TWI786016B

TWI786016B - Flat panel detector detection system and flat panel detector detection method

Info

Publication number: TWI786016B
Application number: TW111115891A
Authority: TW
Inventors: 許肇驛; 陳彥宇; 黃正義
Original assignee: 友達光電股份有限公司
Priority date: 2022-04-26
Filing date: 2022-04-26
Publication date: 2022-12-01
Also published as: TW202341935A; CN115900797A

Abstract

A flat panel detector detection method, including: when a flat panel detector is illuminated by a light source, enabling a first driving circuit of the flat panel detector, and disabling a second driving circuit of the flat panel detector, wherein the first driving circuit and the second driving circuit are configured to provide a plurality of scan signals to a plurality of scan lines of a sensing panel of the flat panel detector; obtaining a first sensing image generated by the sensing panel through a reading circuit; and comparing a plurality of first luminance values of a plurality of first regions in the first sensing image to identify at least one abnormal scan line.

Description

平板感測器檢測系統及平板感測器檢測方法Flat-panel sensor detection system and flat-panel sensor detection method

本揭示內容關於一種感測光源強度以產生影像之技術，特別是關於一種檢測平板感測器之組裝是否有異常的系統與方法。The disclosure relates to a technology for sensing light intensity to generate images, and in particular to a system and method for detecting whether there is abnormality in the assembly of a flat panel sensor.

平板感測器（Flat panel Detector）是一種可利用光電轉換技術，將X光訊號轉換成電訊號，並以數位影像呈現出X光訊號強度的裝置。相較於傳統的底片，平板感測器具有更高的感測度，能夠縮短人體暴露於X光的時間，降低人體接收的輻射劑量。然而，平板感測器在組裝上若產生偏差，則產生的數位影像亦可能出現錯誤，從而影響對於數位影像的判讀結果。Flat panel detector is a device that can use photoelectric conversion technology to convert X-ray signals into electrical signals and display the X-ray signal intensity in digital images. Compared with the traditional film, the flat panel sensor has a higher sensitivity, which can shorten the time when the human body is exposed to X-rays and reduce the radiation dose received by the human body. However, if there is a deviation in the assembly of the flat panel sensor, errors may occur in the generated digital image, thereby affecting the interpretation result of the digital image.

本揭示內容係關於一種平板感測器檢測方法，包含下列步驟：在平板感測器被光源照射的情形下，致能平板感測器之第一驅動電路，且禁能平板感測器之第二驅動電路，其中第一驅動電路及第二驅動電路用以提供複數個掃描訊號至平板感測器之一感測面板的複數個掃描線；透過讀取電路，取得感測面板產生的第一感測影像；以及比對第一感測影像中複數個第一區域的複數個第一亮度值，以辨識出該些掃描線中的至少一個異常掃描線。The disclosure relates to a detection method of a flat panel sensor, comprising the following steps: when the flat panel sensor is illuminated by a light source, enabling the first drive circuit of the flat panel sensor and disabling the second drive circuit of the flat panel sensor Two driving circuits, wherein the first driving circuit and the second driving circuit are used to provide a plurality of scanning signals to a plurality of scanning lines of the sensing panel of the flat panel sensor; through the reading circuit, the first sensing panel generated is obtained sensing images; and comparing a plurality of first brightness values of a plurality of first areas in the first sensing image to identify at least one abnormal scanning line among the scanning lines.

本揭示內容還關於一種平板感測器檢測系統，包含平板感測器及處理器。平板感測器包含感測面板、第一驅動電路及第二驅動電路。感測面板具有複數條掃描線。第一驅動電路電性連接該些掃描線的複數個第一端。第二驅動電路電性連接該些掃描線的複數個第二端。處理器電性連接於平板感測器。在平板感測器被光源照射的情形下，處理器用以致能第一驅動電路，且禁能第二驅動電路，以取得第一感測影像。處理器還用以比對第一感測影像中複數個第一區域的複數個第一亮度值，以辨識出該些掃描線中的至少一個異常掃描線。The disclosure also relates to a flat panel sensor detection system, including a flat panel sensor and a processor. The flat panel sensor includes a sensing panel, a first driving circuit and a second driving circuit. The sensing panel has a plurality of scan lines. The first driving circuit is electrically connected to a plurality of first ends of the scan lines. The second driving circuit is electrically connected to a plurality of second ends of the scan lines. The processor is electrically connected to the flat panel sensor. When the flat panel sensor is illuminated by the light source, the processor is used to enable the first driving circuit and disable the second driving circuit to obtain the first sensing image. The processor is also used for comparing the plurality of first brightness values of the plurality of first areas in the first sensing image to identify at least one abnormal scanning line among the scanning lines.

本揭示內容還關於一種平板感測器檢測方法，包含下列步驟：在平板感測器之感測面板被光源照射的情形下，驅動平板感測器之第一驅動電路掃描感測面板上的複數個掃描線，以取得第一感測影像；在平板感測器被光源照射的情形下，驅動平板感測器之第二驅動電路掃描感測面板上的該些掃描線，以取得第二感測影像；以及比對第一感測影像及第二感測影像的亮度，以辨識出該些掃描線中的至少一個異常掃描線。The present disclosure also relates to a detection method of a flat panel sensor, which includes the following steps: when the sensing panel of the flat panel sensor is illuminated by a light source, driving the first driving circuit of the flat panel sensor to scan the complex numbers on the sensing panel scanning lines to obtain the first sensing image; when the flat panel sensor is illuminated by the light source, the second driving circuit driving the flat panel sensor scans the scanning lines on the sensing panel to obtain the second sensing image and comparing the brightness of the first sensing image and the second sensing image to identify at least one abnormal scanning line among the scanning lines.

據此，透過分別驅動不同的驅動電路，取得感測影像並進行亮度分析，將可精確地辨識出感測影像中的異常位置，並據以發現平板感測器上的硬體組裝錯誤。Accordingly, by separately driving different driving circuits, obtaining sensing images and performing brightness analysis, abnormal positions in the sensing images can be accurately identified, and hardware assembly errors on the flat panel sensor can be found accordingly.

