TWI487894B - - Google Patents

Info

Publication number
TWI487894B
TWI487894B TW101151235A TW101151235A TWI487894B TW I487894 B TWI487894 B TW I487894B TW 101151235 A TW101151235 A TW 101151235A TW 101151235 A TW101151235 A TW 101151235A TW I487894 B TWI487894 B TW I487894B
Authority
TW
Taiwan
Application number
TW101151235A
Other versions
TW201409017A (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of TW201409017A publication Critical patent/TW201409017A/zh
Application granted granted Critical
Publication of TWI487894B publication Critical patent/TWI487894B/zh

Links

TW101151235A 2012-08-31 2012-12-28 一種等離子處理系統 TW201409017A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210317750.2A CN102820197B (zh) 2012-08-31 2012-08-31 一种等离子处理***

Publications (2)

Publication Number Publication Date
TW201409017A TW201409017A (zh) 2014-03-01
TWI487894B true TWI487894B (zh) 2015-06-11

Family

ID=47304248

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101151235A TW201409017A (zh) 2012-08-31 2012-12-28 一種等離子處理系統

Country Status (2)

Country Link
CN (1) CN102820197B (zh)
TW (1) TW201409017A (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105161395A (zh) * 2015-08-11 2015-12-16 上海华力微电子有限公司 等离子体刻蚀装置及等离子体刻蚀方法
CN108966474A (zh) * 2018-10-03 2018-12-07 张家港衡德新材料科技有限公司 一种大功率复合频率icp等离子发生器

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6181068B1 (en) * 1998-05-15 2001-01-30 Dae Won Paptin Form Co., Ltd. Plasma generating apparatus
US6791692B2 (en) * 2000-11-29 2004-09-14 Lightwind Corporation Method and device utilizing plasma source for real-time gas sampling

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4857136A (en) * 1988-06-23 1989-08-15 John Zajac Reactor monitoring system and method
KR100257903B1 (ko) * 1997-12-30 2000-08-01 윤종용 인시튜 모니터링가능한 플라즈마 식각장치, 그 인시튜 모니터링방법, 플라즈마 식각챔버내의 잔류물 제거를 위한 인시튜 세정방법
FR2887072A1 (fr) * 2005-06-08 2006-12-15 Alcatel Sa Systeme spectographique ameliore avec source plasma
CN101150909B (zh) * 2006-09-22 2010-05-12 中微半导体设备(上海)有限公司 等离子体约束装置
KR200456733Y1 (ko) * 2009-08-24 2011-11-15 (주)쎄미시스코 센서챔버의 가스배출장치

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6181068B1 (en) * 1998-05-15 2001-01-30 Dae Won Paptin Form Co., Ltd. Plasma generating apparatus
US6791692B2 (en) * 2000-11-29 2004-09-14 Lightwind Corporation Method and device utilizing plasma source for real-time gas sampling

Also Published As

Publication number Publication date
TW201409017A (zh) 2014-03-01
CN102820197B (zh) 2016-03-09
CN102820197A (zh) 2012-12-12

Similar Documents

Publication Publication Date Title
BR112014017635A2 (zh)
BR112014017614A2 (zh)
BR112014017625A2 (zh)
BR112014017592A2 (zh)
BR112014017659A2 (zh)
BR112014017646A2 (zh)
AR092201A1 (zh)
BR112014017638A2 (zh)
BR112014017607A2 (zh)
BR112013027865A2 (zh)
BR112014017634A2 (zh)
BR112014017609A2 (zh)
BR112014017644A2 (zh)
BR112014017647A2 (zh)
BR112014017588A2 (zh)
BR112014017618A2 (zh)
BR112014013184A8 (zh)
BR112014017630A2 (zh)
BR112014017652A2 (zh)
BR112014017621A2 (zh)
BR112014017622A2 (zh)
BR112014017627A2 (zh)
BR112014017623A2 (zh)
BR112014017641A2 (zh)
BR112014018838A2 (zh)