TWI487893B - Surface plasmon resonance measurement system - Google Patents
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Description
本發明係有關於一種量測系統，其尤指一種表面電漿共振量測系統。 The present invention relates to a measurement system, and more particularly to a surface plasma resonance measurement system.
生物分子相互作用是生命的基礎，任何生物學方面的研究都可以歸納至生物分子交互作用(Biomolecular interaction)的結果。隨著科技日漸發展，生物分子間交互作用的關係讓人們更加深入研究了解生物體系中的結合，不論在動力學、親合力及免疫力識別之研究與基因調控、藥物開發等領域上，都持續不斷的深入分析及探討，其中以光波為媒介進行信號轉換處理的光學量測技術在各個領域上有廣泛的應用。 Biomolecular interactions are the foundation of life, and any biological study can be generalized to the results of Biomolecular interaction. With the development of science and technology, the interaction between biomolecules allows people to further study and understand the combination in biological systems, whether in the fields of kinetics, affinity and immunity recognition research, gene regulation, drug development, etc. Continuously in-depth analysis and discussion, the optical measurement technology that uses light wave as the medium for signal conversion processing has been widely used in various fields.
早期生物醫學領域常用酵素免疫分析法來分析分子親合力，檢測方式需對待測分子標定，過程需要繁複的沖洗手續，導致無法在分析過程中即時得知分子間交互作用機制。相較於酵素免疫分析法，近二十年來，表面電漿共振生物感知器(surface plasmon resonance biosensor,SPR biosensor)，一種利用光學技術設計的生物感測器，其利用特定分子與待測分子在界面間專一性的交互作用，產生界面特性改變的方式，來分析生物分子間的交互作用，優勢在可即時偵測生物分子的交互作用、無須對待測分子進行螢光或放射性物質標定、分析反應時間相當短、對 待測環境變化靈敏度高、整體架構簡單，且偵測區與感應區分別在於晶片兩側，除了能避免待測信號光遭到反應槽內的溶液吸收與散射，也可以在混濁或不透光的溶液中(例如血液、尿液)偵測專一性分子間交互作用，因此表面電漿共振生物感知器成為現代生物醫學研究上不可或缺的重要工具。 In the early biomedical field, enzyme immunoassay was used to analyze molecular affinity. The detection method requires calibration of the molecules to be tested. The process requires complicated washing procedures, which makes it impossible to know the mechanism of interaction between molecules in the analysis process. Compared with enzyme immunoassay, surface plasmon resonance biosensor (SPR biosensor), a biosensor designed by optical technology, utilizes specific molecules and molecules to be tested in the past two decades. The interaction between interfaces creates a way to change the characteristics of the interface to analyze the interaction between biomolecules. The advantage is that it can instantly detect the interaction of biomolecules, perform fluorescence or radioactive calibration without analyzing the molecules, and analyze the reaction. Time is quite short, right The sensitivity of the environment to be tested is high, and the overall structure is simple, and the detection area and the sensing area are respectively on both sides of the wafer, in addition to avoiding absorption and scattering of the signal light to be tested by the solution in the reaction tank, and also being turbid or opaque. In the solution (such as blood, urine) to detect specific intermolecular interactions, surface plasmon resonance biosensors have become an indispensable tool in modern biomedical research.
然而，傳統表面電漿共振生物感知器是使用巨大的雷射或鹵素燈泡作為激發光源，且需一偏光片調整光源的偏振角度，上述方式會使傳統表面電漿共振生物感知器之體積過大，且對於現在極為重視的微型化形成莫大的阻礙。 However, the conventional surface plasma resonance biosensor uses a huge laser or halogen bulb as the excitation light source, and requires a polarizer to adjust the polarization angle of the light source. The above method makes the volume of the conventional surface plasma resonance biosensor too large. And it poses a great obstacle to the miniaturization that is now highly valued.
因此，本發明提供一種利用有機發光二極體作為入射光源，且在稜鏡之入射面或出射面設置薄型之偏光膜，達到微型化之目的之表面電漿共振量測系統。 Therefore, the present invention provides a surface plasma resonance measuring system that uses an organic light-emitting diode as an incident light source and a thin polarizing film on the incident or exit surface of the crucible to achieve miniaturization.
本發明之一目的，係提供一種表面電漿共振量測系統，藉由在稜鏡之入射面或出射面設置薄型之偏光膜，以達到減少整體表面電漿共振量測系統體積之目的。 An object of the present invention is to provide a surface plasma resonance measuring system for reducing the volume of the overall surface plasma resonance measuring system by providing a thin polarizing film on the incident or exit surface of the crucible.
本發明之一目的，係提供一種表面電漿共振量測系統，藉由在有機發光二極體之出光面貼附薄型之偏光膜，以同時達到減少量測系統體積與調整入射光偏振角度之目的。 An object of the present invention is to provide a surface plasma resonance measuring system by attaching a thin polarizing film to a light emitting surface of an organic light emitting diode to simultaneously reduce the volume of the measuring system and adjust the polarization angle of the incident light. purpose.
本發明之一目的，係提供一種表面電漿共振量測系統，藉由在稜鏡之出射面貼附薄型之偏光膜，以同時達到減少量測系統體積與調整入射光偏振角度之目的。 An object of the present invention is to provide a surface plasma resonance measuring system for attaching a thin polarizing film to an exit surface of a crucible to simultaneously reduce the volume of the measuring system and adjust the polarization angle of the incident light.
