TWI811430B - Method for checking an object made of transparent material and corresponding checking system - Google Patents

Method for checking an object made of transparent material and corresponding checking system Download PDF

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TWI811430B
TWI811430B TW108129879A TW108129879A TWI811430B TW I811430 B TWI811430 B TW I811430B TW 108129879 A TW108129879 A TW 108129879A TW 108129879 A TW108129879 A TW 108129879A TW I811430 B TWI811430 B TW I811430B
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light
sensor
trace
container
traces
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TW202108976A (en
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莫里吉奧 達拉卡薩
馬可 蒙特其
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義大利商馬普斯公司
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Abstract

Method for checking the surface and/or shape of at least one surface, or part thereof, of an object made of transparent material, by means of a checking system which comprises a light source, a sensor and a processing unit connected to the sensor. By an appropriate positioning of the light source and sensor it is possible to overcome the problem of multiple reflections and to identify in a unique manner the rays scattered from the surface to be checked and received by the sensor which are useful for the purposes of checking. According to one of the embodiments, it is also possible to determine the thickness of the object to be checked.

Description

用於查驗由透明材料所製成的物件之方法及對應之查驗系統Methods for inspecting objects made of transparent materials and corresponding inspection systems

本發明關於一種用於查驗由透明材料製成的物件的方法和對應的系統。例如,該方法使得可以對物件的至少一個表面或其一部分的表面和/或形狀進行查驗,以識別不平整和/或結構缺陷。根據一個實施例,還可以確定待查驗物件的厚度。The invention relates to a method and a corresponding system for inspecting objects made of transparent materials. For example, the method makes it possible to examine the surface and/or shape of at least one surface of the object or a part thereof to identify irregularities and/or structural defects. According to one embodiment, the thickness of the object to be inspected can also be determined.

有多種已知的用於重建物件的3D形狀的方法。在非接觸式方法中,3D雷射三角剖分掃描非常適合以解析度低至幾微米從約一米的距離測量物件。根據這種在此未詳細說明的已知技術,將雷射束對準要測量的物件,被照射的表面反射/散射部分入射輻射,並且數位攝影機捕獲包括照明點之該物件表面的影像。There are several known methods for reconstructing the 3D shape of an object. Among non-contact methods, 3D laser triangulation scanning is ideal for measuring objects from a distance of about one meter with resolutions as low as a few microns. According to this known technique, not described in detail here, a laser beam is directed at the object to be measured, the illuminated surface reflects/scatters part of the incident radiation, and a digital camera captures an image of the surface of the object including the illuminated point.

用於從2D影像重建物件的3D幾何形狀的方法提供了使用如圖1所示的攝影機的針孔模型。A method for reconstructing the 3D geometry of an object from 2D images provides a pinhole model using a camera as shown in Figure 1.

本質上,當影像已經被針對由透鏡產生的畸變校正時,從物件表面散射的光線穿過攝影機的透鏡中心,並最終入射到攝像機的影像感測器(典型地為CCD/ CMOS)。為了方便起見,將感測器放置在圖中透鏡中心之前。因此,已知以下情況時: -其上為雷射束/刀片所在的幾何平面或直線 -透鏡中心的位置 -相機的方向(偏航,俯仰,橫滾) -透鏡的焦距 -感測器的主點, 藉由獨特且立即的解決方案,將物件表面上的點P的位置的計算減少為簡單的幾何問題(因此不需要進行迭代計算),撞擊影像感測器的像素i、j之散射的光線從該物件表面離開。Essentially, when the image has been corrected for the distortion produced by the lens, light scattered from the surface of the object passes through the center of the camera's lens and ultimately strikes the camera's image sensor (typically a CCD/CMOS). For convenience, the sensor is placed in front of the center of the lens in the figure. Therefore, when the following is known: -The geometric plane or line on which the laser beam/blade lies -The position of the lens center -The direction of the camera (yaw, pitch, roll) -focal length of lens -the main point of the sensor, With a unique and immediate solution that reduces the calculation of the position of point P on the object surface to a simple geometric problem (and therefore does not require iterative calculations), the scattered light rays hitting the image sensor pixels i, j are from The object surface leaves.

一旦特徵矩陣、畸變係數和攝影機的主點是已知的,就可以校正影像的畸變;在選擇了適合測量要求的攝影機和透鏡組合之後,可以使用文獻中描述的方法之一評估所有這些參數。Once the characteristic matrix, distortion coefficients and principal points of the camera are known, the distortion of the image can be corrected; after selecting a camera and lens combination suitable for the measurement requirements, all these parameters can be evaluated using one of the methods described in the literature.

目前,該方法已被廣泛用於不透明物件的測量,但是強烈建議不要將其用於透明物件,因為折射和反射現象會在待查驗的物件之第一表面(即面對光發射器的表面)產生假跡線。例如,在玻璃板的情況下,除了由於雷射與玻璃的第一表面(即面對光源的表面)相交而產生的第一跡線之外,還會出現由於玻璃的第二表面之第二跡線(即相對的表面,不面對光源的表面)。此外,在諸如容器的透明中空物件的情況下,存在由與被查驗並且光線被導向的壁相對的容器的壁相對的壁產生了附加的反射/散射。這使得常規三角測量方法無效。實際上,即使查驗關於的是容器而不是板,以類似的方式,撞擊到容器外表面的一些光也會透過透明材料傳輸,直到到達發生反射的第二表面(容器內部)為止。At present, this method has been widely used for the measurement of opaque objects, but it is strongly recommended not to be used for transparent objects, because refraction and reflection phenomena will occur on the first surface of the object to be inspected (that is, the surface facing the light emitter) Produce false traces. For example, in the case of a glass plate, in addition to the first trace due to the intersection of the laser with the first surface of the glass (i.e. the surface facing the light source), there will also be a second trace due to the second surface of the glass. Trace (that is, the opposite surface, the surface not facing the light source). Furthermore, in the case of transparent hollow objects such as containers, there is additional reflection/scattering caused by the walls of the container opposite the walls to which the light is being examined and directed. This renders conventional triangulation methods ineffective. Indeed, even if the inspection is about a container rather than a plate, in a similar manner some of the light striking the outer surface of the container will be transmitted through the transparent material until it reaches the second surface (inside the container) where reflection occurs.

