TWI588508B - Stereoscopic depth measuring apparatus - Google Patents

Stereoscopic depth measuring apparatus Download PDF

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TWI588508B
TWI588508B TW105114346A TW105114346A TWI588508B TW I588508 B TWI588508 B TW I588508B TW 105114346 A TW105114346 A TW 105114346A TW 105114346 A TW105114346 A TW 105114346A TW I588508 B TWI588508 B TW I588508B
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TW201740135A (en
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施錫富
詹世榆
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國立中興大學
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Description

立體深度量測裝置 Stereo depth measuring device

本發明係關於一種深度距離量測裝置；特別關於一種利用光學方式之非接觸式立體深度距離量測裝置，該裝置係利用光學投影器投射圖案至待測位置，並以影像取像器擷取該圖案，透過空間頻率之計算以獲知待測位置之深度資訊。 The present invention relates to a depth distance measuring device; and more particularly to an optical non-contact stereo depth distance measuring device that uses an optical projector to project a pattern to a position to be tested and captures it with an image capturing device. The pattern is obtained by calculating the spatial frequency to obtain the depth information of the position to be tested.

三度空間(three-dimensional,3D)之手勢擷取是用於人機互動介面之一項新興科技，而3D感測器則是該技藝中最為重要的組成。在文獻上已有許多創作探討該技術，並且有些創作已被開發成實際的工業用或消費性產品。一般而言，該技藝與光學深度距離量測相關，可以以感測機制而被區分成三種主要類別。分別是：結構光(structured light)法、飛行時間(time of flight)法及立體視覺(stereo vision)法。每種架構皆有其優點與缺點並且已有對應之產品問世。例如，微軟(Microsoft)公司的Xbox系統採用的Kinect感測器就是以結構光法為設計架構，MESA Imaging公司推出的SwissRanger產品則是採用飛行時間法，另外Leap Motion公司則推出以立體視覺法為架構的感測器，此三種產品為此三類技術之最主要代表。 Three-dimensional (3D) gesture capture is an emerging technology for human-computer interaction interface, and 3D sensor is the most important component of the technology. There have been many creations in the literature to explore this technology, and some of the creations have been developed into actual industrial or consumer products. In general, this technique is related to optical depth distance measurement and can be divided into three main categories by sensing mechanisms. They are: structured light method, time of flight method, and stereo vision method. Each architecture has its advantages and disadvantages and there are already corresponding products available. For example, the Kinect sensor used by Microsoft's Xbox system is designed with structured light. The SwissRanger product from MESA Imaging uses the time-of-flight method, and Leap Motion introduces stereo vision. The architecture of the sensor, these three products are the main representatives of the three types of technology.

