TWM469489U - Testing assembly and electrical testing device - Google Patents
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- TWM469489U TWM469489U TW102216654U TW102216654U TWM469489U TW M469489 U TWM469489 U TW M469489U TW 102216654 U TW102216654 U TW 102216654U TW 102216654 U TW102216654 U TW 102216654U TW M469489 U TWM469489 U TW M469489U
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Description
本創作涉及一種電性測試技術，特別是指一種用於軟性電路板之測試組件及其電性檢測裝置。The present invention relates to an electrical testing technique, and more particularly to a test component for a flexible circuit board and an electrical detecting device thereof.
軟性印刷電路板(Flexible Printed Circuit，FPC)又稱軟板，乃是將一可撓式銅箔基板經蝕刻等加工製程，最後留下所需的線路以作為電子產品訊號傳輸的媒介者。一般來說，FPC常搭載於電子零件，例如積體電路晶片、電阻、電容、連結器等元件，以使電子產品能夠發揮既定的功能；由於FPC具有折撓性及可三度空間配線等特性，在科技化電子產品強調輕薄短小、可折撓性的趨勢下，其發展可使相關電子產業更加蓬勃。Flexible Printed Circuit (FPC), also known as soft board, is a process of etching a flexible copper foil substrate, and finally leaving the required lines as a medium for electronic product signal transmission. In general, FPCs are often mounted on electronic components, such as integrated circuit chips, resistors, capacitors, connectors, etc., so that electronic products can perform their intended functions; due to FPC's flexibility and three-dimensional wiring, etc. Under the trend of technology-based electronic products that emphasize lightness, shortness, and flexibility, their development will make the related electronics industry more vigorous.
為確保FPC產品之良率，在FPC製成後通常需經過電性測試，以從中篩選出不良品及發現製程不良之所在。目前市面上的FPC電性測試設備多半為單片式手動測試機具，在操作時係先利用手動方式將待測FPC一次一片地置入測試機具中並完成對位，之後再手動將待測FPC與測試機具的測試系統電性連接後，由測試系統判斷待測FPC上的線路是否存在開路、短路等情事，以篩選出不良品。In order to ensure the yield of FPC products, after the FPC is made, it is usually subjected to electrical testing to screen out defective products and find defects in the process. At present, most of the FPC electrical test equipment on the market is a single-chip manual test machine. In operation, the FPC to be tested is manually placed into the test equipment one by one and the alignment is completed, and then the FPC to be tested is manually determined. After electrically connecting with the test system of the test tool, the test system determines whether there is an open circuit or a short circuit on the line on the FPC to be tested, so as to screen out the defective product.
惟，前述之測試機具在一次只能針對單一片FPC進行手動測試的情況下，則因為作業效率偏低而致使生產成本偏高；並且，在以手動方式操作FPC與測試系統電性連接的情況下，則容易因為測試人員施力不一而致使測試系統的電連接端(如探針)產生不等程度的磨損，或鬆脫接觸不良等問題，間接地影響到電性測試的判定結果，反造成檢測上的疑慮。However, in the case where the aforementioned test tool can only be manually tested for a single piece of FPC at a time, the production cost is high due to the low work efficiency; and the manual connection of the FPC to the test system is electrically connected. Under the circumstance, it is easy for the tester to exert different degrees of wear on the electrical connection end (such as the probe) of the test system, or loose contact failure, which indirectly affects the judgment result of the electrical test. Contrary to the doubts in the test.
又，前述之手動測試手段係通過探針頭壓合FPC上的導線線路(bonding pad)以達成電性連接，因而在過程需要多次的對準調整，如此易使探針破壞部分線路而造成斷路或短路；此外，針對具有不同導線間隙的各種線路設計，探針頭內的探針也需要做出相對應的調整，可以理解的是，此連結機制對於多款不同線路設計規格的FPC的檢測便利性不佳。Moreover, the manual testing method described above is to press the bonding pad on the FPC through the probe head to achieve electrical connection, so that the alignment adjustment needs to be performed multiple times in the process, so that the probe is damaged by the partial line. Open circuit or short circuit; in addition, for various circuit designs with different wire gaps, the probes in the probe head also need to be adjusted accordingly. It can be understood that this connection mechanism is applicable to FPCs of various different line design specifications. Poor detection convenience.
