TWM358968U - Probe device - Google Patents
Probe device Download PDFInfo
- Publication number
- TWM358968U TWM358968U TW97223953U TW97223953U TWM358968U TW M358968 U TWM358968 U TW M358968U TW 97223953 U TW97223953 U TW 97223953U TW 97223953 U TW97223953 U TW 97223953U TW M358968 U TWM358968 U TW M358968U
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- grounding
- test
- protective casing
- sleeve
- Prior art date
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
Description
M358968 五、新型說明： 【新型所屬之技術領域】 且特別是有關於一種具有 本創作是有關於1探針裝置 可伸縮之接地件的探針敦置。 【先前技術】 圖1是習知一種探針筆M358968 V. New description: [New technical field] It is especially related to a probe that has a grounding member for the 1 probe device. [Prior Art] FIG. 1 is a conventional probe pen
探針裝置的立體示意圖，圖’而圖2是習知之 護外殼。請參照圖丨相2、= ^略了 S知之探針裝置的保 RF)同軸探針^知^裝置100為一射頻（radi〇 筒12〇、-信號探針130 其包括一保護外殼110、一套 相對的-第-端m與—;及外殼⑽具有 Γ具有—人線孔115。套筒1誠置於 且邛分套筒120從保護外殼110的開口 113 140括；Μ外。此套筒120為接地套筒。此外，彈簧 1於套1^ 120的一端122與保護外殼110的第二端114 之間三信號探針130是從保護外殼UQ的第二端114之入線孔 115穿入保護外殼110内，並穿入彈簧14〇内與套筒12〇内， 且信號探針130的一測試端131延伸至保護外殼11〇外。另 外，採針裝置100包括一固定柱132以及一絕緣層136。信號 探針130是配置於固定柱132内，且部分探針134暴露於固定 柱132外，以形成上述之測試端131。絕緣層136是配置於信 號探針130與固定柱132之間。 圖3是習知之探針裝置用於測試電路板的射頻訊號的示 意圖。請參照圖1與圖3，習知探針裝置1〇〇是用於測量一模 組的射頻訊號，此模組具有一電路板5〇，且電路板5〇的一表 面51設有射頻訊號測試端子52以及圍繞此射頻訊號測試接子 3 M358968 52的一接地端子54。測試射頻訊號的方法是將信號探針 的測試端131對準射頻訊號測試端子52，並將套筒12〇的接 觸端124對準接地端子54。接著，下壓探針裝置100，使套筒 120的接觸端124抵靠接地端子54，如此套筒12〇會擠壓彈箬 140並$微縮入保護外殼11〇内，而信號探針13〇的測試端 則會抵靠射頻訊號測試端子52，以測量電路板5〇的射頻訊號。 承上述，在測量射頻訊號時，套筒12〇的接觸端124需整 個與接地端子52接觸，以避免接地參考訊號失真而導致測量 •出的射頻訊號產生嚴重的誤差。因此，探針裝置100需沿垂直 ，路，50之表面51的方向m下壓，以使套筒12〇的接觸端 4月b整個與接地端子52接觸。然而，在某些情況下，如探 -針^置1〇〇無法沿方向D1下覆或接地端子52不平坦時，則 套筒120 _觸端124僅有部分與接地端子52接觸。如此， ^接地參考訊號失真，並導致·㈣射頻訊號產生嚴重的 【新型内容】 本創作提供-種探針裝置，以提高測試準確度。 試端述優點’本創作提出—種探針裝置，其適於與一測 及位於測試端子周圍的至少—接地端子接觸。此 信號探針與多個接地件。信號探針具有-測試端， 每-接^献細懷端子翻。接地件位於賴端周圍，且 其二接觸測試端子時，接地件至少 而弟二端具有—人線孔。信號探針從第二端之Γ線孔穿護 M358968 外设内’且信號採針的測試端從開口延伸至保護外殼外。接地 件係位於保護外殼内。 在本創作之-實施例中，上述之每一接地件包括一基部盘 一接地部。基雜置於保護外糾，接地部連接基部的一陳 ’並從開口延伸至保護外殼外。 在本創作之-實施例中，上述之探針裂置更包括多個彈性 件’抵靠於每-接地件之基部與保護外殼的第二端之間。A perspective view of the probe device, Fig. 2, and Fig. 2 are conventional outer casings. Please refer to the figure 2、 phase 2, = ^ slightly to know the RF protection of the probe device.) The coaxial probe is a radio frequency (radiation cartridge 12 〇, - signal probe 130 including a protective casing 110, A set of opposing - first ends m and -; and a casing (10) having a mantle - a manhole 115. The sleeve 1 is disposed and the split sleeve 120 is enclosed from the opening 113 140 of the protective casing 110; The sleeve 120 is a grounding sleeve. Further, the spring 1 is between the one end 122 of the sleeve 110 and the second end 114 of the protective housing 110. The three signal probe 130 is an access hole 115 from the second end 114 of the protective housing UQ. It penetrates into the protective casing 110 and penetrates into the spring 14 与 and the sleeve 12 ,, and a test end 131 of the signal probe 130 extends to the outside of the protective casing 11. In addition, the needle picking device 100 includes a fixing post 132. And an insulating layer 136. The signal probe 130 is disposed in the fixing post 132, and a portion of the probe 134 is exposed outside the fixing post 132 to form the test end 131. The insulating layer 136 is disposed on the signal probe 130 and fixed. Between the pillars 132. Figure 3 is a schematic diagram of a conventional probe device for testing RF signals of a circuit board. 1 and FIG. 3, the conventional probe device 1 is used for measuring a radio frequency signal of a module. The module has a circuit board 5〇, and a surface 51 of the circuit board 5 is provided with an RF signal test terminal 52. And a ground terminal 54 surrounding the RF signal test connector 3 M358968 52. The method of testing the RF signal is to align the test end 131 of the signal probe with the RF signal test terminal 52, and the contact end 124 of the sleeve 12 对The grounding terminal 54. Next, the probe device 100 is depressed, so that the contact end 124 of the sleeve 120 abuts against the grounding terminal 54, so that the sleeve 12〇 will squeeze the magazine 140 and be slightly retracted into the protective casing 11〇, The test end of the signal probe 13A abuts the RF signal test terminal 52 to measure the RF signal of the circuit board 5. In the above, when measuring the RF signal, the contact end 124 of the sleeve 12〇 needs the whole and the ground terminal. 52 contact to avoid distortion of the ground reference signal causes a serious error in the measurement and output of the RF signal. Therefore, the probe device 100 needs to be pressed in the direction m of the surface 51 of the vertical, road 50 to make the sleeve 12〇 Contact end April b whole and ground The sub-52 is in contact. However, in some cases, if the probe-pin 1 is not able to cover in the direction D1 or the ground terminal 52 is not flat, the sleeve 120_contact 124 only has a portion and the ground terminal 52. Contact. Thus, the grounding reference signal is distorted and causes (4) the RF signal to be severely [new content] This creation provides a kind of probe device to improve the accuracy of the test. A device adapted to contact a test and at least a ground terminal located around the test terminal. This signal probe is connected to multiple grounding pieces. The signal probe has a test terminal, and each terminal is turned over. The grounding member is located around the lap end, and when the two contacts the test terminal, the grounding member has at least two ends of the grounding hole. The signal probe is routed from the second end of the wire hole to the M358968 peripheral and the test end of the signal pin extends from the opening to the outside of the protective casing. The grounding piece is located inside the protective casing. In an embodiment of the present invention, each of the grounding members includes a base plate and a grounding portion. The base is placed outside the protective casing, and the grounding portion is connected to the base portion and extends from the opening to the outside of the protective casing. In an embodiment of the present invention, the probe splitting further includes a plurality of resilient members affixed between the base of each of the grounding members and the second end of the protective casing.
