TWI724955B - Capacitor test system and generating device of adjustable voltage drop for micro short - Google Patents
Capacitor test system and generating device of adjustable voltage drop for micro short Download PDFInfo
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- G—PHYSICS
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
Description
本發明涉及一種電容測試系統,該系統包含一可調式微短壓降產生裝置與一電容測試裝置,其中該電容測試裝置是用於檢測一待測電容是否具有一微短路缺陷,而該可調式微短壓降產生裝置是用於產生一可調壓降,用以輸入至該電容測試裝置,以檢測該電容測試裝置是否運作正常。 The present invention relates to a capacitance testing system. The system includes an adjustable micro-short voltage drop generating device and a capacitance testing device, wherein the capacitance testing device is used to detect whether a capacitor to be tested has a micro-short defect, and the adjustable The micro-short voltage drop generating device is used to generate an adjustable voltage drop for input to the capacitance testing device to detect whether the capacitance testing device is operating normally.
目前在檢測電路板上兩根金屬線間耦合電容時,常會遭遇微短路(Micro short)的現象,即兩根相鄰金屬線間有一微小之電阻值(例如10mΩ或100mΩ),當加上一直流電壓一段時間後,該兩相鄰金屬線有可能相互導通,而產生一電壓降,此時該兩相鄰金屬線間具有一微短路。例如,導電性陽極細絲物(CAF(Conductive Anodic Filament),或稱陽極性玻璃纖維絲漏電現象)即為一電路板上的微短路。 At present, when detecting the coupling capacitance between two metal wires on a circuit board, a micro short is often encountered, that is, there is a small resistance value (for example, 10mΩ or 100mΩ) between two adjacent metal wires, and when one is added After the DC voltage is applied for a period of time, the two adjacent metal wires may be connected to each other, resulting in a voltage drop. At this time, there is a slight short circuit between the two adjacent metal wires. For example, a conductive anode filament (CAF (Conductive Anodic Filament), or anode glass fiber filament leakage phenomenon) is a micro short circuit on a circuit board.
用於檢測兩根金屬線間耦合電容之微短路缺陷的一電容測試裝置的重要性自不待言,但如何確保該電 容測試裝置運作正常,亦是一值得深思的問題。 It goes without saying that the importance of a capacitance testing device for detecting the micro-short-circuit defect of the coupling capacitance between two metal wires is self-evident, but how to ensure that the electrical The normal operation of the capacity test device is also a question worth pondering.
職是之故,發明人鑒於習知技術之缺失,乃思及改良發明之意念,終能發明出本案之「電容測試系統及可調式微短壓降產生裝置」。 For this reason, in view of the lack of conventional technology, the inventor thought and improved the idea of the invention, and finally invented the "capacitance test system and adjustable micro-short voltage drop generating device" of this case.
本發明的主要目的在於提供一種電容測試系統,包含一可調式微短壓降產生裝置與一電容測試裝置,其中該電容測試裝置是用以判斷一電路板的相鄰兩線路間之一耦合電容在一充電過程中,是否會產生一微小的壓降,當該耦合電容在該充電過程中產生了該微小的壓降時,則該相鄰二線路間存在一微短路的缺陷;而該可調式微短壓降產生裝置是用於產生一可調壓降,且使該電容測試裝置接收該可調壓降以檢測該電容測試裝置是否運作正常。 The main purpose of the present invention is to provide a capacitance test system, including an adjustable micro-short voltage drop generating device and a capacitance test device, wherein the capacitance test device is used to determine a coupling capacitance between two adjacent lines of a circuit board During a charging process, will a slight voltage drop be generated? When the coupling capacitor generates the slight voltage drop during the charging process, there is a short-circuit defect between the two adjacent lines; The adjustable short voltage drop generating device is used to generate an adjustable voltage drop, and the capacitance testing device receives the adjustable voltage drop to detect whether the capacitance testing device is operating normally.
