TWI737111B

TWI737111B - Opitcal axis keyboard adjustment method and optical axis keyboard using the same

Info

Publication number: TWI737111B
Application number: TW108148752A
Authority: TW
Inventors: 李建興
Original assignee: 達方電子股份有限公司
Priority date: 2019-12-31
Filing date: 2019-12-31
Publication date: 2021-08-21
Also published as: TW202127485A

Abstract

An method for adjusting an optical axis keyboard with a plurality of key units includes the following steps. The control unit applies a scanning signal on one of the plurality of scanning lines at the first time point. The light source emits light according to the scanning signal. The detecting element detects the light emitted by the light source and generates a detected electric signal. The control unit reads the detected electric signal to obtain a first read signal. When the first read signal voltage is outside the predetermined voltage range of the pressed state of the plurality of key units, the control unit increases the period of the scan signal by a first predetermined amount to obtain a adjusted scan signal.

Description

光軸鍵盤調整方法及應用此調整方法之光軸鍵盤 Optical axis keyboard adjustment method and optical axis keyboard applying the adjustment method

本揭露是有關於一種光軸鍵盤調整方法及應用此調整方法之光軸鍵盤。 This disclosure relates to an optical axis keyboard adjustment method and an optical axis keyboard applying the adjustment method.

由於光軸鍵盤係利用光源(例如發光二極體)所產生之光線以及相對應的偵測元件(例如光電晶體)來運作，光軸鍵盤控制單元需要定期地在多條掃描線其中之一傳送掃描訊號來開啟光源發光，如此偵測元件才能依據是否接收到光線來判斷是否有按鍵被按下。相關光軸鍵盤技術因而會衍生光源經過長時間掃描發光後，光源(例如紅外光發光二極體(infrared light emitting diode,IR LED))發光效能衰退而使發出光線強度減低；如此導致偵測元件所產生的對應偵測電訊號中的高位準區間變短或延遲發生，使控制單元讀取此偵測電訊號得到錯誤的偏低電壓位準，進而使控制單元誤判按鍵單元並未被按壓的問題。因此，需要一種新穎的光軸鍵盤調整方法，能在光源發光效能衰退而使發出光線強度減低狀態下，藉由加長掃描訊號的時段長度或增加延遲讀取該偵測電訊號，使控制單元能正確判斷按鍵單元已經被按壓。 Since the optical axis keyboard uses the light generated by the light source (such as light-emitting diodes) and the corresponding detection element (such as photoelectric crystal) to operate, the optical axis keyboard control unit needs to periodically transmit on one of the multiple scan lines The signal is scanned to turn on the light source to emit light, so that the detection element can determine whether a button is pressed according to whether it receives light. As a result, the related optical axis keyboard technology will derive the light source (such as infrared light emitting diode (IR LED)) after a long time scanning and emitting light, and the luminous efficiency of the light source (such as infrared light emitting diode (IR LED)) will decline and the emitted light intensity will be reduced; this leads to the detection element The generated high-level interval in the corresponding detected electrical signal is shortened or delayed, so that the control unit reads the detected electrical signal to obtain the wrong low-voltage level, and the control unit misjudges that the button unit is not pressed. problem. Therefore, there is a need for a novel optical axis keyboard adjustment method that can extend the time period of the scanning signal or increase the delay in reading the detection signal under the condition that the luminous efficiency of the light source is degraded and the emitted light intensity is reduced, so that the control unit can Correctly judge that the key unit has been pressed.

本揭露係有關於一種光軸鍵盤調整方法及應用此調整方法之光軸鍵盤。 This disclosure relates to an optical axis keyboard adjustment method and an optical axis keyboard applying the adjustment method.

根據本揭露之第一方面，提出一種光軸鍵盤調整方法，光軸鍵盤具有多個按鍵單元，此光軸鍵盤調整方法包括下列步驟。控制單元於第一掃描時點於複數條掃描線其中之一傳送掃描訊號，光源依據掃描訊號發出光線。偵測元件偵測光線而產生偵測電訊號，控制單元讀取偵測電訊號而得到第一讀取訊號。當第一讀取訊號位準超出按鍵單元的按壓狀態位準範圍時，控制單元加長掃描訊號的時段長度第一預定量而得到修正過的掃描訊號。 According to the first aspect of the present disclosure, an optical axis keyboard adjustment method is proposed. The optical axis keyboard has a plurality of key units. The optical axis keyboard adjustment method includes the following steps. The control unit transmits a scanning signal to one of the plurality of scanning lines at the time of the first scanning, and the light source emits light according to the scanning signal. The detection element detects light to generate a detection electrical signal, and the control unit reads the detection electrical signal to obtain a first read signal. When the first reading signal level exceeds the pressing state level range of the key unit, the control unit lengthens the period length of the scanning signal by a first predetermined amount to obtain the corrected scanning signal.

根據本揭露之第二方面，提出一種光軸鍵盤調整方法，光軸鍵盤具有多個按鍵單元，此光軸鍵盤調整方法包括下列步驟。控制單元於第一掃描時點於複數條掃描線其中之一傳送掃描訊號，光源依據掃描訊號發出光線。偵測元件偵測光線而產生偵測電訊號。控制單元自第一掃描時點間隔一個延遲時段之時點讀取偵測電訊號而得到第一讀取訊號。當第一讀取訊號位準超出按鍵單元的按壓狀態位準範圍時，控制單元加長延遲時段的時段長度第二預定量而得到修正過的延遲時段。 According to the second aspect of the present disclosure, an optical axis keyboard adjustment method is proposed. The optical axis keyboard has a plurality of key units. The optical axis keyboard adjustment method includes the following steps. The control unit transmits a scanning signal to one of the plurality of scanning lines at the time of the first scanning, and the light source emits light according to the scanning signal. The detection element detects the light and generates a detection electrical signal. The control unit reads the detection electrical signal from the first scanning time point with a delay period to obtain the first read signal. When the first read signal level exceeds the pressing state level range of the key unit, the control unit lengthens the period length of the delay period by a second predetermined amount to obtain the corrected delay period.

根據本揭露之第三方面，提出一種光軸鍵盤，包括複數掃描線、控制單元與多個按鍵單元。控制單元耦接至複數掃描線，控制單元對各些掃描線其中之一傳送掃描訊號。多個按鍵單元中之任一包括光源與偵測元件。光源依據掃描訊號發出光線。當偵測元件偵測到光線時，偵測元件產生偵測電訊號，控制單元讀取偵測電訊號而得到第一讀取訊號。其中，當第一讀取訊號位準超出按鍵單元的按壓狀態位準範圍時，控制單元加長掃描訊號的時段長度第一預定量而得到修正過的掃描訊號。 According to the third aspect of the present disclosure, an optical axis keyboard is provided, which includes a plurality of scan lines, a control unit, and a plurality of key units. The control unit is coupled to a plurality of scan lines, and the control unit transmits a scan signal to one of the scan lines. Any one of the plurality of key units includes a light source and a detecting element. The light source emits light according to the scanning signal. When the detection component detects When the light arrives, the detecting element generates a detecting electrical signal, and the control unit reads the detecting electrical signal to obtain the first read signal. Wherein, when the first reading signal level exceeds the pressing state level range of the key unit, the control unit lengthens the period length of the scanning signal by a first predetermined amount to obtain the corrected scanning signal.

根據本揭露之第四方面，提出一種光軸鍵盤，包括複數掃描線、控制單元與多個按鍵單元。控制單元耦接至複數掃描線，控制單元於第一掃描時點對各些掃描線其中之一傳送掃描訊號。多個按鍵單元中之任一包括光源與偵測元件。光源依據掃描訊號發出光線。當偵測元件偵測到光線時，偵測元件產生第一讀取訊號。其中控制單元於第二時點讀取第一讀取訊號，第二時點與第一掃描時點間隔一個延遲時段，當第一讀取訊號位準超出按鍵單元的按壓狀態位準範圍時，控制單元加長延遲時段的時段長度第二預定量而得到修正過的延遲時段。 According to the fourth aspect of the present disclosure, an optical axis keyboard is provided, which includes a plurality of scan lines, a control unit, and a plurality of key units. The control unit is coupled to a plurality of scan lines, and the control unit transmits a scan signal to one of the scan lines during the first scan. Any one of the plurality of key units includes a light source and a detecting element. The light source emits light according to the scanning signal. When the detecting element detects light, the detecting element generates a first read signal. The control unit reads the first read signal at the second time point, and the second time point is separated from the first scanning time point by a delay period. When the first read signal level exceeds the pressing state level range of the key unit, the control unit lengthens The length of the delay period is the second predetermined amount to obtain the modified delay period.

為了對本揭露之上述及其他方面有更佳的瞭解，下文特舉實施例，並配合所附圖式詳細說明如下： In order to have a better understanding of the above and other aspects of the present disclosure, the following examples are specially cited, and the accompanying drawings are described in detail as follows:

100:光軸鍵盤 100: Optical axis keyboard

101_1、101_2、101_3、101_4:光源、發光二極體 101_1, 101_2, 101_3, 101_4: light source, light-emitting diode

102_1、102_2、102_3、102_4:偵測元件、光電晶體 102_1, 102_2, 102_3, 102_4: detection element, photoelectric crystal

104_1:鍵帽 104_1: keycap

108_1:回復力元件 108_1: Restoring force element

110_1、110_2、110_3、110_4:按鍵單元 110_1, 110_2, 110_3, 110_4: key unit

160:控制單元 160: control unit

162:類比數位轉換單元 162: Analog-to-digital conversion unit

164_1:第一掃描線 164_1: the first scan line

164_2:第二掃描線 164_2: second scan line

166_1:第一讀取線 166_1: first read line

166_2:第二讀取線 166_2: second read line

502~510、702~710:流程步驟 502~510, 702~710: process steps

B1、B2、B3、B4:遮光板 B1, B2, B3, B4: shading plate

Lmax:最大發光強度 Lmax: Maximum luminous intensity

PT1、PT2、PT3、PT4:輸出端子 PT1, PT2, PT3, PT4: output terminals

R1、R2、R3、R4、R5、R6:負載電阻 R1, R2, R3, R4, R5, R6: load resistance

Read_1:第一讀取訊號 Read_1: first read signal

Read_2:第二讀取訊號 Read_2: second read signal

Scan_1:第一掃描訊號 Scan_1: the first scan signal

Scan_1’:修正過的第一掃描訊號 Scan_1’: First scan signal corrected

Scan_2:第二掃描訊號 Scan_2: The second scan signal

Scan_1:第一掃描訊號 Scan_1: the first scan signal

T0:第一掃描時點 T0: Time of the first scan

Tdelay_1:第一延遲時段 Tdelay_1: the first delay period

Tdelay_1’:修正過的第一延遲時段 Tdelay_1’: First delay period corrected

Ton_1:第一掃描時段 Ton_1: the first scan period

Ton_1’:修正過的第一掃描時段 Ton_1’: First scan period corrected

Tread_1:第一讀取時點 Tread_1: the first reading time point

Tread_2:第二讀取時點 Tread_2: second reading time point

Tread_3:第三讀取時點 Tread_3: The third reading time point

VH:電壓最大值 VH: Maximum voltage

Vth:臨界位準 Vth: critical level

Vread_1:第一讀取訊號位準 Vread_1: The first read signal level

Vref1、Vref2:預定電壓源 Vref1, Vref2: predetermined voltage source

第1圖繪示依據本揭露一實施例之光軸鍵盤相關電路的示意圖。 FIG. 1 is a schematic diagram of related circuits of an optical axis keyboard according to an embodiment of the disclosure.

