TWI743851B - Pcie slot detection system - Google Patents
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一種檢測系統,尤其是指一種提供快速周邊組件互連插槽各個腳位進行檢測系統。A detection system, in particular, refers to a detection system that provides fast peripheral component interconnection sockets for each pin.
當前快速周邊組件互連插槽檢測通常是採用標準快速周邊組件互連網卡加以實現,採用標準快速周邊組件互連網卡檢測只能檢測到基本的電源特徵和標準快速周邊組件互連插槽的連接狀態,無法詳細對標準快速周邊組件互連插槽的各個角為分開檢測,也沒有輔助腳位檢測的功能,現有對於標準快速周邊組件互連插槽的檢測覆蓋率偏低。At present, rapid peripheral component interconnection slot detection is usually realized by using standard rapid peripheral component interconnection network card, and standard rapid peripheral component interconnection network card detection can only detect the basic power characteristics and the connection status of standard rapid peripheral component interconnection slot. It is impossible to separately detect the corners of the standard rapid peripheral component interconnection slot in detail, and there is no auxiliary pin detection function. The existing detection coverage rate for the standard rapid peripheral component interconnection slot is low.
綜上所述,可知先前技術中長期以來一直存在現有對標準快速周邊組件互連插槽檢測無法提供各個腳位檢測的問題,因此有必要提出改進的技術手段,來解決此一問題。In summary, it can be seen that the prior art has long been a problem that the existing standard fast peripheral component interconnection slot detection cannot provide individual pin detection. Therefore, it is necessary to propose improved technical means to solve this problem.
有鑒於先前技術存在現有對標準快速周邊組件互連插槽檢測無法提供各個腳位檢測的問題,本發明遂揭露一種快速周邊組件互連插槽檢測系統,其中:In view of the prior art problem that the existing standard rapid peripheral component interconnection slot detection cannot provide individual pin detection, the present invention discloses a rapid peripheral component interconnection slot detection system, in which:
本發明所揭露第一實施態樣的快速周邊組件互連插槽檢測系統,其包含:主機板以及檢測電路板,檢測電路板更包含:快速周邊組件互連控制晶片以及檢測邏輯控制晶片。The present invention discloses a first embodiment of the rapid peripheral component interconnection slot inspection system, which includes a main board and a test circuit board, and the test circuit board further includes: a rapid peripheral component interconnection control chip and a test logic control chip.
主機板具有中央處理器、記憶體、快速周邊組件互連(Peripheral Component Interconnect Express,PCIe)插槽,檢測程式儲存於記憶體中,中央處理器自記憶體加載並執行檢測程式以生成檢測訊號,檢測程式透過快速周邊組件互連插槽傳輸檢測訊號、第一檢測結果資訊以及第二檢測結果資訊。The motherboard has a central processing unit, a memory, and a Peripheral Component Interconnect Express (PCIe) slot. The detection program is stored in the memory. The central processing unit loads and executes the detection program from the memory to generate the detection signal. The detection program transmits the detection signal, the first detection result information, and the second detection result information through the fast peripheral component interconnection slot.
