TWI789032B - Capacitor Life Tester - Google Patents

Capacitor Life Tester Download PDF

Info

Publication number
TWI789032B
TWI789032B TW110136014A TW110136014A TWI789032B TW I789032 B TWI789032 B TW I789032B TW 110136014 A TW110136014 A TW 110136014A TW 110136014 A TW110136014 A TW 110136014A TW I789032 B TWI789032 B TW I789032B
Authority
TW
Taiwan
Prior art keywords
detection
circuit board
outer setting
setting surface
connection part
Prior art date
Application number
TW110136014A
Other languages
Chinese (zh)
Other versions
TW202314254A (en
Inventor
李昶均
邱煜哲
Original Assignee
振海資通股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 振海資通股份有限公司 filed Critical 振海資通股份有限公司
Priority to TW110136014A priority Critical patent/TWI789032B/en
Priority to CN202211172019.5A priority patent/CN115877041A/en
Application granted granted Critical
Publication of TWI789032B publication Critical patent/TWI789032B/en
Publication of TW202314254A publication Critical patent/TW202314254A/en

Links

Images

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Ceramic Capacitors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

一種電容壽命測試機，適用於測試多個電容元件，電容壽命測試機包含容置設備，以及探測設備。容置設備包括具有外側設置面的容置體、位於容置體內且分別適用於供多個電路板設置的多個電路板連接部，以及位於外側設置面且分別對應於電路板連接部的多個探測連接部，每一電路板設置有電容元件，每一探測連接部具有多個探測點組，探測點組各自對應於其中一電容元件。探測設備包括移動裝置，以及探測件組，移動裝置包括供探測件組設置的滑動座，移動裝置的滑動座能被驅動以使探測件組連接於探測點組中的任一者。A capacitor life testing machine is suitable for testing multiple capacitor components. The capacitor life testing machine includes accommodating equipment and detection equipment. The accommodating device includes an accommodating body with an outer setting surface, a plurality of circuit board connecting parts located in the accommodating body and respectively suitable for setting a plurality of circuit boards, and a plurality of circuit board connecting parts located on the outer setting surface and respectively corresponding to the circuit board connecting parts. Each circuit board is provided with a capacitive element, and each detection connecting portion has a plurality of detection point groups, and each detection point group corresponds to one of the capacitive elements. The detecting equipment includes a moving device and a detecting element group. The moving device includes a sliding seat for the detecting element group. The sliding seat of the moving device can be driven to connect the detecting element group to any one of the detecting point groups.

Description

電容壽命測試機Capacitor Life Tester

本發明是有關於一種壽命測試機，特別是指一種電容壽命測試機。The invention relates to a life testing machine, in particular to a capacitance life testing machine.

現有一種電容壽命測試機能用以測試電容元件的壽命，以確保電容元件的製造品質，這種電容壽命測試機包括用以設置多個電容元件的一容置設備，以及一量測設備，該量測設備與該容置設備之間連接有多個纜線組，該等纜線組分別通過該容置設備電連接於該等電容元件，以使該量測設備能獲取該等電容元件的運行數據。然而，由於該等纜線組的數量眾多，因此容易因該等纜線組產生的電磁波而對該等電容元件產生電磁干擾，進而使該等電容元件的運行數據失真。There is a capacitor life testing machine which can be used to test the life of capacitor elements to ensure the manufacturing quality of capacitor elements. A plurality of cable groups are connected between the measuring device and the containing device, and the cable groups are respectively electrically connected to the capacitive elements through the containing device, so that the measuring device can obtain the operation of the capacitive elements data. However, due to the large number of the cable sets, the electromagnetic waves generated by the cable sets easily generate electromagnetic interference to the capacitive elements, thereby distorting the operating data of the capacitive elements.

因此，本發明之一目的，即在提供一種能改善先前技術中至少一缺點的電容壽命測試機。Therefore, one object of the present invention is to provide a capacitor life testing machine that can improve at least one shortcoming of the prior art.