本發明之一目的，係提供一種表面電漿共振量測系統，利用 有機發光二極體作為激發光源，以達到減少整體表面電漿共振量測系統體積之目的。 An object of the present invention is to provide a surface plasma resonance measuring system, which utilizes The organic light-emitting diode is used as an excitation light source to achieve the purpose of reducing the volume of the overall surface plasma resonance measurement system.
本發明之一目的，係提供一種表面電漿共振量測系統，藉由在稜鏡之入射面設置偏光膜，以達到調整入射光之偏振角度之目的。 An object of the present invention is to provide a surface plasma resonance measuring system for adjusting the polarization angle of incident light by providing a polarizing film on the incident surface of the crucible.
本發明之一目的，係提供一種表面電漿共振量測系統，藉由在稜鏡之出射面設置偏光膜，以達到調整反射光之偏振角度之目的。 An object of the present invention is to provide a surface plasma resonance measuring system for adjusting the polarization angle of reflected light by providing a polarizing film on the exit surface of the crucible.
本發明之一目的，係提供一種表面電漿共振量測系統，藉由在稜鏡之入射面設置增亮膜，以達到提升入射光之集中度、正視角亮度之目的。 An object of the present invention is to provide a surface plasma resonance measuring system, which is provided with a brightness enhancing film on the incident surface of the crucible to enhance the concentration of the incident light and the brightness of the positive viewing angle.
本發明之一目的，係提供一種表面電漿共振量測系統，藉由在稜鏡之出射面設置增亮膜，以達到提升反射光之集中度、正視角亮度之目的。 An object of the present invention is to provide a surface plasma resonance measuring system, which is provided with a brightness enhancing film on the exit surface of the crucible to enhance the concentration of the reflected light and the brightness of the positive viewing angle.
為了達到上述所指稱之各目的與功效，本發明係揭示了一種表面電漿共振量測系統，其包含：一有機發光二極體光源，具有一第一出光面，並經由第一出光面提供一第一入射光；一第一稜鏡，具有一第一入射面、一第一反射面與一第一出射面，第一入射光入射至第一入射面；一第一偏光膜，設置於第一出光面或第一入射面，第一入射光透過第一偏光膜入射至第一入射面，以調整第一入射光之偏振角度；一第一感測晶片，設置於第一反射面，並與至少一待測物接觸，第一感測晶片與待測物接觸之部分形成一偵測區，且第一入射光透過第一入射面與第一反射面入射至 偵測區，偵測區則依據待測物將第一入射光反射為一反射光；以及一第一偵測器，接收經第一出射面出射之反射光，以偵測反射光；其中第一感測晶片經由第一入射光之照射而產生表面電漿共振現象，並依據待測物反射該第一入射光。 In order to achieve the above-mentioned various purposes and effects, the present invention discloses a surface plasma resonance measuring system comprising: an organic light emitting diode light source having a first light emitting surface and provided via a first light emitting surface a first incident light; a first incident surface having a first incident surface, a first reflective surface and a first exit surface, the first incident light being incident on the first incident surface; a first polarizing film disposed on a first light-emitting surface or a first incident surface, the first incident light is incident on the first incident surface through the first polarizing film to adjust a polarization angle of the first incident light; and a first sensing wafer is disposed on the first reflective surface, And contacting at least one object to be tested, the portion of the first sensing wafer contacting the object to be tested forms a detection area, and the first incident light is incident on the first incident surface and the first reflective surface a detection area, the detection area reflects the first incident light as a reflected light according to the object to be tested; and a first detector receives the reflected light emitted through the first exit surface to detect the reflected light; A sensing wafer generates a surface plasma resonance phenomenon by irradiation of the first incident light, and reflects the first incident light according to the object to be tested.
10‧‧‧有機發光二極體光源 10‧‧‧Organic light source
101‧‧‧第一入射光 101‧‧‧First incident light
103‧‧‧第一出光面 103‧‧‧The first glazing
105‧‧‧第一反射光 105‧‧‧First reflected light
106‧‧‧玻璃蓋板 106‧‧‧glass cover
107‧‧‧陰極電極 107‧‧‧Cathode electrode
108‧‧‧有機層 108‧‧‧Organic layer
109‧‧‧陽極電極 109‧‧‧Anode electrode
110‧‧‧玻璃基板 110‧‧‧ glass substrate
20‧‧‧第一稜鏡 20‧‧‧ first
201‧‧‧第一入射面 201‧‧‧first incident surface
203‧‧‧第一反射面 203‧‧‧First reflecting surface
205‧‧‧第一出射面 205‧‧‧First exit surface
30‧‧‧第一偏光膜 30‧‧‧First polarizing film
40‧‧‧第一感測晶片 40‧‧‧First sensing chip
401‧‧‧偵測區 401‧‧‧Detection area
403‧‧‧透明基板 403‧‧‧Transparent substrate
405‧‧‧金屬薄膜 405‧‧‧Metal film
50‧‧‧第一偵測器 50‧‧‧First detector
60‧‧‧待測物 60‧‧‧Test object
70‧‧‧微流道層 70‧‧‧Microchannel layer
