TWI467139B - Device for testing luminance - Google Patents
Device for testing luminance Download PDFInfo
- Publication number
- TWI467139B TWI467139B TW100102199A TW100102199A TWI467139B TW I467139 B TWI467139 B TW I467139B TW 100102199 A TW100102199 A TW 100102199A TW 100102199 A TW100102199 A TW 100102199A TW I467139 B TWI467139 B TW I467139B
- Authority
- TW
- Taiwan
- Prior art keywords
- sliding
- disposed
- driving mechanism
- driving
- brightness
- Prior art date
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
- Liquid Crystal (AREA)
Description
本發明涉及一種顯示器測試裝置，尤其涉及一種顯示器背光模組輝度測試裝置。 The present invention relates to a display test device, and more particularly to a display backlight module luminance test device.
當液晶顯示器背光模組之光源輝度不均時，就會於使用者觀看時造成視覺上之不協調。因此，於液晶顯示器生產製造過程中需要對其輝度進行檢測。由於大多數習知之輝度測試裝置移動性及靈活性較差，導致很多習知之液晶顯示器背光模組生產線上之輝度測試效果仍不夠理想。為提高液晶顯示器背光模組之輝度測試精度，需要設計性能更好之輝度測試裝置。 When the brightness of the light source of the backlight module of the liquid crystal display is uneven, it will cause visual disharmony when viewed by the user. Therefore, the brightness of the liquid crystal display needs to be detected during its manufacturing process. Due to the poor mobility and flexibility of most conventional luminance test devices, the brightness test results of many conventional LCD backlight modules are still not satisfactory. In order to improve the brightness test accuracy of the liquid crystal display backlight module, it is necessary to design a brightness test device with better performance.
有鑒於此，有必要提供一種靈活性更高之輝度測試裝置。 In view of this, it is necessary to provide a more flexible brightness test device.
一種輝度測試裝置，用於測試背光模組之輝度，包括工作臺、第一驅動機構、承載機構、支撐機構、第二驅動機構、第三驅動機構及輝度計，該工作臺用於容置該第一驅動機構，所述承載機構蓋設於該工作臺上，用於承載所述背光模組，該承載機構上設置有凹部，該凹部內可容置一校正鏡，該校正鏡與該輝度計相對設置，用於判斷所述輝度計之光軸是否與該承載機構所在平面垂直，所述支撐機構連接至所述第一驅動機構，以於所述第一驅動機構之驅動下沿一第一方向移動，所述第二驅動機構裝設於該支撐 機構上，該第三驅動機構裝設於該第二驅動機構之一側，所述第二驅動機構驅動所述第三驅動機構沿一垂直於上述第一方向之第二方向移動，所述輝度計裝設於所述第三驅動機構之一側，第三驅動機構驅動所述輝度計沿一垂直於上述第一方向及第二方向之第三方向移動。 A brightness test device for testing the brightness of the backlight module, comprising a work table, a first driving mechanism, a supporting mechanism, a supporting mechanism, a second driving mechanism, a third driving mechanism and a luminance meter, wherein the working table is configured to receive the brightness a first driving mechanism, the carrying mechanism is disposed on the working platform, and is configured to carry the backlight module, wherein the carrying mechanism is provided with a concave portion, wherein the concave portion can accommodate a correcting mirror, the correcting mirror and the brightness a relative setting, configured to determine whether an optical axis of the luminance meter is perpendicular to a plane of the carrying mechanism, and the supporting mechanism is coupled to the first driving mechanism to drive along the first driving mechanism Moving in one direction, the second driving mechanism is mounted on the support Mechanically, the third driving mechanism is mounted on one side of the second driving mechanism, and the second driving mechanism drives the third driving mechanism to move in a second direction perpendicular to the first direction, the brightness The metering device is disposed on one side of the third driving mechanism, and the third driving mechanism drives the luminance meter to move in a third direction perpendicular to the first direction and the second direction.
本發明之輝度測試裝置藉由設置複數個驅動機構，使得輝度測試裝置能夠實現三維空間內移動，從而快速地對同一被測物件立體結構上之複數個測試點進行輝度測量，較習知之輝度測試裝置具有更高之實用性。 The brightness test device of the present invention enables the brightness test device to move in a three-dimensional space by setting a plurality of drive mechanisms, thereby rapidly performing luminance measurement on a plurality of test points on the stereoscopic structure of the same object to be tested, which is better than the conventional brightness test. The device has higher utility.
