TWM519218U - Circuit testing apparatus - Google Patents

Circuit testing apparatus Download PDF

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Publication number
TWM519218U
TWM519218U TW104219976U TW104219976U TWM519218U TW M519218 U TWM519218 U TW M519218U TW 104219976 U TW104219976 U TW 104219976U TW 104219976 U TW104219976 U TW 104219976U TW M519218 U TWM519218 U TW M519218U
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TW
Taiwan
Prior art keywords
electrical
circuit
light
substrate
testing device
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Application number
TW104219976U
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Chinese (zh)
Inventor
Ren-Hou Wang
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Suzonetech Co Ltd
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Publication date
Application filed by Suzonetech Co Ltd filed Critical Suzonetech Co Ltd
Priority to TW104219976U priority Critical patent/TWM519218U/en
Publication of TWM519218U publication Critical patent/TWM519218U/en

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Description

電路測試裝置 Circuit test device

本創作係有關於一種電路測試裝置。 This creation is about a circuit test device.

一般固定基礎(例如牆壁)在尚未裝設電器之前,通常會使電器安裝部及其內部之電源線路裸露設置,而為了便於觀視此電源線路是否電性導通,通常會於電器安裝部裝設如TWM508642所示之燈座,並於燈座上裝設鎢絲燈泡,透過燈座與鎢絲燈泡所組成之電路測試裝置,有便於人們由外觀視燈泡的明亮變化,進而得知此電源線路是否電性導通。 Generally, a fixed foundation (such as a wall) usually has an electrical installation line and its internal power supply line exposed before the electrical equipment is installed. In order to facilitate visual observation of whether the power supply line is electrically connected, it is usually installed in the electrical installation part. Such as the lamp holder shown in TWM508642, and the tungsten lamp bulb is installed on the lamp holder, and the circuit test device composed of the lamp holder and the tungsten wire bulb has a bright change for the light bulb of the appearance, so that the power line is known. Whether it is electrically conductive.

然而,此種電路測試裝置之鎢絲燈泡的體積較大而不易攜帶,且組裝時,須將燈座與鎢絲燈泡分別設置,十分不便利,存在亟待改善之缺弊。 However, the tungsten light bulb of such a circuit test device has a large volume and is not easy to carry, and the lamp holder and the tungsten filament bulb must be separately disposed during assembly, which is very inconvenient, and there is a drawback that needs to be improved.

因此,有必要提供一種新穎且具有進步性之電路測試裝置,以解決上述之問題。 Therefore, it is necessary to provide a novel and progressive circuit test apparatus to solve the above problems.

本創作之主要目的在於提供一種電路測試裝置,整體體積較小,攜帶及組裝上將更為便利。 The main purpose of this creation is to provide a circuit test device that is smaller in size and more convenient to carry and assemble.

為達成上述目的,本創作提供一種電路測試裝置,該電路測試裝置供組設於一固定基礎,該固定基礎設有一電器安裝部,該固定基礎 內部設有一電源線路,該電源線路之一端電性連接一外部電源、該電源線路之另一端設於該電器安裝部。該電路測試裝置包括一本體,該本體具有一供與該電器安裝部組接之組接部、一基板及一供電性連接該電源線路之整流電路,該基板設有至少一電性連接該整流電路之發光二極體,該整流電路供將由該電源線路傳入之一交流電轉換為一直流電並傳送至該至少一發光二極體而致使該至少一發光二極體發光,該至少一發光二極體之光源可射至外界。 In order to achieve the above object, the present invention provides a circuit testing device for being assembled on a fixed base, the fixed base being provided with an electrical installation portion, the fixed base A power line is disposed inside, and one end of the power line is electrically connected to an external power source, and the other end of the power line is disposed at the electrical installation portion. The circuit testing device includes a body having a connection portion for being assembled with the electrical device mounting portion, a substrate, and a rectifying circuit electrically connected to the power supply line, the substrate being provided with at least one electrical connection for the rectification a light-emitting diode of the circuit, wherein the rectifier circuit converts an alternating current that is transmitted from the power line into a continuous current and transmits the light to the at least one light-emitting diode to cause the at least one light-emitting diode to emit light, and the at least one light-emitting diode The source of the polar body can be emitted to the outside world.