701‧‧‧微流道 701‧‧‧ micro flow channel
80‧‧‧增亮膜 80‧‧‧Brightening film
801‧‧‧細微稜鏡結構 801‧‧‧Small structure
90‧‧‧準直鏡 90‧‧‧ collimation mirror
100‧‧‧供電系統 100‧‧‧Power supply system
101’‧‧‧第二入射光 101’‧‧‧second incident light
103’‧‧‧第二出光面 103’‧‧‧The second glazing
105’‧‧‧反射光 105'‧‧‧ reflected light
20’‧‧‧第二稜鏡 20’‧‧‧Second
201’‧‧‧第二入射面 201’‧‧‧second incident surface
203’‧‧‧第二反射面 203’‧‧‧second reflective surface
205’‧‧‧第二出射面 205’‧‧‧second exit surface
30’‧‧‧第二偏光膜 30’‧‧‧Second polarizing film
40’‧‧‧第二感測晶片 40'‧‧‧Second Sensing Wafer
401’‧‧‧偵測區 401’‧‧‧Detection area
403’‧‧‧透明基板 403'‧‧‧Transparent substrate
405’‧‧‧金屬薄膜 405'‧‧‧Metal film
50’‧‧‧第二偵測器 50’‧‧‧Second detector
60’‧‧‧待測物 60’‧‧‧Test objects
70’‧‧‧微流道層 70’‧‧‧microchannel layer
701’‧‧‧微流道 701’‧‧‧ micro-channel
90’‧‧‧準直鏡 90’‧‧‧ collimation mirror
第1圖：其係為本發明之表面電漿共振量測系統之俯視圖；第2圖：其係為本發明之第一實施例之表面電漿共振量測系統之示意圖；第3圖：其係為本發明之反射式偏光增亮膜之示意圖；第4圖：其係為本發明之下發光型有機發光二極體光源之結構圖；第5圖：其係為本發明之上發光型有機發光二極體光源之結構圖；第6圖：其係為本發明之第二實施例之表面電漿共振量測系統之示意圖；第7圖：其係為本發明之第三實施例之表面電漿共振量測系統之示意圖；第8圖：其係為本發明之增亮膜之工作原理示意圖；第9A-9H圖：其係為本發明之增亮膜的結構示意圖；第10圖：其係為本發明之第四實施例之表面電漿共振量測系統之示意圖；以及第11圖：其係為本發明之全透式有機發光二極體光源之結構圖。 1 is a plan view of a surface plasma resonance measuring system of the present invention; FIG. 2 is a schematic view showing a surface plasma resonance measuring system according to a first embodiment of the present invention; FIG. 3: The schematic diagram of the reflective polarizing brightening film of the present invention; FIG. 4 is a structural diagram of the light-emitting organic light-emitting diode light source of the present invention; FIG. 5 is a top light-emitting type of the present invention. A structural diagram of an organic light emitting diode light source; Fig. 6 is a schematic view showing a surface plasma resonance measuring system according to a second embodiment of the present invention; Fig. 7 is a third embodiment of the present invention Schematic diagram of the surface plasma resonance measuring system; Fig. 8 is a schematic view showing the working principle of the brightness enhancing film of the present invention; Figure 9A-9H: it is a schematic structural view of the brightness enhancing film of the present invention; It is a schematic diagram of a surface plasma resonance measuring system according to a fourth embodiment of the present invention; and FIG. 11 is a structural diagram of a full-transmissive organic light emitting diode light source of the present invention.
為使 貴審查委員對本發明之特徵及所達成之功效有更進一 步之瞭解與認識，謹佐以較佳之實施例及配合詳細之說明，說明如後：首先，請參閱第1圖，其係為本發明之表面電漿共振量測系統之俯視圖。如圖所示，表面電漿共振量測系統包含一有機發光二極體光源10、一第一稜鏡20、一第一感測晶片40、一微流道層70、一準直鏡90。有機發光二極體光源10設置於第一稜鏡20之入射面，並連接於一供電系統100，供電系統100提供有機發光二極體光源10產生光所需之電源。第一感測晶片40與微流道層70設置於第一稜鏡20之反射面。準直鏡90則設置於第一稜鏡20之出射面，並用於將所接收到之光轉換為平行光，並將轉換後之光傳送至一偵測器(圖中未示)。此外，雖圖中未示，但有機發光二極體光源10與第一稜鏡20之入射面之間設置一偏光膜，用以調整有機發光二極體光源10產生之光的角度。 In order to make the reviewer's characteristics and effects achieved by the reviewer more advanced The understanding and understanding of the steps will be described with reference to the preferred embodiments and detailed descriptions. First, please refer to FIG. 1 , which is a top view of the surface plasma resonance measuring system of the present invention. As shown, the surface plasmon resonance measurement system includes an organic light emitting diode source 10, a first cymbal 20, a first sensing wafer 40, a microchannel layer 70, and a collimating mirror 90. The OLED light source 10 is disposed on the incident surface of the first cymbal 20 and is coupled to a power supply system 100. The power supply system 100 provides a power source required for the OLED light source 10 to generate light. The first sensing wafer 40 and the microchannel layer 70 are disposed on the reflective surface of the first crucible 20. The collimating mirror 90 is disposed on the exit surface of the first crucible 20 and is configured to convert the received light into parallel light and transmit the converted light to a detector (not shown). Further, although not shown, a polarizing film is disposed between the organic light emitting diode source 10 and the incident surface of the first crucible 20 for adjusting the angle of the light generated by the organic light emitting diode source 10.