檢測電路板透過快速周邊組件互連介面插設於快速周邊組件互連插槽,檢測電路板的快速周邊組件互連控制晶片與快速周邊組件互連介面直接與透過開關形成電性連接,自快速周邊組件互連介面傳輸檢測訊號以對快速周邊組件互連插槽進行檢測並生成第一檢測結果資訊,透過快速周邊組件互連插槽傳輸第一檢測結果資訊至檢測程式;及檢測電路板的檢測邏輯控制晶片與快速周邊組件互連介面直接與透過開關形成電性連接,檢測邏輯控制晶片與快速周邊組件互連控制晶片直接與透過開關形成電性連接,自快速周邊組件互連介面傳輸檢測訊號以依據檢測訊號進行檢測控制以及進行檢測邏輯設定以對快速周邊組件互連插槽進行檢測並生成第二檢測結果資訊,透過快速周邊組件互連插槽傳輸第二檢測結果資訊至檢測程式。The test circuit board is inserted into the rapid peripheral component interconnection slot through the rapid peripheral component interconnection interface, and the rapid peripheral component interconnection control chip and the rapid peripheral component interconnection interface of the test circuit board are directly electrically connected with the switch through the switch. The peripheral component interconnection interface transmits detection signals to detect the rapid peripheral component interconnection slot and generate first test result information, and transmits the first test result information to the test program through the rapid peripheral component interconnection slot; and detects the circuit board The detection logic control chip and the fast peripheral component interconnection interface are directly electrically connected with the through switch, and the detection logic control chip and the fast peripheral component interconnection control chip are directly electrically connected with the through switch, and the detection is transmitted from the fast peripheral component interconnection interface. The signal is used to perform detection control and detection logic settings based on the detection signal to detect the fast peripheral component interconnection slot and generate second detection result information, and transmit the second detection result information to the testing program through the fast peripheral component interconnection slot.
本發明所揭露第二實施態樣的快速周邊組件互連插槽檢測系統,其包含:主機板、檢測電路板以及檢測裝置,檢測電路板更包含:快速周邊組件互連控制晶片、檢測邏輯控制晶片、第一UART轉RS-232介面晶片、第二UART轉RS-232介面晶片、快速周邊組件互連封包切換連接器以及檢測邏輯連接連接器。The second embodiment of the present invention discloses a rapid peripheral component interconnection slot detection system, which includes: a motherboard, a detection circuit board, and a detection device. The detection circuit board further includes: a rapid peripheral component interconnection control chip and a detection logic control Chip, first UART to RS-232 interface chip, second UART to RS-232 interface chip, fast peripheral component interconnection packet switching connector, and detection logic connection connector.
主機板具有快速周邊組件互連插槽,檢測電路板透過快速周邊組件互連介面插設於快速周邊組件互連插槽,檢測電路板的快速周邊組件互連控制晶片與快速周邊組件互連介面直接與透過開關形成電性連接,接收檢測訊號以對快速周邊組件互連插槽進行檢測並生成第一檢測結果資訊;檢測電路板的檢測邏輯控制晶片與快速周邊組件互連介面直接與透過開關形成電性連接,檢測邏輯控制晶片與快速周邊組件互連控制晶片直接與透過開關形成電性連接,接收檢測訊號以依據檢測訊號進行檢測控制以及進行檢測邏輯設定以對快速周邊組件互連插槽進行檢測並生成述第二檢測結果資訊;檢測電路板的快速周邊組件互連封包切換連接器與快速周邊組件互連控制晶片直接與透過第一UART轉RS-232介面晶片形成電性連接,快速周邊組件互連封包切換連接器傳輸檢測訊號至快速周邊組件互連控制晶片,快速周邊組件互連封包切換連接器對第一檢測結果資訊進行傳輸;及檢測電路板的檢測邏輯連接連接器與檢測邏輯控制晶片透過第二UART轉RS-232介面晶片形成電性連接,檢測邏輯連接連接器傳輸檢測訊號至檢測邏輯控制晶片,檢測邏輯連接連接器對第二檢測結果資訊進行傳輸。The motherboard has a fast peripheral component interconnection slot, the test circuit board is inserted into the fast peripheral component interconnection slot through the rapid peripheral component interconnection interface, and the rapid peripheral component interconnection control chip and the fast peripheral component interconnection interface of the test circuit board Directly form an electrical connection with the through switch, receive the detection signal to detect the fast peripheral component interconnection slot and generate the first detection result information; the detection logic control chip of the test circuit board and the fast peripheral component interconnect interface are directly connected with the through switch An electrical connection is formed. The detection logic control chip and the fast peripheral component interconnection control chip are directly electrically connected with the through switch. The detection signal is received to perform detection control based on the detection signal and the detection logic setting is performed to connect the fast peripheral component interconnection slot Perform inspection and generate the second inspection result information; the fast peripheral component interconnection packet switching connector of the testing circuit board and the fast peripheral component interconnection control chip directly form an electrical connection with the first UART to RS-232 interface chip, which is fast The peripheral component interconnection packet switching connector transmits the detection signal to the rapid peripheral component interconnection control chip, and the rapid peripheral component interconnection packet switching connector transmits the first inspection result information; and the inspection logic connection connector of the inspection circuit board and the inspection The logic control chip forms an electrical connection through the second UART to RS-232 interface chip, the detection logic connection connector transmits the detection signal to the detection logic control chip, and the detection logic connection connector transmits the second detection result information.
