TWI664431B - Testing system - Google Patents
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Abstract
一種測試系統用以測試主機板，其包含測試治具、測試板、網路設備、及儲存媒介。測試治具提供中央處理器與記憶體模組以插接於主機板。儲存媒介電性連接主機板，儲存作業系統、測試程式及控制程式，並執行以下步驟：以作業系統存取主機板的MAC位址；執行控制程式，驅動測試板發出模擬信號至主機板以執行第一測試流程，當完成後，測試程式產生第一測試結果；以及作業系統執行測試程式，對主機板進行第二測試流程，在完成後，測試程式產生第二測試結果。作業系統透過網路設備將分別將第一測試結果及第二測試結果關連MAC位址發送出。A test system for testing a motherboard includes a test fixture, a test board, a network device, and a storage medium. The test fixture provides a central processing unit and a memory module for plugging into the motherboard. The storage medium is electrically connected to the motherboard, stores the operating system, test programs and control programs, and executes the following steps: accesses the MAC address of the motherboard with the operating system; executes the control program, and drives the test board to send analog signals to the motherboard to execute The first test process, when completed, the test program generates a first test result; and the operating system executes the test program to perform a second test process on the motherboard, and after completion, the test program generates a second test result. The operating system sends the first test result and the second test result to the MAC address through the network device.
Description
本發明涉及電腦領域，尤其是一種用於主機板的測試系統。The invention relates to the field of computers, in particular to a test system for a motherboard.
為了保證主機板出貨品質，出貨前通常會進行相關的測試，通稱為燒機(Burn in)。現有的燒機測試由人員手動按照擬定好的各項測試步驟，逐一執行相關的測試程式，逐項地測試。並且逐項地由操作員人為完成通過(Pass)/或未通過(Fail)的判定。In order to ensure the quality of motherboard shipments, relevant tests are usually performed before shipment, commonly known as burn in. Existing burn-in tests are performed manually by the personnel in accordance with the prepared test steps, one by one, and the relevant test programs are executed one by one. And one by one by the operator to complete the pass (or fail) judgment.
在這樣的測試條件下，首先各項程式的執行、及測試結果的判定全由人為來完成，因此，操作員需要一直待在測試現場，時刻檢查測試進度。使得整體的工時較長、負擔重。自然容易發生誤測或誤判的疏失。Under such test conditions, the execution of various programs and the determination of test results are all done by humans. Therefore, the operator needs to stay at the test site and check the test progress at all times. This makes the overall working hours longer and more burdensome. Mistakes or misjudgments are naturally prone to negligence.
有鑑於此，為了解決現有技術上的問題，在此提供一種測試系統，用以自動化地測試主機板。測試系統包含測試治具、測試板、網路設備、及儲存媒介。測試治具供電至主機板，並提供中央處理器與記憶體模組以插接於主機板。測試板電性連接至主機板。網路設備電性連接至主機板。儲存媒介電性連接至主機板、網路設備及測試板，儲存作業系統、測試程式及控制程式，並經由插接中央處理器與記憶體模組的主機板載入執行以下的步驟：In view of this, in order to solve the problems in the prior art, a test system is provided here to automatically test the motherboard. The test system includes a test fixture, a test board, a network device, and a storage medium. The test fixture is powered to the motherboard, and a central processing unit and a memory module are provided for plugging into the motherboard. The test board is electrically connected to the motherboard. The network device is electrically connected to the motherboard. The storage medium is electrically connected to the motherboard, network equipment and test board, stores the operating system, test programs and control programs, and loads the motherboard through the central processing unit and the memory module to execute the following steps:
以作業系統存取主機板的媒體存取控制(media access control，MAC)位址；執行控制程式，驅動測試板發出複數個模擬信號至主機板以執行第一測試流程，當第一測試流程完成後，測試程式產生第一測試結果，作業系統透過網路設備將第一測試結果關連MAC位址發送出；以及作業系統執行測試程式，對主機板進行第二測試流程，在完成後，測試程式產生第二測試結果，作業系統透過網路設備將第二測試結果關連MAC位址發送出。Use the operating system to access the media access control (MAC) address of the motherboard; execute the control program to drive the test board to send a plurality of analog signals to the motherboard to execute the first test process, and when the first test process is completed Then, the test program generates the first test result, and the operating system sends the first test result to the MAC address through the network device; and the operating system executes the test program to perform the second test flow on the motherboard. After the test program is completed, A second test result is generated, and the operating system sends the second test result to the MAC address through the network device.
