M421499 五、新型說明： 【新型所屬之技術領域】 本創作係錢於-種光學檢_統，特別是—種具 射之光學檢測系統 【先前技術】 —般來說絲檢測H個來檢測零件之外觀缺陷或量測尺寸 等檢測項目，尤其是應用於表面黏著製程之零件，史是需要 =的外觀缺陷或尺寸獅輪择目，叫保表面黏著元件^ 品質。 . Λ ·. 習知之光_齡括L:.、,_光源模組及—醉鏡 心檢測台擺放_零件，再來光源模組對著零件_出 攄2或背向光源，接著攝影鏡職取顯示之影像，最後依 據擷取之·騎__献指爾㈣項目。 一^知之光學檢測器之檢測台、光源模組及攝影鏡頭位於 二、由上如此將導致光學檢測器呈現長條狀的外觀，條若需 因此’如何縮小光學檢測 齡，得待_影料，所钱學檢測紅元件直線 且起來更而要龐大的空間來擺放 器的體積將是設計人員應解決的問題。 f新型内容】 檢測種光學檢測系統’藉以解決先前技術之光學 題。效祿取到表面轉元件之輪廊且光學檢測器之體積 M421499 一實施例所揭露之光學檢測系統，係用以檢測一待測物，其 光學檢測系統包括一背光模組、一正光模組及一攝像模組。其中， 背光模組具有一第一發光件及複數第一反射件，這些反射件係圍 繞在待測物之各側邊’弟一發光件係提供待測物一背光源。正光 模組具有-第二發光件及-第二反射件，第二發光件係朝向第二 反射件發出一正光源，且第二反射件係導引正光源至這些第一反 射件。攝像模組具有-攝像構件及—第三反射件，第三反射件係 投射待測物之正面影像及成像於這些第—反射件之待測物之各側 面影像至攝像構件。 ，上述實施例所揭露之光學檢測系統，係利用這些第一反射 件、第二反餅及第三反雜改縣_轉，使級的路經符 合所需之路線行進。藉此紐配置各辆她與攝像模組的擺設 位置以有效縮小光學檢測***的體積。. 另外，_這錄_反射件衫二反射件紅統投射至待 靡㈣㈣朗，料大幅減 =之__Α下之實施方式之說明係用 權伽’蝴物吩街請細更 【實施方式】· 例之2錢「第1Α圖」至「第3圖」’「第1Α圖」為一實施 '先4測糸統的立體示意圖，「第1Β圖」為「第1Α圖」之 内部元件的立體示意圖，「第2 Α 圖，「第瓜圖」為「第㈣圖」的分解示意 ㈡」為第2A圖」之背光模組的分解示意圖兀 回·卜第2Β圖」之待.測物的立體示意圖，「第3圖 圖J的剖面示意.圖。 ‘，，、弟1 ·: · 爲施例之光學檢測系統1〇包括一背光模組獅、— ^ 200 300 〇 1〇 ⑽〇 °待測物鲁例如是表崎元件。其中，待測物且有 一正面:4ΐσ' —背面及多個側面。另外，可姻機械手臂 (未Τ或真.空玫盤(未繪示)將_物4〇〇置入背光模組跡内。 、背光模組_.包括。置物G 11G、—第—發光件i2G、壤數値 第反射件130、-句光板14〇及一透明阻隔板15〇。置物口⑽ 設置於背光模組100之頂面並與外部環境相互連通。為了猶測 物400能被放入背光模組1〇〇内，第一發光件12〇為一環狀之發 光元件，詳細來說，第-發光件12G包括多個發光二極體师 emitting diode ’ LED)燈泡’轉光二極雜泡環設於置物口 11〇 之邊緣。 • · . 這些第一反射件130圍繞在待測物4〇〇之各侧面42〇 ,且這些 第-反射件13G之反射面分別與待測物伽之各側面42()夾有一 銳角，以改變光線之行進路徑。 為了讓第-發光件120發出之背光源121均勻的投射於待測 物400之背面430,背光模組100另包括一勻光板14〇，勻光板14〇 用以讓背光源121產生折射或散射。 M421499 為了讓待測物400不至於掉入正光模組200，背光模組loo 底部另包括一透明阻隔板150,透明阻隔板150 —方面可防止待測 物400掉到正光模組2〇〇内，一方面又可讓光線透射。 正光模組200包括一第二發光件210及一第二反射件22〇。第 一發光件210發出一正光源211，，本實施例之正光源211.為具有平 行光之特性的同軸光源。第二反射件22〇設置於正光源211的投 射路仅上，且將正光源211反射並導引至第一反射件.，以改變 正光源211的行進路徑。而本實施例之第二反射件22〇.為一半透 明半反射之反射元件，故反射至第一反射件13〇的正光源211之 .強度為第二發光件21〇發出之i光源211之強度的一半。但並不 以此為限’在其他實施例中，第二反射件22〇也可以採用其他反 射透射比之反射元件。 攝像模組300包括一攝像構件310及第三反射件32〇。攝像構 件310包括一鏡頭311及一電荷耦合元件312。電荷耦合元件312 係透過鏡頭311擷取影像。第三反射件32〇係用以改變正光源2ιι 與背光源121的行進路徑。因此，第三反射件32〇係將待測物4〇〇 之正面410的影像及成像於這些第一反射件13〇之待測物4〇〇之 各側面420的影像透過鏡頭311投射至電荷耦合元件312。 接著描述背光源121與正光源211的投射路徑與擷取之影 像。請參閱「第4圖」至「第6圖」，「第4圖」為「第1B圖」之 正光源與背光源的投射路彳£圖，「第5圖」為「第4圖」之正光源 的背光示意圖’「第6圖」為「第1B圖」之待測物的影像擷取示 意圖。由「第4圖」可知第—發光件12〇投射背光源121自待測 物400.之背面430，故因待測物400遮住背光源121而產生陰影， 此陰影則為待·測物.400之正面41〇的輪廟(如.「第6圓」;所糸):。:..., 第二發光件210投射正光源211至第二反射件22〇。.接著，第 二反射·件220。改變正光源2α 1，之行進路徑並將一半之先餘办L .導引至第-反射件13〇。接著，第一反射件m將正光源加投知; 至待測物雜之側® 420，而待測物働之側面42〇 _住正光源 211以產生陰影’此陰影則為待測物4〇〇之側面42〇之輪廊(如「.第 ::6圖J所雨声 ........ • · ..... r ys.； · ，·. 接箸描述上述正光源2ij如何產生背光效果 「第參齒v 所示™投射至其中一第一反射件13。，二 130將正光源211投射至待測物之其中一側面42〇。此♦待 測物之另-側面420之第一反射件13〇會將影像投射至攝像模組 300而此影像所顯不之結果，如同人站在待測物彻之另一侧面 42〇觀察待測物彻，而正光源叫打在待測物相對的側面樣 述實施觸揭露之光學檢_統，係利用這些第一反射 2、^二反射件及第三反射件改變絲的路徑，使光線的路徑符 2需之路線行進。藉此細齡光賴組與攝健組的擺設 以有效縮小光學檢測系統的體積。 M421499 少攝影機使用數目。 另外，第二發光件所發出之正光源為具有平行光特性之同軸 光源由於同軸规的光線較不會發散，是以當正光源經由第 -反射件投射至待測物之侧面時，可產生高反差之待側物的輪靡 影像’以提南量測待測物之尺寸準確度。 雖然本創作之實施例揭露如上所述，然並非用以限定本創 作’任何热習相關技藝者在不脫離本創作之精神和範圍内，舉 凡依本創作申請範圍所述之形狀、構造、魏及精神#可做些許 之文更目此本創作之專利保護範圍須視本說明書所附之申請專 制範圍所界定者為準> .【圖式簡單說明】 「第1八圖」為—實施例之光學檢測系統的立體示意圖。 「第1Β圖」為「第1A8j」之内部元件的立體示意圖。 第2A圖」為「第1B圖」的分解示意圖。 「第3圖」為「第2A圖」之背光模經的分解示意圖。 「第2C圖」為「第2B圖」之待測物的立體示意圖。 「第3圖」為「第1圖」的剖面示意圖。 「=圖」為第⑴圖」之正光源與背光源的投射路徑圖。 「5圖」為「第4圖」之正光源的背光示意圖。 :第6圖」為「第4圖」之待測物的影像操取示意圖。 【主要兀件符號說明】 1〇,. 