檢測裝置執行有檢測程式以生成檢測訊號,檢測裝置分別與快速周邊組件互連封包切換連接器以及檢測邏輯連接連接器形成電性連接,檢測程式分別透過快速周邊組件互連封包切換連接器以及檢測邏輯連接連接器傳輸檢測訊號,檢測程式透過快速周邊組件互連封包切換連接器傳輸第一檢測結果資訊,檢測程式透過檢測邏輯連接連接器傳輸第二檢測結果資訊。The detection device executes a detection program to generate a detection signal. The detection device forms an electrical connection with the fast peripheral component interconnection packet switching connector and the detection logic connection connector. The detection program respectively uses the fast peripheral component interconnection packet switching connector and detection The logical connection connector transmits the detection signal, the detection program transmits the first detection result information through the fast peripheral component interconnection packet switching connector, and the detection program transmits the second detection result information through the detection logical connection connector.
本發明所揭露的系統如上,與先前技術之間的差異在於快速周邊組件互連控制晶片自快速周邊組件互連介面傳輸檢測訊號以對快速周邊組件互連插槽進行檢測並生成第一檢測結果資訊,透過快速周邊組件互連插槽傳輸第一檢測結果資訊至檢測程式,檢測邏輯控制晶片自快速周邊組件互連介面傳輸檢測訊號以依據檢測訊號進行檢測控制以及進行檢測邏輯設定以對快速周邊組件互連插槽進行檢測並生成第二檢測結果資訊,透過快速周邊組件互連插槽傳輸第二檢測結果資訊至檢測程式。The system disclosed in the present invention is as above. The difference from the prior art is that the rapid peripheral component interconnection control chip transmits the detection signal from the rapid peripheral component interconnection interface to detect the rapid peripheral component interconnection slot and generate the first test result. Information, the first inspection result information is transmitted to the inspection program through the fast peripheral component interconnection slot, the inspection logic control chip transmits the inspection signal from the fast peripheral component interconnection interface to perform inspection control based on the inspection signal and the inspection logic setting to control the rapid peripheral The component interconnection slot performs detection and generates second detection result information, and transmits the second detection result information to the testing program through the fast peripheral component interconnection slot.
透過上述的技術手段,本發明可以達成快速周邊組件互連插槽腳位各別檢測的技術功效。Through the above-mentioned technical means, the present invention can achieve the technical effect of rapid peripheral component interconnection socket pin detection.
以下將配合圖式及實施例來詳細說明本發明的實施方式,藉此對本發明如何應用技術手段來解決技術問題並達成技術功效的實現過程能充分理解並據以實施。The following describes the implementation of the present invention in detail with the drawings and embodiments, so as to fully understand and implement the implementation process of how the present invention uses technical means to solve technical problems and achieve technical effects.
以下首先要說明本發明所揭露第一實施態樣的快速周邊組件互連插槽檢測系統,並請參考「第1圖」所示,「第1圖」繪示為本發明第一實施態樣快速周邊組件互連插槽檢測系統的系統方塊圖。The following first describes the rapid peripheral component interconnection slot detection system disclosed in the first embodiment of the present invention, and please refer to "Figure 1" which shows the first embodiment of the present invention. The system block diagram of the fast peripheral component interconnection slot inspection system.
