M397526 五、新型說明·· 【新型所屬之技術領域】 本創作係與探針卡結構有關，更詳而言之是指—種探針以 非對稱式排列’且用於測試LCD驅動電路之探針卡。 【先前技術】 已知液晶顯示裝置之驅動電路傜使用捲帶式封裝(丁叩6 Camer Package，TCP) ’亦即’該些複數個驅動電路彼此間係 呈併鄰設置，又每-驅動電路包含一積體電路及 點與該積體電路雜連接。-制每—萄魏的== 性’既有探針卡是在1路板下綠置有兩排各由複數根探針 «的接觸單元，如第—圖所示，其中—接觸單^之探針】用 、接觸驅動電路3之§fl號接點％，並作細懷訊號輸入用， 另-接觸單元之探針2用以接觸驅動電路3之訊號接點％， 並作為測顧4號之輸出用，藉此，俾達量測目的。 &誠然上述探針卡雖可完成驅動電路之電氣特性測試，惟， 探針卡之該二接觸單元僅能於每一次測試時，完成-個驅動電 路的電氣特性測試，致量測效能難以彰顯。 為解決上频失，有絲騎卡製作成—次可同時量 ^兩個驅動電路之結構，以期提升雜檢測效率。如第二圖所 不之探針卡，包括有作為測試訊號輸入用之探針4及探針6 ’ 3 M397526 以及作為測試訊號輸出用之探針5及探針7，利用探針4搭配 探針5、探針6搭配探針7的交錯配置方式而達成上述㈣。 然而’上述結構存有下列缺失： 其-，作為測試訊號輸入用之探針4及探針6容易受到作 為測試訊號輸出用之探針5及探針7的電性干擾； 其二，因作為測試訊號輸入用之探針4的長度與探針6的 長度不’導致各用於傳輸高頻訊號的探針4及探針石的阻抗 匹配精準设定困難度增加。 【新型内容】M397526 V. New Description·· 【New Technology Fields】 This creation is related to the structure of the probe card, more specifically, the probes are arranged in an asymmetrical manner and are used to test the LCD driver circuit. Needle card. [Prior Art] It is known that a driving circuit of a liquid crystal display device uses a tape and reel type package (TCP), that is, 'the plurality of driving circuits are arranged adjacent to each other, and each driving circuit An integrated circuit and a point are connected to the integrated circuit. - The system of each - Wei's == Sexual probe card is a contact unit with two rows of probes « under the 1st board, as shown in the figure - where - contact sheet ^ The probe uses the contact point §fl of the drive circuit 3 for the input of the signal, and the probe 2 of the contact unit is used to contact the signal contact % of the drive circuit 3, and serves as a probe. The output of No. 4 is used for this purpose. It is true that although the above probe card can complete the electrical characteristic test of the driving circuit, the two contact units of the probe card can only perform the electrical characteristic test of one driving circuit in each test, which makes the measurement performance difficult. Highlighted. In order to solve the upper frequency loss, the silk riding card is made into a structure that can simultaneously measure the two driving circuits to improve the efficiency of the hybrid detection. The probe card as shown in the second figure includes the probe 4 for the test signal input and the probe 6 ' 3 M397526 and the probe 5 and the probe 7 for the test signal output, and is probed by the probe 4 The above (4) is achieved by the staggered arrangement of the needle 5 and the probe 6 in conjunction with the probe 7. However, the above structure has the following drawbacks: - the probe 4 and the probe 6 used as the test signal input are susceptible to electrical interference as the probe 5 and the probe 7 for the test signal output; The length of the probe 4 for the test signal input and the length of the probe 6 do not cause an increase in the difficulty of accurately setting the impedance matching of the probe 4 and the probe stone for transmitting the high frequency signal. [New content]
