TWI741432B

TWI741432B - Radio frequency electronic component test device and its application test equipment

Info

Publication number: TWI741432B
Application number: TW108144561A
Authority: TW
Inventors: 謝旼達
Original assignee: 鴻勁精密股份有限公司
Priority date: 2019-12-05
Filing date: 2019-12-05
Publication date: 2021-10-01
Also published as: TW202122812A

Abstract

一種射頻電子元件測試裝置，包含第一平台、第二平台、天線測試器及電性測試器，該第一平台係供裝配至少一天線測試器，天線測試器之作業軸線係位於預設指向，以供接收射頻電子元件之天線所傳輸的無線訊號，第二平台係供裝配至少一電性測試器，電性測試器係設有至少一接合部件，接合部件供電性連接至少一位於測試工位之射頻電子元件，測試工位與天線測試器間不具有訊號干擾件，使射頻電子元件之天線於測試工位對預設指向發出波束而進行無線訊號測試作業，以及電性測試器對射頻電子元件執行電性測試作業，達到提升測試效能之實用效益。A radio frequency electronic component testing device includes a first platform, a second platform, an antenna tester, and an electrical tester. The first platform is for assembling at least one antenna tester, and the working axis of the antenna tester is in a preset direction. For receiving the wireless signal transmitted by the antenna of the radio frequency electronic component, the second platform is for assembling at least one electrical tester. The electrical tester is provided with at least one joint component, and at least one of the joint components is electrically connected to the testing station. There is no signal interference between the test station and the antenna tester of the radio frequency electronic components, so that the antenna of the radio frequency electronic component emits a beam to the preset direction at the test station to perform wireless signal testing operations, and the electrical tester performs the radio signal test operation. The components perform electrical test operations to achieve practical benefits of improving test performance.

Description

射頻電子元件測試裝置及其應用之測試設備Radio frequency electronic component test device and its application test equipment

本發明係提供一種測試具天線之射頻電子元件的測試裝置。The invention provides a testing device for testing radio frequency electronic components with antennas.

在現今，行動通訊區域無線網路系統、無線通訊區域網路系統或藍芽無線個人網路系統等，在為了增加資料傳輸速度的需求下，一內建有複數個天線之射頻電子元件即為前述通訊系統之重要應用；天線的發射場型依應用場所而有不同，例如偶極天線具有全指向性發射場型，應用於終端設備，使終端設備可接收不同指向之波束所傳輸的無線訊號；例如無線網路接取器之天線，則需要能夠產生特定指向(如0°或45°或30°指向)的發射場型，而接收特定位置之設備所發出的無線訊號。目前射頻電子元件係於一面設置複數個接點，並於至少一面設置複數個陣列排列之天線，利用調節各天線的相位及波束成形技術，進而調整發射場型，亦即使天線陣列於特定指向的發射/接收無線訊號一致地疊加，進而產生最佳發射／接收之波束；因此，如何測試射頻電子元件之天線對於不同指向的無線訊號傳輸效能，而淘汰出不良品，即為業者研發之標的。Nowadays, in order to increase the data transmission speed of mobile communication area wireless network system, wireless communication area network system or Bluetooth wireless personal network system, etc., a radio frequency electronic component with multiple built-in antennas is The important application of the aforementioned communication system; the antenna's transmitting field type varies according to the application site. For example, the dipole antenna has an omnidirectional transmitting field type, which is applied to terminal equipment, so that the terminal equipment can receive wireless signals transmitted by beams of different directions. ; Such as the antenna of a wireless network access device , You need to be able to generate a specific directional (such as 0° or 45° or 30° directional) of the transmitting field type, and receive the wireless signal sent by the device at a specific location. At present, radio frequency electronic components are equipped with multiple contacts on one side and multiple antennas arranged in an array on at least one side. The phase of each antenna and beamforming technology are used to adjust the transmission field pattern, even if the antenna array is in a specific direction. Transmitting/receiving wireless signals are superimposed uniformly to produce the best transmitting/receiving beam; therefore, how to test the transmission performance of radio frequency electronic component antennas for wireless signal transmission in different directions and eliminate defective products is the target of the industry's research and development.

本發明之目的一，係提供一種射頻電子元件測試裝置，包含第一平台、第二平台、天線測試器及電性測試器，該第一平台係供裝配至少一天線測試器，天線測試器之作業軸線係位於預設指向，以供接收射頻電子元件之天線所傳輸的無線訊號，第二平台係供裝配至少一電性測試器，電性測試器係設有至少一接合部件，接合部件供電性連接至少一位於測試工位之射頻電子元件，測試工位與天線測試器間不具有訊號干擾件，使射頻電子元件之天線於測試工位對預設指向發出波束而進行無線訊號測試作業，以及電性測試器對射頻電子元件執行電性測試作業，達到提升測試效能之實用效益。The first object of the present invention is to provide a radio frequency electronic component test device, including a first platform, a second platform, an antenna tester and an electrical tester. The first platform is for assembling at least one antenna tester. The working axis is located in a preset direction for receiving the wireless signal transmitted by the antenna of the radio frequency electronic component. The second platform is used for assembling at least one electrical tester. The electrical tester is provided with at least one joint component for power supply. Sexually connect at least one radio frequency electronic component at the test station , There is no signal interference between the test station and the antenna tester, so that the antenna of the radio frequency electronic component emits a beam to the preset direction at the test station to perform wireless signal testing operations, and the electrical tester performs electrical properties on the radio frequency electronic components The test operation achieves the practical benefit of improving the test performance.

本發明之目的二，係提供一種射頻電子元件測試裝置，其中，該第一平台係設於第一調整器，第一調整器可視射頻電子元件之不同待測指向，而驅動調整第一平台及裝配於上之天線測試器的擺置位置或角度，使天線測試器可便利測試不同指向之射頻電子元件，進而有效縮減天線測試器之配置數量，達到節省天線測試器成本之實用效益。The second objective of the present invention is to provide a radio frequency electronic component testing device, wherein the The first platform is set on the first adjuster. The first adjuster can drive and adjust the placement position or angle of the first platform and the antenna tester installed on it according to the different directions of the radio frequency electronic components to be tested, so that the antenna tester It is convenient to test radio frequency electronic components of different directions, thereby effectively reducing the number of antenna tester configurations , To achieve the practical benefit of saving the cost of antenna tester.

本發明之目的三，係提供一種射頻電子元件測試裝置，其中，該第二平台係設於第二調整器，第二調整器可視射頻電子元件之不同待測指向，而驅動調整第二平台及裝配於上之電性測試器的擺置位置或角度，使電性測試器上之射頻電子元件可調整擺置位置及角度，以利於測試不同指向之射頻電子元件，進而有效縮減天線測試器之配置數量，達到節省天線測試器成本之實用效益。The third objective of the present invention is to provide a radio frequency electronic component testing device, wherein the The second platform is set on the second adjuster. The second adjuster can drive and adjust the placement position or angle of the second platform and the electrical tester mounted on the The position and angle of the radio frequency electronic components on the tester can be adjusted to facilitate the testing of radio frequency electronic components of different orientations, thereby effectively reducing the number of antenna tester configurations and achieving practical benefits of saving the cost of the antenna tester.

本發明之目的四，係提供一種射頻電子元件測試裝置，其中，更包含至少一移載器，以於預設測試工位移入／移出射頻電子元件，達到提升移載便利性之實用效益。The fourth object of the present invention is to provide a radio frequency electronic component testing device, which further includes at least one transfer device to enter/remove the radio frequency electronic component in a preset test work position, so as to achieve the practical benefit of improving the convenience of transfer.