杜5 ft!!作之—實施射，上述之每―接地件之基部被彈性 件至少其中之一抵靠。 邱开/ί本創Γ之—實施财，上述之每—接地件之基部與接地 。丨4形戚一弧片。 在本創作之-實施例中，上述之接地件 :，。基部包括互相套設的多個套筒，且每一套筒圍繞二 的多之一實施例中’上述之探針裝置更包括互相套設 的夕個彈性件，且彈性件分別抵靠套筒。 〜在本創作之-實施财，上述之套筒包括―第―… 第-套筒與-第二錢’其#第二套筒套設 。第一套筒的一限位物-第：部 二靠保護外殼的第一端。第二套筒的-限位 端H ( 且弟—限位部適於抵靠保護外殼的第- 知弟—套同的一限位端設有一第三限位部，且爷 適於抵靠該倾外殼的第—端。 Μ -限位4 在本創作之一實施例中，上述之探針裝置更 $， 保護外殼内’且位於信號探針周 ： …-接地件包括可伸縮的一接地探針，接地 5 M358968 觸端從開口延伸至保護外殼外。 在本創作之-實施射，上述之每—接地 套，其固疋於套笱，而接地探針係配置於針套内。 在本創狀—實施射，上述之每— 件，其抵靠於接地探針與針套之間。 千更匕括弹性 面。在梢狀-實施射，上叙特岐於套筒之一外表 在本創作之-實施射，上述之套筒具有 與一第二面，第二面與保護外殼 、、苐面 ’套筒的第一面。 又的第-端相對，而針套固定於 在本創作之-實施射，上述之探 件，套筒具有相對的一第一面與一第 置更匕括一彈性 的第二端相對，而彈性件抵靠套 —面與保濩外殼 二端之間。 於套间的第二面與保護外殼的第 在本創作之一實施例中，上述 苗 柱，其位於錢探針與接地件之間。_裝置更包括一固定 在本創作之一實施例中，上述 層，其位於固定柱内。 ^針震置更包括-絕緣 f本創作之-實施例中，上述之接地件㈣於 由於本創作之探針裝置具有可伸 ' 確保這些接地件能與接地端子接=地件，所以能 號。之娜嶋高祕參考訊 懂’下文特舉較佳實施例，並配合所附#=和f能更明顯易 【實施方式】 物料，料細說明如下。 有鐘於習知技術的缺點，本創作提出—種探針裝置，其適 6 M358968 於與-測試端子以及位於測試端子 觸。此探針U包括—信號探針與多1二接地端子接 一測試端，且此钏对#t、、 件。彳S號探針具有 端周圍，且每—接地件^可^^|5式=子接觸。接地件位於測試 以下將列舉數個實施例，並配合圖式來進 接地件至少終伸、&。虽測試端接酬試端子時， 接地件至/其中之二係_至少—接地端子。 作 步說明本創Du 5 ft!! For the implementation, the base of each of the above-mentioned grounding members is abutted by at least one of the elastic members. Qiu Kai / ί本创Γ - implementation of the financial, the base of each of the above-mentioned grounding parts and grounding.丨 4 shape 戚 a curved piece. In the present invention - the above-mentioned grounding member:,. The base portion includes a plurality of sleeves sleeved with each other, and each of the sleeves surrounds one of the two embodiments. The above probe device further includes a plurality of elastic members that are sleeved with each other, and the elastic members respectively abut the sleeve. . ~ In this creation - the implementation of the wealth, the above sleeve includes "the first - the first sleeve and - the second money" its # second sleeve sleeve. A limit-part: of the first sleeve is secured to the first end of the protective casing. a limit end H of the second sleeve (and the seat portion is adapted to abut against the first leg of the protective casing - a limit portion of the sleeve is provided with a third limit portion, and the seat is adapted to abut The first end of the tilting housing. Μ - Limit 4 In one embodiment of the present invention, the probe device described above is further protected within the housing and located at the periphery of the signal probe: ... the grounding member comprises a telescopic one Grounding probe, grounding 5 M358968 The contact end extends from the opening to the outside of the protective casing. In the present invention, each of the above-mentioned grounding sleeves is fixed to the casing, and the grounding probe is disposed in the needle casing. In the present invention, the above-mentioned each piece is placed between the grounding probe and the needle sleeve. The tens of thousands of elastic surfaces are included in the tip-acting shot, and the upper part is one of the sleeves. The outer surface of the present invention is implemented, the sleeve has a second surface, the second surface and the protective outer shell, and the first surface of the sleeve 'the sleeve. The other end is opposite, and the needle sleeve is fixed to In the present invention, the above-mentioned probe member has a first surface opposite to the first surface and a second elastic portion. In contrast, the elastic member abuts between the sleeve-side and the two ends of the protective casing. In one embodiment of the present invention, the seedling is located at the money probe and the ground. Between the pieces _ the device further comprises an embodiment fixed in one embodiment of the present invention, the above layer, which is located in the fixed column. The needle is further included - the insulating material is created - in the embodiment, the above grounding member (four) Because the probe device of the present invention has a stretchable 'ensure that these grounding members can be connected with the grounding terminal=the grounding member, the number can be obtained. The following is a preferred embodiment and is accompanied by the attached #=和f can be more obvious and easy [Implementation] Material, material details are as follows. With the shortcomings of the conventional technology, this author proposes a kind of probe device, which is suitable for the 6-M358968 and the test terminal and the test terminal. The probe U includes a signal probe connected to the test terminal of the multiple 1 and 2 ground terminals, and the 钏 pair is #t, , and the 彳S probe has an end around the end, and each of the grounding members can be ^^ |5 = sub-contact. Grounding parts are listed below the test will enumerate several implementations And FIG formula with at least the end member extending into the ground, &. pay again when terminated although the test terminal, a ground member to / _ of which at least two lines - a ground terminal for further description of the record
圖，創作第—實施例之—種探針裝置的立體示意 本創實施例之探針裝置的***圖，而圖6是 4至圖6 H例之探針裝置的部分料敝合圖。請參照圖 置，Ξ不以tit例之ΐ針裝置200例如是一射頻同轴探針裝 _ ”、、、。此彳木針裝置200包括一信號探針220與可 2如么夕固接地件。本實施例是以三個接地件230a、230b、 垃+Lr例。接地件230a、230b、230c位於信號探針220周圍。 =Ifa、230b、23〇c之間可存有間隙，或是彼此相連。 並不限定接地件與彈性件的數量。換言之，接地件的數 里可為兩個或兩個以上。 上述之探針裝i 200可更包括-保護外殼210。保護外殼 10具有相對的—第一端212與一第二端214，其中第一端212 具有Γ"開Γ213，而第二端214具有一入線孔215。信號探針 疋攸第二端214之入線孔215穿入保護外殼210内，且信 °u探針220的一測试端221從開口 213延伸至保護外殼210 外。接地件230a、230b、230c是配置於保護外殼210内，且 圍繞彳δ该;探針220。此外，接地件23〇a包括一基部232a與一 接地部234a，接地件230b包括一基部232b與一接地部234b， 而接地件230c包括一基部232c與一接地部234c。基部232a、 M358968 232b、232c配置於保護外殼210内，而接地部234a、234b、 234c分別連接基部232a、232b、232c的一限位端233a、233b、 233c，並從開口 213延伸至保護外殼210外。接地件23〇a、 230b、230c的接地部234a、234b、234c例如是沿圍繞信號探 針220的一執跡排列。此執跡可以是圓形軌跡，但不以此為 限。需注思的疋，^號探針220具有一測試端221，而接地件 230a、230b、230c的接地部234a、234b、234c是位於信號探 針220的測試端221周圍，並不限定需圍繞信號探針22〇。 探針裝置2〇〇可更包括多個彈性件，而本實施例是以三個 彈性件240a、240b、240c為例。但本創作並不限定彈性件的 數量。換言之，彈性件的數量可為兩個或兩個以上。彈性件 240a是抵靠於接地件230a之基部232a的一端235a與保護外 设210的第二端214之間，彈性件240b是抵靠於接地件230b 之基部232b的一端235b與保護外殼210的第二端214之間， 彈性件240c是抵靠於接地件230c之基部232c的一端235c與 保漢外设210的弟一端214之間。需注意的是，彈性件24〇a、 240b、240c並非必要構件。