第2A圖繪示依據本揭露一實施例之一種按鍵單元於未按壓狀態時的剖面圖。 FIG. 2A is a cross-sectional view of a key unit in an unpressed state according to an embodiment of the disclosure.

第2B圖繪示第2A圖所示之按鍵單元於按壓狀態時的剖面圖。 Fig. 2B is a cross-sectional view of the key unit shown in Fig. 2A in a pressed state.

第3圖繪示第2B圖所示之按鍵單元於按壓狀態時所對應的正常偵測電訊號與第一讀取訊號位準示意圖。 FIG. 3 shows a schematic diagram of the normal detection electrical signal and the first read signal level corresponding to the key unit shown in FIG. 2B in the pressed state.

第4圖繪示第2B圖所示之按鍵單元於按壓狀態時所對應的不正常偵測電訊號與第一讀取訊號位準示意圖。 FIG. 4 is a schematic diagram showing the abnormal detection electrical signal and the first read signal level corresponding to the button unit shown in FIG. 2B when it is pressed.

第5圖繪示依據本揭露之第一實施例之光軸鍵盤調整方法的流程圖。 FIG. 5 shows a flowchart of the optical axis keyboard adjustment method according to the first embodiment of the disclosure.

第6A圖繪示實施第5圖所示光軸鍵盤調整方法之按鍵單元之一實施例於按壓狀態時所對應的偵測電訊號與第一讀取訊號位準示意圖。 FIG. 6A is a schematic diagram showing the detection electrical signal and the first read signal level corresponding to an embodiment of the key unit implementing the optical axis keyboard adjustment method shown in FIG. 5 in the pressed state.

第6B圖繪示實施第5圖所示光軸鍵盤調整方法之按鍵單元之另一實施例於按壓狀態時所對應的偵測電訊號與第一讀取訊號位準示意圖。 FIG. 6B is a schematic diagram showing the detected electrical signal and the first read signal level corresponding to another embodiment of the key unit implementing the optical axis keyboard adjustment method shown in FIG. 5 in the pressed state.

第7圖繪示依據本揭露之第二實施例之光軸鍵盤調整方法的流程圖。 FIG. 7 shows a flowchart of the optical axis keyboard adjustment method according to the second embodiment of the present disclosure.

第8圖繪示實施第7圖所示光軸鍵盤調整方法之按鍵單元之一實施例於按壓狀態時所對應的偵測電訊號與第一讀取訊號位準示意圖。 FIG. 8 is a schematic diagram of the detection electrical signal and the first read signal level corresponding to an embodiment of the key unit implementing the optical axis keyboard adjustment method shown in FIG. 7 in the pressed state.

請參照第1圖，其繪示依據本揭露一實施例之光軸鍵盤100相關電路的示意圖。一般光軸鍵盤例如可具有88個以上的按鍵單元、6條以上掃描線與18條以上讀取線。如此6條掃描線與18條讀取線構成一個鍵盤掃描矩陣，且每個按鍵單元係各別設置在一條掃描線與一條讀取線的交會處。如第1圖所示，係以4個按鍵單元110_1~110_4、2條掃描線與2條讀取線為例來作說明，然不限於此。其中按鍵單元110_1係設置於掃描線164_1與讀取線166_1的交會處上，按鍵單元110_2係設置於掃描線164_2與讀取線166_1的交會處上...以此類推，按鍵單元110_4係設置於掃描線164_2與讀取線166_2的交會處上。此光軸鍵盤100包括多條掃描線164_1~164_2、多條讀取線166_1~166_2、控制單元160與多個按鍵單元110_1~110_4。控制單元160耦接至多條掃描線164_1~164_2與多條讀取線166_1~166_2。控制單元160依序輪流對各些掃描線164_1~164_2其中之一傳送一個掃描訊號Scan_1~Scan_2。多個按鍵單元110_1~110_4中之任一包括光源101_1~101_4與偵測元件102_1~102_4。各個光源101_1~101_4依據掃描訊號Scan_1~Scan_2其中之一發出光線。各個按鍵單元110_1~110_4係透過負載元件(例如負載電阻R1~R6)耦接到預定電壓源Vref1~Vref2。在本實施例中，按鍵單元110_1可包含光源101_1、偵測元件102_1與遮光板B1。光源101_1例如是發光二極體(light emitting diode,LED)、偵測元件102_1例如是光電晶體(phototransistor,PT)，遮光板B1係設置於發光二極體101_1與光電晶體102_1之間。發光二極體101_1可透過負載電阻R1耦接至第一掃描線164_1，而接收對應的掃描訊號Scan_1。光電晶體102_1的第一端耦接至按鍵單元110_1之輸出端子PT1，此輸出端子PT1耦接至讀取線166_1，並且透過負載電阻R2耦接至第一參考電壓Vref1。光電晶體102_1的第二端耦接至接地點(ground,GND。在本實施例中，發光二極體101_1可產生(或發出)紅外光，光電晶體102_1可依據是否偵測(或接收)到發光二極體101_1所產生的紅外光以在輸出端子PT1產生偵測電訊號。其中遮光板B1係用於當按鍵單元110_1被按下時遮擋發光二極體101_1所產生的紅外光，以使得光電晶體102_1在輸出端子PT1所產生的偵測電訊號發生改變。其他按鍵單元均具有與按鍵單元110_1類似的架構，例如，按鍵單元110_2可包含發光二極體101_2、光電晶體102_2以及安裝於發光二極體101_2與光電晶體102_2之間的遮光板B2。又例如，按鍵單元110_3可包含發光二極體101_3、光電晶體102_3以及安裝於發光二極體101_3與光電晶體102_3之間的遮光板B3。再舉一例，按鍵單元110_4可包含發光二極體101_4、光電晶體102_4以及安裝於發光二極體101_4與光電晶體102_4之間的遮光板B4。 Please refer to FIG. 1, which shows a schematic diagram of related circuits of the optical axis keyboard 100 according to an embodiment of the present disclosure. A general optical axis keyboard may have, for example, more than 88 key units, more than 6 scan lines, and more than 18 read lines. In this way, 6 scanning lines and 18 reading lines form a keyboard scanning matrix, and each key unit is set on a scanning line and The intersection of a read line. As shown in Fig. 1, the description is made by taking 4 key units 110_1 to 110_4, 2 scanning lines, and 2 reading lines as an example, but it is not limited to this. The key unit 110_1 is arranged at the intersection of the scan line 164_1 and the reading line 166_1, the key unit 110_2 is arranged at the intersection of the scan line 164_2 and the reading line 166_1... and so on, the key unit 110_4 is arranged On the intersection of the scan line 164_2 and the read line 166_2. The optical axis keyboard 100 includes a plurality of scanning lines 164_1 to 164_2, a plurality of reading lines 166_1 to 166_2, a control unit 160, and a plurality of key units 110_1 to 110_4. The control unit 160 is coupled to a plurality of scan lines 164_1 to 164_2 and a plurality of read lines 166_1 to 166_2. The control unit 160 sequentially transmits a scan signal Scan_1 to Scan_2 to one of the scan lines 164_1 to 164_2 in turn. Any one of the plurality of key units 110_1 to 110_4 includes light sources 101_1 to 101_4 and detection elements 102_1 to 102_4. The light sources 101_1 to 101_4 emit light according to one of the scan signals Scan_1 to Scan_2. Each key unit 110_1 to 110_4 is coupled to a predetermined voltage source Vref1 to Vref2 through load elements (for example, load resistors R1 to R6). In this embodiment, the key unit 110_1 may include a light source 101_1, a detection element 102_1, and a light shielding plate B1. The light source 101_1 is, for example, a light emitting diode (LED), the detecting element 102_1 is, for example, a phototransistor (PT), and the light shielding plate B1 is disposed between the light emitting diode 101_1 and the phototransistor 102_1. The light emitting diode 101_1 can be coupled to the first scan line 164_1 through the load resistor R1 to receive the corresponding scan signal Scan_1. The first end of the photoelectric crystal 102_1 is coupled to the output terminal PT1 of the key unit 110_1. The output terminal PT1 is coupled to the read line 166_1 and is coupled to the first reference voltage Vref1 through the load resistor R2. The second end of the photoelectric crystal 102_1 is coupled to the ground point (ground, GND. In this embodiment, the light-emitting two The polar body 101_1 can generate (or emit) infrared light, and the photoelectric crystal 102_1 can generate a detection electrical signal at the output terminal PT1 according to whether the infrared light generated by the light-emitting diode 101_1 is detected (or received). The light shielding plate B1 is used to shield the infrared light generated by the light emitting diode 101_1 when the key unit 110_1 is pressed, so that the detection electrical signal generated by the photoelectric crystal 102_1 at the output terminal PT1 is changed. Other key units have a similar structure to the key unit 110_1. For example, the key unit 110_2 may include a light-emitting diode 101-2, a photoelectric crystal 102_2, and a shading plate B2 installed between the light-emitting diode 101_2 and the photoelectric crystal 102_2. For another example, the key unit 110_3 may include a light emitting diode 101_3, a photoelectric crystal 102_3, and a shading plate B3 installed between the light emitting diode 101_3 and the photoelectric crystal 102_3. For another example, the key unit 110_4 may include a light-emitting diode 101_4, a photoelectric crystal 102_4, and a light-shielding plate B4 installed between the light-emitting diode 101_4 and the photoelectric crystal 102_4.

請參照第2A圖，其繪示依據本揭露一實施例之一種按鍵單元110_1於未按壓狀態時的剖面圖。如第2A圖所示，回復力元件108_1設置在鍵帽104_1下方，當光源101_1依據第一掃描訊號Scan_1發出光線且使用者未按壓鍵帽104_1時，回復力元件108_1向上頂起鍵帽104_1，進而使設置在鍵帽104_1下方的遮光板B1同步向上移動。如此發光二極體101_1所發出的紅外光，可以順利地行進到光電晶體102_1處，使光電晶體102_1偵測到此紅外光而導通，如此使得第1圖所示的輸出端子PT1電壓下降為接地點的0V電壓。 Please refer to FIG. 2A, which shows a cross-sectional view of a key unit 110_1 in an unpressed state according to an embodiment of the disclosure. As shown in FIG. 2A, the restoring force element 108_1 is arranged under the key cap 104_1. When the light source 101_1 emits light according to the first scanning signal Scan_1 and the user does not press the key cap 104_1, the restoring force element 108_1 pushes up the key cap 104_1. In turn, the light-shielding plate B1 arranged under the keycap 104_1 moves upward synchronously. In this way, the infrared light emitted by the light-emitting diode 101_1 can smoothly travel to the photoelectric crystal 102_1, so that the photoelectric crystal 102_1 detects the infrared light and conducts, so that the voltage of the output terminal PT1 shown in Figure 1 drops to be connected 0V voltage at the location.

請參照第2B圖，其繪示第2A圖所示之按鍵單元110_1於按壓狀態時的剖面圖。如第2B圖所示，當光源101_1依據第一掃描訊號Scan_1發出光線且使用者按壓鍵帽104_1時，鍵帽104_1下方的回復力元件108_1被壓縮，鍵帽104_1向下移動，進而使設置在鍵帽104_1下方的遮光板B1同步向下移動。如此遮光板B1阻擋住發光二極體101_1所發出的紅外光，使此紅外光無法行進到光電晶體102_1處，使光電晶體102_1未偵測到此紅外光而斷路，如此使得第1圖所示的輸出端子PT1電壓被第一參考電壓Vref1拉升而大於接地點的0V電壓。 Please refer to FIG. 2B, which shows a cross-sectional view of the key unit 110_1 shown in FIG. 2A in a pressed state. As shown in Figure 2B, when the light source 101_1 follows the first scan When the signal Scan_1 emits light and the user presses the keycap 104_1, the restoring force element 108_1 under the keycap 104_1 is compressed, and the keycap 104_1 moves downward, so that the light shielding plate B1 disposed under the keycap 104_1 moves downward synchronously. In this way, the light-shielding plate B1 blocks the infrared light emitted by the light-emitting diode 101_1, so that the infrared light cannot travel to the photoelectric crystal 102_1, so that the photoelectric crystal 102_1 does not detect the infrared light and is disconnected, so as shown in Figure 1 The voltage of the output terminal PT1 is pulled up by the first reference voltage Vref1 and is greater than the 0V voltage at the ground point.

請參照第3圖，其繪示第2B圖所示之按鍵單元110_1於按壓狀態時所對應的正常偵測電訊號與第一讀取訊號位準Vread_1示意圖。於第一掃描時點T0，控制單元160在第一掃描線164_1上傳送第一掃描訊號Scan_1，此第一掃描訊號Scan_1為一個方波訊號且持續時間為第一掃描時段Ton_1。例如當掃描矩陣包含6條掃描線與18條讀取線時，分配給第一掃描線164_1的掃描週期是800usec，而第一掃描訊號Scan_1方波訊號例如係維持第一掃描時段Ton_1為300usec，如此控制單元160完成6條掃描線的掃描總時間共約需要800usec*6而為4.8msec。當控制單元160完成一次所有6條掃描線的掃描循環總時間小於6msec，可以避免當使用者快速連續按壓第一掃描線164_1的多個按鍵單元，但因為第一掃描線164_1連續兩次掃描時間間隔太久而未偵測到所有按鍵單元被按壓的掉鍵問題。光源101_1依據第一掃描訊號Scan_1發出光線，此光線具有最大發光強度Lmax。偵測元件102_1偵測光線而產生偵測電訊號，此偵測電訊號具有電壓最大值VH。控制單元160於第一讀取時點Tread_1讀取偵測電訊號而得到第一讀取訊號Read_1，此第一讀取時點Tread_1與第一掃描時點T0間隔第一延遲時段Tdelay_1。此第一延遲時段Tdelay_1例如可為第一掃描時段Ton_1的50%~70%，第3圖係以第一延遲時段Tdelay_1為第一掃描時段Ton_1(例如為300usec)的60%為例來作說明，亦即第一延遲時段Tdelay_1為180usec。當此光軸鍵盤100剛出廠，光源101_1發光效能尚未衰退時，對應於第一讀取時點Tread_1所發出光線係維持在最大發光強度Lmax，亦即於自第一掃描時點T0加上第一延遲時段Tdelay_1的時點，光源101_1所發出光線係維持在最大發光強度Lmax。如此於第一讀取時點Tread_1，控制單元160讀取偵測電訊號而得到第一讀取訊號位準Vread_1符合按鍵單元110_1之按壓狀態之位準範圍(例如大於臨界位準Vth的1.5V)，控制單元160能正確地判斷按鍵單元110_1目前是處於按壓狀態。 Please refer to FIG. 3, which shows a schematic diagram of the normal detection electrical signal and the first read signal level Vread_1 corresponding to the key unit 110_1 shown in FIG. 2B in the pressed state. At the first scanning time point T0, the control unit 160 transmits the first scanning signal Scan_1 on the first scanning line 164_1, the first scanning signal Scan_1 is a square wave signal and the duration is the first scanning period Ton_1. For example, when the scan matrix includes 6 scan lines and 18 read lines, the scan period allocated to the first scan line 164_1 is 800 usec, and the first scan signal Scan_1 square wave signal maintains the first scan period Ton_1 to be 300 usec, for example, In this way, the total time required for the control unit 160 to complete the scanning of 6 scan lines is about 800 usec*6, which is 4.8 msec. When the control unit 160 completes one scan cycle of all 6 scan lines, the total time is less than 6msec, which can prevent the user from pressing multiple key units of the first scan line 164_1 quickly and continuously, but because the first scan line 164_1 scans twice in a row. The interval is too long to detect the key drop problem when all key units are pressed. The light source 101_1 emits light according to the first scan signal Scan_1, and the light has the maximum luminous intensity Lmax. The detecting element 102_1 detects light to generate a detecting electrical signal, and the detecting electrical signal has a maximum voltage VH. The control unit 160 reads the detection electrical signal at the first reading time point Tread_1 to obtain the first reading signal Read_1. The first reading time point Tread_1 and the first scanning time point T0 are separated by a first delay period Tdelay_1. The first delay period Tdelay_1 can be, for example, 50% to 70% of the first scanning period Ton_1. The first delay period Tdelay_1 is used as the first scanning period in Fig. 3 60% of the segment Ton_1 (for example, 300usec) is taken as an example for illustration, that is, the first delay period Tdelay_1 is 180usec. When the optical axis keyboard 100 has just been shipped from the factory and the luminous efficiency of the light source 101_1 has not yet degraded, the light emitted by the first reading point Tread_1 is maintained at the maximum luminous intensity Lmax, that is, the first delay is added from the first scanning point T0 At the time of the time period Tdelay_1, the light emitted by the light source 101_1 is maintained at the maximum luminous intensity Lmax. In this way, at the first reading time point Tread_1, the control unit 160 reads the detection electrical signal and obtains the first read signal level Vread_1 that corresponds to the level range of the pressing state of the key unit 110_1 (for example, 1.5V greater than the critical level Vth) , The control unit 160 can correctly determine that the key unit 110_1 is currently in a pressed state.

請參照第4圖，其繪示第2B圖所示之按鍵單元110_1於按壓狀態時所對應的不正常偵測電訊號與第一讀取訊號位準Vread_1示意圖。類似地，控制單元160於第一掃描時點T0於第一掃描線164_1傳送第一掃描訊號Scan_1，此第一掃描訊號Scan_1為一個方波訊號且持續時間為第一掃描時段Ton_1。光源101_1依據第一掃描訊號Scan_1發出光線，雖然此光線仍具有最大發光強度Lmax；但是因為此光軸鍵盤100已經被使用一段時間，光源101_1發光效能已經衰退，故此光源101_1需要更長時間的第一掃描訊號Scan_1驅動才能達到此最大發光強度Lmax。因此在施加相同的第一掃描訊號Scan_1下，光源101_1延後輸出最大發光強度Lmax，且維持在最大發光強度Lmax的時段長度變短。如第4圖所示，因應於此最大發光強度Lmax的時點延後發生且時段長度縮短，偵測元件102_1對應所產生的偵測電訊號抵達電壓最大值VH的時點也對應地延後發生且維持在電壓最大值VH 的時段長度也縮短，使得偵測電訊號波形劣化不再類似理想的方波，而會比較類似和緩上升下降的弦波。當控制單元160仍然於第一讀取時點Tread_1讀取偵測電訊號所得到的第一讀取訊號位準Vread_1會變成不符合按鍵單元110_1之按壓狀態之位準範圍(例如小於臨界位準Vth的1.5V)，如此導致控制單元160錯誤地判斷按鍵單元110_1目前是處於未按壓狀態，導致光軸鍵盤100功能失常，因此需要本揭露之光軸鍵盤調整方法來校正此錯誤狀態。 Please refer to FIG. 4, which shows a schematic diagram of the abnormal detection electrical signal and the first read signal level Vread_1 corresponding to the key unit 110_1 shown in FIG. 2B in the pressed state. Similarly, the control unit 160 transmits the first scan signal Scan_1 on the first scan line 164_1 at the first scan time T0. The first scan signal Scan_1 is a square wave signal and lasts for the first scan period Ton_1. The light source 101_1 emits light according to the first scan signal Scan_1, although the light still has the maximum luminous intensity Lmax; however, because the optical axis keyboard 100 has been used for a period of time, the luminous efficiency of the light source 101_1 has declined, so the light source 101_1 needs a longer period of time. The maximum luminous intensity Lmax can be reached only when the scanning signal Scan_1 is driven. Therefore, when the same first scanning signal Scan_1 is applied, the light source 101_1 outputs the maximum luminous intensity Lmax after a delay, and the length of the period during which the maximum luminous intensity Lmax is maintained becomes shorter. As shown in Figure 4, in response to the time point of the maximum luminous intensity Lmax being delayed and the period length is shortened, the detection element 102_1 corresponds to the time point when the generated detection signal reaches the maximum voltage VH. Maintain at the maximum voltage VH The length of the time period is also shortened, so that the deterioration of the detected electrical signal waveform is no longer similar to an ideal square wave, but is more similar to a sine wave that rises and falls slowly. When the control unit 160 is still at the first reading time point Tread_1, the first read signal level Vread_1 obtained by reading the detected electrical signal will become a level range that does not meet the pressing state of the key unit 110_1 (for example, less than the critical level Vth) This causes the control unit 160 to incorrectly determine that the key unit 110_1 is currently in an unpressed state, causing the optical axis keyboard 100 to malfunction. Therefore, the optical axis keyboard adjustment method disclosed in the present disclosure is required to correct this error state.