本發明之目的五，係提供一種應用射頻電子元件測試裝置之測試設備，包含機台、供料裝置、收料裝置、本發明測試裝置、輸送裝置及中央控制裝置；供料裝置係配置於機台上，並設有至少一容納待測射頻電子元件之供料承置器；收料裝置係配置於機台上，並設有至少一容納已測射頻電子元件之收料承置器；本發明測試裝置係配置於機台上，包含第一平台、第二平台、天線測試器及電性測試器，以測試具天線之射頻電子元件；輸送裝置係配置於機台上，並設有至少一輸送器，用以輸送射頻電子元件；中央控制裝置係用以控制及整合各裝置作動，以執行自動化作業，達到提升作業效能之實用效益。The fifth object of the present invention is to provide a test equipment using radio frequency electronic component test equipment, including a machine, a feeding device, a receiving device, the test device of the present invention, a conveying device, and a central control device; the feeding device is configured in the machine The stage is equipped with at least one feeding holder for accommodating the radio frequency electronic components to be tested; the receiving device is arranged on the machine table and is equipped with at least one receiving holder for accommodating the tested radio frequency electronic components; The test device of the invention is configured on the machine platform, including a first platform, a second platform, an antenna tester, and an electrical tester to test radio frequency electronic components with an antenna; the conveying device is configured on the machine platform and is provided with at least A conveyor is used to transport radio frequency electronic components; the central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operational performance.

為使　貴審查委員對本發明作更進一步之瞭解，茲舉一較佳實施例並配合圖式，詳述如后。In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the drawings, and the details are as follows.

請參閱第1圖，係本發明測試裝置10之第一實施例，測試裝置10包含第一平台11、第二平台12、天線測試器13及電性測試器14，更包含移載器15。Please refer to FIG. 1, which is the first embodiment of the test device 10 of the present invention. The test device 10 includes a first platform 11, a second platform 12, an antenna tester 13 and an electrical tester 14, and further includes a transfer device 15.

該第一平台11係供裝配至少一天線測試器13，更進一步，第一平台11可為至少一面板、端部、架體或座體，或者以連接天線測試器13之相關元件的一部位作為第一平台11，第一平台11之型式只要可供裝配天線測試器13均可，例如當第一平台11包含複數個不同位置之面板時，可供裝配複數個不同位置之天線測試器13，易言之，第一平台11可為機台之台板、調整器之承裝部件、測試室之面板、箱罩之面板、移載器之承裝部件、載具之承裝部件或承座之架板等，載具可為轉動具、線性驅動源（如作動臂、滑軌組或螺桿螺座組等）或包含箱罩及可驅動箱罩位移之驅動源，移載器包含作業治具及可驅動作業治具位移之另一驅動源，第一平台11可為固定式或活動式，活動式之第一平台11可作至少一方向位移或作角度轉動，亦或作至少一方向位移及角度轉動；例如當第一平台11為機台之台板、測試室之面板或承座之架板時，係可使天線測試器13固定於預設位置；例如當第一平台11為調整器之承裝部件時，係帶動天線測試器13作角度轉動而調整擺置角度或作至少一方向位移而變換擺置位置；例如當第一平台11為移載臂之承裝部件時，係可帶動天線測試器13作至少一方向位移；例如當第一平台11為載具之承裝部件時，係可帶動天線測試器13作線性位移或旋轉位移；於本實施例中，第一平台11係為固定式配置，並位於第二平台12之上方，以供裝配天線測試器13。The first platform 11 is for assembling at least one antenna tester 13. Furthermore, the first platform 11 can be at least one panel, end, frame or base, or a part of the antenna tester 13 connected to related components As the first platform 11, the type of the first platform 11 can be used as long as the antenna tester 13 can be assembled. For example, when the first platform 11 includes a plurality of panels in different positions, it can be equipped with a plurality of antenna testers 13 in different positions. In other words, the first platform 11 can be the platform of the machine and the supporting part of the adjuster. , The panel of the test room, the panel of the box cover, the supporting part of the transfer device, the supporting part of the carrier or the frame plate of the holder, etc. The carrier can be a rotating tool, a linear drive source (such as an actuator, a slide rail) Group or screw seat group, etc.) or include the box cover and the driving source that can drive the displacement of the box cover, the transfer device includes the work fixture and another drive source that can drive the displacement of the work fixture, the first platform 11 can be a fixed type Or movable, the movable first platform 11 can be displaced or rotated in at least one direction, or can be displaced and rotated in at least one direction; for example, when the first platform 11 is a table of a machine, a panel of a test room Or the support plate, the antenna tester 13 can be fixed at the preset position; for example, when the first platform 11 is the supporting part of the adjuster, the antenna tester 13 is driven to rotate and adjust the placement angle Or make at least one direction displacement to change the placement position; for example, when the first platform 11 is the carrying part of the transfer arm, the antenna tester 13 can be driven to move in at least one direction; for example, when the first platform 11 is a carrier When the component is mounted, the antenna tester 13 can be driven to perform linear displacement or rotational displacement; in this embodiment, the first platform 11 is a fixed configuration and is located above the second platform 12 for assembly antenna testing器13.

該第二平台12係供裝配至少一電性測試器14，更進一步，第二平台12可為至少一面板、端部、架體或座體，亦或以連接電性測試器14之相關元件的一部位作為第二平台12，第二平台12之型態只要可供裝配電性測試器14均可，易言之，第二平台12可為機台之台板、調整器之承裝部件、測試室之面板、移載臂之承裝部件、載具之承裝部件或承座之架板等，載具可為轉動具、線性驅動源（如作動臂、滑軌組或螺桿螺座組等）或包含箱罩及可驅動箱罩位移之驅動源，移載器包含作業治具及可驅動作業治具位移之另一驅動源，第二平台12可為固定式或活動式，活動式之第二平台12可作至少一方向位移或作角度轉動，亦或作至少一方向位移及角度轉動；例如當第二平台12為機台之台板、測試室之面板或承座之架板時，係可使電性測試器14固定於預設位置；例如當第二平台12為調整器之承裝部件時，係可帶動電性測試器14作角度轉動而調整擺置角度或作至少一方向位移而變換擺置位置；例如當第二平台12為移載臂之承裝部件時，係可帶動電性測試器14作至少一方向位移；例如當第二平台12為載具之承裝部件時，係可帶動電性測試器14作線性位移或旋轉位移；又該第二平台12於相對第一平台11時，可於二者間形成一測試通道，以供射頻電子元件30傳輸無線訊號：再者，第二平台12與第一平台11可設於同一或不同物件，例如第一平台11與第二平台12可設於同一測試室或移料臂，使天線測試器13及電性測試器14位於同一測試室或移料臂；於本實施例中，第二平台12係為固定式配置，並位於第一平台11之下方，以供裝配電性測試器14。The second platform 12 is for assembling at least one electrical tester 14. Furthermore, the second platform 12 can be at least one panel, an end, a frame or a base, or it can be connected to related components of the electrical tester 14. The second platform 12 can be used as the second platform 12, as long as the second platform 12 can be equipped with the electrical tester 14. In other words, the second platform 12 can be the platform of the machine and the mounting part of the adjuster. , The panel of the test room , The supporting part of the transfer arm, the supporting part of the carrier or the frame plate of the bearing, etc. The carrier can be a rotating tool, a linear drive source (such as an actuator arm, a slide rail set or a screw and screw seat set, etc.) or include The box cover and the driving source that can drive the displacement of the box cover. The transfer device includes a work fixture and another drive source that can drive the displacement of the work fixture. The second platform 12 can be a fixed or movable second platform. 12 can be displaced in at least one direction or angle, or at least in one direction and angle; for example, when the second platform 12 is the table of the machine, the panel of the test room, or the frame of the bearing, it can be The electrical tester 14 is fixed at a preset position; for example, when the second platform 12 is the supporting part of the adjuster, the electrical tester 14 can be driven to rotate angularly to adjust the placement angle or make at least one direction displacement. Change the placement position; for example, when the second platform 12 is the supporting part of the transfer arm, the electrical tester 14 can be driven to move in at least one direction; for example, when the second platform 12 is the supporting part of the carrier, It can drive the electrical tester 14 to perform linear displacement or rotational displacement; and when the second platform 12 is relative to the first platform 11, a test channel can be formed between the two for the radio frequency electronic component 30 to transmit wireless signals: Furthermore, the second platform 12 and the first platform 11 can be set on the same or different objects. For example, the first platform 11 and the second platform 12 can be set in the same test room or moving arm, so that the antenna tester 13 and the electrical tester 14 is located in the same test room or material moving arm; in this embodiment, the second platform 12 is a fixed configuration and is located below the first platform 11 for assembling the electrical tester 14.