結構光法是一種採用主動式光投影以得到投射週期性變化之二維光強度圖案在待測物上的一種方法，且多數的是以光學投影機來實 現。經由待測物表面反射之投射圖案以影像取像器進行擷取，該擷取到的影像再透過三角量測(triangulation)原理或相移(phase shift)演算法則以求得待測物表面之深度資訊。若與另外兩種深度量測技術相比，結構光法需要較複雜之光學架構，因此成本相對較高。此缺點後來被微軟公司所出產的Xbox遊戲機所搭配的Kinect感測器所改善，該感測器利用美國專利公報US8150142B2,US8493496B2與US8786682B2內容中所揭露的技術，應用繞射(diffraction)方法以實現光學投影。將紅外光之雷射光束透過兩片繞射光學元件(diffractive optical element,DOE)繞射出具有光斑(optical speckle)分佈之投射光場。其中一片繞射光學元件是採用電腦全像片(computer generated hologram,CGH)方法設計而成以產生光斑之光編碼用途，另一片繞射光學元件則是設計成二維式之週期性光柵，用以將矩形斑點光場複製成3×3的圖案，以連接成一較寬廣的斑點光場分佈。該兩片繞射光學元件與紅外光雷射二極體整合成一個具有小型化尺寸之投射模組，另外再搭配一個可見光影像取像器及紅外線影像取像器分別擷取待測物影像與由待測物表面反射回來的結構光圖案，透過待測物平面、參考平面及紅外線影像感測器三者間之離軸式(off-axis)幾何關係可以求出待測物表面之深度距離。該發明具有簡單架構、精簡尺寸及低成本之特點。然而，量測解析度卻是一重點；由於該深度計算是根據觀測結構光圖案在影像取像器上成像位置變異而求得，該系統通常是採用固定焦距之影像取像器，因此結構光圖案位置變異容易因為如離焦或畸變等因素造成之影像模糊而改變。該發明所能提供之量測解析度大約只有1.5公分，所以只能使用於較不需要高量測精度之系統應用上，例如：手勢偵測、物件追蹤或場景重建等。 The structured light method is a method of adopting active light projection to obtain a two-dimensional light intensity pattern that periodically changes in the object to be tested, and most of them are based on optical projectors. Now. The projected image reflected by the surface of the object to be tested is captured by the image capturing device, and the captured image is transmitted through a triangulation principle or a phase shift algorithm to obtain a surface of the object to be tested. In-depth information. Compared with the other two depth measurement techniques, structured light method requires a relatively complicated optical structure, so the cost is relatively high. This shortcoming was later improved by the Kinect sensor with the Xbox game console produced by Microsoft Corporation, which uses the technique disclosed in the contents of US Pat. No. 8,150,142 B2, US Pat. No. 8,493,496 B2 and US Pat. No. 8,878,682 B2, to apply the diffraction method. Achieve optical projection. The laser beam of infrared light is transmitted through two diffractive optical elements (DOE) to project a projected light field with an optical speckle distribution. One of the diffractive optical elements is designed by the computer generated hologram (CGH) method to generate the optical code of the spot, and the other diffractive optical element is designed as a two-dimensional periodic grating. The rectangular spot light field is reproduced as a 3 x 3 pattern to join a wider spot light field distribution. The two diffractive optical elements and the infrared laser diode are integrated into a projection module having a miniaturized size, and a visible light image capturing device and an infrared image capturing device respectively capture the image of the object to be tested and The structured light pattern reflected from the surface of the object to be tested can obtain the depth distance of the surface of the object to be tested through the off-axis geometric relationship between the object plane, the reference plane and the infrared image sensor. . The invention has the characteristics of simple architecture, compact size and low cost. However, the measurement resolution is a key point; since the depth calculation is based on the imaging position variation of the observed structural light pattern on the image pickup, the system usually uses a fixed focal length image capture device, so the structured light Pattern position variation is easily changed due to blurry images caused by factors such as defocus or distortion. The measurement resolution that the invention can provide is only about 1.5 cm, so it can only be used in system applications that do not require high measurement accuracy, such as gesture detection, object tracking or scene reconstruction.

建構在結構光與繞射光學投影之基礎上，本發明提出一創新之深度量測架構。該架構採用內含電腦全像片之光學投影器來投射週期性之結構光場，並組成一同軸(coaxial)之光學三角量測關係，可使影像取像器所擷取到的待測物表面結構光圖案之空間頻率(spatial frequency)隨物體深度距離而改變。藉由將擷取到的影像轉換成頻率域，對應的深度距離即可以計算出來。該架構具有對影像品質較不敏感之特性，可以提供較高之量測解析度。 Based on structured light and diffraction optical projections, the present invention proposes an innovative depth measurement architecture. The architecture uses an optical projector with a full-frame computer to project a periodic structured light field and form a coaxial optical triangulation relationship that allows the image capture device to capture the object under test. The spatial frequency of the surface structured light pattern changes with the object depth distance. By converting the captured image into a frequency domain, the corresponding depth distance can be calculated. The architecture is less sensitive to image quality and provides a higher measurement resolution.