此外，彈性件2他、24%、2攸 •例如分別為一彈簧，且這些彈性件240a、240b、240c是互相 套》又，並分別抵罪基部232a、232b、232c。更詳細地說，彈性 件240a是抵靠於基部232a與保護外殼21〇的第二端214之 間’彈性件240b是套設於彈性件24〇a内並抵靠於基部23沘 ，保護外殼210的第二端214之間，而彈性件24〇c是套設於 彈性件240b内並抵靠於基部232c與保護外殼210的第二端 214之間。 在本實施例中，上述這些接地件23〇a、23〇b、23〇c之接 地部234a、234b、234c例如分別為—弧片。此外，接地件2術、 8 M358968 230b、230c的材質可包括銅，而銅的表面可鑛一層金。接地Fig. 6 is a perspective view showing the probe device of the present embodiment, and Fig. 6 is a partial view of the probe device of the example of the fourth embodiment. Please refer to the figure, the ΐ 装置 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 This embodiment is exemplified by three grounding members 230a, 230b, and +Lr. The grounding members 230a, 230b, and 230c are located around the signal probe 220. There may be a gap between =Ifa, 230b, 23〇c, or The number of the grounding members and the number of the elastic members is not limited. In other words, the number of the grounding members may be two or more. The above-described probe assembly i 200 may further include a protective outer casing 210. The protective outer casing 10 has The first end 212 and the second end 214, wherein the first end 212 has a Γ Γ 213, and the second end 214 has an inlet hole 215. The signal probe 疋攸 the second end 214 of the second hole 214 Inside the protective casing 210, a test end 221 of the signal probe 220 extends from the opening 213 to the outside of the protective casing 210. The grounding members 230a, 230b, 230c are disposed in the protective casing 210 and surround the 彳δ; The probe 220. In addition, the grounding member 23A includes a base portion 232a and a ground portion 234a, and the grounding member 230b includes A base portion 232b and a ground portion 234b, and the grounding member 230c includes a base portion 232c and a ground portion 234c. The base portions 232a, M358968 232b, 232c are disposed in the protective housing 210, and the ground portions 234a, 234b, 234c are respectively connected to the base portion 232a, A limiting end 233a, 233b, 233c of 232b, 232c extends from the opening 213 to the outside of the protective casing 210. The grounding portions 234a, 234b, 234c of the grounding members 23A, 230b, 230c are, for example, surrounding the signal probe 220. The trajectory can be a circular trajectory, but it is not limited thereto. It should be noted that the probe 220 has a test end 221 and the grounding portion of the grounding member 230a, 230b, 230c 234a, 234b, 234c are located around the test end 221 of the signal probe 220, and are not limited to surround the signal probe 22. The probe device 2 can further include a plurality of elastic members, and the embodiment is three The elastic members 240a, 240b, 240c are exemplified. However, the present invention does not limit the number of elastic members. In other words, the number of the elastic members may be two or more. The elastic member 240a is abutted against the base 232a of the grounding member 230a. One end 235a and the second end of the protection peripheral 210 Between the two ends 214, the elastic member 240b is abutted between the one end 235b of the base portion 232b of the grounding member 230b and the second end 214 of the protective casing 210. The elastic member 240c is abutted against the one end 235c of the base portion 232c of the grounding member 230c. Han's peripheral 210 is between the younger end 214. It should be noted that the elastic members 24A, 240b, 240c are not essential components. Further, the elastic members 2, 24%, 2, for example, respectively, are a spring, and the elastic members 240a, 240b, 240c are mutually spliced and respectively occupies the base portions 232a, 232b, 232c. In more detail, the elastic member 240a is abutted between the base portion 232a and the second end 214 of the protective casing 21〇. The elastic member 240b is sleeved in the elastic member 24A and abuts against the base portion 23, and protects the outer casing. The second end 214 of the 210 is between the elastic members 240b and is disposed between the base 232c and the second end 214 of the protective casing 210. In the present embodiment, the grounding portions 234a, 234b, and 234c of the grounding members 23a, 23b, 23b, respectively, are, for example, a curved piece. In addition, the material of the grounding member 2, 8 M358968 230b, 230c may include copper, and the surface of the copper may be a layer of gold. Ground
件 230a、230b、230c 的基部 232a、232b、232c 分別為一套筒。 這些基部232a、232b、232c是互相套設，且每一基部232a、 232b、232c皆圍繞信號探針220。具體而言，基部232a為一 第一套筒，基部232a的限位端233a設有一第一限位部237a， 且第一限位部237a適於抵靠保護外殼21〇的第一端212，而 接地部234a是連接第一限位部237a。基部232b為一第二套 筒，且基部232b是套設於基部232a内，基部232b的限位端 233b設有一第二限位部237b’且第二限位部237b適於抵靠保 濩外殼210的第一端212，而接地部234b是連接第二限位部 237b。此外，基部232c為一第三套筒，其套設於基部232b内， 基部232c的限位端233c設有一第三限位部237c，且第三限位 部237c適於抵靠保護外殼21〇的第一端212，而接地部23牝 是連接第三限位部237c。 棟針裝置200可更包括一固定柱222，而信號探針22〇j 位於固定柱222與接地件内，且部分信號探針220是暴露於β 疋柱222外，以形成上述之測試端221。此外，探針裝置2〇 可更包括一絕緣層226。此絕緣層226是配置於固定柱222内 另外’信號探針220的材質可包括銅，而銅的表面可鍍一層金 所需注意的是，固定柱222非必要構件，而在固定柱222白 材質為絕緣材質的實施例中，絕緣層226也非必要構件。可g 的’可將固定柱132改為包覆層’包覆在絕緣層136、信號老 針130外，將固定柱132 (包覆層）、絕緣層136與信 130預製成一探針線。 儿 此外，信號探針220可位於固定柱222内或接地件23〇a 23〇b、230C的基部232a、232b、23以内，但並不限定位於# 9 M3 5 8968 中心。另外，上述之信號探針220可連接一可伸縮件，以形成 可伸縮的信雜針220,由於其結構為本創作所屬技術領域中 的通常知識，在此將不另搭配圖式做詳細的說明。 圖7是本創作第一實施例之探針裝置用於測試電路板的 射頻訊號的示意圖。請參照圖6與圖7,本實施例之探針裝置 200可用於測量一模組的射頻訊號時，此模組具有—電ς板 60 ’且電路板60的一表面61設有射頻訊號測試端子62以及 圍繞此射頻訊號測試端子62的—接地端子64。測試射頻訊號 的方法是將信號探針220的測試端221對準射頻訊號測試端子° 罾62，並將接地部234a、234b、2地對準接地端子64。接著， 下壓探針裝置細，使接地部234a、234b、234e接觸接地端子 64，並使信號探針22〇 _試端221接觸射頻訊號測試端子 62，以測量電路板60的射頻訊號。 在本實施例中，由於每一接地件23〇a、23〇b、23〇c都可 獨立伸縮。即使接地端子64 +平坦或探針裝i 2〇〇無法沿垂 直電路板60之表面61的方向D2下壓，每一接地件2施、 230b、23〇c的接地部234a、2鳥、2地仍可接觸到接地端子 _ 64。舉例來說’在圖7 _，雖然接地端子64之位於射頻訊號 測試端子62左儀部分較接地齡64之㈣射魏號測試端 子62右側的部分高，但先抵觸到接地端子64的接地部23如 會稍微縮回保護外殼210内，而接地部拠與接地部23如（圖 未式）並不會縮回保護外殼21G内或縮回較少，如此接地部 2j4b與接地部234c仍可接觸到接地端子64。由於本實施例之 奴針裝置200能確保每一接地件23〇a、23%、23〇c的接地部 “ 234b 234c都可接觸到接地端子64，所以能避免接地 茶考訊號失真，進而防止測量出的射頻訊號產生誤差。因此， M358968 本實施例之探針裝置200能提高測試準確度。 需注意的是，在不包括彈性件240a、240b、240c的實施 例中，在測試時，接地件230a、230b、230c可靠著重力而伸 出。此外’在探針裝置200不包括保護外殼210的實施例中， 彈性件240a、24〇b、240c可一端固定於接地件230的基部232, 另一端固定於固定柱222。 