TWI660280B - Multi-input autoreulation detector and method of multi-input autoreulation detection - Google Patents
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Abstract
一種多輸入自調節檢測器包含多個感測器、運算器、後端處理裝置及系統資料庫。多個感測器用於分別感測待測物的各感測物理量。運算器電性連接感測器且用以比對並判斷該些感測物理量是否與基準數據相符，以判斷待測物的品質狀態。後端處理裝置電性連接運算器且用於執行關聯於待測物的品質狀態的作動。系統資料庫電性連接運算器且儲存有初始參考數據。系統資料庫用於當待測物的品質狀態符合標準時，將該些感測物理量紀錄為新參考數據，且依據新參考數據及初始參考數據產生更新基準數據，並將更新基準數據傳送至運算器以更新基準數據。A multi-input self-adjusting detector includes a plurality of sensors, a computing unit, a back-end processing device, and a system database. The plurality of sensors are used for sensing each sensing physical quantity of the object to be measured, respectively. The computing unit is electrically connected to the sensor and used to compare and judge whether the sensed physical quantities are consistent with the reference data, so as to determine the quality state of the object to be measured. The back-end processing device is electrically connected to the computing unit and configured to perform an operation related to the quality state of the object to be measured. The system database is electrically connected to the computing unit and stores initial reference data. The system database is used to record the measured physical quantities as new reference data when the quality status of the object to be tested meets the standard, and generate updated reference data based on the new reference data and the initial reference data, and transmit the updated reference data to the computing unit. To update the baseline data.
Description
本發明係關於一種多輸入自調節檢測器及多輸入自調節檢測方法，特別是一種針對多種不同感測值進行統計的多輸入自調節檢測器及多輸入自調節檢測方法。The invention relates to a multi-input self-adjusting detector and a multi-input self-adjusting detection method, in particular to a multi-input self-adjusting detector and a multi-input self-adjusting detection method for statistics on a plurality of different sensing values.
一般來說，在生產各類的產品時，為了確保產品的品質，通常會使用檢測設備以對產品進行檢測/比對。檢測設備通常包含各項的檢測儀器，可針對產品的各項參數進行量測，以確認產品的品質狀態是否有符合預期，例如使用電壓感測器量測產品的電壓參數或是使用電阻感測器量測產品的電阻參數等。Generally speaking, in the production of various products, in order to ensure the quality of the products, testing equipment is usually used to detect / compare the products. Testing equipment usually includes various testing instruments, which can measure various parameters of the product to confirm whether the quality status of the product meets expectations, such as using a voltage sensor to measure the voltage parameters of the product or using resistance sensing Measure the resistance parameters of the product.
然而，這一類的檢測儀器均是產生單一功能的量測數據，因此若要量測得產品的所有數據，將會耗費大量時間且僅能做單一功能的比對。再者，這些通過量測而得到的各項數據還需要經過逐步的確認/分析，才可判斷其品質狀態，其過程既繁瑣且複雜。However, this type of testing instrument produces measurement data with a single function, so if you want to measure all the data of the product, it will take a lot of time and can only be compared with a single function. Furthermore, the various data obtained through the measurement need to be gradually confirmed / analyzed before the quality status can be judged. The process is cumbersome and complicated.
本發明提出一種多輸入自調節檢測器及多輸入自調節檢測方法，整合待測物的多種物理量以進行收斂判定，藉此提高待測物的品質/良率。The invention proposes a multi-input self-adjusting detector and a multi-input self-adjusting detection method, which integrate multiple physical quantities of a test object to perform convergence determination, thereby improving the quality / yield of the test object.
依據本發明之一實施例揭露一種多輸入自調節檢測器，適於一待測物。所述的多輸入自調節檢測器包含多個感測器、運算器、後端處理裝置及系統資料庫。每個感測器用於感測待測物的一種感測物理量。運算器電性連接該些感測器且用以比對並判斷該些種感測物理量是否與基準數據相符，以判斷待測物的品質狀態。後端處理裝置電性連接運算器且用於執行關聯於待測物的品質狀態的作動。系統資料庫電性連接運算器且儲存有初始參考數據。系統資料庫用於當待測物的品質狀態符合標準時，將該些種感測物理量紀錄為新參考數據，且依據新參考數據及初始參考數據產生更新基準數據，並將更新基準數據傳送至運算器以更新基準數據。其中所述的基準數據係依據初始參考數據的至少一部份所產生。According to an embodiment of the present invention, a multi-input self-adjusting detector is disclosed, which is suitable for a test object. The multi-input self-adjusting detector includes a plurality of sensors, a computing unit, a back-end processing device and a system database. Each sensor is a sensing physical quantity for sensing an object to be measured. The computing unit is electrically connected to the sensors and used to compare and determine whether the sensed physical quantities are consistent with the reference data, so as to determine the quality status of the object to be measured. The back-end processing device is electrically connected to the computing unit and configured to perform an operation related to the quality state of the object to be measured. The system database is electrically connected to the computing unit and stores initial reference data. The system database is used to record the measured physical quantities as new reference data when the quality status of the test object meets the standard, and generate updated reference data based on the new reference data and the initial reference data, and transmit the updated reference data to the calculation To update the baseline data. The reference data is generated based on at least a part of the initial reference data.