於是，本發明電容壽命測試機在一些實施態樣中，適用於測試多個電容元件，該電容壽命測試機包含一容置設備，以及一探測設備。該容置設備包括具有一外側設置面的一容置體、位於該容置體內且分別適用於供多個電路板設置的多個電路板連接部，以及位於該外側設置面且分別對應於該等電路板連接部的多個探測連接部，每一電路板設置有該等電容元件中的至少一部分，每一探測連接部具有多個探測點組，該等探測點組各自對應於其中一該電容元件。該探測設備包括一移動裝置，以及一探測模組，該移動裝置包括一滑動座，該探測模組包括設於該滑動座的一探測件組，該移動裝置的滑動座能被驅動以滑動至對應於該等探測連接部的該等探測點組中的任一者之處，以使該探測件組連接於該等探測點組中的該任一者。Therefore, in some embodiments, the capacitor life testing machine of the present invention is suitable for testing a plurality of capacitor elements, and the capacitor life testing machine includes a containing device and a detecting device. The accommodating device includes an accommodating body with an outer setting surface, a plurality of circuit board connecting parts located in the accommodating body and respectively suitable for setting a plurality of circuit boards, and located on the outer setting surface and respectively corresponding to the A plurality of detection connection parts of the circuit board connection part, each circuit board is provided with at least a part of the capacitive elements, each detection connection part has a plurality of detection point groups, and each of the detection point groups corresponds to one of the capacitive element. The detection equipment includes a moving device, and a detection module, the moving device includes a sliding seat, the detection module includes a detection piece set on the sliding seat, the sliding seat of the moving device can be driven to slide to The position corresponding to any one of the detection point groups of the detection connection parts, so that the detection element group is connected to the any one of the detection point groups.

在一些實施態樣中，每一探測點組具有多個探測孔，每一探測件組具有多個探測針。In some implementation aspects, each detection point group has a plurality of detection holes, and each detection element group has a plurality of detection pins.

在一些實施態樣中，該移動裝置還包括橫向地延伸的一橫向滑軌、豎向地延伸且可橫向滑動地設置於該橫向滑軌的一豎向滑軌，以及可豎向滑動地設置於該豎向滑軌的一滑動台，該滑動座設於該滑動台且可朝該容置設備的外側設置面或遠離該容置設備的外側設置面地滑動。In some embodiments, the mobile device further includes a horizontal sliding rail extending horizontally, a vertical sliding rail extending vertically and being slidably disposed on the horizontal sliding rail, and a vertically slidably disposed A sliding platform on the vertical slide rail, the sliding seat is arranged on the sliding platform and can slide toward or away from the outer setting surface of the accommodating device.

在一些實施態樣中，該容置設備還包括位於該外側設置面且分別對應於該等電路板連接部的多個第一充電連接部，以及設於該外側設置面且分別對應於該等第一充電連接部的多個壓合機構，每一壓合機構包括具有一第二充電連接部的一壓合滑塊，該壓合滑塊能被驅動地朝該外側設置面或遠離該外側設置面地滑動，以使該第一充電連接部與該第二充電連接部接觸或分離。In some implementation aspects, the accommodating device further includes a plurality of first charging connection parts located on the outer setting surface and respectively corresponding to the circuit board connecting parts, and a plurality of first charging connecting parts arranged on the outer setting surface and respectively corresponding to the circuit board connecting parts. A plurality of pressing mechanisms of the first charging connection part, each pressing mechanism includes a pressing slider having a second charging connection part, the pressing slider can be driven towards the outer setting surface or away from the outer side The setting surface is slid so that the first charging connection part is in contact with or separated from the second charging connection part.

本發明電容壽命測試機藉由能滑動至對應於該等探測連接部的該等探測點組中的任一者之處的該滑動座，使設於該滑動座的探測件組能夠連接於該等探測點組中的該任一者，藉此使該探測模組能夠探測到該等電容元件的運行數據，這種設置方式能夠減少該容置設備與該探測設備之間的纜線數量，以減少纜線產生的電磁干擾使該等電容元件的運行數據失真之狀況。The capacitance life testing machine of the present invention enables the detection element set on the sliding seat to be connected to the sliding seat by being able to slide to any one of the detecting point groups corresponding to the detecting connection parts. any one of the detection point groups, so that the detection module can detect the operation data of the capacitive elements, and this arrangement can reduce the number of cables between the accommodating device and the detection device, In order to reduce the condition that the electromagnetic interference generated by the cable distorts the operating data of these capacitive elements.

參閱圖1至圖4，本發明電容壽命測試機100之一實施例，適用於測試多個電容元件200，該電容壽命測試機100包含一容置設備1，以及一探測設備2。Referring to FIG. 1 to FIG. 4 , an embodiment of a capacitor life tester 100 of the present invention is suitable for testing a plurality of capacitor elements 200 . The capacitor life tester 100 includes a holding device 1 and a detection device 2 .