以下將以圖式揭露本發明之複數個實施方式，為明確說明起見，許多實務上的細節將在以下敘述中一併說明。然而，應瞭解到，這些實務上的細節不應用以限制本發明。也就是說，在本發明部分實施方式中，這些實務上的細節是非必要的。此外，為簡化圖式起見，一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之。Several embodiments of the present invention will be disclosed in the following figures. For the sake of clarity, many practical details will be described together in the following description. It should be understood, however, that these practical details should not be used to limit the invention. That is, in some embodiments of the present invention, these practical details are unnecessary. In addition, for the sake of simplifying the drawings, some well-known structures and components will be shown in a simple and schematic manner in the drawings.

於本文中，當一元件被稱為「連接」或「耦接」時，可指「電性連接」或「電性耦接」。「連接」或「耦接」亦可用以表示二或多個元件間相互搭配操作或互動。此外，雖然本文中使用「第一」、「第二」、…等用語描述不同元件，該用語僅是用以區別以相同技術用語描述的元件或操作。除非上下文清楚指明，否則該用語並非特別指稱或暗示次序或順位，亦非用以限定本發明。Herein, when an element is referred to as "connected" or "coupled", it may mean "electrically connected" or "electrically coupled". "Connected" or "coupled" may also be used to indicate that two or more elements cooperate or interact with each other. In addition, although terms such as “first”, “second”, . Unless clearly indicated by the context, the terms do not imply any particular order or sequence, nor are they intended to be limiting of the invention.

第1A及1B圖為根據本揭示內容之部份實施例的平板感測器檢測系統之示意圖。平板感測器檢測系統包含光源裝置L、平板感測器100及處理器200。光源裝置L用以產生測試光線（如：X光），測試光線在穿過檢測物或人體後，將照射在平板感測器100上。1A and 1B are schematic diagrams of flat panel sensor inspection systems according to some embodiments of the present disclosure. The flat panel sensor detection system includes a light source device L, a flat panel sensor 100 and a processor 200 . The light source device L is used to generate test light (such as X-ray), and the test light will be irradiated on the flat panel sensor 100 after passing through the test object or human body.

平板感測器100包含第一驅動電路110、第二驅動電路120、感測面板130、讀取電路140及控制電路150。感測面板130設有多列（row）掃描線SL及多行（column）資料線DL，用以驅動感測面板130上的多個畫素單元（圖中未示）。在一實施例中，感測面板130可為薄膜電晶體影像感測面板（Thin Film Transistor image sensor panel ），其中薄膜電晶體可包含非晶矽(amorphous)、低溫多晶矽(LTPS)、氧化銦鎵鋅(IGZO)或其他，但本揭示內容並不以此為限。The flat panel sensor 100 includes a first driving circuit 110 , a second driving circuit 120 , a sensing panel 130 , a reading circuit 140 and a control circuit 150 . The sensing panel 130 is provided with a plurality of rows of scan lines SL and a plurality of columns of data lines DL for driving a plurality of pixel units (not shown in the figure) on the sensing panel 130 . In one embodiment, the sensing panel 130 may be a thin film transistor image sensor panel (Thin Film Transistor image sensor panel), wherein the thin film transistor may include amorphous silicon (amorphous), low temperature polysilicon (LTPS), indium gallium oxide Zinc (IGZO) or others, but the disclosure is not limited thereto.

如第1A圖所示，在部份實施例中，平板感測器100還包含閃爍器131（Scintillator）。閃爍器131設置於感測面板130上方，用以接收光源裝置L產生的X光，並將X光轉換為可見光訊號。感測面板130中每個畫素單元可透過光電元件（如：光電二極體）將可見光訊號轉換為電訊號，再透過電晶體輸出感測訊號。感測訊號用以反應投射到對應之畫素單元的光源強度。As shown in FIG. 1A , in some embodiments, the flat panel sensor 100 further includes a scintillator 131 (Scintillator). The scintillator 131 is disposed above the sensing panel 130 for receiving the X-rays generated by the light source device L and converting the X-rays into visible light signals. Each pixel unit in the sensing panel 130 can convert a visible light signal into an electrical signal through a photoelectric element (such as a photodiode), and then output a sensing signal through a transistor. The sensing signal is used to reflect the intensity of the light source projected to the corresponding pixel unit.

第一驅動電路110及第二驅動電路120分別設置於感測面板130的兩側，且電性連接於掃描線SL的兩端。換言之，第一驅動電路110電性連接於掃描線SL的第一端，第二驅動電路120則電性連接於掃描線SL的第二端。第一驅動電路110及第二驅動電路120可傳送掃描訊號，以依序驅動每一條掃描線SL，使感測面板130上的畫素單元根據資料線DL上的電壓及從可見光訊號轉換而成的電訊號，輸出對應的感測訊號。「掃描訊號」可為一種閘極導通（gate-on）電壓位準的閘極信號，例如閘極脈衝訊號。此一架構為「雙驅動架構」，第一驅動電路110及第二驅動電路120會提供相同的閘極脈衝訊號至同一條掃描線SL之兩端。The first driving circuit 110 and the second driving circuit 120 are respectively disposed on two sides of the sensing panel 130 and electrically connected to two ends of the scanning line SL. In other words, the first driving circuit 110 is electrically connected to the first end of the scan line SL, and the second driving circuit 120 is electrically connected to the second end of the scan line SL. The first driving circuit 110 and the second driving circuit 120 can transmit scanning signals to sequentially drive each scanning line SL, so that the pixel units on the sensing panel 130 are converted from visible light signals according to the voltage on the data line DL. The electrical signal outputs the corresponding sensing signal. The "scanning signal" may be a gate signal of a gate-on voltage level, such as a gate pulse signal. This structure is a "dual driving structure", and the first driving circuit 110 and the second driving circuit 120 will provide the same gate pulse signal to both ends of the same scanning line SL.