綜上所述，於本發明所提出的多輸入自調節檢測器及多輸入自調節檢測方法中，主要係藉由多種感測器量測待測物的多種物理量，且將該些種物理量與基準數據比對以判斷待測物的品質狀態。且進一步透過系統資料庫將該些種物理量整合至初始參考數據以形成更新基準數據，並且回傳該更新基準數據以對原本的基準數據進行更新。藉此，可達到藉由整合待測物的多種物理量進行收斂判定，以提高待測物的品質/良率之目的，更可以藉由適時地回傳更新的基準數據，進一步地提升判斷品質狀態的精準度。In summary, in the multi-input self-adjusting detector and the multi-input self-adjusting detection method proposed by the present invention, a variety of sensors are used to measure various physical quantities of the object to be measured, and the physical quantities and The reference data is compared to determine the quality status of the test object. Furthermore, these physical quantities are integrated into the initial reference data through the system database to form updated reference data, and the updated reference data is returned to update the original reference data. In this way, it can achieve convergence judgment by integrating multiple physical quantities of the object to be tested, so as to improve the quality / yield of the object to be tested, and it can further improve the quality state of judgment by returning updated reference data in a timely manner. Accuracy.
以上之關於本揭露內容之說明及以下之實施方式之說明係用以示範與解釋本發明之精神與原理，並且提供本發明之專利申請範圍更進一步之解釋。The above description of the contents of this disclosure and the description of the following embodiments are used to demonstrate and explain the spirit and principle of the present invention, and provide a further explanation of the scope of the patent application of the present invention.
以下在實施方式中詳細敘述本發明之詳細特徵以及優點，其內容足以使任何熟習相關技藝者了解本發明之技術內容並據以實施，且根據本說明書所揭露之內容、申請專利範圍及圖式，任何熟習相關技藝者可輕易地理解本發明相關之目的及優點。以下之實施例係進一步詳細說明本發明之觀點，但非以任何觀點限制本發明之範疇。The detailed features and advantages of the present invention are described in detail in the following embodiments. The content is sufficient for any person skilled in the art to understand and implement the technical contents of the present invention. Anyone skilled in the relevant art can easily understand the related objects and advantages of the present invention. The following examples further illustrate the viewpoints of the present invention in detail, but do not limit the scope of the present invention in any way.
請參照圖1，圖1係依據本發明之一實施例所繪示的多輸入自調節檢測器的功能方塊圖。如圖1所示，多輸入自調節檢測器1適用於待測物2。多輸入自調節檢測器1包含多個感測器10~14、運算器20、後端處理裝置30及系統資料庫40。各個感測器10~14用於分別感測待測物2的一種感測物理量。於實務上，感測器10~14的類型及所感測的物理量之種類可以係為不同。舉例來說，感測器10~14可分別係為電壓感測器、電流感測器、溫度感測器、阻抗感測器、影像感測器。感測器10可感測得待測物2的電壓值、感測器11可感測得待測物2的電流值、感測器12可感測得待測物2的溫度值、感測器10可感測得待測物2的色差值。圖1實施例所示的感測器之類型及數量僅係用於舉例說明，本發明不以此為限。Please refer to FIG. 1. FIG. 1 is a functional block diagram of a multi-input self-adjusting detector according to an embodiment of the present invention. As shown in FIG. 1, the multi-input self-adjusting detector 1 is suitable for the object 2 to be measured. The multi-input self-adjusting detector 1 includes a plurality of sensors 10-14, a computing unit 20, a back-end processing device 30, and a system database 40. Each of the sensors 10 to 14 is used to respectively sense a sensing physical quantity of the object 2 to be measured. In practice, the types of the sensors 10 to 14 and the types of the sensed physical quantities can be different. For example, the sensors 10 to 14 may be respectively a voltage sensor, a current sensor, a temperature sensor, an impedance sensor, and an image sensor. The sensor 10 can sense the voltage value of the object 2, the sensor 11 can sense the current value of the object 2, the sensor 12 can sense the temperature value of the object 2, and The device 10 can sense the color difference value of the object 2 to be measured. The type and number of the sensors shown in the embodiment of FIG. 1 are only for illustration, and the present invention is not limited thereto.