該容置設備1包括具有一外側設置面111的一容置體11、位於該容置體11內且分別適用於供多個電路板300設置的多個電路板連接部12，以及位於該外側設置面111且分別對應於該等電路板連接部12的多個探測連接部13。在本實施例中，該容置體11呈箱體結構且還具有朝前的一開口112，以及用以蓋合該開口112的一門板113，該外側設置面111詳細來說是位於該容置體11的後方外側面。另外，該容置體11內可設有一溫度控制單元(圖未示)，以模擬該等電容元件200在不同溫度下的運行狀況。每一電路板300設置有該等電容元件200中的至少一部分，每一探測連接部13具有多個探測點組131，該等探測點組131各自對應於其中一該電容元件200，在本實施例中，每一探測點組131具有四個探測孔131a，但在其他實施態樣中，所述探測點組131的探測孔131a的數量也可以為其他數量，不以本實施例的數量為限制，另外，所述探測點組131的探測孔131a可以被其他連接結構所取代，例如探測接觸點等等，不以本實施例為限。The accommodating device 1 includes an accommodating body 11 having an outer setting surface 111, a plurality of circuit board connecting parts 12 located in the accommodating body 11 and respectively suitable for setting a plurality of circuit boards 300, and a plurality of circuit board connecting parts 12 located on the outer side The installation surface 111 corresponds to the plurality of detection connection portions 13 of the circuit board connection portions 12 respectively. In this embodiment, the accommodating body 11 has a box structure and also has an opening 112 facing forward, and a door panel 113 for covering the opening 112. Put the rear outer surface of body 11. In addition, a temperature control unit (not shown) may be provided in the containing body 11 to simulate the operating conditions of the capacitive elements 200 at different temperatures. Each circuit board 300 is provided with at least a part of the capacitive elements 200, and each detection connection part 13 has a plurality of detection point groups 131, and each of the detection point groups 131 corresponds to one of the capacitive elements 200, in this embodiment In the example, each detection point group 131 has four detection holes 131a, but in other implementations, the number of detection holes 131a of the detection point group 131 can also be other numbers, not the number of this embodiment. In addition, the detection holes 131a of the detection point group 131 can be replaced by other connection structures, such as detection contact points, etc., which is not limited to this embodiment.

該探測設備2包括一移動裝置21，以及一探測模組22。該移動裝置21對應於該容置設備1的該外側設置面111，該移動裝置21包括橫向地延伸的一橫向滑軌211、豎向地延伸且可橫向滑動地設置於該橫向滑軌211的一豎向滑軌212、可豎向滑動地設置於該豎向滑軌212的一滑動台213，以及設於該滑動台213且可朝該容置設備1的外側設置面111或遠離該容置設備1的外側設置面111地滑動的一滑動座214。該探測模組22包括設於該滑動座214的一探測件組221，以及與該探測件組221通過線路(圖未示)連接的一探測儀器(圖未示)。在本實施例中，每一探測件組221具有四個探測針221a，但在其他實施態樣中，所述探測針221a的數量也可以為其他數量，不以本實施例的數量為限制，另外，所述探測針221a可以被其他連接結構所取代，例如探測接觸點等等，不以本實施例為限。The detection device 2 includes a mobile device 21 and a detection module 22 . The moving device 21 corresponds to the outer setting surface 111 of the accommodating device 1, and the moving device 21 includes a horizontal sliding rail 211 extending laterally, a vertically extending horizontal sliding rail 211 A vertical slide rail 212, a slide table 213 that can be vertically slidably arranged on the vertical slide rail 212, and a slide table 213 that is arranged on the slide table 213 and can be set toward the outer surface 111 of the accommodating device 1 or away from the accommodating device 1 A sliding seat 214 that slides on the outer setting surface 111 of the device 1 . The detecting module 22 includes a detecting element set 221 disposed on the sliding base 214 , and a detecting instrument (not shown) connected to the detecting element set 221 through a circuit (not shown). In this embodiment, each detection element group 221 has four detection needles 221a, but in other implementations, the number of detection needles 221a can also be other numbers, not limited to the number of this embodiment, In addition, the detection pins 221a can be replaced by other connection structures, such as detection contact points, etc., which is not limited to this embodiment.