100‧‧‧輝度測試裝置 100‧‧‧luminance test device
10‧‧‧底座 10‧‧‧Base
20‧‧‧工作臺 20‧‧‧Workbench
30‧‧‧第一驅動機構 30‧‧‧First drive mechanism
40‧‧‧承載機構 40‧‧‧Loading mechanism
50‧‧‧支撐機構 50‧‧‧Support institutions
60‧‧‧第二驅動機構 60‧‧‧Second drive mechanism
70‧‧‧第三驅動機構 70‧‧‧ Third drive mechanism
80‧‧‧輝度計 80‧‧‧luminometer
90‧‧‧感測器 90‧‧‧ Sensor
31‧‧‧第一驅動部 31‧‧‧First Drive Department
32‧‧‧第一滑軌 32‧‧‧First slide rail
33‧‧‧第一滑動部 33‧‧‧First sliding part
311‧‧‧第一固定板 311‧‧‧First fixed plate
312‧‧‧第一帶輪 312‧‧‧First pulley
313‧‧‧第一皮帶 313‧‧‧First belt
314‧‧‧第一電機 314‧‧‧First motor
331‧‧‧連接部 331‧‧‧Connecting Department
332‧‧‧裝配槽 332‧‧‧Assemble
41‧‧‧凹部 41‧‧‧ recess
42‧‧‧滑動件 42‧‧‧Sliding parts
43‧‧‧定位件 43‧‧‧ Positioning parts
46‧‧‧伸縮條 46‧‧‧Flexing strip
200‧‧‧待測背光模組 200‧‧‧Backlight module to be tested
421‧‧‧滑槽 421‧‧‧Chute
431‧‧‧滑柱 431‧‧‧Sliding column
432‧‧‧卡持部 432‧‧‧Cars Department
51‧‧‧立柱 51‧‧‧ column
52‧‧‧橫樑 52‧‧‧ beams
61‧‧‧支撐部 61‧‧‧Support
62‧‧‧第二驅動部 62‧‧‧Second drive department
63‧‧‧第二滑軌 63‧‧‧Second rail
64‧‧‧第二滑動部 64‧‧‧Second sliding part
65‧‧‧防護板 65‧‧‧Protective panels
621‧‧‧第二固定板 621‧‧‧Second fixed plate
622‧‧‧第二帶輪 622‧‧‧Second pulley
623‧‧‧第二皮帶 623‧‧‧Second belt
624‧‧‧第二電機 624‧‧‧Second motor
641‧‧‧滑塊 641‧‧‧ Slider
642‧‧‧配合槽 642‧‧‧With slot
643‧‧‧缺口 643‧‧‧ gap
71‧‧‧裝配部 71‧‧‧Assembly Department
72‧‧‧調節部 72‧‧‧Regulatory Department
73‧‧‧第三滑動部 73‧‧‧ third sliding part
711‧‧‧連接板 711‧‧‧Connecting board
712‧‧‧裝配板 712‧‧‧ Assembly board
721‧‧‧調節柱 721‧‧‧ adjustment column
722‧‧‧操作部 722‧‧‧Operation Department
723‧‧‧操作柄 723‧‧‧Operator
724‧‧‧導向柱 724‧‧‧ Guide column
731‧‧‧調節孔 731‧‧‧Adjustment hole
732‧‧‧導向孔 732‧‧‧ Guide hole
圖1為本發明較佳實施方式之輝度測試裝置之分解示意圖。 1 is an exploded perspective view of a luminance testing device according to a preferred embodiment of the present invention.
圖2為圖1所示輝度測試裝置中底座、工作臺及第一驅動機構之分解示意圖。 2 is an exploded perspective view of the base, the table, and the first driving mechanism in the luminance testing device of FIG. 1.
圖3為圖1所示輝度測試裝置中承載機構之示意圖。 3 is a schematic view of a carrier mechanism in the luminance testing device of FIG. 1.
圖4為圖1所示輝度測試裝置中支撐機構、第二驅動機構及第三驅動機構之分解示意圖。 4 is an exploded perspective view of the support mechanism, the second drive mechanism, and the third drive mechanism in the luminance test device of FIG. 1.
圖5為圖1所示輝度測試裝置之組裝示意圖。 FIG. 5 is a schematic view showing the assembly of the luminance testing device shown in FIG. 1. FIG.