請一併參閱第2圖，其係為本發明之第一實施例之表面電漿共振量測系統之示意圖。如圖所示，表面電漿共振量測系統包含有機發光二極體光源10、第一稜鏡20、一第一偏光膜30、第一感測晶片40與一第一偵測器50。有機發光二極體光源10具有一第一出光面103，並經由第一出光面103提供一第一入射光101。第一稜鏡20為任意適用於製作稜鏡之透明材質所製成，其具有一第一入射面201、一第一反射面203與一第一出射面205，第一入射光101入射至第一入射面201。第一偏光膜30設置於有機發光二極體10之第一出光面103或第一入射面201，第一入射光101透過第一偏光膜30入射至第一入射面201，以調整第一入射光101之偏振角度。第一感測晶片40設置於第一稜鏡20之第一反射面203，並與 至少一待測物60接觸，第一感測晶片40與待測物60接觸之部分形成一偵測區401，且第一入射光101透過第一入射面201而入射至第一反射面203，接著入射至偵測區401，偵測區401則依據所接觸之待測物60將第一入射光101反射為對應之反射光105。第一偵測器50用於接收經第一出射面205出射之反射光105，並用於偵測反射光105。 Please refer to FIG. 2, which is a schematic diagram of a surface plasma resonance measuring system according to a first embodiment of the present invention. As shown in the figure, the surface plasma resonance measuring system comprises an organic light emitting diode light source 10, a first germanium 20, a first polarizing film 30, a first sensing wafer 40 and a first detector 50. The organic light emitting diode 10 has a first light emitting surface 103 and provides a first incident light 101 via the first light emitting surface 103. The first cymbal 20 is made of any transparent material suitable for making cymbals, and has a first incident surface 201, a first reflective surface 203 and a first exit surface 205, and the first incident light 101 is incident on the first An incident surface 201. The first polarizing film 30 is disposed on the first light emitting surface 103 or the first incident surface 201 of the organic light emitting diode 10, and the first incident light 101 is incident on the first incident surface 201 through the first polarizing film 30 to adjust the first incident surface. The polarization angle of light 101. The first sensing wafer 40 is disposed on the first reflective surface 203 of the first crucible 20, and At least one of the objects to be tested 60 is in contact with each other, and a portion of the first sensing wafer 40 that is in contact with the object to be tested 60 forms a detection region 401, and the first incident light 101 is incident on the first reflective surface 203 through the first incident surface 201. Then, it is incident on the detection area 401. The detection area 401 reflects the first incident light 101 into the corresponding reflected light 105 according to the object to be tested 60. The first detector 50 is configured to receive the reflected light 105 emitted through the first exit surface 205 and to detect the reflected light 105.
有機發光二極體光源10與第一偏光膜30之厚度皆選擇為小於0.2毫米(mm)，且第一偏光膜30可直接貼附於有機發光二極體光源10之第一出光面103或貼附於第一稜鏡20之第一入射面201，第一偏光膜30與一般偏光片原理相同，也就是將入射光之偏振角度調整為產生表面電漿現象所需之橫向磁波(Transverse Magnetic Wave，TM Wave)，此外，第一偏光膜30亦可為一反射式偏光增亮膜，其效率更高於一般偏光片，其工作原理如第3圖所示，其係為本發明之反射式偏光增亮膜之示意圖，反射式偏光增亮膜使穿透方向偏振光(橫向磁波TM)通過，反射非穿透方向的偏振光(橫向電波TE)，被反射回去的非穿透方向偏振光(橫向電波TE)被底層的有機發光二極體光源10擴散與擾亂後而再轉化成部分穿透、部分非穿透偏振光，穿透方向偏振光(橫向磁波TM)再穿透，非穿透方向偏振光(橫向電波TE)再反射，光源經如此反覆作用後，使大部分的光都轉變成可利用的橫向磁波TM。 The thickness of the organic light-emitting diode light source 10 and the first polarizing film 30 are both selected to be less than 0.2 millimeters (mm), and the first polarizing film 30 can be directly attached to the first light-emitting surface 103 of the organic light-emitting diode light source 10 or Attached to the first incident surface 201 of the first crucible 20, the first polarizing film 30 has the same principle as the general polarizer, that is, the polarization angle of the incident light is adjusted to the transverse magnetic wave required to generate the surface plasma phenomenon (Transverse Magnetic Wave, TM Wave), in addition, the first polarizing film 30 can also be a reflective polarizing brightening film, which is more efficient than a general polarizer, and its working principle is shown in FIG. 3, which is the reflection of the present invention. Schematic diagram of a polarizing brightening film, the reflective polarizing brightening film passes the polarized light in the direction of transmission (transverse magnetic wave TM), reflects the polarized light in the non-penetrating direction (transverse electric wave TE), and is reflected in the non-penetrating direction polarization The light (transverse electric wave TE) is diffused and disturbed by the underlying organic light-emitting diode source 10 and then converted into a partially penetrating, partially non-transmissive polarized light, and transmitted through the directionally polarized light (transverse magnetic wave TM). Transverse direction polarized light (transverse electric wave TE) After such a repeated action by the light source, so that most of the light is converted into transverse wave TM available.