圖8是本創作第二實施例之一種探針裝置的立體示意 圖’圖9A是本創作第二實施例之探針裝置的剖面示意圖，而 圖9B是本創作第二實施例之接地件與彈性件的立體示意圖。 請參照圖8、圖9A與圖9B ’本實施例之探針裝置3〇〇例如是 二射頻同轴探針裝置，但不以此為限。與第一實施例相似，此 探針裝置300包括一保護外殼21〇與一信號探針22〇。此外，The bases 232a, 232b, 232c of the pieces 230a, 230b, 230c are each a sleeve. The bases 232a, 232b, 232c are nested with each other, and each of the bases 232a, 232b, 232c surrounds the signal probe 220. Specifically, the base portion 232a is a first sleeve, the limiting end 233a of the base portion 232a is provided with a first limiting portion 237a, and the first limiting portion 237a is adapted to abut the first end 212 of the protective casing 21〇, The grounding portion 234a is connected to the first limiting portion 237a. The base portion 232b is a second sleeve, and the base portion 232b is sleeved in the base portion 232a. The limiting end 233b of the base portion 232b is provided with a second limiting portion 237b' and the second limiting portion 237b is adapted to abut the protective housing. The first end 212 of the 210 is connected to the second limiting portion 237b. In addition, the base portion 232c is a third sleeve which is sleeved in the base portion 232b. The limiting end 233c of the base portion 232c is provided with a third limiting portion 237c, and the third limiting portion 237c is adapted to abut against the protective casing 21〇. The first end 212 is connected to the third limiting portion 237c. The pin device 200 can further include a fixing post 222, and the signal probe 22〇j is located in the fixing post 222 and the grounding member, and part of the signal probe 220 is exposed outside the β-column 222 to form the test end 221 described above. . Further, the probe device 2A may further include an insulating layer 226. The insulating layer 226 is disposed in the fixing post 222. The material of the 'signal probe 220 may include copper, and the surface of the copper may be plated with a layer of gold. It is noted that the fixing post 222 is not a necessary member, and the fixing post 222 is white. In the embodiment in which the material is an insulating material, the insulating layer 226 is also an unnecessary member. The fixing post 132 can be changed to the cladding layer 142 to cover the insulating layer 136 and the signal pin 130, and the fixing post 132 (cladding layer), the insulating layer 136 and the signal 130 are pre-formed into a probe line. Further, the signal probe 220 may be located within the fixed post 222 or within the bases 232a, 232b, 23 of the grounding members 23A, 23b, 230C, but is not limited to the center of #9 M3 5 8968. In addition, the signal probe 220 can be connected to a retractable member to form a telescopic pin 220. Since its structure is the general knowledge in the art of the art, it will not be detailed in the drawings. Description. Fig. 7 is a schematic view showing the RF signal of the probe device of the first embodiment of the present invention for testing a circuit board. Referring to FIG. 6 and FIG. 7 , when the probe device 200 of the embodiment can be used to measure the RF signal of a module, the module has an electrical panel 60 ′ and a surface 61 of the circuit board 60 is provided with an RF signal test. Terminal 62 and a ground terminal 64 surrounding the RF signal test terminal 62. The RF signal is tested by aligning the test terminal 221 of the signal probe 220 with the RF signal test terminal 罾62 and aligning the ground portions 234a, 234b, 2 with the ground terminal 64. Next, the probe device is pressed down to make the grounding portions 234a, 234b, and 234e contact the ground terminal 64, and the signal probe 22〇_test terminal 221 contacts the RF signal test terminal 62 to measure the RF signal of the circuit board 60. In this embodiment, since each of the grounding members 23a, 23b, 23c can be independently stretched and contracted. Even if the ground terminal 64 + is flat or the probe package i 2 〇〇 cannot be pressed in the direction D2 of the surface 61 of the vertical circuit board 60, the grounding portions 234a, 2, 2, 2 of each of the grounding members 2, 230b, 23〇c The ground can still be touched to the ground terminal _ 64. For example, in FIG. 7 _, although the ground terminal 64 is located at the left side of the radio frequency signal test terminal 62, which is higher than the grounding level 64 (four), the portion of the right side of the test terminal 62 is high, but first touches the ground portion of the ground terminal 64. If the grounding portion 拠 and the grounding portion 23 are not retracted into the protective casing 21G or retracted less, the grounding portion 2j4b and the grounding portion 234c can still be retracted. Contact the ground terminal 64. Since the slave device 200 of the embodiment can ensure that the grounding portion "234b 234c of each of the grounding members 23〇a, 23%, 23〇c can contact the grounding terminal 64, the ground tea test signal distortion can be avoided, thereby preventing The measured RF signal produces an error. Therefore, the probe device 200 of the present embodiment can improve the test accuracy. It should be noted that in the embodiment not including the elastic members 240a, 240b, 240c, the ground is tested during the test. The pieces 230a, 230b, 230c are reliably extended by gravity. Further, in the embodiment in which the probe device 200 does not include the protective casing 210, the elastic members 240a, 24〇b, 240c may be fixed at one end to the base 232 of the grounding member 230, The other end is fixed to the fixing post 222. Figure 8 is a perspective view of a probe device according to a second embodiment of the present invention. Figure 9A is a cross-sectional view of the probe device of the second embodiment of the present invention, and Figure 9B is the first 2, FIG. 9A and FIG. 9B. The probe device 3 of the present embodiment is, for example, a two-frequency coaxial probe device, but not limited thereto. With the first implementation Similarly, the probe device 300 includes a protective housing 21 and a signal probe 22A.