請參照第5圖，其繪示依據本揭露第一實施例之光軸鍵盤100調整方法的流程圖，此方法包含下列步驟502~510。於步驟502中，藉由類比數位轉換單元162，控制單元160能判斷此光軸鍵盤100中是否有任一按鍵單元被按壓。以下係以第一按鍵單元110_1為例來作說明，然不限於此，以此類推，控制單元160藉由在不同時點對不同掃描線施加掃描訊號，並從不同讀取線接收讀取訊號，如此能判斷光軸鍵盤100中是否有任一按鍵單元被按壓。如第1圖與第3圖所示，當按鍵單元110_1未被按壓時，光電晶體102_1偵測到此紅外光而導通，故當於第一讀取時點Tread_1進行讀取，類比數位轉換單元162所讀取到的第一讀取訊號位準Vread_1為接地點電壓0V。相對地，當按鍵單元110_1被按壓時，光電晶體102_1未偵測到此紅外光而斷路，故第一參考電壓Vref1會拉高輸出端子PT1電壓，使類比數位轉換單元162所讀取到的第一讀取訊號位準Vread_1會高於0V。控制單元160藉由於第一掃描時點T0於第一掃描線164_1上施加第一掃描訊號Scan_1，並於第一讀取時點Tread_1於第一讀取線166_1讀取第一讀取訊號位準Vread_1，判斷第一讀取訊號位準Vread_1是否高於0V，就能判斷第一按鍵單元110_1是否被按壓，若是則執行步驟504，若否則停留在步驟502。於步驟504中，藉由類比數位轉換單元162，控制單元160判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍，例如判斷第一讀取訊號位準Vread_1是否低於按壓狀態的臨界位準Vth，例如1.5V。當第一讀取訊號位準Vread_1低於1.5V，則代表已經超出按鍵單元之按壓狀態位準範圍，故需執行步驟505使光軸鍵盤100開啟校正模式；若第一讀取訊號位準Vread_1高於1.5V，則代表並未超出按鍵單元之按壓狀態位準範圍，如此則執行步驟510並不會啟動校正模式。於步驟505中，光軸鍵盤100進入校正模式。於步驟506中，藉由類比數位轉換單元162，控制單元160判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍(例如判斷第一讀取訊號位準Vread_1是否低於按壓狀態的臨界位準Vth為1.5V)，若是則執行步驟508，若否則執行步驟507。於步驟507中，控制單元160記錄修正過的掃描訊號之時段長度，作為控制單元160稍後施加第一掃描訊號Scan_1的時段長度依據。於步驟508中，控制單元160加長第一掃描訊號Scan_1的時段長度第一預定量而得到修正過的第一掃描訊號Scan_1’，在得到此修正過的第一掃描訊號Scan_1’之後，控制單元160回到步驟506，(1)依據修正過的第一掃描訊號Scan_1’，重複使光源101_1依據此修正過的第一掃描訊號Scan_1’發出光線，並且(2)再次判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍。第一預定量可為此未修正過的原始第一掃描訊號Scan_1的時段長度的預定百分比。例如當原始第一掃描訊號Scan_1的時段長度為300usec時，則每執行步驟508一次，修正過的第一掃描訊號Scan_1’增加原始第一掃描訊號Scan_1時段長度300usec的10%，亦即修正過的第一掃描訊號Scan_1’的時段長度每次增加30usec。如此於步驟506~508迴圈中，當第一讀取訊號位準Vread_1超出此些按鍵單元之按壓狀態位準範圍時，控制單元160於每次回圈中加長掃描訊號的時段長度第一預定量而得到修正過的第一掃描訊號Scan_1’，直到第一讀取訊號位準Vread_1符合按鍵單元之按壓狀態位準範圍。於步驟510中，光軸鍵盤100結束校正模式。 Please refer to FIG. 5, which shows a flowchart of the method for adjusting the optical axis keyboard 100 according to the first embodiment of the present disclosure. The method includes the following steps 502 to 510. In step 502, through the analog-digital conversion unit 162, the control unit 160 can determine whether any key unit in the optical axis keyboard 100 is pressed. The following takes the first key unit 110_1 as an example for description, but it is not limited to this. By analogy, the control unit 160 applies scan signals to different scan lines at different points in time, and receives read signals from different read lines. In this way, it can be determined whether any key unit in the optical axis keyboard 100 is pressed. As shown in Figures 1 and 3, when the key unit 110_1 is not pressed, the photoelectric crystal 102_1 detects the infrared light and is turned on, so when the reading is performed at the first reading point Tread_1, the analog-to-digital conversion unit 162 The first read signal level Vread_1 read is 0V at the ground point. In contrast, when the key unit 110_1 is pressed, the photoelectric crystal 102_1 does not detect the infrared light and is disconnected. Therefore, the first reference voltage Vref1 will pull up the voltage of the output terminal PT1 to make the first reference voltage read by the analog-to-digital conversion unit 162 A read signal level Vread_1 will be higher than 0V. The control unit 160 applies the first scan signal Scan_1 on the first scan line 164_1 at the first scan time T0, and reads the first read on the first read line 166_1 at the first read time Tread_1 The signal level Vread_1 is judged whether the first read signal level Vread_1 is higher than 0V, and then it can be judged whether the first key unit 110_1 is pressed, if it is, step 504 is executed, if not, step 502 is stopped. In step 504, through the analog-to-digital conversion unit 162, the control unit 160 determines whether the first read signal level Vread_1 exceeds the pressing state level range of the key unit, for example, determines whether the first read signal level Vread_1 is lower than the press The critical level Vth of the state, for example, 1.5V. When the first read signal level Vread_1 is lower than 1.5V, it means that the pressing state level range of the key unit has been exceeded, so step 505 needs to be performed to enable the optical axis keyboard 100 to open the calibration mode; if the first read signal level Vread_1 If the voltage is higher than 1.5V, it means that the pressing state level range of the key unit is not exceeded, so performing step 510 will not start the calibration mode. In step 505, the optical axis keyboard 100 enters the calibration mode. In step 506, through the analog-digital conversion unit 162, the control unit 160 determines whether the first read signal level Vread_1 exceeds the pressing state level range of the key unit (for example, determines whether the first read signal level Vread_1 is lower than the pressed state level The critical level Vth of the state is 1.5V), if yes, go to step 508, if not, go to step 507. In step 507, the control unit 160 records the period length of the corrected scanning signal as a basis for the period length of the control unit 160 applying the first scanning signal Scan_1 later. In step 508, the control unit 160 lengthens the period length of the first scan signal Scan_1 by a first predetermined amount to obtain the corrected first scan signal Scan_1'. After obtaining the corrected first scan signal Scan_1', the control unit 160 Returning to step 506, (1) according to the corrected first scanning signal Scan_1', repeatedly causing the light source 101_1 to emit light according to the corrected first scanning signal Scan_1', and (2) determining the first read signal level again Whether Vread_1 exceeds the pressing state level range of the key unit. The first predetermined amount can be this uncorrected original first scan The predetermined percentage of the period length of the signal Scan_1. For example, when the period length of the original first scan signal Scan_1 is 300usec, every time step 508 is performed, the corrected first scan signal Scan_1' increases by 10% of the period length 300usec of the original first scan signal Scan_1, that is, the corrected first scan signal Scan_1. The period length of the first scan signal Scan_1' increases by 30usec each time. So in the loops of steps 506~508, when the first read signal level Vread_1 exceeds the pressing state level range of these key units, the control unit 160 lengthens the period length of the scan signal by the first predetermined amount in each loop The corrected first scan signal Scan_1' is obtained until the first read signal level Vread_1 meets the pressing state level range of the key unit. In step 510, the optical axis keyboard 100 ends the calibration mode.

請參照第6A圖，其繪示第5圖所示之按鍵單元之一實施例於按壓狀態時所對應的偵測電訊號與第一讀取訊號位準Vread_1示意圖。於第一掃描時點T0，控制單元160在第一掃描線164_1上傳送此修正過的第一掃描訊號Scan_1’，此修正過的第一掃描訊號Scan_1’為一個方波訊號且持續時間為修正過的第一掃描時段Ton_1’。如第6A圖所示，假設此時步驟508被執行過2次，而每執行步驟508一次增加30usec掃描時段長度，故此修正過的第一掃描訊號Scan_1’所對應的修正過的第一掃描時段Ton_1’為360usec。光源101_1依據修正過的第一掃描訊號Scan_1’發出光線，因為光源101_1發光效能已經衰退，故此光源101_1發出光線強度的上升部分曲線和第4圖發光強度上升部分曲線相同(左半部實線和虛線重合部分)，需要更長時間的掃描訊號驅動才能達到最大發光強度Lmax。但因為此修正過的第一掃描訊號Scan_1’加長後係具有修正過的第一掃描時段Ton_1’為 360usec，故和虛線所示的第4圖發光強度曲線相比，光線維持在最大發光強度Lmax的時段長度也對應增加60usec。偵測元件102_1偵測光線而產生偵測電訊號，此偵測電訊號對應具有電壓最大值VH。 Please refer to FIG. 6A, which shows a schematic diagram of the detected electrical signal and the first read signal level Vread_1 corresponding to an embodiment of the key unit shown in FIG. 5 in the pressed state. At the first scan time T0, the control unit 160 transmits the modified first scan signal Scan_1' on the first scan line 164_1. The modified first scan signal Scan_1' is a square wave signal and the duration is modified The first scan period Ton_1'. As shown in Figure 6A, assuming that step 508 has been executed twice at this time, and the length of the scanning period is increased by 30usec each time step 508 is performed, the corrected first scanning period corresponding to the corrected first scanning signal Scan_1' Ton_1' is 360usec. The light source 101_1 emits light according to the modified first scan signal Scan_1'. Because the luminous efficiency of the light source 101_1 has been degraded, the curve of the rising part of the light intensity of the light source 101_1 is the same as the curve of the rising part of the luminous intensity in Figure 4 (the left half of the solid line and The dotted line overlaps), it takes a longer time to drive the scanning signal to reach the maximum luminous intensity Lmax. But because the modified first scan signal Scan_1’ is lengthened, the modified first scan period Ton_1’ is 360usec, so compared with the luminous intensity curve shown in the dashed line in Figure 4, the length of time that the light stays at the maximum luminous intensity Lmax is also increased by 60usec. The detecting element 102_1 detects light to generate a detecting electrical signal, and the detecting electrical signal correspondingly has a maximum voltage VH.

如第6A圖所示，對應於步驟506，藉由類比數位轉換單元162，控制單元160於第二讀取時點Tread_2讀取偵測電訊號而得到第一讀取訊號位準Vread_1，進而判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍。此第二讀取時點Tread_2與第一掃描時點T0間隔一個修正過的延遲時段，亦即當控制單元160加長原始第一掃描訊號Scan_1的時段長度而得到此修正過的第一掃描訊號Scan_1’之後，控制單元160也同時加長第一延遲時段Tdelay_1的時段長度第二預定量而得到修正過的第一延遲時段Tdelay_1’。控制單元160回到步驟506，重複執行(1)依據修正過的第一掃描訊號Scan_1’使光源101_1依據此修正過的第一掃描訊號Scan_1’發出光線，並且(2)於自第一掃描時點T0間隔此修正過的第一延遲時段Tdelay_1’之時點讀取偵測電訊號，再次判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍。類似第4圖的設計，此延遲時段例如可為修正過的第一掃描時段Ton_1’的50%~70%，第6A圖係以修正過的第一延遲時段Tdelay_1’為修正過的第一掃描時段Ton_1’的60%為例來作說明，亦即修正過的第一延遲時段Tdelay_1’為216usec；如此對應到光源101_1發出光線係維持在最大發光強度Lmax的時段中央處附近。當控制單元160於第二讀取時點Tread_2讀取偵測電訊號所得到的第一讀取訊號位準 Vread_1符合按鍵單元110_1之按壓狀態之位準範圍(例如大於臨界位準Vth的1.5V)時，代表控制單元160恢復能正確判斷按鍵單元110_1是處於按壓狀態，控制單元160會執行步驟507~510以結束校正模式。另一方面，當第一讀取訊號位準Vread_1仍未對應到光源101_1發出光線維持在最大發光強度Lmax的時段中時，如此第一讀取訊號位準Vread_1可能仍超出此按鍵單元110_1之按壓狀態之位準範圍(例如第一讀取訊號位準Vread_1仍然小於臨界位準Vth的1.5V)時，代表控制單元160仍未能正確判斷按鍵單元110_1目前是否處於按壓狀態，此時控制單元160會執行步驟508使光軸鍵盤100維持在校正模式中。如第5圖所示，如此每執行步驟506~508的迴圈一次，便會使修正過的第一掃描訊號Scan_1’增加30usec。直到於自第一掃描時點T0間隔修正過的第一延遲時段Tdelay_1’的時點，控制單元160讀取偵測電訊號所得的第一讀取訊號位準Vread_1符合此按鍵單元110_1之按壓狀態之位準範圍(例如大於臨界位準Vth的1.5V)。 As shown in FIG. 6A, corresponding to step 506, by the analog-to-digital conversion unit 162, the control unit 160 reads the detected electrical signal at the second read time point Tread_2 to obtain the first read signal level Vread_1, and then determines the first read signal level Vread_1. 1. Whether the read signal level Vread_1 exceeds the pressing state level range of the key unit. The second reading time point Tread_2 is separated from the first scanning time point T0 by a modified delay period, that is, when the control unit 160 increases the period length of the original first scan signal Scan_1 to obtain the modified first scan signal Scan_1' At the same time, the control unit 160 also lengthens the period length of the first delay period Tdelay_1 by a second predetermined amount to obtain the modified first delay period Tdelay_1'. The control unit 160 returns to step 506, and repeatedly executes (1) according to the corrected first scan signal Scan_1' to make the light source 101_1 emit light according to the corrected first scan signal Scan_1', and (2) at the time of the first scan The detected electrical signal is read at the time of the corrected first delay period Tdelay_1' at T0 interval, and it is again determined whether the first read signal level Vread_1 exceeds the pressing state level range of the key unit. Similar to the design in Figure 4, this delay period can be, for example, 50%~70% of the modified first scan period Ton_1'. In Figure 6A, the modified first delay period Tdelay_1' is the modified first scan. Take 60% of the period Ton_1' as an example for illustration, that is, the modified first delay period Tdelay_1' is 216usec; this corresponds to that the light emitted by the light source 101_1 is maintained near the center of the period of the maximum luminous intensity Lmax. When the control unit 160 reads the first read signal level obtained by detecting the electrical signal at the second read time point Tread_2 When Vread_1 meets the level range of the pressed state of the key unit 110_1 (for example, 1.5V greater than the critical level Vth), it means that the control unit 160 can correctly determine that the key unit 110_1 is in the pressed state, and the control unit 160 will perform steps 507~510 To end the calibration mode. On the other hand, when the first read signal level Vread_1 still does not correspond to the period when the light emitted by the light source 101_1 is maintained at the maximum luminous intensity Lmax, so the first read signal level Vread_1 may still exceed the pressing of the key unit 110_1 When the level range of the state (for example, the first read signal level Vread_1 is still less than 1.5V of the critical level Vth), it means that the control unit 160 still fails to correctly determine whether the key unit 110_1 is currently in the pressed state. At this time, the control unit 160 Step 508 will be executed to maintain the optical axis keyboard 100 in the calibration mode. As shown in Fig. 5, each time the loop of steps 506 to 508 is executed, the corrected first scan signal Scan_1' will increase by 30usec. Until the time point of the first delay period Tdelay_1' adjusted from the first scanning time point T0 interval, the control unit 160 reads the first read signal level Vread_1 obtained by detecting the electrical signal to match the position of the pressing state of the key unit 110_1 Range (for example, 1.5V greater than the critical level Vth).