請一併參閱第4、5圖，第4圖係為本發明之下發光型有機發光二極體光源之結構圖，第5圖係為本發明之上發光型有機發光二極體光源之結構圖。如第4圖所示，本發明之有機發光二極體光源10可為下發光型有機發光二極體光源，其包含一玻璃蓋板 106、一陰極電極107、一有機層108、一陽極電極109以及一玻璃基板110，而由於下發光型有機發光二極體光源之陽極電極109為透明電極，第一入射光101是由陽極電極109之方向射出，因此第一偏光膜30藉由鍍或黏貼等方式設置於玻璃基板106之一側，以調整第一入射光101之偏振角度。 Please refer to FIG. 4 and FIG. 5 together. FIG. 4 is a structural diagram of the light-emitting organic light-emitting diode light source of the present invention, and FIG. 5 is a structure of the light-emitting organic light-emitting diode light source of the present invention. Figure. As shown in FIG. 4, the organic light emitting diode light source 10 of the present invention may be a lower light emitting type organic light emitting diode light source, which comprises a glass cover plate. 106, a cathode electrode 107, an organic layer 108, an anode electrode 109 and a glass substrate 110, and since the anode electrode 109 of the lower-emitting organic light-emitting diode light source is a transparent electrode, the first incident light 101 is an anode electrode The first polarizing film 30 is disposed on one side of the glass substrate 106 by plating or pasting to adjust the polarization angle of the first incident light 101.
如第5圖所示，本發明之有機發光二極體光源10亦可為上發光型有機發光二極體光源，其與下方光型有機發光二極體光源之差異在於其陰極電極107為透明電極，第一入射光101是由陰極電極107之方向射出，因此第一偏光膜30藉由鍍或黏貼等方式設置於玻璃蓋板106之一側，以調整第一入射光101之偏振角度。 As shown in FIG. 5, the organic light-emitting diode light source 10 of the present invention may also be an upper light-emitting organic light-emitting diode light source, which is different from the lower light-type organic light-emitting diode light source in that the cathode electrode 107 is transparent. The first incident light 101 is emitted from the cathode electrode 107. Therefore, the first polarizing film 30 is disposed on one side of the cover glass 106 by plating or pasting to adjust the polarization angle of the first incident light 101.
復參閱第2圖，於此實施例中第一感測晶片40包含一透明基板403與一金屬薄膜405。透明基板403之材質選擇與第一稜鏡20之材質相同，且透明基板403貼合於第一稜鏡20之第一反射面203，例如可利用折射率匹配油(Index Matching Oil)貼合透明基板403與第一稜鏡20，但不以此為限。金屬薄膜405設置於透明基板403，其材質為金或銀，而其厚度選擇為40至50奈米之間，金屬薄膜405可藉由蒸鍍之方式設置於透明基板403，且金屬薄膜405直接與待測物60接觸，其與待測物60接觸之部分受待測物60之影響會改變表面電漿共振特性，而形成偵測區401，而藉由量測不同待測物60所產生的表面電漿共振特性，即可量測出各種待測物60，而待測物60亦可為空氣。 Referring to FIG. 2, in this embodiment, the first sensing wafer 40 includes a transparent substrate 403 and a metal film 405. The material of the transparent substrate 403 is the same as that of the first crucible 20, and the transparent substrate 403 is bonded to the first reflective surface 203 of the first crucible 20, for example, by using Index Matching Oil. The substrate 403 and the first crucible 20 are not limited thereto. The metal film 405 is disposed on the transparent substrate 403, and the material thereof is gold or silver, and the thickness thereof is selected to be between 40 and 50 nanometers. The metal film 405 can be disposed on the transparent substrate 403 by evaporation, and the metal film 405 is directly In contact with the object to be tested 60, the portion in contact with the object to be tested 60 is affected by the object to be tested 60 to change the surface plasma resonance characteristics, and the detection region 401 is formed, and the measurement is performed by measuring different objects 60 to be tested. The surface plasma resonance characteristics, that is, the various objects to be tested 60 can be measured, and the object to be tested 60 can also be air.
由上述可知，第一感測晶片40包含透明基板403與金屬薄膜405，因此若要更換金屬薄膜405時不需更換整個第一稜鏡20，僅需更換透明基板403即可，但本發明不以此為限，在金屬薄膜405 與第一反射面203間亦可不需有透明基板403，而將金屬薄膜405直接蒸鍍至第一稜鏡20之第一反射面203。 As can be seen from the above, the first sensing wafer 40 includes the transparent substrate 403 and the metal film 405. Therefore, if the first film 20 is not replaced when the metal film 405 is to be replaced, only the transparent substrate 403 needs to be replaced, but the present invention does not. To this end, in the metal film 405 The transparent film 403 may be omitted from the first reflecting surface 203, and the metal film 405 may be directly vapor-deposited to the first reflecting surface 203 of the first crucible 20.
另外，第一稜鏡20之第一入射面201與第一反射面203間之夾角θ1為75度，而第一反射面203與第一出射面205間之夾角θ2亦為75度，且第一入射光101之入射角與反射光105之反射角亦皆為75度，而透過此入射角與反射角的角度可測得較佳的表面電漿共振現象，但本發明不以此為限，夾角θ1與夾角θ2亦可為任意能產生表面電漿共振現象之角度。 In addition, the angle θ 1 between the first incident surface 201 of the first crucible 20 and the first reflective surface 203 is 75 degrees, and the angle θ 2 between the first reflective surface 203 and the first exit surface 205 is also 75 degrees. The angle of incidence of the first incident light 101 and the reflected light 105 are also 75 degrees, and the angle of the incident angle and the angle of reflection can be measured to obtain a better surface plasma resonance phenomenon, but the present invention does not For example, the angle θ 1 and the angle θ 2 may also be any angles capable of generating surface plasma resonance.