運算器20電性連接於所述的多個感測器10~14。當前述的多個感測器10~14取得對應的感測物理量後，便可將包含該些感測物理量的資料訊號D1~D5傳送至運算器20，使得運算器20可比對並判斷該些種感測物理量是否與一基準數據相符(即是否落入此基準數據所界定的數值範圍中)，從而判斷待測物2的品質狀態。於一個例子中，所述的基準數據於各種感測物理量之類型分別界定有一範圍，當該些種感測物理量均落於各自對應的範圍時，則運算器20判斷待測物2係屬於良品。反之，當該些種感測物理量其中任一個未落於其對應的範圍時，則運算器20判斷待測物2係屬於不良品。The computing unit 20 is electrically connected to the plurality of sensors 10 to 14. After the aforementioned plurality of sensors 10 to 14 obtain corresponding sensing physical quantities, the data signals D1 to D5 containing the sensing physical quantities can be transmitted to the computing unit 20, so that the computing unit 20 can compare and judge these This kind of sensing physical quantity is consistent with a reference data (that is, whether it falls within a numerical range defined by the reference data), so as to judge the quality state of the object 2 to be measured. In one example, the reference data defines a range for each type of sensing physical quantity. When the sensing physical quantities all fall within their respective ranges, the computing unit 20 determines that the object to be measured 2 belongs to a good product. . Conversely, when any of these sensing physical quantities does not fall within its corresponding range, the computing unit 20 determines that the object to be measured 2 is a defective product.
後端處理裝置30電性連接運算器20，後端處理裝置30係用於執行關聯於待測物2的品質狀態的作動。以一個例子來說，後端處理裝置30可以係為一個顯示器，其用於顯示待測物2的品質狀態，例如顯示良品/不良品等資訊。於另一個例子中，後端處理裝置30係為一個輸送裝置，其用於依據待測物2的品質狀態將待測物2輸送至一個指定位置。例如，當待測物2被判定為不良品時，後端處理裝置30可將其分類並派送至生產線上的一重測區進行重新量測，亦或是將其派送至生產線上的一汰換區，直接將被判定為不良品的待測物2汰除。The back-end processing device 30 is electrically connected to the computing unit 20. The back-end processing device 30 is configured to perform an operation related to the quality state of the object 2 to be measured. For example, the back-end processing device 30 may be a display, which is used to display the quality status of the object 2 to be tested, such as displaying good / defective information. In another example, the back-end processing device 30 is a conveying device for conveying the object 2 to a specified position according to the quality state of the object 2. For example, when the DUT 2 is judged to be a defective product, the back-end processing device 30 may classify it and send it to a retesting area on the production line for re-measurement, or send it to a replacement on the production line. Area, the test object 2 judged as a defective product is directly eliminated.
系統資料庫40電性連接於運算器20且儲存有初始參考數據。系統資料庫40係用於當待測物2的品質狀態符合標準時，將該些種感測物理量紀錄為一個新參考數據。系統資料庫40進一步地依據所述的新參考數據及初始參考數據產生一個更新基準數據，並將所述之更新基準數據傳送至運算器20以更新原本的基準數據。於此實施例中，所述的基準數據係依據初始參考數據的至少一部分所產生的。具體來說，系統資料庫40內存的初始參考數據包含預先檢測所得之不同種感測物理量的多筆參考數據，例如199筆，而系統資料庫40可自該199筆參考數據中擷取前100筆以產生所述之基準數據，以供運算器20對待測物2的品質狀態進行判讀。The system database 40 is electrically connected to the computing unit 20 and stores initial reference data. The system database 40 is used to record the sensing physical quantities as a new reference data when the quality status of the object 2 to be tested meets the standard. The system database 40 further generates an updated reference data according to the new reference data and the initial reference data, and transmits the updated reference data to the computing unit 20 to update the original reference data. In this embodiment, the reference data is generated according to at least a part of the initial reference data. Specifically, the initial reference data in the system database 40 includes multiple reference data of different sensing physical quantities detected in advance, such as 199, and the system database 40 can extract the first 100 from the 199 reference data. The pen is used to generate the reference data for the processor 20 to judge the quality state of the test object 2.