請一併參閱圖1，本發明較佳實施方式提供一種輝度測試裝置100，用於對一背光模組之輝度進行測試。所述輝度測試裝置100包括底座10、工作臺20、第一驅動機構30、承載機構40、支撐機構50、第二驅動機構60、第三驅動機構70、輝度計80及感測器90。 Referring to FIG. 1 together, a preferred embodiment of the present invention provides a luminance testing apparatus 100 for testing the luminance of a backlight module. The brightness testing device 100 includes a base 10 , a table 20 , a first driving mechanism 30 , a carrying mechanism 40 , a supporting mechanism 50 , a second driving mechanism 60 , a third driving mechanism 70 , a luminance meter 80 , and a sensor 90 .
該底座10為一矩形之箱體，所述工作臺20為頂端開口之矩形箱體 ，其固定設置於該底座10上方，用於容置所述第一驅動機構30。 The base 10 is a rectangular box body, and the work table 20 is a rectangular box with an open top end. It is fixedly disposed above the base 10 for accommodating the first driving mechanism 30.
請一併參閱圖2，該第一驅動機構30包括第一驅動部31、二第一滑軌32及二第一滑動部33。該第一驅動部31包括二第一固定板311、二第一帶輪312、第一皮帶313及第一電機314。所述第一固定板311相對設置於該工作臺20內，且與該工作臺20之底部垂直設置。所述第一帶輪312分別固定於二第一固定板311相對之一側。該第一皮帶313纏繞於所述第一帶輪312上。第一電機314可為伺服電機，其中一第一帶輪312同軸地套設於該第一電機314之傳動軸(圖未示)上。如此，當所述第一電機314啟動後，可驅動該第一帶輪312轉動，進而帶動套設於該第一帶輪312上之第一皮帶313繞所述第一帶輪312轉動。所述第一滑軌32大致呈矩形條狀，兩者相互平行且分別設置於該第一驅動部31之兩側。該第一滑動部33大致呈矩形條狀，其兩端之底部分別固定有一連接部331，所述連接部331大致呈矩形塊狀，其遠離該第一滑動部33之表面開設有與該第一滑軌32形狀及結構相應之裝配槽332，用於與該第一滑軌32相配合，以將該第一滑動部33可滑動地裝設於對應之第一滑軌32上，且垂直該第一滑軌32設置。該第一滑動部33朝向第一滑軌32之表面連接至該第一皮帶313。如此，當所述第一皮帶313於該第一電機314之控制下繞所述第一帶輪312轉動時，該第一滑動部33可於該第一皮帶313之帶動下沿所述第一滑軌32滑動。 Referring to FIG. 2 , the first driving mechanism 30 includes a first driving portion 31 , two first sliding rails 32 , and two first sliding portions 33 . The first driving portion 31 includes two first fixing plates 311 , two first pulleys 312 , a first belt 313 , and a first motor 314 . The first fixing plate 311 is oppositely disposed in the table 20 and disposed perpendicular to the bottom of the table 20 . The first pulleys 312 are respectively fixed to one side of the two first fixing plates 311. The first belt 313 is wound around the first pulley 312. The first motor 314 can be a servo motor, and a first pulley 312 is coaxially sleeved on a drive shaft (not shown) of the first motor 314. Thus, when the first motor 314 is activated, the first pulley 312 can be driven to rotate, thereby driving the first belt 313 sleeved on the first pulley 312 to rotate around the first pulley 312. The first sliding rails 32 are substantially rectangular strips, and are disposed parallel to each other and respectively disposed on two sides of the first driving portion 31. The first sliding portion 33 has a substantially rectangular strip shape, and a connecting portion 331 is fixed to a bottom portion of the first sliding portion 33. The connecting portion 331 has a substantially rectangular block shape, and the surface of the first sliding portion 33 is opened away from the surface of the first sliding portion 33. A sliding groove 32 having a shape and a corresponding mounting groove 332 for engaging with the first sliding rail 32 to slidably mount the first sliding portion 33 on the corresponding first sliding rail 32, and vertical The first slide rail 32 is disposed. The first sliding portion 33 is coupled to the first belt 313 toward the surface of the first rail 32. In this manner, when the first belt 313 is rotated around the first pulley 312 under the control of the first motor 314, the first sliding portion 33 can be driven by the first belt 313 along the first The slide rail 32 slides.