請參照第6B圖，其繪示第5圖所示之按鍵單元之另一實施例於按壓狀態時所對應的偵測電訊號與第一讀取訊號位準Vread_1示意圖。類似第6A圖，於第一掃描時點T0，控制單元160在第一掃描線164_1上傳送此修正過的第一掃描訊號Scan_1’，此修正過的第一掃描訊號Scan_1’為一個方波訊號且持續時間為修正過的第一掃描時段Ton_1’。如第6B圖所示，假設此時步驟508被執行過2次，故此修正過的第一掃描訊號Scan_1’所對應的修正過的第一掃描時段Ton_1’為360usec。光源101_1依據修正過的第一掃描訊號 Scan_1’發出光線。當光源101_1發光效能已經衰退，故此光源101_1發出光線強度的上升部分曲線和第4圖發光強度上升部分曲線(左半部實線和虛線重合部分)相同，需要更長時間的掃描訊號驅動才能達到最大發光強度Lmax。但因為此修正過的第一掃描訊號Scan_1’加長係具有修正過的第一掃描時段Ton_1’為360usec，故和虛線所示的第4圖發光強度曲線相比，光線維持在最大發光強度Lmax的時段長度也對應增加60usec。偵測元件102_1偵測光線而產生偵測電訊號，此偵測電訊號對應具有電壓最大值VH。 Please refer to FIG. 6B, which shows a schematic diagram of the detected electrical signal and the first read signal level Vread_1 corresponding to another embodiment of the button unit shown in FIG. 5 in the pressed state. Similar to FIG. 6A, at the first scan time point T0, the control unit 160 transmits the modified first scan signal Scan_1' on the first scan line 164_1, and the modified first scan signal Scan_1' is a square wave signal and The duration is the modified first scanning period Ton_1'. As shown in FIG. 6B, it is assumed that step 508 has been executed twice at this time, so the modified first scan period Ton_1' corresponding to the modified first scan signal Scan_1' is 360usec. The light source 101_1 is based on the corrected first scan signal Scan_1’ emits light. When the luminous efficiency of the light source 101_1 has declined, the rising part of the light intensity curve of the light source 101_1 is the same as the rising part of the luminous intensity curve in Figure 4 (the left half of the solid line and the dotted line overlap), and it takes longer to drive the scanning signal to achieve Maximum luminous intensity Lmax. However, because the modified first scan signal Scan_1' is extended with a modified first scan period Ton_1' of 360usec, compared with the luminous intensity curve shown in the dashed line in Figure 4, the light remains at the maximum luminous intensity Lmax The length of the time period is correspondingly increased by 60usec. The detecting element 102_1 detects light to generate a detecting electrical signal, and the detecting electrical signal correspondingly has a maximum voltage VH.

如第6B圖所示，對應於步驟506，當控制單元160加長掃描訊號的時段長度之後，控制單元160回到步驟506，重複執行(1)使光源101_1依據此修正過的第一掃描訊號Scan_1’發出光線，並且(2)於自第一掃描時點T0間隔原始的第一延遲時段Tdelay_1的時段長度的實數倍之時點處，控制單元160讀取偵測電訊號至少兩次而得到至少第一讀取訊號位準Vread_1與第二讀取訊號位準Vread_2。類似第4圖所示的原始第一延遲時段Tdelay_1為180usec，故第一掃描時點T0、第一讀取時點Tread_1與第二讀取時點Tread_2彼此均間隔相同的180usec延遲時段；亦即控制單元160分別(1)於自第一掃描時點T0延後此原始第一延遲時段Tdelay_1的時段長度1倍(例如180usec)的第一讀取時點Tread_1，讀取偵測電訊號而得到第一讀取訊號位準Vread_1，並且(2)於自第一掃描時點T0延後此原始第一延遲時段Tdelay_1的時段長度2倍(例如360usec)的第二讀取時點Tread_2，讀取偵測電訊號而得到第二讀取訊號位準Vread_2。如此當第一讀取時點Tread_1和第二讀取時點Tread_2兩者至少其中之一係對應到光源101_1發出光線維持在最大發光強度Lmax的時段中時，則第一讀取訊號位準Vread_1和第二讀取訊號位準Vread_2至少二者其中之一會符合按鍵單元110_1之按壓狀態之位準範圍(例如大於臨界位準Vth的1.5V)，代表控制單元160恢復能正確判斷按鍵單元110_1是處於按壓狀態時，控制單元160會執行步驟507~510以結束校正模式。另一方面，當第一讀取時點Tread_1和第二讀取時點Tread_2兩者均仍未對應到光源101_1發出光線維持在最大發光強度Lmax的時段中時，則第一讀取訊號位準Vread_1和第二讀取訊號位準Vread_2兩者可能仍會超出此按鍵單元110_1之按壓狀態之位準範圍(例如兩個讀取訊號位準大於0V，但小於臨界位準Vth的1.5V)，代表控制單元160仍未能正確判斷按鍵單元110_1目前是否處於按壓狀態，此時控制單元160會執行步驟508，使光軸鍵盤100維持在校正模式中繼續執行步驟506~508的迴圈。 As shown in FIG. 6B, corresponding to step 506, when the control unit 160 lengthens the period of the scanning signal, the control unit 160 returns to step 506 and repeats (1) to make the light source 101_1 based on the corrected first scanning signal Scan_1 'Light is emitted, and (2) at the time point when the period length of the original first delay period Tdelay_1 is a real number multiple of the interval from the first scanning time point T0, the control unit 160 reads the detected electrical signal at least twice to obtain at least the first The read signal level Vread_1 and the second read signal level Vread_2. Similar to the original first delay period Tdelay_1 shown in FIG. 4 is 180usec, the first scanning time point T0, the first reading time point Tread_1, and the second reading time point Tread_2 are all separated by the same 180usec delay period; that is, the control unit 160 (1) Respectively (1) at the first reading time point Tread_1 which is 1 times (for example, 180usec) of the original first delay period Tdelay_1 after the first scanning time point T0, the detected electrical signal is read to obtain the first read signal Level Vread_1, and (2) at the second reading time point Tread_2 that is twice the length of the original first delay period Tdelay_1 after the first scanning time point T0 (for example, 360usec), the detected electrical signal is read to obtain the Second, the read signal level is Vread_2. in this way When at least one of the first reading time point Tread_1 and the second reading time point Tread_2 corresponds to the period when the light emitted by the light source 101_1 is maintained at the maximum luminous intensity Lmax, the first reading signal level Vread_1 and the second reading signal level Vread_1 The read signal level Vread_2 at least one of the two will meet the level range of the pressed state of the key unit 110_1 (for example, 1.5V greater than the critical level Vth), which means that the control unit 160 can correctly determine whether the key unit 110_1 is pressed. In the state, the control unit 160 executes steps 507 to 510 to end the calibration mode. On the other hand, when both the first reading time point Tread_1 and the second reading time point Tread_2 do not correspond to the period when the light emitted by the light source 101_1 is maintained at the maximum luminous intensity Lmax, then the first read signal levels Vread_1 and Both the second read signal level Vread_2 may still exceed the level range of the pressing state of the key unit 110_1 (for example, the two read signal levels are greater than 0V but less than 1.5V of the critical level Vth), representing control The unit 160 still fails to correctly determine whether the key unit 110_1 is currently in the pressed state. At this time, the control unit 160 executes step 508 to maintain the optical axis keyboard 100 in the calibration mode and continue to execute the loops of steps 506 to 508.

於第6B圖所示實施例中，係以原始第一延遲時段Tdelay_1的時段長度為180usec，且控制單元160自第一掃描時點T0延後原始第一延遲時段Tdelay_1的時段長度的1倍時點處和2倍時點處，分別讀取偵測電訊號而得到兩次讀取訊號為例來作說明，然不限於此。控制單元160也可選擇性地於自第一掃描時點T0延後原始第一延遲時段Tdelay_1的時段長度的1~N倍時點處對偵測電訊號進行多次讀取而得到多個讀取訊號，N可為大於1的實數。當類比數位轉換單元162執行速度夠快，則N例如可為：1、1.4、1.8與2.2，代表控制單元160自第一掃描時點T0起分別延後180usec、252usec、324usec與396usec時點處分別讀取偵測電訊號而得到4次讀取訊號。如第5圖所示，如此每執行步驟506~508的迴圈一次，便會使修正過的第一掃描訊號Scan_1’增加30usec。重複此迴圈步驟，直到控制單元160對偵測電訊號進行多次讀取所得的多個讀取訊號位準(例如第一讀取訊號位準Vread_1~第二讀取訊號位準Vread_2)其中之一符合此按鍵單元110_1之按壓狀態之位準範圍(例如大於臨界位準Vth的1.5V)。 In the embodiment shown in FIG. 6B, the period length of the original first delay period Tdelay_1 is 180usec, and the control unit 160 delays from the first scanning time point T0 by 1 time the period length of the original first delay period Tdelay_1. At the time point of 2 times and 2 times, the detection signal is read separately and the read signal is obtained twice as an example for illustration, but it is not limited to this. The control unit 160 can also selectively read the detected electrical signal multiple times at a time point of 1~N times the length of the original first delay period Tdelay_1 after the first scanning time point T0 to obtain multiple read signals. , N can be a real number greater than 1. When the execution speed of the analog-to-digital conversion unit 162 is fast enough, N can be, for example: 1, 1.4, 1.8, and 2.2, The representative control unit 160 reads the detected electrical signals at the time points of 180usec, 252usec, 324usec, and 396usec respectively delayed from the first scan time T0 to obtain 4 read signals. As shown in Fig. 5, each time the loop of steps 506 to 508 is executed, the corrected first scan signal Scan_1' will increase by 30usec. Repeat this loop step until the control unit 160 performs multiple readings of the detected electrical signal to obtain multiple read signal levels (for example, the first read signal level Vread_1~the second read signal level Vread_2). One meets the level range of the pressed state of the key unit 110_1 (for example, 1.5V greater than the critical level Vth).