請一併參照圖1與圖2A~2E，圖2A~2E係依據本發明之一實施例所繪示的用於產生基準數據的參考數據所包含之各種感測物理量的分佈示意圖。如圖2A~2E所示，用於產生基準數據的參考數據可包含電壓數據ID1、電流數據ID2、溫度數據ID3、阻抗數據ID4及色差數據ID5。於實務上，每組數據ID1~ID5各別包含多筆資料以條狀分布圖呈現，且搭配有對應的曲線。每組數據ID1~ID5各別具有中心值S1~S5，而每組數據ID1~ID5以個別的中心值S1~S5為基準於分布圖上具有良品範圍RNG1~RNG5。於一個例子中，良品範圍的選取方式係於具有曲線之條狀分布圖上，依據中心值為基準向左右二側各別選取一範圍，使得所選取之左右二側的範圍具有大致相等的面積(例如具有相同筆數)。藉此，即可產生在電壓、電流、溫度、阻抗及色差等多種物理量的良品範圍，以做為前述的基準數據。於圖2A~2E中，所述的中心值係為眾數。然而，於實務上，所述的中心值可係為中位數或平均數，但本發明不以此為限。Please refer to FIG. 1 and FIGS. 2A to 2E together. FIGS. 2A to 2E are schematic diagrams showing the distribution of various sensing physical quantities included in the reference data for generating reference data according to an embodiment of the present invention. As shown in FIGS. 2A to 2E, the reference data used to generate the reference data may include voltage data ID1, current data ID2, temperature data ID3, impedance data ID4, and color difference data ID5. In practice, each group of data ID1 to ID5 contains multiple pieces of data presented in a bar-shaped distribution chart, with corresponding curves. Each group of data ID1 to ID5 has a center value S1 to S5, and each group of data ID1 to ID5 has a good range RNG1 to RNG5 on the distribution chart based on the individual center values S1 to S5. In one example, the selection method of the good product range is based on a bar-shaped distribution chart with a curve, and a range is selected to the left and right sides according to the center value, so that the selected left and right ranges have approximately equal areas. (E.g. with the same number of pens). As a result, a good range of various physical quantities such as voltage, current, temperature, impedance, and color difference can be generated as the aforementioned reference data. In FIGS. 2A to 2E, the center value is a mode. However, in practice, the center value may be a median or an average number, but the present invention is not limited thereto.
當運算器20獲取多個感測器10~14所量測的待測物2之各感測物理量的資料訊號D1~D5時，運算器20亦從系統資料庫40獲取由前述電壓數據ID1、電流數據ID2、溫度數據ID3、阻抗數據ID4及色差數據ID5所產生的基準數據。運算器20進一步將資料訊號D1~D5所包含之感測物理量分別對比於電壓數據ID1、電流數據ID2、溫度數據ID3、阻抗數據ID4及色差數據ID5的良品範圍。於實際操作時，若是資料訊號D1~D5所包含的感測物理量均落於對應的良品範圍RNG1~RNG5內，則運算器20判斷待測物2係屬於良品，亦即品質狀態符合標準。反之，若是資料訊號D1~D5所包含的感測物理量任一個未落於對應的良品範圍RNG1~RNG5內，則運算器20判斷待測物2係屬於不良品，亦即品質狀態未符合標準。於此實施例中，當運算器20判斷待測物2的品質狀態符合標準時，運算器20會將該些種感測物理量紀錄為一個新參考數據且將其傳送至系統資料庫40，從而使系統資料庫40將該筆新參考數據加入初始參考數據中以形成一個更新基準數據回傳至運算器對原本的基準數據進行更新。於一實施例中，當新參考數據及初始參考數據的總量累積達一預設值時，系統資料庫40以所累積的該新參考數據與該初始參考數據產生該更新基準數據。When the computing unit 20 obtains the data signals D1 to D5 of each of the sensed physical quantities of the to-be-measured object 2 measured by the plurality of sensors 10 to 14, the computing unit 20 also obtains the aforementioned voltage data ID1 from the system database 40 Reference data generated from current data ID2, temperature data ID3, impedance data ID4, and color difference data ID5. The computing unit 20 further compares the sensing physical quantities included in the data signals D1 to D5 with the good range of the voltage data ID1, the current data ID2, the temperature data ID3, the impedance data ID4, and the color difference data ID5, respectively. In actual operation, if the sensing physical quantities included in the data signals D1 to D5 all fall within the corresponding good product range RNG1 to RNG5, the computing unit 20 judges that the test object 2 is a good product, that is, the quality status meets the standard. Conversely, if any of the sensing physical quantities included in the data signals D1 to D5 does not fall within the corresponding good product range RNG1 to RNG5, the computing unit 20 determines that the test object 2 is a defective product, that is, the quality status does not meet the standard. In this embodiment, when the computing unit 20 determines that the quality status of the DUT 2 is in compliance with the standard, the computing unit 20 records the sensed physical quantities as a new reference data and transmits it to the system database 40, so that The system database 40 adds the new reference data to the initial reference data to form an updated reference data and returns it to the computing unit to update the original reference data. In an embodiment, when the total amount of the new reference data and the initial reference data reaches a preset value, the system database 40 generates the updated reference data based on the accumulated new reference data and the initial reference data.
