TWI464432B - - Google Patents
Info
- Publication number
- TWI464432B TWI464432B TW102113415A TW102113415A TWI464432B TW I464432 B TWI464432 B TW I464432B TW 102113415 A TW102113415 A TW 102113415A TW 102113415 A TW102113415 A TW 102113415A TW I464432 B TWI464432 B TW I464432B
- Authority
- TW
- Taiwan
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102113415A TW201333499A (zh) | 2013-04-16 | 2013-04-16 | 待測發光元件之光檢測裝置及其方法 |
| CN201410047701.0A CN104111162A (zh) | 2013-04-16 | 2014-02-11 | 待测发光元件的光检测装置及其方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102113415A TW201333499A (zh) | 2013-04-16 | 2013-04-16 | 待測發光元件之光檢測裝置及其方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201333499A TW201333499A (zh) | 2013-08-16 |
| TWI464432B true TWI464432B (zh) | 2014-12-11 |
Family
ID=49479490
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102113415A TW201333499A (zh) | 2013-04-16 | 2013-04-16 | 待測發光元件之光檢測裝置及其方法 |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN104111162A (zh) |
| TW (1) | TW201333499A (zh) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI502206B (zh) * | 2013-12-27 | 2015-10-01 | Hon Tech Inc | Image sensing device for testing electronic components and its application |
| WO2015107655A1 (ja) * | 2014-01-16 | 2015-07-23 | パイオニア株式会社 | 光学測定装置 |
| CN104075879A (zh) * | 2014-06-06 | 2014-10-01 | 致茂电子(苏州)有限公司 | 发光二极体的量测装置 |
| CN104502069B (zh) * | 2014-12-31 | 2017-11-24 | 华中科技大学 | 一种倒装led芯片在线检测收光测试方法 |
| CN104502070B (zh) * | 2014-12-31 | 2017-09-05 | 华中科技大学 | 一种倒装led芯片在线检测收光测试组件 |
| CN105988025A (zh) * | 2015-03-20 | 2016-10-05 | 旺矽科技股份有限公司 | 具有照度调整机制的多单元测试探针卡及其照度调整方法 |
| CN109612969B (zh) * | 2018-12-12 | 2021-07-27 | 闽江学院 | 一种可用于长余辉发光物的光色测量装置及测试方法 |
| TWI682186B (zh) * | 2018-12-26 | 2020-01-11 | 光遠科技股份有限公司 | 發光單元的測試方法 |
| CN117555089B (zh) * | 2024-01-10 | 2024-04-12 | 深圳市维度科技股份有限公司 | 一种用于适配双联光纤连接器的夹具 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006234497A (ja) * | 2005-02-23 | 2006-09-07 | Seiwa Electric Mfg Co Ltd | 光学特性測定装置 |
| TW201135194A (en) * | 2010-02-24 | 2011-10-16 | Otsuka Denshi Kk | Optical measurement apparatus including hemispherical optical integrator |
| CN202869647U (zh) * | 2012-09-26 | 2013-04-10 | 合肥彩虹蓝光科技有限公司 | 积分球 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100721149B1 (ko) * | 2005-12-09 | 2007-05-22 | 삼성전기주식회사 | 발광소자의 광량 측정 장치 |
| CN101221087A (zh) * | 2007-01-09 | 2008-07-16 | 鸿富锦精密工业（深圳）有限公司 | 镜片光反射率检测装置及镜片组装设备 |
| CN101221088B (zh) * | 2007-01-10 | 2011-11-30 | 鸿富锦精密工业（深圳）有限公司 | 镜片光穿透率检测装置及镜片组装设备 |
| TWM342502U (en) * | 2008-05-22 | 2008-10-11 | Tes Electrical Electronic Corp | Integrating sphere |
| TWM414583U (en) * | 2011-05-10 | 2011-10-21 | Guan-Nan Chen | Integrating sphere close to an object to be measured |
| TWM432031U (en) * | 2012-02-10 | 2012-06-21 | Saultech Technology Co Ltd | Integrating sphere |
-
2013
- 2013-04-16 TW TW102113415A patent/TW201333499A/zh unknown
-
2014
- 2014-02-11 CN CN201410047701.0A patent/CN104111162A/zh active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006234497A (ja) * | 2005-02-23 | 2006-09-07 | Seiwa Electric Mfg Co Ltd | 光学特性測定装置 |
| TW201135194A (en) * | 2010-02-24 | 2011-10-16 | Otsuka Denshi Kk | Optical measurement apparatus including hemispherical optical integrator |
| CN202869647U (zh) * | 2012-09-26 | 2013-04-10 | 合肥彩虹蓝光科技有限公司 | 积分球 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201333499A (zh) | 2013-08-16 |
| CN104111162A (zh) | 2014-10-22 |