除了上述用於獲得與容器的外表面的輪廓的形狀有關的測量值的系統之外,下面還列出了當前使用的最廣泛的系統。 -藉由使用機電感測器重建容器輪廓的形狀,這些機電感測器在不同位置與容器的外表面進行點接觸。然後,容器被放置在旋轉的支架上,並被連接至將感測器的讀數和容器的角位置相互關聯的處理系統的機電感測器的讀數,且可用於重建在各個位置中的形狀誤差。 -使用配備機械探針或光學測量頭(非接觸式)的坐標測量系統。在工業和實驗室計量學的使用中眾所周知的這些系統還可以提供將微粉施加到容器的外表面上的用途,以利於藉由光學測量頭識別照明點。 -使用檢測容器外部輪廓的光學系統(陰影投影系統)。這樣的系統通常讀取容器的“輪廓”,即在適當的背景下顯示其“陰影”。相機在不同角度位置拍攝容器外邊緣的照片,藉由分析收集的大量影像來重建其拓撲。但是,這些系統無法檢測到“負”形狀的誤差,即“凹陷”的誤差。 -使用機械量規,當機械量規靠在容器外表面上時,可藉由機械比較器提供有關具有圓柱形標稱外表面的容器輪廓誤差的資訊。In addition to the above-mentioned systems for obtaining measurements related to the shape of the contour of the outer surface of a container, the most widely used systems currently in use are listed below. -The shape of the container contour is reconstructed by using electromechanical sensors that make point contact with the outer surface of the container at different locations. The container is then placed on a rotating stand and the readings of the electromechanical sensor are connected to a processing system that correlates the sensor readings with the angular position of the container and can be used to reconstruct the shape error in each position . -Use coordinate measuring systems equipped with mechanical probes or optical measuring heads (non-contact). Well known from use in industrial and laboratory metrology, these systems also offer the possibility of applying micropowder to the outer surface of the container to facilitate the identification of illumination points by optical measuring heads. -Use an optical system that detects the outer contour of the container (shadow projection system). Such systems typically read the "outline" of the container, i.e. display its "shadow" against an appropriate background. The camera takes photos of the outer edge of the container at different angles and reconstructs its topology by analyzing the large number of images collected. However, these systems are unable to detect errors of "negative" shape, i.e. errors of "sag". - Using a mechanical gauge, information about the contour error of a vessel with a cylindrical nominal outer surface can be provided by a mechanical comparator when the mechanical gauge is placed against the outer surface of the vessel.

原則上,當系統的幾何形狀(即物件、接收器(攝影機)和光源的相對位置)以及發光方向與形成待查驗物件的材料之折射特性已知時,對在兩個過渡表面(外部和內部)上反射的影像進行的分析不僅可以用於容器的3D測量,還可以用於形成容器的材料的厚度測量藉由測量兩條反射跡線之間的距離來測量容器。但是,特別是在待查驗容器的內表面(即中空形狀的物件)的情況下,迄今為止,多次反射/散射和折射現象阻礙了上述方法的應用,因為這非常困難,當使用已知方法時,將光源的實際反射/散射影像與由多次反射/散射現象產生的寄生影像區分開。In principle, when the geometry of the system (i.e. the relative positions of the object, the receiver (camera) and the light source) as well as the direction of the light emission and the refractive properties of the material forming the object to be examined are known, then the ) can be used not only for 3D measurements of containers, but also for thickness measurements of the materials from which they are formed. Containers can be measured by measuring the distance between two reflection traces. However, particularly in the case of inner surfaces of containers to be inspected (i.e. hollow-shaped objects), the phenomena of multiple reflections/scattering and refraction have hitherto hindered the application of the above-mentioned methods, since this is very difficult when using known methods When distinguishing the actual reflected/scattered image of a light source from the spurious image produced by multiple reflection/scattering phenomena.

存在多種其他方法,其藉由感測器進行厚度的點測量。當將這些感測器適當地連接到定位和移動系統和/或組合成陣列時,可以藉由掃描或藉由獲取大量點跡線來測量多個點處的厚度。這樣的點感測器可以是例如電容感測器、色共焦感測器或磁感測器。但是,使用這些感測器需要沿著在不同位置的重複路徑對要測量的物件進行掃描,因此這種掃描的執行和完成非常耗時。There are many other methods that make point measurements of thickness with sensors. When these sensors are appropriately connected to positioning and movement systems and/or combined into arrays, the thickness at multiple points can be measured by scanning or by acquiring traces of a large number of points. Such point sensors may be, for example, capacitive sensors, chromatic confocal sensors or magnetic sensors. However, using these sensors requires scanning the object to be measured along a repeated path at different locations, making such scans very time-consuming to perform and complete.

本發明的目的是提供一種用於無接觸地查驗由透明材料製成的至少一個平坦和/或彎曲表面的方法和對應的系統,該方法和對應的系統克服了已知方法的缺點並且允許進行光學三角測量被應用於透明物件。It is an object of the present invention to provide a method and a corresponding system for the contactless inspection of at least one flat and/or curved surface made of a transparent material, which method and corresponding system overcome the disadvantages of known methods and allow Optical triangulation is applied to transparent objects.

根據本發明的系統和方法還可以用於查驗和測量由玻璃或其他透明材料製成的物件的表面的形狀誤差(輪廓誤差)。在容器的特定情況下,例如可以查驗在填充處理結束時貼有標籤的區域或形成表面裝飾的區域。The system and method according to the invention can also be used to inspect and measure shape errors (contour errors) of surfaces of objects made of glass or other transparent materials. In the specific case of containers, it is possible, for example, to inspect areas where labels were attached at the end of the filling process or areas where surface decoration was formed.

根據本發明的實施例之一,還可以查驗板和/或透明材料的空心體(例如容器)的厚度。According to one embodiment of the invention, it is also possible to check the thickness of plates and/or hollow bodies of transparent material, such as containers.

下面參照由玻璃製成的容器,更具體地為瓶子,來描述查驗系統1和對應的方法。然而,這些可以應用於查驗包括至少第一表面和第二表面的透明材料的任何物件,該第一表面和第二表面可以是平坦的或彎曲的,從而限制了厚度,例如平坦的物件,例如玻璃板。The inspection system 1 and the corresponding method are described below with reference to containers made of glass, more specifically bottles. However, these can be applied to inspecting any object of transparent material that includes at least a first surface and a second surface, which may be flat or curved, thereby limiting the thickness, such as a flat object, e.g. glass plate.

圖2示出了具有旋轉對稱性的玻璃容器2,該玻璃容器2大體上是圓柱形的,更具體地是瓶子,其定位在圍繞平行於方向Z的旋轉軸R旋轉的支撐件3上。容器2限定了實質上位於支撐件的旋轉軸線上之縱軸並包括第一表面(即容器的外表面)和與第一表面相對的第二表面(即所述容器的內表面)。容器放置在其上的支撐件3也可以沿方向Z平移。容器可以手動放置或藉由自動系統放置。Figure 2 shows a glass container 2 with rotational symmetry, generally cylindrical, more specifically a bottle, positioned on a support 3 rotating about an axis of rotation R parallel to the direction Z. The container 2 defines a longitudinal axis located substantially on the axis of rotation of the support and includes a first surface, ie the outer surface of the container, and a second surface opposite the first surface, ie the inner surface of said container. The support 3 on which the container is placed can also be translated in direction Z. Containers can be placed manually or by automated systems.