本發明所揭露第一實施態樣的快速周邊組件互連插槽檢測系統,其包含:主機板10以及檢測電路板20,檢測電路板20更包含:快速周邊組件互連控制晶片21以及檢測邏輯控制晶片22。The first embodiment of the present invention discloses a rapid peripheral component interconnection slot inspection system, which includes: a
主機板10具有中央處理器11、記憶體12、快速周邊組件互連(Peripheral Component Interconnect Express,PCIe)插槽13,檢測程式儲存於記憶體12中,中央處理器11自記憶體12加載並執行檢測程式以生成檢測訊號。The
檢測電路板20透過快速周邊組件互連介面23插設於快速周邊組件互連插槽13,檢測電路板20的快速周邊組件互連控制晶片21與快速周邊組件互連介面23直接與透過開關24形成電性連接,檢測電路板20的檢測邏輯控制晶片22與快速周邊組件互連介面23直接與透過開關24形成電性連接,檢測邏輯控制晶片22與快速周邊組件互連控制晶片21直接與透過開關24形成電性連接。The
除此之外,檢測電路板20更包含:唯讀記憶體(Read-Only Memory ,ROM)25、EJTAG介面26、JLINK介面27、石英振盪器(crystal )28。In addition, the
唯讀記憶體25與快速周邊組件互連控制晶片22形成電性連接, EJTAG介面26與快速周邊組件互連控制晶片22形成電性連接,JLINK介面27與檢測邏輯控制晶片24形成電性連接,石英振盪器28透過時脈產生器(Clock)29與快速周邊組件互連控制晶片22形成電性連接,石英振盪器28與檢測邏輯控制晶片24形成電性連接。The read-
檢測程式透過快速周邊組件互連插槽13即可傳輸檢測訊號至快速周邊組件互連控制晶片21,快速周邊組件互連控制晶片21依據檢測訊號對快速周邊組件互連插槽13進行檢測並生成第一檢測結果資訊,快速周邊組件互連控制晶片21透過快速周邊組件互連插槽13傳輸第一檢測結果資訊至檢測程式。The inspection program can transmit the inspection signal to the rapid peripheral component
檢測程式透過快速周邊組件互連插槽13即可傳輸檢測訊號至檢測邏輯控制晶片22,檢測邏輯控制晶片22依據檢測訊號進行檢測控制以及進行檢測邏輯設定以對快速周邊組件互連插槽13進行檢測並生成第二檢測結果資訊,檢測邏輯控制晶片22透過快速周邊組件互連插槽13傳輸第二檢測結果資訊至檢測程式。The inspection program can transmit the inspection signal to the inspection
值得注意的是,快速周邊組件互連插槽13進行檢測包含電源腳位檢測、PCIe傳輸速度檢測、PCIe傳輸頻寬檢測、PCIe傳輸速度切換檢測、系統管理匯流排(System Management Bus,SMBus)檢測、喚醒(WAKE)檢測、JTAG檢測、PWRBRK檢測以及CLKREQ檢測。It is worth noting that the Fast Peripheral Component Interconnect
接著,以下說明本發明所揭露第二實施態樣的快速周邊組件互連插槽檢測系統,並請參考「第2圖」所示,「第2圖」繪示為本發明第二實施態樣快速周邊組件互連插槽檢測系統的系統方塊圖。Next, the following describes the rapid peripheral component interconnection slot detection system disclosed in the second embodiment of the present invention, and please refer to "Figure 2" which shows the second embodiment of the present invention. The system block diagram of the fast peripheral component interconnection slot inspection system.