有鑑於此，本創作之主要目的在於提供一種用於測試LCD 驅動電路之探針卡，具有提升電性檢測效率，及便酿抗匹配 之精準設定。 緣以達成上述目的’本創作所提供用於測試LCD驅動電 路之探針卡包含—電路板、一第一探針組與-第二探針組。其 _—電路板之下表面設置有—支撐物，該支撐物定義有一第一 固二區、帛一固定區與一第三固定區；第-探針組用以量測 -第-電路之魏特性，且包含複數顧定於該支撐物之 第，口疋區的k針’以及複數根固定於該支撐物之第二固定區 的探針；第二探針朗以m驅動電路之電氣特性，該 第二驅動電路係相鄰於該第一驅動電路，該第二探針組包含複 數根口疋於錢撐物之第三固定區的探針，且該些探針區分有 4 上針層及—下針層，以及至少—導體係電性隔離 觸與該下針L料體電性連接至接地電 位。 【實施方式】 為能更清楚地說明本創作，兹舉較佳實施例並配合圖示詳 細說明如後。 ^閱第―’所7F’摘作-較佳實施烟於測試 LCD驅動電路之探針卡⑽包括—電路板⑴、―第一探針組 20與一第二探針組3〇;其中： *電路板10具有複數個貫穿其上、下表面之開口】】與導電 穿孔12，且各導電穿孔12之兩端分別設有一上接點^與一 下接點12b。電路板1〇再於其上表面外圍設置有複數個測試 接點13，每-測試接點13藉由一跳線14而與對應的上接點 l2a電性連接，前述測試接點13係作為與一測試機的電性連 接使用，此外，除上述的電性連接方式之外，下接點12b與測 武接點13之間可在電路板内部設置内部電路(圖中未繪示）， 以取代導電穿孔12、上接點12a及跳線14的功用；電路板1〇 的下表面則設置有一具絕緣特性之支撐物15，於此定義，該 支撐物15具有一第一固定區15a、一第二固定區15b與一第 三固定區15c。 第一探針組20係用以量測一第—驅動電路_ 性，所述第-驅動電路細係包含有複數個訊 _ 加包含複數根固定於該支撑物^ 固定區❿的探針22,以及複數根固定於該支撐物15^一 固定㈣的探針24,其中探針22用以接觸訊心-並作為測試機之峨訊號輸出用，探針24 _叫 點202 ’並作為測試機之測試訊號輸入用。 D』接 第二探針組3〇係用以量測相鄰於該第一驅動電路200之 = 綱’的電氣特性，其包含狀於該支擇物15 ❹與騎34，斗μ w +相複數根探 八甲上針層的探針32長度較長，且用以 接觸訊號接點201，並作為測觀號之輸出用，下奸的 34長度較短且用以接觸訊號接點2〇2，並作為測顺^入 用。另，第二探針組3G更包括有—以銅㈣為例之導體，盆 設置於該上針層與該下針層之間，並電性連接至接地電位’I 與各探針32、探針34保持著電性隔離的狀態。 、上述即為本創作較佳實施例之探針卡1〇〇結構說明，於量 測時因可同時檢測兩個鶴電路，俾可提升電性檢測效率。 又，、電路板ίο之開口 n具有方便操作員檢視探針是否對準 驅動電路之喊接點用；另，本創作作為測試訊號輸入用的探 針24及探針34的長度較短，俾利於施工，計，探針糾更 因長度短於探針32，使得其等重疊部分減少，且因鋪％的 M397526 居間設置，故使得探針34遭受作為測試訊號輸出用的探針％ 的電性干擾影響甚少。 • 另外，本創作第二探針組30之銅箔36的設置位置除上述 之外’尚可以選擇包覆在第五圖所示之複數探針32或第六圖 所不之複數探針34的外部，且蝴％與該些探針％ (或料） ， 之間再設置有—絕緣層38以達電性隔離目的，如是，將可收 . 豸免訊號傳輸受干擾之效。同樣地，第-探針組2G之探針24 •，亦可在第七圖所示之外部包覆-絕緣層25後，復於絕緣層乃 表面以半導體製程形成一電性連接至接地電位的金屬層％， 據以獲得良好的阻抗匹配效果；或如第八圖所示於絕緣層乃 外部以包覆且電性連接至接地電位的金屬管π之方式達日成阻 抗匹配設定目的，該第，結構又稱制軸探針；抑或者選擇 於與域24並列且置於探針24表面的接地導線28外部包覆 一絶緣層29亦得為之，如第九圖所示。 鼸 上述第七圖到第九圖是敘述第一探針組Μ測試訊號輸入 ㈣探針結構，主要祕提供探針24触抗匹配，使探針卡 可以用於更局測試訊號的產品測試，當然，上述第七圖到第九 冓樣可以用於第二探針組30測試訊號輸入用的探針 結構’亦即提供探針34的阻抗匹配。 以上所述僅為本創作較佳可行實施例而已，舉凡應用本創 作說明書及申請專利範圍所為之等效結構變化，理應包含在本 創作之專利範圍内。 7 【圖式簡單說明】 第一圖為已知探針卡之量測示意圖。 第二圖為另一已知探針卡之量測示意圖。 第三圖為本創作一較佳實施例探針卡之半剖立體圖。 第四圖為本創作上述較佳實施例探針卡之剖視圖。 第五圖為一剖視圖’揭示銅箔包覆第二探針組之訊號輸出用探 針。 第六圖為一剖視圖’揭示銅箔包覆第二探針組之訊號輸入用探 針。 第七圖為一剖視圖，揭示第一探針組之測試訊號輸入用探針搭 配電性連接至接地電位導體的一種方式。 第八圖為一剖視圖’揭示第一探針組之測試訊號輸入用探針搭 配電性連接至接地電位導體的另一種方式。 第九圖為一剖視圖，揭示第—探針組之測試訊號輸入用探斜搭 配電性連接至接地電位導體的再一種方式。In view of this, the main purpose of this creation is to provide a probe card for testing the LCD driving circuit, which has the advantages of improving the electrical detection efficiency and accurately matching the resistance. In order to achieve the above object, the probe card provided for testing the LCD driving circuit of the present invention comprises a circuit board, a first probe set and a second probe set. The bottom surface of the circuit board is provided with a support, the support defines a first solid two zone, a first fixed zone and a third fixed zone; the first probe set is used for measuring - the first circuit Wei characteristics, and comprising a plurality of probes in the mouth, a k-needle of the mouth area and a plurality of probes fixed to the second fixed area of the support; the second probe is electrically driven by the m drive circuit Characteristic, the second driving circuit is adjacent to the first driving circuit, and the second probe group includes a plurality of probes that are connected to the third fixed area of the money support, and the probes are divided into 4 The needle layer and the lower needle layer, and at least the conductive system electrically is in contact with the lower needle L body electrically connected to the ground potential. [Embodiment] In order to explain the present invention more clearly, the preferred embodiment will be described in detail with reference to the accompanying drawings. Read the first - '7F' extract - preferably implement the test card (10) for testing the LCD driver circuit, including - the circuit board (1), the first probe set 20 and a second probe set 3; wherein: * The circuit board 10 has a plurality of openings extending through the upper and lower