此外，於此實施例中，表面電漿共振量測系統更包含微流道層70與準直鏡90。微流道層70設置於第一感測晶片40之金屬薄膜405，而微流道層70與金屬薄膜405接觸之部分形成有至少一微流道701，此微流道701用於容置待測物60，並使待測物60直接接觸於金屬薄膜405，以形成偵測區401，但本發明設置待測物60之方式並不以此微流道層70為限，亦可為其他方式。準直鏡90設置於第一稜鏡20之第一出射面205與第一偵測器50之間，用以將反射光105的光線調整為平行光後傳送至第一偵測器50，以供第一偵測器50偵測。 Moreover, in this embodiment, the surface plasma resonance measurement system further includes a micro flow channel layer 70 and a collimating mirror 90. The micro-channel layer 70 is disposed on the metal film 405 of the first sensing wafer 40, and the portion of the micro-channel layer 70 in contact with the metal film 405 is formed with at least one micro-flow channel 701 for accommodating The object 60 is measured, and the object to be tested 60 is directly in contact with the metal film 405 to form the detection region 401. However, the manner in which the object to be tested 60 is disposed in the present invention is not limited to the micro channel layer 70, and may be other the way. The collimating mirror 90 is disposed between the first exit surface 205 of the first cassette 20 and the first detector 50 for adjusting the light of the reflected light 105 to be parallel light and transmitting the light to the first detector 50 to It is detected by the first detector 50.
基於上述，本發明之第一實施例之表面電漿共振量測系統，利用有機發光二極體光源10作為表面電漿共振量測系統的激發光源，以解決傳統表面電漿共振量測系統利用雷射或鹵素燈泡作為激發光源體積過大的問題，並藉由在有機發光二極體光源10與第一稜鏡20之第一入射面201間設置薄型的第一偏光膜30，以解決傳統表面電漿共振量測系統之偏光片體積過大的問題。 Based on the above, the surface plasma resonance measuring system of the first embodiment of the present invention utilizes the organic light emitting diode light source 10 as an excitation light source of the surface plasma resonance measuring system to solve the utilization of the conventional surface plasma resonance measuring system. A laser or a halogen bulb is used as a problem of excessive volume of the excitation light source, and the conventional surface is solved by providing a thin first polarizing film 30 between the organic light emitting diode source 10 and the first incident surface 201 of the first crucible 20 The problem of the polarizer volume being too large in the plasma resonance measuring system.
請參閱第6圖，其係為本發明之第二實施例之表面電漿共振量測系統之示意圖。如圖所示，本實施例與第一實施例之差異僅在於，本實施例之第一偏光膜30設置於第一稜鏡20之第一出射面205，而其餘部分則不再贅述。 Please refer to FIG. 6, which is a schematic diagram of a surface plasma resonance measuring system according to a second embodiment of the present invention. As shown in the figure, the first embodiment is different from the first embodiment in that the first polarizing film 30 of the embodiment is disposed on the first exit surface 205 of the first crucible 20, and the rest is not described again.
於本實施例中將第一偏光膜30設置於第一稜鏡20之第一出射面205，反射光105經由第一偏光膜30而出射至第一偵測器50，所以第一偏光膜30可調整反射光105之偏振角度為橫向磁波TM，使第一偵測器50所偵測到之光皆為橫向磁波TM，因此第一偵測器50不會偵測到不需要之光，也就是所謂的雜訊，而第一偏光膜30如同第一實施例其亦可為反射式偏光增亮膜，而第一偏光膜30之原理相同於第一實施例，因此不再贅述。 In the embodiment, the first polarizing film 30 is disposed on the first exit surface 205 of the first crucible 20, and the reflected light 105 is emitted to the first detector 50 via the first polarizing film 30, so the first polarizing film 30 The polarization angle of the adjustable reflected light 105 is the transverse magnetic wave TM, so that the light detected by the first detector 50 is the transverse magnetic wave TM, so the first detector 50 does not detect the unnecessary light, and The so-called noise, and the first polarizing film 30 can also be a reflective polarizing brightness enhancing film as in the first embodiment, and the principle of the first polarizing film 30 is the same as that of the first embodiment, and therefore will not be described again.
請參閱第7圖，其係為本發明之第三實施例之表面電漿共振量測系統之示意圖。如圖所示，本實施例與第一實施例之差異僅在於，本實施例之有機發光二極體光源10與第一偏光膜30之間設置一增亮膜80，而其餘部分則不再贅述。而設置增亮膜80可增加第一入射光101之集中度與正視角亮度，且增亮膜80亦可如第4或5圖所示，鍍或黏貼於第一偏光膜30與玻璃基板110之間或第一偏光膜30與玻璃蓋板106之間。 Please refer to FIG. 7, which is a schematic diagram of a surface plasma resonance measuring system according to a third embodiment of the present invention. As shown in the figure, the difference between the present embodiment and the first embodiment is that a brightness enhancement film 80 is disposed between the organic light emitting diode source 10 and the first polarizing film 30 of the present embodiment, and the rest is no longer Narration. The brightness enhancement film 80 can increase the concentration of the first incident light 101 and the brightness of the positive viewing angle, and the brightness enhancement film 80 can also be plated or adhered to the first polarizing film 30 and the glass substrate 110 as shown in FIG. 4 or FIG. Between or between the first polarizing film 30 and the cover glass 106.