本發明所揭露第二實施態樣的快速周邊組件互連插槽檢測系統,其包含:主機板10、檢測電路板20以及檢測裝置40,檢測電路板20更包含:快速周邊組件互連控制晶片21、檢測邏輯控制晶片22、第一UART轉RS-232介面晶片31、第二UART轉RS-232介面晶片32、快速周邊組件互連封包切換連接器33以及檢測邏輯連接連接器34。The second embodiment of the present invention discloses a rapid peripheral component interconnection slot detection system, which includes: a
檢測電路板20透過快速周邊組件互連介面23插設於快速周邊組件互連插槽13,檢測電路板20的快速周邊組件互連控制晶片21與快速周邊組件互連介面23直接與透過開關24形成電性連接,檢測電路板20的檢測邏輯控制晶片22與快速周邊組件互連介面23直接與透過開關24形成電性連接,檢測邏輯控制晶片22與快速周邊組件互連控制晶片21直接與透過開關24形成電性連接,檢測電路板20的快速周邊組件互連封包切換連接器33與快速周邊組件互連控制晶片21直接與透過第一UART轉RS-232介面晶片31形成電性連接,檢測電路板20的檢測邏輯連接連接器34與檢測邏輯控制晶片22透過第二UART轉RS-232介面晶片32形成電性連接。The
除此之外,檢測電路板20更包含:唯讀記憶體25、EJTAG介面26、JLINK介面27、石英振盪器28。In addition, the
唯讀記憶體25與快速周邊組件互連控制晶片22形成電性連接, EJTAG介面26與快速周邊組件互連控制晶片22形成電性連接,JLINK介面27與檢測邏輯控制晶片24形成電性連接,石英振盪器28透過時脈產生器(Clock)29與快速周邊組件互連控制晶片22形成電性連接,石英振盪器28與檢測邏輯控制晶片24形成電性連接。The read-
檢測裝置30執行有檢測程式以生成檢測訊號,檢測裝置30分別與快速周邊組件互連封包切換連接器33以及檢測邏輯連接連接器34形成電性連接,檢測程式透過UART傳輸方式透過快速周邊組件互連封包切換連接器33傳輸檢測訊號至快速周邊組件互連控制晶片21,快速周邊組件互連控制晶片21依據檢測訊號對快速周邊組件互連插槽13進行檢測並生成第一檢測結果資訊,快速周邊組件互連控制晶片21透過快速周邊組件互連封包切換連接器33對第一檢測結果資訊進行傳輸。The detection device 30 executes a detection program to generate a detection signal. The detection device 30 is respectively electrically connected with the fast peripheral component interconnection packet switching connector 33 and the detection logic connection connector 34, and the detection program is transmitted through the fast peripheral component interconnection via UART transmission. The packet switching connector 33 transmits the detection signal to the fast peripheral component
檢測程式透過UART傳輸方式透過檢測邏輯連接連接器34傳輸檢測訊號至檢測邏輯控制晶片22,檢測邏輯控制晶片22依據檢測訊號進行檢測控制以及進行檢測邏輯設定以對快速周邊組件互連插槽13進行檢測並生成第二檢測結果資訊,檢測邏輯控制晶片22透過檢測邏輯連接連接器34對第二檢測結果資訊傳輸至檢測程式。The inspection program transmits the inspection signal to the inspection
值得注意的是,快速周邊組件互連插槽13進行檢測包含電源腳位檢測、PCIe傳輸速度檢測、PCIe傳輸頻寬檢測、PCIe傳輸速度切換檢測、系統管理匯流排(System Management Bus,SMBus)檢測、喚醒(WAKE)檢測、JTAG檢測、PWRBRK檢測以及CLKREQ檢測。It is worth noting that the Fast Peripheral Component Interconnect
請參考「第3圖」所示,「第3圖」繪示為本發明快速周邊組件互連插槽檢測的電源腳位檢測示意圖。Please refer to "Figure 3". "Figure 3" is a schematic diagram of power pin detection for rapid peripheral component interconnection slot detection of the present invention.
檢測邏輯控制晶片22接收到的檢測訊號為電源腳位檢測時,檢測邏輯控制晶片22即會對快速周邊組件互連插槽13的電源腳位分別進行電壓的量測以生成第二檢測結果資訊,檢測程式會判斷第二檢測結果資訊中電源腳位所量測到的電壓是否符合PCIe所規範的電壓範圍,檢測程式即可檢測出快速周邊組件互連插槽13的電源腳位是否正常供電。When the detection signal received by the detection
檢測邏輯控制晶片22接收到的檢測訊號為電源腳位檢測時,檢測邏輯控制晶片22即會對快速周邊組件互連插槽13的電源腳位分別進行電壓的量測以生成第二檢測結果資訊,檢測程式會判斷第二檢測結果資訊中電源腳位所量測到的電壓是否符合PCIe所規範的電壓範圍,檢測程式即可檢測出快速周邊組件互連插槽13的電源腳位是否正常供電。When the detection signal received by the detection
快速周邊組件互連控制晶片21在檢測電路板20透過快速周邊組件互連介面21插設於快速周邊組件互連插槽13時偵測並將PCIe傳輸速度以及PCIe傳輸頻寬儲存於暫存器中,檢測邏輯控制晶片22自暫存器中取得PCIe傳輸速度以及PCIe傳輸頻寬以生成第二檢測結果,快速周邊組件互連控制晶片21依據檢測訊號控制PCIe傳輸速度的切換,並將PCIe傳輸速度切換後的PCIe的連接狀態生成為第一檢測結果,檢測程式即可檢測出快速周邊組件互連插槽13的PCIe傳輸速度、PCIe傳輸頻寬以及PCIe傳輸速度切換是否與PCIe的規範相符。The fast peripheral component
請參考「第4A圖」以及「第4B圖」所示,「第4A圖」繪示為本發明快速周邊組件互連插槽檢測的系統管理匯流排Master模式檢測示意圖;「第4B圖」繪示為本發明快速周邊組件互連插槽檢測的系統管理匯流排Slave模式檢測示意圖。Please refer to "Figure 4A" and "Figure 4B". "Figure 4A" is a schematic diagram of the system management bus Master mode test for rapid peripheral component interconnect slot detection of the present invention; "Figure 4B" is drawn Shown is a schematic diagram of the system management bus Slave mode detection of the rapid peripheral component interconnection slot detection of the present invention.
在系統管理匯流排的Master模式檢測中,檢測邏輯控制晶片22依據檢測訊號設定為I2C Master檢測狀態,檢測邏輯控制晶片22獲得主機板10上I2C裝置的位址,檢測邏輯控制晶片22會讀取或者寫入I2C位址空間,檢測程式根據I2C位址空間讀取或者寫入的成功與否判定SMBus的可用性。In the Master mode inspection of the system management bus, the inspection
在系統管理匯流排的Slave模式檢測中,僅能適用第一實施態樣,檢測程式訪問主機板的基板管理控制器(Baseboard Management Controller,BMC)或者是ICH上的SMBus控制器,藉由SMBus控制器訪問檢測邏輯控制晶片22所模擬的EEPROM,透過讀寫此EEPROM來驗證SMBus匯流排的可用性。In the Slave mode detection of the system management bus, only the first implementation mode can be applied. The detection program accesses the Baseboard Management Controller (BMC) of the motherboard or the SMBus controller on the ICH, which is controlled by SMBus The device accesses the EEPROM simulated by the detection
請參考「第5圖」所示,「第5圖」繪示為本發明快速周邊組件互連插槽檢測的喚醒檢測示意圖。Please refer to "Figure 5". "Figure 5" is a schematic diagram of the wake-up detection of the rapid peripheral component interconnection slot detection of the present invention.
喚醒檢測包含有IO模式和Function模式,Function模式的適應場景是主機板10透過BMC讀取喚醒狀態,或者主機板10有多於一個的PCIe插槽,並且各個PCIe插槽之間的喚醒連接在一起,由第一檢測邏輯控制晶片221發出喚醒訊號,由主機板10的BMC讀取喚醒狀態或是由第二檢測邏輯控制晶片222讀取喚醒狀態,或是由第二檢測邏輯控制晶片222發出喚醒訊號,由主機板10的BMC讀取喚醒狀態或是由第一檢測邏輯控制晶片221讀取喚醒狀態藉以進行檢測。Wake-up detection includes IO mode and Function mode. The application scenario of Function mode is that the
請參考「第6圖」所示,「第6圖」繪示為本發明快速周邊組件互連插槽檢測的IO檢測模型示意圖。Please refer to "Figure 6". "Figure 6" is a schematic diagram of the IO detection model for rapid peripheral component interconnection slot detection of the present invention.
JTAG包括TMS、TDI、TDO以及TCK,JTAG、PWRBRK以及CLKREQ的訊號都採用IO檢測模型,IO檢測模型請參考「第6圖」所示,即任意一個被檢測的腳位,檢測邏輯控制晶片22的IO連接到此腳位上時,檢測邏輯控制晶片22可以控制連接在這個腳位上的兩個電阻分別設定為上拉電阻以及下拉電阻。檢測邏輯控制晶片22透過控制上拉狀態、下拉狀態以及無上下拉狀態,同時讀取IO的狀態訊號,可以確定被檢測的腳位是H/L/NC狀態。JTAG includes TMS, TDI, TDO, and TCK. The signals of JTAG, PWRBRK, and CLKREQ all use the IO detection model. Please refer to "Figure 6" for the IO detection model. That is, any one of the detected pins, the detection
綜上所述,可知本發明與先前技術之間的差異在於快速周邊組件互連控制晶片自快速周邊組件互連介面傳輸檢測訊號以對快速周邊組件互連插槽進行檢測並生成第一檢測結果資訊,透過快速周邊組件互連插槽傳輸第一檢測結果資訊至檢測程式,檢測邏輯控制晶片自快速周邊組件互連介面傳輸檢測訊號以依據檢測訊號進行檢測控制以及進行檢測邏輯設定以對快速周邊組件互連插槽進行檢測並生成第二檢測結果資訊,透過快速周邊組件互連插槽傳輸第二檢測結果資訊至檢測程式。In summary, it can be seen that the difference between the present invention and the prior art is that the rapid peripheral component interconnection control chip transmits the detection signal from the rapid peripheral component interconnection interface to detect the rapid peripheral component interconnection slot and generate the first inspection result. Information, the first inspection result information is transmitted to the inspection program through the fast peripheral component interconnection slot, the inspection logic control chip transmits the inspection signal from the fast peripheral component interconnection interface to perform inspection control based on the inspection signal and the inspection logic setting to control the rapid peripheral The component interconnection slot performs detection and generates second detection result information, and transmits the second detection result information to the testing program through the fast peripheral component interconnection slot.
藉由此一技術手段可以來解決先前技術所存在現有對標準快速周邊組件互連插槽檢測無法提供各個腳位檢測的問題,進而達成快速周邊組件互連插槽腳位各別檢測的技術功效。This technical method can solve the problem that the existing standard rapid peripheral component interconnection socket detection cannot provide individual pin detection in the existing technology, and then achieve the technical effect of the rapid peripheral component interconnection socket pin detection technology. .
雖然本發明所揭露的實施方式如上,惟所述的內容並非用以直接限定本發明的專利保護範圍。任何本發明所屬技術領域中具有通常知識者,在不脫離本發明所揭露的精神和範圍的前提下,可以在實施的形式上及細節上作些許的更動。本發明的專利保護範圍,仍須以所附的申請專利範圍所界定者為準。Although the embodiments disclosed in the present invention are as described above, the content described is not intended to directly limit the scope of patent protection of the present invention. Anyone with ordinary knowledge in the technical field to which the present invention belongs can make slight changes in the implementation form and details without departing from the spirit and scope disclosed by the present invention. The scope of patent protection of the present invention shall still be subject to those defined by the scope of the attached patent application.