本發明內容包含有產生結構光之投影光場設計、投影與取像模組間之光學架構及擷取影像之空間頻率轉換與深度計算等部分。依該內容提出多種不同之設計架構，以實現立體深度量測之目的。詳細之內容及技術，茲配合圖式說明如下： The invention comprises a projection light field design for generating structured light, an optical structure between the projection and image capturing module, and a spatial frequency conversion and depth calculation of the captured image. A variety of different design architectures are proposed according to the content to achieve the purpose of stereo depth measurement. The detailed content and technology are as follows:

10‧‧‧雷射投影器 10‧‧‧Laser Projector

11‧‧‧雷射光源 11‧‧‧Laser light source

12‧‧‧電腦全像片 12‧‧‧Computer full picture

13‧‧‧投射光束 13‧‧‧Projected beam

14‧‧‧分光鏡片 14‧‧‧Splitting lens

15‧‧‧參考面 15‧‧‧ reference plane

16‧‧‧待測面 16‧‧‧Determination

17‧‧‧結構光圖案 17‧‧‧Structural light pattern

18‧‧‧影像取像器成像面 18‧‧‧Imager imager

19‧‧‧返回光束 19‧‧‧Return beam

20‧‧‧影像取像器 20‧‧‧Image Imager

21‧‧‧被擷取之影像範圍 21‧‧‧Image range taken

22‧‧‧吸光屏幕 22‧‧‧ absorbing screen

23‧‧‧影像擷取與運算單元 23‧‧‧Image capture and arithmetic unit

30‧‧‧頻率分佈 30‧‧‧frequency distribution

31‧‧‧直流分量 31‧‧‧DC component

32‧‧‧基本頻率 32‧‧‧Basic frequency

第1圖係本發明之基本創作概念與原理說明。 Figure 1 is a description of the basic inventive concepts and principles of the present invention.

第2圖係說明兩不同深度距離之反射平面所擷取的結構光圖案之線條密度。 Figure 2 illustrates the line density of the structured light pattern captured by the reflection planes of two different depth distances.

第3圖係說明週期性圖案在水平方向經快速傅立葉轉換後之頻譜分佈。 Figure 3 illustrates the spectral distribution of the periodic pattern after fast Fourier transform in the horizontal direction.

第4圖係本發明之第一具體實施例的結構示意圖。 Figure 4 is a schematic view showing the structure of the first embodiment of the present invention.

第5圖係本發明之第二具體實施例的結構示意圖。 Figure 5 is a schematic view showing the structure of a second embodiment of the present invention.

第6圖係本發明之第三具體實施例的結構示意圖。 Figure 6 is a schematic view showing the structure of a third embodiment of the present invention.

第7圖係本發明之第四具體實施例的結構示意圖。 Figure 7 is a schematic view showing the structure of a fourth embodiment of the present invention.