請一併參閱第8圖，其係為本發明之增亮膜之工作原理示意圖，如圖所示，當第一入射光101從增亮膜80的細微稜鏡結構801(折射率=1.47~1.55)進入到空氣中，入射光束小於臨界角時，根據斯乃爾定律，第一入射光101會以正常折射方式偏離法線來達到提升正面亮度、集中出光角度，而當第一入射光101大於臨界角時，則第一入射光101無法從增亮膜80透射進入到空氣 ，因而產生全反射現象，經全反射的第一入射光101有部分會被反射回去再重新利用，部分第一入射光101重新進入下一個細微稜鏡結構801、少部分再反射或再折射造成低比例損失，第一入射光101經如此重複作用，對光能的重新分佈，來達到提高凝聚光線、提升正視角亮度。 Please refer to FIG. 8 , which is a schematic diagram of the working principle of the brightness enhancement film of the present invention. As shown in the figure, when the first incident light 101 is from the fine 稜鏡 structure 801 of the brightness enhancement film 80 (refractive index=1.47~) 1.55) When entering the air, when the incident beam is smaller than the critical angle, according to Snell's law, the first incident light 101 will deviate from the normal line in the normal refraction manner to achieve the front brightness and the concentrated light angle, and when the first incident light 101 is larger than At the critical angle, the first incident light 101 cannot be transmitted from the brightness enhancement film 80 into the air. Thus, a total reflection phenomenon occurs, and a portion of the totally incident first incident light 101 is reflected back and reused, and a portion of the first incident light 101 re-enters the next fine 稜鏡 structure 801, resulting in a small portion of re-reflection or re-refraction. With a low proportion loss, the first incident light 101 is repeatedly repeated to re-distribute the light energy to improve the condensed light and enhance the brightness of the positive viewing angle.
其中，增亮膜80結構上主要以不同厚度的聚對苯二甲酸乙二酯(Polyethylene terephthalate，PET)上塗佈壓克力樹脂(Acrylic Resin or PMMA)，再以預鑄的光學級週期性稜鏡結構滾輪壓印，再利用高能量紫外線光照射將細微稜鏡結構801，而細微稜鏡結構801並不僅限於第8圖之樣式，亦可如第9A至9H圖，本發明之增亮膜的結構示意圖所示之各種樣式。 Among them, the brightness enhancement film 80 is mainly coated with acrylic resin (Acrylic Resin or PMMA) on different thicknesses of polyethylene terephthalate (PET), and then optically periodicized with erbium. The 稜鏡 structure roller is embossed, and the fine 稜鏡 structure 801 is irradiated by high-energy ultraviolet light, and the fine 稜鏡 structure 801 is not limited to the pattern of FIG. 8, and may also be brightened by the present invention as shown in FIGS. 9A to 9H. Various patterns shown in the structural schematic of the film.
此外，本發明之增亮膜80不僅限於設置在有機發光二極體光源10與第一偏光膜30之間，其亦可設置於第一偏光膜30與第一入射面201之間，或是設置於第一出射面205與第一偵測器50之間，以提高反射光105凝聚光線、提升正視角亮度，且其亦可單獨設置，並非一定要設置於第一偏光膜30。 In addition, the brightness enhancement film 80 of the present invention is not limited to be disposed between the organic light emitting diode source 10 and the first polarizing film 30, and may be disposed between the first polarizing film 30 and the first incident surface 201, or The first emitting surface 205 is disposed between the first emitting surface 205 and the first detecting unit 50 to enhance the light condensed by the reflected light 105 and enhance the brightness of the positive viewing angle, and may be separately disposed, and is not necessarily disposed on the first polarizing film 30.
請參閱第10圖，其係為本發明之第四實施例之表面電漿共振量測系統之示意圖。如圖所示，本實施例與前述實施例之差異在於，本實施例之有機發光二極體光源10為一全透式有機發光二極體光源，所以有機發光二極體光源10具有一第一出光面103與一第二出光面103’，並將第一出光面103與一第二出光面103’分別對應設置於第一稜鏡20之第一入射面201與一第二稜鏡20’之一第二入射面201’，且將第一偏光膜30與一第二偏光膜30’設置於有機發光二極體光源10與第一稜鏡20、第二稜鏡20’之間， 此外，本實施例之表面電漿共振量測系統更包含有一第二感測晶片40’、一微流道層70’以及一第二偵測器50’，該些感測晶片(第一感測晶片40、第二感測晶片40’)、該些微流道層70、70’與該些偵測器(第一偵測器50、第二偵測器50’)分別對應設置於第一稜鏡20與第二稜鏡，其設置方式與原理皆相同於本發明之第一實施例，但本實施例之設置方式亦可如第二、三實施例所示，設置增亮膜80於有機發光二極體光源10與第二偏光膜30之間，或將第二偏光膜30設置於出射面，而詳細設置方式皆如前述實施例所述，故在此不再贅述。 Please refer to FIG. 10, which is a schematic diagram of a surface plasma resonance measuring system according to a fourth embodiment of the present invention. As shown in the figure, the difference between the embodiment and the foregoing embodiment is that the organic light emitting diode light source 10 of the present embodiment is a full transparent organic light emitting diode light source, so the organic light emitting diode light source 10 has a first a light emitting surface 103 and a second light emitting surface 103 ′, and the first light emitting surface 103 and the second light emitting surface 103 ′ are respectively disposed on the first incident surface 201 and the second 稜鏡 20 of the first 稜鏡 20 a first incident surface 201 ′, and a first polarizing film 30 and a second polarizing film 30 ′ are disposed between the organic light emitting diode light source 10 and the first 稜鏡 20 and the second 稜鏡 20 ′, In addition, the surface plasma resonance measuring system of the embodiment further includes a second sensing chip 40', a micro channel layer 70', and a second detector 50'. The sensing chips (first sense) The measuring chip 40, the second sensing chip 40'), the micro channel layers 70, 70' and the detectors (the first detector 50, the second detector 50') are respectively disposed corresponding to the first The 稜鏡20 and the second 稜鏡 are disposed in the same manner as the first embodiment of the present invention. However, the arrangement of the embodiment may also be as shown in the second and third embodiments. Between the organic light-emitting diode light source 10 and the second polarizing film 30, or the second polarizing film 30 is disposed on the exit surface, and the detailed arrangement is as described in the foregoing embodiment, and thus will not be described herein.