請一併參閱圖3，該承載機構40蓋設於所述工作臺20上方，用於承載該待測背光模組。該承載機構40大致呈矩形板狀，其上設置有凹部41、多組滑動件42及數量與滑動件42數量相應之定位件43 。該凹部41大致呈矩形，其開設於該承載機構40中遠離工作臺20表面之中部位置。該凹部41內可容置一校正鏡(圖未示)，該校正鏡與該輝度計80相對設置，用於判斷所述輝度計80之光軸是否與該承載機構40所在平面垂直，從而實現對所述輝度計80之定位及校正。於本實施例中，該滑動件42之數量為四組，其圍繞該凹部41設置。每一組滑動件42包括二滑槽421，所述滑槽421大致呈矩形條狀，兩者相對且相互平行設置。該滑槽421貫通所述承載機構40，且自所述承載機構40之邊緣位置向該凹部41所在方向延伸。每一定位件43包括二滑柱431及卡持部432，所述滑柱431大致呈圓柱狀，其裝設於與其相應之滑槽421內。該卡持部432大致呈矩形板狀，其垂直該承載機構40中遠離該工作臺20之表面設置，且連接至該二滑柱431。該定位件43共同圍成一承載部44，用於容置所述待測背光模組。當該待測背光模組放置於該承載部44時，可調節該定位件43，使得該定位件43中之滑柱431沿相應之滑槽421滑動，直至該卡持部432抵持該待測背光模組，以定位並卡持該待測背光模組，防止該待測背光模組滑動。該承載機構40之兩側分別開設有大致呈矩形條狀之通槽45，該通槽45之延伸方向與該第一滑軌32之延伸方向一致，且露出該第一滑動部33之端部。 Please refer to FIG. 3 , the loading mechanism 40 is disposed above the work table 20 for carrying the backlight module to be tested. The carrying mechanism 40 has a substantially rectangular plate shape, and is provided with a recess 41, a plurality of sets of sliding members 42 and a positioning member 43 corresponding to the number of the sliding members 42. . The recess 41 is substantially rectangular and is formed in a position away from the surface of the table 20 in the carrier mechanism 40. A correction mirror (not shown) can be disposed in the recess 41. The calibration mirror is disposed opposite to the luminance meter 80 for determining whether the optical axis of the luminance meter 80 is perpendicular to the plane of the bearing mechanism 40. Positioning and correction of the luminance meter 80. In the present embodiment, the number of the sliders 42 is four sets, which are disposed around the recesses 41. Each of the sets of sliders 42 includes two sliding slots 421 which are substantially rectangular strips and are disposed opposite to each other and parallel to each other. The sliding groove 421 penetrates the supporting mechanism 40 and extends from the edge position of the supporting mechanism 40 in the direction of the concave portion 41. Each of the positioning members 43 includes two sliding columns 431 and a holding portion 432. The sliding column 431 has a substantially cylindrical shape and is installed in the corresponding sliding groove 421. The holding portion 432 has a substantially rectangular plate shape and is disposed perpendicular to a surface of the supporting mechanism 40 away from the table 20 and is connected to the two sliding posts 431. The locating members 43 are collectively formed into a carrying portion 44 for accommodating the backlight module to be tested. When the backlight module to be tested is placed on the carrying portion 44, the positioning member 43 can be adjusted, so that the sliding column 431 of the positioning member 43 slides along the corresponding sliding slot 421 until the holding portion 432 abuts the waiting portion 432. The backlight module is tested to locate and hold the backlight module to be tested to prevent the backlight module to be tested from sliding. A substantially rectangular strip-shaped through groove 45 is defined in each of the two sides of the supporting mechanism 40. The extending direction of the through groove 45 coincides with the extending direction of the first sliding rail 32, and the end of the first sliding portion 33 is exposed. .
請一併參閱圖4，該支撐機構50包括設於承載機構40上並位於承載機構40兩側之二立柱51及橫樑52。該立柱51分別穿過相應之通槽45，並固定於相應之第一滑動部33之端部。如此，支撐機構50可於該第一驅動機構30之帶動下沿所述通槽45滑動，即沿圖5中所示O-XYZ直角座標系之X軸方向滑動。該橫樑52大致呈矩形條狀，其連接於該二立柱51之頂端之間，並與該立柱51構成大致呈“ ㄇ”形狀之結構。 Referring to FIG. 4 together, the supporting mechanism 50 includes two columns 51 and beams 52 disposed on the supporting mechanism 40 and located on both sides of the supporting mechanism 40. The uprights 51 respectively pass through the corresponding through grooves 45 and are fixed to the ends of the corresponding first sliding portions 33. In this manner, the support mechanism 50 can slide along the through groove 45 under the driving of the first driving mechanism 30, that is, slide along the X-axis direction of the O-XYZ rectangular coordinate system shown in FIG. 5. The beam 52 has a substantially rectangular strip shape and is connected between the top ends of the two columns 51 and is substantially constituting with the column 51. ㄇ" shape of the structure.