光發射器4或光源朝支撐件的旋轉軸線(即與旋轉軸線R實質上共面)發射光翼(在圖中示意性地顯示為一系列垂直線)。發射的光翼限定照明平面,該照明平面實質上垂直於待查驗的瓶子的第一表面。該第一表面面對光源4。根據較佳實施例,光源4發射結構化的光,較佳地為雷射刀片。發出的光的特性可以以適當的方式選擇。特別地,顏色可以是藍色,換言之具有小波長,以在被查驗的表面上提供尖銳的散射效果。The light emitter 4 or light source emits a light wing (shown schematically in the figure as a series of vertical lines) towards the axis of rotation of the support, ie substantially coplanar with the axis of rotation R. The emitted light wings define an illumination plane that is substantially perpendicular to the first surface of the bottle to be inspected. This first surface faces the light source 4 . According to a preferred embodiment, the light source 4 emits structured light, preferably a laser blade. The characteristics of the emitted light can be selected in an appropriate manner. In particular, the color may be blue, in other words have a small wavelength, to provide a sharp scattering effect on the surface being inspected.

包括較佳地為矩陣類型的感測器6的接收器或攝影機,其被定位以朝向支撐件3的旋轉軸的定向並與光源4成角度地間隔開,該感測器6限定光軸並且可以接收從待查驗表面散射的光線。換句話說,感測器6被定位成面對待查驗的表面,以便與照明平面形成一個指定的角度,在該圖中由參考θ表示。該角度在45°至85°之間。根據對具有不同特性的多個透明物件進行的試驗,經驗地確定了上述範圍。a receiver or camera comprising a sensor 6, preferably of the matrix type, positioned in an orientation towards the axis of rotation of the support 3 and angularly spaced from the light source 4, which sensor 6 defines the optical axis and Can receive light scattered from the surface to be inspected. In other words, the sensor 6 is positioned facing the surface to be inspected so as to form a specified angle with the illumination plane, represented in the figure by the reference θ. This angle is between 45° and 85°. The above ranges were determined empirically based on tests on several transparent objects with different properties.

感測器6發射作為由感測器接收的光量的函數之電訊號,並將該訊號發送到連接到感測器6並包括例如已知類型的微處理器的處理單元,該處理單元圖中未示出,其產生了由光翼入射在容器2的內表面和外表面上而產生的多個跡線的有序影像。在查驗系統與容器2之間的相互旋轉期間,光翼在一定角度間隔的位置(例如間隔1°)撞擊容器2的表面,並且每個影像與所述位置之一相關聯。The sensor 6 emits an electrical signal as a function of the amount of light received by the sensor and sends this signal to a processing unit connected to the sensor 6 and comprising, for example, a microprocessor of a known type, which processing unit is shown in FIG. Not shown, it produces an ordered image of multiple traces produced by light wings incident on the inner and outer surfaces of the container 2 . During the mutual rotation between the inspection system and the container 2, the light wings strike the surface of the container 2 at angularly spaced positions (eg 1° apart), and each image is associated with one of said positions.

所收集的影像被儲存(儲存在RAM或諸如HDD或SSD的硬體媒體中或等效的媒體中),然後由處理單元進行處理。The collected images are stored (in RAM or hardware media such as HDD or SSD or equivalent) and then processed by the processing unit.

在影像處理之後,地圖被顯示在連接至例如處理單元的顯示器上,該地圖提供相對於參考表面的表面形狀的正偏差(例如投影)或負偏差(例如凹陷)的圖形表示。After image processing, a map is displayed on a display connected to, for example, a processing unit, which map provides a graphical representation of positive deviations (eg projection) or negative deviations (eg depression) of the surface shape relative to the reference surface.

換句話說,從包含在基於感測器6提供的訊號而產生的影像中的基本資訊的組合中,計算出掃描表面輪廓的趨勢。該等影像有關容器2的整個表面之完整分析還使其可以獲得適於重建物件的空間形狀的資料。In other words, the trend of the scanned surface profile is calculated from the combination of the basic information contained in the image generated based on the signal provided by the sensor 6 . The complete analysis of these images with respect to the entire surface of the container 2 also makes it possible to obtain data suitable for reconstructing the spatial shape of the object.

還可以藉由使用輔助或外部系統(例如光學系統)或基於圖紙,或藉由使用以文件形式的適當數學(圖紙、3D模型)來獲得有關容器的形態或拓撲的資料。Information about the morphology or topology of the container can also be obtained by using auxiliary or external systems (eg optical systems) or based on drawings, or by using appropriate mathematics in the form of documents (drawings, 3D models).

查驗系統還可以包括電子控制的機械系統,用於定位容器和查驗系統的各個部件,例如光源和攝影機。Inspection systems may also include electronically controlled mechanical systems for positioning containers and various components of the inspection system, such as light sources and cameras.

至此為止所描述的系統實現了根據本發明的查驗方法,如上所述,該查驗方法提供了用於發射借助於光源4之照明刀片和用於定位面對該外表面的感測器6,照明刀片限定出實質上垂直於待查驗的容器2的外表面的照明平面,定位面對該外表面的感測器6使得感測器6的光軸與照明平面形成指定的角度θ,較佳在45°和85°之間。該方法還提供了用於檢測在由光翼撞擊容器2的外表面和內表面時由容器2的外表面和內表面散射的多個光線之間在感測器6的光軸處接收到的散射光線,並用於根據檢測到的散射光線產生對應於包括內表面和外表面之容器2的表面輪廓的多個跡線。術語“跡線”用來表示,一組點對應於由光翼擊中的表面上的該等點,其指示該表面的趨勢。The system described so far implements the inspection method according to the invention, which, as mentioned above, provides for emitting an illumination blade by means of a light source 4 and for positioning a sensor 6 facing the outer surface, illuminating The blade defines an illumination plane that is substantially perpendicular to the outer surface of the container 2 to be inspected, and the sensor 6 facing this outer surface is positioned so that the optical axis of the sensor 6 forms a specified angle θ with the illumination plane, preferably at between 45° and 85°. The method also provides for detecting light received at the optical axis of the sensor 6 between a plurality of light rays scattered by the outer and inner surfaces of the container 2 when struck by light wings. scattered light, and used to generate a plurality of traces corresponding to the surface profile of the container 2 including the inner surface and the outer surface based on the detected scattered light. The term "trace" is used to mean a set of points corresponding to points on a surface hit by a light wing that indicates the trend of that surface.

多個產生的跡線構造容器2的影像,該影像包括容器2的表面的輪廓並且具有已知的以及與物件的空間位置相關的定向。容器的外表面和內表面中的至少一個的輪廓與所產生的跡線之一相關,其相對於其他所產生的跡線位於預定位置。The plurality of generated traces constructs an image of the container 2 that includes the contour of the surface of the container 2 and has an orientation that is known and related to the spatial position of the object. A profile of at least one of the outer and inner surfaces of the container is associated with one of the generated traces, which is located at a predetermined position relative to the other generated traces.

在較佳實施例中,第一表面的輪廓對應於在位於相對於其他跡線的末端位置之多個檢測到的跡線之間的第一跡線,其中第一表面的輪廓換句話說是由光翼照射的容器2的外表面的輪廓,以及第二表面的輪廓對應於與與外表面的輪廓相關聯之第一跡線相鄰的第二跡線,其中第二表面的輪廓換言之是容器的內表面的輪廓。In a preferred embodiment, the profile of the first surface corresponds to a first trace between a plurality of detected traces located at end positions relative to the other traces, wherein the profile of the first surface is in other words The profile of the outer surface of the container 2 illuminated by the light wing, and the profile of the second surface corresponds to a second trace adjacent to the first trace associated with the profile of the outer surface, where the profile of the second surface is in other words Contour of the inner surface of the container.