該天線測試器13係裝配於第一平台11，並設有至少一訊號作業件131，以供射頻電子元件30執行無線訊號測試作業，例如天線測試器13對射頻電子元件30執行接收無線訊號之作業，例如天線測試器13對射頻電子元件30執行發射無線訊號之作業，例如天線測試器13對射頻電子元件30作接收及發射無線訊號之作業，又天線測試器13可連接一獨立之處理器（圖未示出），以將接收射頻電子元件30的無線訊號傳輸至處理器，或者將處理器之測試用的無線訊號發射至射頻電子元件30，該處理器亦可為中央控制裝置（圖未示出）之處理器；再者，天線測試器13之訊號作業件131的作業軸線L角度係相同或偏近於射頻電子元件30之待測指向（如0°或45°或30°指向），以使天線測試器13接收射頻電子元件30之待測指向所發出波束的無線訊號，或朝向射頻電子元件30之待測指向發出測試用的無線訊號，測試裝置10可依測試作業所需而變換天線測試器13之配置數量及配置位置，例如測試單一指向之無線訊號時，可配置單一天線測試器13，例如測試不同指向之無線訊號時，可於複數個位置配置複數個天線測試器13；於本實施例中，該天線測試器13係裝配於第一平台11，天線測試器13之訊號作業件131的作業軸線L係位於0°指向，以供接收射頻電子元件30所發出之無線訊號，並將接收之無線訊號傳輸至中央控制裝置之處理器，以供處理器作一分析，而判別射頻電子元件30之待測指向的波束所發出的無線訊號強度是否符合標準。The antenna tester 13 is assembled on the first platform 11 and is provided with at least one signal work piece 131 for the radio frequency electronic component 30 to perform wireless signal testing operations. For example, the antenna tester 13 performs wireless signal reception on the radio frequency electronic component 30 For example, the antenna tester 13 performs the operation of transmitting wireless signals to the radio frequency electronic component 30, for example, the antenna tester 13 performs the operation of receiving and transmitting wireless signals to the radio frequency electronic component 30, and the antenna tester 13 can be connected to an independent processor (Not shown in the figure), in order to transmit the wireless signal of the receiving radio frequency electronic component 30 to the processor, or transmit the wireless signal for testing of the processor to the radio frequency electronic component 30, the processor can also be a central control device (figure (Not shown) processor; furthermore, the angle of the operating axis L of the signal work piece 131 of the antenna tester 13 is the same or close to the direction to be measured of the radio frequency electronic component 30 (such as 0° or 45° or 30° ), so that the antenna tester 13 can receive the wireless signal of the beam emitted from the direction to be tested of the radio frequency electronic component 30, or send out the wireless signal for testing toward the direction to be tested of the radio frequency electronic component 30. The test device 10 can be required for the test operation The number and position of the antenna tester 13 are changed. For example, when testing a single-point wireless signal, a single antenna tester 13 can be configured. For example, when testing a wireless signal with different directions, multiple antenna testers can be placed at multiple locations. 13; In this embodiment, the antenna tester 13 is assembled on the first platform 11, and the operating axis L of the signal work piece 131 of the antenna tester 13 is located at 0°, for receiving the radio frequency electronic components 30 The wireless signal and the received wireless signal are transmitted to the processor of the central control device for analysis by the processor to determine whether the strength of the wireless signal emitted by the beam to be measured of the radio frequency electronic component 30 meets the standard.

該電性測試器14係裝配於第二平台12，並設有電性連接之電路板141及至少一接合部件142，接合部件142供電性連接至少一位於測試工位之射頻電子元件30，測試工位與天線測試器13間不具有訊號干擾件，使射頻電子元件30之天線於測試工位對預設指向發出波束而進行無線訊號測試作業，以及電性測試器14對射頻電子元件30執行電性測試作業；更進一步，電性測試器14包含電路板141、至少一接合部件142及承置部件143，承置部件143供承置射頻電子元件30，接合部件142之一端電性連接電路板141，另一端則供電性連接射頻電子元件30，該承置部件143可為獨立座體或為載具之承置部，其型式只需供承置射頻電子元件30均可而不受限，又該測試工位係為預設射頻電子元件30執行測試作業之位置，測試工位可位於電性測試器14、載具、移載器或承座等，依不同測試作業需求而定，不受限於本實施例，該測試工位與天線測試器13間不具有訊號干擾件(如金屬件或導電件)，以避免無線訊號於傳輸過程損耗；於本實施例中，電性測試器14係裝配於第二平台12，並包含電路板141、複數個接合部件142及承置部件143，更包含至少一定位部件144，以供定位該射頻電子元件30，定位部件144可為夾具或抽氣孔，以夾持或吸附射頻電子元件30定位，該電路板141係承置承置部件143，承置部件143係穿置複數個接合部件142 ，複數個接合部件142之一端係電性連接電路板141，另一端則供電性連接射頻電子元件30，另於承置部件143之內部設有複數個為抽氣孔之定位部件144，定位部件144連接一抽氣設備（圖未示出），以便吸附或釋放射頻電子元件30，該測試工位即為承置部件143處，以供射頻電子元件30執行測試作業，換言之，承置部件143至天線測試器13間之傳輸路徑不具有訊號干擾件。The electrical tester 14 is assembled on the second platform 12, and is provided with an electrical circuit board 141 and at least one joining component 142. The joining component 142 is electrically connected to at least one radio frequency electronic component 30 at the testing station, and tests There is no signal interference between the station and the antenna tester 13, so that the antenna of the radio frequency electronic component 30 emits a beam to the preset direction at the test station for wireless signal testing, and the electrical tester 14 performs the radio frequency electronic component 30 Electrical testing operations; further, the electrical tester 14 includes a circuit board 141, at least one joining component 142, and a supporting component 143, the supporting component 143 is used to hold the radio frequency electronic component 30, and one end of the joining component 142 is electrically connected to the circuit The other end of the board 141 is electrically connected to the radio frequency electronic component 30. The supporting member 143 can be an independent base or a supporting part of the carrier. , And the test station is a preset position where the radio frequency electronic component 30 performs the test operation. The test station can be located at the electrical tester 14, the carrier, the transfer device or the socket, etc., depending on the requirements of different test operations. Without being limited to this embodiment, there is no signal interference component (such as metal or conductive component) between the test station and the antenna tester 13 to avoid loss of wireless signals during the transmission process; in this embodiment, the electrical test The device 14 is assembled on the second platform 12 and includes a circuit board 141, a plurality of joining components 142 and a supporting component 143, and further includes at least one positioning component 144 for positioning the radio frequency electronic component 30. The positioning component 144 can be a clamp Or a vent hole to clamp or adsorb the radio frequency electronic component 30. The circuit board 141 supports a supporting component 143, and the supporting component 143 penetrates a plurality of joint components 142. One end of the plurality of joining parts 142 is electrically connected to the circuit board 141, and the other end is electrically connected to the radio frequency electronic component 30. In addition, a plurality of positioning parts 144, which are exhaust holes, are arranged inside the supporting part 143. The positioning parts 144 Connect an air extraction device (not shown in the figure) to absorb or release the radio frequency electronic component 30. The test station is the supporting part 143 for the radio frequency electronic component 30 to perform the test operation, in other words , The transmission path between the supporting component 143 and the antenna tester 13 does not have signal interference components.