因此，本創作人有鑑於習用軟板電性測試設備實在有其改良的必要性，遂以其多年從事相關領域的創作設計及專業製造經驗，積極地針對電性檢測治具進行改良研究，在各方條件的審慎考慮下，終於開發出本創作。Therefore, the creator has the necessity of improving the electrical test equipment for the use of soft boards, and has been actively researching and improving the electrical test fixtures with his years of experience in creative design and professional manufacturing in related fields. Under the careful consideration of the conditions of all parties, this work was finally developed.
本創作針對現有技術存在的缺失，提出一種測試組件及其電性檢測裝置，藉以改善軟性印刷電路板的電性測試之便利性、效率及精準度不佳等問題。In view of the shortcomings of the prior art, the present invention proposes a test component and an electrical detecting device thereof, thereby improving the convenience, efficiency and accuracy of the electrical test of the flexible printed circuit board.
為實現上述目的，本創作採用以下技術手段：一種測試組件，包括一檢測排線及一導電橡膠連接器。其中，該檢測排線包含複數呈間隔排列的第一導體及包覆該等第一導體的一絕緣層，該等第一導體的相對二端皆外露於該絕緣層；該導電橡膠連接器與該檢測排線相互堆疊，該導電橡膠連接器包含複數呈間隔排列的第二導體及包覆該等第二導體的一軟膠層，該等第二導體的相對二端皆外露於該軟膠層並與該等第一導體相連接。In order to achieve the above objectives, the present invention adopts the following technical means: a test component comprising a test cable and a conductive rubber connector. The detection cable includes a plurality of first conductors arranged at intervals and an insulating layer covering the first conductors, wherein opposite ends of the first conductors are exposed to the insulating layer; the conductive rubber connector and The test cable is stacked on the other side. The conductive rubber connector includes a plurality of second conductors arranged at intervals and a soft rubber layer covering the second conductors. The opposite ends of the second conductors are exposed to the soft rubber. The layers are connected to the first conductors.
根據上述測試組件，本創作另提供一種電性檢測裝置，包括一基座、一測試組件及一升降機構。其中，該基座具有供一待測物件設置的一測試平台；該測試組件係可升降地設置於該測試平台的上方且包含一檢測排線及與該檢測排線相連接的一導電橡膠連接器；該升降機構係設置於該基座上，用以控制該測試組件相對該測試平台進行升降，並與該待測物件相接觸。According to the above test assembly, the present invention further provides an electrical detection device comprising a base, a test assembly and a lifting mechanism. The base has a test platform for an object to be tested; the test component is vertically disposed above the test platform and includes a detection cable and a conductive rubber connection connected to the detection cable The lifting mechanism is disposed on the base to control the test component to be lifted and lowered relative to the test platform, and is in contact with the object to be tested.
本創作至少具有以下有益效果：本創作的測試組件係利用檢 測排線搭配導電橡膠連接器，可以直接壓合於待測物件上，並與具有不同導線間隙的各種導線線路相匹配而不致破壞待測物件(如軟性印刷電路板)之導線線路，大幅提升電性測試之作業效率。This creation has at least the following beneficial effects: the test component of this creation is used for inspection. The measuring cable is matched with the conductive rubber connector, which can be directly pressed onto the object to be tested, and matched with various wire lines having different wire gaps without damaging the wire of the object to be tested (such as a flexible printed circuit board), greatly improving The efficiency of electrical testing.
以上關於本創作內容的說明及以下實施方式的說明係用以舉例並解釋本創作的原理，並且提供本創作之申請專利範圍進一步的解釋。The above description of the present invention and the following description of the embodiments are provided to illustrate and explain the principles of the present invention, and to provide further explanation of the scope of the patent application of the present invention.