請參照第7圖，其繪示依據本揭露之第二實施例之光軸鍵盤100調整方法的流程圖，此方法包含下列步驟702~710。於步驟702中，藉由類比數位轉換單元162，控制單元160能判斷此光軸鍵盤100中是否有任一按鍵單元被按壓；以下係以按鍵單元110_1為例來作說明，然不限於此，以此類推，控制單元160藉由在不同時點對不同掃描線施加掃描訊號，並從不同讀取線接收讀取訊號，如此能判斷光軸鍵盤100中是否有任一按鍵單元被按壓。如第1圖與第3圖所示，當按鍵單元110_1未被按壓時，光電晶體102_1偵測到此紅外光而導通，故當於第一讀取時點Tread_1進行讀取，類比數位轉換單元162所讀取到的第一讀取訊號位準Vread_1為接地點電壓0V。相對地，當按鍵單元110_1被按壓時，光電晶體102_1未偵測到此紅外光而斷路，故第一參考電壓Vref1會拉高輸出端子PT1電壓，使類比數位轉換單元162所讀取到的第一讀取訊號位準Vread_1會高於0V。控制單元160藉由於第一掃描時點T0於第一掃描線164_1上施加第一掃描訊號Scan_1，並於第一讀取時點Tread_1於第一讀取線166_1上讀取得到第一讀取訊號位準Vread_1，並比較第一讀取訊號位準Vread_1是否高於0V，就能判斷第一按鍵單元是否被按壓，若是則執行步驟704，若否則停留在步驟702。於步驟704中，藉由類比數位轉換單元162，控制單元160判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍(例如低於臨界位準Vth的1.5V)。若是，則代表第一讀取訊號位準Vread_1低於1.5V已經超出按鍵單元之按壓狀態位準範圍，則執行步驟705；若否，則代表第一讀取訊號位準Vread_1高於1.5V並且符合按鍵單元之按壓狀態之位準範圍(例如高於臨界位準Vth的1.5V)，則執行步驟710。於步驟705中，光軸鍵盤100進入校正模式。於步驟706中，藉由類比數位轉換單元162，控制單元160判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍，若是則執行步驟708，若否則執行步驟707。於步驟707中，控制單元160記錄修正過的第一延遲時段Tdelay_1’之時段長度，作為控制單元160稍後讀取偵測電訊號時所需的延遲時段的時段長度依據。於步驟708中，控制單元160對原始第一延遲時段Tdelay_1的時段長度增加第二預定量而得到一個修正過的第一延遲時段Tdelay_1’，在得到此修正過的第一延遲時段Tdelay_1’之後，控制單元160回到步驟706，重複執行(1)依據第一掃描訊號Scan_1，使光源101_1依據第一掃描訊號Scan_1發出光線之步驟，並且(2)於自第一掃描時點T0加上延遲此修正過的第一延遲時段Tdelay_1’的時點，控制單元160再次讀取偵測電訊號而得到第一讀取訊號位準Vread_1，並判斷第一讀取訊號位準Vread_1是否超出按鍵單元之按壓狀態位準範圍。第二預定量例如可為未修正過的原始第一延遲時段Tdelay_1的時段長度的一個預定百分比；例如原始第一延遲時段Tdelay_1的時段長度為180usec，而每次執行步驟708，則增加原始第一延遲時段Tdelay_1的時段長度180usec的10%，亦即每執行步驟708一次，則第一延遲時段Tdelay_1的時段長度每次增加18usec。於步驟710中，光軸鍵盤100結束校正模式。 Please refer to FIG. 7, which shows a flowchart of the method for adjusting the optical axis keyboard 100 according to the second embodiment of the present disclosure. The method includes the following steps 702 to 710. In step 702, through the analog-digital conversion unit 162, the control unit 160 can determine whether any key unit in the optical axis keyboard 100 is pressed; the following takes the key unit 110_1 as an example for description, but it is not limited to this. By analogy, the control unit 160 can determine whether any key unit in the optical axis keyboard 100 is pressed by applying scanning signals to different scanning lines at different time points and receiving reading signals from different reading lines. As shown in Figures 1 and 3, when the key unit 110_1 is not pressed, the photoelectric crystal 102_1 detects the infrared light and is turned on, so when the reading is performed at the first reading point Tread_1, the analog-to-digital conversion unit 162 The first read signal level Vread_1 read is 0V at the ground point. In contrast, when the key unit 110_1 is pressed, the photoelectric crystal 102_1 does not detect the infrared light and is disconnected. Therefore, the first reference voltage Vref1 will pull up the voltage of the output terminal PT1 to make the first reference voltage read by the analog-to-digital conversion unit 162 A read signal level Vread_1 will be higher than 0V. The control unit 160 applies the first scan signal Scan_1 on the first scan line 164_1 at the first scan time point T0, and reads the first scan signal Scan_1 on the first read line 166_1 at the first read time point Tread_1 to obtain the first read signal The level Vread_1 is compared with whether the first read signal level Vread_1 is higher than 0V, and then it can be determined whether the first key unit is pressed. In step 704, through the analog-to-digital conversion unit 162, the control unit 160 determines whether the first read signal level Vread_1 exceeds the pressing state level range of the key unit (for example, 1.5V lower than the critical level Vth). If yes, it means that the first read signal level Vread_1 is lower than 1.5V and has exceeded the pressing state level range of the key unit, then go to step 705; if not, it means that the first read signal level Vread_1 is higher than 1.5V and If the level range of the pressing state of the key unit is met (for example, 1.5V higher than the critical level Vth), step 710 is executed. In step 705, the optical axis keyboard 100 enters the calibration mode. In step 706, through the analog-to-digital conversion unit 162, the control unit 160 determines whether the first read signal level Vread_1 exceeds the pressing state level range of the key unit, if yes, execute step 708, if otherwise, execute step 707. In step 707, the control unit 160 records the modified first delay period Tdelay_1' as a basis for the delay period required when the control unit 160 reads the detected electrical signal later. In step 708, the control unit 160 adds a second predetermined amount to the length of the original first delay period Tdelay_1 to obtain a modified first delay period Tdelay_1'. After obtaining the modified first delay period Tdelay_1', The control unit 160 returns to step 706 to repeatedly execute (1) the step of making the light source 101_1 emit light according to the first scanning signal Scan_1 according to the first scanning signal Scan_1, and (2) adding a delay to this correction from the first scanning time point T0 When the first delay period Tdelay_1' has passed, the control unit 160 reads the detection signal again to obtain the first read signal level Vread_1, and determines whether the first read signal level Vread_1 exceeds the pressing state bit of the key unit Standard scope. The second predetermined amount may be, for example, a predetermined percentage of the period length of the original first delay period Tdelay_1 that has not been corrected; for example, the period length of the original first delay period Tdelay_1 is 180 usec, and each time step 708 is executed, the original The period length of the first delay period Tdelay_1 is 10% of 180usec, that is, every time step 708 is performed, the period length of the first delay period Tdelay_1 increases by 18usec each time. In step 710, the optical axis keyboard 100 ends the calibration mode.

請參照第8圖，其繪示實施第7圖所示光軸鍵盤100調整方法之按鍵單元之一實施例於按壓狀態時所對應的偵測電訊號與第一讀取訊號位準Vread_1示意圖。第8圖的情境類似第4圖，於第一掃描時點T0，控制單元160在第一掃描線164_1上傳送第一掃描訊號Scan_1，此第一掃描訊號Scan_1為一個方波訊號且持續時間為第一掃描時段Ton_1。光源101_1依據原始第一掃描訊號Scan_1發出光線，且如第4圖所示，光源101_1發光效能已經衰退，故第8圖所示光源101_1發出光線強度的曲線和第4圖所示發光強度曲線相同，需要更長時間的掃描訊號驅動才能達到最大發光強度Lmax。偵測元件102_1偵測光線而產生偵測電訊號，此偵測電訊號對應具有電壓最大值VH。如第4圖所示的原始第一延遲時段Tdelay_1為180usec，於自第一掃描時點T0加上延遲時段180usec時點處，控制單元160所讀取到的第一讀取訊號位準Vread_1小於按壓狀態之臨界位準Vth的1.5V。如第8圖所示，其繪示情境是因為第一讀取訊號位準Vread_1小於按壓狀態之臨界位準Vth的1.5V，故第7圖所示步驟706~708的迴圈已經被執行過2次，故第8圖中所示的修正過的第一延遲時段Tdelay_1’為216usec，亦即為180usec的原始第一延遲時段Tdelay_1的120%。 Please refer to FIG. 8, which shows a schematic diagram of the detection electrical signal and the first read signal level Vread_1 corresponding to an embodiment of the key unit implementing the adjustment method of the optical axis keyboard 100 shown in FIG. 7 in the pressed state. The scenario in Figure 8 is similar to that in Figure 4. At the first scanning time point T0, the control unit 160 transmits the first scanning signal Scan_1 on the first scanning line 164_1. The first scanning signal Scan_1 is a square wave signal and has a duration of the first scanning signal Scan_1. One scanning period Ton_1. The light source 101_1 emits light according to the original first scan signal Scan_1, and as shown in Fig. 4, the luminous efficiency of the light source 101_1 has declined, so the light intensity curve of the light source 101_1 shown in Fig. 8 is the same as the luminous intensity curve shown in Fig. 4 , It takes longer time to drive the scan signal to reach the maximum luminous intensity Lmax. The detecting element 102_1 detects light to generate a detecting electrical signal, and the detecting electrical signal correspondingly has a maximum voltage VH. As shown in FIG. 4, the original first delay period Tdelay_1 is 180usec. At the time point T0 plus the delay period 180usec from the first scanning time point T0, the first read signal level Vread_1 read by the control unit 160 is smaller than the pressed state The critical level Vth is 1.5V. As shown in Figure 8, the situation is shown because the first read signal level Vread_1 is less than 1.5V of the critical level Vth of the pressed state, so the loop of steps 706~708 shown in Figure 7 has been executed. 2 times, so the modified first delay period Tdelay_1' shown in Figure 8 is 216usec, which is 120% of the original first delay period Tdelay_1 of 180usec.