光學檢測系統M421499 V. New description: [New technical field] This creation is a kind of optical inspection system, especially the optical detection system with a shot [previous technology] - generally, the detection of H to detect parts Test items such as appearance defects or measurement dimensions, especially those applied to the surface adhesion process, history is required to = the appearance of defects or size lion wheel selection, called surface adhesion components ^ quality. Λ ·. The light of knowledge _ age includes L:.,, _ light source module and - drunk mirror detection table placed _ parts, then the light source module facing the part _ out 2 or back to the light source, then photography The image of the mirror is used to display the image, and finally it is based on the capture and riding __ 献 尔 (4) project. The detection table, the light source module and the photographic lens of the optical detector are located at the second position, which will cause the optical detector to have a long strip appearance. If necessary, the method can reduce the optical inspection age. It is a problem that designers should solve to detect the volume of the red component in a straight line and to make the space larger. f new content] detection of optical detection systems ' to solve the optical problems of the prior art. The optical detection system disclosed in the embodiment is used to detect an object to be tested, and the optical detection system comprises a backlight module and a positive light module. And a camera module. The backlight module has a first illuminating member and a plurality of first reflecting members. The reflecting members are wound around the sides of the object to be tested, and the illuminating member provides a backlight of the object to be tested. The positive light module has a second light emitting member and a second reflecting member, the second light emitting member emitting a positive light source toward the second reflecting member, and the second reflecting member guiding the positive light source to the first reflecting members. The camera module has an imaging member and a third reflecting member, and the third reflecting member projects a front image of the object to be tested and each side image of the object to be tested imaged on the first reflecting member to the image capturing member. The optical detecting system disclosed in the above embodiments utilizes the first reflecting member, the second counter cake, and the third anti-counterfeit county to make the path of the stage travel in accordance with the required route. This button is used to configure the position of each camera and camera module to effectively reduce the volume of the optical detection system. In addition, _ this record _ reflexive shirt two reflective parts of the red system projected to be 靡 (four) (four) lang, the material is greatly reduced = _ _ Α 之 之 之 之 实施 实施 权 权 权 ' ' ' ' ' 蝴 蝴 蝴 蝴 蝴 蝴 蝴 蝴 蝴 蝴 蝴 蝴】· Example 2 Money "1st map" to "3rd map" ""1st map" is a three-dimensional diagram of the implementation of the 'first 4 test system', and the "1st map" is the internal component of the "1st map" The three-dimensional diagram, "The second map, the "Guagua map" is the decomposition of the "fourth map" (2) is the decomposition diagram of the backlight module of the 2A map". A three-dimensional diagram of the object, "Fig. 3 is a cross-sectional view of Fig. J. ',,, brother 1 ·: · The optical detection system for the example 1 includes a backlight module lion, - ^ 200 300 〇 1 〇 (10)待° The object to be tested is, for example, a surface element. Among them, the object to be tested has a front surface: 4ΐσ'—back surface and multiple sides. In addition, the mechanical arm can be married (unfinished or true. Empty plate (not shown)) The _ object 4 〇〇 is placed in the backlight module trace. The backlight module _. includes: the storage G 11G, the first illuminating member i2G, the number of the first reflecting member 130, the sentence light The board 14 〇 and a transparent blocking plate 15 〇. The storage opening (10) is disposed on the top surface of the backlight module 100 and communicates with the external environment. The illuminating object 400 can be placed in the backlight module 1 ,, the first illuminating The 12-inch light-emitting element is a ring-shaped light-emitting element. In detail, the first light-emitting element 12G includes a plurality of light-emitting diodes emitting diode 'LED' bulbs, and the light-transmitting two-pole bubble ring is disposed at the edge of the storage opening 11〇. The first reflecting member 130 surrounds each side surface 42 of the object to be tested 4, and the reflecting surfaces of the first reflecting members 13G respectively have an acute angle with each side surface 42 of the object to be tested. In order to make the backlight 121 emitted by the first illuminating member 120 uniformly projected on the back surface 430 of the object to be tested 400, the backlight module 100 further includes a light concentrating plate 14 〇, and the light absorbing plate 14 让 is used for backlighting. The source 121 generates refraction or scattering. M421499 In order to prevent the object to be tested 400 from falling into the positive light module 200, the bottom of the backlight module loo further includes a transparent barrier plate 150, and the transparent barrier plate 150 prevents the object to be tested 400 from falling. The positive light module is inside the 2 ,, on the one hand, it allows light to pass through. The positive light module 200 includes a second light emitting element 210 and a second light reflecting element 22. The first light emitting element 210 emits a positive light source 211. The positive light source 211 of the embodiment is a coaxial light source having the characteristics of parallel light. The second reflecting member 22 is disposed only on the projection path of the positive light source 211, and reflects and guides the positive light source 211 to the first reflecting member to change the traveling path of the positive light source 211. The second reflection of the embodiment The piece 22 is a semi-transparent and semi-reflective reflecting element, so that the intensity of the positive light source 211 reflected to the first reflecting member 13A is half the intensity of the i-light source 211 emitted by the second illuminating member 21. However, it is not limited thereto. In other embodiments, the second reflecting member 22A may also adopt other reflective elements having a reflective transmittance. The camera module 300 includes an imaging member 310 and a third reflecting member 32A. The camera member 310 includes a lens 311 and a charge coupled component 312. The charge coupled device 312 captures an image through the lens 311. The third reflecting member 32 is used to change the traveling path of the positive light source 2 and the backlight 121. Therefore, the third reflecting member 32 is configured to project an image of the front surface 410 of the object to be tested 4 and an image of each side surface 420 of the object to be tested 4 401 formed on the first reflecting member 13 through the lens 311 to the electric charge. Coupling element 312. Next, the projection path of the backlight 121 and the positive light source 211 and the captured image will be described. Please refer to "Figure 4" to "Figure 6". "Figure 4" is the projection path of the positive light source and the backlight of "1B", and "5th" is "4th". The backlight schematic of the positive light source '"Fig. 6" is a schematic image capture of the object to be tested in "1B". It can be seen from Fig. 4 that the first light-emitting member 12 〇 projects the backlight 121 from the back surface 430 of the object to be tested 400. Therefore, the object to be tested 400 blocks the backlight 121, and the shadow is the object to be measured. The front of the .400 is a 41-inch round temple (eg "6th round"; so far):. The second illuminating member 210 projects the positive light source 211 to the second reflecting member 22 〇. Next, the second reflection member 220. The traveling path of the positive light source 2α1 is changed and half of the first L is guided to the first reflecting member 13A. Then, the first reflecting member m adds the positive light source to the side; the side of the object to be tested is 420, and the side of the object to be tested is 42 〇 _ the positive light source 211 to generate a shadow 'this shadow is the object to be tested 4轮 〇〇 〇 〇 〇 ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( How the light source 2ij produces a backlight effect "The TM shown by the reference tooth v is projected to one of the first reflection members 13. The second 130 projects the positive light source 211 onto one of the sides 42 of the object to be tested. - the first reflecting member 13 of the side surface 420 projects the image to the camera module 300, and the result of the image is as if the person is standing on the other side of the object to be tested, and the object to be tested is observed. The light source is called an optical inspection method for performing the touch exposure on the opposite side of the object to be tested, and the first reflection 2, the second reflection member and the third reflection member are used to change the path of the wire, so that the path of the light is required to be 2 The route travels. This makes it possible to reduce the size of the optical inspection system by the arrangement of the aging group and the camera group. M421499 The number of cameras used is small. In addition, the second The positive light source emitted by the illuminating member is a coaxial light source having parallel light characteristics. Since the light of the coaxial gauge is less divergent, the high light contrast can be generated when the positive light source is projected onto the side of the object to be tested via the first reflecting member. The rim image of the side object is used to measure the dimensional accuracy of the object to be tested. Although the embodiment of the present disclosure is as described above, it is not intended to limit the creation of any of the art-related artists. Within the spirit and scope of the application, the shape, structure, and spirit of the application as described in the scope of this application may be made a little more. The scope of patent protection of this creation shall be defined by the scope of the application authorship attached to this specification. 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 It is an exploded view of "1B". "3" is an exploded view of the backlight of "2A". "2C" is a schematic view of the object to be tested in "2B". 3 map" is " "Figure" is a schematic diagram of the projection of the positive light source and the backlight of "(1)". "5" is the backlight of the positive light source of "Fig. 4": Fig. 6" Schematic diagram of the image manipulation of the object to be tested in "Fig. 4" [Description of the main components] 1〇,. Optical inspection system