1‧‧‧電路測試裝置 1‧‧‧Circuit test device

10‧‧‧本體 10‧‧‧ Ontology

11‧‧‧基板 11‧‧‧Substrate

110‧‧‧發光二極體 110‧‧‧Lighting diode

111‧‧‧第一側面 111‧‧‧ first side

112‧‧‧第二側面 112‧‧‧ second side

113‧‧‧電性插槽 113‧‧‧Electrical slot

12‧‧‧整流電路 12‧‧‧Rectifier circuit

13‧‧‧飾板 13‧‧‧Plate

140‧‧‧凹槽 140‧‧‧ Groove

141‧‧‧結合孔 141‧‧‧Combination hole

200‧‧‧固定基礎 200‧‧‧Fixed foundation

201‧‧‧電器安裝部 201‧‧‧Electrical Installation Department

202‧‧‧電源線路 202‧‧‧Power line

210‧‧‧外部電源 210‧‧‧External power supply

220‧‧‧螺固件 220‧‧‧Spiral firmware

1a‧‧‧電路測試裝置 1a‧‧‧Circuit test device

110a‧‧‧發光二極體 110a‧‧‧Lighting diode

130‧‧‧貫孔 130‧‧‧through holes

133‧‧‧肋部 133‧‧‧ ribs

14‧‧‧組接部 14‧‧‧Team

113a‧‧‧電性插槽 113a‧‧‧Electrical slot

12a‧‧‧整流電路 12a‧‧‧Rectifier circuit

15a‧‧‧開關部 15a‧‧‧Switch Department

圖1為本創作一較佳實施例之立體圖。 1 is a perspective view of a preferred embodiment of the present invention.

圖2為本創作一較佳實施例之分解圖。 2 is an exploded view of a preferred embodiment of the present invention.

圖3為本創作一較佳實施例之剖面圖。 Figure 3 is a cross-sectional view of a preferred embodiment of the present invention.

圖4為本創作一較佳實施例之電性關係方塊圖。 4 is a block diagram of an electrical relationship of a preferred embodiment of the present invention.

圖5為本創作另一較佳實施例之立體圖。 Figure 5 is a perspective view of another preferred embodiment of the present invention.

圖6為本創作另一較佳實施例之電性關係方塊圖。 FIG. 6 is a block diagram showing the electrical relationship of another preferred embodiment of the present invention.

以下將藉由較佳實施例說明本創作之結構特徵及其預期達成之功效,惟非用以限制本創作所欲保護之範疇,合先敘明。 The structural features of the present invention and the intended effects thereof will be described below by way of a preferred embodiment, but are not intended to limit the scope of the present invention.

請參考圖1至4,其顯示本創作之一較佳實施例,本創作之電路測試裝置1供組設於一固定基礎200(例如牆壁或天花板等),該固定基礎200設有一電器安裝部201,該固定基礎200內部設有一電源線路202。該電源線路202之一端電性連接一外部電源210,該電源線路202之另一端 設於該電器安裝部201。 Please refer to FIG. 1 to FIG. 4, which show a preferred embodiment of the present invention. The circuit test apparatus 1 of the present invention is provided on a fixed base 200 (such as a wall or a ceiling, etc.), and the fixed base 200 is provided with an electrical installation part. 201. The fixed base 200 is internally provided with a power line 202. One end of the power line 202 is electrically connected to an external power source 210, and the other end of the power line 202 It is provided in the electric appliance mounting part 201.

於本實施例,該電路測試裝置1包括一本體10,該本體10具有一供與該電器安裝部201組接之組接部14、一基板11及一供電性連接該電源線路202之整流電路12,該基板11設有至少一電性連接該整流電路12之發光二極體110,於本實施例,該基板11僅設有一發光二極體110(當然亦可設有多數個發光二極體)。 In the embodiment, the circuit testing device 1 includes a body 10 having a connecting portion 14 for being assembled with the electrical device mounting portion 201, a substrate 11 and a rectifying circuit for electrically connecting the power supply line 202. 12, the substrate 11 is provided with at least one light-emitting diode 110 electrically connected to the rectifier circuit 12. In the embodiment, the substrate 11 is only provided with a light-emitting diode 110 (of course, a plurality of light-emitting diodes may be provided body).

該整流電路12供將由該電源線路202傳入之一交流電轉換為一直流電並傳送至該至少一發光二極體110而致使該至少一發光二極體110發光,該至少一發光二極體110之光源可射至外界。要說明的是,該基板11係為電路基板,而該整流電路12係佈設於該基板11(整流電路亦可為另外設置之整流器)。 The rectifier circuit 12 converts an alternating current that is transmitted from the power line 202 into a continuous current and transmits the light to the at least one light emitting diode 110 to cause the at least one light emitting diode 110 to emit light. The at least one light emitting diode 110 The light source can be emitted to the outside world. It should be noted that the substrate 11 is a circuit substrate, and the rectifier circuit 12 is disposed on the substrate 11 (the rectifier circuit may be a separately provided rectifier).