與感測器和照明平面的相互定位有關的上述角度值範圍使得可以獲得跡線,特別是第一跡線和第二跡線,它們明顯彼此不同並且因此易於識別。其還可以減少潛在地由多次反射引起的干涉,多次反射典型地被產生在這種類型的查驗中並且可與根據本發明的方法的應用干涉。The above-mentioned range of angular values in relation to the mutual positioning of the sensor and the illumination plane makes it possible to obtain traces, in particular the first trace and the second trace, which are clearly different from each other and therefore easily identifiable. It can also reduce potential interference caused by multiple reflections, which are typically produced in this type of inspection and which can interfere with the application of the method according to the invention.

在查驗系統和容器2之間的相互旋轉期間,可以在容器2的不同角度位置處重複根據本發明的方法的步驟,直到已經查驗了其至少一個表面或指定區域為止。During the mutual rotation between the inspection system and the container 2 , the steps of the method according to the invention can be repeated at different angular positions of the container 2 until at least one surface or designated area thereof has been inspected.

下面參考圖式中示出的實施例描述該方法。The method is described below with reference to the embodiments shown in the drawings.

圖3示出了藉由將每個像素的灰度值乘以兩個不同的增強值,從位元深度為14的灰度級影像中獲得的由光翼撞擊的瓶子的兩個影像;顏色較淺的區域表示已達到最大值(飽和度)。在右側影像中,放大20倍時,很容易將瓶子的輪廓與深色背景區分開。由於材料的透明性,光線會傳播到瓶子中,並且在沿其路徑交叉的任何空氣/玻璃界面(換句話說,容器的任何表面,以下也稱為“面”)傳播,不僅會產生跡線,而且每條光線還會分為透射光線和反射光線,並且每一種光線都會繼續傳播和***。最終結果是大量跡線的出現。Figure 3 shows two images of a bottle struck by a light wing, obtained from a grayscale image with a bit depth of 14 by multiplying the grayscale value of each pixel by two different enhancement values; color Lighter areas indicate that maximum value (saturation) has been reached. In the image on the right, at 20x magnification, the outline of the bottle is easily distinguished from the dark background. Due to the transparency of the material, light will travel into the bottle and at any air/glass interface that crosses along its path (in other words, any surface of the container, hereafter also referred to as a "face"), not only creating traces , and each ray of light will be divided into transmitted rays and reflected rays, and each ray of light will continue to spread and split. The end result is the appearance of a large number of traces.

根據本發明的方法使得能夠建立判別準則以識別對查驗有用的跡線,同時克服已知方法的困難。The method according to the invention enables the establishment of discriminant criteria to identify traces useful for inspection, while overcoming the difficulties of known methods.

與利用反射的光學現象的已知方法不同,根據本發明的方法利用光學散射的現象,也稱為光學色散,而無需將手段(例如微粉)施加到待查驗的表面以增加待查驗的表面的點或部分的亮度。這是可能的,因為光源和攝影機的特定相互定位,這使得形成表面的材料的典型不平整性得以查驗,從而以獨特的方式用於識別從由攝影機查驗並接收的表面散射的光線,這對於查驗很有用。Unlike known methods that exploit the optical phenomenon of reflection, the method according to the invention exploits the phenomenon of optical scattering, also known as optical dispersion, without the need to apply means (such as micropowder) to the surface to be inspected in order to increase the intensity of the surface to be inspected. The brightness of a point or part. This is possible due to the specific mutual positioning of the light source and the camera, which allows the typical unevenness of the material forming the surface to be inspected and thus used in a unique way to identify the light scattered from the surface inspected and received by the camera, which is useful for Checking is useful.

攝影機以及感測器6的適當定位確保攝影機以及感測器6在其光軸上僅接收那些對查驗有用的散射光線。藉由使用具有適當孔徑的透鏡,並將攝影機相對於容器2的縱軸定位在適當的高度,攝影機可以重建待查驗的整個表面的輪廓,或更具體地說,在所描述的實施例中,容器2的整個母線的輪廓被光翼撞擊。因此,藉由對待查驗表面的單次掃描,可以確定該表面的輪廓。如果待查驗的表面在方向Z上的延伸範圍大於攝影機的視場,則可以執行第一次查驗,然後在圖2所示的方向Z上移動支架3,然後執行一次或更多次掃描,以便查驗整個表面。Proper positioning of the camera and sensor 6 ensures that the camera and sensor 6 receive only those scattered rays on their optical axis that are useful for inspection. By using a lens with an appropriate aperture and positioning the camera at an appropriate height relative to the longitudinal axis of the container 2, the camera can reconstruct the outline of the entire surface to be inspected, or more specifically, in the embodiment described, The entire profile of the generatrix of container 2 is struck by the light wing. Thus, with a single scan of the surface to be inspected, the contour of the surface can be determined. If the extension of the surface to be inspected in direction Z is larger than the field of view of the camera, a first inspection can be performed, and then the bracket 3 is moved in direction Z as shown in Figure 2, and then one or more scans are performed so that Check the entire surface.

使用根據本發明的方法,可建立用於識別與被光翼擊打的第一面有關的跡線的判別準則,換句話說,就是面對光源的要被查驗的表面。圖3中的影像關於光源在容器右側的定位,並以對應的方式定向。在該示例中,對應於面對光源的外表面的第一跡線是從右開始的順序中的第一跡線。隨後是幾乎與第一條跡線平行之第二跡線,對應於相對的表面,也就是不面對光源的表面的那個(在這種情況下,如果容器被包裹,則該表面對應於瓶子的內表面)。這是兩個有興趣的跡線,所有其他的跡線都將被忽略。因此,根據本發明的方法可以確定,與被發射的光翼穿過的物件的第一面相關的跡線是最靠近光源的面。Using the method according to the invention, it is possible to establish criteria for identifying traces related to the first surface struck by the light wing, in other words, the surface to be inspected facing the light source. The image in Figure 3 is about the light source being positioned on the right side of the container and oriented accordingly. In this example, the first trace corresponding to the outer surface facing the light source is the first trace in the order starting from the right. This is followed by a second trace almost parallel to the first trace, corresponding to the opposite surface, that is, the one not facing the light source (in this case, if the container is wrapped, this surface corresponds to the bottle inner surface). These are the two traces of interest, all other traces will be ignored. Therefore, the method according to the invention can determine that the trace associated with the first face of the object through which the emitted light wing passes is the face closest to the light source.

