed on the carrier plate 23, and the adjusting member 24 is used to adjust the carrier plate 23 to further drive and adjust the support member 21. The vertical distance of the upper pattern generating device 3 relative to the lens module 4.
續請一併參閱第4、5圖，係為本創作鏡頭品質檢測系統5之俯視圖及實施示意圖，該鏡頭品質檢測系統5包括有一載台50及前述說明的鏡頭品質檢測裝置2，該載台50形成至少一貫孔51，至少一待測鏡頭6對應容設於該貫孔51內並被該載台50支撐住，更詳細地說，該待測鏡頭6即為欲檢測的鏡頭。 Continuing to refer to Figures 4 and 5, which are top views and implementation diagrams of the inventive lens quality inspection system 5, the lens quality detection system 5 includes a stage 50 and the lens quality detecting device 2 described above, the stage The at least one lens 16 to be tested is correspondingly received in the through hole 51 and supported by the stage 50. In more detail, the lens 6 to be tested is the lens to be detected.
其中，前述載台50可選擇為一金屬板材或一塑膠板材或一半導體板材或一玻璃板材，該貫孔51形成的方式可以選擇利用車床技術、雷射加工、沖壓技術、半導體蝕刻或其他加工技術，而形成貫孔51的技術需視該機台選用何種材質而定，並不以前述技術為限，此外，該貫孔51的寬度並無固定，此會隨著須檢測之待測鏡頭6之寬度而定。 The carrier 50 can be selected as a metal plate or a plastic plate or a semiconductor plate or a glass plate. The through hole 51 can be formed by using lathe technology, laser processing, stamping technology, semiconductor etching or other processing. The technique of forming the through hole 51 depends on which material is selected for the machine, and is not limited to the above technology. Moreover, the width of the through hole 51 is not fixed, and this will be tested as it is to be tested. The width of the lens 6 depends on the width.
所述鏡頭品質檢測裝置2已於前述詳細說明故在此不再贅述，惟需特別說明的是所述圖樣光束32的投射路徑之差異，所述鏡頭模組4的第一端40對應與所述圖樣產生裝置3相對接並接收該圖樣產生裝置3的發光單元31發出的圖樣光束32之後，再將該圖樣光束32傳遞至該鏡頭模組4的 第二端41處，最後，再投射至所述待測鏡頭6處。 The lens quality detecting device 2 has been described in detail above, and will not be further described herein. However, the difference between the projection paths of the pattern light beams 32 and the first end 40 of the lens module 4 corresponds to After the pattern generating device 3 is opposite to the pattern light beam 32 emitted by the light emitting unit 31 of the pattern generating device 3, the pattern light beam 32 is transmitted to the lens module 4 At the second end 41, finally, it is projected to the lens 6 to be tested.
再續請參閱第5圖，於進行MTF(Modulation Transfer Function，調制轉換函數)測試時需搭配一感光裝置7，該感光裝置7係位於該載台50之另一側，其係用以接收通過該待測鏡頭6的圖樣光束32，進一步說明，藉由該鏡頭品質檢測裝置2之鏡頭模組4的第一端40接收該圖樣產生裝置3的圖樣光束32後再傳遞至該鏡頭模組4的第二端41，接著，該圖樣光束32從遠端投射至所述待測鏡頭6上，最後該圖樣光束32會通過該待測鏡頭6而傳遞至該感光裝置7，此時便可藉由分析投射至該感光裝置7的圖樣光束32來判斷該待測鏡頭6的成像品質，如此一來，透過該鏡頭模組4的遠端投射方式，可避免習知圖樣產生裝置3必須伸入所述貫孔51進行圖樣光束32投射時而造成該圖樣產生裝置3容易碰撞到機台所產生的損毀問題，除此之外，於MTF測試過程中，也無須先將該載台50遠離該圖樣產生裝置3後再水平移動載台50以至下一個待測鏡頭6進行檢測(會產生兩個動作)而造成的時間花費問題，因此本創作可大幅縮減檢測時間並增加檢測便利性。 Referring to FIG. 5 again, in the MTF (Modulation Transfer Function) test, a photosensitive device 7 is disposed, and the photosensitive device 7 is located on the other side of the stage 50 for receiving and passing. The pattern beam 32 of the lens 6 to be tested is further illustrated. The first end 40 of the lens module 4 of the lens quality detecting device 2 receives the pattern beam 32 of the pattern generating device 3 and transmits the pattern beam 32 to the lens module 4. The second end 41 is then projected from the distal end onto the lens 6 to be tested. Finally, the pattern beam 32 is transmitted to the photosensitive device 7 through the lens 6 to be tested. The image quality of the lens 6 to be tested is determined by analyzing the pattern light beam 32 projected onto the photosensitive device 7. Thus, the far-end projection mode of the lens module 4 can prevent the conventional pattern generating device 3 from reaching. When the through hole 51 is projected by the pattern light beam 32, the pattern generating device 3 easily collides with the damage caused by the machine table. In addition, during the MTF test, the stage 50 does not need to be moved away from the pattern. After generating device 3, re-water Mobile stage 50 as well as the next test shot 6 for testing (two actions will produce) and spent time caused problems, so this creation can significantly reduce the detection time and increase the detection convenience.
以上所述，本創作相較於習知具有下列優點：1.大幅增加檢測便利性；2.大幅縮短檢測時間；3.避免圖樣產生裝置之碰撞所造成的損毀。 As described above, the present invention has the following advantages as compared with the conventional ones: 1. greatly increasing the convenience of detection; 2. greatly shortening the detection time; 3. avoiding the damage caused by the collision of the pattern generating device.
以上已將本創作做一詳細說明，惟以上所述者，僅為本創作之一較佳實施例而已，當不能限定本創作實施之範圍，即凡依本創作申請範圍所作之均等變化與修飾等，皆應仍屬本創作之專利涵蓋範圍。 The above description has been made in detail, but the above is only a preferred embodiment of the present invention. When it is not possible to limit the scope of the creation of the creation, that is, the equivalent change and modification according to the scope of the present application. Etc., should still be covered by the patents of this creation.
Claims (9)
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW108202205U TWM583048U (en) | 2019-02-21 | 2019-02-21 | Lens quality detecting device and system thereof |
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| TW108202205U TWM583048U (en) | 2019-02-21 | 2019-02-21 | Lens quality detecting device and system thereof |
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| TWM583048U true TWM583048U (en) | 2019-09-01 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2022161756A1 (en) | 2021-02-01 | 2022-08-04 | Trioptics Gmbh | Device and method for measuring an optical property of an optical system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2022161756A1 (en) | 2021-02-01 | 2022-08-04 | Trioptics Gmbh | Device and method for measuring an optical property of an optical system |
| DE102021102246A1 (en) | 2021-02-01 | 2022-08-04 | Trioptics Gmbh | Device and method for measuring an optical property of an optical system |
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