舉例來說，系統資料庫40可被設定為當每200、300、400、500等整數為所述預設值。當初始參考數據的筆數係為399筆時，此時若是運算器20將一筆新參考數據傳送至系統資料庫40，則初始參考數據與所傳送的該新參考數據的總量為400筆，其達到所述的預設值，系統資料庫40便將新參考數據與初始參考數據合併而產生該更新基準數據。反之，當初始參考數據的筆數係為465筆時，此時若是運算器20將一筆新參考數據傳送至系統資料庫40，則初始參考數據與所傳送的該新參考數據的總量為466筆，並未達到所述的預設值。此時，系統資料庫40便不會將初始參考數據及所傳送之新參考數據合併產生更新基準數據。換言之，於此實施例中，僅有當新參考數據及初始參考數據的總量累積達到一定數目時，系統資料庫40才會合併新參考數據與初始參考數據以產生該更新基準數據，以供基準數據的更新。其好處係在於系統資料庫40不需要每產生一筆新參考數據，便將其併入初始參考數據以產生該更新基準數據，從而可以減少/簡化系統資料庫40的運算過程。For example, the system database 40 may be set to be the preset value when every integer of 200, 300, 400, 500, or the like. When the number of initial reference data is 399, if the arithmetic unit 20 transmits a new reference data to the system database 40, the total amount of the initial reference data and the new reference data transmitted is 400. When it reaches the preset value, the system database 40 combines the new reference data with the initial reference data to generate the updated reference data. Conversely, when the number of initial reference data is 465, if the computing unit 20 transmits a new reference data to the system database 40, the total amount of the initial reference data and the new reference data transmitted is 466. Pen, did not reach the preset value. At this time, the system database 40 does not combine the initial reference data and the transmitted new reference data to generate updated reference data. In other words, in this embodiment, only when the total amount of the new reference data and the initial reference data reaches a certain number, the system database 40 will merge the new reference data with the initial reference data to generate the updated reference data for use in Update of baseline data. The advantage is that the system database 40 does not need to generate a new reference data each time, and then merges it into the initial reference data to generate the updated reference data, thereby reducing / simplifying the calculation process of the system database 40.
於一實施例中，系統資料庫40可依據新參考數據及初始參考數據計算在該些種感測物理量的每一種感測物理量的中心值，且依據每一種感測物理量的中心值計算對應的良品範圍，接著再以每一種感測物理量的良品範圍作為更新基準數據。舉例來說，請進一步參照圖3A，圖3A係依據本發明之一實施例所繪示的初始參考數據ID所包含之感測物理量的分佈示意圖，而圖3B係依據本發明之一實施例所繪示的更新基準數據所包含之感測物理量的分佈示意圖。如圖3A所示，儲存於系統資料庫40的初始參考數據ID包含有以條狀分布呈現的多筆感測物理量(例如係為電壓值)，其具有中心值S以及以該中心值S為基準的良品範圍RNG。而當系統資料庫40將來自運算器20的一或多筆新參考數據加入初始參考數據ID形成後，便可透過運算產生如圖3B所示的更新基準數據ID’，其同樣以條狀分布呈現。In one embodiment, the system database 40 may calculate the center value of each of the sensed physical quantities based on the new reference data and the initial reference data, and calculate a corresponding value based on the center value of each of the sensed physical quantities. Good product range, and then use the good product range of each sensing physical quantity as the updated reference data. For example, please refer to FIG. 3A. FIG. 3A is a schematic diagram of a distribution of a sensing physical quantity included in an initial reference data ID according to an embodiment of the present invention, and FIG. 3B is a diagram according to an embodiment of the present invention. A schematic diagram of the distribution of sensing physical quantities included in the updated reference data. As shown in FIG. 3A, the initial reference data ID stored in the system database 40 includes a plurality of sensing physical quantities (for example, voltage values) in a stripe distribution, which has a center value S and the center value S is The benchmark good range RNG. After the system database 40 adds one or more pieces of new reference data from the computing unit 20 to the initial reference data ID, the updated reference data ID 'shown in FIG. 3B can be generated through calculation, which is also distributed in a stripe shape. Render.