如第8圖所示，對應於步驟706，控制單元160於第三讀取時點Tread_3讀取偵測電訊號而得到第一讀取訊號位準Vread_1；此第三讀取時點Tread_3與第一掃描時點T0間隔此修正過的第一延遲時段Tdelay_1’(例如為原始第一延遲時段Tdelay_1的180usec的120%而為216usec)；亦即控制單元160在第一掃描時點T0延後216usec時點讀取偵測電訊號而得到第一讀取訊號位準Vread_1。當第三讀取時點Tread_3係對應到光源101_1發出光線維持在最大發光強度Lmax的時段中時，如此第一讀取訊號位準Vread_1會符合此按鍵單元110_1之按壓狀態之位準範圍(例如大於臨界位準Vth的1.5V)，代表控制單元160恢復能正確判斷按鍵單元110_1目前是處於按壓狀態，此時控制單元160會執行步驟707~710以結束校正模式。另一方面，當第三讀取時點Tread_3仍未對應到光源101_1發出光線維持在最大發光強度Lmax的時段中時，如此第一讀取訊號位準Vread_1可能仍會超出此按鍵單元110_1之按壓狀態之位準範圍(例如仍然小於臨界位準Vth的1.5V)，代表控制單元160仍未能正確判斷按鍵單元110_1是否處於按壓狀態，此時控制單元160會執行步驟708，使光軸鍵盤100維持在校正模式中，繼續執行步驟706~708的迴圈。如此每執行步驟706~708的迴圈一次，便會使修正過的第一延遲時段Tdelay_1’增加18usec，直到第一讀取訊號位準Vread_1符合此按鍵單元110_1之按壓狀態之位準範圍(例如大於臨界位準Vth的1.5V)。 As shown in FIG. 8, corresponding to step 706, the control unit 160 reads the detected electrical signal at the third read time point Tread_3 to obtain the first read signal level Vread_1; this third read time point Tread_3 and the first scan Time point T0 is separated by this modified first delay period Tdelay_1' (for example, 120% of 180usec of the original first delay period Tdelay_1 and It is 216usec); that is, the control unit 160 reads the detected electrical signal at a time point of 216usec after the first scanning time point T0 to obtain the first read signal level Vread_1. When the third reading time point Tread_3 corresponds to the period when the light emitted by the light source 101_1 is maintained at the maximum luminous intensity Lmax, the first reading signal level Vread_1 will meet the level range of the pressing state of the key unit 110_1 (for example, greater than The critical level Vth is 1.5V), which means that the control unit 160 can correctly determine that the key unit 110_1 is currently in the pressed state. At this time, the control unit 160 will execute steps 707 to 710 to end the calibration mode. On the other hand, when the third reading point Tread_3 still does not correspond to the period when the light source 101_1 emits light to maintain the maximum luminous intensity Lmax, the first reading signal level Vread_1 may still exceed the pressing state of the key unit 110_1. The level range (for example, it is still less than 1.5V of the critical level Vth), which means that the control unit 160 still fails to correctly determine whether the key unit 110_1 is in the pressed state. At this time, the control unit 160 executes step 708 to maintain the optical axis keyboard 100 In the calibration mode, continue to execute the loop of steps 706 to 708. In this way, every time the loop of steps 706~708 is executed, the modified first delay period Tdelay_1' will increase by 18usec until the first read signal level Vread_1 meets the level range of the pressing state of the key unit 110_1 (for example 1.5V greater than the critical level Vth).

本揭露提出一種調整方法，偵測元件偵測光線而產生偵測電訊號。控制單元160自第一掃描時點T0間隔一個延遲時段Tdelay_1之時點讀取偵測電訊號而得到第一讀取訊號位準Vread_1。當第一讀取訊號位準Vread_1超出按鍵單元110_1的按壓狀態位準範圍時，控制單元160加長掃描訊號Scan_1的時段長度第一預定量而得到修正過的掃描訊號Scan_1’，或是加長延遲時段Tdelay_1的時段長度第二預定量而得到修正過的第一延遲時段Tdelav_1’。如此能使光軸鍵盤，在光源發光效能衰退而使發出光線強度減低狀態下，藉由加長掃描訊號Scan_1’的時段長度或加長延遲時段Tdelay_1來延遲讀取偵測電訊號，使光軸鍵盤的控制單元160仍能正確判斷按鍵單元110_1是否被按壓，避免光軸鍵盤的控制單元160誤判按鍵單元110_1並未被按壓的問題。 The present disclosure proposes an adjustment method in which a detection element detects light and generates a detection electrical signal. The control unit 160 reads the detected electrical signal from the first scanning time point T0 when a delay period Tdelay_1 is interval to obtain the first read signal level Vread_1. When the first read signal level Vread_1 exceeds the pressing state level range of the key unit 110_1, the control unit 160 lengthens the period length of the scan signal Scan_1 by a first predetermined amount to obtain the corrected scan signal Scan_1', or lengthens the delay period The period length of Tdelay_1 is the second predetermined amount to obtain the modified first delay period Tdelav_1'. In this way, the optical axis keyboard can be extended by lengthening the The period length of the scanning signal Scan_1' or the delay period Tdelay_1 is lengthened to delay the reading of the detection electrical signal, so that the control unit 160 of the optical axis keyboard can still correctly determine whether the key unit 110_1 is pressed, so as to prevent the control unit 160 of the optical axis keyboard from misjudging the key The problem that the unit 110_1 is not pressed.

綜上所述，雖然本揭露已以實施例揭露如上，然其並非用以限定本揭露。本揭露所屬技術領域中具有通常知識者，在不結束本揭露之精神和範圍內，當可作各種之更動與潤飾。因此，本揭露之保護範圍當視後附之申請專利範圍所界定者為準。 To sum up, although the present disclosure has been disclosed as above through the embodiments, it is not intended to limit the present disclosure. Those with ordinary knowledge in the technical field to which this disclosure belongs can make various changes and modifications without ending the spirit and scope of this disclosure. Therefore, the scope of protection of this disclosure shall be subject to the scope of the attached patent application.

502~510:流程步驟 502~510: Process steps

Claims

一種光軸鍵盤調整方法，該光軸鍵盤具有一按鍵單元，包括：一控制單元於一第一掃描時點於複數條掃描線其中之一傳送一掃描訊號；一光源依據該掃描訊號發出一光線；一偵測元件偵測該光線而產生一偵測電訊號；該控制單元讀取該偵測電訊號而得到一第一讀取訊號；當該第一讀取訊號位準超出該按鍵單元之一按壓狀態位準範圍時，該控制單元加長該掃描訊號的時段長度一第一預定量而得到一修正過的該掃描訊號。 An optical axis keyboard adjustment method. The optical axis keyboard has a key unit, including: a control unit transmits a scanning signal to one of a plurality of scanning lines at a first scanning time; a light source emits a light according to the scanning signal; A detection element detects the light to generate a detection electrical signal; the control unit reads the detection electrical signal to obtain a first read signal; when the first read signal level exceeds one of the key units When the state level range is pressed, the control unit lengthens the period length of the scan signal by a first predetermined amount to obtain a corrected scan signal.

如申請專利範圍第1項所述之方法，其中，當該第一讀取訊號位準超出該按壓狀態位準範圍時，該第一預定量係為未修正過的該掃描訊號的時段長度的一預定百分比。 For example, the method described in item 1 of the scope of patent application, wherein, when the first read signal level exceeds the pressing state level range, the first predetermined amount is an uncorrected period length of the scanning signal A predetermined percentage.

如申請專利範圍第1項所述之方法，其中該方法更包括：在得到該修正過的該掃描訊號之後，依據該修正過的該掃描訊號，重複執行該光源依據該掃描訊號發出該光線之步驟。 For example, the method described in item 1 of the scope of patent application, wherein the method further comprises: after obtaining the corrected scanning signal, according to the corrected scanning signal, repeatedly executing the light source emitting the light according to the scanning signal step.

如申請專利範圍第1項所述之方法，其中，當該第一讀取訊號位準超出該按壓狀態位準範圍時，該控制單元使該光軸鍵盤開啟一校正模式，當該第一讀取訊號符合該按壓狀態位準範圍時，該控制單元使該光軸鍵盤結束該校正模式。 The method described in item 1 of the scope of patent application, wherein when the first reading signal level exceeds the pressing state level range, the control unit enables the optical axis keyboard to start a calibration mode, and when the first reading When the signal is in the pressing state level range, the control unit causes the optical axis keyboard to end the calibration mode.

如申請專利範圍第4項所述之方法，其中該方法更包括：當該第一讀取訊號符合該按壓狀態位準範圍，且該光軸鍵盤結束該校正模式時，該控制單元記錄該修正過的該掃描訊號之時段長度。 The method according to item 4 of the scope of patent application, wherein the method further includes: when the first read signal meets the pressing state level range and the optical axis keyboard ends the correction mode, the control unit records the correction The duration of the scanning signal that has passed.

如申請專利範圍第1項所述之方法，其中該方法更包括：當該控制單元未加長該掃描訊號的時段長度時，該控制單元自該第一掃描時點間隔一延遲時段之時點讀取該偵測電訊號而得到該第一讀取訊號；當該控制單元加長該掃描訊號的時段長度之後，該控制單元加長該延遲時段的時段長度一第二預定量而得到一修正過的該延遲時段，重複執行(1)該光源依據該掃描訊號發出該光線之步驟，且(2)該控制單元於自該第一掃描時點間隔該修正過的該延遲時段之時點讀取該偵測電訊號之步驟。 For the method described in claim 1, wherein the method further includes: when the control unit does not lengthen the period length of the scanning signal, the control unit reads the time when the first scanning time is separated by a delay period. Detect the electrical signal to obtain the first read signal; after the control unit lengthens the period length of the scanning signal, the control unit lengthens the period length of the delay period by a second predetermined amount to obtain a modified delay period , Repeating the steps of (1) the light source emits the light according to the scanning signal, and (2) the control unit reads the detection signal at the time point of the corrected delay period from the first scanning time point step.

如申請專利範圍第1項所述之方法，其中該方法更包括：當該控制單元未加長該掃描訊號的時段長度時，該控制單元自該第一掃描時點間隔一延遲時段之時點讀取該偵測電訊號而得到該第一讀取訊號；當該控制單元加長該掃描訊號的時段長度之後，重複執行(1)該光源依據該掃描訊號發出該光線之步驟，且(2)該控制單元於自該第一掃描時點間隔該延遲時段的時段長度的實數倍之時點處讀取該偵測電訊號至少兩次而得到至少該第一讀取訊號與一第二讀取訊號。 For the method described in claim 1, wherein the method further includes: when the control unit does not lengthen the period length of the scanning signal, the control unit reads the time when the first scanning time is separated by a delay period. Detect the electrical signal to obtain the first read signal; after the control unit lengthens the period of the scanning signal, repeat the steps of (1) the light source emits the light according to the scanning signal, and (2) the control unit The detection electrical signal is read at least twice at a time point separated from the first scanning time point by a real number multiple of the period length of the delay period to obtain at least the first read signal and a second read signal.

如申請專利範圍第7項所述之方法，其中當該第一讀取訊號與該第二讀取訊號均超出該按壓狀態位準範圍時，該光軸鍵盤開啟在一校正模式，當該第一讀取訊號與該第二讀取訊號至少其中之一符合該按壓狀態位準範圍時時，該光軸鍵盤結束該校正模式。 For example, the method described in item 7 of the scope of patent application, wherein when the first read signal and the second read signal both exceed the pressing state level range, the optical axis keyboard is turned on in a calibration mode, and when the first read signal A read signal and the second read signal When at least one of them meets the pressing state level range, the optical axis keyboard ends the calibration mode.

一種光軸鍵盤調整方法，該光軸鍵盤具有一按鍵單元，其中該方法包括：一控制單元於一第一掃描時點於複數條掃描線其中之一傳送一掃描訊號；一光源依據該掃描訊號發出一光線；一偵測元件偵測該光線而產生一偵測電訊號；該控制單元自該第一掃描時點間隔一延遲時段之時點讀取該偵測電訊號而得到一第一讀取訊號；當該第一讀取訊號位準超出該按鍵單元之一按壓狀態位準範圍時，該控制單元加長該延遲時段的時段長度一第二預定量而得到一修正過的該延遲時段。 An optical axis keyboard adjustment method, the optical axis keyboard has a key unit, wherein the method includes: a control unit transmits a scanning signal to one of a plurality of scanning lines during a first scanning; a light source emits a scanning signal according to the scanning signal A light; a detection element detects the light to generate a detection electrical signal; the control unit reads the detection electrical signal from the first scanning time point with a delay period to obtain a first read signal; When the first read signal level exceeds a pressing state level range of the key unit, the control unit lengthens the delay period by a second predetermined amount to obtain a modified delay period.

如申請專利範圍第9項所述之方法，其中，當該第一讀取訊號位準超出該按壓狀態位準範圍時，該第二預定量係為未修正過的該延遲時段的時段長度的一預定百分比。 For example, the method described in item 9 of the scope of patent application, wherein, when the first read signal level exceeds the pressing state level range, the second predetermined amount is an uncorrected period length of the delay period A predetermined percentage.

