M441822 五、新型說明： 【新型所屬之技術領域】 [0001] 本案係有關一種面板檢測裝置，尤指一種可以讓被 自動判別有瑕疵的面板，被作業人員處置時有清晰方便 的瑕疵顯示標註方式，和方便後續對瑕疵面板進行處置 的面板檢測、瑕疵顯示及清潔作業系統。 【先前技術】 [0002] 按，顯示面板於生產及移動時，難免於表面上會有M441822 V. New description: [New technical field] [0001] This case relates to a panel detecting device, especially a panel that can be automatically identified and has a clear and convenient display method when being disposed by the operator. And a panel inspection, 瑕疵 display and cleaning operation system that facilitates subsequent disposal of the sill panel. [Prior Art] [0002] Pressing, when the display panel is produced and moved, it is inevitable that there will be
刮傷或髒污（particle)，但是該刮傷或髒污將會影響面 板的顯示性能，甚至引起使用者之不悅而被退貨。因此 ，面板於出廠前通常都會進行刮傷或髒污的檢測。Scratches or particles, but the scratches or dirt will affect the display performance of the panel, and may even be returned to the user's dissatisfaction. Therefore, the panel is usually scratched or soiled before it leaves the factory.
習知之第一種面板刮傷或髒污之檢測裝置主要是將 被測面板放入自動光學檢測（AOI )機台中，利用光學鏡 頭和相機，自動檢查系統，將待測物件上的瑕庇顯示在 電腦上，並將髒污與被測物相對位置，給一組參數來做 為髒污的定位。習知之另一種面板刮傷或髒污之檢測裝 置主要是將被測面板放AOI機台中，利用光學鏡頭和相機 ，自動檢查系統，將物件上的瑕疵顯示在電腦上，並將 瑕疵在被待測物位置附近以喷墨方式定位。 習知之第一種面板到傷或髒污之檢測裝置由於操作 AOI機台的人員與清潔髒污的人員並不一定是同一位，目 前髒污只是顯示相對位置在電腦上，作業人員必須在 AOI機台上清潔（因為有相對位置），如果待測物件離開 AOI機台，因為沒有明確標示位置，瑕疵並不容易被精確 定義，所以容易被誤判，尤其當瑕疵有一個以上時。 10121287#單編號 A_ 第3頁/共16頁 1012041376-0 M441822 请一併參照圖l(a)~l(c)，其中’圖1(a)繪示習知 之面板檢測裝置於檢測到到傷或髒污等瑕疵後進行喷墨 疋位之示意圖；圖K b)繪示習知之面板檢測裝置於喷墨 疋位後之剖面示意圖；圖1 ( c )繪示習知之面板檢測褒置 於噴墨定位及拋光後之剖面示意圖。如圖所示，習知之 第二種面板到傷或髒污之檢測裝置由於AOI機台有利用 喷墨11 0喷在瑕疵附近的待測物件丨〇〇表面來標示瑕疵位 置（如圖1(a)所示），因此，瑕疵可以被精確定義，所 以作業人員容易辨識，尤其是瑕疵有一個以上時。但是 ，喷墨110本身又是另一種瑕疵，作業人員在沒有適合的 工具下並不能百分之百確定將喷墨11〇與瑕疵清潔乾淨。 再者，喷墨110如果碰到待測物件100的缺陷是刮傷12〇 時嘴墨110的油墨會流到刮傷12 〇的刮痕中（如圖1 (匕） 及圖1(c)所示），反而更不易清潔與更突瑕疵位置。 此外’如果待測物件是保護玻璃（cover glass) 或一片玻璃式技術解決方案（〇ne Glass s〇luti〇n , 簡稱0GS)時，其表面會被塗佈有一層石申（As)，該層砷 會抗巧，因此，一般喷墨不易附著在待測物件表面上， 誠屬美中不足之處。 針對上述習知面板檢測裝置之缺點，本新型提供一 種面板檢測及清潔系統，以改善上述之缺點。 【新型内容】 本案之目的係提供一種面板檢測、瑕疵顯示及清 /繁作業系統，其光學自動檢測機台可掃瞄該待測面板上 是否有缺陷’並㈣取該缺陷之影像後，提供該缺陷之 座標參數。 10121287产單編號 A0101 第4頁/共16頁 101204 M441822 本案之另一目的係提供一種面板檢測、瑕疵顯示及 清潔作業系統，其至少一瑕疵顯示及清潔機台上具有一 顯示器，該顯示器上具有由至少一個透明擋塊所形成之 一區塊，當該待測面板放置於該區塊中時，該使用者介 面根據該座標參數可精確定位及/或顯示出該缺陷之位置 ，讓作業人員可以快速判定該缺陷之種類，並選擇以適 當方式進行作業處置。The first type of panel scratching or dirty detecting device mainly puts the panel to be tested into an automatic optical inspection (AOI) machine, and uses an optical lens and a camera to automatically check the system to display the shelter on the object to be tested. On the computer, and the relative position of the dirt and the measured object, give a set of parameters as a dirty positioning. Another type of panel scratching or dirty detection device is mainly to put the panel to be tested in the AOI machine, use the optical lens and camera, automatically check the system, display the 上 on the object on the computer, and wait for it. The inkjet position is positioned near the position of the object. The first type of panel to the detection device for injury or dirt is not necessarily the same as the person who operates the AOI machine and the