藉由該橫向滑軌211、該豎向滑軌212與該滑動台213之配合，讓該滑動座214能夠三軸地滑動，使該移動裝置21的滑動座214能被驅動以滑動至對應於該等探測連接部13的該等探測點組131中的任一者之處，以使該探測件組221連接於該等探測點組131中的該任一者，當連接完成後該探測模組22的探測儀器便能夠探測到該等電容元件200的運行數據。進一步來說，在上述連接過程中，是先透過該豎向滑軌212相對於該橫向滑軌211的橫向滑動及該滑動台213相對於該豎向滑軌212的豎向滑動，使該探測件組221與對應的探測點組131對準，接著再透過該滑動座214相對於該滑動台213的滑動，使該探測件組221的探測針221a***對應的探測點組131的探測孔131a，但不以此為限制。藉由該探測設備2的移動裝置21能夠減少該容置設備1與該探測設備2之間的纜線數量，以減少纜線產生的電磁干擾使該等電容元件200的運行數據失真之狀況。另外，該移動設備的該橫向滑軌211、該豎向滑軌212與該滑動台213的配合關係與整體結構僅為示例，可以了解的是，在能使該滑動座214能夠滑動至對應於該等探測連接部13的該等探測點組131中的任一者之處的前提下，該移動設備的具體結構與內部零件之間的配合關係能夠依照需求變更與調整，不應以本實施例為限制。再者，舉例來說該移動裝置21的該橫向滑軌211、該豎向滑軌212、該滑動台213與該滑動座214之間的滑動可以是透過伺服馬達(圖未示)或氣缸(圖未示)等驅動元件所驅動，但不以此為限制。Through the cooperation of the horizontal slide rail 211, the vertical slide rail 212 and the sliding table 213, the sliding seat 214 can slide in three axes, so that the sliding seat 214 of the moving device 21 can be driven to slide to the position corresponding to Any one of the detection point groups 131 of the detection connection parts 13, so that the detection part group 221 is connected to the any one of the detection point groups 131, when the connection is completed, the detection module The detecting instruments of the group 22 can detect the operation data of the capacitive elements 200 . Further, in the above-mentioned connection process, firstly, through the horizontal sliding of the vertical slide rail 212 relative to the horizontal slide rail 211 and the vertical sliding of the sliding platform 213 relative to the vertical slide rail 212, the detection Component group 221 is aligned with the corresponding detection point group 131, and then through the sliding of the sliding seat 214 relative to the sliding table 213, the detection needle 221a of the detection component group 221 is inserted into the detection hole 131a of the corresponding detection point group 131 , but not limited to. The moving device 21 of the detecting device 2 can reduce the number of cables between the accommodating device 1 and the detecting device 2 , so as to reduce the situation that the electromagnetic interference generated by the cables distorts the operating data of the capacitive elements 200 . In addition, the cooperative relationship and the overall structure of the horizontal slide rail 211, the vertical slide rail 212, and the sliding table 213 of the mobile device are only examples. It can be understood that when the sliding seat 214 can slide to the Under the premise of any one of the detection point groups 131 of the detection connection part 13, the cooperation relationship between the specific structure of the mobile device and the internal parts can be changed and adjusted according to the requirements, and should not be used in this implementation. Example is limited. Furthermore, for example, the sliding between the horizontal sliding rail 211, the vertical sliding rail 212, the sliding platform 213 and the sliding seat 214 of the mobile device 21 may be through a servo motor (not shown) or an air cylinder ( not shown in the figure) and other driving elements, but it is not limited thereto.

此外，需要說明的是，每一電容元件200與其對應的電路板300上的電路形成一電路迴路(圖未示)，對應的探測點組131的探測孔131a分別連接至該電路迴路上的四個點位，而在不同的量測需求之下，當該探測件組221連接於該等探測點組131中的該任一者時，舉例來說該四個探測針221a中也可以僅有兩個探測針221a連接到對應的探測孔131a，以使該探測件組221連接至該四個點位中的其中兩個點位。另外，該電路迴路舉例來說可以是設有一保護裝置(圖未示)，該保護裝置是由高阻抗的電阻組成。當電容元件200或是後續電路短路時，大部分的壓降將落在該保護裝置上，並藉由該保護裝置的高阻抗特性限制電流，其原理類似現今市面上的高組計，所述高組計是藉由阻抗高的電阻得到較小電流，藉此測得待測物阻值。此外，該保護裝置在啟動方面並無控制機制，基本上在設於該電路迴路後即開始發揮功能。In addition, it should be noted that each capacitive element 200 and its corresponding circuit on the circuit board 300 form a circuit loop (not shown in the figure), and the detection holes 131a of the corresponding detection point group 131 are respectively connected to four holes on the circuit loop. points, and under different measurement requirements, when the probe set 221 is connected to any one of the probe point sets 131, for example, only one of the four probe pins 221a can be The two detection pins 221a are connected to the corresponding detection holes 131a, so that the detection element set 221 is connected to two of the four points. In addition, the circuit loop may, for example, be provided with a protection device (not shown in the figure), and the protection device is composed of a high-impedance resistor. When the capacitive element 200 or the subsequent circuit is short-circuited, most of the voltage drop will fall on the protection device, and the current is limited by the high impedance characteristic of the protection device. The high-group meter uses a high-impedance resistor to obtain a small current, thereby measuring the resistance of the object to be tested. In addition, the protection device has no control mechanism in terms of activation, and basically starts to function after being installed in the circuit loop.