在一些實施例中，測試系統更包含遠端伺服器，遠端伺服器接收並儲存MAC位址、第一測試結果及第二測試結果，並對依據測試結果產生測試表單。進一步地，在一些實施例中，測試系統更包含資料庫，遠端伺服器存取資料庫的比對表，存取對應MAC位址的主機板序號。In some embodiments, the test system further includes a remote server. The remote server receives and stores the MAC address, the first test result, and the second test result, and generates a test form according to the test result. Further, in some embodiments, the test system further includes a database, and the remote server accesses the comparison table of the database and accesses the serial number of the motherboard corresponding to the MAC address.
進一步地，在一些實施例中，遠端伺服器依據主機板序號批次地產生測試表單。Further, in some embodiments, the remote server generates test forms in batches according to the serial number of the motherboard.
進一步地，在一些實施例中，第一測試結果及第二測試結果中具有錯誤資訊，遠端伺服器針對主機板序號、第一測試結果及第二測試結果的錯誤訊息，批次地產生錯誤分析表。更進一步地，第一測試結果或第二測試結果中具有錯誤資訊時，遠端伺服器回傳回饋信息至作業系統，作業系統依據回饋信息，再一次進行第一測試流程或第二測試流程。Further, in some embodiments, the first test result and the second test result have error information, and the remote server generates errors in batches for the motherboard serial number, the first test result, and the second test result error message. Analysis Table. Furthermore, when there is error information in the first test result or the second test result, the remote server returns feedback information to the operating system, and the operating system performs the first test process or the second test process again according to the feedback information.
在一些實施例中，第一測試流程包含電壓開關測試、開關測試步驟、重新啟動測試、以及暫存至記憶體(Suspend to RAM，STR)測試。In some embodiments, the first test process includes a voltage switch test, a switch test step, a restart test, and a Suspend to RAM (STR) test.
在一些實施例中，第二測試流程包含影片播放測試步驟、3D效果測試步驟、音訊測試步驟、處理器功能測試步驟、以及運行時間(Real Time Clock，RTC)測試。In some embodiments, the second test process includes a movie playback test step, a 3D effect test step, an audio test step, a processor function test step, and a real time clock (RTC) test.
在一些實施例中，網路設備為網路交換器。In some embodiments, the network device is a network switch.
在一些實施例中，儲存媒介為USB隨身碟裝置、硬碟裝置、或裝設光碟片的光碟裝置。In some embodiments, the storage medium is a USB flash drive device, a hard drive device, or an optical disc device equipped with an optical disc.
綜上所述，完成測試系統的軟硬體架設，可以透過儲存於儲存媒介中的控制程式、測試程式自動地執行測試、產生測試結果，並將測試結果透過網路設備上傳。如此，操作員可以同時進行多個主機板的測試，大幅提升了工作效率。同時，操作員不必一直在現場就能監控，釋放了人力資源，也因為減少了操作員人為的漏測、誤測等因素，所有測試項可以確保確實執行，也減少了人為的誤判，提升了測試的信賴度。In summary, to complete the software and hardware setup of the test system, the control program and test program stored in the storage medium can be used to automatically execute the test, generate test results, and upload the test results through network equipment. In this way, operators can test multiple motherboards at the same time, greatly improving work efficiency. At the same time, the operator can monitor without having to be on site all the time, freeing up human resources, and reducing the operator's artificial missed and mistested factors. All test items can be surely performed, and human misjudgments are reduced, which improves the Test reliability.
以下在實施方式中詳細敘述本發明之詳細特徵及優點，其內容足以使任何熟習相關技藝者瞭解本發明之技術內容並據以實施，且根據本說明書所揭露之內容、申請專利範圍及圖式，任何熟習相關技藝者可輕易地理解本發明相關之目的及優點。The detailed features and advantages of the present invention are described in detail in the following embodiments. The content is sufficient for any person skilled in the art to understand and implement the technical content of the present invention, and according to the content disclosed in this specification, the scope of patent applications and the drawings. Anyone skilled in the relevant art can easily understand the related objects and advantages of the present invention.