讀取電路140電性連接於感測面板130的資料線DL，以提供電壓至資料線，或者接收感測面板130之畫素單元產生的感測訊號。The reading circuit 140 is electrically connected to the data line DL of the sensing panel 130 to provide a voltage to the data line, or receive sensing signals generated by the pixel units of the sensing panel 130 .

控制電路150電性連接於第一驅動電路110、第二驅動電路120、感測面板130及讀取電路140，用以驅動第一驅動電路110及第二驅動電路120，並透過讀取電路140接收感測訊號。控制電路150可對所有的感測訊號進行數位化處理，以產生對應於投射在感測面板130上光強度的影像資料。由於本領域人士能理解透過閃爍器131轉換X光以產生影像的原理，故在此不另贅述。 The control circuit 150 is electrically connected to the first driving circuit 110, the second driving circuit 120, the sensing panel 130 and the reading circuit 140 for driving the first driving circuit 110 and the second driving circuit 120, and through the reading circuit 140 Receive sensing signal. The control circuit 150 can digitize all the sensing signals to generate image data corresponding to the light intensity projected on the sensing panel 130 . Since those skilled in the art can understand the principle of converting X-rays through the scintillator 131 to generate an image, no further details are given here.

處理器200電性連接於控制電路150，用以接收影像資料，以透過分析影像資料，判斷平板感測器100的各個元件組裝之間是否有異常。舉例而言，若第一驅動電路110/第二驅動電路120與感測面板130之間的壓合(bonding)製程不夠理想，則平板感測器100所產生的影像資料就會存在雜訊或錯誤圖像。 The processor 200 is electrically connected to the control circuit 150 for receiving the image data, and by analyzing the image data, it is determined whether there is any abnormality between the assembly of each component of the flat panel sensor 100 . For example, if the bonding process between the first driving circuit 110/second driving circuit 120 and the sensing panel 130 is not ideal, the image data generated by the flat panel sensor 100 will have noise or wrong image.

本揭示內容透過調整檢測方式，使得平板感測器檢測系統能精確辨識出平板感測器100是否存在硬體組裝的錯誤。第2圖所示為根據本揭示內容之部份實施例的平板感測器檢測方法的流程圖，在此根據第1及2圖說明如後。 In this disclosure, by adjusting the detection method, the flat panel sensor detection system can accurately identify whether there is a hardware assembly error in the flat panel sensor 100 . FIG. 2 is a flow chart of a flat panel sensor detection method according to some embodiments of the present disclosure, which will be described as follows based on FIGS. 1 and 2 .

在步驟S201中，光源裝置L產生測試光線(如：X光)照射感測面板130。在步驟S202中，控制電路150致能/驅動第一驅動電路110，但禁能第二驅動電路120(或維持於待命狀態)，使得第一驅動電路110依序提供掃描訊號至每一條掃描線SL。此時，第二驅動電路120並未被驅動，但第二驅動電路120仍會根據內部的偏壓，將掃描線SL維持在一個固定電壓。換言之，第一驅動電路 110提供致能電壓(即，掃描訊號)至掃描線SL的第一端，而第二驅動電路120則將掃描線SL的第二端固定於固定電壓。 In step S201 , the light source device L generates test light (such as X-ray) to irradiate the sensing panel 130 . In step S202, the control circuit 150 enables/drives the first driving circuit 110, but disables the second driving circuit 120 (or remains in a standby state), so that the first driving circuit 110 sequentially provides scanning signals to each scanning line SL. At this time, the second driving circuit 120 is not driven, but the second driving circuit 120 still maintains the scan line SL at a fixed voltage according to the internal bias voltage. In other words, the first drive circuit 110 provides an enable voltage (ie, a scan signal) to the first end of the scan line SL, and the second driving circuit 120 fixes the second end of the scan line SL to a fixed voltage.

在步驟S203中，掃描線SL輸出感測訊號至讀取電路140，控制電路150透過讀取電路140接收對應於每個畫素單元的感測訊號，並據以產生第一感測影像。 In step S203 , the scanning line SL outputs the sensing signal to the reading circuit 140 , and the control circuit 150 receives the sensing signal corresponding to each pixel unit through the reading circuit 140 and generates a first sensing image accordingly.

具體而言，請參閱第3圖所示，係平板感測器100驅動以產生影像的階段示意圖。在提供掃描訊號之前，控制電路150會先控制第一驅動電路110對該些掃描線SL輸出高電壓，再輸出低電壓，以進行重置(clean)程序P301。接著，感測面板130於暴露(exposure)程序P302中被光源照射，同時第一驅動電路110依序掃描該些掃描線SL。在經過靜置延遲(front delay)程序P303後，讀取電路140接收感測訊號，以進行讀取(Acquire)程序P304。最後，控制電路150在傳輸(data transfer)程序P305中取得感測訊號並產生第一感測影像。 Specifically, please refer to FIG. 3 , which is a schematic diagram of stages in which the flat panel sensor 100 is driven to generate images. Before providing the scanning signal, the control circuit 150 first controls the first driving circuit 110 to output a high voltage to the scanning lines SL, and then output a low voltage to perform a cleaning procedure P301. Next, the sensing panel 130 is irradiated by a light source in an exposure procedure P302 , while the first driving circuit 110 scans the scan lines SL sequentially. After the front delay procedure P303, the reading circuit 140 receives the sensing signal to perform the acquisition (Acquire) procedure P304. Finally, the control circuit 150 acquires the sensing signal and generates a first sensing image in a data transfer procedure P305.