參閱圖1及圖4至圖6，另外，在本實施例中，該容置設備1還包括位於該外側設置面111且分別對應於該等電路板連接部12的多個第一充電連接部14，以及設於該外側設置面111且分別對應於該等第一充電連接部14的多個壓合機構15。每一壓合機構15包括設於該外側設置面111且朝遠離該外側設置面111的方向凸伸的兩個導引柱151、可滑動地設於該兩導引柱151的一壓合滑塊152、設於該外側設置面111且朝遠離該外側設置面111的方向凸伸的兩個設置柱153，以及能轉動地設置於該兩設置柱153的一凸輪件154。該壓合滑塊152包括設於該兩導引柱151的一本體152a，設於該本體152a朝向該外側設置面111處的一壓合電路板152b，以及可轉動地設於該本體152a的兩個惰輪152c。該壓合電路板152b具有用以與所述第一充電連接部14接觸的一第二充電連接部152d，需要說明的是，所述第一充電連接部14與所述第二充電連接部152d舉例來說是各自具有橫向地排列的多個電路接觸點(圖未示)，該壓合電路板152b是與一供電單元(圖未示)彼此連接，且用以供電給所述電容元件200。該凸輪件154具有位於兩端且分別對應於該兩惰輪152c的兩個凸輪結構154a，每一凸輪結構154a具有一凸部154b，以及位於該凸部154b兩端的兩個凹部154c。另外，該壓合滑塊152的本體152a與該外側設置面111之間可以是連接有一彈性元件(圖未示)。需要說明的是，雖然在本實施例中，每一電路板連接部12僅對應一個第一充電連接部14與一個壓合滑塊152的第二充電連接部152d，但在其他實施態樣中，其所對應的第一充電連接部14與壓合滑塊152的第二充電連接部152d的數量可以為兩個以上，不應以本實施例為限制。Referring to FIG. 1 and FIG. 4 to FIG. 6 , in addition, in this embodiment, the accommodating device 1 further includes a plurality of first charging connection parts located on the outer setting surface 111 and respectively corresponding to the circuit board connection parts 12 14 , and a plurality of pressing mechanisms 15 provided on the outer setting surface 111 and respectively corresponding to the first charging connection parts 14 . Each pressing mechanism 15 includes two guide columns 151 that are arranged on the outer setting surface 111 and protrude toward a direction away from the outer setting surface 111, and a pressing slide that is slidably arranged on the two guiding columns 151. The block 152 , two setting columns 153 disposed on the outer setting surface 111 and protruding away from the outer setting surface 111 , and a cam member 154 rotatably arranged on the two setting columns 153 . The pressing slider 152 includes a body 152a disposed on the two guide columns 151, a pressing circuit board 152b disposed on the body 152a facing the outer setting surface 111, and a rotatably disposed on the body 152a. Two idlers 152c. The pressed circuit board 152b has a second charging connection part 152d for contacting the first charging connection part 14. It should be noted that the first charging connection part 14 and the second charging connection part 152d For example, each has a plurality of circuit contact points arranged horizontally (not shown in the figure), the press-fit circuit board 152b is connected to a power supply unit (not shown in the figure), and is used to supply power to the capacitive element 200 . The cam member 154 has two cam structures 154a located at two ends corresponding to the two idler gears 152c respectively. Each cam structure 154a has a protrusion 154b and two recesses 154c located at two ends of the protrusion 154b. In addition, an elastic element (not shown) may be connected between the body 152a of the pressing slider 152 and the outer setting surface 111 . It should be noted that although in this embodiment, each circuit board connecting portion 12 corresponds to only one first charging connecting portion 14 and one second charging connecting portion 152d of the press-fit slider 152, in other embodiments The number of the corresponding first charging connection part 14 and the second charging connection part 152d of the pressing slider 152 may be more than two, which should not be limited by this embodiment.

