TWI800558B - 用於電鍍鈷之包含調平劑之組成物 - Google Patents
用於電鍍鈷之包含調平劑之組成物 Download PDFInfo
- Publication number
- TWI800558B TWI800558B TW107141016A TW107141016A TWI800558B TW I800558 B TWI800558 B TW I800558B TW 107141016 A TW107141016 A TW 107141016A TW 107141016 A TW107141016 A TW 107141016A TW I800558 B TWI800558 B TW I800558B
- Authority
- TW
- Taiwan
- Prior art keywords
- composition
- leveling agent
- cobalt electroplating
- electroplating
- cobalt
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/12—Electroplating: Baths therefor from solutions of nickel or cobalt
- C25D3/14—Electroplating: Baths therefor from solutions of nickel or cobalt from baths containing acetylenic or heterocyclic compounds
- C25D3/18—Heterocyclic compounds
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/12—Electroplating: Baths therefor from solutions of nickel or cobalt
- C25D3/14—Electroplating: Baths therefor from solutions of nickel or cobalt from baths containing acetylenic or heterocyclic compounds
- C25D3/16—Acetylenic compounds
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Electroplating Methods And Accessories (AREA)
- Electrodes Of Semiconductors (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
??17202568.6 | 2017-11-20 | ||
EP17202568.6 | 2017-11-20 | ||
EP17202568 | 2017-11-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201923154A TW201923154A (zh) | 2019-06-16 |
TWI800558B true TWI800558B (zh) | 2023-05-01 |
Family
ID=60409228
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW112112867A TW202334510A (zh) | 2017-11-20 | 2018-11-20 | 用於電鍍鈷之包含調平劑之組成物 |
TW107141016A TWI800558B (zh) | 2017-11-20 | 2018-11-20 | 用於電鍍鈷之包含調平劑之組成物 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW112112867A TW202334510A (zh) | 2017-11-20 | 2018-11-20 | 用於電鍍鈷之包含調平劑之組成物 |
Country Status (8)
Country | Link |
---|---|
US (2) | US11377748B2 (zh) |
EP (1) | EP3714085B1 (zh) |
JP (1) | JP2021503560A (zh) |
KR (1) | KR102647950B1 (zh) |
CN (1) | CN111344438A (zh) |
IL (1) | IL274486A (zh) |
TW (2) | TW202334510A (zh) |
WO (1) | WO2019097044A1 (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020126687A1 (en) * | 2018-12-21 | 2020-06-25 | Basf Se | Composition for cobalt plating comprising additive for void-free submicron feature filling |
US11230778B2 (en) | 2019-12-13 | 2022-01-25 | Macdermid Enthone Inc. | Cobalt chemistry for smooth topology |
US20240124999A1 (en) * | 2022-09-26 | 2024-04-18 | Rohm And Haas Electronic Materials Llc | Nickel electroplating compositions for rough nickel |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002063070A1 (en) * | 2001-02-08 | 2002-08-15 | The University Of Alabama In Huntsville | Nickel cobalt phosphorous low stress electroplating |
TW200707640A (en) * | 2005-03-18 | 2007-02-16 | Applied Materials Inc | Contact metallization scheme using a barrier layer over a silicide layer |
TW201631108A (zh) * | 2014-07-09 | 2016-09-01 | Hitachi Chemical Co Ltd | Cmp用研磨液及研磨方法 |
Family Cites Families (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1283417A (en) * | 1968-10-24 | 1972-07-26 | Kewanee Oil Co | High speed electrodeposition of nickel and/or cobalt |
JPS5424971B1 (zh) * | 1970-12-10 | 1979-08-24 | ||
DE2100971B2 (de) * | 1971-01-11 | 1975-04-17 | Langbein-Pfanhauser Werke Ag, 4040 Neuss | Verfahren und Bad zur Erzeugung mikrorissiger Chromschichten über Zwischenschichten |
FR2472621A3 (fr) * | 1979-12-28 | 1981-07-03 | Xantia National Corp | Procede pour l'obtention de depots metalliques brillants d'au moins un element du groupe fer-nickel-cobalt ou d'un alliage d'un ou de plusieurs de ces elements avec le chrome |
US4425198A (en) | 1981-06-16 | 1984-01-10 | Omi International Corporation | Brightening composition for zinc alloy electroplating bath and its method of use |
AU726422B2 (en) * | 1996-06-03 | 2000-11-09 | Ebara-Udylite Co. Ltd. | Electroless copper plating solution and method for electroless copper plating |
US6508924B1 (en) * | 2000-05-31 | 2003-01-21 | Shipley Company L.L.C. | Control of breakdown products in electroplating baths |
JP4128005B2 (ja) | 2001-12-28 | 2008-07-30 | 日本リーロナール有限会社 | 電気ニッケルめっき液 |
ES2271848T3 (es) | 2003-02-24 | 2007-04-16 | Basf Aktiengesellschaft | Polimeros que contienen carboxilato para el tratamiento de superficies metalicas. |
DE102005038608A1 (de) * | 2005-08-16 | 2007-02-22 | Basf Ag | Polymerzusammensetzung für den Korrosionsschutz |
TWI328622B (en) * | 2005-09-30 | 2010-08-11 | Rohm & Haas Elect Mat | Leveler compounds |
JP5201315B2 (ja) * | 2007-09-26 | 2013-06-05 | 上村工業株式会社 | 電気めっき方法 |
US20090188805A1 (en) | 2008-01-25 | 2009-07-30 | Government Of The United States Of America, As Represented By The | Superconformal electrodeposition of nickel iron and cobalt magnetic alloys |
MY157126A (en) * | 2009-07-30 | 2016-05-13 | Basf Se | Composition for metal plating comprising suppressing agent for void free submicron feature filling |
US9617647B2 (en) * | 2009-07-30 | 2017-04-11 | Basf Se | Composition for metal plating comprising suppressing agent for void free submicron feature filling |
US8691687B2 (en) | 2010-01-07 | 2014-04-08 | International Business Machines Corporation | Superfilled metal contact vias for semiconductor devices |
KR101780085B1 (ko) * | 2010-03-18 | 2017-09-20 | 바스프 에스이 | 레벨링제를 포함하는 금속 전기도금용 조성물 |
EP2392692A1 (en) * | 2010-06-01 | 2011-12-07 | Basf Se | Composition for metal electroplating comprising leveling agent |
US20130264213A1 (en) * | 2010-12-21 | 2013-10-10 | Basf Se | Composition for metal electroplating comprising leveling agent |
SG194983A1 (en) * | 2011-06-01 | 2013-12-30 | Basf Se | Composition for metal electroplating comprising an additive for bottom-up filling of though silicon vias and interconnect features |
EP2530102A1 (en) * | 2011-06-01 | 2012-12-05 | Basf Se | Additive and composition for metal electroplating comprising an additive for bottom-up filling of though silicon vias |
US9514983B2 (en) | 2012-12-28 | 2016-12-06 | Intel Corporation | Cobalt based interconnects and methods of fabrication thereof |
EP2801640A1 (en) * | 2013-05-08 | 2014-11-12 | ATOTECH Deutschland GmbH | Galvanic nickel or nickel alloy electroplating bath for depositing a semi-bright nickel or nickel alloy |
US20150071980A1 (en) * | 2013-09-06 | 2015-03-12 | Savannah River Nuclear Solutions, Llc | Formation of nanosized metal particles on a titanate carrier |
US9777386B2 (en) | 2015-03-19 | 2017-10-03 | Lam Research Corporation | Chemistry additives and process for cobalt film electrodeposition |
CN113215626A (zh) | 2015-06-30 | 2021-08-06 | 麦德美乐思公司 | 微电子电路中的互连部的钴填充 |
US20170067173A1 (en) * | 2015-09-09 | 2017-03-09 | Rohm And Haas Electronic Materials Llc | Acid copper electroplating bath and method for electroplating low internal stress and good ductility copper deposits |
US20190226107A1 (en) | 2016-07-18 | 2019-07-25 | Basf Se | Composition for cobalt plating comprising additive for void-free submicron feature filling |
US10329683B2 (en) * | 2016-11-03 | 2019-06-25 | Lam Research Corporation | Process for optimizing cobalt electrofill using sacrificial oxidants |
US11035048B2 (en) * | 2017-07-05 | 2021-06-15 | Macdermid Enthone Inc. | Cobalt filling of interconnects |
CN111630211B (zh) * | 2017-11-01 | 2024-05-24 | 朗姆研究公司 | 控制在电化学镀敷设备上的镀敷电解液浓度 |
CN112154228A (zh) | 2018-04-19 | 2020-12-29 | 巴斯夫欧洲公司 | 用于钴或钴合金电镀的组合物 |
-
2018
- 2018-11-19 KR KR1020207016960A patent/KR102647950B1/ko active IP Right Grant
- 2018-11-19 US US16/762,717 patent/US11377748B2/en active Active
- 2018-11-19 CN CN201880072834.XA patent/CN111344438A/zh active Pending
- 2018-11-19 EP EP18800670.4A patent/EP3714085B1/en active Active
- 2018-11-19 JP JP2020545450A patent/JP2021503560A/ja active Pending
- 2018-11-19 WO PCT/EP2018/081692 patent/WO2019097044A1/en unknown
- 2018-11-20 TW TW112112867A patent/TW202334510A/zh unknown
- 2018-11-20 TW TW107141016A patent/TWI800558B/zh active
-
2020
- 2020-05-06 IL IL274486A patent/IL274486A/en unknown
-
2022
- 2022-06-02 US US17/805,144 patent/US20220298664A1/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002063070A1 (en) * | 2001-02-08 | 2002-08-15 | The University Of Alabama In Huntsville | Nickel cobalt phosphorous low stress electroplating |
TW200707640A (en) * | 2005-03-18 | 2007-02-16 | Applied Materials Inc | Contact metallization scheme using a barrier layer over a silicide layer |
TW201631108A (zh) * | 2014-07-09 | 2016-09-01 | Hitachi Chemical Co Ltd | Cmp用研磨液及研磨方法 |
Also Published As
Publication number | Publication date |
---|---|
US11377748B2 (en) | 2022-07-05 |
JP2021503560A (ja) | 2021-02-12 |
KR102647950B1 (ko) | 2024-03-14 |
TW202334510A (zh) | 2023-09-01 |
KR20200089697A (ko) | 2020-07-27 |
CN111344438A (zh) | 2020-06-26 |
TW201923154A (zh) | 2019-06-16 |
WO2019097044A1 (en) | 2019-05-23 |
US20220298664A1 (en) | 2022-09-22 |
US20200347503A1 (en) | 2020-11-05 |
EP3714085B1 (en) | 2023-08-09 |
IL274486A (en) | 2020-06-30 |
EP3714085A1 (en) | 2020-09-30 |
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