該第二驅動機構60包括支撐部61、第二驅動部62、第二滑軌63及第二滑動部64。該支撐部61大致呈條狀，其固定於該橫樑52之頂部。該第二驅動部62設置於該支撐部61之頂端，包括二第二固定板621、二第二帶輪622、第二皮帶623及第二電機624。所述第二固定板621大致呈矩形片狀，其固定於所述支撐部61之兩端，且垂直該支撐部61設置。所述二第二帶輪622分別設置於該第二固定板621相對之兩側。該第二皮帶623纏繞於所述第二帶輪622上。該第二電機624可為一伺服電機，其中一第二帶輪622同軸地套設於該第二電機624之傳動軸(圖未示)上。如此，當所述第二電機624啟動後，可驅動該第二帶輪622轉動，進而帶動套設於該第二帶輪622上之第二皮帶623繞所述第二帶輪622轉動。所述第二滑軌63大致呈矩形條狀，兩者相對且相互平行地設置於該第二皮帶623之兩側。該第二滑動部64大致呈矩形塊狀，其底部兩端分別設置有一大致呈矩形條狀之滑塊641，所述滑塊641遠離第二滑動部64之表面開設有一大致呈直條狀之配合槽642，該配合槽642用於與該第二滑軌63相配合，以將該第二滑動部64可滑動地裝設於相應之第二滑軌63上。該第二滑動部64之側面上開設有大致呈矩形且貫通該側面之缺口643，該缺口643朝向所述滑塊641之側壁連接至所述第二皮帶623。如此，當所述第二皮帶623於該第二電機624之驅動下繞所述第二帶輪622轉動時，該第二滑動部64可於該第二皮帶623之帶動下沿所述第二滑軌63滑動，即沿圖5中所示O-XYZ直角座標系之Y軸方向滑動。該第二驅動機構60還包括防護板65，所述防護板65裝設於該第二固定板621遠離支撐部61之端部，且靠設於該第二滑動部64之頂部，用於防止使用者因 為誤操作而碰到第二皮帶623。 The second drive mechanism 60 includes a support portion 61, a second drive portion 62, a second slide rail 63, and a second slide portion 64. The support portion 61 is substantially strip-shaped and is fixed to the top of the beam 52. The second driving portion 62 is disposed at the top end of the supporting portion 61 and includes two second fixing plates 621 , two second pulleys 622 , a second belt 623 , and a second motor 624 . The second fixing plate 621 is substantially in the shape of a rectangular plate, and is fixed to both ends of the supporting portion 61 and disposed perpendicular to the supporting portion 61. The two second pulleys 622 are respectively disposed on opposite sides of the second fixing plate 621. The second belt 623 is wound around the second pulley 622. The second motor 624 can be a servo motor, and a second pulley 622 is coaxially sleeved on a drive shaft (not shown) of the second motor 624. In this manner, when the second motor 624 is activated, the second pulley 622 can be driven to rotate, thereby driving the second belt 623 sleeved on the second pulley 622 to rotate around the second pulley 622. The second sliding rails 63 are substantially rectangular strips, and are disposed opposite to each other and parallel to each other on both sides of the second belt 623. The second sliding portion 64 has a substantially rectangular block shape, and a substantially rectangular strip-shaped slider 641 is disposed at each end of the bottom portion thereof. The slider 641 defines a substantially straight strip shape away from the surface of the second sliding portion 64. The engaging groove 642 is configured to cooperate with the second sliding rail 63 to slidably mount the second sliding portion 64 on the corresponding second sliding rail 63. A notch 643 having a substantially rectangular shape and penetrating the side surface is formed on a side surface of the second sliding portion 64. The notch 643 is connected to the second belt 623 toward a side wall of the slider 641. The second sliding portion 64 can be driven by the second belt 623 along the second belt 623 when the second belt 623 is rotated by the second motor 624. The slide rail 63 slides, that is, slides in the Y-axis direction of the O-XYZ rectangular coordinate system shown in FIG. The second driving mechanism 60 further includes a shielding plate 65. The shielding plate 65 is disposed at an end of the second fixing plate 621 away from the supporting portion 61 and is disposed at the top of the second sliding portion 64 for preventing User The second belt 623 is encountered for erroneous operation.