該至少一移載器15係作至少一方向位移，以供移載射頻電子元件30，更進一步，移載器15包含驅動源及作業治具，驅動源係驅動作業治具作至少一方向位移或旋轉位移，該作業治具可為吸嘴、夾具或壓接件，而執行移載射頻電子元件30或壓接射頻電子元件30，或者執行移載及壓接射頻電子元件30 ；例如移載器15可單純將射頻電子元件30移載至電性測試器14之測試工位，例如移載器15可將射頻電子元件30移載至電性測試器14之測試工位，並下壓射頻電子元件30，使射頻電子元件30之接點確實電性接觸電性測試器14之接合部件142，並使射頻電子元件30之無線訊號通過移載器15而傳輸至天線測試器13；於本實施例中，移載器15係作X-Y-Z方向位移，以將待測之射頻電子元件30移入電性測試器14之承置部件143(即測試工位)，並於電性測試器14移出已測之射頻電子元件30。The at least one transfer device 15 is displaced in at least one direction to transfer the radio frequency electronic component 30. Furthermore, the transfer device 15 includes a driving source and a work fixture, and the drive source drives the work fixture to move in at least one direction Or rotational displacement, the work fixture can be a suction nozzle, a clamp or a crimping part, and it can transfer or crimp the RF electronic component 30, or it can transfer and crimp the RF electronic component 30. ; For example, the transfer device 15 can simply transfer the radio frequency electronic component 30 to the test station of the electrical tester 14, for example, the transfer device 15 can transfer the RF electronic component 30 to the test station of the electrical tester 14, And press down the radio frequency electronic component 30 so that the contacts of the radio frequency electronic component 30 are indeed in electrical contact with the joint part 142 of the electrical tester 14, and the radio signal of the radio frequency electronic component 30 is transmitted to the antenna tester through the carrier 15 13; In this embodiment, the transfer device 15 is displaced in the XYZ direction to move the radio frequency electronic component 30 to be tested into the supporting component 143 (ie, the test station) of the electrical tester 14, and perform the electrical test The device 14 removes the radio frequency electronic component 30 that has been tested.

再者，測試裝置10係於天線測試器13與測試工位之間設有至少一中介器（圖未示出），中介器可為菱鏡或折射元件等，中介器係於射頻電子元件30與天線測試器13之間轉送傳輸無線訊號。Furthermore, the testing device 10 is provided with at least one intermediary (not shown in the figure) between the antenna tester 13 and the testing station. The intermediary may be a rhomboid mirror or a refraction element, etc. The intermediary is connected to the radio frequency electronic component 30. It transmits and transmits wireless signals between the antenna tester 13 and the antenna tester 13.

請參閱第1、2圖，移載器15係吸附一待測之射頻電子元件30，該射頻電子元件30之一面具有複數個接點31，另一面具有天線32，移載器15作X-Z方向位移將待測之射頻電子元件30移載置放於電性測試器14之承置部件143 (即測試工位)，電性測試器14即以定位部件144吸附射頻電子元件30定位，射頻電子元件30之接點31即電性接觸該電性測試器14之接合部件142，電性測試器14之電路板141經由接合部件142而對射頻電子元件30執行電性測試作業，同時，由於射頻電子元件30之天線32的待測指向係為0°，而天線測試器13之訊號作業件131的作業軸線L角度係相同射頻電子元件30之待測指向且為0°，承置部件143至天線測試器13間之傳輸路徑不具有訊號干擾件，當位於測試工位之射頻電子元件30的天線32朝0°指向發出波束而傳輸無線訊號時，天線測試器13之訊號作業件131即接收射頻電子元件30之無線訊號，並將接收之無線訊號傳輸至中央控制裝置之處理器，以供處理器作一分析，而判別射頻電子元件30之待測指向所發出的無線訊號強度是否符合標準；若是，則判斷射頻電子元件30為良品，反之，則判斷射頻電子元件30為不良品，達到測試射頻電子元件30品質之實用效益。Please refer to Figures 1 and 2, the transfer device 15 is to absorb a radio frequency electronic component 30 to be tested. The RF electronic component 30 has a plurality of contacts 31 on one side and an antenna 32 on the other side. The transfer device 15 is used in the XZ direction. Displacement moves the radio frequency electronic component 30 to be tested on the supporting part 143 of the electrical tester 14 (I.e. testing station), the electrical tester 14 is positioned by the positioning component 144 to adsorb the radio frequency electronic component 30, and the contact 31 of the radio frequency electronic component 30 is electrically contacted with the joint component 142 of the electrical tester 14, and the electrical test The circuit board 141 of the device 14 performs an electrical test operation on the radio frequency electronic component 30 through the bonding part 142, and at the same time , Because the direction to be measured of the antenna 32 of the radio frequency electronic component 30 is 0°, and the angle of the working axis L of the signal work piece 131 of the antenna tester 13 is the same as the direction to be measured of the radio frequency electronic component 30 and is 0°. The transmission path between the component 143 and the antenna tester 13 does not have signal interference components. When the antenna 32 of the radio frequency electronic component 30 at the test station emits a beam toward 0° to transmit wireless signals, the signal operation part of the antenna tester 13 131 is to receive the wireless signal of the radio frequency electronic component 30 and transmit the received radio signal to the processor of the central control device for an analysis by the processor to determine the strength of the radio signal emitted by the direction to be measured of the radio frequency electronic component 30 Whether it meets the standard; if it is, it is judged that the radio frequency electronic component 30 is a good product, otherwise, it is judged that the radio frequency electronic component 30 is a defective product, which achieves the practical benefit of testing the quality of the radio frequency electronic component 30.

請參閱第3圖，係本發明測試裝置10之第二實施例，當射頻電子元件30A之天線32A的數量及位置改變時，其波束的傳輸指向也會改變，本實施例之第一平台11包含複數個不同位置且為架體之第一部件111A、111B、111C，以供裝配複數個天線測試器13A、13B、13C，使複數個天線測試器13A 、3B、13C位於不同指向，例如天線測試器13B位於45°指向，而可測試射頻電子元件之待測45°指向所發出波束的無線訊號，例如天線測試器13C位於30°指向，而可測試射頻電子元件之待測30°指向所發出波束的無線訊號；於本實施例中，射頻電子元件30A之複數個天線32A的待測指向係為45°，當射頻電子元件30A於電性測試器14之測試工位執行電性測試作業之同時，射頻電子元件30A並朝45°指向發出波束而傳輸無線訊號，測試裝置10即利用位於45°指向之天線測試器13B接收射頻電子元件30A之無線訊號，並將接收之無線訊號傳輸至中央控制裝置之處理器，而判別射頻電子元件30A之待測45°指向所發出的無線訊號強度是否符合標準。Please refer to Figure 3, which is the second embodiment of the test device 10 of the present invention. When the number and position of the antenna 32A of the radio frequency electronic component 30A change, the transmission direction of the beam will also change. The first platform 11 of this embodiment The first part 111A, 111B, 111C, which includes a plurality of different positions and is a frame, is used for assembling a plurality of antenna testers 13A, 13B, 13C, so that a plurality of antenna testers 13A , 3B, and 13C are located in different directions. For example, the antenna tester 13B is located at 45°, and the radio signal of the radio frequency electronic component to be tested is at 45°. For example, the antenna tester 13C is located at 30° and can be tested. The radio signal of the radio frequency electronic component to be tested at 30° is directed to the emitted beam; in this embodiment, the radio signal to be measured of the plurality of antennas 32A of the radio frequency electronic component 30A is 45°. When the radio frequency electronic component 30A is in the electrical tester While the test station of 14 is performing electrical testing operations, the radio frequency electronic component 30A emits a beam toward 45° to transmit wireless signals. The test device 10 uses the antenna tester 13B positioned at 45° to receive the radio frequency of the radio frequency electronic component 30A. It transmits the received wireless signal to the processor of the central control device, and judges whether the strength of the wireless signal emitted by the 45° direction of the radio frequency electronic component 30A to be tested meets the standard.

請參閱第4圖，係本發明測試裝置10之第三實施例，該第一平台161係設於第一調整器，第一調整器具有第一承裝部件及第一驅動源，第一承裝部件可為第一驅動源之一部位，或為裝配於第一驅動源上之面板，亦即第一平台161可為獨立面板裝配於第一調整器之第一承裝部件，或者以第一承裝部件作為第一平台161，換言之，第一平台161可為第一驅動源之一部位，或為裝配於第一驅動源上之面板；於本實施例中，第一調整器之第一承裝部件係為面板，測試裝置10係以第一承裝部件作為第一平台161，以供裝配天線測試器13 ，又該第一平台161並裝配於第一驅動源162，第一驅動源162可為機械手臂、轉軸、滑軌組或包含複數個調整桿件，以帶動第一平台161及天線測試器13依測試作業之測試指向所需而調整擺置位置或角度，使天線測試器13可位於0°指向、45°指向或30°指向等不同位置，以利測試不同指向之射頻電子元件；於本實施例中，第一驅動源162係驅動第一平台161變換擺置為45°指向，以供測試射頻電子元件30B之天線32B於45°指向發出波束的無線訊號；因此，第一平台161可藉由第一調整器調整天線測試器13之擺置角度或位置，毋須於不同指向之位置配置複數個天線測試器13，藉以有效縮減天線測試器13之配置數量，達到節省成本之實用效益。Please refer to FIG. 4, which is the third embodiment of the test device 10 of the present invention. The first platform 161 is set on the first adjuster. The first adjuster has a first mounting part and a first driving source. The mounting part can be a part of the first driving source, or a panel mounted on the first driving source, that is, the first platform 161 can be a first mounting part of an independent panel mounted on the first adjuster, or A supporting component is used as the first platform 161. In other words, the first platform 161 may be a part of the first driving source or a panel mounted on the first driving source; in this embodiment, the first stage of the first adjuster A supporting component is a panel, and the testing device 10 uses the first supporting component as a first platform 161 for assembling the antenna tester 13 , And the first platform 161 is assembled to the first driving source 162. The first driving source 162 can be a robot arm, a rotating shaft, a slide rail group or a plurality of adjusting rods to drive the first platform 161 and the antenna tester 13 Adjust the placement position or angle according to the test orientation of the test operation, so that the antenna tester 13 can be located at different positions such as 0°pointing, 45°pointing or 30°pointing, so as to facilitate the testing of radio frequency electronic components with different orientations; In the embodiment, the first driving source 162 drives the first platform 161 to change its orientation to 45°, so as to test the antenna 32B of the radio frequency electronic component 30B at 45° to emit the wireless signal of the beam; therefore, the first platform 161 can By adjusting the placement angle or position of the antenna tester 13 by the first adjuster, there is no need to arrange multiple antenna testers 13 at positions of different orientations, so as to effectively reduce the number of antenna testers 13 and achieve practical benefits of cost saving.

請參閱第5圖，係本發明測試裝置10之第四實施例，該第二平台171係設於第二調整器，第二調整器具有第二承裝部件及第二驅動源，第二承裝部件可為第二驅動源之一部位，或為裝配於第二驅動源上之面板，亦即第二平台171可為獨立面板裝配於第二調整器之第二承裝部件，或者以第二承裝部件作為第二平台171，換言之，第二平台171可為第二驅動源之一部位，或為裝配於第二驅動源上之面板；於本實施例中，第二調整器之第二承裝部件係為面板，測試裝置10係以第二承裝部件作為第二平台171，以供裝配電性測試器14 ，又該第二平台171並裝配於第二驅動源172，第二驅動源172可為機械手臂、轉軸、滑軌組或包含複數個調整桿件，以帶動第二平台171及電性測試器14依測試作業之測試指向所需而調整擺置位置或角度，使電性測試器14可位於0°指向、45°指向或30°指向等不同位置，亦或於原地擺置呈不同之0°指向、45°指向或30°指向，而使電性測試器14搭配位於第一平台11上之單一天線測試器13，即可測試射頻電子元件之不同待測指向；於本實施例中，第二驅動源172係驅動第二平台171及電性測試器14變換擺置為45°指向，以供測試射頻電子元件30B之天線32B於45°指向發出波束的無線訊號；因此，第二平台171可藉由第二調整器調整電性測試器14及射頻電子元件30B之擺置角度，毋須於不同指向之位置配置天線測試器13，藉以有效縮減天線測試器13之配置數量，達到節省成本之實用效益。Please refer to FIG. 5, which is the fourth embodiment of the test device 10 of the present invention. The second platform 171 is provided on the second adjuster. The second adjuster has a second mounting part and a second driving source. The mounting part can be a part of the second driving source, or a panel mounted on the second driving source, that is, the second platform 171 can be a second mounting part of an independent panel mounted on the second adjuster, or The two mounting parts serve as the second platform 171. In other words, the second platform 171 can be a part of the second driving source or a panel mounted on the second driving source; in this embodiment, the second adjuster The second mounting part is a panel, and the testing device 10 uses the second mounting part as a second platform 171 for assembling the electrical tester 14 , And the second platform 171 is assembled on the second driving source 172. The second driving source 172 can be a robot arm, a rotating shaft, a slide rail group or a plurality of adjusting rods to drive the second platform 171 and the electrical tester 14 Adjust the placement position or angle according to the test orientation of the test operation, so that the electrical tester 14 can be located at different positions such as 0°pointing, 45°pointing, or 30°pointing, or it may be placed differently on the spot. 0° pointing, 45° pointing or 30° pointing, and the electrical tester 14 is combined with the single antenna tester 13 on the first platform 11 to test the different directions to be tested of the radio frequency electronic components; in this embodiment , The second driving source 172 drives the second platform 171 and the electrical tester 14 to change the orientation to 45°, so as to test the antenna 32B of the radio frequency electronic component 30B at 45° to emit the wireless signal of the beam; therefore, the second The platform 171 can adjust the placement angle of the electrical tester 14 and the radio frequency electronic component 30B by the second adjuster, without disposing the antenna tester 13 at different pointing positions, so as to effectively reduce the number of antenna testers 13 to save Practical benefits of cost.

請參閱第6圖，係本發明測試裝置10之第五實施例，該天線測試器13及電性測試器14於測試時係位於封閉之測試室，該測試室可為一獨立且具門板之箱室，或者於機台上固設具門板之箱罩，而於箱罩與機台間形成測試室，亦或於機台之上方配置一可作Z方向位移之外罩，以於外罩罩置於機台時，而於外罩與機台間形成測試室，又第一平台181可為測試室之其一面板(如箱罩之頂板)，以供裝配天線測試器13，第二平台182可為測試室之另一面板(如機台 )，以供裝配電性測試器14；於本實施例中，測試裝置10係以機台作為第二平台182，以供裝配電性測試器14，第二平台182上固設一具門板184之箱罩183，第二平台182與箱罩32間形成一測試室185，測試裝置10係以箱罩183之頂板作為第一平台181，以供裝配天線測試器13；另於測試室185設有至少一可輸入預設溫度流體之輸送管186，於本實施例中，係於箱罩183設有至少一可輸入預設溫度流體之輸送管186，輸送管186輸送預設溫度之流體於測試室185，使測試室185形成一模擬日後射頻電子元件應用場所溫度之測試環境；當箱罩183之門板184開啟時，一具吸嘴之移載器15係將待測之射頻電子元件30移入測試室185，且置放於電性測試器14之測試工位，於移載器15退出測試室185時，箱罩183之門板184關閉，使得射頻電子元件30於測試室185內執行無線訊號測試作業及電性測試作業。Please refer to Fig. 6, which is the fifth embodiment of the test device 10 of the present invention. The antenna tester 13 and the electrical tester 14 are located in a closed test room during testing. The test room can be an independent and door panel. Box room, or a box cover with a door panel fixed on the machine, and a test room is formed between the box cover and the machine , Or dispose a cover that can be displaced in the Z direction above the machine, so that when the cover is placed on the machine, a test room is formed between the cover and the machine, and the first platform 181 can be another of the test rooms. One panel (such as the top panel of the box cover) for assembling the antenna tester 13, and the second platform 182 can be another panel of the test room (such as a machine ) For assembling the electrical tester 14; in this embodiment, the testing device 10 uses a machine as the second platform 182 for assembling the electrical tester 14, and a door 184 is fixed on the second platform 182 A test chamber 185 is formed between the second platform 182 and the box cover 32. The test device 10 uses the top plate of the box cover 183 as the first platform 181 for assembling the antenna tester 13; There is at least one delivery pipe 186 capable of inputting preset temperature fluid. In this embodiment, at least one delivery pipe 186 capable of inputting preset temperature fluid is provided in the tank cover 183. The delivery pipe 186 transports the preset temperature fluid to The test room 185 makes the test room 185 form a test environment that simulates the temperature of the application place of radio frequency electronic components in the future; when the door panel 184 of the box cover 183 is opened, a transfer device 15 with a suction nozzle is used to transfer the radio frequency electronic component 30 to be tested Move into the test room 185 and place it in the test station of the electrical tester 14. When the transferer 15 exits the test room 185, the door 184 of the box cover 183 is closed, so that the radio frequency electronic component 30 performs wireless in the test room 185. Signal test work and electrical test work.

請參閱第7、8圖，係本發明測試裝置10之第六實施例，該天線測試器13及電性測試器14於測試時係位於封閉之測試室，第一平台191可為測試室之其一面板(如載具之面板)，以供裝配天線測試器13，第二平台192可為測試室之另一面板(如機台)，以供裝配電性測試器14；於本實施例中，測試裝置10係以機台作為第二平台192，以供裝配電性測試器14，另於第二平台192之上方設置載具，載具包含外罩193及一驅動外罩193作Z方向位移之第三驅動源194，於第三驅動源194驅動外罩193罩置於第二平台192時，外罩193與第二平台192間形成測試室，測試裝置10係以外罩193之頂板作為第一平台191，以供裝配天線測試器13；當開啟外罩193時，一具吸嘴之移載器15係將待測之射頻電子元件30移入電性測試器14，於移載器15退出電性測試器14之上方時，第三驅動源194驅動外罩193作Z方向位移罩置於第二平台192，使得射頻電子元件30於測試室內執行無線訊號測試作業及電性測試作業。Please refer to Figures 7 and 8, which are the sixth embodiment of the test device 10 of the present invention. The antenna tester 13 and the electrical tester 14 are located in a closed test room during testing. The first platform 191 can be a part of the test room. One panel (such as the panel of the carrier) is used for assembling the antenna tester 13, and the second platform 192 can be the other panel (such as a machine) of the test room for assembling the electrical tester 14; in this embodiment In the testing device 10, a machine is used as the second platform 192 for assembling the electrical tester 14, and a carrier is set above the second platform 192. The carrier includes an outer cover 193 and a driving outer cover 193 for Z-direction displacement The third driving source 194, when the third driving source 194 drives the cover 193 and the cover is placed on the second platform 192, a test chamber is formed between the cover 193 and the second platform 192, and the test device 10 is the top plate of the cover 193 as the first platform 191, for assembling the antenna tester 13; when the cover 193 is opened, a transferer 15 with a suction nozzle moves the radio frequency electronic component 30 to be tested into the electrical tester 14, and the transferer 15 exits the electrical test When the device 14 is above, the third driving source 194 drives the outer cover 193 to move the cover in the Z direction to be placed on the second platform 192, so that the radio frequency electronic component 30 performs the wireless signal test operation and the electrical test operation in the test room.