探針裝置30〇更包括多個接地件330，在圖8、圖9A與圖9B 中是=兩個接地件330為例，但在其他實施例中，接地件33〇 的數里個大於兩個。此外，接地件33〇之間可存有間隙，或是 彼此相連。 / 本實施例之保護外殼210及信號探針22〇與第一實施例相 似’所以本實施例之保護外殼21G、信號探針，及其細部構 ^的標號與第-實施例相同。此外，關於保護外殼训及信號 5 220的詳細朗’請參照第一實施例，在此將不再重述。 一實施例相似，探針裝置300亦可包括固定柱222 與絕緣層226，但其並非必要構件。 盘-ίίί探針裝置細中，每一接地件330包括一基部332 辦H334 ’基部332配置於保護外殼210内，而接地部 334連接基部332的一限仞# ^ ' 外殼21〇外。這些接地’並從開口 213延伸至保護 牛3〇的接地部234例如是沿圍繞信號 11 M358968 的軌跡（如圓形執跡）排列。需注意的是，接地件 3 _地部234是位於信號探針 ^ = 信號探針220。 闲儿个丨氏疋而圍繞 片H，每一接地件规之基部332與接地部334形成一弧 與接地部334。^中^ 而此孤片包括基部说 部234的外徑略小於開略大於開口 213，接地 大致彳目斿ϋ ' 限位端353的外徑與開口 213 八=°接地件的材質可包_，而銅的表面可鍵-層 = =ίΓ2的一端335與保護外殼210的第二端 ^ 例如是彈簧，但不以此為限。在本實施 件340抵靠—個接地件330為例，但在其他 ^ ’可-個彈性件34〇抵靠一個接地件別，兩個以上 抵靠一個接地件330，或是一個彈性件抵靠 兩=兩個以上的接地件330。與第一實施例相似，本實施例 之探針裝置300亦可不包括彈性件34〇。 與第-實施例相似，本實施例之探針裝置3〇〇的每一接地 330都可獨立伸缩。因此，本實施例之探針袭f獅與第一 3例之騎裝置2GG具有相似的優點。亦即，本實施例之探 十^置300能避免接地參考訊號失真，以防止測量出的射頻訊 號產生的誤差，進而提高測試準確度。需注意的是，在不包括 彈!·生件240的只_中，在測試時，接地件⑽可靠著重力而 伸出。此外，在探針裝置3〇〇 +包括保護外殼21〇的實施例中， 彈性件340可一端固定於接地件330的基部332，另一端固定 於固定柱222。 圖1〇疋本創作第三實施例之—種探針褒置的刹面示意 12 M358968 圖，而圖11是本創作第三實施例之探針裝置的立體示音 其中圖η省略了第三實施例之探針裝置的保護外殼。ς炎昭 圖10與圖1卜本實施例之探針裳置400例如是—射頻同轴^ 針裝置，但不以此為限。與第一實施例相似。此探針裝置400 包括一信號探針420以及可伸縮的多個接地件44〇。信號探 420具有一測試端421 ’而接地件44〇位於信號探針42〇的測 試端421周圍。本創作並不限定接地件與彈性件的數量。換^ 之’接地件的數量可為兩個或兩個以上。 、°The probe device 30 further includes a plurality of grounding members 330. In FIGS. 8, 9A and 9B, the two grounding members 330 are exemplified, but in other embodiments, the number of the grounding members 33〇 is greater than two. One. Further, there may be gaps between the grounding members 33A or connected to each other. The protective case 210 and the signal probe 22A of the present embodiment are similar to those of the first embodiment. Therefore, the protective case 21G, the signal probe, and the detail of the present embodiment are the same as those of the first embodiment. In addition, the details of the protective casing training signal 5 220 are referred to the first embodiment, and will not be repeated here. Similar to an embodiment, the probe device 300 can also include a mounting post 222 and an insulating layer 226, but it is not a necessary component. In the disc device, each of the grounding members 330 includes a base portion 332. The base portion 332 is disposed in the protective casing 210, and the grounding portion 334 is connected to the outer casing 21 of the base portion 332. These grounding's and extending from the opening 213 to the grounding portion 234 protecting the cows 3, for example, are arranged along a trajectory (e.g., a circular obstruction) surrounding the signal 11 M358968. It should be noted that the grounding member 3_the ground portion 234 is located at the signal probe ^=signal probe 220. The base portion 332 of each of the grounding members and the ground portion 334 form an arc and a ground portion 334. ^中^ and the isolated piece including the base portion 234 has an outer diameter slightly smaller than the opening slightly larger than the opening 213, and the grounding is substantially 彳 斿ϋ ' the outer diameter of the limiting end 353 and the opening 213 八 = ° the material of the grounding member can be packaged_ The surface of the copper may be a key-layer == one end 335 of the 与 2 and the second end of the protective casing 210 is, for example, a spring, but is not limited thereto. In the embodiment 340, the grounding member 330 is abutted, but the other elastic members 34 〇 abut the grounding member, two or more of the grounding members 330, or one elastic member. By two = two or more grounding members 330. Similar to the first embodiment, the probe device 300 of the present embodiment may not include the elastic member 34A. Similar to the first embodiment, each of the grounding members 330 of the probe device 3 of the present embodiment can be independently extended and contracted. Therefore, the probe of the present embodiment has similar advantages to the riding device 2GG of the first three cases. That is, the probe 300 of the embodiment can avoid the distortion of the ground reference signal to prevent the error of the measured RF signal, thereby improving the test accuracy. It should be noted that in the only _ which does not include the bomb! The raw part 240, the grounding member (10) is reliably extended by gravity during the test. Further, in the embodiment in which the probe device 3 〇〇 + includes the protective casing 21 , the elastic member 340 may be fixed at one end to the base portion 332 of the grounding member 330 and at the other end to the fixing post 222 . FIG. 1 is a perspective view of a third embodiment of a probe device, and FIG. 11 is a perspective view of a probe device according to a third embodiment of the present invention, wherein FIG. The protective casing of the probe device of the embodiment.探针炎昭 Figure 10 and Figure 1 The probe skirt 400 of the present embodiment is, for example, a radio frequency coaxial device, but is not limited thereto. Similar to the first embodiment. The probe device 400 includes a signal probe 420 and a plurality of telescoping ground members 44A. The signal probe 420 has a test end 421 ' and the ground member 44 is located around the test end 421 of the signal probe 42A. This creation does not limit the number of grounding members and elastic members. The number of grounding members can be two or more. , °