在步驟S204中，在取得第一感測影像後，控制電路150將第一感測影像傳輸給處理器200分析。處理器200將比對第一感測影像中多個第一區域的第一亮度值，以辨識出異常亮度的區域(如：亮度與整體平均值之差異大於設定值)。第4A圖為根據本揭示內容之部份實施例的第一感測影像F1之示意圖。在一實施例中，處理器200會在第一感測影像F1上劃分出多個第一區域。例如：從感測面板130對應於第一掃描電路110的一側邊(第4A圖的左側）設定長度與寬度，以擷取多個第一區域401～404。In step S204, after obtaining the first sensing image, the control circuit 150 transmits the first sensing image to the processor 200 for analysis. The processor 200 compares the first luminance values of the plurality of first areas in the first sensing image to identify areas with abnormal luminance (eg, the difference between the luminance and the overall average value is greater than a set value). FIG. 4A is a schematic diagram of a first sensing image F1 according to some embodiments of the present disclosure. In one embodiment, the processor 200 divides a plurality of first regions on the first sensing image F1. For example: set the length and width from a side of the sensing panel 130 corresponding to the first scanning circuit 110 (the left side in FIG. 4A ), so as to capture a plurality of first regions 401 - 404 .

接著，處理器200根據每一個第一區域401～404的第一亮度，比對每個第一亮度的差異，以找出第一區域中的第一異常區域。如第4A圖所示，第一感測影像F1中的大部分區域都如同第一區域401、402般，並沒有出現圖案或線段，但第一區域403、404則分別有著黑線與白線，使得第一區域403、404的亮度會明顯異於其他第一區域（如：第一區域401、402）。因此，處理器200會將第一區域403、404設定為第一異常區域。根據第一區域403、404在第一感測影像F1中的座標或位置，處理器200將可進一步判斷出感測面板130上對應位置的掃描線SL（如：第80條掃描線）存在組裝錯誤。Next, the processor 200 compares the difference of each first brightness according to the first brightness of each first region 401 - 404 to find out the first abnormal region in the first region. As shown in FIG. 4A, most of the areas in the first sensing image F1 are the same as the first areas 401 and 402, and there are no patterns or line segments, but the first areas 403 and 404 have black lines and white lines respectively. This makes the brightness of the first regions 403 and 404 significantly different from other first regions (eg, the first regions 401 and 402 ). Therefore, the processor 200 sets the first areas 403 and 404 as the first exception area. According to the coordinates or positions of the first areas 403 and 404 in the first sensing image F1, the processor 200 can further determine that the scanning line SL (for example: the 80th scanning line) at the corresponding position on the sensing panel 130 is assembled. mistake.

前述步驟S201～S204係只驅動第一驅動電路110，以檢測異常的掃描線。在其他實施例中，為了以不同角度確認異常的掃描線，可透過步驟S205～S207，驅動第二驅動電路120來做檢測。The foregoing steps S201-S204 are to drive only the first driving circuit 110 to detect abnormal scan lines. In other embodiments, in order to confirm abnormal scan lines from different angles, the second driving circuit 120 may be driven for detection through steps S205-S207.

在步驟S205中，在光源裝置L同樣持續照射感測面板130的情況下，控制電路150致能第二驅動電路120，但禁能第一驅動電路110，使得第二驅動電路120依序提供掃描訊號至每一條掃描線SL。此時，第一驅動電路110並未被驅動，但第一驅動電路110仍會根據內部的偏壓，將掃描線SL維持在固定電壓。In step S205, when the light source device L also continues to illuminate the sensing panel 130, the control circuit 150 enables the second driving circuit 120, but disables the first driving circuit 110, so that the second driving circuit 120 sequentially provides scanning Signal to each scan line SL. At this time, the first driving circuit 110 is not driven, but the first driving circuit 110 still maintains the scan line SL at a fixed voltage according to the internal bias voltage.

在步驟S206中，掃描線SL輸出感測訊號至讀取電路140，控制電路150透過讀取電路140接收對應於每個畫素單元的感測訊號，並據以產生第二感測影像。In step S206 , the scanning line SL outputs the sensing signal to the reading circuit 140 , and the control circuit 150 receives the sensing signal corresponding to each pixel unit through the reading circuit 140 and generates a second sensing image accordingly.

在步驟S207中，在取得第二感測影像後，控制電路150將第二感測影像傳輸給處理器200分析。處理器200將比對第二感測影像中多個第二區域405～408的第二亮度值，以辨識出異常亮度的區域。如第4B圖所示，第二區域407具有白線、第二區域408具有黑線，其亮度皆與其他第二區域（如：第二區域405、406）有明顯區隔，因此處理器200可將第二區域407、408列為異常區域。相似地，處理器200可根據異常區域的座標，來判斷出異常掃描線。In step S207, after obtaining the second sensing image, the control circuit 150 transmits the second sensing image to the processor 200 for analysis. The processor 200 compares the second brightness values of the plurality of second regions 405 - 408 in the second sensing image to identify regions with abnormal brightness. As shown in FIG. 4B, the second area 407 has a white line, and the second area 408 has a black line, and their brightness is clearly separated from other second areas (such as: the second area 405, 406), so the processor 200 can The second areas 407, 408 are listed as abnormal areas. Similarly, the processor 200 can determine the abnormal scan line according to the coordinates of the abnormal area.

在步驟S208中，處理器200可比對第一感測影像及或第二感測影像的亮度，判斷出第一感測影像及/或第二感測影像中的異常區域，以辨識出異常掃描線。換言之，根據第一感測影像F1中所發現的第一異常區域，以及根據第二感測影像F2所發現的第二異常區域，處理器200可以根據第一異常區域及第二異常區域之「交集」或「聯集」的座標來判斷出異常的掃描線。In step S208, the processor 200 can compare the brightness of the first sensing image and/or the second sensing image to determine the abnormal area in the first sensing image and/or the second sensing image, so as to identify the abnormal scanning Wire. In other words, according to the first abnormal area found in the first sensing image F1 and the second abnormal area found in the second sensing image F2, the processor 200 can calculate the " The coordinates of "intersection" or "union" are used to determine abnormal scan lines.