10:主機板 11:中央處理器 12:記憶體 13:快速周邊組件互連插槽 20:檢測電路板 21:快速周邊組件互連控制晶片 22:檢測邏輯控制晶片 221:第一檢測邏輯控制晶片 222:第二檢測邏輯控制晶片 23:快速周邊組件互連介面 24:開關 25:唯讀記憶體 26:EJTAG介面 27:JLINK介面 28:石英振盪器 29:時脈產生器 31:第一UART轉RS-232介面晶片 32:第二UART轉RS-232介面晶片 33:快速周邊組件互連封包切換連接器 34:檢測邏輯連接連接器 10: Motherboard 11: Central Processing Unit 12: Memory 13: Fast peripheral component interconnection slot 20: Test the circuit board 21: Fast peripheral component interconnection control chip 22: Inspection logic control chip 221: The first detection logic control chip 222: The second detection logic control chip 23: Fast peripheral component interconnection interface 24: switch 25: Read-only memory 26: EJTAG interface 27: JLINK interface 28: Quartz oscillator 29: Clock generator 31: The first UART to RS-232 interface chip 32: The second UART to RS-232 interface chip 33: Fast peripheral component interconnection packet switching connector 34: Detect logical connection connector
第1圖繪示為本發明第一實施態樣快速周邊組件互連插槽檢測系統的系統方塊圖。 第2圖繪示為本發明第二實施態樣快速周邊組件互連插槽檢測系統的系統方塊圖。 第3圖繪示為本發明快速周邊組件互連插槽檢測的電源腳位檢測示意圖。 第4A圖繪示為本發明快速周邊組件互連插槽檢測的系統管理匯流排Master模式檢測示意圖。 第4B圖繪示為本發明快速周邊組件互連插槽檢測的系統管理匯流排Slave模式檢測示意圖。 第5圖繪示為本發明快速周邊組件互連插槽檢測的喚醒檢測示意圖。 第6圖繪示為本發明快速周邊組件互連插槽檢測的IO檢測模型示意圖。 FIG. 1 is a system block diagram of the rapid peripheral component interconnection slot detection system according to the first embodiment of the present invention. FIG. 2 is a system block diagram of the rapid peripheral component interconnection slot detection system according to the second embodiment of the present invention. FIG. 3 is a schematic diagram of power pin detection for rapid peripheral component interconnection slot detection of the present invention. FIG. 4A is a schematic diagram of the system management bus Master mode detection of the rapid peripheral component interconnection slot detection of the present invention. FIG. 4B is a schematic diagram of the system management bus Slave mode detection of the rapid peripheral component interconnection slot detection of the present invention. FIG. 5 is a schematic diagram of wake-up detection for rapid peripheral component interconnection slot detection of the present invention. Figure 6 is a schematic diagram of the IO detection model for rapid peripheral component interconnection slot detection of the present invention.
10:主機板 10: Motherboard
11:中央處理器 11: Central Processing Unit
12:記憶體 12: Memory
13:快速周邊組件互連插槽 13: Fast peripheral component interconnection slot
20:檢測電路板 20: Test the circuit board
21:快速周邊組件互連控制晶片 21: Fast peripheral component interconnection control chip
22:檢測邏輯控制晶片 22: Inspection logic control chip
23:快速周邊組件互連介面 23: Fast peripheral component interconnection interface
24:開關 24: switch
25:唯讀記憶體 25: Read-only memory
26:EJTAG介面 26: EJTAG interface
24:JLINK介面 24: JLINK interface
28:石英振盪器 28: Quartz oscillator
29:時脈產生器 29: Clock generator
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