請參閱第9、10圖，係本發明測試裝置10之第七實施例，第一平台201可為測試室之其一面板(如箱體之底板)，以供裝配天線測試器13，第二平台202可為移載器之其一面板，以供裝配電性測試器14；於本實施例中，測試裝置10係於機台204裝配一內具測試室2031之箱體203，箱體203之頂板外部設置承座2032，承座2032供承置射頻電子元件30，並開設有相通測試室2031之通孔2033，承座2032即為測試工位，測試工位至天線測試器13間之傳輸路徑並無訊號干擾件，測試裝置10係以箱體203之底板作為第一平台201，以供裝配天線測試器13，測試裝置10係於承座2032之上方設置移載器，移載器包含第四驅動源2051及作業治具，第四驅動源2051係驅動作業治具作至少一方向位移，該作業治具可為吸嘴、夾具或壓接件，而執行移載射頻電子元件30或壓接射頻電子元件30，或者執行移載及壓接射頻電子元件30；於本實施例中，移載器之作業治具係為吸嘴2052，以移載射頻電子元件30，第二平台202係裝配於移載器，並由第四驅動源2051驅動作X-Z方向位移，電性測試器14係裝配於第二平台202 ，並設有電性接觸之第一電路板145、第一接合部件146及第二接合部件147，第一接合部件146係供電性連接射頻電子元件30之接點，第二接合部件147則供電性連接裝配於承座2032上之第二電路板148；測試裝置10更包含至少一載台，以供載送該射頻電子元件，於本實施例中，係於承座2032之兩側分別設有第一載台211及第二載台212，第一載台211及第二載台212係供載送射頻電子元件30；再者，測試裝置10係於移載器或第二平台202設置至少一溫控件221，以供溫控射頻電子元件30位於模擬日後射頻電子元件應用場所溫度之測試環境；於測試時，該移載器係以第四驅動源2051驅動吸嘴2052、第二平台202及電性測試器14作X-Z方向位移，令吸嘴2052於第一載台211取出待測之射頻電子元件30 ，並使電性測試器14之第一接合部件146電性連接射頻電子元件30之接點，當吸嘴2052將射頻電子元件30移入承座2032時，電性測試器14之第二接合部件147即電性連接承座2032上之第二電路板148，並使第一接合部件146下壓射頻電子元件30，使電性測試器14利用第一電路板145、第一接合部件146、第二接合部件147及第二電路板148對射頻電子元件30執行電性測試作業，同時，射頻電子元件30之天線32於0°指向發出波束的無線訊號，天線測試器13接收射頻電子元件30之無線訊號，並將接收之無線訊號傳輸至中央控制裝置之處理器，而判別射頻電子元件30之測試品質。Please refer to Figures 9 and 10, which are the seventh embodiment of the test device 10 of the present invention. The first platform 201 can be one of the panels of the test room (such as the bottom plate of the box) for assembling the antenna tester 13, the second The platform 202 can be a panel of the transfer device for assembling the electrical tester 14; in this embodiment, the testing device 10 is mounted on the machine 204 with a box 203 with a test chamber 2031, and the box 203 A socket 2032 is provided on the outside of the top plate. The socket 2032 is used to hold the radio frequency electronic component 30. The socket 2032 is provided with a through hole 2033 communicating with the test chamber 2031. The socket 2032 is the test station. The test station is between the test station and the antenna tester 13. There is no signal interference component in the transmission path. The test device 10 uses the bottom plate of the box 203 as the first platform 201 for assembling the antenna tester 13. The test device 10 is provided with a transfer device above the support 2032. It includes a fourth drive source 2051 and a work fixture. The fourth drive source 2051 drives the work fixture to move in at least one direction. The work fixture can be a nozzle, a clamp, or a crimping part to perform transfer and transfer of radio frequency electronic components 30 Either crimping the radio frequency electronic component 30, or performing transfer and crimping of the radio frequency electronic component 30; in this embodiment, the work fixture of the transfer device is the suction nozzle 2052 to transfer the radio frequency electronic component 30, the second platform 202 is assembled on the transfer device and driven by the fourth driving source 2051 for displacement in the XZ direction, and the electrical tester 14 is assembled on the second platform 202 , And is provided with a first circuit board 145, a first joint part 146 and a second joint part 147 for electrical contact. The first joint part 146 is for power connection to the contacts of the radio frequency electronic component 30, and the second joint part 147 is for power supply The second circuit board 148 assembled on the socket 2032 is sexually connected; the test device 10 further includes at least one carrier , For carrying the radio frequency electronic components. In this embodiment, a first carrier 211 and a second carrier 212, a first carrier 211 and a second carrier 212 are respectively provided on both sides of the bearing 2032 It is used to carry the radio frequency electronic component 30; furthermore, the test device 10 is provided with at least one temperature control 221 on the transfer device or the second platform 202 for the temperature control of the radio frequency electronic component 30 to simulate the temperature of the application site of the radio frequency electronic component in the future The test environment; during the test, the transferer uses the fourth driving source 2051 to drive the suction nozzle 2052, the second platform 202 and the electrical tester 14 for displacement in the XZ direction, so that the suction nozzle 2052 is taken out of the first stage 211 RF electronic components to be tested 30 , And electrically connect the first joint part 146 of the electrical tester 14 to the contact point of the radio frequency electronic component 30. When the suction nozzle 2052 moves the radio frequency electronic component 30 into the socket 2032, the second joint part of the electrical tester 14 147 is electrically connected to the second circuit board 148 on the socket 2032, and the first joint part 146 is pressed down on the radio frequency electronic component 30, so that the electrical tester 14 uses the first circuit board 145, the first joint part 146, and the first joint part 146. The second joining component 147 and the second circuit board 148 perform electrical testing operations on the radio frequency electronic component 30. At the same time, the antenna 32 of the radio frequency electronic component 30 emits a beam of wireless signals at 0°, and the antenna tester 13 receives the radio frequency electronic component 30. The wireless signal is transmitted to the processor of the central control device to determine the test quality of the radio frequency electronic component 30.

請參閱第1、11圖，係本發明測試裝置10應用於測試設備之示意圖，包含機台40、供料裝置50、收料裝置60、本發明測試裝置10、輸送裝置70及中央控制裝置（圖未示出）；供料裝置50係配置於機台40上，並設有至少一容納待測射頻電子元件之供料承置器51；收料裝置60係配置於機台40上，並設有至少一容納已測射頻電子元件之收料承置器61；本發明之測試裝置10係配置於機台40上，包含第一平台11、第二平台12、天線測試器13及電性測試器14，以對射頻電子元件執行電性測試作業及無線訊號測試作業，於本實施例中，測試裝置10係於機台40之第一側及第二側分別配置有複數個第一平台11、複數個第二平台12、複數個天線測試器13及複數個電性測試器14，測試裝置10另於機台40上配置第一移載器151及第二移載器152，以於第一側之複數個電性測試器14及第二側之複數個電性測試器14移載待測/已測之射頻電子元件；輸送裝置70係配置於機台40上，並設有至少一輸送器，用以輸送射頻電子元件，於本實施例中，輸送裝置70係設有作X-Y-Z方向位移之第一輸送器71，第一輸送器71係為拾取器，以於供料裝置50取出待測之射頻電子元件，並移載至具載台之第二輸送器72及第三輸送器73，第一移載器151於第二輸送器72取出待測之射頻電子元件，第二移載器152則將已測之射頻電子元件移入第三輸送器73，第一輸送器71於第三輸送器73取出已測之射頻電子元件，並依測試結果，將已測之射頻電子元件移載至收料裝置60而分類收置；中央控制裝置係用以控制及整合各裝置作動，以執行自動化作業，達到提升作業效能之實用效益。Please refer to Figures 1 and 11, which are schematic diagrams of the testing device 10 of the present invention applied to testing equipment, including the machine 40, the feeding device 50, the receiving device 60, the testing device 10 of the present invention, the conveying device 70 and the central control device ( (Not shown in the figure); the feeding device 50 is arranged on the machine 40, and is provided with at least one feeding holder 51 containing the radio frequency electronic component to be tested; the receiving device 60 is arranged on the machine 40, and There is at least one receiving receiver 61 for accommodating the tested radio frequency electronic components; the testing device 10 of the present invention is arranged on the machine 40, and includes a first platform 11, a second platform 12, an antenna tester 13 and electrical properties The tester 14 performs electrical test operations and wireless signal test operations on radio frequency electronic components. In this embodiment, the test device 10 is provided with a plurality of first platforms on the first side and the second side of the machine 40, respectively 11. A plurality of second platforms 12, a plurality of antenna testers 13 and a plurality of electrical testers 14, and the test device 10 is additionally equipped with a first transfer device 151 and a second transfer device 152 on the machine 40, so as to The plurality of electrical testers 14 on the first side and the plurality of electrical testers 14 on the second side transfer the radio frequency electronic components to be tested/tested; the conveying device 70 is arranged on the machine 40 and is provided with at least A conveyor for conveying radio frequency electronic components. In this embodiment, the conveying device 70 is provided with a first conveyor 71 that is displaced in the XYZ direction, and the first conveyor 71 is a picker for the feeding device 50 Take out the radio frequency electronic component to be tested and transfer it to the second conveyor 72 and the third conveyor 73 with a stage. The first transferer 151 takes out the radio frequency electronic component to be tested on the second conveyor 72. The transferer 152 moves the tested radio frequency electronic components into the third conveyor 73. The first conveyor 71 takes out the tested radio frequency electronic components from the third conveyor 73 and transfers the tested radio frequency electronic components according to the test results. It is transferred to the receiving device 60 to be sorted and stored; the central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operational efficiency.