上述之探針裝置400可更包括一保護外殼41〇。保護外殼 410具有相對的一第一端412與一第二端414，第一端412 = 有-開口 413 ’而第二端414具有一入線孔415。信號探針伽 從此入線孔415穿入保護外殼41〇内，且信號探針42〇的一測 試端421從開口 413延伸至保護外殼41〇外。此外，上述之探 針裝置400可更包括一套筒430，其配置於保護外殼41〇内， 且圍繞信號探針420。接地件440例如是固定於套筒43〇，且 位於信號探針420的測試端421周圍。接地件440之間可存有 間隙，或是彼此相連。接地探針444的一接觸端445從開口 413延伸至保護外殼41〇外。此外，每一接地件44〇可更包括 一針套442。針套442例如是固定於套筒420,而接地探針444 是可伸縮地配置於針套442内。 上述之探針裝置400中，針套442例如是固定於套筒430 之一外表面432。保護外殼410與套筒430例如皆為圓形套筒， 但不以此為限。此外，探針裝置4〇〇可更包括一固定柱422。 測減探針424配置於固定柱422内，且部分測試探針424暴露 於固定柱422外，以形成上述之測試端421。另外，探針裝置 4〇〇可更包括一絕緣層426。絕緣層426配置於測試探針424 13 M358968 與固定柱422之間。再者，每一接地件44〇可更包括一彈性件 446 ’其抵靠於接地探在十物肖針套搬之間，以使接地探針 444具有可伸縮性。 品注思的疋，上述之保護外殼41〇、套筒43〇、針套442、 固定柱似、絕緣層426以及彈性件桃非必要構件。在探針 裝置400不包括套请430的實施例中，接地件44〇可固定於固 疋柱422。在探針裝置4〇〇不包括固定柱422的實施例中 地件440可固定於套筒43〇。 圖I2是本解第三實施例之探針裝置祕測試電路板的 號的轉圖。請參關u與圖12，本實關之探針裝 可用於測量-模組的射頻訊號。測試射頻訊號的方法是 探針424的測試端421對準射頻訊號測試端子62，並 ^接地探針444對準接地端子64。接著，下壓探針裝置彻， 使接地探針444接觸接地端子64，並使測試探針5 接觸射頻訊號測試端子62，以測量電路板6〇的射頻訊 接地2 =4^中— 由於每一接地探針444是可伸縮的，即使 接地知子64不平坦或探職置_無法沿垂直電 ^ 面61的方向D2下壓，每一接地探針444仍可 子64。舉例來說，在圖12中，雖然接地端子料== 喊測試端子62左_部分較接地端子64之位 、^員 試端子62右側的部分高，但先抵觸 測 丨副物_ 444)=== ^而其餘接地探針444 (如位於圖12左侧 :套442 並不會縮回針套442内或縮回較少，所以這些=蝴） 可接觸到接地端子64。由於本實施例之探針裝置二能 14 M358968 每一接地探針444都可接觸到接地端子64，所以能避免接地 參考訊號失真，進而防止測量出的射頻訊號產生誤差。因此， 本實施例之探針裝置400能提高測試準確度。 需注意的是’在接地件440不包括彈性件446的實施例 中’在測試時，接地件440的接地探針444可靠著重 此外，信號探針則位於固定柱422内或套 不限定位於其中心。The probe device 400 described above may further include a protective casing 41. The protective casing 410 has a first end 412 and a second end 414. The first end 412 = has an opening 413 ' and the second end 414 has an inlet hole 415. The signal probe gamma penetrates from the access hole 415 into the protective casing 41, and a test end 421 of the signal probe 42A extends from the opening 413 to the outside of the protective casing 41. In addition, the probe device 400 described above may further include a sleeve 430 disposed in the protective casing 41〇 and surrounding the signal probe 420. The grounding member 440 is, for example, fixed to the sleeve 43A and located around the test end 421 of the signal probe 420. There may be gaps between the grounding members 440 or may be connected to each other. A contact end 445 of the grounding probe 444 extends from the opening 413 to the outside of the protective casing 41. In addition, each of the grounding members 44 can further include a needle sleeve 442. The needle guard 442 is, for example, fixed to the sleeve 420, and the grounding probe 444 is telescopically disposed within the needle sleeve 442. In the probe device 400 described above, the needle guard 442 is, for example, fixed to an outer surface 432 of the sleeve 430. The protective casing 410 and the sleeve 430 are, for example, circular sleeves, but are not limited thereto. In addition, the probe device 4 can further include a fixing post 422. The down test probe 424 is disposed within the fixed post 422, and a portion of the test probe 424 is exposed outside the fixed post 422 to form the test end 421 described above. Additionally, the probe device 4 can further include an insulating layer 426. The insulating layer 426 is disposed between the test probes 424 13 M358968 and the fixed post 422. Moreover, each of the grounding members 44 can further include an elastic member 446' which is placed between the grounding probes to make the grounding probe 444 expandable. The above-mentioned protective casing 41〇, sleeve 43〇, needle sleeve 442, fixing pillar like, insulating layer 426, and elastic member are unnecessary components. In embodiments where the probe device 400 does not include the sleeve 430, the grounding member 44A can be secured to the retaining post 422. In embodiments where the probe assembly 4 does not include the mounting post 422, the ground member 440 can be secured to the sleeve 43A. Figure 12 is a diagram showing the number of the probe device test circuit board of the third embodiment of the present invention. Please refer to Figure 12 and the actual probe can be used to measure the RF signal of the module. The RF signal is tested by aligning the test terminal 421 of the probe 424 with the RF signal test terminal 62 and the ground probe 444 with the ground terminal 64. Then, the probe device is pressed down, the grounding probe 444 is contacted with the grounding terminal 64, and the test probe 5 is contacted with the RF signal testing terminal 62 to measure the RF signal ground of the circuit board 6 2 2 = 4^ - as each A grounding probe 444 is telescopic, and even if the grounding stalk 64 is not flat or the dying _ can not be depressed in the direction D2 of the vertical electrical surface 61, each grounding probe 444 can still be 64. For example, in FIG. 12, although the ground terminal material == shouting test terminal 62 left_part is higher than the ground terminal 64, and the right side of the test terminal 62 is high, but first touches the test object _ 444) = == ^ and the remaining grounding probes 444 (as located on the left side of Figure 12: the sleeve 442 does not retract into the needle sleeve 442 or retract less, so these = butterfly) can contact the ground terminal 64. Since the probe device 2 of the present embodiment can contact the grounding terminal 64 for each grounding probe 444, the grounding reference signal can be prevented from being distorted, thereby preventing the measurement of the RF signal from being erroneous. Therefore, the probe device 400 of the present embodiment can improve the test accuracy. It should be noted that 'in the embodiment where the grounding member 440 does not include the elastic member 446', the grounding probe 444 of the grounding member 440 is reliably emphasized during the test. In addition, the signal probe is located in the fixed post 422 or the sleeve is not limited thereto. center.