比對圖3A及圖3B，可以得知圖3A中原本的中心值S以及以該中心值S為基準的良品範圍RNG轉變為圖3B的中心值S’以及以該中心值S’為基準的良品範圍RNG’。換言之，當有新參考數據加入初始參考數據後，分佈示意圖的條狀結構會改變，而中心值及其對應的良品範圍亦可能隨之改變，從而形成所述的更新基準數據。系統資料庫40再進一步將所述的更新基準數據回傳至運算器20，以對原本的基準數據進行更新。如此一來，可以適時地對運算器20所依據的基準數據進行更新，使得運算器20依據基準數據來判斷待測物2的品質狀態的準確度可以提升且改善產品的良率。Comparing FIG. 3A and FIG. 3B, it can be known that the original center value S and the good range RNG based on the center value S in FIG. 3A are transformed into the center value S ′ in FIG. 3B and the center value S ′ as a reference. Good range RNG '. In other words, when new reference data is added to the initial reference data, the bar structure of the distribution diagram will change, and the center value and the corresponding range of good products may also change accordingly, thereby forming the updated reference data. The system database 40 further transmits the updated reference data to the computing unit 20 to update the original reference data. In this way, the reference data on which the computing unit 20 is based can be updated in a timely manner, so that the accuracy with which the computing unit 20 determines the quality state of the object 2 to be tested can improve and improve the yield of the product.
請參照圖4，圖4係依據本發明之另一實施例所繪示的多輸入自調節檢測器的功能方塊圖。相較於圖1，圖4所示的多輸入自調節檢測器1更包含有切換開關50，其電性連接於運算器20及系統資料庫40之間。切換開關50係用以選擇性地導通以決定是否將運算器20所接收到的該些感測物理量的資料訊號D1~D5傳送至系統資料庫40。具體來說，當多輸入自調節檢測器1進行在線檢測時，切換開關50會選擇導通運算器20與系統資料庫40之間的傳輸路徑，使得感測器10~14所感測到的各種感測物理量可以傳送至系統資料庫40，以適時地進行必要的數據更新。然而，當多輸入自調節檢測器1進行離線檢測時，切換開關50會選擇不導通運算器20與系統資料庫40之間的傳輸路徑。詳細來說，當待測物2的品質狀態被判定為不良時，切換開關50可選擇導通運算器20與離線顯示平台60之間的傳輸路徑，相關工程人員可於離線顯示平台60上針對待測物2的品質狀態重複進行確認。然而，離線顯示平台60的設置僅係為選擇性的，於其他實施例中，多輸入自調節檢測器1可不包含離線顯示平台60。Please refer to FIG. 4, which is a functional block diagram of a multi-input self-adjusting detector according to another embodiment of the present invention. Compared to FIG. 1, the multi-input self-adjusting detector 1 shown in FIG. 4 further includes a switch 50, which is electrically connected between the computing unit 20 and the system database 40. The switch 50 is selectively turned on to determine whether to transmit the data signals D1 to D5 of the sensing physical quantities received by the computing unit 20 to the system database 40. Specifically, when the multi-input self-adjusting detector 1 performs on-line detection, the switch 50 selects a transmission path between the conducting processor 20 and the system database 40, so that the various senses sensed by the sensors 10 to 14 The measured physical quantities can be transmitted to the system database 40 to perform necessary data updates in a timely manner. However, when the multi-input self-adjusting detector 1 performs offline detection, the switch 50 selects the transmission path between the computing unit 20 and the system database 40. In detail, when the quality status of the DUT 2 is judged to be bad, the switch 50 can select a transmission path between the computing unit 20 and the offline display platform 60, and related engineers can target the target on the offline display platform 60. The quality state of the test object 2 was repeatedly confirmed. However, the setting of the offline display platform 60 is only selective. In other embodiments, the multi-input self-adjusting detector 1 may not include the offline display platform 60.