10:測試裝置 11:第一平台 111A、111B、111C:第一部件 12:第二平台 13、13A、13B、13C:天線測試器 131:訊號作業件 14:電性測試器 141:電路板 142:接合部件 143:承置部件 144:定位部件 145:第一電路板 146:第一接合部件 147:第二接合部件 148:第二電路板 15:移載器 151:第一移載器 152:第二移載器 161:第一平台 162:第一驅動源 171:第二平台 172:第二驅動源 181:第一平台 182:第二平台 183:箱罩 184:門板 185:測試室 186:輸送管 191:第一平台 192:第二平台 193:外罩 194:第三驅動源 201:第一平台 202:第二平台 203:箱體 2031:測試室 2032:承座 2033:通孔 204:機台 2051:第四驅動源 2052:吸嘴 211:第一載台 212:第二載台 221:溫控件 30、30A、30B:射頻電子元件 31:接點 32、32A、32B:天線 L:作業軸線 40:機台 50:供料裝置 51:供料承置器 61:收料承置器 70:輸送裝置 71:第一輸送器 72:第二輸送器 73:第三輸送器10: Test device 11: The first platform 111A, 111B, 111C: the first part 12: The second platform 13, 13A, 13B, 13C: antenna tester 131: Signal work piece 14: Electrical tester 141: circuit board 142: Joining Parts 143: bearing parts 144: Positioning parts 145: The first circuit board 146: The first joint part 147: The second joint part 148: second circuit board 15: transfer device 151: The first transfer device 152: Second transfer device 161: The first platform 162: The first drive source 171: The second platform 172: second drive source 181: The first platform 182: The second platform 183: box cover 184: Door Panel 185: test room 186: Conveying Pipe 191: The first platform 192: The second platform 193: Outer Cover 194: Third Drive Source 201: The first platform 202: second platform 203: Box 2031: test room 2032: seat 2033: Through hole 204: Machine 2051: Fourth drive source 2052: Nozzle 211: first stage 212: second stage 221: temperature control 30, 30A, 30B: RF electronic components 31: Contact 32, 32A, 32B: antenna L: work axis 40: Machine 50: Feeding device 51: Feeder 61: Receiving holder 70: Conveying device 71: The first conveyor 72: second conveyor 73: Third Conveyor

第1圖：本發明測試裝置第一實施例之示意圖。第2圖：本發明測試裝置第一實施例之使用示意圖。第3圖：本發明測試裝置第二實施例之示意圖。第4圖：本發明測試裝置第三實施例之示意圖。第5圖：本發明測試裝置第四實施例之示意圖。第6圖：本發明測試裝置第五實施例之示意圖。第7圖：本發明測試裝置第六實施例之示意圖。第8圖：本發明測試裝置第六實施例之使用示意圖。第9圖：本發明測試裝置第七實施例之示意圖。第10圖：本發明測試裝置第七實施例之使用示意圖。第11圖：本發明測試裝置應用於測試設備之示意圖。Figure 1: A schematic diagram of the first embodiment of the testing device of the present invention. Figure 2: A schematic diagram of the use of the first embodiment of the testing device of the present invention. Figure 3: A schematic diagram of the second embodiment of the testing device of the present invention. Figure 4: A schematic diagram of the third embodiment of the testing device of the present invention. Figure 5: A schematic diagram of the fourth embodiment of the testing device of the present invention. Figure 6: A schematic diagram of the fifth embodiment of the testing device of the present invention. Figure 7: A schematic diagram of the sixth embodiment of the testing device of the present invention. Figure 8: A schematic diagram of the use of the sixth embodiment of the testing device of the present invention. Figure 9: A schematic diagram of the seventh embodiment of the testing device of the present invention. Figure 10: A schematic diagram of the use of the seventh embodiment of the testing device of the present invention. Figure 11: A schematic diagram of the testing device of the present invention applied to testing equipment.

10:測試裝置10: Test device

11:第一平台11: The first platform

12:第二平台12: The second platform

13:天線測試器13: Antenna tester

131:訊號作業件131: Signal work piece

14:電性測試器14: Electrical tester

141:電路板141: circuit board

142:接合部件142: Joining Parts

143:承置部件143: bearing parts

144:定位部件144: Positioning parts

15:移載器15: transfer device

30:射頻電子元件30: RF electronic components

31:接點31: Contact

32:天線32: Antenna

L:作業軸線L: work axis

Claims

一種射頻電子元件測試裝置，包含：第一平台；第二平台；天線測試器：係裝配於該第一平台，並設有至少一訊號作業件，以供對位於測試工位之該射頻電子元件執行無線訊號測試作業，該測試工位與該天線測試器間不具有訊號干擾件；電性測試器：係裝配於該第二平台，並設有電性連接之電路板及至少一接合部件，該接合部件係供電性連接位於該測試工位之該射頻電子元件而執行電性測試作業；其中，該第一平台設置於第一調整器，以供作至少一方向位移或作角度轉動，或作至少一方向位移及角度轉動，以供該射頻電子元件位於該測試工位時而使待測指向對位該天線測試器。 A radio frequency electronic component testing device, comprising: a first platform; a second platform; an antenna tester: assembled on the first platform and provided with at least one signal work piece for the radio frequency electronic component at the test station To perform wireless signal testing operations, there are no signal interference components between the testing station and the antenna tester; electrical tester: is assembled on the second platform, and is provided with an electrical circuit board and at least one joint component, The joining component is electrically connected to the radio frequency electronic component at the test station to perform electrical testing; wherein, the first platform is provided on the first adjuster for at least one direction displacement or angular rotation, or At least one direction displacement and angle rotation are made to allow the radio frequency electronic component to be positioned at the test station to align the antenna tester with the direction to be tested.

如請求項1所述之射頻電子元件測試裝置，其中，該第一平台係為至少一面板、端部、架體或座體，或者以連接該天線測試器之相關元件的一部位作為該第一平台。 The radio frequency electronic component test device according to claim 1, wherein the first platform is at least one panel, end, frame or base, or a part connected to a related component of the antenna tester is used as the first platform One platform.

如請求項1所述之射頻電子元件測試裝置，其中，該第二平台係為至少一面板、端部、架體或座體，或者以連接該電性測試器之相關元件的一部位作為該第二平台。 The radio frequency electronic component testing device according to claim 1, wherein the second platform is at least one panel, end, frame or base, or a part connected to related components of the electrical tester is used as the The second platform.

如請求項1所述之射頻電子元件測試裝置，其中，該測試工位係為預設該射頻電子元件執行測試作業之位置。 The radio frequency electronic component testing device according to claim 1, wherein the test station is a preset position where the radio frequency electronic component performs a test operation.

如請求項1所述之射頻電子元件測試裝置，其中，該電性測試器係設有至少一定位部件，以定位該射頻電子元件。 The radio frequency electronic component testing device according to claim 1, wherein the electrical tester is provided with at least one positioning component for positioning the radio frequency electronic component.

如請求項1所述之射頻電子元件測試裝置，更包含至少一載台，以供載送該射頻電子元件。 The radio frequency electronic component testing device according to claim 1, further comprising at least one carrier for carrying the radio frequency electronic component.

一種射頻電子元件測試設備，包含：機台；供料裝置：係配置於該機台上，並設有至少一容納待測射頻電子元件之供料承置器；收料裝置：係配置於該機台上，並設有至少一容納已測射頻電子元件之收料承置器；至少一如請求項1所述之射頻電子元件測試裝置：係配置於該機台上，以供測試射頻電子元件；輸送裝置：係配置於該機台上，並設有至少一輸送器，用以輸送射頻電子元件；中央控制裝置：係用以控制及整合各裝置作動，以執行自動化作業。 A radio frequency electronic component testing equipment, comprising: a machine; a feeding device: is arranged on the machine, and is provided with at least one feeding holder for accommodating the radio frequency electronic component to be tested; and the receiving device: is arranged on the machine The machine is equipped with at least one receiving carrier for accommodating the tested radio frequency electronic components; at least one radio frequency electronic component testing device as described in claim 1: is configured on the machine for testing radio frequency electronic components Components; Conveying device: It is arranged on the machine and is equipped with at least one conveyor for conveying radio frequency electronic components; Central control device: It is used to control and integrate the actions of various devices to perform automated operations.