圖1為測試系統的單元示意圖。圖2為關於儲存媒介的局部單元示意圖。圖3為測試系統的操作流程圖。如圖1及圖2所示，測試系統1是用以測試主機板500，主要在於主機板500出廠前的燒機(Burn in)測試。測試系統1包含測試治具10、測試板20、網路設備30及儲存媒介40。測試治具10可以為裝設主機板500的平台，供電至主機板500，並提供至少一中央處理器(CPU)11與記憶體模組13以插接於主機板500上以進行測試。測試板20電性連接至主機板500。網路設備30電性連接至主機板500。儲存媒介40電性連接至主機板500、網路設備30及測試板20。在此，測試板20、網路設備30、及儲存媒介40都可插接於主機板50的輸入輸出(I/O)模組510，但此僅為示例，而非用以限制。Figure 1 is a schematic diagram of the unit of the test system. FIG. 2 is a schematic diagram of a local unit of a storage medium. Figure 3 is a flowchart of the operation of the test system. As shown in FIG. 1 and FIG. 2, the test system 1 is used to test the motherboard 500, which is mainly a burn-in test before the motherboard 500 leaves the factory. The test system 1 includes a test fixture 10, a test board 20, a network device 30, and a storage medium 40. The test fixture 10 may be a platform on which the main board 500 is installed, power the main board 500, and provide at least a central processing unit (CPU) 11 and a memory module 13 to be plugged into the main board 500 for testing. The test board 20 is electrically connected to the motherboard 500. The network device 30 is electrically connected to the motherboard 500. The storage medium 40 is electrically connected to the motherboard 500, the network device 30 and the test board 20. Here, the test board 20, the network device 30, and the storage medium 40 can be plugged into the input / output (I / O) module 510 of the main board 50, but this is only an example, not a limitation.
如圖2所示，儲存媒介40儲存有作業系統41、控制程式43及測試程式45。儲存媒介40中的作業系統41、控制程式43及測試程式45經由插接CPU11與記憶體模組13的主機板500載入執行。在此，儲存媒介40為USB隨身碟裝置、硬碟裝置、或裝設存儲有作業系統41、控制程式43及測試程式45之光碟片的光碟裝置。As shown in FIG. 2, the storage medium 40 stores an operating system 41, a control program 43, and a test program 45. The operating system 41, the control program 43, and the test program 45 in the storage medium 40 are loaded and executed by the motherboard 500 connected to the CPU 11 and the memory module 13. Here, the storage medium 40 is a USB flash drive device, a hard disk device, or an optical disk device provided with an optical disk storing an operating system 41, a control program 43, and a test program 45.
圖3為測試系統之測試方法的流程圖。如圖3所示，測試系統的測試方法S1包含步驟S10、步驟S20、步驟S31、步驟S33、步驟S35、步驟S41、步驟S43、及步驟S45。同時參閱圖1及圖2，在步驟S10中，完成測試治具10、測試板20、網路設備30、儲存媒介40及主機板500的架設。步驟S20，以作業系統41存取主機板500的媒體存取控制(media access control，MAC)位址。FIG. 3 is a flowchart of a test method of the test system. As shown in FIG. 3, the test method S1 of the test system includes steps S10, S20, S31, S33, S35, S41, S43, and S45. Referring to FIG. 1 and FIG. 2 at the same time, in step S10, the installation of the test fixture 10, the test board 20, the network device 30, the storage medium 40, and the main board 500 is completed. In step S20, the operating system 41 accesses the media access control (MAC) address of the motherboard 500.
接著步驟S31中，作業系統41執行控制程式43，發出驅動信號以驅動測試板20發出複數個模擬信號至主機板500以執行第一測試流程。步驟S33是在第一測試流程完成後，測試程式產生第一測試結果。接著，步驟S35作業系統41透過網路設備30將第一測試結果關連該MAC位址發送出。In step S31, the operating system 41 executes the control program 43 and sends a driving signal to drive the test board 20 to send a plurality of analog signals to the main board 500 to execute the first test process. In step S33, after the first test process is completed, the test program generates a first test result. Next, in step S35, the operating system 41 sends the first test result to the MAC address through the network device 30.