該第三驅動機構70設置於該第二驅動機構60之一側，包括裝配部71、調節部72及第三滑動部73。該裝配部71包括連接板711及裝配板712，該連接板711大致呈矩形，其固定於所述第二滑動部64之頂部。該裝配板712之一端垂直連接至該連接板711之一側，以與該連接板711構成大致呈“L”型之結構。該調節部72為一大致呈矩形之板體，其固定於所述裝配板712背向連接板711之一側。該調節部72上設置有大致呈圓柱狀之調節柱721。所述調節柱721之一端部設置有一大致呈圓餅狀之操作部722，該操作部722沿其切線方向垂直延伸有一細長之操作柄723。該調節部72上還設置有二相對且相互平行設置之導向柱724，所述導向柱724固定於所述調節柱721之兩側，用於定位該第三滑動部73。該第三滑動部73大致呈矩形塊狀，其上開設有與該調節柱721相應之調節孔731及二與該導向柱724相應之導向孔732。當操作該操作柄723時，該調節柱721將於所述調節孔731內轉動，進而驅動該第三滑動部73沿所述調節柱721滑動，即沿圖5中所示O-XYZ直角座標系之Z軸方向移動。所述導向孔732則與相應之導向柱724相配合，以定位及導向所述第三滑動部73。 The third driving mechanism 70 is disposed on one side of the second driving mechanism 60 and includes a mounting portion 71, an adjusting portion 72, and a third sliding portion 73. The mounting portion 71 includes a connecting plate 711 and a mounting plate 712. The connecting plate 711 is substantially rectangular and is fixed to the top of the second sliding portion 64. One end of the mounting plate 712 is vertically connected to one side of the connecting plate 711 to form a substantially "L"-shaped structure with the connecting plate 711. The adjusting portion 72 is a substantially rectangular plate body fixed to one side of the mounting plate 712 facing away from the connecting plate 711. The adjustment portion 72 is provided with a substantially cylindrical adjustment column 721. One end of the adjusting column 721 is provided with an operating portion 722 having a substantially disk shape, and the operating portion 722 extends vertically along an tangential direction thereof with an elongated handle 723. The adjusting portion 72 is further provided with two guiding columns 724 which are opposite to each other and disposed in parallel with each other. The guiding posts 724 are fixed on two sides of the adjusting column 721 for positioning the third sliding portion 73. The third sliding portion 73 has a substantially rectangular block shape, and has an adjusting hole 731 corresponding to the adjusting column 721 and two guiding holes 732 corresponding to the guiding post 724. When the operating handle 723 is operated, the adjusting post 721 will rotate in the adjusting hole 731, thereby driving the third sliding portion 73 to slide along the adjusting column 721, that is, along the O-XYZ right angle coordinate shown in FIG. The Z axis moves in the direction. The guiding hole 732 cooperates with the corresponding guiding post 724 to position and guide the third sliding portion 73.
所述輝度計80固設於所述第三滑動部73遠離調節部72之一側。所述感測器90可是電荷耦合器(Charge Coupled Device，CCD)鏡頭，亦可是互補金屬氧化物半導體(Complementary Metal Oxide Semiconductor，CMOS)鏡頭。於本實施例中，該感測器90為一CCD鏡頭，其位於所述輝度計80之正上方，且與一CCD測試機(圖未示)相連，用於將輝度計80測得之資料傳送至該CCD測 試機，以供操作者分析及判斷該待測背光模組之輝度值是否符合標準。 The luminance meter 80 is fixed to one side of the third sliding portion 73 away from the adjusting portion 72. The sensor 90 can be a Charge Coupled Device (CCD) lens or a Complementary Metal Oxide Semiconductor (CMOS) lens. In this embodiment, the sensor 90 is a CCD lens located directly above the luminance meter 80 and connected to a CCD tester (not shown) for measuring the information of the luminance meter 80. Transfer to the CCD test The test machine is provided for the operator to analyze and determine whether the luminance value of the backlight module to be tested meets the standard.