1‧‧‧電性檢測裝置1‧‧‧Electrical testing device
10‧‧‧基座10‧‧‧ Pedestal
11‧‧‧測試平台11‧‧‧Test platform
111‧‧‧定位結構111‧‧‧ Positioning structure
12‧‧‧支撐架12‧‧‧Support frame
13‧‧‧樞接結構13‧‧‧ pivot structure
20‧‧‧測試組件20‧‧‧Test components
21‧‧‧檢測排線21‧‧‧Detection cable
211‧‧‧第一導體211‧‧‧First conductor
212‧‧‧絕緣層212‧‧‧Insulation
22‧‧‧導電橡膠連接器22‧‧‧Electrical rubber connector
221‧‧‧第二導體221‧‧‧second conductor
222‧‧‧軟膠層222‧‧‧Soft layer
30‧‧‧升降機構30‧‧‧ Lifting mechanism
31‧‧‧限位板31‧‧‧ Limit Board
310‧‧‧限位孔310‧‧‧Limited holes
311‧‧‧第一側板311‧‧‧First side panel
312‧‧‧第二側板312‧‧‧ second side panel
32‧‧‧連桿組件32‧‧‧ Connecting rod assembly
321‧‧‧壓桿321‧‧‧Press
322‧‧‧活動件322‧‧‧ activities
322a‧‧‧第一端322a‧‧‧ first end
322b‧‧‧第二端322b‧‧‧second end
323‧‧‧升降桿323‧‧‧ Lifting rod
40‧‧‧分析主機40‧‧‧Analysis host
S‧‧‧待測物件S‧‧‧Articles to be tested
S1‧‧‧導線線路S1‧‧‧ wire line
圖1為本創作之電性測試系統之架構圖。Figure 1 is an architectural diagram of the electrical test system of the present invention.
圖2為本創作之電性檢測裝置之使用狀態示意圖。FIG. 2 is a schematic view showing the state of use of the electrical detecting device of the present invention.
圖3為本創作之導電橡膠連接器之立體圖。Figure 3 is a perspective view of the conductive rubber connector of the present invention.
圖4為本創作之測試組件之一實施態樣示意圖。FIG. 4 is a schematic diagram of an implementation aspect of a test component of the present invention.
圖5為本創作之測試組件之另一實施態樣示意圖。FIG. 5 is a schematic diagram of another embodiment of the test component of the present invention.
本揭露書公開一種新穎的測試組件及裝載有所述測試組件的電性檢測裝置；所述電性檢測裝置於進行電性測試時，其測試組件可直接壓合於待測物件上，並與具有不同導線間隙的各種導線線路相匹配，以達成分析主機與待測物件間之電性互連，從而可改善現有電性測試治具無法對應不同導線間隙排列即時做出調整的問題。The present disclosure discloses a novel test component and an electrical detection device loaded with the test component; when the electrical test device is electrically tested, the test component can be directly pressed onto the object to be tested, and The various conductor lines with different wire gaps are matched to achieve an electrical interconnection between the analysis host and the object to be tested, thereby improving the problem that the existing electrical test fixture cannot be adjusted in time for different wire gap arrangements.
在本創作的較佳實施例中，待測物件指的是待測之軟性印刷電路板(未搭載有電子零件之裸板)，但本創作並不對此設限。下文中將結合附圖及複數實施例對本創作「測試組件及其電性檢測裝置」作進一步詳細說明。In the preferred embodiment of the present invention, the object to be tested refers to a flexible printed circuit board to be tested (a bare board not equipped with electronic components), but this creation does not limit this. The "test component and its electrical detection device" will be further described in detail below with reference to the accompanying drawings and the embodiments.
請參閱圖1，為本創作第一實施例之電性測試系統之架構圖。本創作之電性測試系統包括一電性檢測裝置1及一分析主機40，其中電性檢測裝置1更包括有一基座10、一測試組件20及一升降 機構30，其中測試組件20可配合分析主機40量測一待測物件S(如軟性印刷電路板)的電氣特性。值得說明的是，本創作針對不同規格的待測物件S，無需更換測試組件20。Please refer to FIG. 1 , which is a structural diagram of an electrical test system according to a first embodiment of the present invention. The electrical test system of the present invention includes an electrical detecting device 1 and an analysis host 40. The electrical detecting device 1 further includes a base 10, a test component 20 and a lifting device. The mechanism 30, wherein the test component 20 can cooperate with the analysis host 40 to measure the electrical characteristics of an object to be tested S (such as a flexible printed circuit board). It is worth noting that the present invention is directed to different types of articles S to be tested, and it is not necessary to replace the test component 20.
請配合參閱圖2，為本創作第一實施例之電性檢測裝置之使用狀態示意圖。如圖所示，基座10從側面觀之大致呈L狀，具體地說係包含一測試平台11及架設在測試平台11上的一支撐架12，而測試平台11與支撐架12大致呈相互垂直。Please refer to FIG. 2 for a schematic view of the state of use of the electrical detecting device according to the first embodiment of the present invention. As shown, the base 10 is substantially L-shaped from the side, specifically including a test platform 11 and a support frame 12 mounted on the test platform 11, and the test platform 11 and the support frame 12 are substantially mutually vertical.