如上所述,藉由以最大化跡線的分離所瞄準的光源和攝影機的適當相互定位、適當選擇光源的特性(光翼的強度、寬度和顏色)以及待查驗的物件表面產生的入射光的散射效果來實現跡線的正確和有效的辨別,並因此實現該方法的有效性。當已經識別出對應於第一面的跡線時,可以以常規方式進行外表面或通常更加較為靠近光源的表面的形狀的重建,換句話說,就像物件是不透明的,根據已知的光學三角測量方法此處不再詳細描述。As mentioned above, this is accomplished by proper mutual positioning of the light source and camera aimed at maximizing trace separation, by appropriate selection of the characteristics of the light source (intensity, width and color of the light wings) and of the incident light generated by the surface of the object to be inspected. Scattering effects to achieve correct and efficient identification of traces and thus the effectiveness of the method. When the traces corresponding to the first face have been identified, the reconstruction of the shape of the outer surface or a surface that is usually closer to the light source can be performed in a conventional manner, in other words as if the object were opaque, according to known optical The triangulation method is not described in detail here.

如果待查驗的物件具有空心形狀並且相對於物件本身的尺寸具有非常小的厚度,或者如果物件具有平坦的形狀,則可以使用根據本發明的方法來建立第二判別準則:在多個產生的跡線之間,第二跡線(即該跡線緊跟在第一跡線之後,換言之相鄰於第一跡線,第一跡線即相鄰於與物件的第一面有關的跡線)對應於與待查驗的物件之第一面相對的第二面。If the object to be inspected has a hollow shape and a very small thickness relative to the size of the object itself, or if the object has a flat shape, a second discriminant criterion can be established using the method according to the invention: in a plurality of generated traces Between lines, the second trace (that is, the trace immediately follows the first trace, in other words, it is adjacent to the first trace, which is adjacent to the trace related to the first side of the object) Corresponds to the second side opposite to the first side of the object to be inspected.

在這種情況下,可以更具體地確定待查驗物件的厚度,並且例如如下面所解釋的,物件的厚度可以計算作為該第一跡線和第二跡線之間的距離的函數。實際上,被已穿過面對光源的表面(在容器的情況下,該表面對應於其外表面)的光翼撞擊的相對表面上的點作用為點光源,相對表面即不面對光源的表面(在容器的情況下,該表面對應於其內表面)。對於所有這些散射光線中的每一個,攝影機僅接收已經穿過面對光源的表面並指向攝影機透鏡中心的光線。In this case, the thickness of the object to be inspected can be determined more specifically and, for example, as explained below, the thickness of the object can be calculated as a function of the distance between the first trace and the second trace. In effect, a point on an opposite surface that is struck by a light wing that has passed through the surface facing the light source (in the case of the container, this surface corresponds to its outer surface) acts as a point light source, i.e. the opposite surface that is not facing the light source. surface (in the case of a container, this surface corresponds to its inner surface). For each of these scattered rays, the camera only receives rays that have passed through the surface facing the light source and are pointed toward the center of the camera lens.

在圖4中示意性地示出了上述原理,其中示出了玻璃板,該板示意性地示出為矩形,光線垂直地入射。假定觀察者(對應於攝影機)處於無限大的距離(也就是說,位於遠大於玻璃厚度的觀察距離處),並且從相對於光線的角度θ觀察板。為了確保光線在空中時從第二界面到達是平行於與第一界面所相關的光線,玻璃中的發射角θ1 必須滿足以下折射定律,其中從第二界面到達換句話說是從如圖中定向的矩形的左側到達,在空中時換句話說是從第一界面散射時,對應於如圖中定向的矩形的右側,該折射定律如下:, 其中n 0n 1 是空氣和玻璃的折射率;空氣的折射率n 0 可以取為1。 參見圖4,將容易看出兩條跡線之間的視距 根據關係與玻璃的厚度有關, 因此 The above principle is illustrated schematically in Figure 4, where a glass plate is shown, schematically shown as a rectangle, with light incident vertically. Assume that the observer (corresponding to the camera) is at infinite distance (that is, at a viewing distance much greater than the thickness of the glass) and is viewing the plate from an angle θ relative to the light ray. In order to ensure that the ray arriving from the second interface while in the air is parallel to the ray associated with the first interface, the emission angle θ1 in the glass must satisfy the following law of refraction, where the arrival from the second interface is in other words from the figure The left side of the oriented rectangle arrives, when in the air in other words when scattering from the first interface, corresponding to the right side of the oriented rectangle as shown in the figure, the law of refraction is as follows: , where n 0 and n 1 are the refractive indices of air and glass; the refractive index n 0 of air can be taken as 1. Referring to Figure 4, it will be easy to see the sight distance between the two traces According to the relationship, it is related to the thickness of the glass , therefore

結果完全獨立於兩個界面是否平行;然而,它受到光線的入射點和由第二界面產生的光線的出射點之間發生的第一界面的任何曲率的影響,但是,由於這些點相對於第一界面的曲率半徑是彼此非常接近的,這種效果很弱。The result is completely independent of whether the two interfaces are parallel; however, it is affected by any curvature of the first interface that occurs between the point of entry of the ray and the point of exit of the ray produced by the second interface, however, since these points are relative to the The radii of curvature of an interface are very close to each other and this effect is weak.

當已經確定了外表面的形狀時,上述二維處理可以容易地以3D實施。When the shape of the outer surface has been determined, the above two-dimensional processing can be easily implemented in 3D.

作為一般規則,所檢測到的跡線可能在例如由於材料中的缺陷之採樣不可行的區域中具有不連續性。對檢測到的跡線進行數學處理,假設材料是連續的(無裂紋),則可以藉由從系統所獲取的資料內插來估算物件表面的形狀及其厚度,包括採樣密度較低的區域中。As a general rule, the detected traces may have discontinuities in areas where sampling is not feasible, for example due to defects in the material. Mathematically processing the detected traces, assuming the material is continuous (no cracks), the shape of the object surface and its thickness can be estimated by interpolation from the data obtained by the system, including in areas with lower sampling density .

儘管對於根據本發明的方法之應用不是必需的,但是為了減小與待檢測的特性無關的光學反射/擾動的可能影響,可以如在已知系統中的這種情況下那樣使用用於增加由過渡區域中的光源突顯的輪廓的對比度的裝置,從而改善採樣。對比度增加系統可被配置為少量注入單一粉末或組合粉末或微粉之包含霧化合成樹脂的適當氣體。該系統尤其在對具有非常高的透明度和特別精細的內表面精加工的玻璃物件進行測量的情況下可能是有用的。對比度增加系統的目的實質上是藉由產生更多的散射點源來最大化採樣資料的數量。Although it is not necessary for the application of the method according to the invention, in order to reduce the possible influence of optical reflections/disturbances which are not related to the properties to be detected, it is possible to use, as in this case in known systems, the addition of Light sources in transition areas highlight the contrast of the contours of the device, thereby improving sampling. The contrast increasing system may be configured to inject a small amount of a single powder or a combination of powders or micropowders of an appropriate gas containing atomized synthetic resin. This system may be useful especially in the case of measurements of glass objects with very high transparency and particularly fine internal surface finishing. The purpose of a contrast increasing system is essentially to maximize the amount of sampled data by generating more scattered point sources.