請一併參閱圖5，當需要對待測背光模組之輝度進行測試時，首先將一待測背光模組200放置於該承載機構40上之承載部44內，接著調節該定位件43，使得該定位件43中之滑柱431沿相應之滑槽421滑動，直至該卡持部432抵持該待測背光模組200，以定位並卡持該待測背光模組200，防止該待測背光模組200滑動。將所述待測背光模組200進行定位後，再啟動相應之第一驅動機構30、第二驅動機構60及第三驅動機構70，使得該輝度計80於該第一驅動機構30、第二驅動機構60及第三驅動機構70之驅動下沿圖中所示X軸、Y軸及Z軸方向移動，從而對所述待測背光模組200上之立體結構上任一點之輝度進行測試，並將其測試結果藉由該感測器90傳送至相應之CCD檢測機，以供操作者進行分析及判斷。 Referring to FIG. 5, when the brightness of the backlight module to be tested is tested, a backlight module 200 to be tested is first placed in the carrying portion 44 of the carrying mechanism 40, and then the positioning member 43 is adjusted. The sliding column 431 of the positioning member 43 slides along the corresponding sliding slot 421 until the holding portion 432 abuts against the backlight module 200 to be tested to position and hold the backlight module 200 to be tested, thereby preventing the to-be-tested The backlight module 200 slides. After the backlight module 200 to be tested is positioned, the corresponding first driving mechanism 30, second driving mechanism 60 and third driving mechanism 70 are activated, so that the luminance meter 80 is at the first driving mechanism 30 and the second The driving mechanism 60 and the third driving mechanism 70 are driven to move in the X-axis, Y-axis and Z-axis directions as shown in the figure, thereby testing the brightness of any point on the three-dimensional structure of the backlight module 200 to be tested, and The test result is transmitted to the corresponding CCD detector by the sensor 90 for analysis and judgment by the operator.
可理解，藉由調節該定位件43，以使得該承載部44可適應不同類型及尺寸之待測背光模組。 It can be understood that the positioning member 43 can be adjusted to adapt the bearing portion 44 to different types and sizes of the backlight module to be tested.
可理解，該通槽45內還可填充相應之伸縮條46，該伸縮條46之一端固定至所述通槽45之端部，另一端連接至所述立柱51。當所述立柱51於所述通槽45內滑動時，該伸縮條46可相應之發生形變，進而有效填充該通槽45與立柱51之間之間隙，防止灰塵進入所述工作臺20。 It can be understood that the through slot 45 can also be filled with a corresponding telescopic strip 46. One end of the telescopic strip 46 is fixed to the end of the through slot 45, and the other end is connected to the upright 51. When the column 51 slides in the through groove 45, the expansion bar 46 can be deformed correspondingly, thereby effectively filling the gap between the groove 45 and the column 51 to prevent dust from entering the table 20.
可理解，所述二導向柱724可省略，相應地，與所述導向柱724對應之導向孔732可省略。 It can be understood that the two guiding posts 724 can be omitted, and correspondingly, the guiding holes 732 corresponding to the guiding posts 724 can be omitted.
顯然，本發明之輝度測試裝置100藉由設置複數個驅動機構，使 得輝度測試裝置100能夠實現三維空間內移動，從而能夠快速地對同一被測物件之複數個測試點進行輝度測量。 Obviously, the luminance testing device 100 of the present invention is provided by providing a plurality of driving mechanisms. The brightness test apparatus 100 is capable of moving in a three-dimensional space, thereby enabling rapid measurement of luminance at a plurality of test points of the same object to be tested.
綜上所述，本發明符合發明專利要件，爰依法提出專利申請。惟，以上所述者僅為本發明之較佳實施例，本發明之範圍並不以上述實施例為限，舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化，皆應涵蓋於以下申請專利範圍內。 In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above-described embodiments, and equivalent modifications or variations made by those skilled in the art in light of the spirit of the present invention are It should be covered by the following patent application.