舉例而言，如第4A及4B圖所示，在辨識出第一感測影像F1及第二感測影像F2中的第一異常區域及第二異常區域後，處理器200可判斷第一異常區域的座標是否與第二異常區域的座標相同。若第一異常區域的座標是否與第二異常區域的座標相同（如：第一區域403對應第二區域407、第一區域404對應第二區域408），則處理器200再根據第一異常區域/第二異常區域的座標推算出異常掃描線。 For example, as shown in FIGS. 4A and 4B , after recognizing the first abnormal region and the second abnormal region in the first sensing image F1 and the second sensing image F2, the processor 200 can determine the first abnormality Whether the coordinates of the region are the same as the coordinates of the second anomaly region. If the coordinates of the first abnormal area are the same as the coordinates of the second abnormal area (such as: the first area 403 corresponds to the second area 407, the first area 404 corresponds to the second area 408), then the processor 200 then according to the first abnormal area / The coordinates of the second anomaly area are used to derive the anomalous scan line.

透過分別驅動第一驅動電路110及第二驅動電路120，產生不同的感測影像，將能分別看出感測面板130不同側的清楚影像，以精確辨識出可能存在的組裝錯誤。第5A~5C圖為根據本揭示內容之部份實施例的實際檢測影像。從圖式可清楚看出，第一感測影像F1及第二感測影像F2上分別有多個亮度異常的區域ER。其中，第一感測影像F1之白線代表感測面板130對應於第一掃描電路110的側面(即，左側)具有壓合製程的錯誤。另一方面，第一感測影像F1之黑線則代表感測面板130對應於第二掃描電路120的側面(即，右側)具有壓合製程的錯誤，因為此時第二掃描電路120並未提供掃描訊號，僅將掃描線SL固定於固定電壓，因此會形成黑色線條。 By separately driving the first driving circuit 110 and the second driving circuit 120 to generate different sensing images, clear images of different sides of the sensing panel 130 can be seen respectively, so as to accurately identify possible assembly errors. 5A-5C are actual detection images according to some embodiments of the present disclosure. It can be clearly seen from the figure that there are a plurality of regions ER with abnormal brightness on the first sensing image F1 and the second sensing image F2 respectively. Wherein, the white line of the first sensing image F1 indicates that the side (ie, the left side) of the sensing panel 130 corresponding to the first scanning circuit 110 has an error in the lamination process. On the other hand, the black line of the first sensing image F1 indicates that the side (ie, the right side) of the sensing panel 130 corresponding to the second scanning circuit 120 has an error in the lamination process, because the second scanning circuit 120 is not at this time. The scanning signal is provided to only fix the scanning line SL at a constant voltage, thus forming black lines.

此外，在部份實施例中，在辨識出異常掃描線後，控制電路150還可同時致能第一驅動電路110及第二驅動電路120，以透過讀取電路取得第三感測影像。由於產生第三感測影像F3的方式與產生第一/第二感測影像的方式類似，故在此不再復述。 In addition, in some embodiments, after identifying the abnormal scanning line, the control circuit 150 can also enable the first driving circuit 110 and the second driving circuit 120 at the same time, so as to obtain the third sensing image through the reading circuit. Since the method of generating the third sensing image F3 is similar to the method of generating the first/second sensing image, it will not be repeated here.

承上，如第5C圖所示，處理器200可比對第三感測影像F3上多個第三區域的第三亮度，以找出異常亮度的異常區域(如：第5C圖中，具有垂直白線之區域ER)，進而辨識出感測面板130上具有壓合問題的異常資料線。 Continuing, as shown in FIG. 5C, the processor 200 can compare the third luminances of multiple third areas on the third sensing image F3 to find abnormal areas with abnormal brightness (such as: in FIG. 5C, with vertical The region ER of the white line), and then identify the abnormal data line on the sensing panel 130 that has a pressing problem.

具體而言，在比對第一感測影像F1/第二感測影像 F2/第三感測影像F3中多個區域的亮度，以判斷異常亮度的區域時，處理器200可計算所有區域的平均亮度，作為「判斷閾值」。若任一區域的亮度與該閾值的差異超過設定值，則即可認定為異常區域。在其他實施例中，處理器200亦可自行設定一個固定閾值為判斷閾值，與每個區域的亮度值來判斷。或者，處理器200亦可將所有區域的亮度值中的中位數作為判斷閾值，來辨識異常亮度之區域。 Specifically, comparing the first sensing image F1/second sensing image When detecting the luminance of multiple areas in F2/the third sensing image F3 to determine an area with abnormal luminance, the processor 200 may calculate the average luminance of all areas as a "judgment threshold". If the difference between the brightness of any area and the threshold value exceeds the set value, it can be identified as an abnormal area. In other embodiments, the processor 200 can also set a fixed threshold as the judgment threshold, and judge according to the brightness value of each region. Alternatively, the processor 200 may also use the median of the brightness values of all regions as the judgment threshold to identify regions with abnormal brightness.

前述實施例中，平板感測器檢測系統係由處理器200辨識異常區域及分析出異常掃描線。然而，在其他實施例中，處理器200亦可整合於平板感測器100中。或者，前述動作亦可由平板感測器100的控制電路150執行，而無須輸出至處理器200。 In the foregoing embodiments, the flat panel sensor detection system uses the processor 200 to identify abnormal areas and analyze abnormal scan lines. However, in other embodiments, the processor 200 can also be integrated in the flat panel sensor 100 . Alternatively, the aforementioned actions can also be executed by the control circuit 150 of the flat panel sensor 100 without outputting to the processor 200 .

此外，前述實施例中之平板感測器檢測方法係執行於平板感測器100之出廠檢測階段。在其他實施例中，本揭示內容之平板感測器檢測方法亦可在畫素檢測階段中執行。換言之，在執行平板感測器檢測方法時，平板感測器100上可無須設置閃爍器，且光源裝置L可直接投射可見光至感測面板130，據此，感測面板130仍能透過內部之光電元件產生對應的感測影像。換言之，業者可在執行平板感測器檢測方法，確認平板感測器100沒有壓合或其他硬體組裝問題後，再將閃爍器裝設至感測面板130上。 In addition, the inspection method of the flat panel sensor in the foregoing embodiments is implemented in the factory inspection stage of the flat panel sensor 100 . In other embodiments, the flat panel sensor detection method of the present disclosure can also be implemented in the pixel detection stage. In other words, when performing the detection method of the flat panel sensor, there is no need to install a scintillator on the flat panel sensor 100, and the light source device L can directly project visible light to the sensing panel 130. Accordingly, the sensing panel 130 can still transmit the internal light The photoelectric element generates a corresponding sensing image. In other words, the operator can install the scintillator on the sensing panel 130 after performing the flat panel sensor detection method to confirm that the flat panel sensor 100 has no pressing or other hardware assembly problems.

第6圖所示為平板感測器100在接收不同劑量(dose)的X光情況下，呈現的影像讀取數值關係圖。第6圖中，曲線趨近於飽和時(讀取數值約60000)可視為X光感測的最高劑量（100％）。如圖所示，在線性操作區LR對應的劑量中，X光劑量強度與影像讀取數值呈線性關係。雖然X光劑量越高，影像會越清楚，但也會縮短平板感測器100內的元件的使用壽命。在部份實施例中，本揭示內容之平板感測器檢測系統可控制發光裝置L投射的X光劑量（例如將X光劑量控制於50％以下），且仍能清楚辨識出異常掃描線，因此可兼顧檢測精確性與元件壽命。FIG. 6 is a diagram showing the relationship between image reading values presented by the flat panel sensor 100 when receiving X-rays of different doses. In Figure 6, when the curve is close to saturation (the reading value is about 60000), it can be regarded as the highest dose (100%) of X-ray sensing. As shown in the figure, in the dose corresponding to the linear operating region LR, the X-ray dose intensity has a linear relationship with the image reading value. Although the higher the X-ray dose, the clearer the image will be, but it will also shorten the service life of the elements in the flat panel sensor 100 . In some embodiments, the flat panel sensor detection system of the present disclosure can control the X-ray dose projected by the light emitting device L (for example, control the X-ray dose below 50%), and still clearly identify abnormal scan lines, Therefore, both detection accuracy and component life can be balanced.

前述各實施例中的各項元件、方法步驟或技術特徵，係可相互結合，而不以本揭示內容中的文字描述順序或圖式呈現順序為限。Various components, method steps or technical features in the above-mentioned embodiments can be combined with each other, and are not limited by the order of description in words or presentation in drawings in the present disclosure.

雖然本揭示內容已以實施方式揭露如上，然其並非用以限定本揭示內容，任何熟習此技藝者，在不脫離本揭示內容之精神和範圍內，當可作各種更動與潤飾，因此本揭示內容之保護範圍當視後附之申請專利範圍所界定者為準。Although the content of this disclosure has been disclosed above in terms of implementation, it is not intended to limit the content of this disclosure. Anyone who is skilled in this art can make various changes and modifications without departing from the spirit and scope of this disclosure. Therefore, this disclosure The scope of protection of the content shall be defined by the scope of the attached patent application.

L:光源裝置 100:平板感測器 110:第一驅動電路 120:第二驅動電路 130:感測面板L: light source device 100: Flat panel sensor 110: the first drive circuit 120: the second drive circuit 130: Sensing panel

131:閃爍器 131: scintillator

140:讀取電路 140: Read circuit

150:控制電路 150: control circuit

200:處理器 200: Processor

401-404:第一區域 401-404: the first area

405-408:第二區域 405-408: Second area

S201-S208:步驟 S201-S208: Steps

F1:第一感測影像 F1: The first sensing image

F2:第二感測影像 F2: Second sensing image

F3:第三感測影像 F3: The third sensing image

ER:區域 ER: area

DL:資料線 DL: data line

SL:掃描線 SL: scan line

LR:線性操作區 LR: linear operating region

P301:重置程序 P301: Reset program

P302:暴露程序 P302: Exposure procedures

P303:靜置延遲程序 P303: Standby delay program

P304:讀取程序 P304: Read program

P305:傳輸程序 P305: Transfer Procedure

第1A圖為根據本揭示內容之部份實施例之平板感測器檢測系統的示意圖。第1B圖為根據本揭示內容之部份實施例之平板感測器檢測系統的示意圖。第2圖為根據本揭示內容之部份實施例之平板感測器檢測方法的步驟流程圖。第3圖為根據本揭示內容之部份實施例之平板感測器產生感測影像的流程示意圖。第4A圖為根據本揭示內容之部份實施例之平板感測器所產生的第一感測影像示意圖。第4B圖為根據本揭示內容之部份實施例之平板感測器所產生的第二感測影像示意圖。第5A～5C圖為根據本揭示內容之部份實施例之平板感測器所產生的感測影像示意圖。第6圖為根據本揭示內容之部份實施例之平板感測器的X光劑量與影像讀取數值關係圖。 FIG. 1A is a schematic diagram of a flat panel sensor inspection system according to some embodiments of the present disclosure. FIG. 1B is a schematic diagram of a flat panel sensor inspection system according to some embodiments of the present disclosure. FIG. 2 is a flow chart of the steps of the flat panel sensor detection method according to some embodiments of the present disclosure. FIG. 3 is a schematic diagram of a process of generating a sensing image by a flat panel sensor according to some embodiments of the present disclosure. FIG. 4A is a schematic diagram of a first sensing image generated by a flat panel sensor according to some embodiments of the present disclosure. FIG. 4B is a schematic diagram of a second sensing image generated by the flat panel sensor according to some embodiments of the present disclosure. FIGS. 5A-5C are schematic diagrams of sensing images generated by the flat panel sensor according to some embodiments of the present disclosure. FIG. 6 is a graph showing the relationship between X-ray dose and image reading value of the flat panel sensor according to some embodiments of the present disclosure.