本案之又一主要目的在於提供一種電容測試系統,包含一可調式微短壓降產生裝置,包括一可調限流電阻,具一第一端與一第二端,一開關,具一第一端與一第二端,其中該開關之該第二端接地,且該開關之該第一端電連接於該可調限流電阻之該第二端,一可調直流電源,具一第一端與一第二端,其中該可調直流電源的該第一端電連接於該可調限流電阻之該第一端,且該可調直流電源的該第二端接地,一固定值電容,具一第一端與一第二端,其中該固定值電容之該第二端電連接於該可調直流電源之該第一端與該可調限流電阻之該第一端,以及一直 流輸入電源,具一第一端與一第二端,其中該直流輸入電源之該第一端電連接於該固定值電容之該第一端,該直流輸入電源之該第二端接地,且該產生裝置是用於在該固定值電容之該第一端與該接地間產生一可調壓降,以及一電容測試裝置,與該可調式微短壓降產生裝置耦接,用以接收該可調壓降以檢測該電容測試裝置。 Another main purpose of this case is to provide a capacitance test system, including an adjustable short voltage drop generator, including an adjustable current limiting resistor, with a first terminal and a second terminal, a switch, and a first terminal. Terminal and a second terminal, wherein the second terminal of the switch is grounded, and the first terminal of the switch is electrically connected to the second terminal of the adjustable current limiting resistor, an adjustable DC power supply, with a first Terminal and a second terminal, wherein the first terminal of the adjustable DC power supply is electrically connected to the first terminal of the adjustable current limiting resistor, and the second terminal of the adjustable DC power supply is grounded, a fixed value capacitor , Having a first terminal and a second terminal, wherein the second terminal of the fixed value capacitor is electrically connected to the first terminal of the adjustable DC power supply and the first terminal of the adjustable current limiting resistor, and a constant The current input power source has a first terminal and a second terminal, wherein the first terminal of the DC input power source is electrically connected to the first terminal of the fixed value capacitor, and the second terminal of the DC input power source is grounded, and The generating device is used to generate an adjustable voltage drop between the first end of the fixed-value capacitor and the ground, and a capacitor testing device is coupled to the adjustable short voltage drop generating device for receiving the The voltage drop can be adjusted to detect the capacitance test device.
本案之下一主要目的在於提供一種可調式微短壓降產生裝置,包含一第一與一第二輸出端,一直流輸入電源,其一端電連接於該第一輸出端,其另一端接地且電連接於該第二輸出端,一固定值電容,其一端電連接於該第一輸出端,一可調限流電阻,其一端電連接於該固定值電容之另一端,一開關,其一端電連接於該可調限流電阻之另一端,其另一端接地,以及一可調直流電壓源,具一第一端電連接於該固定值電容之另一端,及另一端接地,且用以產生一可調電壓,俾藉調整該可調電壓,在該第一輸出端與該該第二輸出端間產生一可調壓降。 A main purpose of this case is to provide an adjustable short voltage drop generator, which includes a first output terminal and a second output terminal, a DC input power source, one end of which is electrically connected to the first output terminal, and the other end is grounded and Electrically connected to the second output end, a fixed value capacitor, one end of which is electrically connected to the first output end, an adjustable current limiting resistor, one end of which is electrically connected to the other end of the fixed value capacitor, a switch, and one end Is electrically connected to the other end of the adjustable current-limiting resistor, the other end of which is grounded, and an adjustable DC voltage source, with a first end electrically connected to the other end of the fixed value capacitor, and the other end is grounded, and used for An adjustable voltage is generated, and by adjusting the adjustable voltage, an adjustable voltage drop is generated between the first output terminal and the second output terminal.
1:電容測試系統 1: Capacitance test system
11:可調式微短壓降產生裝置 11: Adjustable micro-short pressure drop generator
12:電容檢測裝置 12: Capacitance detection device
C1:固定值電容 C 1 : fixed value capacitor
Cin:待測電容/耦合電容 C in : Capacitance to be measured/coupling capacitance
R1:第一內阻 R 1 : first internal resistance
R2:第二內阻 R 2 : second internal resistance
Rx:可調限流電阻 R x : Adjustable current limiting resistor
SW1:開關 SW 1 : switch
Vin:輸入電壓 V in : input voltage
Vout:輸出電壓 V out : output voltage
Vs:直流輸入電源 V s : DC input power
Vx:可調直流電源/可調直流電壓源 V x : adjustable DC power supply/adjustable DC voltage source
第一圖:其係顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置之電路圖。 The first figure: It shows a circuit diagram of an adjustable short voltage drop generating device according to a preferred embodiment of the present invention.
第二圖:其係顯示一依據本發明構想之較佳實施例的電容測試裝置用於檢測一待測電容時之電路示意圖。 Figure 2: It is a schematic diagram of a circuit when the capacitance testing device according to the preferred embodiment of the present invention is used to detect a capacitance to be measured.
第三圖:其係顯示一依據本發明構想之較佳實施例 的電容測試系統之電路示意圖。 Figure 3: It shows a preferred embodiment according to the concept of the present invention Schematic diagram of the circuit of the capacitance test system.
第四圖(a):其係顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第一波形圖。 Figure 4 (a): It shows a first waveform diagram of an adjustable short voltage drop generating device according to a preferred embodiment of the present invention that generates an adjustable voltage drop at its output end.
第四圖(b):其係顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第二波形圖。 The fourth diagram (b): It shows a second waveform diagram of the adjustable short voltage drop generating device according to the preferred embodiment of the present invention that generates an adjustable voltage drop at its output end.