於本實施例,該本體10另包括一蓋設於該基板11之飾板13,該飾板13與該基板11相連接(可例如為相卡接或黏接),該飾板13設有該組接部14,如此一來,該飾板13、該基板11與該至少一發光二極體110係為相連接而成一體之裝置,透過該組接部14可使該電路測試裝置1便於組裝或拆卸。更進一步說,該電器安裝部201係為電氣盒,該電源線路202穿設於該電氣盒而可供電性連接該整流電路12,該飾板13藉由該組接部14而供與該電氣盒相組接。 In this embodiment, the body 10 further includes a fascia 13 that is disposed on the substrate 11. The fascia 13 is connected to the substrate 11 (for example, a phase is stuck or bonded), and the plaque 13 is provided. The splicing portion 14 , the slab 13 , the substrate 11 and the at least one illuminating diode 110 are integrally connected to each other, and the circuit testing device 1 can be transmitted through the connecting portion 14 . Easy to assemble or disassemble. Furthermore, the electrical installation unit 201 is an electrical box. The power supply line 202 is disposed in the electrical box and is electrically connected to the rectifier circuit 12. The trim 13 is supplied to the electrical component by the assembly 14 The boxes are assembled.

為了將該電路測試裝置1組裝於該電器安裝部201,該組接部14包括有二結合孔141,該二結合孔141相對地貫設於該本體10,各該結合孔141供一螺固件220與該電器安裝部201相螺鎖,而可便於組裝。更明確地說,該飾板13凹設有二凹槽140,各該凹槽140之剖面概呈由該飾 板13之中心向周緣漸縮之錐狀,該二凹槽140分別穿設有一該結合孔141,各該結合孔141供一該螺固件220與該電氣盒(電器安裝部201)相螺鎖。更進一步說,該二結合孔141概呈橢圓狀,且該二結合孔141之長軸位於同一直線方向上,如此一來,使用者可依據該電器安裝部201之大小而調整各該螺固件220於各該結合孔141之位置。 In order to assemble the circuit test device 1 to the electrical device mounting portion 201, the assembly portion 14 includes two coupling holes 141. The two coupling holes 141 are oppositely disposed on the body 10. Each of the coupling holes 141 is provided with a screw. The screw 220 is screwed to the electric appliance mounting portion 201 to facilitate assembly. More specifically, the fascia 13 is recessed with two recesses 140, and each of the recesses 140 has a cross section. The center of the plate 13 is tapered toward the circumference. The two recesses 140 are respectively formed with a coupling hole 141. Each of the coupling holes 141 is configured to screw the screw 220 to the electrical box (the electrical component mounting portion 201). . Furthermore, the two coupling holes 141 are substantially elliptical, and the long axes of the two coupling holes 141 are in the same linear direction. Thus, the user can adjust the screws according to the size of the electrical installation portion 201. 220 is located at each of the bonding holes 141.

進一步說,該飾板13係為遠離該基板11而外凸之弧狀飾板,該飾板13形成有一肋部133,該肋部133與該基板11相抵接,使該基板11可平穩地設於該飾板13。除此之外,該飾板13設有至少一貫孔130,各該發光二極體110穿設於一該貫孔130而顯露於外。於其他實施例,飾板亦可不用設置貫孔,僅要將飾板設有透光部(鏤空或透光材質),同樣可使光線透出。 Further, the plaque 13 is an arc-shaped slab that is convex away from the substrate 11. The fascia 13 is formed with a rib 133 that abuts the substrate 11 so that the substrate 11 can be smoothly It is provided on the fascia 13. In addition, the fascia 13 is provided with at least a uniform hole 130, and each of the illuminating diodes 110 is disposed through the through hole 130 to be exposed. In other embodiments, the decorative plate may not be provided with a through hole, and the decorative plate only needs to have a light transmitting portion (hollow or light-transmitting material), and light can also be transmitted.

該基板11之相對二側面分別定義為一第一側面111及一第二側面112,各該發光二極體110設於該第一側面111,該飾板13蓋設於該第一側面111且可顯露各該發光二極體110,該第二側面112設有一與該整流電路12電性連接之電性插槽113,該電性插槽113可供該電源線路202電性插接,透過電性插接之方式可使該電路測試裝置1便於組裝於電器安裝部201(當然亦可以焊接之方式而電性連接)。 The two sides of the substrate 11 are defined as a first side surface 111 and a second side surface 112. The light emitting diodes 110 are disposed on the first side surface 111, and the fascia 13 is disposed on the first side surface 111. Each of the light-emitting diodes 110 can be exposed. The second side 112 is electrically connected to the rectifier circuit 12. The electrical slot 113 can be electrically connected to the power line 202. The electrical plugging method can facilitate the assembly of the circuit testing device 1 to the electrical device mounting portion 201 (of course, it can be electrically connected by soldering).