步驟S41，作業系統41執行測試程式45，對主機板500進行一第二測試流程。步驟S43，在完成第二測試流程後，測試程式45產生第二測試結果。接著，步驟S45，作業系統41透過網路設備30將該第二測試結果關連MAC位址發送出。在此流程中，步驟S10、步驟S20、步驟S31、步驟S33及步驟S35間，或是步驟S41、步驟S43及步驟S45具有順序關係，但是步驟S31、步驟S33至步驟S35與步驟S41、步驟S43至步驟S45這兩套流程間並無順序關係。換言之，測試系統的測試方法S1可以先執行步驟S31、步驟S33至步驟S35，也可以先執行步驟S41、步驟S43至步驟S45。唯，測試之間可能會造成相互干擾，故不可能同時執行步驟S31、步驟S33至步驟S35，以及步驟S41、步驟S43至步驟S45。In step S41, the operating system 41 executes a test program 45 to perform a second test procedure on the motherboard 500. In step S43, after completing the second test flow, the test program 45 generates a second test result. Next, in step S45, the operating system 41 sends the second test result to the MAC address through the network device 30. In this process, there is a sequential relationship between steps S10, S20, S31, S33, and S35, or steps S41, S43, and S45, but steps S31, S33 to S35, and S41, S43 There is no sequence relationship between the two sets of processes from step S45. In other words, the test method S1 of the test system may first perform steps S31, S33 to S35, or may first perform steps S41, S43 to S45. However, the tests may cause mutual interference, so it is impossible to perform steps S31, S33 to S35, and steps S41, S43 to S45 at the same time.
再次參閱圖1至圖3，測試系統1更包含遠端伺服器50。遠端伺服器50接收並儲存MAC位址、第一測試結果及第二測試結果。測試系統的測試方法S1更包含步驟S50。遠端伺服器50依據測試結果產生測試表單。在此僅為示例，實際上也可以將MAC位址、第一測試結果及第二測試結果儲存至近端的電腦，也是可行的。Referring to FIGS. 1 to 3 again, the test system 1 further includes a remote server 50. The remote server 50 receives and stores the MAC address, the first test result, and the second test result. The test method S1 of the test system further includes step S50. The remote server 50 generates a test form according to the test results. This is just an example. In fact, it is also possible to store the MAC address, the first test result, and the second test result to a near-end computer.
圖4為測試系統另一實施例的局部單元示意圖。如圖4所示，網路設備30為網路交換器，從而，遠端伺服器50可以對應於多個欲進行測試的主機板500，如此，MAC位址更顯得重要，能對於不同的主機板500測試產生的第一測試結果及第二測試結果加以區別，以避免測試的結果造成混淆。FIG. 4 is a schematic diagram of a partial unit of another embodiment of a test system. As shown in FIG. 4, the network device 30 is a network switch. Therefore, the remote server 50 can correspond to multiple motherboards 500 to be tested. In this way, the MAC address is more important and can be used for different hosts. The first test result and the second test result generated by the board 500 test are distinguished to avoid confusion caused by the test results.
再次參閱圖1，測試系統1更包含資料庫55，資料庫55中可以儲存MAC位址及主機板序號的比對表。遠端伺服器50存取資料庫55的比對表，從而存取對應MAC位址的主機板序號。如此，遠端伺服器50可以對於主機版序號，而關連於第一測試結果及第二測試結果。然而，以上僅為示例，而非用以限制。主機板序號也可以是由在進行測試時，透過手動的方式輸入。由於主機板500的製作通常有批號，若是第一測試結果及第二測試結果有錯誤資訊，可以比對主機板序號，而確認整個批號的主機板500是否在製作上有缺失。在此，遠端伺服器50可以依據主機板序號批次地產生測試表單。Referring to FIG. 1 again, the test system 1 further includes a database 55, which can store a comparison table of the MAC address and the serial number of the motherboard. The remote server 50 accesses the comparison table of the database 55 to access the motherboard serial number corresponding to the MAC address. In this way, the remote server 50 can be related to the serial number of the host computer and related to the first test result and the second test result. However, the above is only an example, not a limitation. The motherboard serial number can also be entered manually during the test. Since the motherboard 500 is usually produced with a batch number, if the first test result and the second test result have error information, the serial number of the motherboard can be compared to confirm whether the motherboard 500 of the entire batch is missing in production. Here, the remote server 50 may generate test forms in batches according to the serial number of the motherboard.
另外，當第一測試結果及第二測試結果中具有錯誤資訊，該遠端伺服器50針對主機板序號、第一測試結果及該第二測試結果的錯誤訊息，批次地產生錯誤分析表。從而，能針對整個批號的主機板500的錯誤進行分析、比對，並判斷是否在製作的缺失。In addition, when there is error information in the first test result and the second test result, the remote server 50 generates an error analysis table for the motherboard serial number, the first test result, and the second test result error message in batches. Therefore, it is possible to analyze and compare the errors of the motherboard 500 of the entire lot number, and determine whether there is a lack of production.
更進一步地，操作員或任何參與測試的人員，可以透過網路連線至遠端伺服器50，從而可以即時監測整個測試流程的測試情況，以及是否有不正常的狀況產生。從而，操作員可以不必隨時在場，而達到即時監測的功效。Furthermore, the operator or anyone involved in the test can connect to the remote server 50 through the network, so that the test conditions of the entire test process can be monitored in real time, and whether abnormal conditions occur. Therefore, the operator can achieve the effect of real-time monitoring without being present at any time.
進一步地，再次參閱圖2，由於可能測試時，程式有當機的問題存在，當第一測試結果或第二測試結果中具有錯誤資訊時，遠端伺服器50透過網路設備30回傳回饋信息至作業系統41，作業系統依據回饋信息，再一次進行第一測試流程或第二測試流程。從而，再一次進行測試，以確認錯誤資訊是來自程式或是主機板500。Further, referring to FIG. 2 again, since the program may be crashed during a possible test, when there is error information in the first test result or the second test result, the remote server 50 returns a feedback through the network device 30 The information is sent to the operating system 41, and the operating system performs the first test process or the second test process again according to the feedback information. Therefore, a test is performed again to confirm whether the error message comes from the program or the motherboard 500.
再次參閱圖3，在此，第一測試流程係指需要軟、硬體協作測試主機板500的測試流程。第一測試流程包含電壓開關測試、開關測試步驟、重新啟動測試、以及暫存至記憶體(Suspend to RAM，STR)測試，而第一測試流程可為上述的其中一項測試步驟或是多個測試步驟。以上僅為示例，而非用以限制。第一測試流程中的這些測試項目，是透過作業系統41執行控制程式43，驅動測試板20產生模擬信號，例如，發出模擬按壓開關的模擬信號等，以確認主機板500的相關功能是否正常，並依各個測試項目產生第一測試結果。Referring to FIG. 3 again, here, the first test process refers to a test process that requires the software and hardware to test the motherboard 500 in cooperation. The first test process includes a voltage switch test, a switch test step, a restart test, and a Suspend to RAM (STR) test. The first test process may be one of the above test steps or multiple test steps. Test steps. The above is only an example, not a limitation. These test items in the first test process are to execute the control program 43 through the operating system 41 and drive the test board 20 to generate analog signals, for example, to send analog signals such as analog push switches to confirm whether the relevant functions of the motherboard 500 are normal. A first test result is generated according to each test item.
例如，在第一測試流程中，可以透過測試板20發出多次模擬信號，以進行電壓開關測試、開關測試步驟、重新啟動測試時，並於作業系統41中，紀錄每一個測試的結果，經計算而獲得測試值、並將測試值與設定值進行比對，若測試值低於設定值，則判定錯誤(fail)。另外，若在測試時作業系統41產生發現錯誤視窗(Error Windows found)、測試電腦重啟(The computer restarts)、作業系統測試錯誤(OS test error)、CPU加負載超時(CPU load time out)時，整個測試項目也將被判定為錯誤(fail)，並將相關的錯誤信息紀錄，並透過網路設備30傳送至遠端伺服器50。For example, in the first test process, multiple analog signals can be sent through the test board 20 to perform voltage switch tests, switch test steps, restart tests, and record the results of each test in the operating system 41. The test value is obtained by calculation, and the test value is compared with the set value. If the test value is lower than the set value, a failure is determined. In addition, if the operating system 41 generates an Error Windows found, The computer restarts, an OS test error, or a CPU load time out during the test The entire test item will also be determined as a failure, and the related error information will be recorded and transmitted to the remote server 50 through the network device 30.
另外，在進行暫存至記憶體(Suspend to RAM，STR)測試時，若接收到作業系統41產生的控制/測試軟體錯誤(BurnIn test failed)、無法進入S3模式(Failed to set sleep mode)、閒置測試錯誤回報(Suspend test failed)、測試電腦重啟(The computer restarts)、超出視頻檢測時間(Video check time out)、以及閒置開啟失敗(Failed to open suspend) 也判定為錯誤(fail)，並將相關的錯誤信息紀錄，並透過網路設備30傳送至遠端伺服器50。In addition, during the Suspend to RAM (STR) test, if you receive a control / test software error (BurnIn test failed) from the operating system 41, fail to enter S3 mode (Failed to set sleep mode), Suspend test failed, The computer restarts, Video check time out, and Failed to open suspend are also determined to be fail, and The related error information records are transmitted to the remote server 50 through the network device 30.
第二測試流程為安裝於主機板500上相關晶片的功能測試流程，第二測試流程包含影片播放測試步驟、3D效果測試步驟、音訊測試步驟、處理器功能測試步驟以及運行時間(Real Time Clock，RTC)測試，而第二測試流程可為上述的其中一項測試步驟或是多個測試步驟。The second test flow is a functional test flow of related chips installed on the motherboard 500. The second test flow includes a video playback test step, a 3D effect test step, an audio test step, a processor function test step, and a running time (Real Time Clock, RTC) test, and the second test process may be one of the above test steps or multiple test steps.
在此，在第二測試流程的影片播放測試步驟、及音訊測試步驟，可以透過測試程式45執行預存於作業系統41中的相關影音資料，並透過播放、文字辨識、畫面擷取、比對，來確認相關的功能是否正常。又例如，對於運行時間(Real Time Clock，RTC)測試，係比對終端的系統時間與伺服端的系統時間，若差值超過一預訂值，例如三分鐘，則判定為錯誤，並將相關的錯誤信息紀錄，並透過網路設備30傳送至遠端伺服器50。在CPU功能測試時，若作業系統41產生測試電腦重啟(The computer restarts)、CPU加負載超時(CPU load time out)、CPU使用率小於門檻值(CPU usage is below the upper limit)或是測試中異常關閉(Abnormal shutdown of furmark)。則判定為錯誤，並將相關的錯誤信息紀錄，並透過網路設備30傳送至遠端伺服器50。Here, in the video playback test step and audio test step of the second test flow, the relevant audiovisual data pre-stored in the operating system 41 can be executed through the test program 45, and through playback, text recognition, screen capture, and comparison, To confirm whether the related functions are normal. For another example, for the Real Time Clock (RTC) test, the system time of the terminal is compared with the system time of the server. If the difference exceeds a predetermined value, such as three minutes, it is determined to be an error, and the related error is determined. The information record is transmitted to the remote server 50 through the network device 30. During the CPU function test, if the operating system 41 generates test computer restarts, CPU load time out, CPU usage is below the upper limit, or test Abnormal shutdown of furmark. It is determined as an error, and the related error information is recorded and transmitted to the remote server 50 through the network device 30.
此外，對於3D效果測試步驟，若在測試時，作業系統41產生畫面卡死(time out)、畫面退出(benchmark cancelled)、運行錯誤(encountered error while running)、影片無法運行(video did not run)、超出視頻檢測時間(Video check time out)、測試電腦重啟(The computer restarts)、或C&C測試錯誤回報(C&C Test XX fail)，也會被判定為錯誤，並將相關的錯誤信息紀錄，並透過網路設備30傳送至遠端伺服器50。然而，以上各種測試的判定僅為示例，而非用以限制，實際上各種錯誤訊息、或是各種錯誤的判定，均可以依據需求來加載於控制程式或是測試程式之中。In addition, for the 3D effect test step, during the test, if the operating system 41 generates a screen time out, a benchmark cancelled, an error while running, or a video did not run, , Video check time out, The computer restarts, or C & C Test XX fail, it will also be judged as an error, and the relevant error information will be recorded and passed The network device 30 is transmitted to the remote server 50. However, the determinations of the above various tests are merely examples, not for limitation. In fact, various error messages or various error determinations can be loaded into the control program or test program according to requirements.