請參照「第1圖」，該圖為本發明之基本創作概念與原理說明。將一雷射投影器10放置於光軸01上，該雷射投影器10可經由繞射之方式投射出具週期性結構光圖案17之投射光束13至參考面15或待測面16上，繞射光束之繞射角為θ p ，雷射投影器10至參考面15與待測面16之距離分別為L o 與L k 。一具有焦距為f之影像取像器20以同軸之方式放置於該雷射投影器10之前，經物體表面反射後之返回光束19的視場角為θ c ，該角度可決定結構光圖案17經參考面15或待測面16反射後被擷取之影像範圍21。影像取像器20至參考面15與待測面16之距離與分別為D o 與D k 。由於θ c 不等於θ p ，故在影像取像器20所擷取之結構光圖案17將會對不同深度距離之反射平面有不同之線條週期與分佈。請參照「第2圖」，該圖說明兩不同深度距離之反射平面所擷取的結構光圖案17之線條密度，左邊是擷取在較前面之參考面15的結構光圖案17，右邊則是擷取在較後面之待測面16的結構光圖案17。根據幾何關係，很明顯地右邊圖案比左邊圖案具有較高之線條密度(即較高之空間頻率)。此特性建構本發明之理論基礎，可推導出待測面之空間頻率與相對深度距離△z之數學關係。 Please refer to "1st figure", which is a basic creative concept and principle description of the present invention. A laser projector 10 is placed on the optical axis 01. The laser projector 10 can project a projection beam 13 having a periodic structured light pattern 17 onto the reference surface 15 or the surface 16 to be tested. The diffraction angle of the beam is θ p , and the distance between the laser projector 10 to the reference surface 15 and the surface 16 to be tested is L o and L k , respectively . An image pickup 20 having a focal length f is placed coaxially before the laser projector 10, and the angle of view of the return beam 19 reflected by the surface of the object is θ c , which determines the structured light pattern 17 The image range 21 that is captured after being reflected by the reference surface 15 or the surface 16 to be tested. The distance between the image pickup 20 and the reference surface 15 and the surface 16 to be tested is D o and D k , respectively . Since θ c is not equal to θ p , the structured light pattern 17 captured by the image capture unit 20 will have different line periods and distributions for the reflection planes of different depth distances. Please refer to "Fig. 2", which illustrates the line density of the structured light pattern 17 taken by the reflection planes of two different depth distances, the left side is the structured light pattern 17 taken at the front reference surface 15, and the right side is The structured light pattern 17 at the later face 16 to be tested is taken. Depending on the geometric relationship, it is clear that the right pattern has a higher line density (i.e., a higher spatial frequency) than the left pattern. This feature constructs the theoretical basis of the present invention and can derive the mathematical relationship between the spatial frequency of the surface to be measured and the relative depth distance Δ z .

其中p o 與p k 分別是投射在參考面15與待測面16之結構光圖案17的線條寬度。d o 與d k 則是在影像取像器成像面18所分別對應的線條成像寬度。因為由雷射投影器10投射出來的投射光束13有固定的繞射角，故對應於不同 投射平面位置上之線條寬度與投射距離間會有固定的比例關係。 Where p o and p k are the line widths of the structured light pattern 17 projected on the reference surface 15 and the surface 16 to be tested, respectively. d o and d k are the line imaging widths respectively corresponding to the image capturing surface 18 of the image pickup. Since the projection beam 13 projected by the laser projector 10 has a fixed diffraction angle, there is a fixed proportional relationship between the line width corresponding to different projection plane positions and the projection distance.

結合(1)至(3)式，可得到線條成像寬度do與dk之關係為， 若直接將影像取像器成像面18上線條寬度取倒數以求得空間頻率，可得到以深度距離△z為變數之函數關係如下。 Combining equations (1) to (3), the relationship between the line imaging widths do and dk can be obtained, If the line width on the image capturing surface 18 of the image pickup unit is directly reciprocal to obtain the spatial frequency, the function of the depth distance Δ z as a variable can be obtained as follows.

其中F o 與F k 分別代表在影像取像器成像面18處計算參考面15與待測面16之空間頻率值。由(5)式可看出，若雷射投影器10、影像取像器20及參考面15間之距離配置固定，空間頻率之改變只與深度距離△z之變化有關。相較於其他採用三角量測原理之習知深度量測裝置而言，本發明之量測結果完全不受取像器之焦距所影響。深度距離變化值可進一步地被表示成， Wherein F o and F k represent the spatial frequency values of the reference surface 15 and the surface 16 to be tested, respectively, at the imaging surface 18 of the image capturer. By the formula (5) can be seen, when the laser projector 10, the image 15 from the imaging surface 20 and the reference configuration is fixed, changing the spatial frequency is only related to the variation in the depth distance △ z. Compared to other conventional depth measuring devices that employ the principle of triangulation, the measurement results of the present invention are completely unaffected by the focal length of the imager. The depth distance change value can be further expressed as