根據本發明的方法使得可以在單次掃描中忠實地近似面對光源的表面的輪廓,並且根據替代實施例,也可以是相對的表面的輪廓(即不面對光源的表面的輪廓)。如果將查驗方法應用於容器,則這些表面的輪廓對應於容器的外部輪廓和內部輪廓。與已知方法相比,可以延伸到待查驗的整個表面或其一部分的查驗和/或測量過程在很短時間內覆蓋了測量的大量點和位置。因此,該方法允許連續地而不是離散地,換句話說逐點地掃描表面,如在已知方法中那樣,掃描的連續性僅受所用感測器的解析度和採集速度的限制。The method according to the invention makes it possible to faithfully approximate in a single scan the profile of a surface facing the light source and, according to an alternative embodiment, also of the opposite surface (ie of a surface not facing the light source). If the inspection method is applied to a container, the contours of these surfaces correspond to the outer and inner contours of the container. In contrast to known methods, the inspection and/or measurement process, which can extend to the entire surface to be inspected or a part thereof, covers a large number of measured points and positions in a very short time. This method therefore allows the surface to be scanned continuously rather than discretely, in other words point by point, as in known methods, the continuity of the scan being limited only by the resolution and acquisition speed of the sensor used.

在到目前為止所描述的系統和方法中,是使容器相對於查驗系統旋轉的容器。然而,可以以如下方式設計系統:容器是固定的,並且藉由移動查驗系統本身來提供被查驗物件與查驗系統之間的相對運動。In the systems and methods described so far, it is the container that is rotated relative to the inspection system. However, the system can be designed in such a way that the container is fixed and relative movement between the inspected object and the inspection system is provided by moving the inspection system itself.

可以以不同於圖1所示的方式來提供待查驗的物件與查驗系統之間的相對運動,其中一些方式在以下描述中以示例的方式示出。Relative motion between the object to be inspected and the inspection system may be provided in ways other than those shown in Figure 1, some of which are shown by way of example in the following description.

下面描述的用於定位容器和光源的系統使得能夠在容器和光源之間產生相對運動,從而保持由在容器表面上光源發射的光的入射實質上正交。The system described below for positioning a container and a light source enables relative movement between the container and the light source to maintain substantially orthogonal incidence of light emitted by the light source on the surface of the container.

圖5示出了替代實施例,其中,光源的發射方向由參考X表示。將具有待查驗的平行六面體部分的容器放置在能夠沿兩個彼此正交的方向旋轉和平移的支撐物上。容器限定了位於支撐件的旋轉軸線處之縱向軸線。根據從系統的其他輔助採集系統(光學或機械)獲得的與容器形狀有關的資料,容器被旋轉直到待查驗的尺寸變得平行於垂直於X的方向Y。該系統是能夠在平行於Y的方向平移容器的,用於查驗平行於Y的尺寸的形狀和厚度的目的。Figure 5 shows an alternative embodiment, in which the emission direction of the light source is represented by the reference X. The container with the parallelepiped portion to be inspected is placed on a support capable of rotation and translation in two mutually orthogonal directions. The container defines a longitudinal axis located at the axis of rotation of the support. Based on information related to the shape of the container obtained from other auxiliary acquisition systems of the system (optical or mechanical), the container is rotated until the dimension to be inspected becomes parallel to the direction Y perpendicular to X. The system is capable of translating the container in a direction parallel to Y for the purpose of checking the shape and thickness of dimensions parallel to Y.

備選地,在其它配置中,光源可在平行於Y的方向平移來掃描平行於Y被查驗的尺寸。Alternatively, in other configurations, the light source may be translated in a direction parallel to Y to scan the dimension being examined parallel to Y.

在示出另一個替代實施例的圖6中,該系統包括用於定位容器的設備,具有控制單元的多軸系統(例如,以非常示意性的方式示出的允許3D移動的工業機器人)、發射結構化光的光源(例如雷射器)和攝影機。In Figure 6, another alternative embodiment is shown, the system includes a device for positioning containers, a multi-axis system with a control unit (eg an industrial robot allowing 3D movement shown in a very schematic way), Light sources (such as lasers) and cameras that emit structured light.

用於定位容器的設備可以執行至少一個旋轉以及平行於Z的平移。The device for positioning the container can perform at least one rotation and a translation parallel to Z.

基於與容器的形態及其表面的拓撲有關的資料,定位裝置使容器相對於方向Y適當地定向。與光源機械連接的多軸系統使光源移動藉由平行於Y的平移,可以保持光源的發射平行於X。The positioning device orients the container appropriately relative to the direction Y based on information regarding the morphology of the container and the topology of its surface. A multi-axis system mechanically connected to the light source allows the light source to be moved by translation parallel to Y, keeping the emission of the light source parallel to X.

攝影機獲取影像,並且藉由適當的處理以重建平行於Y軸的容器的寬度的輪廓的形狀和相對於所述輪廓的容器的厚度。The camera acquires the image and by appropriate processing reconstructs the shape of the contour of the container's width parallel to the Y-axis and the thickness of the container relative to said contour.

圖7以簡化的方式示出了用於產生關於容器的形態和拓撲資料的輔助系統的配置。Figure 7 shows in a simplified way the configuration of an auxiliary system for generating morphological and topological information about containers.

這些輔助系統可以包括具有適當照明裝置的攝影機,該照明裝置用於從容器上方或相對於容器的側面捕獲至少一個影像,從而能夠獲得有關容器的形態和表面拓撲的資訊的容器。These auxiliary systems may include cameras with appropriate lighting for capturing at least one image from above or relative to the side of the container, enabling information about the morphology and surface topology of the container to be obtained.

用於定位容器和光源的系統使得能夠在容器和光源之間產生相對運動,使得由光源發射的光在容器表面上的入射保持正交於容器的表面或接近正交於容器的表面。在控制系統的控制下的該相對運動期間,透過攝影機獲取並產生多個可訂製的影像。從影像中包含的基本資訊的組合,計算出被掃描表面的輪廓的趨勢,並且獲得了容器壁在整個表面或其一部分上的厚度的測量結果。覆蓋容器的整個表面(包絡線)的影像的完整的分析還使得能夠獲得適合於重建物件的空間形狀資料。The system for positioning the container and the light source enables relative movement between the container and the light source such that the incidence of light emitted by the light source on the surface of the container remains orthogonal or nearly orthogonal to the surface of the container. During the relative movement under the control of the control system, a plurality of customizable images are acquired and generated through the camera. From the combination of the basic information contained in the image, the trend of the contour of the scanned surface is calculated and a measurement of the thickness of the container wall over the entire surface or a part of it is obtained. A complete analysis of the image covering the entire surface (envelope) of the container also makes it possible to obtain spatial shape data suitable for reconstructing the object.

如果將根據本發明的方法應用於由深色透明材料製成的物件,則可以適當地調變光源的發射功率,以便於識別與待查驗的第二表面相對應的跡線。If the method according to the invention is applied to an object made of dark transparent material, the emission power of the light source can be appropriately modulated in order to facilitate the identification of traces corresponding to the second surface to be inspected.