請參考圖5至6,其顯示另一實施例之電路測試裝置1a,與圖1至4之電路測試裝置1相比,該電路測試裝置1a於電性插槽113a與至少一發光二極體110a之間還電性連接有一開關部15a,該開關部15a可控制該電性插槽113a與該至少一發光二極體110a電性導通或不導通,透過該開關部15a可更為方便地控制該電路測試裝置1a之狀態。更進一步說,該開 關部15a係設於該電性插槽113a與整流電路12a之間;於其它實施例,開關部亦可設於整流電路與發光二極體之間;抑或是,開關部為整流電路之一部分。 Referring to FIGS. 5-6, a circuit testing device 1a of another embodiment is shown. Compared with the circuit testing device 1 of FIGS. 1 to 4, the circuit testing device 1a is electrically socket 113a and at least one LED. The switch portion 15a is electrically connected to the at least one LED 110a. The state of the circuit test device 1a is controlled. Further, the opening The switch portion 15a is disposed between the electrical socket 113a and the rectifier circuit 12a. In other embodiments, the switch portion may be disposed between the rectifier circuit and the light emitting diode; or the switch portion is a part of the rectifier circuit .

綜上,本創作電路測試裝置,整體體積較小,攜帶及組裝上將更為便利。 In summary, the original circuit test device has a smaller overall size and is more convenient to carry and assemble.

綜上所述,本創作之整體結構設計、實用性及效益上,確實是完全符合產業上發展所需,且所揭露之結構創作亦是具有前所未有的創新構造,所以其具有「新穎性」應無疑慮,又本創作可較之習知結構更具功效之增進,因此亦具有「進步性」,其完全符合我國專利法有關新型專利之申請要件的規定,乃依法提起專利申請,並敬請 鈞局早日審查,並給予肯定。 In summary, the overall structural design, practicality and efficiency of this creation are indeed in full compliance with the needs of industrial development, and the disclosed structural creation is also an unprecedented innovative structure, so it has a "novelty" should Undoubtedly, this creation can be more effective than the conventional structure. Therefore, it is also "progressive". It fully complies with the requirements of the application requirements for new patents in the Chinese Patent Law. It is a patent application in accordance with the law, and please The bureau will review it early and give it affirmation.

11‧‧‧基板 11‧‧‧Substrate

110‧‧‧發光二極體 110‧‧‧Lighting diode

13‧‧‧飾板 13‧‧‧Plate

130‧‧‧貫孔 130‧‧‧through holes

14‧‧‧組接部 14‧‧‧Team

140‧‧‧凹槽 140‧‧‧ Groove

141‧‧‧結合孔 141‧‧‧Combination hole

200‧‧‧固定基礎 200‧‧‧Fixed foundation

201‧‧‧電器安裝部 201‧‧‧Electrical Installation Department

202‧‧‧電源線路 202‧‧‧Power line

220‧‧‧螺固件 220‧‧‧Spiral firmware

Claims (10)