在本具體實施例中，測試平台11可讓待測物件S置放於其上；而為了增加電性測試之精確度，測試平台11在與測試組件20相對的表面上設有多個定位結構111，例如定位針，定位插銷等，但本創作並不限制於此。當欲進行電性量測時，待測物件S可藉由該等定位結構111對應多個穿過預設在其上的定位貫孔(圖未顯示)，以準確定位在測試平台11表面之待測位置上。In the specific embodiment, the test platform 11 can place the object to be tested S thereon; and in order to increase the accuracy of the electrical test, the test platform 11 is provided with a plurality of positioning structures on the surface opposite to the test component 20. 111, such as a positioning pin, a positioning pin, etc., but the creation is not limited thereto. When the electrical measurement is to be performed, the object S to be tested can be accurately positioned on the surface of the test platform 11 by the positioning holes 111 corresponding to the plurality of positioning through holes (not shown) preset thereon. At the location to be tested.
支撐架12可與測試平台11一體成型，或係以組裝方式結合於測試平台11上，但本創作並不限定其組裝方式。具體地說，支撐架12一端與測試平台11相連接，而另一端延伸成型一樞接結構13，可讓升降機構30樞設於其上，用以操控測試組件20相對於測試平台11表面進行升降。The support frame 12 can be integrally formed with the test platform 11 or assembled to the test platform 11 in an assembled manner, but the present invention does not limit its assembly manner. Specifically, one end of the support frame 12 is connected to the test platform 11 , and the other end is extended to form a pivot structure 13 , and the lifting mechanism 30 is pivoted thereon for controlling the test component 20 relative to the surface of the test platform 11 . Lifting.
請參閱圖3及4，其中圖3為本創作之測試組件之一實施態樣示意圖，圖4為本創作之導電橡膠連接器之立體視圖。在本實施例中，測試組件20為相互堆疊之一檢測排線21與一導電橡膠連接器22所組成，組構方式係在檢測排線21與導電橡膠連接器22之間設置一膠合層(如熱固性膠)，作為兩者貼合固定之用。Please refer to FIG. 3 and FIG. 4 , wherein FIG. 3 is a schematic diagram of an embodiment of the test component of the present invention, and FIG. 4 is a perspective view of the conductive rubber connector of the present invention. In the present embodiment, the test component 20 is composed of one of the detection wires 21 and a conductive rubber connector 22 stacked one on another, and the structure is arranged to provide a glue layer between the detection wire 21 and the conductive rubber connector 22 ( Such as thermosetting glue), as a combination of the two.
其中之檢測排線21包含複數呈間隔排列的第一導體211及包覆該等第一導體211的一絕緣層212，且該等第一導體211相對二端皆外露於絕緣層212，而本創作於應用時，該等第一導體211的佈局設計可依測試需求而有所調整。The detecting cable 21 includes a plurality of first conductors 211 arranged at intervals and an insulating layer 212 covering the first conductors 211, and the first conductors 211 are exposed to the insulating layer 212 at opposite ends. When the application is created, the layout design of the first conductors 211 can be adjusted according to the test requirements.
本實施例之第一導體211例如是金屬導線，其材料可包括金、 銀、銅、鎳、鋁、鉻或上述材料之任意組合，但本創作並不限制於此；本實施例之絕緣層212為包覆該等第一導體211(金屬導線)的絕緣材料所製成，所述絕緣材料例如是聚亞醯胺(PI)或聚乙烯對苯二甲酸酯(PET)，但本創作同樣不限制於此。The first conductor 211 of this embodiment is, for example, a metal wire, and the material thereof may include gold, Silver, copper, nickel, aluminum, chromium or any combination of the above materials, but the present invention is not limited thereto; the insulating layer 212 of the present embodiment is made of an insulating material covering the first conductors 211 (metal wires). The insulating material is, for example, polyamine (PI) or polyethylene terephthalate (PET), but the present creation is also not limited thereto.