圖13是本創作第四實_之—種探針裝置的剖面示音 請參照圖H)、圖U與圖13，本實施例之探針裝置榻二 ^三實施例之探針裝置働相似，以下僅針對其差別處 說明。相較於探龍置_，本實_讀舰置伽a更包 =彈^件450 ’此彈性件例如是彈簧。套筒伽具有相 對的一第一面434盘一第-面436,筮-二t 弟一面 第一面436與保護外殼41〇 的第一& 414相對。此彈性件例抵靠於套筒43〇的第二面 I#外殼410的第二端414之間，以使套筒430具有可 伸祕。換s之’本實施例之探針裝置働a的套筒物是可 伸2地配置於保護外殼内，而第三實_ 的套筒430是固定於佴雏41Λ如,, 木t裝置4υυ 成 。此外，此探針裝置400a 2 探針裝置400的優點她，在此將不再 圖，第五實施例之—種探姑置的剖面示意 it作第五實施例之探針裝置的立體示意圖， =中圖15 4略了弟五實施例之探針裝置的保護外^ =施=4圖/、圖15 ’本實施例之探針裝置橋與 衣m 432，而％針裝置400b 15 M358968 的針套442是固定於套筒430的第-面434。此探針裝置傷 的優點與第三實關之探針裝置的優點她，在此將不再 重^。需注意的是，在探針裝置働未包括套筒43〇的實施 例中，接地件440可固定於固定柱222上。 、 第六實施例之—種探針裝置的剖面示意 J — 口月π® 14、圖15與圖16，本實施例之探針震置働c 弟五實關之探難置鷄構與伽她 對其結構上的如錢行制。減於簡裝置娜gFIG. 13 is a cross-sectional view of the probe device of the fourth embodiment of the present invention. Referring to FIG. H), FIG. 9 and FIG. 13, the probe device of the present embodiment is similar to the probe device of the third embodiment. The following is only for the difference. Compared with the probe dragon _, the actual _ read ship gamma a pack = the bomb member 450 ' this elastic member is for example a spring. The sleeve has a first face 434, a first face 436, and a first face 436 opposite the first & 414 of the protective casing 41. The resilient member is abutted against the second end 414 of the second face I# housing 410 of the sleeve 43〇 to provide the sleeve 430 with a stretchable secret. The sleeve of the probe device 働a of the present embodiment is disposed in the protective casing in a stretchable manner, and the sleeve 430 of the third real body is fixed to the rafter 41, for example, the wooden t device 4υυ to make. In addition, the advantages of the probe device 400a 2 the probe device 400 will not be shown here, and the cross-section of the probe device shown in the fifth embodiment is a schematic view of the probe device of the fifth embodiment. = Figure 15 4 shows the protection of the probe device of the fifth embodiment. ^=施=4图/, Figure 15 'The probe device bridge of this embodiment and the clothing m 432, and the % needle device 400b 15 M358968 The needle guard 442 is fixed to the first face 434 of the sleeve 430. The advantages of this probe device injury and the advantages of the third practical probe device will not be repeated here. It should be noted that in the embodiment in which the probe device 働 does not include the sleeve 43 接地, the grounding member 440 can be fixed to the fixed post 222. The cross-sectional view of the probe device of the sixth embodiment is shown as J-mouth π® 14, FIG. 15 and FIG. 16, and the probe of the present embodiment is shocked by the 働c. She is structurally slavish. Reduced to simple device
=2=置條更包括—彈性件45G。此彈性件450抵 門、第二面436與保護外殼410的第二端414之 曰 1使套靖430具有可伸縮性。換言之，本實施例之探針裝 =0=的套筒43〇是可伸縮地配置於保護外殼_内，而第 實施例之探針裝置娜的套筒43G是岐於賴外殼41〇= 2 = the strip further includes an elastic member 45G. The resilient member 450 abuts the second face 436 and the second end 414 of the protective outer casing 410 to provide flexibility to the sleeve 430. In other words, the sleeve 43 of the probe package of the present embodiment is retractably disposed in the protective casing_, and the sleeve 43G of the probe device of the first embodiment is a casing 41.
Py ° 是^創作第七實施例之探針裝置的立體示意圖，圖 例之探針裝置的立體示意圖，而圖是Py ° is a schematic perspective view of the probe device of the seventh embodiment, a schematic view of the probe device of the example, and the figure is
= 探針裝置的立體示意圖。請參照圖17至 5^0b八之々七至第九實施例中，探針裝置5GG、500a、 5〇〇b刀別包括一針套51〇、—信號探針52〇、一固定柱別盥 位於㈣探針周圍52〇的多個接地件54〇。每—接地件包 :可伸縮的接地探針544，且每一接地件 罙接 是配置於針套542内。此外，與接地件娜 =(=牛ΓΙ更包括彈性件，位於針套542内的彈 探針別是可伸縮的，且位於針套 套510内可設置彈箐，其抵靠於信號探針似與針套51〇之間。 16 M35-8968 在探針襞置500中，針套510與接地件540是固定於固定 柱530的外表面532。在探針裝置500a中，針套51〇與接地 件540是固定於固定柱530内。在探針裝置5〇〇b中，針套51〇 與接地件540是固定於固定柱530的端面534。探針裝置5〇〇、 500a、500b與前述之探針裝置具有相似的優點，在^將不再 重述。 综上所述，本創作之探針裝置具有可伸縮的多個接地件， 所以能確保這些接地件的接地探針皆能與接地端子接觸，以提 接地參考訊號’此，本創作之探針裝置能提高測試 準確度。 本創Ϊ然ϋΓΓ佳實施例揭露如上，然其並非用以限定 則作之精神和粑圍内，當可作些許之旻 ，護Ϊ11當視_之申鮮__狀i鲜本創作 【圖式簡單說明】 圖1是習知一種探針裝置的剖面示意圖。 圖2是習知之探針裝置的立體示意圖。 圖3是習知之探針裝置用於 意圖 料電路板的射頻訊號的示 圖 4是本創作第一實施例之—種 圖 ^5是本創作第-實施例之探針裝置的爆=體示意圖。 圖6是本創作第—實施 的***圖。 铋物的部分構件的組合 圖7是本創作第一實施例之探 射頻訊號的示意圖。 褒置用於測試電路板的 圖8是本創作第二實施例之一 種权針裝置的立體示意圖。 17 M358968= A schematic view of the probe unit. Referring to FIGS. 17 to 5^0b, the seventh to the ninth embodiments, the probe device 5GG, 500a, 5〇〇b includes a needle sleeve 51〇, a signal probe 52〇, and a fixed column.盥 A plurality of grounding members 54〇 located at 52 turns around the probe. Each grounding member package: a retractable grounding probe 544, and each grounding member is disposed in the needle sleeve 542. In addition, with the grounding member Na = (= burdock more includes an elastic member, the elastic probe located in the needle sleeve 542 is not retractable, and a magazine can be disposed in the needle sleeve 510, which is similar to the signal probe. Between the needle sleeve 51. 16 M35-8968 In the probe device 500, the needle sleeve 510 and the grounding member 540 are fixed to the outer surface 532 of the fixing post 530. In the probe device 500a, the needle sleeve 51 is The grounding member 540 is fixed in the fixing post 530. In the probe device 5〇〇b, the needle sleeve 51〇 and the grounding member 540 are fixed to the end surface 534 of the fixing post 530. The probe devices 5〇〇, 500a, 500b and The foregoing probe device has similar advantages, and will not be repeated here. In summary, the probe device of the present invention has a plurality of grounding members that can be telescopic, so that the grounding probes of the grounding members can be ensured. Contact with the grounding terminal to raise the ground reference signal 'This, the probe device of the present invention can improve the test accuracy. The present invention is disclosed in the above preferred embodiment, but it is not limited to the spirit and scope of the work. When you can make a little bit of it, the Guardian 11 is regarded as a fresh __like i fresh creation [Figure BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic cross-sectional view of a conventional probe device. Figure 2 is a perspective view of a conventional probe device. Figure 3 is a schematic view of a conventional probe device for an RF signal intended for a circuit board. The first embodiment of the present invention is a schematic view of the probe device of the first embodiment of the present invention. Fig. 6 is an exploded view of the first embodiment of the present invention. It is a schematic diagram of the radio frequency signal of the first embodiment of the present invention. Fig. 8 is a perspective view of a right needle device of the second embodiment of the present invention. 17 M358968
圖 圖9A疋本創作第二實施例之探針 _是本創作第二實施例之接地物二=示 意 本創作第三實施例之1探針襄置的剖面示意圖 圖1Λ是本辦第三纽狀_心料職電路板的 圖11是本創作第三實施例之探針裝置的2 射頻訊號的示意圖。 圖13是本創作第四實施例之 圖。 圖0FIG. 9A is a probe of a second embodiment of the present invention_ is a grounding object of the second embodiment of the present invention. FIG. 1 is a schematic cross-sectional view of a probe device of the third embodiment of the present invention. Figure 11 is a schematic diagram of two radio frequency signals of the probe device of the third embodiment of the present invention. Figure 13 is a view showing a fourth embodiment of the present creation. Figure 0
體示意圖 種探針裝置的剖面示意 圖14是本創作第五實施例之一種 種探針裝置的剖面示意 圖 圖 15 16 是本創作第五實施例之探針|置的立體示意圖。 是本創作第六實施例之-種探針裝置的剖面示意 圖Π是本創作第七實施例之探針裴置的立體示意圖。 圖18是本創作第八實施例之探針裝置的立體示意圖。 圖19是本創作第九實施例之探針裝置的立體示意圖。 • 【主要元件符號說明】 u 50、 60 :電路板 51、 61 :表面 52 ' 62 :射頻訊號測試端子 54 ' 64 :接地端子 1〇〇、200、300、400、400a、400b、400c、500、500a、 5〇〇b :探針裝置 110、210、410 :保護外殼 1Π、212、412 :第一端 18 M358968 113、 213、413 :開口 114、 214、414 :第二端 115、 215、415 :入線孔 120 :套筒 122、233a、233b、233c :限位端 235a、235b、235c、335 :基部的一端 124、445 :接觸端 130、 220、420、520 :信號探針 131、 221、421 :測試端 ’ 132、222、422、530 :固定柱 136、226、426 :絕緣層 140 :彈簧 230a、230b、230c、330、440 :接地件 232a、232b、232c、332 :基部 234a、234b、234c、334 :接地部 237a :第一限位部 237b:第二限位部 _ 240a、240b、240c、340、450 :彈性件 430 :套筒 432、532 :外表面 434 :第一面 436 :第二面 442、510、542 :針套 444、544 :接地探針 Dl、D2 :方向 19BRIEF DESCRIPTION OF THE DRAWINGS Fig. 14 is a schematic cross-sectional view showing a probe device of a fifth embodiment of the present invention. Fig. 15 16 is a perspective view showing a probe of the fifth embodiment of the present invention. A schematic cross-sectional view of a probe device of a sixth embodiment of the present invention is a perspective view of a probe device of a seventh embodiment of the present invention. Figure 18 is a perspective view showing the probe device of the eighth embodiment of the present invention. Fig. 19 is a perspective view showing the probe device of the ninth embodiment of the present invention. • [Main component symbol description] u 50, 60 : Circuit board 51, 61 : Surface 52 ' 62 : RF signal test terminal 54 ' 64 : Ground terminal 1〇〇, 200, 300, 400, 400a, 400b, 400c, 500 , 500a, 5〇〇b: probe device 110, 210, 410: protective casing 1Π, 212, 412: first end 18 M358968 113, 213, 413: opening 114, 214, 414: second end 115, 215, 415: inlet hole 120: sleeve 122, 233a, 233b, 233c: limit end 235a, 235b, 235c, 335: one end 124, 445 of the base: contact end 130, 220, 420, 520: signal probe 131, 221 421: test end '132, 222, 422, 530: fixing posts 136, 226, 426: insulating layer 140: springs 230a, 230b, 230c, 330, 440: grounding members 232a, 232b, 232c, 332: base 234a, 234b, 234c, 334: grounding portion 237a: first limiting portion 237b: second limiting portion _240a, 240b, 240c, 340, 450: elastic member 430: sleeve 432, 532: outer surface 434: first surface 436: second side 442, 510, 542: needle sleeve 444, 544: grounding probe Dl, D2: direction 19
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97223953U TWM358968U (en) | 2008-12-31 | 2008-12-31 | Probe device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97223953U TWM358968U (en) | 2008-12-31 | 2008-12-31 | Probe device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM358968U true TWM358968U (en) | 2009-06-11 |
Family
ID=44381190
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW97223953U TWM358968U (en) | 2008-12-31 | 2008-12-31 | Probe device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWM358968U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI404938B (en) * | 2009-06-26 | 2013-08-11 | Yamaichi Electronics Co Ltd | Probe card |
| US8659489B2 (en) | 2011-03-28 | 2014-02-25 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd | Radio frequency printed circuit board |
| TWI461699B (en) * | 2011-08-30 | 2014-11-21 | Leeno Ind Inc | Coaxial probe |
| TWI472771B (en) * | 2012-11-08 | 2015-02-11 | Winbond Electronics Corp | Probe card and welding methond thereof |
| CN104749403A (en) * | 2013-12-31 | 2015-07-01 | 旺矽科技股份有限公司 | Probe module |
| US11482805B2 (en) | 2019-10-01 | 2022-10-25 | Kabushiki Kaisha Nihon Micronics | Electrical contactor, electrical connecting structure and electrical connecting apparatus |
| TWI785933B (en) * | 2020-12-17 | 2022-12-01 | 日商日本發條股份有限公司 | measuring unit |
-
2008
- 2008-12-31 TW TW97223953U patent/TWM358968U/en unknown
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI404938B (en) * | 2009-06-26 | 2013-08-11 | Yamaichi Electronics Co Ltd | Probe card |
| US8659489B2 (en) | 2011-03-28 | 2014-02-25 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd | Radio frequency printed circuit board |
| TWI452947B (en) * | 2011-03-28 | 2014-09-11 | Hon Hai Prec Ind Co Ltd | Circuit board |
| TWI461699B (en) * | 2011-08-30 | 2014-11-21 | Leeno Ind Inc | Coaxial probe |
| US9250264B2 (en) | 2011-08-30 | 2016-02-02 | Leeno Industrial Inc. | Coaxial probe |
| TWI472771B (en) * | 2012-11-08 | 2015-02-11 | Winbond Electronics Corp | Probe card and welding methond thereof |
| CN104749403A (en) * | 2013-12-31 | 2015-07-01 | 旺矽科技股份有限公司 | Probe module |
| TWI495880B (en) * | 2013-12-31 | 2015-08-11 | Mpi Corp | Probe module |
| US9470716B2 (en) | 2013-12-31 | 2016-10-18 | Mpi Corporation | Probe module |
| US11482805B2 (en) | 2019-10-01 | 2022-10-25 | Kabushiki Kaisha Nihon Micronics | Electrical contactor, electrical connecting structure and electrical connecting apparatus |
| TWI801754B (en) * | 2019-10-01 | 2023-05-11 | 日商日本麥克隆尼股份有限公司 | Electrical contact, electrical connection structure and electrical connection device |
| TWI785933B (en) * | 2020-12-17 | 2022-12-01 | 日商日本發條股份有限公司 | measuring unit |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWM358968U (en) | Probe device | |
| TWI293122B (en) | Inspection unit | |
| TW531938B (en) | Contact apparatus particularly useful with test equipment | |
| US7554348B2 (en) | Multi-offset die head | |
| KR102439789B1 (en) | Electronic device with cradling | |
| US20120048039A1 (en) | Testing stylus for testing keyboard of portable electronic device | |
| TW201202902A (en) | Integrated connection system for an electronic device | |
| JPH0429561Y2 (en) | ||
| JP2012221362A (en) | Operation input device | |
| JP5660911B2 (en) | Lightning current detection sensor | |
| TW200401113A (en) | Multi-socket board for open/short tester | |
| TW201100811A (en) | Probe card | |
| TWI522623B (en) | Probe module (1) | |
| US20170045550A1 (en) | Cable Assembly With Spine For Instrument Probe | |
| TW201006315A (en) | Electrostatic discharge guide using metal sputtering process and modified plastic case | |
| US20070190823A1 (en) | Electrical connector for semiconductor device test fixture and test assembly | |
| US20150168447A1 (en) | Probe module | |
| TWI642941B (en) | Probe card | |
| TWM478824U (en) | Signal adapting line of probe detector | |
| CN210293142U (en) | Vibrating wire type integrated strain gauge | |
| TWI255521B (en) | Probe card | |
| JPH02201174A (en) | Noise measuring probe and noise measurement | |
| US10007829B2 (en) | Electronic device including electrostatic discharge device coupled flexure member and related methods | |
| CN205679640U (en) | A kind of field effect transistor test adapter | |
| CN110411562A (en) | A kind of signal supervisory instrument |