請一併參閱第11圖，其係為本發明之全透式有機發光二極體光源之結構圖。如圖所示，全透式有機發光二極體光源10與上發光型有機發光二極體光源或下發光行有機發光二極體光源之差異在於，全透式有機發光二極體光源10之陰極電極107與陽極電極109皆為透明電極，因此第一入射光101由陰極電極107或陽極電極109之方向射出，而第二入射光101’則由另一電極(陰極電極107或陽極電極109)之方向射出。 Please refer to FIG. 11 , which is a structural diagram of a full-transmission organic light-emitting diode light source of the present invention. As shown in the figure, the difference between the full-transmission organic light-emitting diode light source 10 and the upper-emitting organic light-emitting diode light source or the lower light-emitting organic light-emitting diode light source is that the fully transparent organic light-emitting diode light source 10 The cathode electrode 107 and the anode electrode 109 are both transparent electrodes, so that the first incident light 101 is emitted from the cathode electrode 107 or the anode electrode 109, and the second incident light 101' is formed by the other electrode (the cathode electrode 107 or the anode electrode 109). ) in the direction of the shot.
基於上述，本發明之第四實施例之表面電漿共振量測系統，藉由在全透式有機發光二極體光源兩側分別設置第一稜鏡20與第二稜鏡20’、第一感測晶片40與第二感測晶片40’、微流道層70、70’以及第一偵測器50與第二偵測器50’，而達到利用同一有機發光二極體光源傳送入射光至兩感測端，以減少整體表面電漿共振系統之體積。 Based on the above, the surface plasma resonance measuring system according to the fourth embodiment of the present invention provides a first 稜鏡 20 and a second 稜鏡 20 ′, respectively, on both sides of the full-transmissive organic light-emitting diode light source. Sensing the wafer 40 and the second sensing wafer 40', the microchannel layer 70, 70', and the first detector 50 and the second detector 50' to achieve the transmission of incident light by using the same organic light emitting diode source To the two sensing ends to reduce the volume of the overall surface plasma resonance system.
綜上所述，本發明之表面電漿共振量測系統，利用有機發光二極體作為激發光源，且在稜鏡的入射面或出射面設置薄型之偏 光膜以取代傳統偏光片，而達到減少整體表面電漿共振系統體積之目的。 In summary, the surface plasma resonance measuring system of the present invention uses an organic light emitting diode as an excitation light source, and is provided with a thin bias on the incident or exit surface of the crucible. The photo film replaces the conventional polarizer to achieve the purpose of reducing the volume of the overall surface plasma resonance system.
惟以上所述者，僅為本發明之較佳實施例而已，並非用來限定本發明實施之範圍，舉凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾，均應包括於本發明之申請專利範圍內。 The above is only the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and the variations, modifications, and modifications of the shapes, structures, features, and spirits described in the claims of the present invention. All should be included in the scope of the patent application of the present invention.
本發明係實為一具有新穎性、進步性及可供產業利用者，應符合我國專利法所規定之專利申請要件無疑，爰依法提出發明專利申請，祈 鈞局早日賜准專利，至感為禱。 The invention is a novelty, progressive and available for industrial use, and should meet the requirements of the patent application stipulated in the Patent Law of China, and the invention patent application is filed according to law, and the prayer bureau will grant the patent as soon as possible. prayer.
10‧‧‧有機發光二極體光源 10‧‧‧Organic light source
101‧‧‧第一入射光 101‧‧‧First incident light
103‧‧‧第一出光面 103‧‧‧The first glazing
105‧‧‧反射光 105‧‧‧reflected light
20‧‧‧第一稜鏡 20‧‧‧ first
201‧‧‧第一入射面 201‧‧‧first incident surface
203‧‧‧第一反射面 203‧‧‧First reflecting surface
205‧‧‧第一出射面 205‧‧‧First exit surface
30‧‧‧第一偏光膜 30‧‧‧First polarizing film
40‧‧‧第一感測晶片 40‧‧‧First sensing chip
401‧‧‧偵測區 401‧‧‧Detection area
403‧‧‧透明基板 403‧‧‧Transparent substrate
405‧‧‧金屬薄膜 405‧‧‧Metal film
50‧‧‧第一偵測器 50‧‧‧First detector
60‧‧‧待測物 60‧‧‧Test object
70‧‧‧微流道層 70‧‧‧Microchannel layer
701‧‧‧微流道 701‧‧‧ micro flow channel
90‧‧‧準直鏡 90‧‧‧ collimation mirror
Claims (12)
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