該凸輪件154舉例來說能被伺服馬達(圖未示)等驅動元件所驅動，當該兩凹部154c其中一者容置對應的惰輪152c時，該彈性元件推頂該壓合滑塊152以使該第一充電連接部14與該第二充電連接部152d彼此分離，如圖5所示；當該凸部154b對準並推頂對應的惰輪152c時，該彈性元件受到壓迫，以使該第一充電連接部14與該第二充電連接部152d彼此接觸，如圖6所示。藉由該壓合機構15的凸輪件154，能使該壓合滑塊152能被驅動地朝該外側設置面111或遠離該外側設置面111地滑動，以使該第一充電連接部14與該第二充電連接部152d接觸或分離。舉例來說，當該壓合機構15的凸輪件154往復地轉動時，該第一充電連接部14與該第二充電連接部152d能間歇性地接觸及分離，並且，通過該壓合機構15還能使該第一充電連接部14與該第二充電連接部152d在不需對所述電容元件200充電的狀況下彼此分離，以確保安全性及所述電容元件200的充放電準確性。The cam member 154 can be driven by a driving element such as a servo motor (not shown), for example. When one of the two recesses 154c accommodates the corresponding idler wheel 152c, the elastic element pushes the pressing slider 152 so that the first charging connection part 14 and the second charging connection part 152d are separated from each other, as shown in FIG. Make the first charging connection part 14 and the second charging connection part 152d contact with each other, as shown in FIG. 6 . By means of the cam member 154 of the pressing mechanism 15, the pressing slider 152 can be driven to slide toward the outer setting surface 111 or away from the outer setting surface 111, so that the first charging connection part 14 is connected to the outer setting surface 111. The second charging connection part 152d is in contact with or separated from. For example, when the cam member 154 of the pressing mechanism 15 rotates reciprocally, the first charging connection part 14 and the second charging connecting part 152d can intermittently contact and separate, and, through the pressing mechanism 15 The first charging connection part 14 and the second charging connection part 152d can also be separated from each other without charging the capacitive element 200 , so as to ensure safety and accuracy of charging and discharging of the capacitive element 200 .

綜上所述，本發明電容壽命測試機100藉由能滑動至對應於該等探測連接部13的該等探測點組131中的任一者之處的該滑動座214，使設於該滑動座214的探測件組221能夠連接於該等探測點組131中的該任一者，藉此使該探測模組22能夠探測到該等電容元件200的運行數據，這種設置方式能夠減少該容置設備1與該探測設備2之間的纜線數量，以減少纜線產生的電磁干擾使該等電容元件200的運行數據失真之狀況。In summary, the capacitance life testing machine 100 of the present invention can slide to the sliding seat 214 corresponding to any one of the detection point groups 131 of the detection connection parts 13, so that the sliding seat 214 located on the sliding The detection element group 221 of the seat 214 can be connected to the any one of the detection point groups 131, thereby enabling the detection module 22 to detect the operation data of the capacitive elements 200, and this arrangement can reduce the The number of cables between the accommodating device 1 and the detection device 2 is used to reduce the condition that the electromagnetic interference generated by the cables distorts the operating data of the capacitive elements 200 .

惟以上所述者，僅為本發明之實施例而已，當不能以此限定本發明實施之範圍，凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾，皆仍屬本發明專利涵蓋之範圍內。But what is described above is only an embodiment of the present invention, and should not limit the scope of the present invention. All simple equivalent changes and modifications made according to the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of the present invention.

100:電容壽命測試機 1:容置設備 11:容置體 111:外側設置面 112:開口 113:門板 12:電路板連接部 13:探測連接部 131:探測點組 131a:探測孔 14:第一充電連接部 15:壓合機構 151:導引柱 152:壓合滑塊 152a:本體 152b:壓合電路板 152c:惰輪 152d:第二充電連接部 153:設置柱 154:凸輪件 154a:凸輪結構 154b:凸部 154c:凹部 2:探測設備 21:移動裝置 211:橫向滑軌 212:豎向滑軌 213:滑動台 214:滑動座 22:探測模組 221:探測件組 221a:探測針 200:電容元件 300:電路板 100:Capacitance life tester 1: Accommodate equipment 11:Accommodating body 111: Outer setting surface 112: opening 113: door panel 12: Circuit board connection part 13: Probe connection 131: Detection point group 131a: detection hole 14: The first charging connection part 15: Pressing mechanism 151: guide column 152: Pressing slider 152a: Ontology 152b: Lamination circuit board 152c: idler 152d: the second charging connection part 153: set column 154: cam piece 154a: Cam structure 154b: convex part 154c: concave part 2: Detection equipment 21:Mobile device 211: Horizontal slide rail 212: vertical slide rail 213: sliding table 214: sliding seat 22: Detection module 221:Detection set 221a: probe needle 200: capacitive element 300: circuit board