國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic deposit information (please note in order of depositor, date, and number) none Overseas storage information (please note in order of storage country, institution, date, and number) none

S201-S208:步驟 S201-S208: Steps

Claims

一種平板感測器檢測方法，包含：在一平板感測器被一光源照射的情形下，致能該平板感測器之一第一驅動電路，且禁能該平板感測器之一第二驅動電路，其中該第一驅動電路及該第二驅動電路用以提供複數個掃描訊號至該平板感測器之一感測面板的複數個掃描線；透過一讀取電路，取得該感測面板產生的一第一感測影像；以及比對該第一感測影像中複數個第一區域的複數個第一亮度值，以辨識出該些掃描線中的至少一個異常掃描線。 A detection method for a flat panel sensor, comprising: enabling a first driving circuit of the flat panel sensor and disabling a second driving circuit of the flat panel sensor when a flat panel sensor is illuminated by a light source A driving circuit, wherein the first driving circuit and the second driving circuit are used to provide a plurality of scanning signals to a plurality of scanning lines of a sensing panel of the flat panel sensor; through a reading circuit, the sensing panel is obtained A generated first sensing image; and comparing a plurality of first brightness values of a plurality of first areas in the first sensing image to identify at least one abnormal scanning line among the scanning lines.

如請求項1所述之平板感測器檢測方法，其中致能該平板感測器之該第一驅動電路，且禁能該平板感測器之該第二驅動電路的方法包含：透過被致能之該第一驅動電路，傳送至少一致能電壓至該些掃描線中至少一者的一第一端；以及透過被禁能之該第二驅動電路，將該些掃描線中該至少一者的一第二端固定於一固定電壓。 The flat panel sensor detection method as described in claim 1, wherein the method of enabling the first driving circuit of the flat panel sensor and disabling the second driving circuit of the flat panel sensor includes: The first drive circuit that is enabled transmits at least one enable voltage to a first end of at least one of the scan lines; and through the second drive circuit that is disabled, the at least one of the scan lines A second terminal of is fixed at a fixed voltage.

如請求項1所述之平板感測器檢測方法，還包含：致能該第二驅動電路，且禁能該第一驅動電路，以透過該讀取電路取得一第二感測影像；以及比對該第二感測影像中複數個第二區域的複數個第二亮度值，以辨識出該些掃描線中的該至少一個異常掃描線。 The flat panel sensor detection method as described in Claim 1, further comprising: enabling the second driving circuit, and disabling the first driving circuit, so as to obtain a second sensing image through the reading circuit; and Comparing the plurality of second brightness values of the plurality of second areas in the second sensing image to identify the at least one abnormal scan line among the scan lines.

如請求項1所述之平板感測器檢測方法，還包含：透過該感測面板中之一閃爍器，將該光源之一X光轉換為一可見光。 The detection method of the flat panel sensor according to claim 1, further comprising: converting the X-ray of the light source into a visible light through a scintillator in the sensing panel.

如請求項1所述之平板感測器檢測方法，其中比對該第一感測影像中該些第一區域的該些第一亮度值的方法包含：比對該些第一亮度值之間的差異，以找出該些第一區域中的至少一第一異常區域；取得該至少一第一異常區域在該第一感測影像中的一座標，以辨識出該至少一個異常掃描線。 The flat panel sensor detection method as described in claim 1, wherein the method for comparing the first brightness values of the first regions in the first sensing image includes: comparing the first brightness values between difference of the first regions to find at least one first abnormal region among the first regions; obtain the coordinates of the at least one first abnormal region in the first sensing image to identify the at least one abnormal scan line.

如請求項1所述之平板感測器檢測方法，還包含：同時致能該第一驅動電路及該第二驅動電路，以透過該讀取電路取得一第三感測影像；以及比對該第三感測影像中複數個第三區域的複數個第三亮度值，以辨識出該感測面板上的至少一個異常資料線。 The flat panel sensor detection method as described in claim 1, further comprising: simultaneously enabling the first driving circuit and the second driving circuit to obtain a third sensing image through the reading circuit; and comparing the The plurality of third brightness values of the plurality of third regions in the third sensing image is used to identify at least one abnormal data line on the sensing panel.

一種平板感測器檢測系統，包含：一平板感測器，包含：一感測面板，具有複數條掃描線；一第一驅動電路，電性連接該些掃描線的複數個第一端；以及一第二驅動電路，電性連接該些掃描線的複數個第二端；以及一處理器，電性連接於該平板感測器，其中在該平板感測器被一光源照射的情形下，該處理器用以致能該第一驅動電路，且禁能該第二驅動電路，以取得一第一感測影像；其中該處理器還用以比對該第一感測影像中複數個第一區域的複數個第一亮度值，以辨識出該些掃描線中的至少一個異常掃描線。 A flat panel sensor detection system comprising: A flat panel sensor includes: a sensing panel with a plurality of scanning lines; a first driving circuit electrically connected to a plurality of first ends of the scanning lines; and a second driving circuit electrically connected to the scanning lines a plurality of second ends of the scan lines; and a processor electrically connected to the flat panel sensor, wherein the processor is used to enable the first driving circuit when the flat panel sensor is illuminated by a light source , and disable the second driving circuit to obtain a first sensing image; wherein the processor is also used to compare the plurality of first brightness values of the plurality of first areas in the first sensing image to identify At least one abnormal scan line among the scan lines is displayed.

如請求項7所述之平板感測器檢測系統，其中該光源包含一X光，且該平板感測器還包含一閃爍器，該閃爍器用以將該X光轉換為一可見光。 The flat-panel sensor inspection system as described in claim 7, wherein the light source includes an X-ray, and the flat-panel sensor further includes a scintillator, and the scintillator is used to convert the X-ray into a visible light.

如請求項8所述之平板感測器檢測系統，其中該X光的劑量小於或等於50%。 The flat panel sensor inspection system as described in Claim 8, wherein the dose of the X-ray is less than or equal to 50%.

如請求項7所述之平板感測器檢測系統，其中在該處理器禁能該第二驅動電路時，該第二驅動電路用以該些掃描線的該些第二端固定於一固定電壓。 The flat panel sensor detection system as described in claim 7, wherein when the processor disables the second driving circuit, the second driving circuit is used to fix the second ends of the scanning lines at a fixed voltage .