在實際應用上，可以利用快速傅立葉轉換(fast Fourier transform,FFT)之方法來計算具有影像強度週期性分佈之數位影像。請參照「第3圖」，該圖為一圖示範例，右圖為左邊週期性圖案在水平方向之快速傅立葉轉換後的頻譜分佈。圖中可看到幾根尖銳之頻率分佈30，本發明主要分析的頻率是在中心直流分量31的右邊第一波瓣，該波瓣即為被擷取之影像範圍21內之結構光圖案17的基本頻率32。 In practical applications, a fast Fourier transform (FFT) method can be used to calculate a digital image with a periodic distribution of image intensities. Please refer to "Fig. 3", which is an example of illustration. The right picture shows the spectral distribution of the left periodic pattern in the horizontal direction after fast Fourier transform. A few sharp frequency distributions 30 can be seen in the figure. The frequency of the main analysis of the present invention is the first lobe on the right side of the central DC component 31, which is the structured light pattern 17 within the captured image range 21. The basic frequency is 32.

根據上述之原理介紹，我們以最佳之光學架構來實現本發明創作，請參照「第4圖」，其圖示本發明創作之第一具體實施例。一雷射光 源11(該雷射光源可為可見光或紅外線之波長範圍，而雷射僅為最佳之光源代表，任何雷射以外之他種光源亦可被本發明所採用)與電腦全像片12組成雷射投影器10，該雷射投影器10可投射出被電腦全像片12所繞射出具有週期性結構光圖案17之投射光束13。一分光鏡片14被放置於投射光束13前進之路徑上，用以防止投射光束13被影像取像器20所遮擋。一吸光屏幕22被放置在投射光束13經分光鏡片14反射的路徑上，用以吸收可能造成背景雜訊或影像誤判的反射光線。通過分光鏡片14後的投射光束13可投射在任何物件表面上，譬如是用以校正用的參考面15或是實際量測的待測面16上。一影像取像器20放置於與光軸01垂直之路徑上，用以收集經物體表面反射後之返回光束19，此影像取像器20連接至一影像擷取與運算單元23，該單元擷取影像取像器20所拍攝的結構光圖案17，經初步影像處理後，再施予空間頻率之計算與分析，最後可以根據空間頻率之變化量以求出待測面與參考面之深度距離差異值△z。該影像擷取與運算單元23必須事先選擇一參考面15為量測基準，經由適當的歸零與校正來求出深度距離變化量與空間頻率變化量間之確實數學量化關係。 Based on the above principles, we have achieved the creation of the present invention with the best optical architecture. Please refer to "FIG. 4", which illustrates a first embodiment of the present invention. a laser light Source 11 (the laser light source can be in the wavelength range of visible light or infrared light, and the laser is only the representative of the best light source, and other light sources other than any laser can also be used by the present invention) and the computer full image 12 A laser projector 10 that projects a projected beam 13 of a periodic structured light pattern 17 that is surrounded by a computer hologram 12. A beam splitting lens 14 is placed on the path of the projected beam 13 to prevent the projected beam 13 from being blocked by the image picker 20. A light absorbing screen 22 is placed on the path of the projected beam 13 reflected by the beam splitting lens 14 for absorbing reflected light that may cause background noise or image misjudgment. The projected beam 13 after passing through the spectroscopic lens 14 can be projected onto the surface of any object, such as the reference surface 15 for calibration or the actually measured surface 16 to be measured. An image finder 20 is placed on a path perpendicular to the optical axis 01 for collecting the return beam 19 reflected by the surface of the object. The image finder 20 is coupled to an image capture and operation unit 23, the unit 撷Taking the structural light pattern 17 captured by the image capturing device 20, after the preliminary image processing, the spatial frequency calculation and analysis are applied, and finally, the depth distance between the surface to be tested and the reference surface can be obtained according to the variation of the spatial frequency. The difference value is Δz. The image capturing and calculating unit 23 must previously select a reference surface 15 as a measurement reference, and obtain a true mathematical quantization relationship between the depth distance change amount and the spatial frequency change amount via appropriate zeroing and correction.