本發明之其他的特徵及功效，將於參照圖式的實施方式中清楚地呈現，其中： 圖1是本發明電容壽命測試機的一實施例及多個電容與多個電路板的一前視圖； 圖2是該實施例從後方觀看的一立體圖； 圖3是類似圖2的一立體圖，圖中該實施例的探測設備的滑動座滑動至對應於探測連接部的該等探測點組中的其中一者處，以使探測件組連接於所述探測點組； 圖4是圖3的一局部放大立體圖；以及 圖5及圖6是兩張剖視圖，用以說明該實施例的容置設備的壓合機構。 Other features and effects of the present invention will be clearly presented in the implementation manner with reference to the drawings, wherein: Fig. 1 is an embodiment of the capacitor life tester of the present invention and a front view of a plurality of capacitors and a plurality of circuit boards; Fig. 2 is a perspective view of this embodiment viewed from the rear; Fig. 3 is a perspective view similar to Fig. 2, in which the sliding seat of the detection device of this embodiment slides to one of the detection point groups corresponding to the detection connection part, so that the detection element group is connected to the probe point group; Fig. 4 is a partially enlarged perspective view of Fig. 3; and FIG. 5 and FIG. 6 are two cross-sectional views for illustrating the pressing mechanism of the accommodating device of this embodiment.

100:電容壽命測試機 100:Capacitance life tester

1:容置設備 1: Accommodate equipment

11:容置體 11:Accommodating body

111:外側設置面 111: Outer setting surface

13:探測連接部 13: Probe connection

131:探測點組 131: Detection point group

131a:探測孔 131a: detection hole

14:第一充電連接部 14: The first charging connection part

15:壓合機構 15: Pressing mechanism

151:導引柱 151: guide column

152:壓合滑塊 152: Pressing slider

152c:惰輪 152c: idler

153:設置柱 153: set column

154:凸輪件 154: cam piece

154a:凸輪結構 154a: Cam structure

154b:凸部 154b: convex part

154c:凹部 154c: concave part

2:探測設備 2: Detection equipment

21:移動裝置 21:Mobile device

212:豎向滑軌 212: vertical slide rail

213:滑動台 213: sliding table

214:滑動座 214: sliding seat

22:探測模組 22: Detection module

221:探測件組 221:Detection set

221a:探測針 221a: probe needle

Claims (4)

一種電容壽命測試機，適用於測試多個電容元件，該電容壽命測試機包含：一容置設備，包括具有一外側設置面的一容置體、位於該容置體內且分別適用於供多個電路板設置的多個電路板連接部，以及位於該外側設置面且分別對應於該等電路板連接部的多個探測連接部，每一電路板設置有該等電容元件中的至少一部分，每一探測連接部具有多個探測點組，該等探測點組各自對應於其中一該電容元件，其中，各該電路板是能各自設置於對應的各該電路板連接部；及一探測設備，包括一移動裝置，以及一探測模組，該移動裝置包括一滑動座，該探測模組包括設於該滑動座的一探測件組，該移動裝置的滑動座能被驅動以滑動至對應於該等探測連接部的該等探測點組中的任一者之處，以使該探測件組連接於該等探測點組中的該任一者。 A capacitor life testing machine is suitable for testing multiple capacitor components. The capacitor life testing machine includes: a housing device, including a housing body with an outer setting surface, which is located in the housing body and is respectively suitable for a plurality of A plurality of circuit board connection parts provided on the circuit board, and a plurality of detection connection parts located on the outer setting surface and respectively corresponding to the circuit board connection parts, each circuit board is provided with at least a part of the capacitive elements, each A detection connection part has a plurality of detection point groups, and each of the detection point groups corresponds to one of the capacitive elements, wherein each of the circuit boards can be respectively arranged on each corresponding circuit board connection part; and a detection device, It includes a mobile device and a detection module, the mobile device includes a sliding seat, the detection module includes a detection piece set on the sliding seat, the sliding seat of the mobile device can be driven to slide to the position corresponding to the any one of the detection point groups of the detection connection portion, so that the detection element group is connected to the any one of the detection point groups. 如請求項1所述的電容壽命測試機，其中，每一探測點組具有多個探測孔，每一探測件組具有多個探測針。 The capacitance life testing machine as claimed in claim 1, wherein each detection point group has a plurality of detection holes, and each detection element group has a plurality of detection needles. 如請求項1所述的電容壽命測試機，其中，該移動裝置還包括橫向地延伸的一橫向滑軌、豎向地延伸且可橫向滑動地設置於該橫向滑軌的一豎向滑軌，以及可豎向滑動地設置於該豎向滑軌的一滑動台，該滑動座設於該滑動台且可朝該容置設備的外側設置面或遠離該容置設備的外側設置面地滑動。 The capacitor life testing machine according to claim 1, wherein the mobile device further includes a horizontal slide rail extending horizontally, a vertical slide rail extending vertically and being slidably arranged on the horizontal slide rail, And a sliding platform vertically slidably arranged on the vertical slide rail, the sliding seat is arranged on the sliding platform and can slide toward or away from the outer setting surface of the accommodating device. 如請求項1所述的電容壽命測試機，其中，該容置設備還包括位於該外側設置面且分別對應於該等電路板連接部的多個第一充 電連接部，以及設於該外側設置面且分別對應於該等第一充電連接部的多個壓合機構，每一壓合機構包括具有一第二充電連接部的一壓合滑塊，該壓合滑塊能被驅動地朝該外側設置面或遠離該外側設置面地滑動，以使該第一充電連接部與該第二充電連接部接觸或分離。 The capacitance life testing machine according to claim 1, wherein the accommodating device further includes a plurality of first chargers located on the outer setting surface and respectively corresponding to the connecting parts of the circuit boards. The electrical connection part, and a plurality of press-fit mechanisms arranged on the outer setting surface and respectively corresponding to the first charging connection parts, each press-fit mechanism includes a press-fit slider with a second charging connection part, the The press-fit slider can be driven to slide toward the outer setting surface or away from the outer setting surface, so as to make the first charging connection part contact or separate from the second charging connection part.
TW110136014A 2021-09-28 2021-09-28 Capacitor Life Tester TWI789032B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW110136014A TWI789032B (en) 2021-09-28 2021-09-28 Capacitor Life Tester
CN202211172019.5A CN115877041A (en) 2021-09-28 2022-09-26 Capacitor life tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110136014A TWI789032B (en) 2021-09-28 2021-09-28 Capacitor Life Tester