請進一步參照圖5，圖5係依據本發明一實施例所繪示的多輸入自調節檢測方法的方法流程圖，其適用於圖1的多輸入自調節檢測器。如圖5所示，在步驟S301中，以多個感測器10~14感測待測物2以對應獲得多種感測物理量。於實務上，所述的感測物理量可以是電壓、電流、阻抗、波型、頻率、溫度、影像色差、聲音或資料傳輸速率等。所屬領域具有通常知識者可依據實際所欲量測的感測物理量而選擇對應的感測器種類。在步驟S303中，以運算器20比對並判斷該些種感測物理量是否與基準數據相符，以判斷待測物2的品質狀態。在步驟S305中，以後端處理裝置30執行關聯於待測物2的品質狀態的作動。所述的作動可以係顯示待測物的品質狀態，亦或是依據待測物的品質狀態將其輸送至一指定區域。在步驟S307中，當待測物2的品質狀態符合標準時，以系統資料庫40將該些種感測物理量紀錄為新參考數據。在步驟S309中，以系統資料庫40依據新參考數據及初始參考數據產生更新基準數據，且將更新基準數據傳送至運算器20以更新基準數據。其中基準數據係依據初始參考數據的至少一部份所產生。於一實施例中，在該系統資料庫中的該新參考數據與該初始參考數據的總量累積達預設值(例如500筆數據)時，以所累積的新參考數據與初始參考數據產生更新基準數據。於一實施例中，所述的中心值可係為一中位數或一平均數，但本發明不以此為限。Please refer to FIG. 5, which is a method flowchart of a multi-input self-adjusting detection method according to an embodiment of the present invention, which is applicable to the multi-input self-adjusting detector of FIG. 1. As shown in FIG. 5, in step S301, the object to be measured 2 is sensed by a plurality of sensors 10 to 14 to correspondingly obtain a plurality of sensed physical quantities. In practice, the sensing physical quantity may be voltage, current, impedance, wave shape, frequency, temperature, image color difference, sound or data transmission rate, and the like. Those with ordinary knowledge in the field can select the corresponding sensor type according to the actual physical quantity to be measured. In step S303, the computing unit 20 compares and judges whether the various sensing physical quantities are consistent with the reference data, so as to determine the quality state of the object to be measured 2. In step S305, the back-end processing device 30 executes an operation related to the quality state of the object 2 to be measured. The action can be to display the quality state of the object to be measured, or to transport it to a designated area according to the quality state of the object to be measured. In step S307, when the quality status of the object to be measured 2 meets the standard, the system database 40 records the various sensing physical quantities as new reference data. In step S309, the system database 40 generates updated reference data according to the new reference data and the initial reference data, and transmits the updated reference data to the computing unit 20 to update the reference data. The reference data is generated based on at least a part of the initial reference data. In an embodiment, when the total amount of the new reference data and the initial reference data in the system database reaches a preset value (for example, 500 records), the accumulated new reference data and the initial reference data are generated. Update baseline data. In an embodiment, the center value may be a median or an average, but the invention is not limited thereto.
請進一步參照圖6，圖6係依據本發明之另一實施例所繪示的多輸入自調節檢測方法的方法流程圖。圖6與圖5大致具有相同的流程步驟，惟差異在於步驟S309包含有步驟S3091及步驟S3093。在步驟S3091中，以系統資料庫40依據新參考數據及初始參考數據計算在該些種感測物理量的每一種感測物理量的中心值。在步驟S3093中，以系統資料庫40依據每一種感測物理量的中心值計算對應的良品範圍，且以每一種感測物理量的該良品範圍作為該更新基準數據，且進一步回傳更新基準數據至運算器20。於實務上，本發明的系統資料庫40除了有儲存的功能用於儲存相關數據資料外，亦具有運算的功能用於執行數據的相關運算，例如中心值或良品範圍的運算。Please refer to FIG. 6, which is a method flowchart of a multi-input self-adjusting detection method according to another embodiment of the present invention. 6 and FIG. 5 have substantially the same process steps, but the difference is that step S309 includes steps S3091 and S3093. In step S3091, the system database 40 is used to calculate the center value of each of the sensed physical quantities based on the new reference data and the initial reference data. In step S3093, the system database 40 is used to calculate the corresponding good product range according to the center value of each sensed physical quantity, and the good product range of each sensed physical quantity is used as the update reference data, and the update reference data is further returned to Arithmetic unit 20. In practice, in addition to the storage function for storing related data, the system database 40 of the present invention also has a function for performing related operations on the data, such as a calculation of a central value or a good range.
綜合以上所述，於本發明所提出的多輸入自調節檢測器及多輸入自調節檢測方法中，主要係藉由多種感測器量測待測物的多種物理量，且將該些種物理量與基準數據比對以判斷待測物的品質狀態。且進一步透過系統資料庫將該些種物理量整合至初始參考數據以形成更新基準數據，並且回傳該更新基準數據以對原本的基準數據進行更新。藉此，可達到藉由整合待測物的多種物理量以統計之方式進行收斂判定，以提高待測物的品質/良率之目的，更可以藉由適時地回傳更新的基準數據，以進一步地提升判斷待測物之品質狀態的精準度。To sum up, in the multi-input self-adjusting detector and the multi-input self-adjusting detection method proposed by the present invention, a variety of sensors are used to measure various physical quantities of the object to be measured, and the physical quantities and The reference data is compared to determine the quality status of the test object. Furthermore, these physical quantities are integrated into the initial reference data through the system database to form updated reference data, and the updated reference data is returned to update the original reference data. In this way, it can achieve the purpose of statistically determining convergence by integrating multiple physical quantities of the object to be tested, so as to improve the quality / yield of the object to be tested, and it can further transmit updated reference data in a timely manner to further Improve the accuracy of judging the quality status of the test object.
雖然本發明以前述之實施例揭露如上，然其並非用以限定本發明。在不脫離本發明之精神和範圍內，所為之更動與潤飾，均屬本發明之專利保護範圍。關於本發明所界定之保護範圍請參考所附之申請專利範圍。Although the present invention is disclosed in the foregoing embodiments, it is not intended to limit the present invention. Changes and modifications made without departing from the spirit and scope of the present invention belong to the patent protection scope of the present invention. For the protection scope defined by the present invention, please refer to the attached patent application scope.
1‧‧‧多輸入自調節檢測器1‧‧‧Multi-input self-adjusting detector
10~14‧‧‧感測器 10 ~ 14‧‧‧Sensor
20‧‧‧運算器 20‧‧‧ Operator
30‧‧‧後端處理裝置 30‧‧‧ back-end processing device
40‧‧‧系統資料庫 40‧‧‧System Database
50‧‧‧切換開關 50‧‧‧ switch
60‧‧‧顯示平台 60‧‧‧display platform
2‧‧‧待測物 2‧‧‧ DUT
D1~D5‧‧‧資料訊號 D1 ~ D5‧‧‧ Data Signal
ID、ID’、ID1~ID4‧‧‧數據 ID, ID ’, ID1 ~ ID4‧‧‧ data
RNG、RNG’、RNG1~RNG5‧‧‧良品範圍 RNG, RNG ’, RNG1 ~ RNG5‧‧‧Good range
S、S’、S1~S5‧‧‧中心值 S, S ’, S1 ~ S5‧‧‧ center value
圖1係依據本發明之一實施例所繪示的多輸入自調節檢測器的功能方塊圖。 圖2A~2E係依據本發明之一實施例所繪示的用於產生基準數據的參考數據所包含之各種感測物理量的分佈示意圖。 圖3A係依據本發明之一實施例所繪示的初始參考數據所包含之感測物理量的分佈示意圖。 圖3B係依據本發明之一實施例所繪示的更新基準數據所包含之感測物理量的分佈示意圖。 圖4係依據本發明之另一實施例所繪示的多輸入自調節檢測器的功能方塊圖。 圖5係依據本發明之一實施例所繪示的多輸入自調節檢測方法的方法流程圖。 圖6係依據本發明之另一實施例所繪示的多輸入自調節檢測方法的方法流程圖。FIG. 1 is a functional block diagram of a multi-input self-adjusting detector according to an embodiment of the present invention. 2A to 2E are schematic diagrams showing the distribution of various sensing physical quantities included in the reference data for generating reference data according to an embodiment of the present invention. FIG. 3A is a schematic diagram of a distribution of sensing physical quantities included in initial reference data according to an embodiment of the present invention. FIG. 3B is a schematic diagram showing a distribution of sensing physical quantities included in the updated reference data according to an embodiment of the present invention. FIG. 4 is a functional block diagram of a multi-input self-adjusting detector according to another embodiment of the present invention. FIG. 5 is a method flowchart of a multi-input self-adjusting detection method according to an embodiment of the present invention. FIG. 6 is a method flowchart of a multi-input self-adjusting detection method according to another embodiment of the present invention.
Claims (10)
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Citations (3)
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|---|---|---|---|---|
| TW200910098A (en) * | 2007-08-22 | 2009-03-01 | Advantech Co Ltd | I/O module system using graphic operation to configure and its method |
| TW200920870A (en) * | 2007-11-14 | 2009-05-16 | Hsiuping Inst Technology | Online real-time inspection system for manufacturing process quality of roll-to-roll coating equipment |
| US20160185048A1 (en) * | 2014-11-18 | 2016-06-30 | Sigma Labs, Inc. | Multi-sensor quality inference and control for additive manufacturing processes |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200910098A (en) * | 2007-08-22 | 2009-03-01 | Advantech Co Ltd | I/O module system using graphic operation to configure and its method |
| TW200920870A (en) * | 2007-11-14 | 2009-05-16 | Hsiuping Inst Technology | Online real-time inspection system for manufacturing process quality of roll-to-roll coating equipment |
| TWI368664B (en) * | 2007-11-14 | 2012-07-21 | ||
| US20160185048A1 (en) * | 2014-11-18 | 2016-06-30 | Sigma Labs, Inc. | Multi-sensor quality inference and control for additive manufacturing processes |
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