第一圖是顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置之電路圖。在第一圖中,一可調式微短壓降產生裝置11包括一具一第一端與一第二端之可調限流電阻Rx,一具一第一端與一第二端之開關SW1,其中該開關SW1之該第二端接地,且該開關SW1之該第一端電連接於該可調限流電阻Rx之該第二端,一具一第一端與一第二端之可調直流電源(其為一可調直流電壓源)Vx,其中該可調直流電源Vx的該第一端電連接於該可調限流電阻Rx之該第一端,且該可調直流電源Vx的該第二端接地,一具一第一端與一第二端之固定值電容C1,其中該固定值電容C1之該第二端電連接於該可調直流電源Vx之該第一端與該可調限流電阻Rx之該第一端,以及一具一第一端與一第二端之直流輸入電源VS,其中該直流輸入電源VS之該第一端電連接於該固定值電容C1之該第一端,該直流輸入電源VS之該第二端接地,且該產生裝置11是用於
在該固定值電容C1之該第一端與該接地間產生一可調壓降。該可調壓降是一任意大小之正值,代表一電容壓降,且該電容壓降作為一電容變異檢查的一測試訊號,以測試該電容測試裝置之一運作是否正常。
The first figure is a circuit diagram showing an adjustable short voltage drop generator according to a preferred embodiment of the present invention. In the first figure, an adjustable short
如第一圖所示,該直流輸入電源VS具有一第一等效內阻R1,電連接於該固定值電容C1之該第一端與該直流輸入電源VS之該第一端間,該可調直流電源Vx具有一第二等效內阻R2,電連接於該固定值電容C1之該第二端與該可調直流電源Vx之該第一端間,調整該可調直流電源Vx大小以調整該電容壓降大小,該開關是一雙極電晶體(BJT)或一場效電晶體(FET),調整該開關之一速度以調整該電容壓降之一產生速度,該可調限流電阻是用以調整該電容壓降之一訊號強弱,當該開關導通時,產生該電容壓降,且該電容壓降是該直流輸入電源與該可調直流電源間之一電壓差。 As shown in the first figure, the DC input power supply V S has a first equivalent internal resistance R 1 , which is electrically connected to the first end of the fixed-value capacitor C 1 and the first end of the DC input power V S Meanwhile, the adjustable DC power supply V x has a second equivalent internal resistance R 2 , which is electrically connected between the second end of the fixed value capacitor C 1 and the first end of the adjustable DC power supply V x to adjust The size of the adjustable DC power supply V x is used to adjust the voltage drop of the capacitor, the switch is a bipolar transistor (BJT) or a field effect transistor (FET), and one of the speeds of the switch is adjusted to adjust one of the voltage drop of the capacitor The adjustable current-limiting resistor is used to adjust the strength of a signal of the capacitor voltage drop. When the switch is turned on, the capacitor voltage drop is generated, and the capacitor voltage drop is the DC input power supply and the adjustable DC power supply One voltage difference between.
第二圖是顯示一依據本發明構想之較佳實施例的電容測試裝置用於檢測一待測電容時之電路示意圖。在第二圖中,該電容測試裝置12用於檢測一待測電容Cin。該待測電容Cin可為一電路板上兩金屬線間之一耦合電容。該待測電容Cin是並聯電連接於一直流輸入電源(提供一輸入電壓Vin)與該電容測試裝置12間。該電容測試裝置12是用以判斷一電路板的相鄰兩線路間之一耦合電容在一充電過程中,是否會產生一微小的壓降,俾據以判斷該兩線路間是否存在一微短路的缺陷。當該待測電容(例
如該耦合電容)在該充電過程中,產生該微小的壓降時,則知該兩線路間存在一微短路的缺陷。
The second figure is a schematic diagram showing a circuit diagram of a capacitance test device according to a preferred embodiment of the present invention when it is used to detect a capacitance to be measured. In the second figure, the
第三圖是顯示一依據本發明構想之較佳實施例的電容測試系統之電路示意圖。在第三圖中,該電容測試系統1包含一可調式微短壓降產生裝置11與一電容測試裝置12。當該電容測試裝置12接收該可調式微短壓降產生裝置11所產生之該電容壓降,且該電容測試裝置12輸出一高電位,代表偵測到該微短路的缺陷,則該電容測試裝置12的該運作是正常的,而當該電容測試裝置12接收該可調式微短壓降產生裝置11所產生之該電容壓降,且該電容測試裝置12輸出一低電位,代表未偵測到該微短路的缺陷,則該電容測試裝置12的該運作是不正常的。
The third figure is a schematic circuit diagram of a capacitance testing system according to a preferred embodiment of the concept of the present invention. In the third figure, the
第四圖(a)是顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第一波形圖。在第四圖(a)中,該可調式微短壓降產生裝置11的輸出端所產生之輸出電壓(亦即該電容壓降)Vout是模擬一待測電容在其充電過程中,於其電容跨壓持續上升的中途產生了一電壓降,其大小(或深度)為Vx。 The fourth diagram (a) is a first waveform diagram showing an adjustable short voltage drop generating device according to a preferred embodiment of the present invention that generates an adjustable voltage drop at its output end. In the fourth figure (a), the output voltage generated by the output terminal of the adjustable short voltage drop generator 11 (that is, the capacitor voltage drop) V out simulates a capacitor under test during its charging process. A voltage drop occurs in the middle of the continuous rise of the capacitor cross-voltage, and its magnitude (or depth) is V x .