surfaces thereof and the conductive vias 12, and each of the two ends of the conductive vias 12 is provided with an upper contact and a lower contact 12b. The circuit board 1 is further provided with a plurality of test contacts 13 on the periphery of the upper surface thereof. Each of the test contacts 13 is electrically connected to the corresponding upper contact 12a by a jumper 14, and the test contact 13 is used as the test board. In addition to the electrical connection method described above, an internal circuit (not shown) may be disposed inside the circuit board between the lower contact 12b and the test contact 13 in addition to the above electrical connection manner. To replace the functions of the conductive via 12, the upper contact 12a and the jumper 14; the lower surface of the circuit board 1 is provided with a support 15 having an insulating property, and the support 15 has a first fixed area 15a. a second fixed area 15b and a third fixed area 15c. The first probe set 20 is configured to measure a first driving circuit, and the first driving circuit includes a plurality of signals. The probe 22 includes a plurality of probes 22 fixed to the support region. And a plurality of probes 24 fixed to the support 15 and a fixed (four), wherein the probe 22 is used to contact the signal core - and is used as the signal output of the test machine, and the probe 24 _ is called the point 202 'and is used as a test The test signal input of the machine is used. D" is connected to the second probe set 3 to measure the electrical characteristics of the first drive circuit 200, which includes the shape of the support 15 骑 and the ride 34, the bucket μ w + The probe 32 of the plurality of probes of the upper eight layers is long and is used for contacting the signal contact 201 and is used as the output of the observation number. The length of the 34 is shorter and is used to contact the signal contact 2 〇 2, and used as a test. In addition, the second probe set 3G further includes a conductor exemplified by copper (four), the pot is disposed between the upper needle layer and the lower needle layer, and is electrically connected to the ground potential 'I and each probe 32, The probe 34 remains electrically isolated. The above is the description of the structure of the probe card of the preferred embodiment of the present invention. When measuring two crane circuits at the same time, the electrical detection efficiency can be improved. Moreover, the opening n of the circuit board ίο has a convenient connection point for the operator to check whether the probe is aligned with the driving circuit; in addition, the length of the probe 24 and the probe 34 used for the test signal input is shorter, 俾Conducive to construction, metering, probe correction because the length is shorter than the probe 32, so that its overlap is reduced, and because of the M397526 intervening setting, the probe 34 is subjected to the probe as the test signal output. Sexual interference has little effect. In addition, in addition to the above, the position of the copper foil 36 of the second probe set 30 of the present invention can be selected to cover the plurality of probes 32 shown in the fifth figure or the plurality of probes 34 in the sixth figure. The external part, and the % of the probe and the probe % (or material), are provided with an insulating layer 38 for electrical isolation