person who cleans and dirty. Currently, the dirt is only displayed on the computer, and the operator must be in the AOI. The machine is clean (because of the relative position). If the object to be tested leaves the AOI machine, it is not easy to be accurately defined because it is not clearly marked, so it is easy to be misjudged, especially when there is more than one. 10121287#单号A_第3页/共16页1012041376-0 M441822 Please refer to Figure l(a)~l(c) together, where 'Figure 1(a) shows the conventional panel detection device detecting the injury Figure 2b shows the cross-sectional view of the conventional panel inspection device after inkjet clamping; Figure 1 (c) shows the conventional panel inspection 褒 placed in the spray A schematic view of the ink after positioning and polishing. As shown in the figure, the conventional second panel to the detection device for injury or dirt is used because the AOI machine has the surface of the object to be tested which is sprayed near the crucible by the ink jet 110 to indicate the position of the crucible (as shown in Fig. 1 (Fig. 1). a)), therefore, 瑕疵 can be precisely defined, so the operator is easy to identify, especially when there is more than one. However, the ink jet 110 itself is another type of flaw, and the operator cannot be 100% sure that the ink jet 11 〇 and 瑕疵 are cleaned without a suitable tool. Furthermore, if the inkjet 110 encounters a defect in the object to be tested 100 that is scratched 12 〇, the ink of the nozzle ink 110 will flow into the scratch of the scratch 12 ( (Fig. 1 (匕) and Fig. 1 (c) Shown), but it is harder to clean and more awkward position. In addition, if the object to be tested is a cover glass or a glass-based technical solution (〇ne Glass s〇luti〇n, referred to as 0GS), the surface thereof is coated with a layer of As (As). The layer of arsenic will be anti-small. Therefore, it is generally difficult for the inkjet to adhere to the surface of the object to be tested. In view of the shortcomings of the above conventional panel detecting device, the present invention provides a panel detecting and cleaning system to improve the above disadvantages. [New content] The purpose of this case is to provide a panel detection, 瑕疵 display and clear/complex operation system, the optical automatic detection machine can scan the panel to be tested for defects ” and (4) after taking the image of the defect, provide The coordinate parameter of the defect. 10121287Product No. A0101 Page 4 of 16 101204 M441822 Another object of the present invention is to provide a panel detecting, 瑕疵 display and cleaning operating system having at least one display and cleaning machine having a display having a block formed by at least one transparent block. When the panel to be tested is placed in the block, the user interface can accurately position and/or display the position of the defect according to the coordinate parameter, so that the operator The type of defect can be quickly determined and the job can be disposed of in an appropriate manner.
為達上述之目的，本案之一種面板檢測、瑕疵顯示 及清潔作業系統：其包括：一光學自動檢測機台，其至 少具有一載台、一取像裝置及一影像處理裝置，其中， 該載台可承載至少一待測面板，該取像裝置可對該待測 面板上是否有缺陷進行取像和自動辨識，該影像處理裝 置可擷取該缺陷之影像，並提供該缺陷之座標參數：以 及至少一瑕疵顯示及清潔作業機台，係耦接至該光學自 動檢測機台，其具有一顯示器，該顯示器上具有一使用 者介面，且該顯示器上具有由至少一個擋塊所形成之一 區塊，當該待測面板放置於該區塊中時，該使用者介面 根據該座標參數可精確定位及/或顯示出該缺陷之位置， 讓作業人員可以快速判定該缺陷之種類，並選擇以適當 方式進行作業處置。 為使貴審查委員能進一步瞭解本新型之結構、特 徵及其目的，茲附以圖式及較佳具體實施例之詳細說明 如后。 【實施方式】 [0004] 請一併參照圖2至圖4，其中圖2繪示本案一較佳實施 例之面板檢測、瑕疵顯示及清潔作業系統之方塊示意圖 10121287^單编號删1 第 5 頁 / 共 16 頁 1012041376-0 M441822 ;圖3綠示本案-較佳實施例之使用者介面上進_步可顯 示該缺陷之影像資料之示意圖；圖4繪示如圖3中所示之 該缺陷之影像資料之放大示意圖。 如圖所示，本案一較佳實施例之面板檢測、瑕疵顯 示及清潔作業系統，其包括：—光學自動檢測機台1〇 ; 以及至少一瑕疵顯示及清潔作業機台2〇所組合而成者。 其中，該光學自動檢測機台1〇其至少具有一載台Η 、一取像裝置12及一影像處理裝置13，其中，該載台11 可承載至少一待測面板14，該取像裝置12例如但不限於 為一CMOS線掃描相機（CM0S line scan eamera)、 CMOS區域掃描相機（CM0S area scan camera)4 CCDCCharge Coupled Device)線掃描相機，可·對該待 測面板14上是否有缺陷（defect) 15進行取像和自動辨 識，其中該缺陷15例如但不限於為一髒污、刮傷或型態 瑕疵（pattern defect);該影像處理裝置13例如但 不限於為一相機或電性測試裝置，其中該電性測試裝置 例如但不限於為一組探針，可擷取該缺陷15之影像，並 提供該缺陷15之座標參數，例如但不限於為X、γ軸座標 參數。其中，S亥載台11進一步藉由一氣浮平台、一輸送 帶或滑台（皆圖未示），以移動該待測面板丨4為一般光 學自動檢測機台之習知技術，且非本案之重點，故在此 不擬贅述》 其中’ s亥待測面板11例如但不限於為一觸控感應器 (Touch Sensor)、保護玻璃（Cover Glass)、薄 膜電晶體液晶面板（TFT LCD)、有源矩陣有機發光二極 體面板（AM0LED)或低溫多晶矽面板（LTPS) » 1012041376-0 10121287^單编號删1 第6頁/共16頁 該至少一瑕疵顯示及清潔作業機台20係耦接至該光 學自動檢測機台10 ’其具有一顯示器21，該顯示器上具 有一使用者介面22，且該顯示器21上具有由兩個擋塊23 所形成之一區塊24，當該待測面板14放置於該區塊24中 時，該使用者介面22根據該座標參數可精確定位及/或顯 示出該缺陷15之位置，讓作業人員可以快速判定該缺陷 U之種類’並選擇以適當方式進行作業處置.在本實施 例中，係以三台瑕疵顯示及清潔作業機台2〇為例加以說 明’但並不以此為限。其中，該區塊2 4例如但不限於為 比該待測面板14相同或略大，且該區塊24之大小可依據 該待測面板14之大小進行調整，且該顯示器21為一平面 顯示器，例如但不限於為一LCD、CRT、PDP或AMOLED顯 示器。For the purpose of the above, a panel inspection, sputum display and cleaning operation system of the present invention comprises: an optical automatic detection machine having at least one stage, an image taking device and an image processing device, wherein the load The device can carry at least one panel to be tested, and the image capturing device can perform image capturing and automatic identification on the panel to be tested. The image processing device can capture the image of the defect and provide coordinate parameters of the defect: And at least one display and cleaning work machine coupled to the optical automatic detection machine, having a display having a user interface thereon, and having one of the at least one stop formed on the display a block, when the panel to be tested is placed in the block, the user interface can accurately locate and/or display the location of the defect according to the coordinate parameter, so that the operator can quickly determine the type of the defect and select Work disposal in an appropriate manner. In order to provide a further understanding of the structure, features, and objects of the present invention, the detailed description of the drawings and the preferred embodiments are set forth below. [0004] Referring to FIG. 2 to FIG. 4 together, FIG. 2 is a block diagram showing a panel detecting, 瑕疵 display and cleaning operation system according to a preferred embodiment of the present invention. Page / A total of 16 pages 1012041376-0 M441822; Figure 3 green shows the case - the user interface of the preferred embodiment can display the image data of the defect; Figure 4 shows the same as shown in Figure 3 An enlarged view of the image data of the defect. As shown in the figure, a panel detecting, 瑕疵 display and cleaning operating system according to a preferred embodiment of the present invention comprises: - an optical automatic detecting machine 1; and at least one display and cleaning working machine 2 By. The optical automatic detecting machine 1 has at least one loading platform, an image capturing device 12 and an image processing device 13, wherein the loading platform 11 can carry at least one panel 14 to be tested, and the image capturing device 12 For example, but not limited to, a CMOS line scan camera (CM0S line scan eamera), a CMOS area scan camera (CC0S area scan camera) 4 CCDCCharge Coupled Device) line scan camera, whether or not there is a defect on the panel 14 to be tested (defect 15 performing image taking and automatic identification, wherein the defect 15 is, for example but not limited to, a dirty, scratched or pattern defect; the image processing device 13 is, for example but not limited to, a camera or an electrical test device The electrical test device, such as but not limited to a set of probes, captures an image of the defect 15 and provides coordinate parameters of the defect 15, such as, but not limited to, X, y axis coordinate parameters. Wherein, the S-mounting stage 11 further moves the panel to be tested 4 as a general optical automatic detecting machine by an air floating platform, a conveyor belt or a sliding table (all not shown), and is not the case The focus of this is not to be described here. The 'Shai panel to be tested 11 is, for example but not limited to, a touch sensor, a cover glass, a thin film transistor liquid crystal panel (TFT LCD), Active Matrix Organic Light Emitting Diode Panel (AM0LED) or Low Temperature Polysilicon Panel (LTPS) » 1012041376-0 10121287^ Single Number Delete 1 Page 6 of 16 This at least one display and cleaning work machine 20 series coupling Connected to the optical automatic inspection machine 10' has a display 21 having a user interface 22 thereon, and the display 21 has a block 24 formed by two stops 23, when the test is to be performed When the panel 14 is placed in the block 24, the user interface 22 can accurately position and/or display the position of the defect 15 according to the coordinate parameter, so that the operator can quickly determine the type of the defect U and select appropriate Way of doing work In the present embodiment, three lines showed defects and cleaning operations in machines 2〇 example to Description 'but is not limited thereto. The block 24 is, for example but not limited to, the same or slightly larger than the panel 14 to be tested, and the size of the block 24 can be adjusted according to the size of the panel 14 to be tested, and the display 21 is a flat display. For example, but not limited to, an LCD, CRT, PDP or AMOLED display.
其中，該至少一個擋塊2 3例如但不限於為透明或半 透明擋塊，以形成該區塊24，該擋塊23用於承載該待測 面板14，以防止該待測面板14和顯示器21接觸，造成二 次到傷。在本實施例中係以兩個擋塊23且以平行或對角 方式配置，但並不以此為限。此外，本案亦可以三個或 四個擋塊23形成該區塊24，但並不以此為限。此外，該 顯示器21亦可以調整其亮度，以提供該待測面板11於該 區塊24中時所需之背光源。 1012041376-0 當該載台11上一次只承載一待測面板14時，於該取 像裝置12及影像處理裝置13完成檢測時，該光學自動檢 測機台10會依序將該待測面板14及其對應的座標參數及 影像資料傳送至第一台瑕疵顯示及清潔作業機台20、第 二台瑕疵顯示及清潔作業機台20及第三台瑕疵顯示及清 10121287产單編號A0101 第7頁/共16頁 M441822 潔作業機台20，讓作業人員可以快速判定該缺陷15之種 類，並選擇以適當方式進行作業處置。 當該載台11上一次承載複數個待測面板14時，於該 取像裝置12及影像處理裝置13於完成檢測時，該光學自 動檢測機台10將同時記錄其對應的座標參數及影像資料 ，然後依序將第一片待測面板14及其對應的座標參數及 影像資料傳送至第一台瑕疵顯示及清潔作業機台20，將 第二片待測面板14及其對應的座標參數及影像資料傳送 至第二台清瑕疵顯示及清潔作業機台20，將第三片待測 面板14及其對應的座標參數及影像資料傳送至第三台瑕 疵顯示及清潔作業機台20，讓作業人員可以快速判定該 缺陷15之種類，並選擇以適當方式進行作業處置，並可 加速作業之速度。 如圖2所示，當該待測面板14分別被放置於該瑕疵顯 示及清潔作業機台20之區塊24中時，該使用者介面22將 根據該座標參數精確定位及/或顯示出該缺陷15之位置， 例如由左至右，分別顯示第一片待測面板14上之髒污位 置，第二片待測面板14上之四周黑邊（Black Matrix) 中之髒污位置，以及第三片待測面板14上之刮傷位置， 讓每一台瑕疵顯示及清潔作業機台20之作業人員可以快 速判定該缺陷之種類，並選擇以適當方式進行作業處置 〇 如圖3所示，本案之使用者介面22上進一步可顯示該 缺陷15之影像資料及其X、Y軸之座標資料，讓每一台瑕 疵顯示及清潔作業20之作業人員藉由該影像資料及X、Y 軸之座標資料可以快速判定該缺陷之種類，並選擇以適 101212877^^ A〇101 第8頁/共16頁 1012041376-0 M441822 當方式進行作業處置。 如圖4所示，藉由該使用者介面22上所顯示該缺陷15 之影像資料，讓每一台瑕疵顯示及清潔作業20之作業人 員藉由該影像資料可以快速判定該缺陷15之種類，並選 擇以適當方式進行作業處置。The at least one stopper 23 is, for example but not limited to, a transparent or translucent stopper to form the block 24, and the stopper 23 is used to carry the panel 14 to be tested to prevent the panel 14 and the display to be tested. 21 contact, causing secondary damage. In the present embodiment, the two stoppers 23 are disposed in parallel or diagonally, but are not limited thereto. In addition, the block 24 may be formed by three or four stops 23 in this case, but is not limited thereto. In addition, the display 21 can also adjust its brightness to provide the backlight required for the panel 11 to be tested in the block 24. 1012041376-0 When the stage 11 is only loaded with a panel 14 to be tested, when the image capturing device 12 and the image processing device 13 complete the detection, the optical automatic detecting machine 10 sequentially steps the panel 14 to be tested. And corresponding coordinate parameters and image data are transmitted to the first 瑕疵 display and cleaning work machine 20, the second 瑕疵 display and cleaning work machine 20 and the third 瑕疵 display and clear 10121287 production order number A0101 page 7 / A total of 16 pages of M441822 clean work machine 20, allowing the operator to quickly determine the type of the defect 15 and choose to handle the work in an appropriate manner. When the stage 11 carries a plurality of panels 14 to be tested at a time, when the image capturing device 12 and the image processing device 13 complete the detection, the optical automatic detecting machine 10 simultaneously records the corresponding coordinate parameters and image data. Then, the first panel to be tested 14 and its corresponding coordinate parameters and image data are sequentially transmitted to the first display and cleaning work machine 20, and the second panel to be tested 14 and its corresponding coordinate parameters and The image data is transmitted to the second clear display and cleaning work machine 20, and the third test panel 14 and its corresponding coordinate parameters and image data are transmitted to the third display and cleaning work machine 20 for operation. The person can quickly determine the type of the defect 15 and choose to handle the work in an appropriate manner and speed up the work. As shown in FIG. 2, when the panel 14 to be tested is placed in the block 24 of the 瑕疵 display and cleaning work machine 20, the user interface 22 will accurately position and/or display the panel according to the coordinate parameter. The position of the defect 15, for example, from left to right, respectively shows the dirty position on the first panel 14 to be tested, the dirty position in the black matrix on the second panel to be tested 14, and the The scratch position on the three panels 14 to be tested allows the operator of each 瑕疵 display and cleaning machine 20 to quickly determine the type of the defect and select the appropriate operation to perform the work, as shown in FIG. Further, the user interface 22 of the present case can display the image data of the defect 15 and the coordinate data of the X and Y axes, so that the operator of each of the display and cleaning operations 20 can use the image data and the X and Y axes. The coordinate data can quickly determine the type of the defect, and choose to handle the work in the manner of 101212877^^ A〇101 page 8/16 pages 1012041376-0 M441822. As shown in FIG. 4, by the image data of the defect 15 displayed on the user interface 22, the operator of each of the UI display and cleaning operations 20 can quickly determine the type of the defect 15 by using the image data. And choose to dispose of the work in an appropriate manner.
綜上所述，藉由本案之面板檢測、瑕疵顯示及清潔 作業系統之實施，其具有：光學自動檢測機台可掃瞄該 待測面板上是否有缺陷，並於擷取該缺陷之影像後，提 供該缺陷之座標參數；以及其至少一瑕疵顯示及清潔作 業機台上具有一顯示器，該顯示器上具有由兩個透明擋 塊所形成之一區塊，當該待測面板放置於該區塊中時， 該使用者介面根據該座標參數可精確定位及/或顯示出該 缺陷之位置，讓作業人員可以快速判定該缺陷之種類， 並選擇以適當方式進行作業處置等優點，因此，本案確 實較習知之面板檢測裝置具有進步性。In summary, with the implementation of the panel detection, the display and the cleaning operation system of the present invention, the optical automatic inspection machine can scan the panel to be tested for defects, and after capturing the image of the defect. Providing coordinate parameters of the defect; and at least one of the display and cleaning work machines having a display having a block formed by two transparent stops, wherein the panel to be tested is placed in the area In the block, the user interface can accurately locate and/or display the position of the defect according to the coordinate parameter, so that the operator can quickly determine the type of the defect and select an appropriate method for handling the work, so the case It is indeed more advanced that the panel inspection device is more conventional.
本案所揭示者，乃較佳實施例，舉凡局部之變更或 修飾而源於本案之技術思想而為熟習該項技藝之人所易 於推知者，俱不脫本案之專利權範疇。 綜上所陳，本案無論就目的、手段與功效，在在顯 示其迥異於習知之技術特徵，且其首先創作合於實用， 亦在在符合新型之專利要件，懇請貴審查委員明察， 並祈早曰賜予專利，俾嘉惠社會，實感德便。 【圖式簡單說明】 [0005] 圖1(a)為一示意圖，其繪示習知之面板檢測裝置於 檢測到到傷或髒污等瑕疵後進行喷墨定位之示意圖。 圖1 ( b)為一示意圖，其繪示習知之面板檢測裝置於 10121287产單編號A0101 第9頁/共16頁 1012041376-0 M441822 喷墨定位後之剖面示意圖。 圖1(c)為一示意圖，其繪示習知之面板檢測裝置於 喷墨定位及拋光後之剖面示意圖。 圖2為一示意圖，其繪示本案一較佳實施例之面板檢 測、瑕疵顯示及清潔作業系統之方塊示意圖。 圖3為一示意圖，其繪示本案一較佳實施例之使用者 介面上進一步可顯示該缺陷之影像資料之示意圖。 圖4為一示意圖，其繪示如圖3甲所示之該缺陷之影 像資料之放大示意圖。 【主要元件符號說明】 [0006] 光學自動檢測機台10 載台11 取像裝置12 影像處理裝置13 待測面板14 缺陷1 5The disclosure of the present invention is a preferred embodiment. Any change or modification of the present invention originating from the technical idea of the present invention and being easily inferred by those skilled in the art will not deviate from the scope of patent rights of the present invention. In summary, the case, regardless of its purpose, means and efficacy, is showing its technical characteristics that are different from the conventional ones, and its first creation is practical, and it is also in line with the new patent requirements. I was granted a patent in the early days, and I was very happy with the society. BRIEF DESCRIPTION OF THE DRAWINGS [0005] Fig. 1(a) is a schematic view showing a conventional panel detecting device for performing ink jet positioning after detecting flaws such as injury or dirt. Fig. 1(b) is a schematic view showing a cross-sectional view of a conventional panel detecting device after inkjet positioning of a single-numbered A0101 page 9/16 page 1012041376-0 M441822. Fig. 1(c) is a schematic view showing a cross-sectional view of a conventional panel detecting device after ink jet positioning and polishing. Fig. 2 is a schematic view showing a block diagram of a panel detecting, 瑕疵 display and cleaning operation system according to a preferred embodiment of the present invention. FIG. 3 is a schematic diagram showing image data further displaying the defect on the user interface of a preferred embodiment of the present invention. Fig. 4 is a schematic view showing an enlarged view of the image data of the defect shown in Fig. 3A. [Explanation of main component symbols] [0006] Optical automatic inspection machine 10 Carrier 11 Image capture device 12 Image processing device 13 Panel to be tested 14 Defect 1 5
瑕疵顯示及清潔作業系統20 顯示器21 使用者介面22 擋塊23 區塊24 待測物件100 喷墨11 0 到傷120 10121287^驗 A〇101 第10頁/共16頁 1012041376-0瑕疵Display and cleaning operating system 20 Display 21 User interface 22 Stop 23 Block 24 Object to be tested 100 Inkjet 11 0 to injury 120 10121287^Test A〇101 Page 10 of 16 1012041376-0