前述第一實施例僅為本發明之主要代表，其雷射投影器10與影像取像器20之前後位置與幾何位置關係可以做各種變換。請參照「第5圖」，該圖為本發明之第二具體實施例，說明兩元件位置交換後並不影響本發明所揭露之深度量測效果。 The foregoing first embodiment is only the main representative of the present invention, and the relationship between the position and the geometric position of the laser projector 10 and the image capturing device 20 can be variously changed. Please refer to FIG. 5, which is a second embodiment of the present invention, illustrating that the two-element position exchange does not affect the depth measurement effect disclosed in the present invention.

雖然本發明以同軸之方式置放雷射投影器10與影像取像器20，利用投射光束13與返回光束19之場角差異以獲致擷取影像之空間頻率隨深度距離改變之特性。然而該特性並不受限於同軸之光學架構，任何可 以達到投射光束13與返回光束19場角差異之光學架構皆可實現本發明之核心精神。請參照「第6圖」，該圖為本發明之第三具體實施例，其示意非同軸之光學架構，雷射投影器10與影像取像器20並不在同一光軸上，但藉由位置之調配，仍可得到擷取影像之空間頻率隨深度距離改變之效果。 Although the present invention places the laser projector 10 and the image pickup 20 in a coaxial manner, the difference in field angle between the projected beam 13 and the return beam 19 is utilized to obtain the characteristic that the spatial frequency of the captured image changes with depth. However, this feature is not limited to the coaxial optical architecture, any The core architecture of the present invention can be achieved by an optical architecture that achieves a difference in field angle between the projected beam 13 and the returned beam 19. Please refer to FIG. 6 , which is a third embodiment of the present invention, which illustrates a non-coaxial optical architecture. The laser projector 10 and the image capturer 20 are not on the same optical axis, but by position. With the deployment, the effect of the spatial frequency of the captured image with the depth distance can still be obtained.

前述三個實施例皆採用一雷射投影器10搭配一影像取像器20。但在某些應用上可能需要較廣之視場量測範圍，因此單一雷射投影器10可能不足以投射出足夠範圍之結構光圖案17，必須採用兩個或更多之雷射投影器10。請參照「第7圖」，該圖為本發明之第四具體實施例，其採用二雷射投影器10與一影像取像器20，可擴充較廣之投射範圍，以達到較廣視場量測範圍之目的。 The foregoing three embodiments all employ a laser projector 10 in combination with an image capture unit 20. However, a wider field of view measurement range may be required in some applications, so a single laser projector 10 may not be sufficient to project a sufficient range of structured light patterns 17, two or more laser projectors 10 must be employed. . Please refer to FIG. 7 , which is a fourth embodiment of the present invention, which uses two laser projectors 10 and an image capturing device 20 to expand a wider projection range to achieve a wider field of view. The purpose of the measurement range.

根據本發明之基本精神，除揭露立體深度量測裝置之設計架構外，更可推廣此設計架構至各種立體感測之相關應用，而不受限於距離量測之使用。 According to the basic spirit of the present invention, in addition to exposing the design structure of the stereo depth measuring device, the design architecture can be promoted to various stereo sensing related applications without being limited by the use of distance measurement.

雖然本發明已以較佳之實施例揭露如上，然其並非用以限定本發明，任何熟習此技藝者，在不脫離本發明之精神和範圍內，當可作各種之更動與潤飾，因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the invention has been described above in terms of a preferred embodiment, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application.