purposes, and if so, the signal transmission is disturbed. Similarly, the probe 24 of the first probe set 2G can also be electrically connected to the ground potential by a semiconductor process after the outer cladding-insulating layer 25 shown in FIG. % of the metal layer, in order to obtain a good impedance matching effect; or as shown in the eighth figure, the insulating layer is externally coated and electrically connected to the metal potential of the ground potential π to achieve the purpose of the impedance matching setting, The structure is also referred to as a shaft probe; or it is also selected to be coated with an insulating layer 29 on the outside of the grounding wire 28 juxtaposed with the field 24 and placed on the surface of the probe 24, as shown in FIG.第七The seventh to ninth above are the first probe set Μ test signal input (four) probe structure, the main secret provides probe 24 contact resistance matching, so that the probe card can be used for product testing of the test signal. Of course, the above seventh to ninth samples can be used for the probe structure for the second probe set 30 test signal input, that is, the impedance matching of the probe 34 is provided. The above description is only for the preferred embodiment of the present invention, and the equivalent structural changes of the present invention and the scope of the patent application are included in the scope of the patent. 7 [Simple description of the diagram] The first figure is a schematic diagram of the measurement of the known probe card. The second figure is a schematic diagram of the measurement of another known probe card. The third figure is a half cross-sectional perspective view of a probe card according to a preferred embodiment of the present invention. The fourth figure is a cross-sectional view of the probe card of the above preferred embodiment. Fig. 5 is a cross-sectional view showing the probe for signal output of the second probe set covered with copper foil. Fig. 6 is a cross-sectional view showing the probe for signal input of the second probe set covered with copper foil. Figure 7 is a cross-sectional view showing one way in which the test signal input probe of the first probe set is electrically connected to the ground potential conductor. The eighth figure is a cross-sectional view showing another way in which the test signal input probe of the first probe set is electrically connected to the ground potential conductor. The ninth drawing is a cross-sectional view showing another way in which the test signal input of the first probe set is connected to the ground potential conductor by the probe.
M397526 【主要元件符號說明】 100探針卡 10電路板 11開口 12導電穿孔 12b下接點 13測試接點 15支撐物 15a第一固定區 15c第三固定區 20第一探針組 22探針 24探針 26金屬層 27金屬管 29絕緣層 30第二探針組 32探針 34探針 38絕緣層 200第一驅動電路 201、202訊號接點 200’第二驅動電路 20Γ、202’訊號接點 12a上接點 14跳線 15b第二固定區 25絕緣層 28接地導線 36銅箔 9M397526 [Description of main component symbols] 100 probe card 10 circuit board 11 opening 12 conductive perforation 12b lower contact 13 test contact 15 support 15a first fixed area 15c third fixed area 20 first probe set 22 probe 24 Probe 26 Metal layer 27 Metal tube 29 Insulation layer 30 Second probe group 32 Probe 34 Probe 38 Insulation layer 200 First drive circuit 201, 202 Signal contact 200' Second drive circuit 20Γ, 202' Signal contact 12a upper contact 14 jumper 15b second fixed area 25 insulating layer 28 grounding wire 36 copper foil 9