一種電路測試裝置,供組設於一固定基礎,該固定基礎設有一電器安裝部,該固定基礎內部設有一電源線路,該電源線路之一端電性連接一外部電源、該電源線路之另一端設於該電器安裝部,該電路測試裝置包括:一本體,具有一供與該電器安裝部組接之組接部、一基板及一供電性連接該電源線路之整流電路,該基板設有至少一電性連接該整流電路之發光二極體,該整流電路供將由該電源線路傳入之一交流電轉換為一直流電並傳送至該至少一發光二極體而致使該至少一發光二極體發光,該至少一發光二極體之光源可射至外界。 A circuit testing device is provided on a fixed base. The fixed base is provided with an electrical installation portion. The fixed base is internally provided with a power line. One end of the power line is electrically connected to an external power source, and the other end of the power line is provided. In the electrical device mounting portion, the circuit testing device includes: a body having a connecting portion for being assembled with the electrical device mounting portion, a substrate, and a rectifying circuit electrically connected to the power supply line, the substrate being provided with at least one Electrically connecting the light-emitting diode of the rectifier circuit, the rectifier circuit is configured to convert an alternating current input from the power line into a continuous current and transmit the light to the at least one light-emitting diode to cause the at least one light-emitting diode to emit light, The light source of the at least one light emitting diode can be emitted to the outside. 如請求項1所述的電路測試裝置,其中該本體另包括一蓋設於該基板之飾板,該飾板與該基板相連接,該飾板設有該組接部。 The circuit testing device of claim 1, wherein the body further comprises a fascia covering the substrate, the plaque being connected to the substrate, the plaque being provided with the assembly. 如請求項2所述的電路測試裝置,其中該電器安裝部係為電氣盒,該電源線路穿設於該電氣盒而可供電性連接該整流電路,該飾板藉由該組接部而供與該電氣盒相組接。 The circuit testing device of claim 2, wherein the electrical installation portion is an electrical box, the power supply line is disposed in the electrical box and is electrically connectable to the rectifier circuit, and the decorative panel is provided by the connection portion Connected to the electrical box. 如請求項3所述的電路測試裝置,其中該飾板凹設有二凹槽,該組接部包括二結合孔,該二結合孔分別穿設於一該凹槽,各該結合孔供一螺固件與該電氣盒相螺鎖。 The circuit test device of claim 3, wherein the fascia is recessed with two recesses, the set of joints includes two joint holes, and the two joint holes are respectively disposed in the groove, and each of the joint holes is provided The screw is screwed to the electrical box. 如請求項1所述的電路測試裝置,其中該組接部包括有二結合孔,該二結合孔相對地貫設於該本體,各該結合孔供一螺固件與該電器安裝部相螺鎖,該二結合孔概呈橢圓狀,且該二結合孔之長軸位於同一直線方向上。 The circuit testing device of claim 1, wherein the set of joints includes two coupling holes, the two coupling holes are oppositely disposed on the body, and the coupling holes are provided with a screw to be screwed with the electrical installation portion. The two bonding holes are substantially elliptical, and the long axes of the two bonding holes are in the same linear direction. 如請求項2所述的電路測試裝置,其中該飾板設有至少一貫孔,各該發 光二極體穿設於一該貫孔而顯露於外。 The circuit testing device of claim 2, wherein the plaque is provided with at least a consistent aperture, each of the hair The light diode is exposed to the through hole and exposed. 如請求項2所述的電路測試裝置,其中該基板之相對二側面分別定義為一第一側面及一第二側面,各該發光二極體設於該第一側面,該飾板蓋設於該第一側面且可顯露各該發光二極體,該第二側面設有一與該整流電路電性連接之電性插槽,該電性插槽可供該電源線路電性插接。 The circuit test device of claim 2, wherein the opposite sides of the substrate are defined as a first side and a second side, each of the light emitting diodes is disposed on the first side, and the fascia is disposed on the first side The first side surface and the light emitting diodes are exposed, and the second side is provided with an electrical socket electrically connected to the rectifying circuit, and the electrical slot is electrically connected to the power line. 如請求項1所述的電路測試裝置,其中該基板設有一與該整流電路電性連接之電性插槽,該電性插槽供該電源線路電性插接。 The circuit test device of claim 1, wherein the substrate is provided with an electrical socket electrically connected to the rectifier circuit, and the electrical socket is electrically connected to the power line. 如請求項8所述的電路測試裝置,其中於該電性插槽與該至少一發光二極體之間還電性連接有一開關部,該開關部可控制該電性插槽與該至少一發光二極體電性導通或不導通。 The circuit testing device of claim 8, wherein a switch portion is electrically connected between the electrical socket and the at least one light emitting diode, and the switch portion can control the electrical socket and the at least one The light-emitting diode is electrically conductive or non-conductive. 如請求項1所述的電路測試裝置,其中該本體另包括一蓋設於該基板之飾板,該飾板設有該組接部,該飾板係為遠離該基板而外凸之弧狀飾板;該飾板凹設有二凹槽,各該凹槽之剖面概呈由該飾板之中心向周緣漸縮之錐狀;該飾板形成有一肋部,該肋部與該基板相抵接。 The circuit testing device of claim 1, wherein the body further comprises a decorative plate disposed on the substrate, the decorative plate is provided with the connecting portion, and the decorative plate is curved outwardly away from the substrate. a plaque; the fascia is recessed with two grooves, and each of the grooves has a tapered shape which is tapered from a center of the plaque toward the periphery; the plaque is formed with a rib, and the rib is opposite to the substrate Pick up.
TW104219976U 2015-12-11 2015-12-11 Circuit testing apparatus TWM519218U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD195142S (en) 2017-04-28 2019-01-01 日商阿德潘鐵斯特股份有限公司 Electronic component test vehicle

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD195142S (en) 2017-04-28 2019-01-01 日商阿德潘鐵斯特股份有限公司 Electronic component test vehicle

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