10‧‧‧雷射投影器 10‧‧‧Laser Projector

11‧‧‧雷射光源 11‧‧‧Laser light source

12‧‧‧電腦全像片 12‧‧‧Computer full picture

13‧‧‧投射光束 13‧‧‧Projected beam

14‧‧‧分光鏡片 14‧‧‧Splitting lens

15‧‧‧參考面 15‧‧‧ reference plane

16‧‧‧待測面 16‧‧‧Determination

17‧‧‧結構光圖案 17‧‧‧Structural light pattern

19‧‧‧返回光束 19‧‧‧Return beam

20‧‧‧影像取像器 20‧‧‧Image Imager

22‧‧‧吸光屏幕 22‧‧‧ absorbing screen

23‧‧‧影像擷取與運算單元 23‧‧‧Image capture and arithmetic unit

Claims (8)

一種量測裝置，可量測前方物件之深度距離，包括：一光束投影單元，其至少內含一光源與一繞射光學元件，該繞射光學元件可將該光源發射出之光束發散並投射至前方待測物件，並使投射出之光束強度呈現週期性分佈，以使投射至待測物件上之投影具有結構性之圖案；一分光單元，可使光束投影單元發射之光束穿透，並使經待測物件反射之返回光束被該分光單元反射；一影像取像單元，用以接收被分光單元反射之待測物件反射光束，將待測物件上之投影圖案成像在影像取像單元之成像面上，該影像取像單元與光束投影單元有共同光軸但不同光場角度之幾何關係；一影像擷取與運算單元，用以擷取影像取像單元收集之影像，並將該影像作空間頻率之計算。 A measuring device capable of measuring a depth distance of a front object, comprising: a beam projection unit having at least a light source and a diffractive optical element, the diffractive optical element diverging and projecting the light beam emitted by the light source Going to the object to be tested in front, and causing the intensity of the projected beam to be periodically distributed, so that the projection projected onto the object to be tested has a structural pattern; a light splitting unit can penetrate the light beam emitted by the beam projecting unit, and The returning light beam reflected by the object to be tested is reflected by the light splitting unit; an image capturing unit is configured to receive the reflected light beam of the object to be tested reflected by the light splitting unit, and image the projection pattern on the object to be tested into the image capturing unit On the imaging surface, the image capturing unit and the beam projecting unit have a common optical axis but a geometric relationship of different light field angles; an image capturing and computing unit is used to capture the image collected by the image capturing unit, and the image is captured Calculate the spatial frequency. 如申請專利範圍第1項所述之量測裝置，可在分光單元反射光束之路徑上置放一吸光屏幕，用以消除不必要之雜光所造成的干擾。 For example, in the measuring device described in claim 1, the light absorbing screen can be placed on the path of the reflected beam of the beam splitting unit to eliminate the interference caused by unnecessary stray light. 如申請專利範圍第1項所述之量測裝置，其光束投影單元所發出之光束波長可以為可見光或紅外線之波段。 The measuring device according to claim 1, wherein the beam of the beam emitted by the beam projecting unit can be in the visible or infrared band. 如申請專利範圍第1項所述之量測裝置，其光束投影單元之光源可以為雷射元件或發光二極體元件。 The measuring device according to claim 1, wherein the light source of the beam projecting unit may be a laser element or a light emitting diode element. 一種量測裝置，可量測前方物件之深度距離，包括： 一光束投影單元，其至少內含一光源與一繞射光學元件，該繞射光學元件可將該光源發射出之光束發散並投射至前方待測物件，並使投射出之光束強度呈現週期性分佈，以使投射至待測物件上之投影具有結構性之圖案；一分光單元，可使光束投影單元發射之光束反射，並使經待測物件反射之返回光束穿透該分光單元；一影像取像單元，用以接收穿透分光單元之待測物件反射光束，將待測物件上之投影圖案成像在影像取像單元之成像面上，該影像取像單元與光束投影單元有共同光軸但不同光場角度之幾何關係；一影像擷取與運算單元，用以擷取影像取像單元收集之影像，並將該影像作空間頻率之計算。 A measuring device that measures the depth distance of a front object, including: a beam projection unit having at least a light source and a diffractive optical element, the diffractive optical element diverging and projecting the light beam emitted from the light source to the object to be tested, and causing the intensity of the projected beam to be periodic Distributing so that the projection projected onto the object to be tested has a structural pattern; a light splitting unit can reflect the light beam emitted by the beam projecting unit, and cause the return beam reflected by the object to be tested to penetrate the light splitting unit; The image capturing unit is configured to receive the reflected light beam of the object to be tested that penetrates the light splitting unit, and image the projection pattern on the object to be tested on the imaging surface of the image capturing unit, the image capturing unit and the beam projecting unit have a common optical axis However, the geometric relationship of different light field angles; an image capturing and computing unit for capturing images collected by the image capturing unit and calculating the spatial frequency of the image. 