綜上所述，測試系統1透過硬體的架設及儲存媒介40中的程式，可以自動地執行測試流程、產生測試結果，並透過網路設備30上傳。如此，操作員可以同時執行多個主機板500的測試，大幅提升了工作效率。此外，操作員不必一直在現場就能監控，釋放了人力資源，也因為減少了操作員人為的漏測、誤測的因素，所有測試項可以確保確實執行能，也減少了人為的誤判，提升了測試的信賴度。In summary, the test system 1 can automatically execute the test flow, generate test results through the hardware installation and programs in the storage medium 40, and upload them through the network device 30. In this way, the operator can perform tests on multiple motherboards 500 at the same time, greatly improving work efficiency. In addition, the operator does not have to be on-site to monitor, freeing up human resources, and reducing the operator ’s artificial missed and mis-tested factors. All test items can ensure the actual performance, and also reduce human misjudgment and improve. Test reliability.
雖然本發明的技術內容已經以較佳實施例揭露如上，然其並非用以限定本發明，任何熟習此技藝者，在不脫離本發明之精神所作些許之更動與潤飾，皆應涵蓋於本發明的範疇內，因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the technical content of the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art and making some changes and retouching without departing from the spirit of the present invention should be covered by the present invention. Therefore, the scope of protection of the present invention shall be determined by the scope of the appended patent application.
1‧‧‧測試系統1‧‧‧test system
10‧‧‧測試治具 10‧‧‧Test fixture
11‧‧‧中央處理器(CPU) 11‧‧‧ Central Processing Unit (CPU)
13‧‧‧記憶體模組 13‧‧‧Memory Module
20‧‧‧測試板 20‧‧‧test board
30‧‧‧網路設備 30‧‧‧ Network Equipment
40‧‧‧儲存媒介 40‧‧‧Storage media
41‧‧‧作業系統 41‧‧‧operating system
43‧‧‧控制程式 43‧‧‧Control Program
45‧‧‧測試程式 45‧‧‧Test program
50‧‧‧遠端伺服器 50‧‧‧ remote server
55‧‧‧資料庫 55‧‧‧Database
500‧‧‧主機板 500‧‧‧ Motherboard
510‧‧‧輸入輸出模組 510‧‧‧I / O Module
S1‧‧‧測試系統的測試方法 Test method of S1‧‧‧test system
S10‧‧‧完成測試治具、測試板、網路設備及主機板、儲存媒介的架設 S10‧‧‧ Complete the installation of test fixtures, test boards, network equipment, motherboards, and storage media
S20‧‧‧存取主機板的媒體存取控制(MAC)位址 S20‧‧‧ accesses the media access control (MAC) address of the motherboard
S31‧‧‧執行控制程式，驅動測試板發出模擬信號至主機板，執行第一測試步驟 S31‧‧‧ executes the control program, drives the test board to send an analog signal to the motherboard, and executes the first test step
S33‧‧‧產生第一測試結果 S33‧‧‧ produces the first test result
S35‧‧‧將第一測試結果關連MAC位址發送出 S35‧‧‧ sends the first test result to the MAC address
S41‧‧‧執行測試程式，對主機板進行第二測試流程 S41‧‧‧ executes the test program and performs the second test process on the motherboard
S43‧‧‧產生第二測試結果 S43‧‧‧ produces the second test result
S45‧‧‧將第二測試結果關連MAC位置發送出 S45‧‧‧ sends the second test result to the MAC location
S50‧‧‧產生測試表單 S50‧‧‧ Generate test form
圖1為測試系統的單元示意圖。 圖2為關於儲存媒介的局部單元示意圖。 圖3為測試系統之測試方法的流程圖。 圖4為測試系統另一實施例的局部單元示意圖。Figure 1 is a schematic diagram of the unit of the test system. FIG. 2 is a schematic diagram of a local unit of a storage medium. FIG. 3 is a flowchart of a test method of the test system. FIG. 4 is a schematic diagram of a partial unit of another embodiment of a test system.
Claims (10)
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