通常,在物件由特定的透明材料製成的情況下,可能難以區分與待查驗物件的外表面和內表面相對應的兩條跡線。實際上,兩條跡線中的一條可能優於另一條跡線,因此使正確識別所需的跡線變得複雜。為了克服該問題,有必要延長曝光時間或設置非常低的識別閾值,從而可能會產生雜訊或誤差訊號,或者可能無法考慮和處理所收集影像中包含的所有資料。Often, where the object is made of a specific transparent material, it may be difficult to distinguish between two traces corresponding to the outer and inner surfaces of the object to be inspected. In fact, one of the two traces may be better than the other, thus complicating the correct identification of the desired trace. To overcome this problem, it is necessary to extend the exposure time or set a very low recognition threshold, which may produce noise or error signals, or it may not be possible to consider and process all the data contained in the collected image.

為了便於識別跡線,可以使用發射偏振雷射光的光源和配備有適當濾光片(例如干涉濾光片(例如,帶通濾光片)的攝影機),以便感測器僅接收對應於光源發出的雷射的頻率)和偏振濾光片。To facilitate trace identification, a light source emitting polarized laser light can be used and a camera equipped with an appropriate filter, such as an interference filter (e.g., a bandpass filter), so that the sensor only receives signals corresponding to those emitted by the light source. frequency of the laser) and polarizing filter.

在已經實施了根據本發明的方法以識別與待查驗物件的內表面和外表面相對應的跡線之後,如下文所述獲取另外的影像。After the method according to the invention has been implemented to identify traces corresponding to the inner and outer surfaces of the object to be inspected, further images are acquired as described below.

藉由以這樣的方式設置攝影機的偏振濾光片,使得偏振角相對於雷射光源的偏振角偏移90°,對應於物件外表面的第一跡線就完全在進一步收集的影像中不存在。因此,此類影像僅包含對應於物件內表面的第二跡線。By setting the camera's polarizing filter in such a way that the polarization angle is offset by 90° relative to the polarization angle of the laser source, the first trace corresponding to the outer surface of the object is completely absent from further collected images. . Therefore, such images contain only the second trace corresponding to the inner surface of the object.

藉由從包含兩個跡線的先前收集的影像中減去僅包含第二跡線的影像,有可能獲得僅具有對應於物件的外表面的第一跡線的影像。要指出的是,可以藉由例如將偏振濾光器的偏振角設置為與雷射光源的偏振角同相來收集包含兩條跡線的影像。By subtracting an image containing only the second trace from a previously collected image containing two traces, it is possible to obtain an image with only the first trace corresponding to the outer surface of the object. It is noted that an image containing two traces can be collected by, for example, setting the polarization angle of the polarization filter to be in phase with the polarization angle of the laser light source.

在查驗系統與容器2之間的相互旋轉期間,對於光翼撞擊容器2的表面的每個角度間隔位置重複此處理。This process is repeated for each angularly spaced position where the light wing strikes the surface of the container 2 during the mutual rotation between the inspection system and the container 2 .

獲得具有單個跡線的影像使得能夠進一步處理這樣的影像(藉由應用例如允許使跡線更清晰的更多“極端”處理方法)而不會引入可能影響跡線辨別力的其他干涉的雜訊。Obtaining an image with a single trace enables further processing of such an image (by applying e.g. more "extreme" processing methods that allow the trace to be made clearer) without introducing other interfering noise that may affect trace discrimination .

這有利於查驗不僅物件的表面而且查驗物件的厚度,因為到目前為止其厚度的測量被簡化。This facilitates checking not only the surface but also the thickness of the object, since the measurement of its thickness is thus far simplified.

藉由使用攝影機的最新模型,特別有利於如上所述的單個影像的收集,這歸功於感測器的功能和攝影機本身的軟體,並且改變偏振態會自動處理在實施根據本發明的方法期間原始收集的影像,即,包含兩者跡線的影像,以獲得包含單個跡線的影像,而在偏振角已經移位之後不拍攝另外的影像。By using the latest models of cameras, the collection of individual images as described above is particularly facilitated, thanks to the functionality of the sensor and the software of the camera itself, and the change of polarization state is automatically processed during the implementation of the method according to the invention. Collect images, ie, images containing both traces, to obtain an image containing a single trace, without taking another image after the polarization angle has been shifted.

1:查驗系統 2:容器 3:支撐件 4:光發射器或光源 6:感測器 R:旋轉軸 X:參考 Y:方向 Z:方向 θ:參考、角度 θ1 :發射角1: Inspection system 2: Container 3: Support 4: Light emitter or light source 6: Sensor R: Rotation axis X: Reference Y: Direction Z: Direction θ: Reference, angle θ 1 : Emission angle

現在將參考圖式中所示的實施例來詳細描述本發明,這些實施例將被解釋為非限制性示例,其中: -圖1以高度簡化的方式示出了已知類型的攝影機的針孔模型; -圖2示出了根據本發明的查驗系統的第一實施例; -圖3示出了藉由根據本發明的系統生產的容器的兩個不同的灰度影像; -圖4示出了與查驗實施根據本發明的方法的容器的厚度有關的佈局; -圖5示出了根據本發明的查驗系統的第一替代實施例; -圖6示出了根據本發明的查驗系統的第二替代實施例;以及 -圖7示出了根據本發明的查驗系統的第三替代實施例。The invention will now be described in detail with reference to the embodiments shown in the drawings, which are to be construed as non-limiting examples, in which: - Figure 1 shows in a highly simplified manner a pinhole model of a camera of a known type; - Figure 2 shows a first embodiment of an inspection system according to the invention; - Figure 3 shows two different grayscale images of containers produced by the system according to the invention; - Figure 4 shows a layout related to checking the thickness of a container for carrying out the method according to the invention; - Figure 5 shows a first alternative embodiment of the inspection system according to the invention; - Figure 6 shows a second alternative embodiment of the inspection system according to the invention; and - Figure 7 shows a third alternative embodiment of the inspection system according to the invention.

1:查驗系統 1: Check the system

2:容器 2: Container

3:支撐件 3:Support

4:光發射器或光源 4: Light emitter or light source

6:感測器 6: Sensor

R:旋轉軸 R: rotation axis

X:參考 X:Reference

Y:方向 Y: direction

Z:方向 Z: direction

θ:參考、角度 θ: reference, angle

Claims (16)