如申請專利範圍第9項所述之方法，其中該方法更包括：在得到該修正過的該延遲時段之後，依據該修正過的該延遲時段，重複執行該光源依據該掃描訊號發出該光線與該控制單元自該第一掃描時點間隔該修正過的該延遲時段之時點讀取該偵測電訊號之步驟。 For example, the method according to claim 9, wherein the method further comprises: after the modified delay period is obtained, according to the modified delay period, repeatedly executing the light source emitting the light and the scanning signal according to the scanning signal. The control unit reads the step of detecting the electrical signal from the time point of the corrected delay period between the first scanning time point.

如申請專利範圍第9項所述之方法，其中，當該第一讀取訊號位準超出該按壓狀態位準範圍時，該控制單元使該光軸鍵盤開啟一校正模式，當該第一讀取訊號符合該按壓狀態位準範圍時，該控制單元使該光軸鍵盤結束該校正模式。 For example, the method described in item 9 of the scope of patent application, wherein, when the first reading signal level exceeds the pressing state level range, the control unit enables the optical axis keyboard to start a calibration mode, and when the first reading When the signal is in the pressing state level range, the control unit causes the optical axis keyboard to end the calibration mode.

如申請專利範圍第12項所述之方法，其中該方法更包括：當該第一讀取訊號符合該按壓狀態位準範圍，且該光軸鍵盤結束該校正模式時，該控制單元記錄該修正過的該延遲時段之時段長度。 The method described in item 12 of the scope of patent application, wherein the method further includes: when the first read signal conforms to the pressing state level range and the optical axis keyboard ends the calibration mode, the control unit records the correction The length of the delay period that has passed.

一種光軸鍵盤，包括：複數掃描線；一控制單元，耦接至該複數掃描線，該控制單元對各該些掃描線其中之一傳送一掃描訊號；複數個按鍵單元，且該複數個按鍵單元中之任一包括：一光源，依據該掃描訊號發出一光線；以及一偵測元件，當偵測到該光線時，該偵測元件產生一偵測電訊號，該控制單元讀取該偵測電訊號而得到一第一讀取訊號；其中，當該第一讀取訊號位準超出該複數個按鍵單元其中之一的一按壓狀態位準範圍時，該控制單元加長該掃描訊號的時段長度一第一預定量而得到一修正過的該掃描訊號。 An optical axis keyboard includes: a plurality of scan lines; a control unit coupled to the plurality of scan lines, the control unit transmits a scan signal to one of the scan lines; a plurality of key units, and the plurality of keys Any one of the units includes: a light source that emits a light according to the scanning signal; and a detection element. When the light is detected, the detection element generates a detection electrical signal, and the control unit reads the detection The electrical signal is measured to obtain a first read signal; wherein, when the first read signal level exceeds a pressing state level range of one of the plurality of key units, the control unit lengthens the period of the scan signal The length is a first predetermined amount to obtain a corrected scanning signal.

如申請專利範圍第14項所述之光軸鍵盤，其中當該第一讀取訊號位準超出該按壓狀態位準範圍時，該第一預定量係為未修正過的該掃描訊號的時段長度的一預定百分比。 For the optical axis keyboard described in item 14 of the scope of patent application, when the first reading signal level exceeds the pressing state level range, the first predetermined amount is the uncorrected period length of the scanning signal A predetermined percentage of.

如申請專利範圍第14項所述之光軸鍵盤，其中在得到該修正過的該掃描訊號之後，該光源重複依據該掃描訊號發出該光線。 For the optical axis keyboard described in item 14 of the scope of patent application, after the corrected scanning signal is obtained, the light source repeatedly emits the light according to the scanning signal.

如申請專利範圍第14項所述之光軸鍵盤，其中，當該第一讀取訊號位準超出該按壓狀態位準範圍時，該控制單元使該光軸鍵盤開啟一校正模式，當該第一讀取訊號符合該按壓狀態位準範圍時，該控制單元使該光軸鍵盤結束該校正模式。 For example, the optical axis keyboard according to item 14 of the scope of patent application, wherein, when the first read signal level exceeds the pressing state level range, the control unit enables the optical axis keyboard to start a calibration mode, and when the first read signal level exceeds the pressed state level range, When a read signal meets the pressing state level range, the control unit causes the optical axis keyboard to end the calibration mode.

如申請專利範圍第17項所述之光軸鍵盤，其中，當該第一讀取訊號符合該按壓狀態位準範圍，且該光軸鍵盤結束該校正模式時，該控制單元記錄該修正過的該掃描訊號之時段長度。 The optical axis keyboard according to item 17 of the scope of patent application, wherein, when the first read signal meets the pressing state level range and the optical axis keyboard ends the calibration mode, the control unit records the corrected The duration of the scanning signal.

如申請專利範圍第14項所述之光軸鍵盤，其中，當該控制單元未加長該掃描訊號的時段長度時，該控制單元自一第一掃描時點間隔一延遲時段之時點讀取該偵測電訊號而得到該第一讀取訊號；當該控制單元加長該掃描訊號的時段長度之後，該控制單元加長該延遲時段的時段長度一第二預定量而得到一修正過的該延遲時段，重複執行(1)該光源依據該掃描訊號發出該光線之步驟，且(2)該控制單元於自該第一掃描時點間隔該延遲時段之時點讀取該偵測電訊號之步驟。 For the optical axis keyboard described in item 14 of the scope of patent application, when the control unit does not lengthen the period length of the scanning signal, the control unit reads the detection at a time when a delay period is separated from a first scanning time point The first read signal is obtained from the electrical signal; after the control unit lengthens the period length of the scanning signal, the control unit lengthens the period length of the delay period by a second predetermined amount to obtain a modified delay period, repeating Perform (1) the step of emitting the light from the light source according to the scanning signal, and (2) the step of reading the detection electrical signal by the control unit at a time interval of the delay period from the first scanning time point.

如申請專利範圍第14項所述之光軸鍵盤，其中，當該控制單元未加長該掃描訊號的時段長度時，該控制單元自一第一掃描時點間隔一延遲時段之時點讀取該偵測電訊號而得到該第一讀取訊號；當該控制單元加長該掃描訊號的時段長度之後，重複執行(1)該光源依據該掃描訊號發出該光線之步驟，且(2)該控制單元於自該第一掃描時點間隔該延遲時段的時段長度的實數倍之時點處讀取該偵測電訊號至少兩次而得到至少該第一讀取訊號與一第二讀取訊號。 For the optical axis keyboard described in item 14 of the scope of patent application, when the control unit does not lengthen the period length of the scanning signal, the control unit reads the detection at a time when a delay period is separated from a first scanning time point Electrical signal to obtain the first read signal; after the control unit lengthens the period of the scanning signal, Repeat the steps of (1) the light source emits the light according to the scanning signal, and (2) the control unit reads the detection signal at a time point that is a real number multiple of the length of the delay period from the first scanning time point At least twice to obtain at least the first read signal and a second read signal.

如申請專利範圍第20項所述之光軸鍵盤，其中，當該第一讀取訊號與該第二讀取訊號均超出該按壓狀態位準範圍時，該光軸鍵盤開啟在該校正模式，當該第一讀取訊號與該第二讀取訊號至少其中之一符合該按壓狀態位準範圍時時，該光軸鍵盤結束該校正模式。 For example, the optical axis keyboard according to item 20 of the scope of patent application, wherein when the first read signal and the second read signal both exceed the pressing state level range, the optical axis keyboard is turned on in the calibration mode, When at least one of the first read signal and the second read signal meets the pressing state level range, the optical axis keyboard ends the calibration mode.

如申請專利範圍第14項所述之光軸鍵盤，其中，該控制單元具有一類比數位轉換電路，該控制單元係透過該類比數位轉換電路來讀取該偵測電訊號。 For the optical axis keyboard described in item 14 of the scope of patent application, the control unit has an analog-to-digital conversion circuit, and the control unit reads the detection electrical signal through the analog-to-digital conversion circuit.

一種光軸鍵盤，包括：複數掃描線；一控制單元，耦接至該複數掃描線，該控制單元於一第一掃描時點對各該些掃描線其中之一傳送一掃描訊號；一控制單元，該控制單元具有複數掃描線，該控制單元對各該些掃描線傳送一掃描訊號；複數個按鍵單元，且該複數個按鍵單元中之任一包括：一光源，依據該掃描訊號發出一光線；以及一偵測元件，當偵測到該光線時，該偵測元件產生一第一讀取訊號；其中該控制單元於一第二時點讀取該第一讀取訊號，該第二時點與該第一掃描時點間隔一延遲時段，當該第一讀取訊號位準超出該複數個按鍵單元其中之一的一按壓狀態位準範圍時，該控制單元加長該延遲時段的時段長度一第二預定量而得到一修正過的該延遲時段。 An optical axis keyboard includes: a plurality of scan lines; a control unit coupled to the plurality of scan lines; the control unit transmits a scan signal to one of the scan lines at a first scan point; and a control unit, The control unit has a plurality of scan lines, and the control unit transmits a scan signal to each of the scan lines; a plurality of key units, and any one of the plurality of key units includes: a light source, which emits a light according to the scan signal; And a detecting element, when the light is detected, the detecting element generates a first read signal; The control unit reads the first read signal at a second time point, the second time point is separated from the first scanning time point by a delay period, when the first read signal level exceeds one of the plurality of key units When one is within a pressing state level range, the control unit lengthens the period length of the delay period by a second predetermined amount to obtain a modified delay period.

如申請專利範圍第23項所述之光軸鍵盤，其中，當該第一讀取訊號位準超出該按壓狀態位準範圍時，該第二預定量係為未修正過的該延遲時段的時段長度的一預定百分比。 For example, the optical axis keyboard described in item 23 of the scope of patent application, wherein, when the first read signal level exceeds the pressing state level range, the second predetermined amount is the uncorrected period of the delay period A predetermined percentage of length.

如申請專利範圍第23項所述之光軸鍵盤，其中，在得到該修正過的該延遲時段之後，該光源重複依據該修正過的該掃描訊號發出該光線，且該控制單元自該第一掃描時點間隔該延遲時段之時點讀取一偵測電訊號。 For the optical axis keyboard described in item 23 of the scope of patent application, wherein, after the modified delay period is obtained, the light source repeatedly emits the light according to the modified scanning signal, and the control unit starts from the first Scanning time points to read a detected electrical signal at the time point of the delay period.

如申請專利範圍第23項所述之光軸鍵盤，其中，當該第一讀取訊號位準超出該按壓狀態位準範圍時，該控制單元使該光軸鍵盤開啟一校正模式，當該第一讀取訊號符合該按壓狀態位準範圍時，該控制單元使該光軸鍵盤結束該校正模式。 For example, the optical axis keyboard according to item 23 of the scope of patent application, wherein when the first read signal level exceeds the pressing state level range, the control unit enables the optical axis keyboard to start a calibration mode, and when the first read signal level exceeds the level range of the pressing state, When a read signal meets the pressing state level range, the control unit causes the optical axis keyboard to end the calibration mode.

如申請專利範圍第26項所述之光軸鍵盤，其中，當該第一讀取訊號符合該按壓狀態位準範圍，且該光軸鍵盤結束該校正模式時，該控制單元記錄該修正過的該延遲時段之時段長度。 The optical axis keyboard described in item 26 of the scope of patent application, wherein, when the first read signal meets the pressing state level range and the optical axis keyboard ends the calibration mode, the control unit records the corrected The length of the delay period.