如申請專利範圍第5項所述之量測裝置，可在分光單元光束穿透之路徑上置放一吸光屏幕，用以消除不必要之雜光所造成的干擾。 For example, in the measuring device described in claim 5, a light absorbing screen can be placed on the path of the beam splitting of the beam splitting unit to eliminate interference caused by unnecessary stray light. 一種量測裝置，可量測前方物件之深度距離，包括：一光束投影單元，其至少內含一光源與一繞射光學元件，該繞射光學元件可將該光源發射出之光束發散並投射至前方待測物件，並使投射出之光束強度呈現週期性分佈，以使投射至待測物件上之投影具有結構性之圖案；一影像取像單元，用以接收待測物件反射光束，將待測物件上之投影圖案成像在影像取像單元之成像面上，該影像 取像單元與光束投影單元呈現不同光軸且不同光場角度之幾何關係；一影像擷取與運算單元，用以擷取影像取像單元收集之影像，並將該影像作空間頻率之計算。 A measuring device capable of measuring a depth distance of a front object, comprising: a beam projection unit having at least a light source and a diffractive optical element, the diffractive optical element diverging and projecting the light beam emitted by the light source Going to the object to be tested in front, and causing the intensity of the projected beam to be periodically distributed, so that the projection projected onto the object to be tested has a structural pattern; an image capturing unit for receiving the reflected beam of the object to be tested, The projection pattern on the object to be tested is imaged on the imaging surface of the image capturing unit, the image The image capturing unit and the beam projecting unit exhibit geometric relations of different optical axes and different light field angles; an image capturing and calculating unit is used for capturing images collected by the image capturing unit, and calculating the spatial frequency of the image. 一種量測裝置，可量測前方物件之深度距離，包括：至少二個光束投影單元，每個光束投影單元至少內含一光源與一繞射光學元件，該繞射光學元件可將該光源發射出之光束發散並投射至前方待測物件，並使投射出之光束強度呈現週期性分佈，以使投射至待測物件上之投影具有結構性之圖案，該至少二個光束投影單元呈現並排之幾何配置關係，以使投射出之結構性圖案具有較大之分佈範圍；一影像取像單元，用以接收待測物件反射光束，將待測物件上之投影圖案成像在影像取像單元之成像面上，該影像取像單元與該至少二個光束投影單元皆呈現不同光軸且不同光場角度之幾何關係；一影像擷取與運算單元，用以擷取影像取像單元收集之影像，並將該影像作空間頻率之計算。 A measuring device capable of measuring a depth distance of a front object, comprising: at least two beam projecting units, each beam projecting unit having at least one light source and a diffractive optical element, wherein the diffractive optical element can emit the light source The emitted beam is diverged and projected to the object to be tested in front, and the intensity of the projected beam is periodically distributed so that the projection projected onto the object to be tested has a structural pattern, and the at least two beam projection units are presented side by side. The geometrical arrangement relationship is such that the projected structural pattern has a large distribution range; an image capturing unit is configured to receive the reflected light beam of the object to be tested, and image the projection pattern on the object to be tested into the image capturing unit. The image capturing unit and the at least two beam projecting units respectively exhibit different optical axes and geometric relationships of different light field angles; and an image capturing and calculating unit for capturing images collected by the image capturing unit, The image is calculated as a spatial frequency.
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