請配合參閱圖4，本創作電性測試組件20所做的改良設計，即在於搭配使用導電橡膠連接器22，其包含複數呈間隔排列的第二導體221及包覆該等第二導體221的一軟膠層222，且該等第二導體221的相對二端同樣係外露於軟膠層222。創作於應用時，導電橡膠連接器22其中一端係與檢測排線21中之第一導體211相接觸，另一端則係與待測物件S的導線線路S1相接觸，藉此提供檢測排線21與待測物件S間之電性及訊號連結，以利分析主機40之判斷。Referring to FIG. 4, the improved design of the electrical test component 20 is to use a conductive rubber connector 22 including a plurality of second conductors 221 arranged at intervals and covering the second conductors 221. A soft rubber layer 222, and the opposite ends of the second conductors 221 are also exposed to the soft rubber layer 222. When the application is created, one end of the conductive rubber connector 22 is in contact with the first conductor 211 in the detecting wire 21, and the other end is in contact with the wire line S1 of the object S to be tested, thereby providing the detecting wire 21 The electrical and signal connections between the object S to be tested are connected to facilitate the analysis of the host 40.
本實施例之第二導體221例如是金屬導線，其材料可包括金、銀、銅、鎳、鋁、鉻或上述材料之任意組合，但本創作並不限制於此；本實施例之軟膠層222為包覆該等第二導體221(金屬導線)的橡膠材料所製成，但本創作同樣不限制於此，其中該等第一導體211的尺寸與第二導體221的尺寸相符，且係分別以一對一方式連接第二導體221。The second conductor 221 of this embodiment is, for example, a metal wire, and the material thereof may include gold, silver, copper, nickel, aluminum, chromium or any combination of the above materials, but the present invention is not limited thereto; the soft glue of this embodiment The layer 222 is made of a rubber material covering the second conductors 221 (metal wires), but the present invention is also not limited thereto, wherein the size of the first conductors 211 is the same as the size of the second conductor 221, and The second conductors 221 are connected in a one-to-one manner, respectively.
進一步值得說明的是，本創作測試組件20在受到外力碰撞或衝擊的時候，包覆於該等第一導體211的絕緣層212以及包覆於該等第二導體221的軟膠層222具有緩衝功效，因而在外力碰撞或衝擊消失之後即可回復到未受外力的初始狀態。據此，該等第一導體211及該等第二導體221不容易發生因受力而產生形變之情事，從而所述之測試組件20在長期重複使用下仍然保有其原來功能。It is further to be noted that the insulating test layer 212 covering the first conductors 211 and the soft rubber layer 222 covering the second conductors 221 have a buffer when the external test force is impacted or impacted. Efficacy, so that after the external force collision or impact disappears, it can return to the initial state without external force. Accordingly, the first conductors 211 and the second conductors 221 are less prone to deformation due to stress, so that the test assembly 20 retains its original function under repeated use for a long period of time.
請復參閱圖1及2，升降機構30包含一限位板31及一連桿組件32。其中，限位板31固接於支撐架12一側，連桿組件32則組接於支撐架12一端，並且連桿組件32還通過限位板31與測試組 件20形成固接。在本實施例中，限位板31由側面視之大致呈L狀，具體而言係為第一側板311及第二側板312所組成，其中之第一側板311固接於支撐架12一側，第二側板312則連接於第一側板311末端且具有一限位孔310，俾使連桿組件32可沿著通過所述之限位孔310的垂直線(未繪示)進行更準確的位移。Referring to FIGS. 1 and 2, the lifting mechanism 30 includes a limiting plate 31 and a link assembly 32. The limiting plate 31 is fixed to one side of the support frame 12, and the connecting rod assembly 32 is assembled to one end of the supporting frame 12, and the connecting rod assembly 32 also passes through the limiting plate 31 and the test group. The piece 20 is formed to be fixed. In this embodiment, the limiting plate 31 is substantially L-shaped from the side, specifically, the first side plate 311 and the second side plate 312, wherein the first side plate 311 is fixed to the side of the support frame 12 The second side plate 312 is connected to the end of the first side plate 311 and has a limiting hole 310, so that the connecting rod assembly 32 can be more accurately along a vertical line (not shown) passing through the limiting hole 310. Displacement.
更詳細地說，連桿組件32包含一壓桿321、一活動件322及一升降桿323。其中，壓桿321一端樞設於支撐架12上的樞接結構13；活動件322呈彎曲狀，具體而言係為一半月形連接件，但本創作非以此為限，活動件322具有可以和其他元件相連接的第一端322a及第二端322b，且所述之第一端322a可樞轉地與壓桿321相連接；升降桿323一端可樞轉地與活動件322的第二端322b相連接，而另一端通過限位板31的限位孔310與測試組件20的檢測排線21形成固接。In more detail, the link assembly 32 includes a pressing rod 321, a movable member 322, and a lifting rod 323. The movable member 322 is bent at one end, and the movable member 322 is curved, specifically, a half-moon connecting member, but the present invention is not limited thereto, and the movable member 322 has a first end 322a and a second end 322b connectable to other components, and the first end 322a is pivotally coupled to the pressing rod 321; the lifting rod 323 is pivotally coupled to the movable member 322 at one end The two ends 322b are connected, and the other end is fixed to the detecting cable 21 of the test component 20 through the limiting hole 310 of the limiting plate 31.
為使熟習此項技藝者能更輕易了解本創作的優點及功效，下文中將詳細地對本創作電性檢測裝置之操作方式作闡述，使其能在不悖離本創作之精神下進行各種修飾與變更，以施行或應用所述電性檢測裝置。In order to make it easier for those skilled in the art to understand the advantages and effects of the creation, the operation mode of the electronic detection device of the present invention will be described in detail below, so that various modifications can be made without departing from the spirit of the creation. And changing to perform or apply the electrical detection device.
首先，測試人員把待測物件S準確定位於在測試平台11上，使其導線線路S1與測試組件20正確對應；接著，測試人員向下扳動壓桿321，在壓桿321從初始位置位移至操作位置的同時，即經由活動件322帶動升降桿323令測試組件20朝靠近待測物件S的方向移動，使導電橡膠連接器22外露之第二導體221準確接觸到待測物件S的導線線路S1。First, the tester accurately positions the object to be tested S on the test platform 11 so that the wire line S1 and the test component 20 correctly correspond; then, the tester pulls the pressure bar 321 downward, and the pressure bar 321 is displaced from the initial position. At the same time as the operation position, the lifting rod 323 is driven by the movable member 322 to move the test assembly 20 toward the object S to be tested, so that the exposed second conductor 221 of the conductive rubber connector 22 accurately contacts the wire of the object S to be tested. Line S1.
在完成電性連結後，分析主機40即可測量待測物件S的電氣特性，以判斷此待測物件S是否合乎要求；在完成測試後，測試人員向上扳動壓桿321，在壓桿321從操作位置位移至初始位置的同時，即經由活動件322帶動升降桿323令測試組件20朝遠離待測物件S的方向移動。After the electrical connection is completed, the analysis host 40 can measure the electrical characteristics of the object S to be tested to determine whether the object S to be tested meets the requirements; after the test is completed, the tester pulls the pressure bar 321 upwards, and the pressure bar 321 While being displaced from the operating position to the initial position, the lifting rod 323 is driven via the movable member 322 to move the test assembly 20 away from the object S to be tested.
請參閱圖5，為本創作之測試組件之另一實施態樣示意圖。如圖所示，儘管本實施例的檢測排線21因應不同規格之待測物件S的導線線路S1設計，而其中之第一導體211的尺寸與導電橡膠連接器22中之第二導體221的尺寸不相符。值得說明的是，本實施例的測試組件20中，檢測排線21中之一個第一導體211也能夠以一對多方式連接導電橡膠連接器22中之N個第二導體221，N為整數。如此本創作的測試組件20適用於不同規格之待測物件S上各種尺寸之導線線路S1間隙，以順利進行檢測。Please refer to FIG. 5 , which is a schematic diagram of another embodiment of the test component of the present invention. As shown in the figure, although the detecting cable 21 of the present embodiment is designed in accordance with the wire line S1 of the object S to be tested of different specifications, the size of the first conductor 211 and the second conductor 221 of the conductive rubber connector 22 are The dimensions do not match. It should be noted that, in the test component 20 of the present embodiment, one of the first conductors 211 of the detecting cable 21 can also be connected to the N second conductors 221 of the conductive rubber connector 22 in a one-to-many manner, N being an integer. . Thus, the test component 20 of the present invention is suitable for the gaps of the wire lines S1 of various sizes on the object S to be tested of different specifications for smooth detection.
綜上所述，相較於習知電性測試治具，本創作用於電性測試之測試組件及其電性檢測裝置至少具有以下功效：In summary, compared with the conventional electrical test fixture, the test component and the electrical detection device for the electrical test have at least the following effects:
1.本創作的測試組件係利用檢測排線搭配導電橡膠連接器，可以直接壓合於待測物件上，並與具有不同導線間隙的各種導線線路相匹配而不致破壞待測物件(如軟性印刷電路板)之導線線路，大幅提升電性測試之作業效率。1. The test component of the creation uses the detection cable with the conductive rubber connector, which can be directly pressed onto the object to be tested and matched with various wire lines with different wire gaps without destroying the object to be tested (such as soft printing). The circuit line of the circuit board greatly improves the efficiency of the electrical test.
2.承第1點所述，儘管檢測排線中之第一導體與導電橡膠連接器中之第二導體的尺寸不相符，仍能夠以一對多的連接方式完成兩者間之電性連結，大幅提升電性測試之可靠度與便利性。2. According to the first point, although the first conductor in the detection cable does not conform to the size of the second conductor in the conductive rubber connector, the electrical connection between the two conductors can be completed in a one-to-many connection. , greatly improve the reliability and convenience of electrical testing.
3.本創作於應用時，測試人員只需上下扳動壓桿，即可輕易控制測試組件的上下升降以接觸待測物件上的導線線路，完全不需以手動方式進行電性測試，大幅提升電性測試之精確度。3. When the creation is applied, the tester can easily control the up and down movement of the test component to touch the wire line on the object to be tested by simply pulling the pressure bar up and down, without any need for manual electrical testing. The accuracy of the electrical test.
雖然本創作之實施例揭露如上，然其並非用以限制本創作。本創作所屬領域中具有通常知識者，在不脫離本創作之精神和範圍內，當可作各種的變動與潤飾。因此，本創作之保護範圍當視後附之申請專利範圍所界定者為准。Although the embodiments of the present disclosure are as above, they are not intended to limit the creation. Those who have ordinary knowledge in the field of the present invention can make various changes and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of this creation is subject to the definition of the scope of the patent application.
1‧‧‧電性檢測裝置1‧‧‧Electrical testing device
10‧‧‧基座10‧‧‧ Pedestal
111‧‧‧定位結構111‧‧‧ Positioning structure
20‧‧‧測試組件20‧‧‧Test components
30‧‧‧升降機構30‧‧‧ Lifting mechanism
40‧‧‧分析主機40‧‧‧Analysis host
Claims (11)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102216654U TWM469489U (en) | 2013-09-04 | 2013-09-04 | Testing assembly and electrical testing device |
| CN201320569770.9U CN203490258U (en) | 2013-09-04 | 2013-09-13 | Test assembly and electrical property detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102216654U TWM469489U (en) | 2013-09-04 | 2013-09-04 | Testing assembly and electrical testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM469489U true TWM469489U (en) | 2014-01-01 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102216654U TWM469489U (en) | 2013-09-04 | 2013-09-04 | Testing assembly and electrical testing device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN203490258U (en) |
| TW (1) | TWM469489U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI642946B (en) * | 2015-01-27 | 2018-12-01 | 法商索泰克公司 | Method, device and system for measuring an electrical characteristic of a substrate |
| CN111175636A (en) * | 2020-01-02 | 2020-05-19 | 广东科学技术职业学院 | Bonding detection circuit and bonding detection device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI695170B (en) * | 2019-09-03 | 2020-06-01 | 尹鑽科技有限公司 | Detection device and detection method using the detection device |
-
2013
- 2013-09-04 TW TW102216654U patent/TWM469489U/en not_active IP Right Cessation
- 2013-09-13 CN CN201320569770.9U patent/CN203490258U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI642946B (en) * | 2015-01-27 | 2018-12-01 | 法商索泰克公司 | Method, device and system for measuring an electrical characteristic of a substrate |
| US10429436B2 (en) | 2015-01-27 | 2019-10-01 | Soitec | Method, device and system for measuring an electrical characteristic of a substrate |
| CN111175636A (en) * | 2020-01-02 | 2020-05-19 | 广东科学技术职业学院 | Bonding detection circuit and bonding detection device |
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|---|---|
| CN203490258U (en) | 2014-03-19 |
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