Publications (2)

Publication Number Publication Date
TWI789032B true TWI789032B (en) 2023-01-01
TW202314254A TW202314254A (en) 2023-04-01

Family

ID=85770018

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110136014A TWI789032B (en) 2021-09-28 2021-09-28 Capacitor Life Tester

Country Status (2)

Country Link
CN (1) CN115877041A (en)
TW (1) TWI789032B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW519235U (en) * 2001-12-07 2003-01-21 Mitac Int Corp Adjustable capacitor tester
TW201948021A (en) * 2018-05-16 2019-12-16 李岳翰 Article structure capable of easily replacing capacitor and capacitor replacement warning system wherein the module can be replaced to achieve the purpose of updating the capacitor when the capacitor is damaged

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW519235U (en) * 2001-12-07 2003-01-21 Mitac Int Corp Adjustable capacitor tester
TW201948021A (en) * 2018-05-16 2019-12-16 李岳翰 Article structure capable of easily replacing capacitor and capacitor replacement warning system wherein the module can be replaced to achieve the purpose of updating the capacitor when the capacitor is damaged

Also Published As

Publication number Publication date
TW202314254A (en) 2023-04-01
CN115877041A (en) 2023-03-31

Similar Documents

Publication Publication Date Title
US5389885A (en) Expandable diaphragm test modules and connectors
US5945838A (en) Apparatus for testing circuit boards
US6822466B1 (en) Alignment/retention device for connector-less probe
TW200535426A (en) Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assemblies
CN104880658B (en) Test device for acceleration transducer
CN109828153B (en) Resistance value test fixture and test method of camera module
CN101644733B (en) Fixture for testing precise printed circuit board
CN106405274B (en) Electronic element aging testing device
TWI789032B (en) Capacitor Life Tester
JPH0520701B2 (en)
CN211741340U (en) Circuit board detection tool with self-checking device
TW201321760A (en) Printed circuit board testing device
JPH10142291A (en) Ic tester
TWM621927U (en) Capacitor service life testing machine
US20030234656A1 (en) Wireless test fixture adapter for printed circuit assembly tester
CN113109696B (en) PCB conductive hole performance test method
CN215833511U (en) A general device that bears for test of paster components and parts electrical performance
TWI765312B (en) Edge sensor and probing method using the same
US20210373089A1 (en) Testing device for determining electrical connection status
CN106841991A (en) The alignment detecting method of a kind of needle mould and circuit board, device and alignment system
CN104049114A (en) Measuring tool and measuring apparatus for electronic device
KR101981653B1 (en) PCB test apparatus
CN209372909U (en) A kind of circuit board testing device
JPH07260825A (en) Probe for measuring signal
CN109521234A (en) Flying probe tester