如請求項7所述之平板感測器檢測系統，其中該處理器用以比對該些第一亮度值之間的差異，以找出該些第一區域中的至少一第一異常區域。 The flat panel sensor detection system as claimed in claim 7, wherein the processor is used to compare the difference between the first brightness values to find at least one first abnormal region in the first regions.

如請求項11所述之平板感測器檢測系統，其中該處理器還用以致能該第二驅動電路，且禁能該第一驅動電路，以取得一第二感測影像；該處理器用以根據該第一感測影像及該第二感測影像，辨識出該些掃描線中的該至少一個異常掃描線。 The flat-panel sensor inspection system as described in claim 11, wherein the processor is also used to enable the second driving circuit and disable the first driving circuit to obtain a second sensing image; the processor is used to According to the first sensing image and the second sensing image, the at least one abnormal scanning line among the scanning lines is identified.

如請求項12所述之平板感測器檢測系統，其中該處理器還用以比對該第二感測影像中複數個第二區域之複數個第二亮度值，以找出該些第二區域中的至少一第二異常區域，在該至少一第一異常區域的座標與該至少一第二異常區域的座標相同的情況下，該處理器用以根據該至少一第一異常區域的座標辨識出該至少一個異常掃描線。 The flat-panel sensor detection system as described in claim 12, wherein the processor is also used to compare a plurality of second brightness values of a plurality of second regions in the second sensing image to find out the second At least one second abnormal area in the area, if the coordinates of the at least one first abnormal area are the same as the coordinates of the at least one second abnormal area, the processor is used to identify the coordinates of the at least one first abnormal area output the at least one abnormal scan line.

一種平板感測器檢測方法，包含：在一平板感測器之一感測面板被一光源照射的情形下，驅動該平板感測器之一第一驅動電路掃描該感測面板上的複數個掃描線，以取得一第一感測影像；在該平板感測器被該光源照射的情形下，驅動該平板感測器之一第二驅動電路掃描該感測面板上的該些掃描線，以取得一第二感測影像；以及比對該第一感測影像及該第二感測影像的亮度，以辨識出該些掃描線中的至少一個異常掃描線。 A flat-panel sensor detection method, comprising: driving a first driving circuit of a flat-panel sensor to scan a plurality of scanning lines to obtain a first sensing image; when the flat panel sensor is illuminated by the light source, driving a second driving circuit of the flat panel sensor to scan the scanning lines on the sensing panel, obtaining a second sensing image; and comparing the brightness of the first sensing image and the second sensing image to identify at least one abnormal scanning line among the scanning lines.

如請求項14所述之平板感測器檢測方法，還包含：在驅動該平板感測器之該第一驅動電路時，禁能該第二驅動電路；以及在驅動該平板感測器之該第二驅動電路時，禁能該第一驅動電路。 The flat-panel sensor detection method as described in claim 14, further comprising: when driving the first driving circuit of the flat-panel sensor, disabling the second driving circuit; and when driving the flat-panel sensor When the second driving circuit is used, the first driving circuit is disabled.

如請求項14所述之平板感測器檢測方法，其中比對該第一感測影像及該第二感測影像的亮度的方法包含：取得該第一感測影像中複數個第一區域的複數個第一亮度值；比對該些第一亮度值之間的差異，以找出該些第一區域中的至少一第一異常區域；以及根據該至少一第一異常區域在該第一感測影像中的一座標，以辨識出該至少一個異常掃描線。 The flat-panel sensor detection method as described in claim 14, wherein the method of comparing the brightness of the first sensing image and the second sensing image comprises: obtaining the values of a plurality of first regions in the first sensing image a plurality of first brightness values; comparing the differences between the first brightness values to find at least one first abnormal region in the first regions; and according to the at least one first abnormal region in the first A coordinate in the image is sensed to identify the at least one abnormal scan line.

如請求項16所述之平板感測器檢測方法，其中比對該第一感測影像及該第二感測影像的亮度的方法還包含：取得該第二感測影像中複數個第二區域的複數個第二亮度值；比對該些第二亮度值之間的差異，以找出該些第二區域中的至少一第二異常區域；以及在該至少一第一異常區域的座標與該至少一第二異常區域的座標相同的情況下，根據該至少一第一異常區域的座標辨識出該至少一個異常掃描線。 The flat panel sensor detection method as described in claim 16, wherein the method of comparing the brightness of the first sensing image and the second sensing image further includes: Obtaining a plurality of second brightness values of a plurality of second regions in the second sensing image; comparing the differences between the second brightness values to find at least one second abnormal region in the second regions ; and if the coordinates of the at least one first abnormal area are the same as the coordinates of the at least one second abnormal area, identifying the at least one abnormal scan line according to the coordinates of the at least one first abnormal area.

如請求項14所述之平板感測器檢測方法，還包含：透過一光源裝置投射該光源，其中該光源包含一X光，該X光的劑量小於或等於50%。 The flat panel sensor inspection method as described in Claim 14, further comprising: projecting the light source through a light source device, wherein the light source includes an X-ray, and the dose of the X-ray is less than or equal to 50%.

如請求項18所述之平板感測器檢測方法，還包含：透過該感測面板中之一閃爍器，將該光源之該X光轉換為一可見光。 The detection method of the flat panel sensor according to claim 18, further comprising: converting the X-ray of the light source into a visible light through a scintillator in the sensing panel.

如請求項14所述之平板感測器檢測方法，還包含：同時驅動該第一驅動電路及該第二驅動電路；取得該感測面板產生的一第三感測影像；以及比對該第三感測影像中複數個第三區域的複數個第三亮度值，以辨識出該感測面板上的至少一個異常資料線。 The flat panel sensor detection method as described in claim 14, further comprising: simultaneously driving the first driving circuit and the second driving circuit; obtaining a third sensing image generated by the sensing panel; and comparing the first The plurality of third brightness values of the plurality of third areas in the three sensing images are used to identify at least one abnormal data line on the sensing panel.