第四圖(b)是顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第二波形圖。在第四圖(b)中,該可調式微短壓降產生裝置11的輸出端所產生之輸出電壓(亦即該電容壓降)Vout是模擬一待測電容在充電至一飽和電壓之後,產 生了一電壓降,其大小(或深度)為Vx。 The fourth diagram (b) is a second waveform diagram showing an adjustable short voltage drop generating device according to a preferred embodiment of the present invention that generates an adjustable voltage drop at its output end. In the fourth diagram (b), the output voltage generated by the output terminal of the adjustable short voltage drop generator 11 (that is, the capacitor voltage drop) V out simulates a capacitor under test after being charged to a saturation voltage , Produces a voltage drop, the magnitude (or depth) of which is V x .
當然,本發明所提出之該可調式微短壓降產生裝置11亦可運用於任何需要產生一任意電壓降的其他各種應用場合中。
Of course, the adjustable short
綜上所述,本發明提供一種電容測試系統,包含一可調式微短壓降產生裝置與一電容測試裝置,其中該電容測試裝置是用以判斷一電路板的相鄰兩線路間之一耦合電容在一充電過程中,是否會產生一微小的壓降,當該耦合電容在該充電過程中產生了該微小的壓降時,則該相鄰二線路間存在一微短路的缺陷;而該可調式微短壓降產生裝置是用於產生一可調壓降,且使該電容測試裝置接收該可調壓降以檢測該電容測試裝置是否運作正常,故其確實具有新穎性與進步性。 In summary, the present invention provides a capacitance testing system including an adjustable micro-short voltage drop generating device and a capacitance testing device, wherein the capacitance testing device is used to determine the coupling between two adjacent lines of a circuit board Will the capacitor generate a slight voltage drop during a charging process? When the coupling capacitor generates the slight voltage drop during the charging process, there is a short-circuit defect between the two adjacent lines; and the The adjustable short voltage drop generating device is used to generate an adjustable voltage drop, and the capacitance testing device receives the adjustable voltage drop to detect whether the capacitance testing device is operating normally, so it is indeed novel and progressive.
是以,縱使本案已由上述之實施例所詳細敘述而可由熟悉本技藝之人士任施匠思而為諸般修飾,然皆不脫如附申請專利範圍所欲保護者。 Therefore, even though this case has been described in detail by the above-mentioned embodiments and can be modified in many ways by those familiar with the art, it does not deviate from the protection of the scope of the attached patent application.
11:可調式微短壓降產生裝置 11: Adjustable micro-short pressure drop generator
C1:固定值電容 C 1 : fixed value capacitor
R1:第一內阻 R 1 : first internal resistance
R2:第二內阻 R 2 : second internal resistance
Rx:可調限流電阻 R x : Adjustable current limiting resistor
SW1:開關 SW 1 : switch
Vout:輸出電壓 V out : output voltage
Vs:直流輸入電源 V s : DC input power
Vx:可調直流電源/可調直流電壓源 V x : adjustable DC power supply/adjustable DC voltage source
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CN202110210487.6A CN114002616A (en) | 2020-07-28 | 2021-02-25 | Capacitance test system and adjustable micro-short voltage drop generating device |
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CN206821064U (en) * | 2017-05-23 | 2017-12-29 | 歌尔科技有限公司 | A kind of structure and circuit board of proof voltage test |
CN110247368A (en) * | 2018-03-09 | 2019-09-17 | 陈晓萍 | Protect circuit |
CN109828190A (en) * | 2019-02-22 | 2019-05-31 | 珠海高赢电子科技有限公司 | Enameled wire breakdown voltage test system and test method |
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CN203798938U (en) * | 2014-04-02 | 2014-08-27 | 泉州市鲤城区强力巨彩光电科技有限公司 | Capacitor test device |
CN104020357A (en) * | 2014-05-29 | 2014-09-03 | 南京航空航天大学 | Capacitance test circuit and test method under DC bias condition |
CN104597361A (en) * | 2015-03-07 | 2015-05-06 | 黄宇嵩 | Capacity performance detector |
US20170069356A1 (en) * | 2015-09-04 | 2017-03-09 | Intel Corporation | Power Loss Capacitor Test Using Voltage Ripple |
CN209296837U (en) * | 2018-12-07 | 2019-08-23 | 北京金风科创风电设备有限公司 | Capacitance testing device and equipment |
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