一種用於藉由查驗系統(1)查驗由透明材料製成的物件(2)的方法,該透明材料定義至少第一表面和第二表面,該至少第一表面和第二表面限定厚度,該查驗系統包含光源(4)、定義光軸的感測器(6)和連接到該感測器的處理單元,該方法包含以下步驟,不一定按該順序進行:-藉由該光源(4)發射定義實質上垂直於該第一表面的照明平面的光翼,-以該光軸與該照明平面形成指定角度的方式定位該感測器(6)面對該第一表面,-在由該至少第一表面和第二表面散射的複數個光線之間,檢測在該感測器(6)的該光軸接收到的該等散射光線,-基於該檢測到的散射光線來產生對應於該至少第一表面和第二表面的輪廓的複數個光跡線,以及-將該至少第一表面和第二表面中的一個的該輪廓與相對於其他光跡線位於預定位置的光跡線相關聯。 A method for inspecting an object (2) made of a transparent material defining at least a first surface and a second surface defining a thickness by an inspection system (1), the The inspection system includes a light source (4), a sensor (6) defining an optical axis and a processing unit connected to the sensor. The method includes the following steps, not necessarily in this order: - by the light source (4) emitting a light wing that defines an illumination plane substantially perpendicular to the first surface, - positioning the sensor (6) facing the first surface in such a way that the optical axis forms a specified angle with the illumination plane, - in response to the Between at least the plurality of light rays scattered by the first surface and the second surface, the scattered light rays received at the optical axis of the sensor (6) are detected, and based on the detected scattered light rays, a corresponding signal is generated based on the detected scattered light rays. a plurality of light traces of the profile of at least the first surface and the second surface, and - correlating the profile of the at least one of the first surface and the second surface with a light trace located at a predetermined position relative to the other light traces Union. 根據申請專利範圍第1項之方法,其中該物件的該第一表面的該輪廓與相對於該複數個其他光跡線位於末端位置的第一光跡線相關聯。 The method according to claim 1, wherein the profile of the first surface of the object is associated with a first light trace located at an end position relative to the plurality of other light traces. 根據申請專利範圍第2項之方法,其中該物件的該第 二表面的該輪廓與鄰近於該第一光跡線的第二光跡線相關聯。 According to the method of item 2 of the patent application, the item of the object The profile of the two surfaces is associated with a second light trace adjacent the first light trace. 根據申請專利範圍第3項之方法,還包括計算該物件的該厚度作為該第一光跡線和該第二光跡線之間的距離之函數的步驟。 The method according to claim 3 further includes the step of calculating the thickness of the object as a function of the distance between the first light trace and the second light trace. 根據申請專利範圍第1至4項中任一項之方法,其中該感測器(6)的該光軸與該照明平面之間的角度在45°和85°之間。 The method according to any one of items 1 to 4 of the patent application, wherein the angle between the optical axis of the sensor (6) and the illumination plane is between 45° and 85°. 根據申請專利範圍第1至4項中任一項之方法,其中該物件(2)的該第一表面和該第二表面中的至少一個是彎曲表面。 The method according to any one of claims 1 to 4, wherein at least one of the first surface and the second surface of the object (2) is a curved surface. 根據申請專利範圍第1至4項中任一項之方法,其中待查驗的該物件是容器(2),該第一表面和該第二表面分別對應於該容器(2)的該外表面和該內表面。 According to the method of any one of items 1 to 4 of the patent application, the object to be inspected is a container (2), and the first surface and the second surface respectively correspond to the outer surface and the outer surface of the container (2). the inner surface. 根據申請專利範圍第7項之方法,其中該第一表面被包括在該容器(2)有黏貼標籤的區域中。 According to the method of claim 7, the first surface is included in the area of the container (2) where the label is adhered. 一種查驗系統(1),用於查驗由透明材料製成的物件(2),該物件定義至少第一表面和第二表面,該至少第一 表面和第二表面限定厚度,該系統包含:-光源(4),-定義光軸的感測器(6),以及-連接到該感測器(6)的處理單元,其特徵在於-該光源(4)發射光翼,該光翼定義實質上垂直於該第一表面的照明平面;以及-該感測器(6)被定位以該光軸與該照明平面形成定義的角度的方式面對該第一表面,該感測器(6)並在該光軸接收並檢測由該至少第一表面和第二表面散射的光線且發送電訊號,該處理單元適於基於該檢測到的散射光線來產生對應於該至少第一表面和第二表面的該輪廓的複數個光跡線的影像,並使該至少第一表面和第二表面中的一個的該輪廓與相對於其他光跡線位於預定位置中的光跡線相關聯。 An inspection system (1) for inspecting an object (2) made of a transparent material defining at least a first surface and a second surface, the at least first surface being The surface and the second surface define the thickness, the system comprising: - a light source (4), - a sensor (6) defining the optical axis, and - a processing unit connected to the sensor (6), characterized in that - the The light source (4) emits a light wing defining an illumination plane substantially perpendicular to the first surface; and - the sensor (6) is positioned in such a way that the optical axis forms a defined angle with the illumination plane. For the first surface, the sensor (6) receives and detects light scattered by the at least first surface and the second surface at the optical axis and sends an electrical signal, and the processing unit is adapted to based on the detected scattering Light rays are used to generate images of a plurality of light traces corresponding to the profile of the at least first surface and the second surface, and the profile of one of the at least first surface and the second surface is compared with the other light traces Light traces located in predetermined locations are associated. 根據申請專利範圍第9項之系統,其中該光源(4)發射雷射光。 According to the system of claim 9 of the patent application, the light source (4) emits laser light. 根據申請專利範圍第9或10項之系統,其中由該光源(4)發出的該光是結構化的光。 According to the system of claim 9 or 10 of the patent application, the light emitted by the light source (4) is structured light. 根據申請專利範圍第9或10項中的任一項之系統,其中該光源(4)發出的該光可以被調變。 According to the system of any one of claims 9 or 10 of the patent application, the light emitted by the light source (4) can be modulated. 根據申請專利範圍第9或10項中任一項之系統,其中該感測器(6)的光軸與該照明平面之間的角度在45°和85°之間。 According to the system of claim 9 or 10, the angle between the optical axis of the sensor (6) and the illumination plane is between 45° and 85°. 根據申請專利範圍第9或10項中的任一項之系統,其中該處理單元適於將該物件的該第一表面的該輪廓與相對於該複數個其他光跡線位於末端位置的第一光跡線相關聯。 The system according to any one of claims 9 or 10, wherein the processing unit is adapted to combine the profile of the first surface of the object with a first light trace located at an end position relative to the plurality of other light traces. Light traces are associated. 根據申請專利範圍第14項之系統,其中該處理單元適於將該物件的該第二表面的該輪廓與鄰近於該第一光跡線的第二光跡線相關聯。 The system according to claim 14, wherein the processing unit is adapted to associate the profile of the second surface of the object with a second light trace adjacent to the first light trace. 根據申請專利範圍第15項之系統,其中該處理單元適於計算該物件的該厚度作為該第一光跡線和該第二光跡線之間的距離之函數。The system according to claim 15, wherein the processing unit is adapted to calculate the thickness of the object as a function of the distance between the first light trace and the second light trace.
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CN1708684A (en) * 2002-10-25 2005-12-14 蒂阿马公司 Method and device for the detection of surface defects on the finish of a transparent or translucent rotating container
CN103477212A (en) * 2011-02-18 2013-12-25 Msc&Sgcc公司 Method and device for detecting defects in material distribution in transparent containers

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1049492C (en) * 1993-09-20 2000-02-16 欧文斯-布洛克威玻璃容器有限公司 Measurement of transparent container wall thickness
CN1708684A (en) * 2002-10-25 2005-12-14 蒂阿马公司 Method and device for the detection of surface defects on the finish of a transparent or translucent rotating container
CN103477212A (en) * 2011-02-18 2013-12-25 Msc&Sgcc公司 Method and device for detecting defects in material distribution in transparent containers

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