10‧‧‧底座 10‧‧‧Base
20‧‧‧工作臺 20‧‧‧Workbench
80‧‧‧輝度計 80‧‧‧luminometer
90‧‧‧感測器 90‧‧‧ Sensor
43‧‧‧定位件 43‧‧‧ Positioning parts
46‧‧‧伸縮條 46‧‧‧Flexing strip
200‧‧‧待測背光模組 200‧‧‧Backlight module to be tested
431‧‧‧滑柱 431‧‧‧Sliding column
432‧‧‧卡持部 432‧‧‧Cars Department
51‧‧‧立柱 51‧‧‧ column
65‧‧‧防護板 65‧‧‧Protective panels
624‧‧‧第二電機 624‧‧‧Second motor
72‧‧‧調節部 72‧‧‧Regulatory Department
73‧‧‧第三滑動部 73‧‧‧ third sliding part
711‧‧‧連接板 711‧‧‧Connecting board
722‧‧‧操作部 722‧‧‧Operation Department
Claims (11)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100102199A TWI467139B (en) | 2011-01-21 | 2011-01-21 | Device for testing luminance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100102199A TWI467139B (en) | 2011-01-21 | 2011-01-21 | Device for testing luminance |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201231941A TW201231941A (en) | 2012-08-01 |
| TWI467139B true TWI467139B (en) | 2015-01-01 |
Family
ID=47069451
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100102199A TWI467139B (en) | 2011-01-21 | 2011-01-21 | Device for testing luminance |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI467139B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI809876B (en) * | 2022-05-18 | 2023-07-21 | 國立雲林科技大學 | Mobile 3d profile scanning device for inspecting surface contour of tire |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108827465A (en) * | 2018-07-03 | 2018-11-16 | 京东方科技集团股份有限公司 | Illuminance measuring test system, method and apparatus |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1293365A (en) * | 1999-10-15 | 2001-05-02 | 株式会社索佳 | Appearance inspection device |
| CN201083904Y (en) * | 2007-07-23 | 2008-07-09 | 华映视讯（吴江）有限公司 | LCD formwork luminance measuring apparatus |
| TWM380471U (en) * | 2009-12-02 | 2010-05-11 | Hirose Tech Co Ltd | Optical image detection apparatus |
| TW201024702A (en) * | 2008-12-31 | 2010-07-01 | Univ Far East | Measurement system for display panel |
-
2011
- 2011-01-21 TW TW100102199A patent/TWI467139B/en not_active IP Right Cessation
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1293365A (en) * | 1999-10-15 | 2001-05-02 | 株式会社索佳 | Appearance inspection device |
| CN201083904Y (en) * | 2007-07-23 | 2008-07-09 | 华映视讯（吴江）有限公司 | LCD formwork luminance measuring apparatus |
| TW201024702A (en) * | 2008-12-31 | 2010-07-01 | Univ Far East | Measurement system for display panel |
| TWM380471U (en) * | 2009-12-02 | 2010-05-11 | Hirose Tech Co Ltd | Optical image detection apparatus |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI809876B (en) * | 2022-05-18 | 2023-07-21 | 國立雲林科技大學 | Mobile 3d profile scanning device for inspecting surface contour of tire |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201231941A (en) | 2012-08-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8836940B2 (en) | Test apparatus for liquid crystal display | |
| CN203657755U (en) | Non-contact type clearance and offset optical measuring device | |
| TWI470201B (en) | A friction testing device having a clamping jig, and friction test method | |
| US9333547B2 (en) | Refitting mechanism | |
| CN206132356U (en) | HUD image test equipment | |
| CN213457237U (en) | Full-automatic first workpiece inspection machine | |
| CN208398802U (en) | A kind of rear shell dimension measuring apparatus | |
| CN110044263A (en) | The working method of detection device and detection device | |
| CN203518947U (en) | Optical measurement equipment | |
| TW201317543A (en) | Planeness testing device | |
| CN103616007A (en) | Precision planeness-measuring apparatus for miniature part | |
| CN101922997A (en) | Backlight lighting test jig and application method thereof | |
| CN115274484B (en) | Wafer detection device and detection method thereof | |
| CN110333611A (en) | A kind of detection method of supporting mechanism and display panel | |
| TWI467139B (en) | Device for testing luminance | |
| KR100934014B1 (en) | Probe Card Inspection System | |
| CN114280463A (en) | Chip testing system | |
| CN106990573B (en) | Optical measuring device and method | |
| CN210165909U (en) | Miniature OLED IVL test equipment | |
| CN210570546U (en) | Optical full-inspection mobile phone front shell flatness device | |
| CN114063327A (en) | Display screen testing device and display screen testing method | |
| TWI476370B (en) | Flatness testing device | |
| KR200393404Y1 (en) | Multi-head Ellipsometer | |
| CN208171209U (en) | A kind of dot laser flatness checking device | |
| TWI407108B (en) | Impedance testing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |