TWI623741B - Optical inspection system - Google Patents
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Abstract
一種光學檢測系統，包含有一進料裝置、一多軸機械手臂、以及一待測物分類站台。該進料裝置係用以供待測物放置。該多軸機械手臂用以抓取該進料裝置上的該待測物，並將該待測物移動至影像檢測站台，以供該影像檢測站台上的影像擷取裝置拍攝該待測物的表面影像，藉以檢測該待測物的表面瑕疵。該待測物分類站台係包含有複數個出料裝置設置於該影像檢測站台的一側，該多軸機械手臂係依據該待測物的狀態將該待測物分類至個別該出料裝置。 An optical detection system includes a feeding device, a multi-axis robot arm, and a to-be-measured object classification station. The feeding device is for placing the object to be tested. The multi-axis robot arm is configured to grasp the object to be tested on the feeding device, and move the object to be detected to an image detecting station for the image capturing device on the image detecting station to take the object to be tested. A surface image by which the surface flaw of the object to be tested is detected. The object classification platform includes a plurality of discharging devices disposed on one side of the image detecting station, and the multi-axis robot arm classifies the object to be tested to the individual discharging device according to the state of the object to be tested.
Description
本發明係有關於一種光學檢測系統，尤指一種用於檢測不規則物件的光學檢測系統。 The present invention relates to an optical detection system, and more particularly to an optical detection system for detecting irregular objects.
精密檢測，係為自動化控制中極為重要之一環。觀之自動控制技術的發展，係可由量產之概念說起。量產係為大量生產(Mass Production)的縮寫，其概念很早即出現於人類的社會，具有低成本、高效率的優點。但量產的實行係受制於規格化的先決條件。在規格化尚未能達成之前，量產的對象僅限於低技術，低精密度之產業，如磚塊等簡單產品。隨著規格化之普及，分工越細，量產所能處理的對象也同時增多。然而隨之精密工業所帶來的高規格之需求，對於產品之品質亦需經過嚴密之檢測始可符合一般供應鏈之標準。是以，如何對產品進行高精密度之檢測，以提供高品質的產料輸出係為製程廠商之一大課題。 Precision testing is one of the most important aspects of automation control. The development of Guanzhi's automatic control technology can be said from the concept of mass production. The mass production system is an abbreviation of Mass Production, and its concept appeared in human society very early, with the advantages of low cost and high efficiency. However, the implementation of mass production is subject to the prerequisites for normalization. Before the standardization has been achieved, the mass production target is limited to low-tech, low-precision industries, such as simple products such as bricks. With the popularization of standardization, the finer the division of labor, the more objects that can be handled by mass production. However, with the high specification requirements brought by the precision industry, the quality of the products must be closely tested to meet the standards of the general supply chain. Therefore, how to carry out high-precision testing of products to provide high-quality output system is one of the major issues for process manufacturers.
精密檢測通常適用於須具備高精密度、低容錯率的產品，通常係配合一自動化控制產線設置，並配設於供應鏈之末端位置，以對製造之成品進行表面汙損、磨損、漏銅等瑕疵之檢測。其通常包含有一光學儀器(例如：線掃描攝影機、面掃描攝影機等)用以對待測物品的表面取像，再以電腦影像處理技術來檢出 異物或圖案異常等瑕疵。於習知技術中通常係藉由一輸送帶將待測物送至上述光學儀器之景深範圍內進行取像，然而，大多數的檢測裝置僅具備有對待測物品之單一視覺平面進行取像之功效，並不能配合多面體之產品進行多維度之表面檢測。 Precision testing is generally suitable for products that require high precision and low fault tolerance. They are usually equipped with an automated control line setting and are placed at the end of the supply chain to surface stain, wear and leak the finished product. Detection of copper and other defects. It usually includes an optical instrument (for example, a line scan camera, a surface scan camera, etc.) for taking the surface of the object to be tested, and then detecting it by computer image processing technology. Foreign matter or pattern is abnormal. In the prior art, the object to be tested is usually sent to the depth of field of the optical instrument by a conveyor belt for image capturing. However, most of the detecting devices only have a single visual plane for taking the object to be tested. Efficacy does not allow multi-dimensional surface inspection with polyhedral products.
針對多面體的檢測，於實務上通常係使用一XYZ載台以調整待測物的位置、角度，使待測物之取像面正對光學儀器的景深範圍內，然而透過XYZ載台移動多面體的技術係須單一向量之維度到達定位時，始可進行另一向量方向之位移，是以受限於操作之速率，該裝置用於大量檢測的效果並不甚理想。 For the detection of polyhedrons, an XYZ stage is usually used in practice to adjust the position and angle of the object to be tested, so that the image taking surface of the object to be tested is in the depth of field of the optical instrument, but the polyhedron is moved through the XYZ stage. When the technology system needs to reach the positioning of the dimension of a single vector, the displacement of another vector direction can be performed. The rate of operation is limited, and the effect of the device for mass detection is not satisfactory.
本發明的主要目的，在於提供一種可有效率地對不規則形狀的待測物進行檢測的光學檢測設備。 SUMMARY OF THE INVENTION A primary object of the present invention is to provide an optical detecting apparatus that can efficiently detect an irregularly shaped object to be tested.
為解決上述問題，本發明係提供一種光學檢測系統，包含有一進料裝置、一影像檢測站台、一多軸機械手臂、以及一待測物分類站台。該進料裝置係用以供待測物放置。該影像檢測站台擷取該待測物的表面影像，藉以檢測該待測物的表面瑕疵。該多軸機械手臂用以將該待測物移動至該影像檢測站台。該待測物分類站台係包含有複數個出料裝置，設置於該影像檢測站台的一側，該多軸機械手臂係依據該待測物的狀態將該待測物分類至個別該出料裝置。 In order to solve the above problems, the present invention provides an optical detecting system including a feeding device, an image detecting station, a multi-axis robot arm, and a to-be-measured object classification station. The feeding device is for placing the object to be tested. The image detecting station captures a surface image of the object to be tested, thereby detecting a surface flaw of the object to be tested. The multi-axis robot arm is used to move the object to be tested to the image detecting station. The object classification platform includes a plurality of discharging devices disposed on one side of the image detecting station, and the multi-axis robot arm classifies the object to be tested to the individual discharging device according to the state of the object to be tested. .
進一步地，該進料裝置包括移動式載盤、輸送帶、Tray盤、固定式載盤、或卡匣。 Further, the feeding device comprises a mobile carrier, a conveyor belt, a Tray disk, a stationary carrier, or a cassette.
進一步地，所述的光學檢測系統包含有一二維條碼掃描裝置，係設置於該進料裝置的一側，用以讀取該待測物的二維條碼，以確認該待測物的編號。 Further, the optical detection system includes a two-dimensional barcode scanning device disposed on one side of the feeding device for reading a two-dimensional barcode of the object to be tested to confirm the number of the object to be tested. .
進一步地，該影像檢測站台包含有一第一檢測站，所述的第一檢測站係提供一雷射掃描器至第一檢測區域，藉由該雷射掃描器建立該第一檢測區域上該待測物的三維模型，藉以完成對該待測物的檢測。 Further, the image detecting station includes a first detecting station, and the first detecting station provides a laser scanner to the first detecting area, and the laser detecting device establishes the first detecting area to be The three-dimensional model of the object is used to complete the detection of the object to be tested.
進一步地，該影像檢測站台係包含有一第二檢測站，所述的第二檢測站係提供一穹型燈至第二檢測區域，以供設置於該第二檢測區域一側的影像擷取裝置拍攝該待測物的影像。 Further, the image detecting station system includes a second detecting station, and the second detecting station provides a 灯-type lamp to the second detecting area for the image capturing device disposed on one side of the second detecting area. Take an image of the object to be tested.
進一步地，該影像檢測站台係包含有一第三檢測站，所述的第三檢測站係提供複數個側向光源至第三檢測區域，以供設置於該第三檢測區域一側的影像擷取裝置拍攝該待測物的影像。 Further, the image detecting station system includes a third detecting station, and the third detecting station provides a plurality of side light sources to the third detecting area for image capturing on one side of the third detecting area. The device captures an image of the object to be tested.
進一步地，該待測物分類站台包含有一良品出料裝置、一壞品出料裝置、以及一NG出料裝置，該多軸機械手臂係依據該待測物的瑕疵狀態分類並放置於對應的該出料裝置上。 Further, the object classification platform includes a good product discharging device, a bad product discharging device, and an NG discharging device, and the multi-axis mechanical arm is classified according to the state of the object to be tested and placed in the corresponding On the discharge device.
本發明的另一目的，在於提供一種光學檢測系統，包含有一進料裝置、一影像檢測站台、一多軸機械手臂、以及一循環式分類站台。該進料裝置係用以供待測物放置。該影像檢測站台擷取該待測物的表面影像，藉以檢測該待測物的表面瑕疵。該多軸機械手臂用以將該待測物移動至該影像檢測站台。該循環 式分類站台係包含有複數個設置於該影像檢測站台一側的出料裝置，以及複數個分別對應於該出料裝置的備援出料裝置，該出料裝置及該備援出料裝置係分別位於一收料區以及一換料區，該出料裝置於該收料區收集達到預設數量的該待測物時，與該備援出料裝置的位置進行替換。 Another object of the present invention is to provide an optical inspection system including a feeding device, an image detecting station, a multi-axis robot arm, and a circulating sorting station. The feeding device is for placing the object to be tested. The image detecting station captures a surface image of the object to be tested, thereby detecting a surface flaw of the object to be tested. The multi-axis robot arm is used to move the object to be tested to the image detecting station. The loop The sorting station system includes a plurality of discharging devices disposed on one side of the image detecting platform, and a plurality of backup discharging devices respectively corresponding to the discharging device, the discharging device and the backup discharging device The discharging device is respectively located in a receiving area and a refueling area, and the discharging device replaces the position of the backup discharging device when the predetermined amount of the object to be tested is collected in the receiving area.
進一步地，該進料裝置係為移動式載盤、輸送帶、Tray盤、固定式載盤、或卡匣。 Further, the feeding device is a mobile carrier, a conveyor belt, a Tray disk, a stationary carrier, or a cassette.
進一步地，所述的光學檢測系統包含有一備援進料裝置，該進料裝置及該備援進料裝置係分別位於一供料區以及一備料區，該進料裝置於該供料區減少至預設數量的待測物時，與該備援進料裝置的位置進行替換。 Further, the optical detection system includes a spare feeding device, the feeding device and the backup feeding device are respectively located in a feeding area and a stocking area, and the feeding device is reduced in the feeding area When the preset amount of the object to be tested is replaced with the position of the spare feeding device.
進一步地，所述的光學檢測系統包含有一二維條碼掃描裝置，係設置於該備料區上，用以讀取該備料區上該待測物的二維條碼，以確認該待測物的編號。 Further, the optical detection system includes a two-dimensional barcode scanning device disposed on the preparation area for reading a two-dimensional barcode of the object to be tested on the preparation area to confirm the object to be tested. Numbering.
進一步地，該進料裝置及該備援進料裝置係位於不同高度平面上，以便該進料裝置及該備援進料裝置於該供料區及該備料區間彼此交錯移動。 Further, the feeding device and the backup feeding device are located on different height planes, so that the feeding device and the backup feeding device are staggered with each other in the feeding region and the stocking interval.
進一步地，該出料裝置及該備援出料裝置係位於不同高度平面上，以便該出料裝置及該備援出料裝置於該收料區及該換料區間彼此交錯移動。 Further, the discharging device and the backup discharging device are located on different height planes, so that the discharging device and the backup discharging device are staggered with each other in the receiving area and the refueling interval.
進一步地，該影像檢測站台包含有一第一檢測站、一第二檢測站、及/或一第三檢測站，所述的第一檢測站係提供一 雷射掃描器至第一檢測區域，藉由該雷射掃描器建立該第一檢測區域上該待測物的三維模型；所述的第二檢測站係提供一穹型燈至第二檢測區域，以供設置於該第二檢測區域一側的影像擷取裝置拍攝該待測物的影像；所述的第三檢測站係提供複數個側向光源至第三檢測區域，以供設置於該第三檢測區域一側的影像擷取裝置拍攝該待測物的影像，藉以完成對該待測物的檢測。 Further, the image detecting station includes a first detecting station, a second detecting station, and/or a third detecting station, and the first detecting station provides one a laser scanner to the first detection area, the three-dimensional model of the object to be tested on the first detection area is established by the laser scanner; the second detection station provides a 灯-type lamp to the second detection area The image capturing device disposed on one side of the second detecting area captures an image of the object to be tested; the third detecting station provides a plurality of side light sources to a third detecting area for being disposed on the image detecting device The image capturing device on the side of the third detecting area captures an image of the object to be tested, thereby completing the detection of the object to be tested.
進一步地，該循環式分類站台包含有一良品出料裝置、一壞品出料裝置、以及一NG出料裝置，該多軸機械手臂係依據該待測物的瑕疵狀態分類並放置於對應的該出料裝置上。 Further, the circulating sorting station comprises a good product discharging device, a bad product discharging device, and an NG discharging device, and the multi-axis mechanical arm is classified according to the state of the object to be tested and placed in the corresponding one. On the discharge device.
進一步地，所述的光學檢測系統包含有一吊掛支架，該吊掛支架係設置於該循環式分類站台的上方，用以供該多軸機械手臂的基座吊掛設置。 Further, the optical detection system includes a hanging bracket disposed above the circulating sorting platform for hanging the base of the multi-axis robot arm.
本發明的另一目的，在於提供一種光學檢測系統，包含有一進料裝置、一影像檢測站台、一多軸機械手臂、以及一旋轉分類站台。該進料裝置係用以供待測物放置。該影像檢測站台擷取該待測物的表面影像，藉以檢測該待測物的表面瑕疵。該多軸機械手臂用以將該待測物移動至該影像檢測站台。該旋轉分類站台具有一旋轉載台、一帶動該旋轉載台旋轉的驅動裝置、一移載裝置，以及複數個出料裝置，其中該旋轉載台係用以供複數個該待測物設置，該多軸機械手臂係將檢測完成的該待測物放置於該旋轉載台上，該驅動單元係帶動該旋轉載台旋轉，以將該待測物移動至靠近該移載裝置的一側，藉由該移載裝置依據該待測 物的狀態將該待測物分類至個別該出料裝置。。 Another object of the present invention is to provide an optical inspection system including a feeding device, an image detecting station, a multi-axis robot, and a rotary sorting station. The feeding device is for placing the object to be tested. The image detecting station captures a surface image of the object to be tested, thereby detecting a surface flaw of the object to be tested. The multi-axis robot arm is used to move the object to be tested to the image detecting station. The rotary sorting station has a rotating stage, a driving device for rotating the rotating stage, a transfer device, and a plurality of discharging devices, wherein the rotating stage is used for setting a plurality of the objects to be tested. The multi-axis robot arm places the detected object to be tested on the rotating stage, and the driving unit drives the rotating stage to rotate to move the object to be tested to a side close to the transfer device. By the transfer device, according to the test The state of the object classifies the object to be tested into individual discharge devices. .
進一步地，該進料裝置包括移動式載盤、輸送帶、Tray盤、固定式載盤、或卡匣。 Further, the feeding device comprises a mobile carrier, a conveyor belt, a Tray disk, a stationary carrier, or a cassette.
進一步地，所述的光學檢測系統包含有一二維條碼掃描裝置，係設置於該進料裝置的一側，用以讀取該待測物的二維條碼，以確認該待測物的編號。 Further, the optical detection system includes a two-dimensional barcode scanning device disposed on one side of the feeding device for reading a two-dimensional barcode of the object to be tested to confirm the number of the object to be tested. .
進一步地，該影像檢測站台包含有一第一檢測站，所述的第一檢測站係提供一雷射掃描器至第一檢測區域，藉由該雷射掃描器建立該第一檢測區域上該待測物的三維模型，藉以完成對該待測物的檢測。 Further, the image detecting station includes a first detecting station, and the first detecting station provides a laser scanner to the first detecting area, and the laser detecting device establishes the first detecting area to be The three-dimensional model of the object is used to complete the detection of the object to be tested.
進一步地，該影像檢測站台係包含有一第二檢測站，所述的第二檢測站係提供一穹型燈至第二檢測區域，以供設置於該第二檢測區域一側的影像擷取裝置拍攝該待測物的影像。 Further, the image detecting station system includes a second detecting station, and the second detecting station provides a 灯-type lamp to the second detecting area for the image capturing device disposed on one side of the second detecting area. Take an image of the object to be tested.
進一步地，該影像檢測站台係包含有一第三檢測站，所述的第三檢測站係提供複數個側向光源至第三檢測區域，以供設置於該第三檢測區域一側的影像擷取裝置拍攝該待測物的影像。 Further, the image detecting station system includes a third detecting station, and the third detecting station provides a plurality of side light sources to the third detecting area for image capturing on one side of the third detecting area. The device captures an image of the object to be tested.
進一步地，該旋轉分類站台包含有一良品出料裝置、一壞品出料裝置、以及一NG出料裝置，該多軸機械手臂係依據該待測物的瑕疵狀態分類並放置於對應的該出料裝置上。 Further, the rotary sorting station comprises a good product discharging device, a bad product discharging device, and an NG discharging device, and the multi-axis mechanical arm is classified according to the state of the object to be tested and placed in the corresponding one. On the material device.
本發明係比起習知技術具有以下的優勢功效： The present invention has the following advantageous effects over the prior art:
1.本發明可有效率地對不規則形狀的待測物進行檢 測，減少檢測時所需的時間。 1. The invention can efficiently inspect irregular shapes of the object to be tested Test to reduce the time required for testing.
2.本發明可拍攝待測物的外觀影像並重建待測物的3D圖形，藉以對待測物進行全面的檢測。 2. The present invention can take an image of the appearance of the object to be tested and reconstruct a 3D pattern of the object to be tested, thereby performing a comprehensive inspection of the object to be tested.
100‧‧‧光學檢測系統 100‧‧‧ Optical Inspection System
SF‧‧‧待測物 SF‧‧‧Test object
110‧‧‧進料裝置 110‧‧‧Feeding device
120‧‧‧二維條碼掃描裝置 120‧‧‧Two-dimensional barcode scanning device
130‧‧‧多軸機械手臂 130‧‧‧Multi-axis robot
131‧‧‧抓取部 131‧‧‧ Grasping Department
132‧‧‧機臂 132‧‧‧ arm
140‧‧‧影像檢測站台 140‧‧‧Image inspection platform
141‧‧‧第一檢測站 141‧‧‧ first test station
1411‧‧‧雷射掃描器 1411‧‧‧Laser scanner
1412‧‧‧第一檢測區域 1412‧‧‧First inspection area
142‧‧‧第二檢測站 142‧‧‧Second test station
1421‧‧‧穹型燈 1421‧‧‧穹 lamp
1422‧‧‧第二檢測區域 1422‧‧‧Second test area
1423‧‧‧影像擷取裝置 1423‧‧‧Image capture device
143‧‧‧第三檢測站 143‧‧‧ third test station
1431‧‧‧側向光源 1431‧‧‧lateral light source
1432‧‧‧第三檢測區域 1432‧‧‧ third detection area
1433‧‧‧影像擷取裝置 1433‧‧‧Image capture device
150‧‧‧待測物分類站台 150‧‧‧Substance classification platform
151‧‧‧良品出料裝置 151‧‧‧Good product discharge device
152‧‧‧壞品出料裝置 152‧‧‧Dangerous material discharge device
153‧‧‧NG出料裝置 153‧‧‧NG discharge device
200‧‧‧光學檢測系統 200‧‧‧ Optical Inspection System
210‧‧‧進料裝置 210‧‧‧Feeding device
220‧‧‧備援進料裝置 220‧‧‧Backup feeding device
230‧‧‧二維條碼掃描裝置 230‧‧‧Two-dimensional barcode scanning device
240A、240B‧‧‧多軸機械手臂 240A, 240B‧‧‧Multi-axis robot
250‧‧‧影像檢測站台 250‧‧‧Image inspection platform
251‧‧‧第一檢測站 251‧‧‧ first test station
252‧‧‧第二檢測站 252‧‧‧Second test station
253‧‧‧第三檢測站 253‧‧‧ third test station
260‧‧‧循環式分類站台 260‧‧‧Circulating sorting platform
261A‧‧‧良品出料裝置 261A‧‧‧Good product discharge device
261B‧‧‧備援出料裝置 261B‧‧‧Reserved discharge device
262A‧‧‧壞品出料裝置 262A‧‧‧Drug discharge device
262B‧‧‧備援出料裝置 262B‧‧‧Reserved discharge device
263A‧‧‧NG出料裝置 263A‧‧‧NG discharge device
263B‧‧‧備援出料裝置 263B‧‧‧Reserved discharge device
270‧‧‧吊掛支架 270‧‧‧ hanging bracket
271‧‧‧側支架 271‧‧‧ side bracket
272‧‧‧橫支架 272‧‧‧ horizontal bracket
R1‧‧‧供料區 R1‧‧‧Feeding area
R2‧‧‧備料區 R2‧‧‧Material area
R3‧‧‧收料區 R3‧‧‧ receiving area
R4‧‧‧換料區 R4‧‧‧ Refueling area
R5‧‧‧收料區 R5‧‧‧ receiving area
R6‧‧‧換料區 R6‧‧‧Refueling area
R7‧‧‧收料區 R7‧‧‧ receiving area
R8‧‧‧換料區 R8‧‧‧Refueling area
300‧‧‧光學檢測系統 300‧‧‧Optical inspection system
310‧‧‧進料裝置 310‧‧‧Feeding device
320‧‧‧二維條碼掃描裝置 320‧‧‧Two-dimensional barcode scanning device
330A、330B‧‧‧多軸機械手臂 330A, 330B‧‧‧Multi-axis robot
340A‧‧‧影像檢測站台 340A‧‧‧Image Inspection Platform
341A‧‧‧第一檢測站 341A‧‧‧ first test station
342A‧‧‧第二檢測站 342A‧‧‧Second test station
343A‧‧‧第三檢測站 343A‧‧‧ third test station
340B‧‧‧影像檢測站台 340B‧‧‧Image Inspection Platform
341B‧‧‧第一檢測站 341B‧‧‧ first test station
342B‧‧‧第二檢測站 342B‧‧‧Second test station
343B‧‧‧第三檢測站 343B‧‧‧ third test station
350‧‧‧旋轉分類站台 350‧‧‧Rotating Classification Platform
351A、351B‧‧‧旋轉載台 351A, 351B‧‧‧ Rotating stage
352A、352B‧‧‧驅動裝置 352A, 352B‧‧‧ drive
352‧‧‧移載裝置 352‧‧‧Transfer device
353‧‧‧良品出料裝置 353‧‧‧Good product discharge device
354‧‧‧壞品出料裝置 354‧‧‧Dangerous material discharge device
355‧‧‧NG出料裝置 355‧‧‧NG discharge device
圖1，係本發明第一實施態樣的外觀示意圖。 Fig. 1 is a schematic view showing the appearance of a first embodiment of the present invention.
圖2，係本發明第一實施態樣多軸機械手臂的工作示意圖。 Fig. 2 is a schematic view showing the operation of the multi-axis robot arm of the first embodiment of the present invention.
圖3，係本發明第一實施態樣的俯視圖。 Fig. 3 is a plan view showing a first embodiment of the present invention.
圖4-1至圖4-3，係本發明第一實施態樣的工作示意圖(一)至工作示意圖(三)。 4-1 to 4-3 are schematic diagrams (1) to (3) of the operation of the first embodiment of the present invention.
圖5，係本發明第二實施態樣的外觀示意圖。 Fig. 5 is a schematic view showing the appearance of a second embodiment of the present invention.
圖6，係本發明第二實施態樣的俯視圖。 Figure 6 is a plan view of a second embodiment of the present invention.
圖7-1至圖7-4，係本發明第二實施態樣的工作示意圖(一)至工作示意圖(四)。 7-1 to 7-4 are schematic diagrams (1) to (4) of the second embodiment of the present invention.
圖8，係本發明第三實施態樣的外觀示意圖。 Figure 8 is a schematic view showing the appearance of a third embodiment of the present invention.
圖9，係本發明第三實施態樣的俯視圖。 Figure 9 is a plan view of a third embodiment of the present invention.
圖10-1至圖10-4，係本發明第三實施態樣的工作示意圖(一)至工作示意圖(四)。 10-1 to 10-4 are schematic diagrams (1) to (4) of the operation of the third embodiment of the present invention.
有關本發明之詳細說明及技術內容，現就配合圖式說明如下。再者，本發明中之圖式，為說明方便，其比例未必照實際比例繪製，該等圖式及其比例並非用以限制本發明之範圍， 在此先行敘明。 The detailed description and technical contents of the present invention will now be described with reference to the drawings. In addition, the drawings in the present invention are not intended to limit the scope of the present invention. Explain first here.
以下係提出本發明的三種不同實施態樣進行說明，請先參閱「圖1」至「圖3」，以下係針對本發明的第一實施態樣進行說明：本實施態樣係提供一種光學檢測系統100，用於對多曲面的待測物SF進行檢測。該光學檢測系統100包含有一進料裝置110、一二維條碼掃描裝置120、一多軸機械手臂130、一影像檢測站台140、以及一待測物分類站台150。 In the following, three different embodiments of the present invention are described. Please refer to FIG. 1 to FIG. 3 first. The following is a description of the first embodiment of the present invention: the present embodiment provides an optical detection. The system 100 is configured to detect a multi-surface object to be tested SF. The optical detection system 100 includes a feeding device 110, a two-dimensional barcode scanning device 120, a multi-axis robot arm 130, an image detecting station 140, and a sample sorting station 150.
所述的進料裝置110係用以供待測物SF放置，並用以輸送該待測物SF。該進料裝置110係用以承載並輸送待測物SF，將待測物SF朝圖3中X方向移動，以經由後續的影像檢測站台140，對該待測物SF進行相應的檢測。於較佳實施態樣中，所述的進料裝置110係為移動式載盤，透過驅動裝置(例如馬達、輸送帶或汽缸等)帶動載盤及設置於其上的待測物SF移動。於較佳實施例，，所述的進料裝置110亦可以為輸送帶、Tray盤、固定式載盤、料片卡匣等，於本發明中不予以限制。此外，於較佳實施態樣中，所述的進料裝置110亦可另外搭配真空吸附裝置，用以吸附待測物SF，以便進料裝置110輸送該待測物SF時，將待測物SF穩固地吸附於進料裝置110的平台上，避免待測物SF於移動的期間內晃動、或是掉落。 The feeding device 110 is used for placing the object to be tested SF and for conveying the object to be tested SF. The feeding device 110 is configured to carry and transport the object to be tested SF, and move the object to be tested SF toward the X direction in FIG. 3 to perform corresponding detection on the object to be tested SF via the subsequent image detecting station 140. In a preferred embodiment, the feeding device 110 is a mobile carrier, and the driving device (such as a motor, a conveyor belt or a cylinder, etc.) drives the carrier and the object to be tested SF disposed thereon to move. In the preferred embodiment, the feeding device 110 can also be a conveyor belt, a Tray disk, a stationary carrier, a chip cassette, etc., which are not limited in the present invention. In addition, in a preferred embodiment, the feeding device 110 may be additionally equipped with a vacuum adsorption device for adsorbing the object to be tested SF, so that when the feeding device 110 transports the object to be tested SF, the object to be tested is to be tested. The SF is firmly adsorbed on the platform of the feeding device 110, and the object to be tested SF is prevented from shaking or falling during the moving period.
所述的二維條碼掃描裝置120係設置於該進料裝置110的一側，用以讀取該待測物SF的二維條碼，以確認該待測物 SF的編號。所述的二維條碼掃描裝置120可以為CCD條碼掃描器、或雷射掃描器等，針對該二維條碼掃描裝置120的種類於本發明中不予以限制。於本實施態樣中，所述的二維條碼掃描裝置120係固定設置於該進料裝置110移動路徑的一側，當待測物SF沿該移動路徑移動時，由該二維條碼掃描裝置120讀取二維條碼標籤上的二維條碼。於另一較佳實施態樣中，當所述的進料裝置110為固定載盤時，該二維條碼掃描裝置120可設置於移動式載台、或是多軸機臂上移動至各該待測物的SF上方，以讀取該待測物SF的二維條碼。 The two-dimensional barcode scanning device 120 is disposed on one side of the feeding device 110 for reading a two-dimensional barcode of the object to be tested SF to confirm the object to be tested. The number of the SF. The two-dimensional barcode scanning device 120 may be a CCD barcode scanner or a laser scanner. The type of the two-dimensional barcode scanning device 120 is not limited in the present invention. In the embodiment, the two-dimensional barcode scanning device 120 is fixedly disposed on one side of the moving path of the feeding device 110, and the two-dimensional barcode scanning device is used when the object to be tested SF moves along the moving path. 120 reads the 2D barcode on the 2D barcode label. In another preferred embodiment, when the feeding device 110 is a fixed carrier, the two-dimensional barcode scanning device 120 can be disposed on a mobile stage or a multi-axis arm to move to each of the two. Above the SF of the object to be tested, to read the two-dimensional barcode of the object to be tested SF.
所述的多軸機械手臂130用以抓取該進料裝置110上的待測物SF，並將該待測物SF移動至影像檢測站台140，以供該影像檢測站台140上的影像擷取裝置拍攝該待測物SF的表面影像，藉以檢測該待測物SF的表面瑕疵。待測物分類站台150係包含有複數個出料裝置設置於該影像檢測站台140的一側，該多軸機械手臂130係依據該待測物SF的狀態，將該待測物SF分類至個別該出料裝置(良品出料裝置151、壞品出料裝置152、NG出料裝置153)。 The multi-axis robot arm 130 is configured to grasp the object to be tested SF on the feeding device 110, and move the object to be tested SF to the image detecting station 140 for image capturing on the image detecting station 140. The device captures a surface image of the object to be tested SF, thereby detecting a surface flaw of the object to be tested SF. The object classification platform 150 includes a plurality of discharging devices disposed on one side of the image detecting station 140. The multi-axis robot 130 classifies the object to be tested SF into individual according to the state of the object to be tested SF. The discharge device (good product discharge device 151, bad product discharge device 152, NG discharge device 153).
於較佳實施態樣中，所述的多軸機械手臂130係包含有一固定上述待測物SF之抓取部131，以及一連結該抓取部131以移動上述待測物SF之機臂132。於本實施態樣中，該抓取部131係為可吸附待測物SF之真空吸附裝置，於實務上操作時，該抓取部131亦可為藉由馬達驅動用以夾持待測物SF之夾臂，於本發明 中並不予以限制該抓取部131的實施型態。如圖2所示，所述的多軸機械手臂130係可將待側物SF移動至影像檢測站台140各檢測站的一側，將該待側物SF移動至檢測站中雷射掃描器或影像擷取裝置的取像範圍內，並轉動該待側物SF，以利雷射掃描器或影像擷取裝置連續擷取待測物SF的影像，藉以擷取該待測物SF的各個平面及曲面的影像，完成影像檢測。 In a preferred embodiment, the multi-axis robot arm 130 includes a gripping portion 131 that fixes the object to be tested SF, and a robot arm 132 that connects the gripping portion 131 to move the object to be tested SF. . In this embodiment, the grasping portion 131 is a vacuum adsorption device that can adsorb the object to be tested SF. When the operation is performed, the grasping portion 131 can also be driven by a motor to clamp the object to be tested. SF clip arm, in the present invention The implementation form of the gripping portion 131 is not limited. As shown in FIG. 2, the multi-axis robot arm 130 can move the object to be side SF to one side of each detecting station of the image detecting station 140, and move the object to be side SF to a laser scanner in the detecting station or The image capturing device is in the image capturing range, and the object to be side SF is rotated, so that the laser scanner or the image capturing device continuously captures the image of the object to be tested SF, thereby capturing the planes of the object to be tested SF. And the image of the surface to complete the image detection.
所述的影像檢測站台140係用以對待測物SF的表面進行光學檢測，為對應不同的瑕疵檢測，該影像檢測站台140係包含有一第一檢測站141、一第二檢測站142、以及一第三檢測站143。 The image detecting station 140 is configured to perform optical detection on the surface of the object to be tested SF for detecting different flaws. The image detecting station 140 includes a first detecting station 141, a second detecting station 142, and a The third detection station 143.
所述的第一檢測站141係提供一雷射掃描器1411至第一檢測區域1412，藉由該雷射掃描器1411建立該第一檢測區域1412上的該待測物SF三維模型，藉以完成對該待測物SF的檢測。該雷射掃描器1411係可用以偵測並分析待測物SF的形狀(幾何構造)與外觀資料(如顏色、表面反光率等性質)，蒐集到的資料係用以進行三維重建計算，藉以建立實際物體的數位模型。該待測物SF係透過該多軸機械手臂130移動至該雷射掃描器1411的檢測區域(第一檢測區域1412)範圍內，完成對該待測物SF形狀的檢測。 The first detecting station 141 provides a laser scanner 1411 to the first detecting area 1412, and the laser scanner 1411 establishes a three-dimensional model of the object to be tested SF on the first detecting area 1412, thereby completing Detection of the analyte SF. The laser scanner 1411 can be used to detect and analyze the shape (geometry) and appearance data (such as color, surface reflectivity, etc.) of the object to be tested SF, and the collected data is used for three-dimensional reconstruction calculation. Create a digital model of the actual object. The object to be tested SF is moved to the detection area (first detection area 1412) of the laser scanner 1411 through the multi-axis robot arm 130, and the detection of the shape of the object SF is completed.
所述的第二檢測站142係提供一穹型燈1421至第二檢測區域1422，以供設置於該第二檢測區域1422一側的影像擷取裝置1423，拍攝該待測物SF的影像。該第二檢測站142適合用於檢測金屬變色、料件表面變色、黑線、積墨、漏底材、亮點、 花斑、髒污、刮傷之部分，均可被清晰的辨識。 The second detecting station 142 provides a 灯-type lamp 1421 to a second detecting area 1422 for the image capturing device 1423 disposed on the side of the second detecting area 1422 to capture an image of the object SF. The second detecting station 142 is suitable for detecting metal discoloration, discoloration of the surface of the material, black line, ink accumulation, leaking substrate, bright spots, The spots, stains, and scratches can be clearly identified.
所述的第三檢測站143係提供複數個側向光源1431至第三檢測區域1432，以供設置於該第三檢測區域1432一側的影像擷取裝置1433拍攝該待測物SF的影像。該第三檢測站143適合用於檢測影像中的不平整區域產生相對應的陰影，適合用於檢測例如豎紋、刀紋、砂光紋等造成待測物SF表面不平整的瑕疵。 The third detecting station 143 provides a plurality of side light sources 1431 to 1432 for imaging the image of the object to be tested SF by the image capturing device 1433 disposed on the side of the third detecting area 1432. The third detecting station 143 is adapted to detect a shadow in the uneven area in the image, and is suitable for detecting flaws such as vertical lines, knives, sanding lines, etc., which cause the surface of the object to be tested SF to be uneven.
以上所述的雷射掃描器1411及影像擷取裝置1423、1433係配合或包含有專門用以分析影像的處理器，透過處理器可將雷射掃描器1411及影像擷取裝置1423、1433所取得的影像進行影像分析，並依據影像分析的結果標註瑕疵的位置、或針對瑕疵的種類進行分類，藉以完成檢測。 The laser scanner 1411 and the image capturing devices 1423 and 1433 described above cooperate with or include a processor for analyzing images. The laser scanner 1411 and the image capturing devices 1423 and 1433 can be used by the processor. The acquired images are subjected to image analysis, and the positions of the defects are marked according to the results of the image analysis, or the types of the defects are classified to complete the detection.
所述的待測物分類站台150包含有一良品出料裝置151、一壞品出料裝置152、以及一NG出料裝置153，該多軸機械手臂130係依據該待測物SF的瑕疵狀態，分類並放置於對應的出料裝置上。於較佳實施態樣中，所述的出料裝置(良品出料裝置151、壞品出料裝置152、NG出料裝置153)係為移動式載盤，透過驅動裝置(例如馬達、輸送帶或汽缸等)帶動載盤及設置於其上的待測物SF移動。除上述的實施態樣外，所述的出料裝置亦可以為輸送帶、Tray盤、固定式載盤、料片卡匣等，於本發明中不予以限制。此外，於較佳實施態樣中，所述的出料裝置亦可另外搭配真空吸附裝置，用以吸附待測物，以便出料裝置輸送該待測物SF時將待測物SF穩固地吸附於出料裝置的平台上，避免待測物SF 於移動的期間內晃動、或是掉落。 The object classification platform 150 includes a good product discharging device 151, a bad product discharging device 152, and an NG discharging device 153. The multi-axis robot arm 130 is based on the 瑕疵 state of the object to be tested SF. Sort and place on the corresponding discharge device. In a preferred embodiment, the discharging device (good product discharging device 151, bad product discharging device 152, NG discharging device 153) is a mobile carrier, and is driven by a driving device (for example, a motor and a conveyor belt). Or the cylinder or the like) drives the carrier and the object to be tested SF disposed thereon to move. In addition to the above embodiments, the discharging device may also be a conveyor belt, a Tray disk, a stationary carrier, a chip cassette, etc., which are not limited in the present invention. In addition, in a preferred embodiment, the discharging device may be additionally equipped with a vacuum adsorption device for adsorbing the object to be tested, so that the object to be tested SF is stably adsorbed when the discharging device delivers the object to be tested SF. On the platform of the discharge device, avoid the object to be tested SF Shake or drop during the movement.
請一併參閱「圖4-1」至「圖4-3」，係揭示本發明第一實施態樣的工作示意圖，如圖所示：請先參閱「圖4-1」，於起始時，進料裝置110係先將待測物SF朝二維條碼掃描裝置120的方向移動，以供該二維條碼掃描裝置120讀取該待測物SF的編號。 Please refer to "Fig. 4-1" to "Fig. 4-3" for a brief view of the operation of the first embodiment of the present invention. As shown in the figure: please refer to "Fig. 4-1" at the beginning. The feeding device 110 first moves the object to be tested SF toward the two-dimensional bar code scanning device 120, so that the two-dimensional bar code scanning device 120 reads the number of the object to be tested SF.
接續，請參閱「圖4-2」，於讀取完成後，該多軸機械手臂130係吸附該待測物SF，藉以將該待測物SF移動至該影像檢測站台140，藉以對該待測物SF進行影像擷取以及檢測作業。於檢測完成時，係依據該待測物SF的編號記錄該待測物SF的料件狀態、及瑕疵類別。檢測的結果係記錄至系統的儲存單元(未顯示)，並依據料件狀態、及瑕疵類別進行分類，以透過系統控管待測物SF的流向。 For the connection, please refer to FIG. 4-2. After the reading is completed, the multi-axis robot arm 130 adsorbs the object to be tested SF, thereby moving the object to be tested SF to the image detecting station 140, thereby The object SF performs image capturing and detecting operations. When the detection is completed, the state of the material of the object to be tested SF and the type of the defect are recorded according to the number of the object to be tested SF. The results of the test are recorded to the storage unit of the system (not shown), and are classified according to the state of the material and the type of the cockroach to control the flow of the SF to be tested through the system.
最後，請參閱「圖4-3」，於檢測完成時，該多軸機械手臂130係依據該待測物SF的料件狀態，於待測物分類站台150上進行分類。當檢測到待測物SF為無瑕疵時，將該待測物SF設置於該良品出料裝置151上送出；於檢測到待測物SF有無法修復的瑕疵時，將該待測物SF設置於該壞品出料裝置152上送出；於檢測到可修復的瑕疵時，將該待測物SF設置於該NG出料裝置153上送出，完成待測物SF的分類工作。 Finally, please refer to FIG. 4-3. When the detection is completed, the multi-axis robot 130 is classified on the object classification platform 150 according to the state of the workpiece SF. When it is detected that the object to be tested SF is flawless, the object to be tested SF is set to be sent to the good product discharging device 151; and when the object to be tested SF is detected to have an unrepairable defect, the object to be tested SF is set. The product is sent out on the defective product discharging device 152. When the repairable flaw is detected, the object to be tested SF is set on the NG discharging device 153 to be sent out, and the classification work of the object to be tested SF is completed.
請續參閱「圖5」、及「圖6」，以下係針對本發明的第二實施態樣進行說明： 本實施態樣係提供一種光學檢測系統200，包含有一進料裝置210、一備援進料裝置220、一二維條碼掃描裝置230、二多軸機械手臂240A、240B、一影像檢測站台250、以及一循環式分類站台260。 Please refer to FIG. 5 and FIG. 6 hereinafter. The following describes the second embodiment of the present invention: The present embodiment provides an optical detection system 200 including a feeding device 210, a backup feeding device 220, a two-dimensional barcode scanning device 230, two multi-axis robot arms 240A, 240B, and an image detecting station 250. And a circular classification station 260.
所述的進料裝置210係用以供待測物SF放置，並用以輸送該待測物SF，將待測物SF移動至供料區R1，以藉由該多軸機械手臂240抓取至影像檢測平台250上進行檢測。於較佳實施態樣中，所述的進料裝置210係為移動式載盤，透過驅動裝置(例如馬達、輸送帶或汽缸等)帶動載盤及設置於其上的待測物SF移動。所述的備援進料裝置220係設置於該進料裝置210的一側，該進料裝置210及該備援進料裝置220係分別位於一供料區R1以及一備料區R2，當供料區R1的待測物SF減少至預設數量時，該進料裝置210係與該備援進料裝置220的位置進行替換，將該備援進料裝置220移動至該供料區R1，並將該進料裝置210移動至該備料區R2，以便供機台或設備人員將新的待測物SF設置於備料區R2上的進料裝置210；同理，當該備援進料裝置220的待測物SF減少至預設數量時，該備援進料裝置220將與該進料裝置210的位置再進行替換，藉此，可省去補替換待測物SF所需的時間。為避免進料裝置210及該備援進料裝置220於交錯移動時，兩者的行程間產生干涉碰撞，該進料裝置210及該備援進料裝置220係位於不同高度平面上，以便該進料裝置210及該備援進料裝置220於該供料區R1及該備料區R2間彼此交錯移動。另外，於 較佳實施態樣中，所述的進料裝置210亦可另外搭配真空吸附裝置，用以吸附待測物SF，以便進料裝置210輸送該待測物SF時將待測物SF穩固地吸附於進料裝置210的平台上，避免待測物SF於移動的期間內晃動、或是掉落。 The feeding device 210 is configured to be used for the object to be tested SF, and to transport the object to be tested SF, and move the object to be tested SF to the feeding area R1 to be grasped by the multi-axis robot arm 240. Detection is performed on the image detection platform 250. In a preferred embodiment, the feeding device 210 is a mobile carrier, and the driving device (such as a motor, a conveyor belt or a cylinder, etc.) drives the carrier and the object to be tested SF disposed thereon to move. The backup feeding device 220 is disposed on one side of the feeding device 210, and the feeding device 210 and the backup feeding device 220 are respectively located in a feeding area R1 and a feeding area R2. When the object to be tested SF of the material zone R1 is reduced to a preset amount, the feeding device 210 is replaced with the position of the spare feeding device 220, and the backup feeding device 220 is moved to the feeding zone R1. And moving the feeding device 210 to the stocking area R2, so that the machine or equipment personnel can set a new object to be tested SF to the feeding device 210 on the stocking area R2; similarly, when the spare feeding device When the object to be tested SF of 220 is reduced to a preset number, the backup feeding device 220 will be replaced with the position of the feeding device 210, whereby the time required to replace the object to be tested SF can be omitted. In order to avoid an interference collision between the strokes of the feeding device 210 and the backup feeding device 220, the feeding device 210 and the backup feeding device 220 are located on different height planes, so that the The feeding device 210 and the backup feeding device 220 are staggered with each other between the feeding region R1 and the stocking region R2. In addition, In a preferred embodiment, the feeding device 210 may be additionally equipped with a vacuum adsorption device for adsorbing the object to be tested SF, so that the object to be tested SF is stably adsorbed when the feeding device 210 delivers the object to be tested SF. On the platform of the feeding device 210, the object to be tested SF is prevented from shaking or falling during the moving period.
所述的二維條碼掃描裝置230係設置於該備料區R2上，用以讀取該待測物SF的二維條碼，以確認該待測物SF的編號。所述的二維條碼掃描裝置230可以為CCD條碼掃描器、或雷射掃描器等，針對該二維條碼掃描裝置230的種類於本發明中不予以限制。於本實施態樣中，所述的二維條碼掃描裝置230係固定設置於備料區R2上，當待測物SF經由機台或設備人員移動至備料區R2上時，該二維條碼掃描裝置230係確認該待測物SF的編號。 The two-dimensional barcode scanning device 230 is disposed on the preparation area R2 for reading the two-dimensional barcode of the object to be tested SF to confirm the number of the object to be tested SF. The two-dimensional barcode scanning device 230 may be a CCD barcode scanner or a laser scanner. The type of the two-dimensional barcode scanning device 230 is not limited in the present invention. In the embodiment, the two-dimensional barcode scanning device 230 is fixedly disposed on the preparation area R2, and the two-dimensional barcode scanning device is moved when the object to be tested SF moves to the preparation area R2 via the machine or equipment personnel. The 230 system confirms the number of the test object SF.
所述的多軸機械手臂240A、240B用以抓取該進料裝置210上的待測物SF，並將該待測物SF移動至影像檢測站台250，以供該影像檢測站台250上的影像擷取裝置拍攝該待測物SF的表面影像，藉以檢測該待測物SF的表面瑕疵。於本實施態樣中，於該光學檢測系統200的平台上係設置有一吊掛支架270，所述的吊掛支架270係包含有二設置於平台上的側支架271，以及一設置於二側支架271之間的橫支架272。該吊掛支架270係設置於該循環式分類站台260的上方，用以供該多軸機械手臂240A、240B的基座吊掛設置，藉以減少平台上所需的空間，並增加多軸機械手臂240A、240B的可動範圍。於本實施態樣中係透過雙手臂同時 取料檢測，增加檢測的效率。 The multi-axis robot arms 240A, 240B are used to grasp the object to be tested SF on the feeding device 210, and move the object to be tested SF to the image detecting station 250 for the image on the image detecting station 250. The capturing device captures a surface image of the object to be tested SF, thereby detecting a surface flaw of the object to be tested SF. In the embodiment, a suspension bracket 270 is disposed on the platform of the optical detection system 200. The suspension bracket 270 includes two side brackets 271 disposed on the platform, and one side is disposed on two sides. A transverse bracket 272 between the brackets 271. The hanging bracket 270 is disposed above the circulating sorting station 260 for hanging the base of the multi-axis robot arms 240A, 240B, thereby reducing the space required on the platform and adding a multi-axis robot arm. The movable range of 240A and 240B. In this embodiment, the two arms are simultaneously Retrieval detection increases the efficiency of detection.
所述的影像檢測站台250係用以對待測物SF的表面進行光學檢測，為對應不同的瑕疵檢測，該影像檢測站台250係包含有一第一檢測站251、一第二檢測站252、以及一第三檢測站253。於本實施態樣中，所述的第一檢測站251、第二檢測站252、及第三檢測站253與第一實施態樣的第一檢測站141、第二檢測站142、第三檢測站143相同，以下便不再予以贅述。 The image detecting station 250 is configured to perform optical detection on the surface of the object to be tested SF, and corresponds to different flaw detection. The image detecting station 250 includes a first detecting station 251, a second detecting station 252, and a The third detection station 253. In the embodiment, the first detecting station 251, the second detecting station 252, and the third detecting station 253 are the first detecting station 141, the second detecting station 142, and the third detecting in the first embodiment. Station 143 is the same and will not be described below.
所述的循環式分類站台260，係包含有複數個設置於該影像檢測站台250一側的出料裝置(良品出料裝置261A、壞品出料裝置262A、NG出料裝置263A)，以及複數個分別對應於該出料裝置的備援出料裝置(備援出料裝置261B、262B、263B)，該出料裝置及該備援出料裝置係分別位於一收料區R3、R5、R7以及一換料區R4、R6、R8，該出料裝置於該收料區R3、R5、R7收集達到預設數量的待測物SF時，與該備援出料裝置的位置進行替換。同第一實施態樣該複數個出料裝置依據所設置的待測物SF種類不同，可以分為良品出料裝置261A、壞品出料裝置262A、以及NG出料裝置263A。每一種出料裝置均分別具有一備援出料裝置261B、262B、263B，該多軸機械手臂240A、240B係依據該待測物SF的瑕疵狀態分類並放置於對應的出料裝置上。於較佳的實施態樣中，為避免出料裝置及該備援出料裝置於交錯移動時，兩者的行程間產生干涉碰撞，該出料裝置及該備援出料裝置係位於不同高度平面上，以便該出料裝置及該備援出料裝置於該收料區 及該換料區間彼此交錯移動。另外，於較佳實施態樣中，所述的出料裝置亦可另外搭配真空吸附裝置，用以吸附待測物SF，以便出料裝置輸送該待測物SF時將待測物SF穩固地吸附於出料裝置的平台上，避免待測物SF於移動的期間內晃動、或是掉落。 The circulating sorting station 260 includes a plurality of discharging devices (good product discharging device 261A, bad product discharging device 262A, NG discharging device 263A) disposed on one side of the image detecting station 250, and plural Each of the discharge device and the backup device is located in a receiving area R3, R5, and R7, respectively. And a refueling area R4, R6, and R8, wherein the discharging device replaces the position of the backup discharging device when the receiving area R3, R5, and R7 collects a predetermined number of objects to be tested SF. According to the first embodiment, the plurality of discharge devices can be classified into a good product discharge device 261A, a bad product discharge device 262A, and an NG discharge device 263A depending on the type of the object to be tested SF. Each of the discharging devices respectively has a backup discharging device 261B, 262B, 263B, and the multi-axis mechanical arms 240A, 240B are classified according to the state of the object to be tested SF and placed on the corresponding discharging device. In a preferred embodiment, in order to avoid interference collision between the two legs during the staggered movement of the discharging device and the backup discharging device, the discharging device and the backup discharging device are located at different heights. In the plane, so that the discharging device and the backup discharging device are in the receiving area And the refueling intervals are staggered with each other. In addition, in a preferred embodiment, the discharging device may be additionally equipped with a vacuum adsorption device for adsorbing the object to be tested SF, so that the object to be tested SF is stably stabilized when the discharging device delivers the object to be tested SF. It is adsorbed on the platform of the discharging device to prevent the object to be tested SF from shaking or falling during the moving period.
請一併參閱「圖7-1」至「圖7-4」，係揭示本發明第一實施態樣的工作示意圖，如圖所示：請先參閱「圖7-1」，於起始時，備援進料裝置220係由設備人員或機台放置於該備料區R2，此時該備料區R2上的二維條碼掃描裝置230係掃描該備料區R2上待測物SF的二維條碼，以讀取該待測物SF的編號。 Please refer to "FIG. 7-1" to "FIG. 7-4" for a detailed description of the operation of the first embodiment of the present invention. As shown in the figure: Please refer to "Figure 7-1" at the beginning. The backup feeding device 220 is placed in the stocking area R2 by the equipment personnel or the machine. At this time, the two-dimensional barcode scanning device 230 on the stocking area R2 scans the two-dimensional barcode of the object to be tested SF on the stocking area R2. To read the number of the object to be tested SF.
接續，請參閱「圖7-2」，於讀取完成後，當供料區R1的待測物SF減少至預設數量時，該進料裝置210係與該備援進料裝置220的位置進行替換，此時進料裝置210係移動至備料區R2準備替換，備援進料裝置220係移動至該供料區R1，供多軸機械手臂240A、240B逐一抓取其上的待測物SF進行檢測。 For the connection, please refer to "Fig. 7-2". After the reading is completed, when the object to be tested SF of the feeding area R1 is reduced to a preset quantity, the feeding device 210 is in position with the backup feeding device 220. When the replacement is performed, the feeding device 210 moves to the preparation area R2 to be replaced, and the backup feeding device 220 moves to the feeding area R1 for the multi-axis robot arms 240A, 240B to grasp the objects to be tested one by one. SF is tested.
接續，請參閱「圖7-3」，該多軸機械手臂240A、240B係抓取該待測物SF，藉以將該待測物SF移動至該影像檢測站台250，藉以對該待測物SF進行檢測。於檢測完成時，係依據該待測物SF的編號記錄該待測物SF的料件狀態、及瑕疵類別。檢測的結果係記錄至系統的儲存單元，並依據料件狀態、及瑕疵類別進行分類，以透過系統控管待測物SF的流向。 For the continuation, please refer to FIG. 7-3. The multi-axis robot arm 240A, 240B grabs the object to be tested SF, thereby moving the object to be tested SF to the image detecting station 250, thereby using the object to be tested SF. Test. When the detection is completed, the state of the material of the object to be tested SF and the type of the defect are recorded according to the number of the object to be tested SF. The results of the test are recorded to the storage unit of the system, and are classified according to the state of the material and the type of the cockroach to control the flow of the SF to be tested through the system.
最後，請參閱「圖7-4」，於檢測完成時，該多軸機 械手臂240A、240B係依據該待測物SF的料件狀態，依據待測物SF的狀態於循環式分類站台260上進行分類，於檢測到該待測物SF無瑕疵時，將該待測物SF設置於該良品出料裝置261A(備援出料裝置261B)上送出；於檢測到該待測物SF有無法修復的瑕疵時，將該待測物SF設置於該壞品出料裝置262A(備援出料裝置262B)上送出；於檢測到可修復的瑕疵時，將該待測物SF設置於該NG出料裝置263A(備援出料裝置263B)上送出，完成待測物SF的分類工作。 Finally, please refer to Figure 7-4. When the test is completed, the multi-axis machine The armes 240A and 240B are classified according to the state of the workpiece SF according to the state of the object to be tested SF on the cyclic classification station 260. When the object SF is detected to be flawless, the object to be tested is tested. The object SF is disposed on the good product discharging device 261A (the backup discharging device 261B); when the detecting object SF is detected to have an unrepairable defect, the object to be tested SF is set in the bad product discharging device. The 262A (the backup discharge device 262B) is sent out; when the repairable defect is detected, the object to be tested SF is set on the NG discharge device 263A (the backup discharge device 263B), and the object to be tested is completed. Classification of SF work.
其中，當良品出料裝置261A供待測物SF擺設的位置用完時，該良品出料裝置261A的備援出料裝置261B係與該良品出料裝置261A的位置進行替換，藉以接續檢測。當壞品出料裝置262A供待測物SF擺設的位置用完時，該壞品出料裝置262A的備援出料裝置262B係與該壞品出料裝置262A的位置進行替換，藉以接續檢測。當NG出料裝置263A供待測物SF擺設的位置用完時，該NG出料裝置263A的備援出料裝置263B係與該NG出料裝置263A的位置進行替換，藉以接續檢測。藉此，減少了出料裝置更換部品時所需的時間。 Wherein, when the good product discharging device 261A is used up for the position where the object to be tested SF is used, the backup discharging device 261B of the good product discharging device 261A is replaced with the position of the good product discharging device 261A, thereby successively detecting. When the defective product discharging device 262A is used up for the position where the object to be tested SF is used up, the backup discharging device 262B of the defective product discharging device 262A is replaced with the position of the defective discharging device 262A, thereby successively detecting . When the position of the NG discharge device 263A for the object SF to be placed is used up, the backup and discharge device 263B of the NG discharge device 263A is replaced with the position of the NG discharge device 263A for subsequent detection. Thereby, the time required for the parts of the discharge device to be replaced is reduced.
請續參閱「圖8」、及「圖9」以下係針對本發明的第三實施態樣進行說明：本實施態樣的光學檢測系統300係包含有一進料裝置310、一二維條碼掃描裝置320、二多軸機械手臂330A、330B、二影像檢測站台340A、340B、以及一旋轉分類站台350。 Please refer to FIG. 8 and FIG. 9 for the following description of the third embodiment of the present invention. The optical detection system 300 of the present embodiment includes a feeding device 310 and a two-dimensional barcode scanning device. 320, two multi-axis robot arms 330A, 330B, two image detection stations 340A, 340B, and a rotation sorting station 350.
所述的進料裝置310係用以供待測物SF放置，並用以輸送該待測物SF。該進料裝置310係用以承載並輸送待測物SF，將待測物SF朝後方二多軸機械手臂330A、330B的方向移動，以經由後續的影像擷取裝置對該待測物SF進行相應的檢測。於較佳實施態樣中，所述的進料裝置310係為移動式載盤，透過驅動裝置(例如馬達、輸送帶或汽缸等)帶動載盤及設置於其上的待測物SF移動。於較佳實施例，所述的進料裝置310亦可以包括輸送帶、Tray盤、固定式載盤、卡匣等。此外，於較佳實施態樣中，所述的進料裝置310亦可另外搭配真空吸附裝置，用以吸附待測物SF，以便進料裝置310輸送該待測物SF時將待測物SF穩固地吸附於進料裝置310的平台上，避免待測物SF於移動的期間內晃動、或是掉落。 The feeding device 310 is used for placing the object to be tested SF and for conveying the object to be tested SF. The feeding device 310 is configured to carry and transport the object to be tested SF, and move the object to be tested SF toward the rear multi-axis robot arms 330A, 330B to perform the object to be tested SF through the subsequent image capturing device. Corresponding detection. In a preferred embodiment, the feeding device 310 is a mobile carrier, and the driving device (such as a motor, a conveyor belt or a cylinder, etc.) drives the carrier and the object to be tested SF disposed thereon to move. In a preferred embodiment, the feeding device 310 may also include a conveyor belt, a Tray disk, a stationary carrier, a cassette, and the like. In addition, in a preferred embodiment, the feeding device 310 may be additionally equipped with a vacuum adsorption device for adsorbing the object to be tested SF, so that the object to be tested SF when the feeding device 310 delivers the object to be tested SF It is firmly adsorbed on the platform of the feeding device 310 to prevent the object to be tested SF from shaking or falling during the moving period.
所述的二維條碼掃描裝置320係設置於該進料裝置310的一側，用以讀取該待測物SF的二維條碼，以確認該待測物SF的編號。所述的二維條碼掃描裝置320可以為CCD條碼掃描器、或雷射掃描器等，針對該二維條碼掃描裝置320的種類於本發明中不予以限制。於本實施態樣中，所述的二維條碼掃描裝置320係固定設置於該進料裝置310移動路徑的一側，當待測物SF沿該移動路徑移動時讀取二維條碼標籤上的二維條碼。於另一較佳實施態樣中，當所述的進料裝置310係為固定載盤時，該二維條碼掃描裝置320可設置於移動式載台、或是多軸機臂上移動至各該待測物SF的上方，以讀取該待測物SF的二維條碼。 The two-dimensional barcode scanning device 320 is disposed on one side of the feeding device 310 for reading a two-dimensional barcode of the object to be tested SF to confirm the number of the object to be tested SF. The two-dimensional barcode scanning device 320 may be a CCD barcode scanner or a laser scanner. The type of the two-dimensional barcode scanning device 320 is not limited in the present invention. In the embodiment, the two-dimensional barcode scanning device 320 is fixedly disposed on one side of the moving path of the feeding device 310, and reads the two-dimensional barcode label when the object to be tested SF moves along the moving path. QR code. In another preferred embodiment, when the feeding device 310 is a fixed carrier, the two-dimensional barcode scanning device 320 can be disposed on a mobile stage or a multi-axis arm to move to each Above the object to be tested SF, a two-dimensional barcode of the object to be tested SF is read.
所述的多軸機械手臂330A、330B用以抓取該進料裝置310上的待測物SF，並將該待測物SF移動至影像檢測站台340A、340B，以供該影像檢測站台340A、340B上的影像擷取裝置拍攝該待測物SF的表面影像，藉以檢測該待測物SF的表面瑕疵。該旋轉分類站台350係包含有複數個出料裝置，設置於該影像檢測站台340A、340B的一側，該多軸機械手臂330A、330B係依據該待測物SF的狀態，將該待測物SF分類至個別該出料裝置。於本實施態樣中係透過雙手臂同時取料檢測，增加檢測的效率。 The multi-axis robot arm 330A, 330B is configured to grasp the object to be tested SF on the feeding device 310, and move the object to be tested SF to the image detecting station 340A, 340B for the image detecting station 340A, The image capturing device on the 340B captures a surface image of the object to be tested SF, thereby detecting a surface flaw of the object to be tested SF. The rotating sorting station 350 includes a plurality of discharging devices disposed on one side of the image detecting stations 340A and 340B. The multi-axis robots 330A and 330B are based on the state of the object to be tested SF. The SF is sorted to individual discharge devices. In this embodiment, the simultaneous detection of the two arms is performed to increase the efficiency of the detection.
所述的影像檢測站台340A、340B係用以對待測物SF的表面進行光學檢測，為對應不同的瑕疵檢測，該影像檢測站台340A、340B係包含有第一檢測站341A、341B、第二檢測站342A、342B、以及第三檢測站343A、343B。於本實施態樣中，所述的第一檢測站341A、341B、第二檢測站342A、342B、及第三檢測站343A、343B與第一實施態樣的第一檢測站141、第二檢測站142、第三檢測站143相同，差異僅在於設置的數量，以下便不再予以贅述。 The image detecting stations 340A and 340B are used for optical detection of the surface of the object to be tested SF, and corresponding to different flaw detections, the image detecting stations 340A and 340B include first detecting stations 341A and 341B and second detecting. Stations 342A, 342B, and third detection stations 343A, 343B. In this embodiment, the first detecting stations 341A, 341B, the second detecting stations 342A, 342B, and the third detecting stations 343A, 343B are the first detecting station 141 and the second detecting of the first embodiment. The station 142 and the third detecting station 143 are the same, and the difference is only in the number of settings, which will not be described below.
所述的旋轉分類站台350包含有二旋轉載台351A、351B，一帶動該旋轉載台351A、351B旋轉的驅動裝置352A、352B，一設置於該旋轉載台351A、351B一側的移載裝置352，以及複數個設置與該移載裝置352一側的出料裝置(例如良品出料裝置353、壞品出料裝置354、以及NG出料裝置355)。該旋轉載台351A、351B係用以供複數個該待測物SF設置，該多軸機械手 臂330A、330B係將檢測完成的該待測物SF放置於該旋轉載台351A、351B上，該驅動裝置352A、352B係帶動該旋轉載台351A、351B旋轉，以將該待測物SF移動至靠近該移載裝置352的一側，藉由該移載裝置352依據該待測物SF的狀態，將該待測物SF分類至個別該出料裝置。該複數個出料裝置依據其設置待測物SF的類別可分為良品出料裝置353、壞品出料裝置354、以及NG出料裝置355，該移載裝置352係依據該待測物SF的瑕疵狀態分類並放置於對應的出料裝置上。 The rotation sorting station 350 includes two rotating stages 351A and 351B, driving devices 352A and 352B that rotate the rotating stages 351A and 351B, and a transfer device provided on the rotating stages 351A and 351B. 352, and a plurality of discharge devices disposed on the side of the transfer device 352 (for example, the good product discharge device 353, the bad product discharge device 354, and the NG discharge device 355). The rotating stage 351A, 351B is configured to provide a plurality of the objects to be tested SF, the multi-axis robot The arms 330A and 330B are placed on the rotating stages 351A and 351B, and the driving units 352A and 352B rotate the rotating stages 351A and 351B to move the object to be tested SF. To the side close to the transfer device 352, the transfer device 352 sorts the object to be tested SF into individual discharge devices according to the state of the object SF. The plurality of discharging devices can be divided into a good product discharging device 353, a bad product discharging device 354, and an NG discharging device 355 according to the type of the object to be tested SF, and the transferring device 352 is based on the object to be tested SF. The 瑕疵 state is classified and placed on the corresponding discharge device.
請一併參閱「圖10-1」至「圖10-4」，係揭示本發明第三實施態樣的工作示意圖，如圖所示：請先參閱「圖10-1」，於起始時，進料裝置310係先將待測物SF朝二維條碼掃描裝置320的方向移動，以供該二維條碼掃描裝置320讀取該待測物SF的編號。 Please refer to "Fig. 10-1" to "Fig. 10-4" together to disclose the working diagram of the third embodiment of the present invention. As shown in the figure: Please refer to "Fig. 10-1" at the beginning. The feeding device 310 first moves the object to be tested SF toward the two-dimensional bar code scanning device 320, so that the two-dimensional bar code scanning device 320 reads the number of the object to be tested SF.
接續，請參閱「圖10-2」，於讀取完成後，該多軸機械手臂330A(330B)係吸附該待測物SF，藉以將該待測物SF移動至該影像檢測站台340A(340B)，藉以對該待測物SF進行檢測。在此，待測物SF係分別由二不同路徑個別進行檢測，多軸機械手臂340A及另一多軸機械手臂340B係分別負責進料裝置310右邊(相當於圖式上側)及左邊(相當於圖式下側)的待側物SF，並將該待測物SF依據擺設位置的不同，分別送至影像檢測站台340A及另一影像檢測站台340B個別進行檢測。 For the connection, please refer to FIG. 10-2. After the reading is completed, the multi-axis robot arm 330A (330B) adsorbs the object to be tested SF, thereby moving the object to be tested SF to the image detecting station 340A (340B). ), by which the object to be tested SF is detected. Here, the object to be tested SF is separately detected by two different paths, and the multi-axis robot arm 340A and the other multi-axis robot arm 340B are respectively responsible for the right side of the feeding device 310 (corresponding to the upper side of the drawing) and the left side (equivalent to The object to be detected SF on the lower side of the drawing is sent to the image detecting station 340A and the other image detecting station 340B for detection according to the difference in the position of the object to be tested.
接續，請參閱「圖10-3」，於檢測完成時，該多軸機 械手臂340A、340B係將該待測物SF設置於該旋轉載台351A、351B上，此時電腦係記錄該旋轉載台351A、351B上每一待測物SF的所在位置及其對應編號，以利移載裝置352藉由該所在位置及編號確認該待測物SF的瑕疵種類，以便進行分類。於另一較佳實施態樣中，所述的旋轉載台351A、351B可依據瑕疵種類分配待測物SF應設置的位置(例如分區設置)，於本發明不予以限制。所述的待測物SF較佳以橫列方式擺放，以便藉由單線軌道的移載裝置352分別抓取待測物SF。 For the connection, please refer to Figure 10-3. When the test is completed, the multi-axis machine The arm 340A, 340B is disposed on the rotating stage 351A, 351B, and the computer records the position of each object SF on the rotating stage 351A, 351B and its corresponding number. The Eli transfer device 352 confirms the type of the object to be tested SF by the location and number for classification. In another preferred embodiment, the rotating stage 351A, 351B can allocate a position (for example, a partition setting) to be set by the object to be tested SF according to the type of the cymbal, which is not limited in the present invention. The object to be tested SF is preferably placed in a row so as to capture the object to be tested SF by the transfer device 352 of the single-track.
接續，請參閱「圖10-4」，當該旋轉載台351A、351B上的位置擺滿待測物SF時，該旋轉載台351A、351B係將該待測物SF旋轉180度，至靠近該移載裝置352的位置，此時該移載裝置352係移動至該旋轉載台351A、351B上，抓取特定位置的待測物SF，並依據所在位置將待測物SF移載至良品出料裝置353、壞品出料裝置354、或NG出料裝置355，完成待測物SF的分類。 For the connection, please refer to "Fig. 10-4". When the position on the rotary stage 351A, 351B is filled with the object to be tested SF, the rotating stage 351A, 351B rotates the object to be tested SF by 180 degrees to near The position of the transfer device 352, at this time, the transfer device 352 moves to the rotating stage 351A, 351B, grabs the object SF at a specific position, and transfers the object to be tested SF to the good according to the position. The discharging device 353, the defective discharging device 354, or the NG discharging device 355 completes the classification of the object to be tested SF.
綜上所述，本發明可有效率地對不規則形狀的待測物進行檢測，減少檢測時所需的時間。此外，本發明可拍攝待測物的外觀影像並重建待測物的3D圖形，藉以對待測物進行全面的檢測。 In summary, the present invention can efficiently detect an irregularly shaped object to be tested, reducing the time required for detection. In addition, the present invention can take an image of the appearance of the object to be tested and reconstruct a 3D pattern of the object to be tested, thereby performing a comprehensive inspection of the object to be tested.
以上已將本發明做一詳細說明，惟以上所述者，僅惟本發明之一較佳實施例而已，當不能以此限定本發明實施之範圍，即凡依本發明申請專利範圍所作之均等變化與修飾，皆應仍屬本發明之專利涵蓋範圍內。 The invention has been described in detail above, but the foregoing is only a preferred embodiment of the invention, and is not intended to limit the scope of the invention, Variations and modifications are still within the scope of the patents of the present invention.
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- 2016-07-18 CN CN201610565378.5A patent/CN107543827A/en active Pending
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| TWI742753B (en) * | 2020-03-13 | 2021-10-11 | 政美應用股份有限公司 | Image calibration method for microscopic imaging system |
Also Published As
| Publication number | Publication date |
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| CN107543827A (en) | 2018-01-05 |
| TW201800747A (en) | 2018-01-01 |
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